U.S. patent application number 12/791905 was filed with the patent office on 2010-09-23 for liquid crystal display device and manufacturing method thereof.
Invention is credited to Kazushi Miyata, Susumu Niwa, Kimitoshi Ohgiichi, Ryouichi Ootsu, Shinichi Tsuruoka.
Application Number | 20100237896 12/791905 |
Document ID | / |
Family ID | 18581375 |
Filed Date | 2010-09-23 |
United States Patent
Application |
20100237896 |
Kind Code |
A1 |
Ohgiichi; Kimitoshi ; et
al. |
September 23, 2010 |
LIQUID CRYSTAL DISPLAY DEVICE AND MANUFACTURING METHOD THEREOF
Abstract
A liquid crystal display panel includes a first substrate, a
second substrate, and a liquid crystal layer formed between the
first substrate and the second substrate. A pixel area is formed on
the first substrate, and a driver is formed on the substrate and
electrically connected with the pixel area. A plurality of lines
are electrically connected with the driver, and a plurality of pads
are electrically connected with the plurality of lines. The
plurality of pads are formed in a straight line and are not
electrically connected with each other except for the electric
connection with the plurality of lines.
Inventors: |
Ohgiichi; Kimitoshi;
(Mobara, JP) ; Ootsu; Ryouichi; (Mobara, JP)
; Miyata; Kazushi; (Mobara, JP) ; Tsuruoka;
Shinichi; (Oohara, JP) ; Niwa; Susumu;
(Chonan, JP) |
Correspondence
Address: |
ANTONELLI, TERRY, STOUT & KRAUS, LLP
1300 NORTH SEVENTEENTH STREET, SUITE 1800
ARLINGTON
VA
22209-3873
US
|
Family ID: |
18581375 |
Appl. No.: |
12/791905 |
Filed: |
June 2, 2010 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
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12060980 |
Apr 2, 2008 |
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12791905 |
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11584632 |
Oct 23, 2006 |
7355659 |
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12060980 |
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10863501 |
Jun 9, 2004 |
7129998 |
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11584632 |
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09798948 |
Mar 6, 2001 |
6750926 |
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10863501 |
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Current U.S.
Class: |
324/760.01 |
Current CPC
Class: |
G02F 1/13452 20130101;
G02F 1/136204 20130101; G09G 2300/0426 20130101; Y10S 345/904
20130101; G09G 3/2003 20130101; G02F 1/136254 20210101; G09G 3/006
20130101; G09G 3/3614 20130101; G09G 3/3648 20130101; G02F 1/1345
20130101 |
Class at
Publication: |
324/770 |
International
Class: |
G01R 31/00 20060101
G01R031/00 |
Foreign Application Data
Date |
Code |
Application Number |
Mar 6, 2000 |
JP |
2000-061197 |
Claims
1. A display device comprising: a substrate; a plurality of test
pads, including a first group of test pads and a second group of
test pads, formed on the substrate; wherein test pads of the first
group are arranged to provide a drain signal for testing said
display device.
2. The display device according to claim 1, wherein test pads of
the second group are arranged to provide a gate signal for testing
said display device.
3. The display device according to claim 1, wherein said first
group of test pads are arranged in a straight line.
4. The display device according to claim 2, wherein said second
group of test pads are arranged in a straight line.
5. The display device according to claim 2, wherein the first group
of test pads and the second group of test pads are arranged in a
straight line.
6. The display device according to claim 1, wherein the first group
of test pads are arranged to be used with primary colors displayed
by said display device.
7. The display device according to claim 1, wherein the first group
of test pads are arranged to be coupled to a drain driver of the
display device and are located outside of a hidden area where the
drain driver is located.
8. The display device according to claim 2, wherein the second
group of test pads are arranged to be coupled to a gate driver of
the display device and are located outside of a hidden area wherein
the gate driver is located.
9. The display device according to claim 7, wherein the first group
of test pads comprises six pads.
10. The display device according to claim 8, wherein the second
group of test pads comprises three pads.
11. The display device according to claim 7, wherein the test pads
of the first group of test pads are arranged in an interleaved
manner.
Description
CROSS REFERENCE TO RELATED APPLICATION
[0001] This application is a continuation of U.S. application Ser.
No. 12/060,980, filed Apr. 2, 2008, which, in turn, is a
continuation of U.S. application Ser. No. 11/584,632, filed Oct.
23, 2006 (now U.S. Pat. No. 7,355,659), which is a continuation of
U.S. application Ser. No. 10/863,501, filed Jun. 9, 2004, (now U.S.
Pat. No. 7,129,998) which is a continuation of U.S. application
Ser. No. 09/798,948, filed Mar. 6, 2001 (now U.S. Pat. No.
6,750,926), the subject matter of which is incorporated by
reference herein.
BACKGROUND OF THE INVENTION
[0002] The present invention relates generally to liquid crystal
display devices; and, more particularly, the invention relates to
liquid crystal display devices of is the thin-film transistor type,
in which test procedures are made easier for inspection of the
functional operabilities of thin-film transistors and connection
failures at scan line lead lines and/or signal line leads. This
invention also relates to a method of manufacturing the same.
[0003] Liquid crystal display devices are widely employed as
high-precision color display devices for use in notebook computers
and display monitor units. Currently available liquid crystal
display devices include those of the simple matrix type, which
comprise a liquid crystal panel with a liquid crystal layer
interposed between a pair of substrates, on the inside surfaces of
which parallel electrodes are formed in such a manner as to cross
over each other, and those of the active matrix type, which
comprise a liquid crystal display element (referred to also as a
liquid crystal panel hereinafter) having switching elements for
selection of pixels disposed on one of a pair of substrates.
[0004] Active-matrix liquid crystal display devices include a
liquid crystal display device of the so-called longitudinal
electric field scheme, such as the twisted nematic (TN) type
(generally called a TN type active-matrix liquid crystal display
device), using a liquid crystal panel having a group of pixel
selection electrodes formed on a respective one of a pair of upper
and lower substrates, and a liquid crystal display device of the
so-called lateral electric field type (generally known as an IPS
type liquid crystal display device) using a liquid crystal panel
with a pixel selection electrode group formed on only one of a pair
of upper and lower substrates.
[0005] Typically, in Tn type of liquid crystal panel of an
active-matrix liquid crystal display device, liquid crystals are
aligned to twist by 90.degree. within an interior space formed
between a pair of substrates (two substrates consisting of a first
substrate (lower substrate) and second substrate (upper
substrate)), and two polarization plates are multilayered on the
outside surfaces of the upper and lower substrates of such liquid
crystal panel, respectively, with the absorption axis directions
thereof being disposed in a cross polarization or "crossed Nicol"
fashion and also with the light entrance side absorption axes being
in parallel or at right angles to the rubbing direction.
[0006] In the TN type of active-matrix liquid crystal display
device thus arranged, incident light becomes linearly polarized
light at an incidence side polarization plate upon application of
no voltages. This linear polarized light travels along the twisting
paths of a liquid crystal layer; and, if the penetration axis of a
light output side polarization plate is identical to the azimuth
angle of the linear polarized light, then all rays of the linear
polarized light are permitted to pass out, resulting in
establishment of a white display (what is called the "normally open
mode").
[0007] In the case of a voltage application, a unit vector's
direction (director), indicating the average orientation direction
of axes of the liquid crystal molecules constituting the liquid
crystal layer, becomes perpendicular to the substrate surfaces,
while the azimuth angle of incidence side linear polarized light
remains unchanged, thus resulting in coincidence with the
absorption axis of the light output side polarization plate, to
thereby obtain a black display (see "Basics and Applications of
Liquid Crystals," issued by Industry Research Association,
1991).
[0008] On the other hand, in an IPS type liquid crystal display
device having pixel selection electrodes and electrode leads formed
on only one of a pair of substrates for permitting switching of its
liquid crystal layer in a specified direction extending in parallel
to the substrate surfaces through voltage to application between
neighboring electrodes (between a pixel electrode and counter
electrode) on this substrate, polarization plates are so disposed
as to provide the black display when no voltages are applied
thereto (the so-called "normally closed mode").
[0009] The IPS type liquid crystal display device's liquid crystal
layer exhibits a homogeneous alignment or orientation parallel to
the substrate surfaces in the initial state. Simultaneously the
director of the liquid crystal layer in a plane parallel to the
substrates is parallel or slightly angled relative to the electrode
lead direction upon application of no voltages, causing the
direction of the director of the liquid crystal layer in voltage
application events to shift toward a direction perpendicular to the
electrode lead direction upon application of a voltage thereto.
When the liquid crystal layer's director direction is tilted toward
the electrode lead direction by 45.degree. in comparison with the
director direction when no voltage are applied thereto, the liquid
crystal layer, upon application of the voltage, causes the azimuth
angle of polarized light to rotate 90.degree. as in 1/2 wavelength
plates resulting in coincidence between the light output side
polarization plate's transmission axis and the polarized light's
azimuth angle, thus providing a white display.
[0010] This IPS type liquid crystal display device has the
characteristic feature that changes in color, phase and contrast
remain low even at wide viewing angles, thus enabling achievement
of wide view-field angles (see Japanese Patent Laid-Open No.
505247/1993).
[0011] A major approach to attain full color image visualization of
the respective types of liquid crystal display devices stated supra
is to employ a color filter scheme. This is achieved by subdividing
a pixel corresponding to a single dot of color display into three
portions and disposing color filters of the three primary colors,
e.g. red (R), green (G) and blue (B), at such unit pixels,
respectively.
[0012] Although the present invention is applicable to the various
types of liquid crystal display devices stated above, its outline
will be explained below with reference to a TN type active-matrix
liquid crystal display device as an example.
[0013] As previously stated, in a liquid crystal element (liquid
crystal panel) making up the TN type active-matrix liquid crystal
display device (referred to simply as an active-matrix liquid
crystal display device hereinafter for brevity is purposes), there
are formed on a liquid crystal layer side surface of one substrate
of two transparent dielectric substrates, which are typically made
of glass plates mutually opposed with a liquid crystal layer
interposed therebetween, a group of scanning signal lines (referred
to as gate lines hereinafter) extending in an "x" direction and
being arranged in parallel in a "y" direction, and a group of drain
lines (video signal lines) isolated from this gate line group and
extending in the y direction, while being arranged in parallel in
the x direction.
