U.S. patent application number 12/539081 was filed with the patent office on 2009-12-03 for universal x-ray test bed.
Invention is credited to CHRISTOPHER M. CONE, NICKOLAS MARKOFF, MIKE M. TESIC.
Application Number | 20090296894 12/539081 |
Document ID | / |
Family ID | 40431817 |
Filed Date | 2009-12-03 |
United States Patent
Application |
20090296894 |
Kind Code |
A1 |
MARKOFF; NICKOLAS ; et
al. |
December 3, 2009 |
UNIVERSAL X-RAY TEST BED
Abstract
Systems and methods presented herein provide for the testing and
reconfiguration of x-ray devices. In one embodiment, a test bed
effectuates testing of an acquired x-ray device to determine a
cause of the inoperability of the device. The x-ray device test bed
may be provided to test a plurality of x-ray devices and,
therefore, readily adaptable to such devices. The x-ray device test
bed may include a mount for an x-ray tube. A variable power supply
may be coupled to the x-ray tube to provide the requisite
high-voltage electrical energy thereto. The x-ray device test bed
may also include a mount for an imaging module (e.g., a "flat-panel
sensor"). A processor may be coupled to the imaging module to
determine the operational characteristics thereof. If certain x-ray
components are deemed inoperable, the x-ray components may be
replaced such that the x-ray device may be reintroduced to a
medical industry segment.
Inventors: |
MARKOFF; NICKOLAS; (Golden,
CO) ; CONE; CHRISTOPHER M.; (Golden, CO) ;
TESIC; MIKE M.; (Louisville, CO) |
Correspondence
Address: |
DUFT BORNSEN & FISHMAN, LLP
1526 SPRUCE STREET, SUITE 302
BOULDER
CO
80302
US
|
Family ID: |
40431817 |
Appl. No.: |
12/539081 |
Filed: |
August 11, 2009 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
|
12062894 |
Apr 4, 2008 |
|
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12539081 |
|
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|
60910555 |
Apr 6, 2007 |
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Current U.S.
Class: |
378/207 ;
378/209 |
Current CPC
Class: |
A61B 8/58 20130101; A61B
6/583 20130101; A61B 6/586 20130101; G01R 31/50 20200101; G01R
31/11 20130101; A61B 8/4444 20130101; G01R 31/2886 20130101; Y10T
29/49004 20150115; G01R 27/2605 20130101; G01R 31/66 20200101; G01N
29/30 20130101; A61B 6/585 20130101 |
Class at
Publication: |
378/207 ;
378/209 |
International
Class: |
G01D 18/00 20060101
G01D018/00 |
Claims
1. A test bed for testing different x-ray devices wherein each
includes an imaging module and an x-ray tube, including: a housing
that includes a first support member and a second support member,
wherein the first support member is configured for retaining one of
the x-ray tubes and wherein the second support member is configured
for retaining one of the x-ray imaging modules; a high-voltage
power supply configured for selectively providing a plurality of
voltage levels and for being adapted to provide at least one of the
voltage levels to the retained x-ray tube; and a processor
communicatively coupled to the retained x-ray imaging module to
retrieve electronic data from the retained x-ray imaging module,
wherein the processor processes the electronic data to determine at
least one inoperable component of the x-ray imaging module.
2. The test bed of claim 1, wherein the x-ray imaging modules are
manufactured by different manufacturers.
3. The test bed of claim 1, further including a storage element
operable to store a software module that directs the processor to
generate a report that includes information associated with at
least one inoperable pixel of the x-ray imaging module.
4. The test bed of claim 3, wherein the storage element also stores
a software module that controls a rules processing engine, wherein
the rules processing engine is configured for receiving the
information associated with the at least one inoperable pixel of
the imaging module to determine a requisite compliance.
5. The test bed of claim 4, wherein the requisite compliance
includes a standard, a government regulation, or both.
6. The test bed of claim 1, further including a display interface
configured for displaying an image produced by operable pixels of
the x-ray imaging module.
7. The test bed of claim 6, further including a storage element
operable to store a software module that directs the processor to
display a location of at least one inoperable pixel with the
display interface.
8. The test bed of claim 1, further including a storage element
operable to store a software module that directs the processor to
locate the least one inoperable pixel of the retained imaging
module.
9. The test bed of claim 1, further including a storage element
operable to store a software module that directs the processor to
determine a percentage of operable pixels within the imaging
module.
Description
CROSS REFERENCE TO RELATED APPLICATIONS
[0001] This patent application is a continuation patent application
from and thus claims priority to U.S. patent application Ser. No.
12/062,894 (filed Apr. 4, 2008), the entire contents of which are
hereby incorporated by reference.
BACKGROUND
[0002] Generally, manufacturers of medical equipment, such as
General Electric, Siemens, Phillips, build and service the medical
equipment that they develop. These manufacturers maintain detailed
specifications and circuit diagrams for the equipment such that
their service technicians can perform repairs and they vigilantly
protect that information in order to protect their market share.
For example, by closely guarding the specifications and diagrams of
the x-ray device, the manufacturer may prevent others from entering
the market to service and repair their brand-name devices. And, by
monopolizing the service and repair market for a particular piece
of equipment, the manufacturer is able to extrude even more income
from a sale thereof. Accordingly, the service and repair costs
associated with that device can be quite substantial, even while
the sale price of a particular x-ray device is also very
substantial.
[0003] In many cases, medical devices are almost prohibitively
expensive. For example, doctors and hospitals in smaller markets
(e.g., small towns) are often unable to afford the costs associated
with such devices. Even if it were possible for the smaller market
medical service providers to afford these medical devices, the
costs associated with the service and repair of the devices would
likely put the devices' benefits out of economic reach.
SUMMARY
[0004] Systems and methods presented herein (hereinafter referred
to as the "utility") provide for the testing, servicing, and
reintroduction of electronics into an industry segment. More
specifically, medical equipment, such as x-ray devices are acquired
and configured for reintroduction into an operable status. In one
embodiment, the utility provides for the identification and
acquisition of a medical device from a medical industry segment.
For example, the utility may provide a means for acquiring certain
medical equipment such that they may be tested and/or serviced and
subsequently reintroduced into an operational status for use in a
medical industry segment, such as a hospital or a doctor's
office.
[0005] In one embodiment, the medical equipment is acquired in a
malfunctioning or at least a partially inoperable status. For
example, a hospital, a doctor's office, medical device
manufacturer, or the like, may possess an x-ray device, or other
radiation type medical device, that is not operational. The utility
may receive information pertaining to the medical device that
indicates the type of medical device and the original manufacturer.
An acquisition module may receive the medical device, for example,
by purchasing the medical device from the medical industry segment.
Such a purchase may effectively transfer title of the medical
device to the acquisition module. In this regard, the cost of such
an acquisition may be substantially less than the original sale
price of the medical device due, at least in part, to the
inoperable nature of the medical device.
[0006] After the medical device has been acquired, a test module
(e.g., a test bed) may effectuate testing of the acquired device to
determine a cause of the inoperability of the medical device. In
this regard, the test module may be readily adaptable to a
plurality of medical devices. For example, an x-ray device test bed
may be provided to test a plurality of x-ray devices. Such x-ray
devices may be from the same or different manufacturers. The x-ray
device test bed may include a mount that receives and supports an
x-ray tube of the x-ray device under test. A variable power supply
may be coupled to the x-ray tube to provide the requisite
high-voltage electrical energy thereto. The x-ray device test bed
may also include another mount that receives and supports an
imaging module (e.g., a "flat-panel sensor" that includes a charge
coupled device, or "CCD") of the x-ray device under test. A
processor may be configured with the test bed and coupled to the
imaging module of the x-ray device to determine the operational
characteristics of the imaging module and the x-ray tube. For
example, the processor may determine certain pixels of the imaging
module that are not functioning. In this regard, the processor may
ascertain whether a certain level of resolution may still be
obtained with the imaging module (e.g., an acceptable percentage of
pixels that are still operable). If certain x-ray components are
deemed to be inadequate in terms of operational functionality, the
x-ray components may be replaced such that the x-ray device may be
reintroduced to a medical industry segment.