[0014] Each respective one of the regions surrounded by the gate
line group and drain line group becomes a pixel region in which a
thin-film transistor (TFT) for use as an active element (switching
element) and a transparent pixel electrode are formed by way of
example. When a scan signal is supplied to a gate line, the
thin-film transistor turns on causing a video signal coming from a
drain line to be supplied to the pixel electrode via this turned-on
thin-film transistor.
[0015] Additionally, each drain line of the drain line group and
each gate line of the gate line group are extended up to the
periphery of the substrate to constitute external terminals,
respectively, to which video drive circuits and gate scan drive
circuits-namely a plurality of drive IC chips (semiconductor
integrated circuits as will be referred to simply as drive ICs or
ICs hereinafter) making up these circuits are connected,
respectively, which are separately mounted at the substrate
periphery. In other words, a plurality of tape carrier packages
(TCPS) with these respective drive ICs mounted thereon are
externally bonded to peripheral portions of the substrate.
[0016] However, since such a substrate is designed so that TCPs
with drive ICs mounted are externally attached at the peripheral
portions thereof, the occupation area of a region (generally called
a "picture frame") defined between contour lines of a display
region, as formed of the substrate's cross-over regions of the gate
line group and drain line group, and an outer frame of the
substrate becomes larger undesirably, which is conflicts with the
demand for reducing or minimizing the outside dimensions of a
liquid crystal display module with the liquid crystal display
element and an illuminance light source (backlight unit) and other
associative optical elements integrated therein.
[0017] Thus, in order to avoid this problem, or at least minimize
risks involved, i.e. to fully meet demands for high-density
mountability of the liquid crystal display element and also effect
downsizing of the outer size of the liquid crystal display module,
the so-called flip-chip scheme or alternative chip-on glass (COG)
scheme has been proposed for permitting direct mounting of drive
ICs for video driving and drive ICs for scan driving on one
substrate (lower substrate) without the use of any TCP components.
And, the drive ICs are designed to employ the so-called FCA scheme
f or permitting electrodes formed on back surf aces of such drive
ICs to be directly connected to electrical wiring leads formed on
the substrate.
[0018] FIG. 10 is a perspective view illustrating a main part of a
liquid crystal display device of the FCA mount type. This liquid
crystal display device is arranged so that a liquid crystal layer
is interposed between one substrate SUB1 with a matrix array of
thin-film transistors formed thereon and an opposing substrate SUB2
with color filters formed thereon.
[0019] The one substrate SUB1 has one peripheral side along which
scan line drive ICs (referred to as gate drivers hereafter) GDR are
mounted by the FCA scheme. In addition, signal line drive circuit
ICs (drain drivers) DDR are similarly mounted by the FCA scheme
along another side of the substrate.
[0020] Outputs of the gate drivers GDR are connected to scan line
extension leads GTM, whereas inputs thereof are connected to wiring
lines of a flexible printed circuit board FPC1. Outputs of the
drain drivers DDR are connected to signal line leads DTM, while
their inputs are coupled to wiring lines of a flexible printed
circuit board FPC2.
[0021] As shown by arrows in FIG. 10, the flexible printed circuit
boards FPC1, FPC2 are arranged such that the flexible printed
circuit board FPC1 can be bent in a direction BENT1 toward the back
surface of substrate SUB1; and then, a curvature portion JT2 of the
flexible printed circuit board FPC2 can be folded along a fold line
BTL in the BENT2 direction and then folded in a direction BENT3 for
accordion-like folding onto the back surface of flexible printed
circuit board FPC1.
[0022] Under this condition, the flexible printed circuit board
FPC2's connector CT4 can be connected to a connector, not shown, as
provided on the flexible printed circuit board FPC1. An adhesive
tape BAT is interposed on the inner surface of the folded portion
of the flexible printed circuit board FPC2, resulting in fixture of
flexible printed circuit board FPC2.
[0023] Note here that reference characters "CHG" and "CHD"
designate electronics components, such as capacitors and others;
ALMG, ALMD denote alignment marks; POL2 denotes a polarization
plate; and AR denotes a display region.
[0024] In the liquid crystal display device with the above
arrangement, probes of test/inspection equipment may be attached to
extension leads of the gate lines and extension leads of the drain
lines, which are extended from the thin-film transistors formed on
one substrate SUB1, to thereby perform several tests for inspection
of thin-film transistor characteristics and connection failures at
respective electrical leads and turn-on or "lighting" tests after
adhesion with the other substrate.
[0025] FIGS. 11(a) and 11(b) are diagrams of test terminals in one
prior art type of liquid crystal display device, wherein FIG. 11(a)
is a pictorial representation of the gate driver side, whereas FIG.
11(b) depicts the drain driver side.
[0026] In FIG. 11(a), GTM designates gate line extension leads; TPC
denotes test terminals; GDR indicates gate driver mount portions
(shown by dot lines); LCT denotes a laser cut line; ASCL denotes a
gate line side static electricity suppression common line; GTM
denotes input terminals of the gate drivers GDR.
[0027] In the manufacture of one substrate SUB1 (thin-film
transistor substrate), the gate line extension leads GTM are
short-circuited by the static electricity suppression common line
ASCL for protection against damage to thin-film transistors and
wiring leads occurring due to invasion of static electricity.
Thereafter, the gate line leads GTM and individually cut along the
laser cut line LCT; and then, the probes are attached to the test
terminals TPC for inspection to detect connection failure or
unwanted open-circuiting, while performing lighting tests upon
application of more than one signal thereto.
[0028] In FIG. 11(b), DTM designates drain line extension lines;
TPC denotes test terminals; DDR indicates drain driver mount
portions (shown by dot lines); LCT denotes a laser cut line; ASCL
denotes a drain line side static electricity suppression common
line; and TTB denotes input terminals of the gate drivers GDR.
[0029] Similarly, on the drain driver side also, in the manufacture
of such a substrate, the drain line extension leads DTM are
short-circuited by the static electricity suppression common line
ASCL for preclusion of damage due to invasion of static electricity
at the thin-film transistors and wiring leads concerned.
Thereafter, the drain line leads DTM are individually cut along the
laser cut line LCT; and then, all the probes are attached to the
test terminals TPC at a time for open-circuit inspection while
performing lighting tests upon application of a signal (s)
thereto.
[0030] An example of this flip-chip scheme liquid crystal display
device is disclosed in Japanese Patent Laid-Open No.
122806/1996.
SUMMARY OF THE INVENTION
[0031] In the prior art test terminal layout, the requisite number
of gate drivers and drain drivers-in particular drain
drivers-increases with growth in high-precision displayability,
resulting in a decrease in pitch of the output terminals thereof
(pitches of GTM and DTM of FIG. 11(a) and FIG. 11(b)).
[0032] As a result, it becomes impossible to provide the test
terminals (TPC of FIGS. 11(a) and 11(b)) with sufficiently large
widths and lengths, which in turn makes it difficult to achieve
simultaneous contacting of all probes as in the prior art, leading
to occurrence of a problem of decreased inspection accuracy due to
probe deviation during open-circuit and lighting tests, while
externally applying test voltages to the test terminals involved.
In addition, production of probes to be applied to output terminals
having such narrow pitches is also becoming more difficult.
[0033] An object of the present invention is to avoid the problems
faced by the prior art to thereby provide a liquid crystal display
device having a wiring lead structure which makes it possible to
perform a variety of different kinds of tests with simultaneous
contact of probes to all terminals at one time, and which also
enables the use of a test/inspection apparatus having probes with a
common applicability for multiple types of products by
standardization of a pattern of test terminals.
[0034] Another object of this invention is to provide a liquid
crystal display device which is capable of facilitating production
of the probes at low costs and a method of manufacturing the
device.
[0035] A further object of the invention is to provide a liquid
crystal display device similar to that stated above and which is
capable of suppressing reduction of the capability for detection of
display defects during inspection, and a manufacturing method
thereof.
[0036] To attain the foregoing objects, the present invention
provides as its representative means a technique for subdividing
output terminals (lead lines) of drain drivers into six separate
groups with regard to the three primary colors of is red, green and
blue, which groups include a positive polarity of red, negative
polarity of red, positive polarity of green, negative polarity of
green, positive polarity of blue, and negative polarity of blue;
wherein, respective groups are bundled and connected together to
drain line common lines, which are taken out of a drain driver
mount region for permitting execution of inspection, while
permitting probes be attached to test terminals, as provided at the
drain line common lines.
[0037] In addition, regarding the gate driver side, a technique is
provided as a representative means for classifying output terminals
(lead lines) of gate drivers into three groups, including a front
stage, a next stage and a rear stage, or alternatively four groups
for setting polarities so as to be reversed in units of respective
dots; wherein, respective groups are bundled and connected together
to gate line common lines, which are taken out of a gate driver
mount region for permitting execution of inspection, while
permitting probes to be attached to test terminals, as provided at
the gate line common lines.
[0038] Some representative arrangements in accordance with the
present invention will be set forth below.
[0039] (1) A liquid crystal display device has a pair of substrates
with a liquid crystal layer interposed therebetween, one of said
substrates having thereon a matrix array of thin-film transistors,
pixel electrodes driven by the thin-film transistors, and a pattern
of scanning lines and signal lines for supplying the thin-film
transistors with voltage signals used for pixel formation, a
remaining one of said substrates having color filters of the three
colors of red and green and blue, the one substrate also having a
peripheral side at which scan line lead terminals are provided and
another peripheral side at which signal line lead terminals are
provided; a scan line drive IC mount region and signal line drive
IC mount region having output terminals connected to respective
ones of said scan line lead terminals and said signal line lead
terminals of the liquid crystal panel, while permitting direct
mounting of more than one scan line drive IC and more than one
signal drive IC, respectively; and more than one static electricity
suppression common line provided in a cut removal region for
commonly connecting said scan line lead terminals and signal line
lead terminals together.
[0040] The device is specifically arranged to comprise: six signal
line side common lines provided in the signal line drive IC mount
region of the signal line lead terminals connected to said static
electricity suppression common line, for connection with six
terminal groups which are divided from the signal line lead
terminals in a way such that the groups are of positive polarity of
red, negative polarity of red, positive polarity of green, negative
polarity of green, positive polarity of blue, and negative polarity
of blue; and test pads provided on said one substrate in an area
excluding said signal line drive IC mount region f or connection to
said six signal line side common lines.
[0041] With such an arrangement, it is possible to enlarge the
width and length plus the pitch of test pads for connection to the
signal line leads, thus making it possible to simplify the
production of the probes, resulting in an increase in contact
accuracy.
[0042] (2) The test pads of said six signal line side common lines
are disposed in the cut removal region of said one substrate.
[0043] It is possible to standardize patterns of the test pads,
thereby enabling the intended inspection of liquid crystal display
devices of multiple types of products to be carried out by use of a
test apparatus or equipment having a common probe or probes.
[0044] (3) A liquid crystal display device has a pair of substrates
with a liquid crystal layer interposed therebetween, one of said
substrates having thereon a matrix array of thin-film transistors,
pixel electrodes driven by the thin-film transistors, and a pattern
of scanning lines and signal lines for supplying the thin-film
transistors with voltage signals used for pixel formation, a
remaining one of said substrates having color filters of the three
colors of red and green and blue, the one substrate also having a
peripheral side at which scan line lead terminals are provided and
another peripheral side at which signal line lead terminals are
provided; a scan line drive IC mount region and signal line drive
IC mount region having output terminals connected to respective
ones of said scan line lead terminals and said signal line lead
terminals of the liquid crystal panel, while permitting direct
mounting of more than one scan line drive IC and more than one
signal drive IC, respectively; and more than one static electricity
suppression common line provided in a cut removal region for
commonly connecting said scan line lead terminals and signal line
lead terminals together.
[0045] The device comprises three scan line side common lines
provided in the scan line drive IC mount region of the scan line
lead terminals, which are connected to the static electricity
suppression common line, for connection with three groups being
divided from the scan signal line lead terminals and having a front
stage and a next stage plus a rear stage, or alternatively four
terminal groups divided therefrom, in order to allow the polarity
become reversed in units of dots; six signal line side common lines
provided in the signal line drive IC mount region of the signal
line lead terminals connected to said static electricity
suppression common line, for connection with six terminal groups
which are divided from the signal line lead terminals in a way such
that the groups are of positive polarity of red, negative polarity
of red, positive polarity of green, negative polarity of green,
positive polarity of blue, and negative polarity of blue; and test
pads provided on said one substrate in an area excluding said scan
line to drive IC mount region and said signal line drive IC mount
region for being associated with said three or four scan line side
common lines and said six signal line side common lines,
respectively.
[0046] With this arrangement, it is possible to enlarge the width
and length plus the pitch of test pads for connection to the signal
line leads, thus making it is possible to simplify the production
of the probes, resulting in an increase in contact accuracy.
[0047] (4) The test pads of the three or four scan line side common
lines and the six signal line side common lines are disposed in the
cut removal region of said one substrate.
[0048] (5) The test pads of the three or four scan line side common
lines and the six signal line side common lines are laid out with
equal intervals in the cut removal region of said one
substrate.
[0049] It is possible to standardize patterns of the test pads
including scan lead lines also, thereby enabling the intended
inspection of liquid crystal display devices of multiple types of
products to be carried out by use of a test apparatus or equipment
having a common probe or probes.
[0050] (6) The remaining substrate has thereon more than one
counter electrode, the test pads of the three or four scan line
side common lines and the six signal line side common lines are
disposed in the cut removal region of said one substrate, and a
test pad for connection to a lead line of the counter electrode is
disposed along with the test pads of the three or four scan line
side common lines and the six signal line side common lines.
[0051] It is possible to further promote standardization of
patterns of the test pads including scan lead lines also, thereby
enabling the intended test of liquid crystal display devices of
multiple types of products to be carried out by use of a test
apparatus or equipment having a common probe or probes.
[0052] (7) The one substrate has thereon more than one counter
electrode, the test pads of the three or four scan line side common
lines and the six signal line side common lines are disposed in the
cut removal region of said one substrate, and a test pad f or,
connection to a lead line of the counter electrode is disposed
along with the test pads of the three or four scan line side common
lines and the six signal line side common lines.
[0053] Since it is possible to dispose those lead lines of counter
electrodes required for turn-on or "lighting" tests also in the
form of a standard pattern along with the test pads of the scan
line side common lines and signal line side common lines, it
becomes possible to further promote standardization of the test pad
patterns, thereby enabling the intended test of liquid crystal
display devices of multiple types of products to be carried out by
use of a test apparatus or equipment having a common probe or
probes.
[0054] One significant feature of the present invention as
disclosed and claimed herein lies in separation of the signal side
common lines at least in units of respective colors of the color
filters in the way stated previously. This invention does not
exclude arrangements for performing inspection while causing only
the same signal to be input to a video signal line concerning each
color in any event. However, separating the signal side common
lines at least in units of colors of the color filters, as stated
above, makes it possible to reduce probe costs due to reduction of
the requisite number of test pads to thereby enable achievement of
tests with colors being displayed, while at the same time enabling
execution of the intended-test procedure with a high accuracy. In
cases where the color filters are of the three primary colors of
red, green and blue, any kinds of tests become available with
respect to almost every color to be displayed by products through
individual inspections of red, green and blue produced by lighting
in units of respective colors, in addition to a white display with
all colors being brightened at one time, and further by lighting
while controlling the gray-scale gradation levels of each
color.
[0055] This means that color purity tests of respective colors
become possible, which is a significant advantage of the
arrangement incorporating the principles of the invention. Further,
a demonstrable improvement in test accuracies of display irregular
ties is realized, which is an effect that will no longer be
attained by exclusive use of all-color simultaneous lighting
schemes. The color filters are is formed by a process including the
steps of performing deposition and exposure plus development
separately in units of colors thereof, or alternatively by letting
the individual colors be impregnated. Accordingly, in-plane
uniformity or distribution within a plane of the film thickness
will take place in units of respective colors. In the case of
lighting all colors at once, the influences of these will normally
become imperceptible. For example, in case only the film thickness
of red locally changes, the resultant influence of such red film
thickness local change upon brightness or luminance during
simultaneous lighting of all of the three colors of red, green and
blue becomes 1/3 of that during unicolor lighting of red.
Accordingly, the only use of all-color simultaneous lighting would
result in occurrence of luminance irregularities-in particular, a
decrease in inspection sensitivities as to color irregularities,
which leads to risks of outflow of defective products into the
market. With the instant invention, it is possible, by separating
the signal side common lines at least in units of respective colors
of the color filters in the way stated supra, to establish tests
with the colors being lit individually, which in turn makes it
possible to realize probe cost reduction and test cost reduction as
well s to perform lighting tests on high-precision products, while
retaining test accuracies concerning luminance and color
irregularities.
[0056] Although this test scheme is advantageous especially for
FCA, similar results are also obtainable in TCP schemes through
separation of the signal side common lines at least in units of
colors of the color filters.
[0057] Another significant feature of the invention is that the
signal side common lines are separated at least in units of colors
of the color filters and for use as positive and negative
polarities. Whereby, if the color filters are of three colors, by
way of example, then the resulting signal side common lines become
six lines. Currently available liquid crystal display device drive
methods include two major ones: a common inversion driving method
and dot inversion drive method. In the common inversion drive
method, at least three signal line side common lines are employed,
as discussed above, due to the fact that in most cases the pixels
neighboring in a scan signal line extension direction have the same
polarity relative to the reference signal potential. On the
contrary, in the dot inversion drive method, neighboring pixels in
the scan signal extension direction are ordinarily driven in such a
way that they have opposite polarities relative to the reference
signal potential. Due to this, in the case of using three signal
line side common lines in dot inversion events, six certain pixels
neighboring in the scan line extension direction become "+-++-+" by
way of example--in this case, any intended polarity inversion is no
longer realizable between B and R. Even in this case, the
above-noted detection accuracies of luminance/color irregularities
can be maintained almost perfectly. Regrettably, this advantage
does not come without an accompanying penalty in that, it becomes
difficult to accurately inspect flicker, i.e. on-screen flickering,
to be checked during a lighting test procedure. Generally, this
flicker will become problematic only with special patterns or only
at special timings, which is less significant during real in-use
events than the above-noted color/luminance irregularities;
however, if such flicker stays at levels greater than a level
defined by clients, then a product with the flicker must be
regarded as being defective. Accordingly, with the invention,
separating the signal side common lines in units of colors of the
color filters and for use as the positive and negative polarities,
e.g. employing six signal side common lines for use with color
filters of the three primary colors, makes it possible to cause an
array of six pixels of RGBRGB to have reversed polarities between
adjacent pixels in a pattern of "+-+-+-" by way of example.
[0058] Further, the flicker inspection accuracy in particular is
variable depending upon the influence of a very small voltage
difference between pixels; thus, it is required to control any
possible delays of signal waveforms during inspection. Thus, it is
desirable that an increased number of test pads for input of test
signals to signal line side common lines be provided with respect
to each signal line, which number is given as (n-1)/2 or more,
where "n" is the number of pads per unit region, which may be a
chip mount region or alternatively a region with an ensemble of
signal wiring leads provided therein. In Addition, to suppress
probe cost increases, it is desirable that the pad number be set at
2.times.(n+l) or less.
[0059] It is also desirable that the number of test signal
terminals for inputting test signals to scan signal lines is
greater than the number of test signal terminals for input of test
signals to video signal lines. This is based on a requirement for
reducing input resistivities of the video signal line side while
taking account of the fact that execution of the intended
test/inspection with the above-noted arrangements requires that the
input frequencies of certain test signals to be applied to the
video signal lines during inspection be higher than or equal to
input frequencies of test signals being applied to the scan signal
lines.
[0060] In addition, advantages as to lower resistivities are
obtainable by providing a region formed of a specific wiring layer
with the lowest resistivity in the liquid crystal display device at
any one of those wiring leads associated with the signal line side
common lines or alternatively between the signal line side and test
pads and leads associated with the scan line side common lines or
between the scan line side common lines and test pads.
[0061] Furthermore, with the invention, the scan line side common
lines are arranged by more than two lines. Use of a single line
enables all-line simultaneous lighting. However, difficulties can
occur in regard to the above-mentioned flicker lighting inspection.
More specifically, for either one of the common inversion driving
and dot inversion driving methods, drive is carried out in real
in-use states in such a way that two neighboring pixels in an
extension direction of video signal lines are reversed in polarity
relative to each other. This is for the purpose of flicker
suppression. Thus, in order to perform inspection as to flicker, it
is required to effect a drive in such a way that two neighboring
pixels in the video signal line extension direction are mutually
reversed in polarity. As the use of a single scan line side common
line must result in such two pixels having the same polarity, there
is a problem that no flicker tests are achieved in real in-use
states. In view of this, by employing two lines for permitting two
neighboring pixels to be deviated or shifted in write timing, it
becomes possible to effect a drive in such a way that the two
neighboring pixels in the video signal line extension direction are
mutually reversed in polarity, thus enabling the intended flicker
test.