[0007] In one embodiment, a universal x-ray test bed is provided
that allows for the service and repair of virtually any x-ray
device on the market. The test bed includes a housing with x-ray
components being mountable in a vertical fashion therein. For
example, the housing may include an x-ray tube mount used to
readily adapt to x-ray tubes of a variety of x-ray device
manufacturers. The housing also includes a imaging module mount
that is adaptable to retain an imaging module of a corresponding
x-ray tube manufacturer. The housing is also configured with an
adaptable power supply that readily adjusts to the power
requirements of a mounted x-ray tube and/or the imaging module.
Additionally, the housing includes a communication interface that
couples with the imaging module mount to transfer information from
the imaging module to a diagnostic module. The diagnostic module
(e.g., a computer work station) may, in turn, use this information
and determine, e.g., whether imaging module pixels are still
functional and/or determine the existing capability of the imaging
module. The diagnostic module may also provide a report describing
the existing capabilities of the x-ray components such that a
subsequent purchaser may make an informed purchase of a
reconditioned x-ray device. In one embodiment, the diagnostic
module provides a pixel map illustrating which pixels of the
imaging module are no longer operational.
[0008] The utility may also provide a means for warranting the
x-ray device in a medical industry segment. In one embodiment, the
means for warranting includes warranting a reintroduced x-ray
device. For example, when an x-ray device has been tested and
brought into condition for reintroduction into the medical industry
segment, the means for warranting may provide a level of
reassurance in case the reintroduced x-ray device fails. Such
warranting may include repair service and/or replacement service.
In another embodiment, the means for warranting may include
warranting an originally introduced x-ray device of an original
equipment manufacturer. For example, when an original equipment
manufacturer initially introduces an x-ray device to a medical
industry segment, the manufacturer often provides a warranty that
covers the cost of repairs and/or replacements. However, this
warranty coverage is generally for a limited period of time. Once
the warranty period ends, the utility may provide for warranting
the medical device for a period of time thereafter. In this regard,
utility may provide for assessing the x-ray device while in the
medical industry segment to determine an appropriate amount of
warranty coverage. While under coverage, the utility may provide
repairs and/or replacements in a manner similar to an original
equipment manufacturer warranty.
[0009] In one embodiment, a test bed for use with a plurality of
x-ray device types includes a housing that includes a first support
member and a second support member, wherein the first support
member is configured for retaining an x-ray tube and wherein the
second support member is configured for retaining an imaging module
of the plurality of x-ray device types. The test bed also includes
a high-voltage power supply configured for selectively providing a
plurality of voltage levels and for being adapted to provide at
least one of the voltage levels to the x-ray tube and a processor
communicatively coupled to the imaging module to retrieve
electronic data from the imaging module where in the processor
processes the electronic data to determine at least one inoperable
component of the imaging module. The first support member may be
further configured for retaining the x-ray tube of the plurality of
x-ray device types. A first x-ray device of the plurality of x-ray
device types may be manufactured by a first x-ray device
manufacturer and a second x-ray device of the plurality of x-ray
device types may be manufactured by a second x-ray device
manufacturer that is different from the first x-ray device
manufacturer.
[0010] The test bed may further include a storage element that
stores a first software module, wherein the first software module
directs the processor to generate a report that includes
information associated with at least one inoperable pixel of the
imaging module. The storage element further stores a second
software module that controls a rules processing engine, wherein
the rules processing engine is configured for receiving the
information associated with the least one inoperable pixel of the
imaging module to determine a requisite compliance. The requisite
compliance may include a standard, a government regulation, or
both.
[0011] The test bed may further include a display interface
configured for displaying an image produced by operable pixels of
the imaging module. The test that may further include a storage
element stores a software module that directs the processor to
display a location of at least one inoperable pixel with the
display interface. Alternatively or additionally, the storage on
may store a software module that directs the processor to locate
the least one inoperable pixel of the charge coupled device.