[0062] In addition, with regard to flicker, the influence of a
"jump-in" voltage upon writing into a TFT is also present. To let
this be closer to a real-use state, it is desirable that more than
three scan line side common lines be employed in specific liquid
crystal display devices using the so-called Cadd scheme with a
capacitor for storage of electrical charge written into a pixel
electrode being formed in particular between the pixel electrode
and scan signal line at the rear stage. Since with this technique
the front stage pixel Cadd is formed on a scan signal line at the
self stage and, further, the self stage pixel Cadd is formed on a
scan signal line at the rear stage, any intended writing into
pixels in a way equivalent to real use events is realized by
scanning a pixel at the self stage and its front and rear pixels in
a specified order of sequence similar to that during real use
states. Additionally, in certain schemes that do not constitute
Cadd such as for example the Cstg scheme or the like, writing
equivalent to real use events is possible even when the scan line
side common lines consist of two lines; however, in regard to the
influence of voltage potentials due to capacitive coupling between
pixels, the use of more than three scan line side common lines in a
similar manner exhibits an effect for approximation to real in-use
states.
[0063] Note here that in the case of three lines, at six pixels
ABCDEF aligned in a direction along the image signal line extension
direction, the polarities of respective pixels relative to a
reference signal potential become "+-++-+" by way of example,
resulting in occurrence of a problem that pixels C and D, for
example, have the same polarity. To avoid this problem, it will be
desirable that the scan line side common lines consist of an even
number of lines. In view of the problem in the Cadd scheme, it is
deemed most effective to arrange them while employing four lines as
a minimal number in the Cadd scheme or using two or four lines in
the Cstg scheme.
[0064] The present invention should not be limited to the
above-stated arrangements or arrangements of embodiments to be set
forth later in the description and ideas as disclosed therein. A
variety of modifications and alterations will be possible without
departing from the true spirit and scope of the invention.
[0065] Several preferred embodiments of the instant invention will
now be described in detail with reference to the accompanying
drawings. Although the following embodiments will be set forth in
conjunction with liquid crystal display devices of the so-called TN
type, the same applied to basic configurations of portions of
devices of the IPS (lateral electric field) type to which the
invention is applied, except that counter electrode lead lines are
drawn out on the thin-film transistor substrate side.
[0066] In addition, in the explanation presented below also, signal
lines are also called drain lines, whereas scan lines are called
gate lines.
BRIEF DESCRIPTION OF THE DRAWINGS
[0067] FIG. 1 is a diagram showing a plan view of one preferred
embodiment of a liquid crystal display device in accordance with
the present invention.
[0068] FIG. 2 is a partly enlarged diagram of a test pad formation
region TTP of FIG. 1.
[0069] FIGS. 3(a) and 3(b) are diagrams showing pictorial
representation of wiring is leads at a main part of one embodiment
of the liquid crystal display device in accordance with this
invention.
[0070] FIG. 4 is a waveform diagram for explanation of exemplary
test signals as applied to drain test pads and gate test pads
during a turn-on test of one embodiment of the liquid crystal
display device in accordance with the invention.
[0071] FIGS. 5(a) and 5(b) are diagrams showing pictorial
representations of major wiring leads at a main part of another
embodiment of the liquid crystal display device in accordance with
the invention.
[0072] FIG. 6 is a block diagram showing the arrangement of a drive
system of a standard active-matrix liquid crystal display device to
which the invention is applied.
[0073] FIG. 7 is a block diagram schematically showing an
arrangement of each driver of a liquid crystal panel along with a
flow of signals therein.
[0074] FIG. 8 is a timing diagram showing display data as input
from a signal source (main body) to a display control device and
signals being output from the display control device to drain and
gate drivers.
[0075] FIG. 9 is a diagram showing the exterior appearance of one
exemplary display monitor for use as electronic equipment having
the liquid crystal display device of the invention mounted
therein.
[0076] FIG. 10 is a diagram showing a perspective view of a main
part of a liquid crystal display device of the type which employs
the PCA mount scheme.
[0077] FIGS. 11(a) and 11(b) are diagrams of test terminals in one
prior art liquid crystal display device.
[0078] FIGS. 12(a) and 12(b) are diagrams of a lead wiring pattern
at a main part of one embodiment of the liquid crystal display
device in accordance with the invention.
[0079] FIGS. 13(a) and 3(b) are diagrams of a lead wiring pattern
at a main part of one embodiment of the liquid crystal display
device in accordance with the is invention.
[0080] FIGS. 14(a) and 14(b) are diagrams of a lead wiring pattern
at a main part of one embodiment of the liquid crystal display
device in accordance with the invention.
[0081] FIGS. 15(a) and 15(b) are diagrams of a lead wiring pattern
at a main part of one embodiment of the liquid crystal display
device in accordance with the invention.
[0082] FIGS. 16(a) and 16(b) are diagrams of a lead wiring pattern
at a main part of one embodiment of the liquid crystal display
device in accordance with the invention.
[0083] FIGS. 17(a) and 17(b) are diagrams of a lead wiring pattern
at a main part of one embodiment of the liquid crystal display
device in accordance with the invention.
[0084] FIGS. 18(a) and 18(b) are diagrams of a lead wiring pattern
at a main part of one embodiment of the liquid crystal display
device in accordance with the invention.
[0085] FIGS. 19(a) to 19(d) are diagrams showing pictorial views of
a test pad layout pattern of one embodiment of the liquid crystal
display device in accordance with the invention.
[0086] FIGS. 20(a) to 20(d) are diagrams showing pictorial views of
a test pad layout pattern of one embodiment of the liquid crystal
display device in accordance with the invention.
[0087] FIGS. 21(a) to 21(f) are diagrams showing pictorial views of
a test pad layout pattern of one embodiment of the liquid crystal
display device in accordance with the invention.
[0088] FIGS. 22(a) to 22(f) are diagrams showing pictorial views of
a test pad layout pattern of one embodiment of the liquid crystal
display device in accordance with the invention.
[0089] FIG. 23 is a diagram showing a pictorial view of a test pad
layout pattern of one embodiment of the liquid crystal display
device in accordance with the invention.
[0090] FIGS. 24(a) to 24(d) are diagrams showing pictorial views of
a test pad layout pattern of one embodiment of the liquid crystal
display device in accordance with the invention.
[0091] FIGS. 25(a) to 25(c) are diagrams showing pictorial views of
test signals in one embodiment of the liquid crystal display device
in accordance with the invention.
[0092] FIGS. 26(a) to 26(c) are diagrams showing pictorial views of
test signals in one embodiment of the liquid crystal display device
in accordance with the invention.
[0093] FIGS. 27(a) to 27(c) are diagrams showing pictorial views of
test signals in one embodiment of the liquid crystal display device
in accordance with the invention.
[0094] FIGS. 28(a) to 28(c) are diagrams showing pictorial views of
test signals in one embodiment of the liquid crystal display device
in accordance with the invention.
[0095] FIGS. 29(a) to 29(c) are diagrams showing pictorial views of
test signals of one embodiment of the liquid crystal display device
in accordance with the invention.
[0096] FIGS. 30(a) to 30(c) are diagrams showing pictorial views of
test signals of one embodiment of the liquid crystal display device
in accordance with the to invention.
[0097] FIGS. 31(a) to 31(c) are diagrams showing pictorial views of
test signals of one embodiment of the liquid crystal display device
in accordance with the invention.
DETAILED DESCRIPTION OF THE INVENTION
[0098] is FIG. 1 is a diagram showing a plan view of a liquid
crystal display device in accordance with one embodiment of the
present invention. This liquid crystal display device includes a
lamination of one substrate SUB1 and a remaining substrate SUB2
with a liquid crystal layer interposed between them. The one
substrate SUB1 has formed on its inside surface a matrix array of
thin-film transistors, not shown. The other substrate SUB2 has
formed on its inside surface three primary color filters and more
than one counter electrode. A counter voltage will be applied to
the counter electrode via a wiring line or lines (not shown) formed
on the inner surface of one substrate SUB1.
[0099] The one substrate SUB1 is greater in dimension so as to
extend at its left side and lower side, as seen in FIG. 1, beyond
the edges of the other substrate SUB2 so as to have exposed inner
surface portions. Eleven scan drive ICs (gate drivers) GDR are
mounted by FCA schemes at the left side peripheral portion, whereas
eleven signal drive ICs (drain drivers) DDR are mounted at the
lower side periphery (in FIG. 1, these elements are shown by their
mount positions).
[0100] The one substrate SUB1 has a test pad formation region TTP.
Part with this test pad formation region TTP is disposed on a
portion of the substrate SUB1 which will be cut and removed along a
cut line CTL after completion of the liquid crystal display
device.
[0101] FIG. 2 is an enlarged diagram of the test pad formation
region TTP of FIG. 1. The test pad formation region TTP is formed
in a cut removal region of one substrate SUB1, which portion will
be cut away along cut line CTL of the final product. This test pad
formation region TTP is arranged such that gate driver side test
pads GLTP and drain driver side test pads DLTP plus test pads Vcom
of the counter electrode lead lines are linearly laid out at equal
intervals.
[0102] The gate driver side test pads GLTP are classified into
three or four groups, whereas the drain driver side test pads DLTP
are classified into six groups, wherein ten to eleven test pads in
total are provided, along with the counter electrode lead-line test
pad Vcom. Accordingly, with this illustrative embodiment, it is
possible to perform all the tests at one time by use of an array of
ten to eleven probes that are equally spaced.
[0103] Alternatively, it is also possible to dispose the gate
driver side test pads GLTP and drain driver side test pads DLTP in
such a way that they are separated from each other, which in turn
makes it possible to provide a design in which these test pads and
the associated counter electrode lead line test pad Vcom are
provided at an appropriate position for use in carrying out a gate
driver side test and drain driver side test independently of each
other.
[0104] In this way, the above noted embodiment is capable of
increasing the width and length plus the layout pitch of the test
pads to be connected to signal line leads; and, thus, it becomes
possible to enhance the contact accuracy, while at the same time
facilitating production of the probes to be used. In addition, it
is possible by standardization of such probes to manufacture a test
apparatus or equipment capable of offering enhanced applicability
to a wide variety of different types of products.
[0105] FIGS. 3(a) and 3(b) are pictorial representations of wiring
patterns at main parts of the liquid crystal display device in
accordance with one embodiment of the instant invention, wherein
FIG. 3(a) shows gate line side wiring leads, whereas FIG. 3(b)
shows drain side wiring leads. In FIG. 3(a), reference character
"GDR" designates gate driver mount positions; GTM denotes gate
driver output terminals (gate line lead terminals); TTA indicates
gate driver input terminals; ASCL denotes a static electricity
suppression common line; C1, C2, C3 denote three scan line side
common lines for common connection of three groups of gate line
leads of multiple gate drivers corresponding to the front stage,
next stage and rear stage thereof, or, alternatively, four groups,
in order to change polarities in units of dots; GLTP (GA, GB, GC)
denotes test pads formed at respective scan line side common lines
C1, C2, C3; PB denotes a probe; and LCT1 and LCT2 denote laser cut
lines. The test pads GLTP (GA, GB, GC) formed at respective scan
line side common lines C1, C2, C3 are disposed at specified
locations, as shown in FIG. 2.
[0106] In this wiring structure, in FIG. 3(a) showing the gate
driver side, after completion of manufacturing of the one substrate
SUB1, the scan line side common lines C1, C2, C3 are cut away along
the laser cut line LCT1 for separation from the static electricity
suppression common line ASCL. Cutting the scan line side common
lines C1, C2, C3 away from the static electricity suppression
common line ASCL results in respective scan line side common lines
C1, C2, C3 becoming test wiring leads of three or four independent
systems.
[0107] In this state, probes PB are attached to the test pads GLTP
(GA, GB, GC) formed at respective scan line side common lines C1,
C2, C3 to thereby execute the intended connection failure test and
turn-on or "lighting" test.
[0108] After having finished the test procedure, respective scan
line side common lines C1, C2, C3 are separated from the gate
driver output terminals GTM at the laser cut line LCT2; and, then,
gate drivers are FCA mounted between the output terminals GTM and
the gate driver input terminals TTA.
[0109] Similarly, in FIG. 3(b) showing the drain driver side, after
having manufactured the one substrate SUB1, the signal line side
common lines C4, C5, C6, C7, C8, C9 are cut away along the laser
cut line LCT1 for separation from the static electricity
suppression common line ASCL. Cutting the signal line side common
lines C4, C5, C6, C7, C8, C9 away from the static electricity
suppression common line ASCL results in respective signal line side
common lines C4, C5, C6, C7, C8, C9 becoming test wiring leads of
six independent systems.
[0110] In this state, probes PB placed in contact with the test
pads DLTP (B1, is B2, G1, G2, R1, R2) formed at respective signal
line side common lines C4, C5, C6, C7, C8, C9 to thereby execute
the intended connection failure test and lighting test.
[0111] After having completed the tests, respective signal line
side common lines C4, C5, C6, C7, C8, C9 are separated from the
drain driver output terminals DTM at the laser cut line LCT2; and,
then, drain drivers are FCA mounted between the output terminals
DTM and the drain driver input terminals TTB.
[0112] Additionally, in the lighting test, a probe is attached to
the counter electrode lead line test pad Vcom for application of a
specified voltage to thereby create an electric field for
controlling the orientation of liquid crystals between it and a
pixel electrode connected to the output electrode of a thin-film
transistor, thus checking for the presence or absence of turn-on or
"lighting" of a pixels.
[0113] Optionally, the laser cut lines LCT1, LCT2 are replaceable
with etching cut lines f or use in separation through etching
processes. Other known similar suitable cutting methods are also
employable.
[0114] FIG. 4 is a waveform diagram illustrating exemplary test
signals to be applied to the drain test pads DLTP (B1, B2, G1, G2,
R1, R2) and test pads GLTP (GA, GB, GC) during the lighting test
procedure according to one embodiment of the liquid crystal display
device of this invention. Note here that these test signals are of
the so-called dot inversion scheme, wherein the illustrative
voltage value pulse widths and pulse intervals and others are mere
examples.
[0115] Applying the test signals shown in FIG. 4 to respective test
pads makes it possible to execute a lighting test through turn-on
of a certain display pattern on a per-system basis.
[0116] With this embodiment, it is possible to provide the intended
liquid crystal display device having a unique wiring lead structure
capable of a variety of tests by simultaneous contact of probes
with all the terminals in an all-at-a-time manner, while making it
possible by standardization of the pattern of test terminals to
employ test equipment having probes for common use with a wide
variety of different types of products.
[0117] FIGS. 5(a) and 5(b) are pictorial representations of wiring
patterns at main parts of another embodiment of the liquid crystal
display device in accordance with the invention, wherein FIG. 5(a)
shows gate line side wiring leads, whereas FIG. 5(b) shows drain
side wiring leads. In FIGS. 5(a) and 5(b) the same reference
characters are used to designate corresponding parts having the
same functions as the parts shown in FIGS. 3(a) and 3(b).
[0118] In the embodiment shown herein, the scan line side common
lines C1, C2, C3 are connected to the static electricity
suppression common line ASCL at a location outside the cut lines
CTL, rather than to the gate driver input terminals TTA. Similarly,
the signal line side common lines C4, C5, C6, C7, C8, C9 are
connected to the static electricity suppression common line ASCL at
a location outside the cut lines CTL, rather than to the drain
driver input terminals TTB.
[0119] With such an arrangement, it becomes possible when cutting
on the static electricity suppression common line ASCL after
production of the substrate SUB1 to make the respective groups or
"systems" formed of the scan line side common lines C1, C2, C3 and
the signal line side common lines C4, C5, C6, C7, C8, C9
independent of one another. This in turn makes it possible to
reduce by one the requisite number of laser cut (or etching cut)
processes.
[0120] With this embodiment also, it is possible to provide the
intended liquid crystal display device having a unique wiring lead
structure capable of accommodating a variety of tests by
simultaneous contact of probes with all the terminals in an
all-at-a-time manner, while making it possible by standardization
of the pattern of test terminals to employ test equipment having
probes for common use with a wide variety of types of different
products.
[0121] As another embodiment of the invention, the signal line side
common lines C4, C5, C6, C7, C8, C9 in FIG. 3(b) are "disassembled"
between respective blocks; and, then, a test pad (s) is provided
between respective blocks. Thus, it is possible to increase the
number of kinds of display patterns for use during inspection.
[0122] It should be noted that, although in the respective
embodiments stated supra the gate side is designed into three or
four groups or "systems" for provision of the common lines C1, C2,
C3, this may be modified as still another embodiment of the
invention in a way such that the gate line side is tested through
simultaneous attachment of the probes to all the terminals
concerned, as in the prior art, in view of the fact that the gate
side terminals are designed to have relatively large terminal
widths and pitches when compared to the drain side terminals. One
preferred configuration of this embodiment is shown FIG. 11(a).
[0123] In addition, as yet another embodiment of the invention,
transistors or diodes are disposed between the scan line side
common lines C1, C2, C3 and the signal line side common lines C4,
C5, C6, C7, C8, C9 shown in FIGS. 3(a) and 3(b) or FIGS. 5(a) and
5(b), on the one hand, and the gate driver output terminals (gate
line lead terminals) GTM and drain driver output terminals (drain
line lead terminals) DTM, on the other hand, for separation between
respective lines with respect to test signals.
[0124] With any one of the above-noted embodiments, it is also
possible to provide the intended liquid crystal display device
having a unique wiring lead structure capable of accommodating a
variety of tests by simultaneous contact of probes with all the
terminals in an all-at-a-time manner, while making it possible by
standardization of the pattern of test terminals to employ test
equipment having probes for common use with a wide variety of
different types of products.
[0125] Although only liquid crystal display devices of the type
with gate drivers and drain drivers that are mounted using
so-called FCA mount techniques are explained in connection with the
above embodiments, the test circuitry of this invention may also be
applied to liquid crystal display devices of the type in which such
drivers are mounted using prior known TCP techniques.
[0126] An explanation will next be given of an example of the
entire arrangement of a liquid crystal display device embodying the
invention, along with examples of its operatively associated drive
system and application equipment.
[0127] FIG. 6 is a block diagram of a drive system of an ordinary
or standard active-matrix liquid crystal display device to which
the invention is applied. This liquid crystal display device
comprises a liquid crystal panel PNL including two substrates with
a liquid crystal layer disposed therebetween, data line (drain
signal line or drain line) drive circuits (IC chips) corresponding
to the aforesaid drain drivers DDR at the periphery of this liquid
crystal panel, scan line (gate signal line or gate line) drive
circuits (IC chips) Corresponding to said gate drivers GDR, a
display control device CRL for use, as display control means for
supplying these drain drivers DDR and gate drivers GDR with display
data and/or clock signals along with gray-scale gradation voltages
and the like for image display operations, and a power supply
circuit PWU.
[0128] Signals coming from an external signal source, such as a
computer, personal computer, television receiver circuitry or the
like, which include display data (said display signals), control
signal clocks, display timing signals and synchronization signals,
are input to the display control device CRL. The display control
device CRL is provided with a gradation reference voltage
generating unit, a timing converter TCON and other elements, and is
operable to convert externally incoming display data into certain
data of the format adaptable for display on the liquid crystal
panel PNL.
[0129] Display data and clock signals f or the gate drivers GDR and
drain drivers DDR are supplied in the way shown in FIG. 6. A carry
output at the front stage of drain driver DDR is directly supplied
with no changes to a drain driver carry input at the next
stage.
[0130] FIG. 7 is a block diagram showing a schematic arrangement of
respective drivers of the liquid crystal panel and also signal
flows therein. A drain driver DDR is constituted from a data latch
unit for latching display data (display signal), such as a video
(image) signal or the like, and an output voltage generation
circuit. In addition, a gray-scale or gradation reference voltage
generator HTV, multiplexer MPX, common voltage generator CVD,
common driver CDD, level shift circuit LST, gate-on voltage
generator GOV, gate-off voltage generator GFD and DC-DC converter
D/D are provided on a circuit board with the display control device
CRL; and, the power supply circuit PWU of FIG. 6 is mounted
thereon.