Alternatively or additionally, the software module may determine
the percentage of operable pixels within the imaging module.
Alternatively or additionally, the software module may determine a
failure rate for the pixels of the imaging module.
[0012] In one embodiment, a method of reconfiguring a plurality of
x-ray device types includes identifying a first x-ray device of a
medical industry segment, wherein the first x-ray device is at
least partially inoperable, acquiring the first x-ray device from
the medical industry segment, and providing a test bed that adapts
to a configuration of the first x-ray device. The method also
includes operating the test bed to determine at least one
inoperable component of the first x-ray device and replacing or
repairing me the at least one inoperable component to return the
first x-ray device to an operable status.
[0013] Operating the test bed may include accessing a database that
stores information associated with a second x-ray device to
determine the least one inoperable component of the first x-ray
device, wherein the first x-ray device and the second x-ray device
include a same type. The method may further include storing
information, in a database, of at least a portion of the first
x-ray device in response to operating the test bed. The method may
also include identifying a second x-ray device of a medical
industry segment, wherein the second x-ray device is at least
partially inoperable, acquiring the second x-ray device from the
medical industry segment, providing a test bed that adapts to a
configuration of the second x-ray device, operating the test bed to
determine at least one inoperable component of the second x-ray
device, and replacing or repairing the at least one inoperable
component to return the second x-ray device to an operable
status.
[0014] The method may further include storing information, in the
database, of at least a portion of the second x-ray device in
response to operating the test bed for the second x-ray device. The
method may further include including mapping the information of the
second x-ray device to the information of the first x-ray device.
Storing the information of the first and second x-ray devices may
include storing the information according to manufacturer and/or
type.
[0015] In one embodiment, a system for analyzing flat panel sensors
of x-ray devices to determine operational characteristics of the
flat panel sensors includes a radiant energy source, a high voltage
source coupled to the radiant energy source stimulate emission of
radiant energy from the radiant energy source, and a communication
interface configured for adaptively coupling to a plurality of flat
panel sensors. The system also includes a processor communicatively
coupled to the communication interface to determine a type of flat
panel sensor coupled to the communication interface and to process
data from the flat panel sensor for use in determining one or more
inoperable components of the flat panel sensor.
[0016] In one embodiment, a method of determining an operational
characteristic of a flat-panel sensor of an x-ray device includes
providing a test bed that includes a communication interface
configured for coupling to a plurality flat-panel sensors,
generating a plurality of control signals to interrogate
connections between a first flat-panel sensor and the communication
interface, determining, based on the interrogate connections, a
type of the first flat-panel sensor, and propagating energy to the
first flat-panel sensor. The method also includes extracting data
from the first flat-panel sensor in response to propagating energy
and processing the extracted data to determine one or more
inoperable components configured with the first flat-panel
sensor.
[0017] The method may further include coupling a second flat-panel
sensor to the communication interface, generating a plurality of
control signals to interrogate connections between the second
flat-panel sensor and the communication interface, and determining,
based on the interrogate connections, a type of the second
flat-panel sensor. The method may also include propagating energy
to the second flat-panel sensor, extracting data from the second
flat-panel sensor in response to propagating energy, and processing
the extracted data to determine one or more inoperable components
configured with the second flat-panel sensor. The method may also
include accessing a database to retrieve information about the
first flat-panel sensor for comparison to information about the
second flat-panel sensor. The method may also include using the
comparison of the information about the first flat-panel sensor to
the information about the second flat-panel sensor to determine the
one or more inoperable components configured with the second
flat-panel sensor. The method may further include determining a
percentage of operable pixels with the first flat-panel sensor. The
method may further include determining a failure rate of pixels
with the first flat-panel sensor.
BRIEF DESCRIPTION OF THE DRAWINGS
[0018] FIG. 1 is a perspective drawing of an exemplary x-ray test
bed.
[0019] FIG. 2 is a block diagram of an exemplary flat-panel
sensor.
[0020] FIG. 3 is a block diagram of an exemplary x-ray test bed
processing module.
[0021] FIG. 4 is a flowchart of a process for testing an x-ray
device.
[0022] FIG. 5 is a system level block diagram for reintroducing an
x-ray device into a medical industry segment.
[0023] FIG. 6 is another system level block diagram for
reintroducing an x-ray device into a medical industry segment that
includes a mapping module.
DETAILED DESCRIPTION OF THE DRAWINGS
[0024] While the invention is susceptible to various modifications
and alternative forms, specific embodiments thereof have been shown
by way of example in the drawings and are herein described in
detail. It should be understood, however, that it is not intended
to limit the invention to the particular form disclosed, but
rather, the invention is to cover all modifications, equivalents,
and alternatives falling within the scope and spirit of the
invention as defined by the claims.
[0025] Turning now to the drawings, FIG. 1 is a perspective drawing
of an exemplary x-ray test bed 10. The test bed 10 is generally
configured as a housing 15 with mounting members 19 and 20. In this
embodiment, the mounting number 19 is used to support an x-ray tube
18 whereas the mounting member 20 is used to support an imaging
module 14. The imaging module 14 captures the x-rays 25 from the
x-ray tube 18 and generates electronic data that is transferred to
a computer workstation 11 for processing and analysis. In this
regard, the computer workstation 11 may be used to identify one or
more inoperable components of the imaging module 14 and/or the
x-ray tube 18. The computer workstation 11 may be configured in a
variety of ways that may include, for example, desktop and laptop
computers.
[0026] To transfer the data from the imaging module 14 to the
computer workstation 11, the test bed 10 is configured with a data
link 13 that is generally configurable to transfer data from a
plurality of imaging module types. In this regard, the test bed 10
may be readily configured for testing components from a plurality
of x-ray devices. For example, x-ray devices are manufactured by a
plurality of medical device manufacturers, such as General Electric
and Siemens. These manufacturers often provide a variety of models
for an x-ray device. With so many types of x-ray devices, the
market for repair services is generally confined to the original
equipment manufacturers of the devices. That is, each manufacturer,
in general, vigilantly protects information pertaining to the
design of their respective medical devices which may preclude other
service organizations from repairing, refurbishing, and/or
reconfiguring a variety of medical device types. The data link 13
overcomes such by providing a communication transfer from a variety
of imaging module types to a test bed processor (i.e., the computer
workstation 11) such that the electronic data from the imaging
module 14 may be analyzed to provide a diagnosis of the imaging
module 14 and/or the x-ray tube 18.
[0027] Also illustrated in this embodiment, is the variable high
voltage power supply 17. The high-voltage power supply 17 is
coupled to the x-ray tube 18 via the high-voltage power line 23 to
provide power to the x-ray tube 18 for the generation of x-rays 25
within the housing 15. The high-voltage power supply 17, in this
embodiment, is variable so as to operate with a plurality of x-ray
tube types. For example, x-ray tubes come in a variety of designs
with different operating voltages. To properly test a variety of
x-ray tube types, the test bed 10 is generally configured with a
variable high voltage power supply 17 that provides high-voltage
power to an x-ray tube under test (e.g., the x-ray tube 18).
[0028] The computer workstation 11 is configured with a test
activation switch 22 that controls operations the x-ray tube 18
(via connection 24) and the imaging module 14. For example, the
test activation switch 22 may initiate x-ray generation from the
x-ray tube 18 and correspondingly direct the imaging module 14 to
capture the x-rays 25 from the x-ray tube 18. Once captured, the
imaging module 14 converts the analog x-ray information of the
x-rays 25 into electronic data that is processable by the
workstation 11.
[0029] Generally, imaging modules, such as the imaging module 14,
are configured as charge coupled devices and are commonly referred
to as flat-panel sensors (although other x-ray detection means may
be employed). An example of a flat panel sensor is illustrated as a
block diagram in FIG. 2. The flat panel sensor 130, in this
example, includes a sensor area 132 that is configured as a
photodiode array. Also configured with a sensor is a shift register
131 that clocks out individual pixels from the photodiode array.