[0131] FIG. 8 is a timing diagram showing display data that is
input from a signal source (main body) to the display control
device and signals that are output from the display control device
to the drain and gate drivers. The display control device CRL
receives from the signal source control signals (clock signal,
display timing signal and synch signal) for generating a clock D1
(CL1), a shift clock D2 (CL2) and display data as control signals
being sent to drain drivers DDR, and, simultaneously, it generates
a frame start instruction signal FLM, clock G (CL3) and display
data as control signals passed to gate drivers GDR.
[0132] Note here that in a scheme using a low-voltage differential
signal (LVDS signal) for transmission of display data from the
signal source, the LVDS signal from the signal source is supplied
to gate drivers GDR and drain drivers DDR after completion of
conversion to an original signal at an LVDS receiver circuit, which
is mounted on a circuit board (interface substrate) on which the
above-stated display control device is also mounted.
[0133] As apparent from viewing FIG. 8, the drain driver's shift
clock signal D2 (CL2) has the same frequency as the clock signal
(DCLK) and display data input from a main-frame computer; in XGA
display elements, the frequency is as high as about 40 megahertz
(MHz). The liquid crystal display device thus arranged features a
reduced thickness and low power consumption, and is expected to be
widely employed as a display device in various fields in the near
future.
[0134] FIG. 9 shows the exterior appearance of one example of a
display monitor adaptable for use as electronic equipment with the
liquid crystal display device of the present invention mounted
therein. The liquid crystal display device is mounted as a screen
of this monitor, that is, a display section thereof. The liquid
crystal display device constituting this display monitor is one
that has passed the open-circuit test and lighting test by use of
the test circuitry explained in conjunction with the embodiments of
the present invention, and, thus, it is high in reliability. Thus,
it is possible to obtain high-quality on-screen images for an
increased length of time.
[0135] It must be noted that the liquid crystal display device
incorporating the principles of the invention should not be limited
to the above-noted display monitor and may alternatively be used as
the monitor of a desktop personal computer and a notebook personal
computer, a television receiver, and a display device of any other
equipment.
[0136] An explanation will next be given of an exemplary main-part
configuration of the present invention in more detail.
[0137] The scan line side common lines will be explained first.
[0138] FIG. 12(a) shows an example with two lines C1, C2 being
formed as the scan line side common lines.
[0139] All-line simultaneous turn-on or "lighting" is possible even
when connecting neighboring scan signal lines to the same scan line
side common line. However, difficulties occur in relation to
flicker lighting tests. In view of this, is at least two scan line
side common lines are provided, as shown in FIG. 12(a).
[0140] Additionally, the above effect remains similar upon
application to an arrangement with the scan signal lines and static
electricity suppression common line ASCL being electrically
disconnected from each other, as shown in FIG. 12(a). Further,
since the scan signal lines are connected to either one of the scan
line side common lines C1, C2 in units of a groups, it is possible
to suppress or reduce the influence of static electricity applied
thereto, as compared to the case in which the scan signal line
exists alone. In this case, an ASCL cutting process will no longer
be required, thus enabling reduction in the number of process steps
resulting in a likewise decrease in production costs.
[0141] The storage capacitor of a pixel may be formed of either one
of Cadd and Cstg.
[0142] FIG. 13(a) shows an example with three lines C1, C2, C3
formed for use as the scan line side common lines, and FIG. 13(b)
is an example that does not have its ASCL.
[0143] As stated as the means, in regard to flicker, the influence
of a "jump-in" voltage upon writing into a TFT is also present. To
let this be closer to a real-use state, it is desirable that more
than three scan line side common lines be employed in specific
liquid crystal display devices of the so-called Cadd type with a
capacitor for storage of electrical charge that is written into a
pixel electrode being formed in particular between the pixel
electrode and scan signal line at the rear stage. In view of this,
the illustrative embodiment is designed so that the front stage
pixel Cadd is formed on a scan signal line at the self stage, and,
further, the self stage pixel Cadd is formed on a scan signal line
at the rear stage. Obviously, a Cstg may also be used. Note,
however, that with this arrangement, for six pixels ABCDEF aligned
in a direction along the image signal line extension direction,
since the polarities of respective pixels relative to a reference
signal potential become "+-++-+" by way of example, as has been
stated as the means, resulting in occurrence of a problem that
pixels C and D, for example, are the same in polarity as each
other, it is desirable that four lines, as will be shown later, are
employed, or, alternatively, two lines, as has been shown
previously, are to be employed especially for liquid crystal
display devices of the type having a pixel structure with
Cadd-scheme capacitance section, the use of four lines, as will be
set forth below, is more desirable.
[0144] FIG. 14(a) shows an example with four lines C1, C2, C3, C10
formed as the scan line side common lines, whereas FIG. 14(b) is an
example that does not have its ASCL. Whereby, it is possible for
pixels in the video signal extension direction to be opposite in
polarity to each other in the way stated previously. This makes it
possible to perform tests that are closer to real use states, thus
improving the inspection accuracy.
[0145] An explanation will next be given of the signal line side
common lines.
[0146] FIG. 15(a) shows an example with three lines C4, C6, C8
formed as the signal line side common lines.
[0147] One significant feature of the present invention is that the
signal line side common lines are separated in units of the colors
of the color filters for reduction of the requisite number of test
pads to thereby reduce probe costs and also enable inspection of
high-precision products, while at the same time carrying out tests
through the displaying of colors. And, if such color filters are of
the three primary colors of red, green and blue, any intended tests
as to almost every color displayable by any products become
possible by using as test patterns white produced by simultaneous
lighting of respective colors and individual lighting in units of
respective colors for discrete tests of red, green and blue, with
or without control of gray-scale gradation levels of respective
colors. Obviously, the colors should not be limited only to red,
green and blue. Similar results are also obtainable with liquid
crystal display devices using color filters of the so called
complementary color type with cyan, magenta and yellow. The same
applied to all of the embodiments set forth herein. With the
present invention, color purity tests of respective colors become
possible. Further, the display irregularity inspection accuracy was
significantly improved for liquid crystal display devices which are
inherently subjected to all-color simultaneous lighting tests only.
The color filters required are formed through processes of
individual deposition and exposure plus development in units of
colors or, alternatively, impregnation of individual colors.
Accordingly, in-plane uniformities of color densities or
distribution on a film thickness plane occur in units of respective
colors. In the case of simultaneous lighting of respective colors,
the influences of these ordinarily become difficult to observe. For
example, in a case where the film thickness of red alone locally
changes, influence of such red film thickness local change upon
brightness or illuminance in the event of simultaneous lighting of
the three colors of red, green and blue becomes about 1/3 of that
in the event of the unicolor displaying of red. Thus, only the use
of all-color simultaneous lighting results in a decrease in
inspection sensitivity regarding illuminance irregularities-in
particular color irregularities. This is the reason.
[0148] FIG. 15(b) shows an example that does not have its ASCL.
With this arrangement also, certain static electricity suppression
effects are realizable while reducing the requisite number of
manufacturing processes in a similar way to that of the scan side
common lines of FIG. 12(b).
[0149] FIG. 16(a) shows an example with six lines C4, C5, C6, C7,
C8, C9 formed as the signal line side common lines. This
arrangement is characterized in that the signal line side common
lines are separated into those for positive and those for negative
polarities in units of at least colors of the color filters. More
specifically, six signal line side common lines are provided with
respect to color filters of the three primary colors of red, green
and blue. Known liquid crystal display device driving methods
typically include a common inversion drive method and a dot
inversion drive method. The common inversion drive is such that at
least three signal line side common lines are employed, as
discussed above, due to the fact that in most cases, the pixels
neighboring in a scan signal line extension direction are the same
as each other in polarity relative to the reference signal
potential. On the contrary, the dot inversion drive method is such
that neighboring pixels in the scan-signal extension direction are
ordinarily driven in such a way that these are of opposite
polarities relative to the reference signal potential. Due to this,
in the case of using three signal line side common lines in dot
inversion events, six certain pixels neighboring in the scan line
extension direction become "+-++-+" by way of example--in this
case, any intended polarity inversion is no longer realizable
between B and R. This makes it difficult during turn-on or
"lighting" tests to accurately inspect flicker, that is, brightness
irregularity. To avoid this, six signal side common lines are
employed for use as positive and negative polarities in units of
color filter colors, thus making it possible for six pixels of
RGBRGB to have an alternate opposite polarity pattern of "+-+-+-",
thereby enabling improvement of flicker inspection accuracy.
[0150] The scan line side common line arrangements shown in FIGS.
12(a) to 14(b) and the signal line side common line configurations
of FIGS. 15(a) to 16(b) are combinable together whereby both
effects are obtainable at one time.
[0151] An explanation will next be given of the cutting of LCT1,
CLT2 shown in a respective one of FIGS. 12(a) through 16(b).
[0152] FIG. 17(a) shows one example in the case of a TCP scheme.
The ASCL is formed inside of a substrate edge portion and is
electrically connected to scan signal lines. At a pre-test stage,
the ASCL is separated from respective scan signal lines in a region
LCT1. This is for inspection of respective colors. Without this
cutoff process, these lines remain connected to the ASCL resulting
in connection of respective scan signal lines via scan line side
signal lines so that any intended unicolor inspection is
impossible. Separation may be carried out by any one of various
laser beam cutting techniques, etching techniques, and techniques
for cutting a substrate in the region. Laser beam cutting
techniques offer the highest positioning accuracy so that it is
possible to reduce the distance between the scan side signal lines
and the ASCL, which advantageously makes it possible to effectively
utilize the area of a mother glass plate, resulting in an increase
in the size of products as taken from the same mother plate. The
use of etching techniques enables all-at-a-time processing with an
increased number of substrates being put into the etching liquid.
In this case, a structure is required for allowing a
to-be-separated layer to be exposed in advance in a to-be-separated
region, and it is desirable that a conductive layer at such part be
a single layer. One exemplary arrangement is one in which a
terminal section is formed of a single layer of transparent
conductive material such as ITO or is covered with it while forming
an etching portion using metals and also employing different
etching liquids therebetween. With such an arrangement, it is
possible to avoid risks of unintentional removal of the terminal
section. Regrettably, in this case, a larger region than that
produced by laser cut techniques is required. With a separation
technique through cutting of a substrate per se, a groove is
ordinarily formed by a scribing blade or laser beam, and,
thereafter, a pressure is applied for cutting the substrate in the
region. In this case, separate on is physically done completely;
thus, risks of separation deficiency may be minimized. However,
this advantage does not come without an accompanying penalty in
that an unintentional region can also be cut away; for example,
scan line side common lines can be cut accidentally in some cases.