For example, when an image is to be generated, the workstation 11
may initiate the test bed 10 via the test activation switch 22 and
thereby initiate x-ray radiation from the x-ray tube 18. The
photodiode array 132 receives photons from the x-ray radiation
which are subsequently converted to analog electronic data. The
shift register 131 clocks out the analog electronic data as pixels.
In this regard, the sensor 130 may also include a timing pulse
generator 134 to trigger the shift register 131 and an oscillator
135 to provide clock for the timing pulse generator 134. The
clocked out pixels are then amplified (e.g., via the amplifier
array circuits 133.sub.1 . . . N, the buffer amplifiers 137.sub.1 .
. . N, and the processing amplifiers 138.sub.1 . . . N).
Thereafter, the analog data from the amplification is converted to
digital data via the A/D converters 139.sub.1 . . . N and are
output via the FIFO circuits 140.sub.1 . . . N as digital video
output.
[0030] The digital video output from the flat panel sensor 130 may
be configured in a variety of ways. For example, since no two flat
panel sensor designs are necessarily alike, the number of bits in
the digital video output used to represent the analog information
from the photodiode array 132 may vary from device to device. The
test bed 10 is able to process the information from a variety of
flat panel sensor types by employing a virtually universal
connection scheme in the communication link 13. In one embodiment,
the communication link 13 includes a zero insertion force connector
that is implemented as a printed circuit board configurable with a
plurality of connection types. In this regard, the communication
link 13 may transfer data from a plurality of flat-panel sensor
types.
[0031] From there, the computer workstation 11 may manipulate the
data according to the flat-panel sensor type. For example, the
computer workstation 11 may include software capable of detecting
the flat-panel sensor type. In this regard, the software may
determine the brand, model, etc. of the x-ray device based on the
connection to the flat-panel sensor 14. After determining the x-ray
device type (e.g., the flat-panel sensor type), the computer
workstation 11 may retrieve software instructions that direct the
workstation to process the data from the flat-panel sensor
according to the x-ray device type. In this regard, the computer
workstation 11 may analyze the data received from the flat-panel
sensor 14 to determine whether the flat-panel sensor 14 and/or the
x-ray tube 18 are operating as designed, or within some standard,
regulation, or guideline.
[0032] Based on the data received from the flat-panel sensor 14, if
it is determined that the flat-panel sensor 14 and/or the x-ray
tube 18 are not operating as desired, then certain components can
be replaced or repaired. For example, the photodiode array 132 of
the flat-panel sensor is not something that can be easily repaired
because the individual photodiodes of the flat-panel sensor are
generally constructed through a semiconductor process that forms
the entire array. As such, individual pixel detectors (e.g., photo
diodes) are semiconductor devices that are not so discretely
connected to one another. However, other ancillary components with
the flat-panel sensor 14 may be replaceable. For example, the
entire photodiode array 132 may be replaced should an intolerable
number of inoperable pixels be determined. In this regard, the
control circuitry, such as the amplifiers 133, 137, 138, the timing
pulse generator 134, the bias generator 136, the A/D converters
139, etc. could remain and coupled to the replacement photodiode
array. More likely, it is these circuits, (e.g., the amplifiers
133, 137, 138, the oscillator 135, the FIFOs 140, etc.) that are
likely to fail over some period of time. By analyzing the data from
the flat-panel sensor 14, the computer workstation 11 may indicate
which part is inoperable such that the circuit can be replaced.
Generally such components are configured on printed circuit boards
as electronic devices (e.g., ASICs, computer chips, etc.) and can
be replaced with relatively careful soldering techniques.
Additionally, these components are often purchased in bulk at
prices that make the repair of the flat-panel sensor 14 much more
cost effective than replacing the entire sensor.
[0033] Referring back to FIG. 1, the test bed 10 may also be
configured with wheels 16. The wheels 16 may be configured in a
variety of ways that serve to make the test bed 10 mobile. In this
regard, the test bed 10 would not require a test "station" to
identify inoperable and/or marginally operable components. That is,
the wheels 16 may provide a repair technician with a certain level
of flexibility when repairing the x-ray device.