Determining which one of the techniques should be used mainly
depends on exact arrangements of manufacturing lines. From the view
point of a profit-maximum policy requiring an increase in the
number of products per mother glass plate and also size
maximization thereof, the use of laser cut techniques is is
recommended because it attains these objects successfully.
Additionally, although this process is unnecessary for the
arrangement with SACL and scan signal lines are separated in
advance, use of the ASCL is desirable f or perfectivity purposes,
while the presence of scan line side common lines per se offers
certain static electricity suppression effects.
[0153] After separation, test probes PB are placed in contact with
scan line side test terminals GLTP, which are provided and
connected to the scan line side common lines; and, then, one or
more test signals are input for inspection. Certain ones that are
judged to have defects through this inspection include repairable
ones, e.g. those with defects curable through correction using a
laser beam. These defective ones undergo repairing processes and,
thereafter, are again subjected to inspection. If the defects are
satisfactorily repaired, then such liquid crystal elements will be
handled as good products. Thus, it is possible to reduce the
rejection rate. Note here that one principal feature of the present
invention lies in its enhanced applicability to unicolor
test/inspection procedures. More specifically, in regard to
continuous point defects or the like at two neighboring pixels, any
intended detection becomes unattainable if only the all-color
simultaneous lighting scheme is supported. One example is that, if
a red pixel and its neighboring green pixel are short-circuited
together, then the judgment of "no abnormality" is made in the
all-color simultaneous lighting event. On the other hand, with the
unicolor inspection scheme, if a red pixel is turned on, then not
only the red pixel, but also its neighboring green pixel will turn
on simultaneously, resulting in judgment of the presence of a
bright point defect. As long as defect judgeability is available at
this process step, any defect found is repairable by cutting a
short-circuit portion between red and green pixels by use of a
laser beam, for example, thus permitting it to become a good
product. However, in case only the all-color simultaneous lighting
inspection is possible, such a defect will no longer be detected
until later connect on to drive circuitry at a later process step.
To make a correction at this stage, it is required that a
polarization plate is first removed away, if such a polarization
plate was attached; and, even in a case where the plate is absent,
the drive circuitry will possibly be destroyed during processes for
transportation toward correction apparatus and repairing works. In
either case, the resulting production costs for repairing processes
increase. Alternatively, other defects such as gap defects are
induced during repairing processes, resulting in an increase in the
correction/repair failure rate. Consequently, the enhanced
applicability or "accommodatability" to unicolor test/inspection at
the stage of cells leads to significant advantages as to both
manufacturing yields and production costs.
[0154] A substrate judged as a good product through inspection is
then subject to separation between the scan line side common lines
C1, C2, C3 and the TCP connection pads TCPD along line LCT2. This
separation is carried out through physical cutaway of the substrate
per se. Accordingly, LCT2 becomes one terminate end of the
substrate in the state of a product therearound. Thereafter, as
shown in FIG. 17(a), TCP is mounted; then, the external drive
circuitry and scan signal lines are connected together.
[0155] Although the above explanation concerns the scan signal line
side, an arrangement as to the video signal line side is shown in
FIGS. 18(a) and 18(b), wherein the former corresponds to FIG.
17(a), whereas the latter corresponds to FIG. 17(b). Basic
processes and ideas are the same as those discussed above
[0156] In addition, as apparent from viewing FIG. 17(a) or FIG.
18(b), with the TCP scheme, in the state that a liquid crystal
display device is completed, it is designable so that the
arrangement for inspection based on the schemes and ideas of the
present invention as disclosed herein does not reside even where
these are applied thereto. However, this invention is inherently
directed at provision of a liquid crystal display device based on
the above techniques, or, is alternatively, to manufacturing
methodology of such liquid crystal display device based on the
above schemes; and, without residence or retention" as a hardware
structure in final products, any available TCP scheme liquid
crystal display devices that are manufactured while incorporating
the techniques or ideas of the invention as disclosed herein should
be considered to fall within the scope and coverage of the present
invention.
[0157] Additionally, although an explanation was made with
reference to the TCP scheme as an example in FIGS. 17(a) to 18(b),
an FCA scheme is substantially the same as the TCP scheme, except
that the former is different from the latter in that the substrate
separation or "cutaway" process at LCT1 or LCT2 employs either one
of laser light and etching in place of the physical cut technique.
Note here that in the case of the FCA scheme, there is a difference
in that judgment as to whether the liquid crystal display device of
interest was manufactured by using the techniques and ideas of the
invention as disclosed herein is relatively easy because of the
fact that at least part of the common lines is left at part of its
substrate even after completion of such liquid crystal display
device.
[0158] A test pad layout method will next be set forth in
conjunction with an example having three common lines on the FCA
scan signal line draw-out side. In the TCP case, the basic ideas
remain identical. Additionally, the same ideals can be applied even
when the common lines used become different in number.
[0159] FIG. 19(a) shows an example in which gate driver side test
pads GLTP are provided on one side of a single chip GDR, or are
alternatively provided in a certain region with an ensemble of
terminals laid out therein if in the TCP case, wherein
manufacturing of probes PB is made easier. Next, FIG. 19(b) shows
an example with an alternate layout, wherein it becomes possible to
provide an arrangement for enlarging test pads GLTP on a per-pad
basis, which in turn makes it possible to facilitate position
alignment of probes PB while at the same time reducing the
test/inspection time period required. FIG. 19(c) shows an example
with the test pads GLTP provided in a different region from the
scan line side common line draw-out region. With such an
arrangement, design flexibilities in both layout and size
increases. FIG. 19(d) shows an example with the test pads provided
on both sides. With this arrangement, it is possible to suppress
unwanted waveform rounding of test signals as supplied from
scan-line side common lines toward a scan line, thereby permitting
achievement of tests closer to real drive states.
[0160] The video signal draw-out side is the same in concept as the
scan signal line drawout side. Several example of the case of using
six signal line side common lines are shown in FIGS. 20(a) to
20(d). FIG. 20(a) shows an example with the test pads PB arranged
on one side. FIG. 20(b) shows an example with an alternate draw-out
on the opposite sides. An increase in the number of probes PB
results in an increase in position alignment accuracy due to
enlargement of the size of GLTPs when compared to the case of FIGS.
19(a) and 19(b). FIG. 20(c) shows an example with GLTPs arranged in
units of positive and negative polarities. FIG. 20(d) shows an
example with a both-side arrangement.
[0161] Several examples of the GLTP layout in a multiple chip mount
region, if in the FCA case, or in a region spanning a plurality of
regions each including an ensemble of terminals, if in the TCP
case, will next be explained, with a scan line side region in FCA
being used as an example, along with some examples thereof.
Obviously, the same ideas are applicable in case the common lines
are different in number and to the drain side also, and the
following explanation is devoted to mere examples thereof.
[0162] FIG. 21(a) shows an example in which gate driver side test
pads GLTP are laid out on the opposite sides of each scan drive IC
mount region GDR. In this case, it is possible to minimize the
power-feed-resistivity, thus enabling achievement of tests closer
to real drive states. FIG. 21(b) shows an example with GLTPs
provided in units of groups each including a plurality of GDRs. In
this case the requisite number of probes may be reduced resulting
in a decrease in probe production costs. FIG. 21(c) shows an
example in which GLTPs are provided alternately with respect to a
plurality of signal line side common lines between adjacent ones of
multiple GDRS. In this case it is possible to reduce probe costs
and also increase the area of GLTP per single one. FIG. 21(d) shows
an example with GLTPs formed in a region outside a signal line side
common line formation region. In this case, it becomes possible to
increase design flexibilities while simultaneously facilitating
probe position alignment. Additionally, with this arrangement, it
becomes possible, by specifically designing GLTPs in such a manner
as to have identical pitches with respect to one edge face on a
substrate, to commonly use probes among a variety of types of
products with different terminal layout pitches, thus enabling
reduction in the number of test/inspection equipment and also
reduction in probe costs. FIG. 21(e) shows an example with
modification in the railing pattern of leads from GDR's signal line
side common lines at one end to GLTPS. In the arrangement of FIG.
21(d), only a single one nearest to an edge will be reversed from
the other portions in layout of terminals within GLTPS. Use of the
arrangement of FIG. 21(e) avoids this risk, which will be
advantageous especially for achievement of probes applicable to
multi-type products. Alternatively, a case in which GLTPs per se
are eliminated at portions reversed from the other portions in FIG.
21(d) is shown in FIG. 21(f). In this case, similar results to FIG.
21(e) are obtainable, while permitting probe number reduction;
unfortunately, the resultant signal power feed is from one-side
only f or the GDRs so that it suffers from a problem that pixel
regions pertaining to the GDRs become relatively lower in accuracy,
in particular as to flicker, than the remaining regions.
[0163] Next, further examples and concepts will be described below
in is conjunction with the drains by way of example.
[0164] FIG. 22(a) shows an example of drain driver side test pads
for signal drive IC mount regions DDR. DLTPs are disposed so that
they are shifted in position between DDRS. With such an
arrangement, it becomes possible to enlarge the area of each test
pad DLTP, thus making easier positioning of the probes PB. FIG.
22(b) shows an example that employs a similar layout for DLTPs on
an edge face. In this case, a probe unit may be constituted from a
plurality of probes of the same arrangement, thus enabling
reduction of probe production costs. FIG. 22(c) is an arrangement
similar to that of FIG. 22(b) with a feature added thereto of
alternately arranging DLTPs in units of signal line side common
lines. With this example, it is possible to enlarge DLTP per single
one. Especially, the drain side is greater in line number than the
gate side, and its increased amount is greater than that of the
aspect ratio of a liquid crystal display device; thus, the distance
or interval between chips on the drain side becomes narrower than
that of the gate side. Thus, it becomes difficult in some cases to
provide sufficient surface areas used f or DLTP formation. Even in
such case, use of the arrangement of FIG. 22(c) makes it possible
to attain the intended DLTP layout. FIG. 22(d) is the one
incorporating the same ideas as those of FIG. 21(d), wherein DLTPs
are formed in a region that is out of the scan line side common
line formation region. An arrangement for removal of DLTPs on the
edge face based on the same concepts as FIG. 21 (f) is shown in
FIG. 22(e). The arrangement of FIG. 22(f) is based on the same
concepts as FIG. 21(e).