[0034] FIG. 3 is a block diagram of an exemplary x-ray test bed
processing module 100. The processing module 100 may be implemented
as a general-purpose processor such as that used by the computer
workstation 11. Alternatively or additionally, the processing
module 100 may be configured as a computer card is operable within
the constructs of a computer workstation. In any case, the
processing module 100 is configured with a communication interface
104 that communicatively couples the processing module 100 to a
variety of different flat-panel display types (e.g., the flat-panel
sensors 102.sub.1 . . . N). As described hereinabove, the
communication interface 104 may, therefore, be configured in such a
way so as to adaptively transfer data from a variety of flat panel
sensor types. For example, the communication interface 104 may be a
printed circuit board that is used to implement a zero insertion
force connection to multiple flat-panel sensor types.
[0035] Once a flat-panel sensor 102, is coupled to the
communication interface 104, the processing module 100 may retrieve
a device detection software module 110 from the storage element 106
for processing by the rules processing engine 103. For example, the
device detection software module 110 may include software
instructions that direct the rules processing engine 103 to
generate control signals that interrogate the connectors of the
communication interface 104. Based on the connections between the
flat-panel sensor 102.sub.1 and the communication interface 104,
the rules processing engine 103 may determine the type of the
flat-panel sensor 102.sub.1 (i.e., or any other flat-panel sensor
102 coupled thereto).
[0036] Once determined, the rules processing engine 103 may
retrieve a device specific software module 109 to initiate testing
of the flat-panel sensor 102. For example, once the rules
processing engine 103 determines the type of flat-panel sensor
102.sub.1, the rules processing engine 103 may call the device
specific software module 109.sub.1 that contains software
instructions specific to the flat-panel sensor 102.sub.1. In this
regard, the software module 109.sub.1 may direct the rules
processing engine 103 to, among other things, format data from the
flat-panel sensor 102 according to a manner in which the data would
be typically processed. For example, if the flat-panel sensor
102.sub.1 generates 13 bit video out data, the rules processing
engine 103 may be directed by the software module 109.sub.1 to
format the data from the flat-panel sensor accordingly. Similarly,
if the flat-panel sensor 102.sub.N outputs video data in a 16-bit
format, the software module 109.sub.N may direct the rules
processing engine 103 to format the data accordingly.
[0037] Additionally, the device specific software modules 109 may
direct the rules processing engine 103 to display the digital video
data according to the flat-panel sensor 102 type. In one
embodiment, the software modules 109 may include ImageJ software
instructions (i.e., Java image processing software) that format the
data for display via a display module, such as the computer monitor
12 of FIG. 1.
[0038] In this regard, the software instructions from the device
specific software module 109 may direct the rules processing engine
103 to transfer formatted video data to the interface 105 for
display to a technician. For example, the interface 105 may be
communicatively coupled to a display module, such as a computer
monitor (e.g., an LCD TV, CRT monitor, or the like), such that the
technician may observe the operational characteristics of an x-ray
tube and/or the flat-panel sensor 102. Based on those observed
operational characteristics, the technician may determine
components that are either inoperable or partially inoperable. For
example, the technician may observe the frequency response of an
x-ray tube by testing the x-ray tube on a material with known x-ray
characteristics (e.g., placing the material between the x-ray tube
and the flat-panel sensor). Additionally or alternatively, the
technician may observe certain features in the displayed data that
indicate one or more inoperable components with the flat-panel
sensor. For example, intermittent data may indicate a faulty
oscillator being used to clock out charges from the photo diode
array. In any case, the displayed data may indicate, to the
technician, components within the flat-panel sensor 102 and/or an
x-ray tube that require repair.
[0039] In one embodiment, a device specific software module 109
directs the rules processing engine 103 to access a database 112 to
retrieve additional information pertaining to the flat-panel sensor
102 and/or the x-ray tube under test. For example, the database 112
may store device specific information according to x-ray device
type. Such information may include, among other things, observed
component failure data that may also be used to indicate possible
failures within the flat-panel sensor 102 and/or the x-ray
tube.