[0165] Flicker inspection accuracy is variable depending upon the
influence of a very small voltage difference between pixels; thus,
it is necessary to control any possible delays of signal waveforms
during inspection. Thus, it is desirable that an increased number
of test pads for input of test signals to signal line side common
lines be provided with respect to each signal line, which number is
is given as (n-1)/2 or more, where "n" is the number of pads per
unit region, which may be a chip mount region or alternatively a
region with an ensemble of signal wiring leads provided therein. In
addition, to suppress probe cost increases, it is desirable that
the pad number be set at 2.times.(n+1) or less The respective types
of examples stated above are the ones that are disclosed, while
incorporating this concept also.
[0166] It is also desirable that the number of test signal
terminals for inputting test signals to scan signal lines is
greater than the number of test signal terminals for input of test
signals to video signal lines. This is based on a requirement for
reducing the input resistivities of the video signal line side
while taking account of the fact that execution of the intended
test/inspection with the above-noted arrangements requires that the
input frequencies of certain test signals to be applied to the
video signal lines during inspection be higher than or equal to
input frequencies of test signals being applied to the scan signal
lines.
[0167] In addition, advantages as to lower resistivities are
obtainable by providing a region formed of a specific wiring layer
with the lowest resistivity in the liquid crystal display device at
any one of those wiring leads associated with the signal line side
common lines or alternatively between the signal line side and test
pads and leads associated with the scan line side common lines or
between the scan line side common lines and test pads.
[0168] An example for further reduction of the test pad number will
be set forth next. Although the gate side will be explained as an
example, the same concepts are also applicable to the drain
side-additionally, the same concepts are applicable even with TCP.
As a representative of these, the gate side of FCA wall be
explained as one example.
[0169] FIG. 23 shows an example wherein wiring leads that are drawn
out of more than one signal line side common line are provided
causing a respective one of such draw-out wiring leads to be
connected to a different common line with GLTPs arranged at least
at selected ends thereof. With such an arrangement, it becomes
possible to reduce the requisite number of GLTPs to the extent that
it is equal to the number of scan line side common lines if on the
gate side or to the number of signal line side common lines if on
the drain side.
[0170] Thus, it is possible to noticeably reduce probe production
costs while at the same time shortening a test time period due to
an ability to facilitate the position alignment of probes used.
[0171] However, it is inevitable for this arrangement that a
waveform delay occurring due to influence of electrical lead
resistivities is degraded when compared to the case of prove ding a
great number of GLTPS. To suppress such influence, it is desirable
that the different common line be designed to at least partly have
a layer of specific material of the lowest resistivity among parts
in the liquid crystal display device or alternatively a layer of
the same material with its resistivity made lower than
within-the-pixel leads by widening the line width thereof.
[0172] Next, a scheme will be described for efficiently performing
cutting along line LCT1, and, in particular, with respect to an
arrangement that is capable of efficiently performing such a
process by use of a laser beam, along with one example thereof.
[0173] FIG. 24(a) shows the state before the embodiment of FIG.
21(f) is cut along line LCT1, i.e. the test pads are connected to
ASCL. Separation using a laser beam is ordinarily performed in a
way such that an optical system of the laser beam is fixed while
allowing the substrate the move. This is because of to the fact
that, while the optical system associated with the laser beam is
precise, so that deviation can take place in the optical system
when it is moved frequently, causing an optical axis of the laser
light to be likewise deviated or offset can result in accidental
cutaway of portions other than a specified region. In addition,
repair in such a case is also precise and thus requires a
lengthened is time period; and, in view of this, the laser beam is
fixed while allowing the substrate to move. In this case, the time
taken for separation may be shortened if an increased clearance is
present between the region to be cut and the region that must not
be cut. This is so because movement is carried out by mechanical
mechanisms, and so, in case the substrate is moved more quickly,
the resultant offset due to such movement tends to likewise
increase. Then, forming the LCT1 region outside a chip region makes
it possible to expand the clearance region; thus, it is possible to
shorten the time required for separation using laser light
accordingly, thereby enabling improvement of throughputs and yields
plus costs. Further, forming a cut region linearly permits
achievement of higher speed performance.
[0174] FIG. 24(b) shows an example with the GLTP number reduced as
in FIG. 23 and with LCT1 provided at its distal end part. It is
possible to reduce the length of the region to be cut, thus
enabling a significant decrease in the processing time period. FIG.
24(c) is another example different in GLTP position from that of
FIG. 24(b). FIG. 24(d) is a further example of application the
concept of FIG. 23 to both the scan line side and the gate line
side, while designing GLTP and DLTP so that they are disposed
concentrically. With such an arrangement, a further time reduction
is possible. Especially, in the case of a concentrated layout at an
edge portion of the substrate, the intended LCT1 separation may be
achieved only by a one dimensional cutting process with the
substrate as a whole; thus, positional alignment of the substrate
for laser cutting is completed through a single trial, thereby
shortening the time required. Additionally, the arrangement with
test pads concentrated along one side in the way discussed above
offers many advantages including the ability to readily realize
production of probes for common use with multiple products, as
shown in FIG. 2, and to make probe positioning easier.
[0175] Next, concepts and examples concerning signal waveforms
during the is test procedure will be shown. FIGS. 25(a) to 25(c)
show an example in a case where the signal line side common lines
on the drain side are formed of three lines for the three primary
colors RGB, respectively, whereas the scan line side common lines
consist of two lines. An explanation will be given using a dot
inversion drive as an example. FIG. 25(a) shows the concept of the
drive waveform; while, FIGS. 25(b) and 25(c) show certain pixel
polarities relative to a reference voltage potential Vcom, which
pixels correspond to six adjacent cells as constituted from RGBs
and first and second scan lines in first and second frames at this
time.
[0176] As apparent from comparing FIGS. 25(b) and 25(c), with this
arrangement, voltage potentials of the same polarity are always
applied to the pixels, resulting in degradation of liquid
crystals.
[0177] Test waveforms remedying this are shown in FIG. 26(a). As
shown in FIG. 26(a), the frequency of a signal as input to a video
signal line is 1/2 of that of FIG. 25(a). Whereby, it is possible
to invert the pixel polarity between the first and second frames as
shown in FIGS. 26(b) and 26(c), thus making it possible to prevent
DC components from mixing into the liquid crystals.
[0178] FIGS. 27(a) to 27(c) are directed to a case in which two
lines of positive and negative polarities are formed in units of
RGBs as the signal line side common lines on the drain side,
resulting in provision of six lines in total.
[0179] With this arrangement, it is possible to realize a standard
dot inversion drive state wherein the voltage potentials of the
pixels in the first and second frames, as shown in FIGS. 27(b) and
27(c), are mutually inverted in units of frames, while at the same
time causing inversion between neighboring pixels in any event.
Thus, it is possible to carry out flicker inspection with high
accuracy near real in use states.
[0180] FIGS. 28(a) to 28(c) are directed to one example of the case
of common inversion. In this case, use of three signal line side
common lines for RGB respectively and two scan line side common
lines results in realization of a line inversion drive scheme, the
first frame and second frame of which are shown in FIGS. 28(b) and
28(c), respectively. Accordingly, in the case of common inversion,
employing three signal line side common lines and two scan line
side common lines makes it possible to realize flicker tests with
higher accuracies near real use states.
[0181] FIGS. 29(a) to 29(c) are directed to is an example in which
the scan line side common lines consist of three lines in the
arrangement of FIGS. 27(a) to 27(c).
[0182] In this case, driving is attainable by three lines at the
front, self and rear states, as stated previously in the
explanation concerning Cadd; and, thus, it is possible to perform
tests while allowing the influence of "jumping" voltages at TFTs to
be in a state closer that of the final products. However, this
suffers from a disadvantage as to the incapability to provide
complete dot inversion due to the fact that GA and GC become the
same polarity.
[0183] FIGS. 30(a) to 30(c) are directed to another scheme for
preventing harmful DC application to pixels of FIGS. 25(a) to
25(c), which offers similar effects to FIGS. 26(a) to 26(c).
Additional advantages are as follows: these effects in this
arrangement are obtainable by use of a single line for the
individual one of RGB; and, if two lines for use as the positive
and negative polarities are provided in units of RGBs, then the
intended flicker remedy is also realized simultaneously.
[0184] With the illustrative arrangement, the frequency of the
video signal lines is designed to be earlier than that of FIG.
25(a) as shown in FIG. 30(a), while writing a voltage to a pixel
with GA, GB set at "high" level at a timing permitting application
of signals of opposite polarities in the first frame and second
frame, whereby DC superimposition is precluded, the first and
second frames of which are shown in FIGS. 30(a) and 30(c),
respectively.
[0185] FIG. 31(a) shows a set of test signal waveforms for dot
inversion driving that are believed to be the best mode when
totally taking into consideration the test accuracies and probe
costs plus LCD panel frame plate size reduction, wherein the signal
line side common lines on the drain side consist of six lines in
total--i.e. three positive polarity lines for respective colors of
RGB plus three negative polarity lines therefor. In addition, the
scan line side common lines on the gate side consist of four lines
for enabling constant retainment of the front, self and rear
stages, while also realizing flicker suppression. Drive waveforms
are shown in FIG. 31(a), whereby the pixel polarities in the first
and second frames become as shown in FIGS. 31(b) and 31(c)
respectively, thereby enabling realization of the intended dot
inversion, with the polarity inverted between neighboring pixels.
Obviously no problems occur even when this is used for common
inversion. With a liquid crystal display device having such common
lines capable of realizing tests based on these waveforms or the
inspection scheme thereof, it is possible to realize a sufficient
test or inspection procedure while at the same time achieving
higher accuracies with a reduced number of test pads during dot
inversion driving. In addition, forming probes into the form
adaptable for use with this arrangement makes it possible to apply
the same to not only dot inversion but also common inversion, thus
enabling provision of test apparatus or equipment with enhanced
applicabilities.
[0186] As has been explained above, according to the present
invention, it is possible to enlarge the width and length plus
pitch of test pads being connected to signal line leads of a liquid
crystal display device for connection to drain drivers and gate
drivers, thereby making easier production of probes used for
electrical open-circuit tests and turn-on or "lighting" tests even
in the case of using the drivers of high-precision display, while
simultaneously improving test accuracies due to an ability to
effect accurate contact between the probes and test pads, which in
turn makes it possible to provide an improved liquid crystal
display device with increased reliability.
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