[0040] Additionally, the storage element 106 may include a report
software module 107 and a regulatory information software module
108. The regulatory information module 108 may direct the rules
processing engine 103 to determine whether a flat-panel sensor 102
is operating within a particular standard. For example, individual
photodiodes within a flat-panel sensor 102 may fail. If the number
of individual photodiodes that fail is beyond some requisite number
of operable photodiodes within a regulatory scheme (e.g., a food
and drug administration regulation), the regulatory information
software module 108 may determine such and require that at least
the photo diode array of the flat-panel sensor 102 be replaced.
Generally, the flat-panel sensor 102 is often equipped with
software that compensates for the failed pixels within the entire
photo diode array. Still, if the number of photodiodes that fail is
beyond some ability of the software to compensate for the failed
pixels, may determine such and require that at least the photo
diode array of the flat-panel sensor 102 be replaced. Moreover, the
regulatory information software module 108 may determine the number
of operable pixels remaining and a failure rate to determine a life
expectancy of the flat panel sensor 102. For example, if a number
of pixels has failed but not beyond a regulatory limit, the
regulatory information software module 108 may determine a rate at
which the pixels are failing to determine when the flat panel
sensor 102 is likely to breach the regulatory limit.
[0041] The report software module 107 may direct the rules
processing engine 103 to generate a report that includes
information pertaining to certain determinations made by the
processing module 100. For example, the report software module 107
may direct the rules processing engine 103 to generate reports
pertaining to a number of operable pixels within the flat-panel
sensor 102 (e.g., a percentage of operable pixels), performance
within a regulatory guideline, and expected lifetime for the
flat-panel sensor 102, etc. Such information, once generated, may
be transferred to the communication interface 105 for display via a
display module or other data display means (e.g., printer,
electronic file creation, etc.).
[0042] FIG. 4 is a flowchart of a process 150 for testing an x-ray
device. In this embodiment, a test housing that includes mounting
members is provided, in the process element 151. For example, an
x-ray tube may be secured with one of the mounting members (process
element 152) and a flat-panel sensor of the x-ray device may be
secured within another mounting member (process element 153) such
that the x-ray tube radiates in the direction of the flat-panel
sensor. This "test bed" also provides a communication link to the
flat-panel sensor under test, in the process element 154, for
transferring data from the flat-panel sensor to a processing
module, such as a computer workstation, to determine the
operational characteristics of the x-ray device. Since the test bed
may be configured for testing a plurality of different flat-panel
sensor types, the data from the flat-panel sensors may come in a
variety of different formats. In this regard, the communication
link may be configured for coupling to a plurality of flat-panel
sensor types. In one embodiment, the communication link may include
a zero insertion force connector that is configured as a printed
circuit board with connector layouts that provide connections to a
plurality of plurality of flat-panel sensor types.
[0043] The test bed also provides a high voltage power supply to
the x-ray tube, in the process element 155. The high-voltage power
supply may be variable so as to provide a changeable voltage to a
plurality of different x-ray tube types. For example, x-ray devices
from different manufacturers may vary in terms of x-ray tube types
and their requisite voltages for generating x-rays. Thus, a
variable high voltage power supply may allow for the testing of a
plurality of different x-ray tube types.
[0044] With the communication link established between the
flat-panel sensor and the processing module, software instructions
may be retrieved or used to detect the flat-panel sensor type. For
example, the software instructions may direct the processing module
to generate control signals that are used to interrogate
connections of the communication link, in the process element 156.
Based on the interrogated connections, the processing module may
determine the type of flat-panel sensor being tested and retrieve
software instructions that are specific to that flat-panel sensor,
in the process element 157.
[0045] Once the flat-panel sensor and the x-ray tube are secured
with the test housing, the x-ray tube may be triggered to generate
x-rays towards the flat-panel sensor, in the process element 158.
The device specific software instructions, of the process element
157, may format the data according to the flat-panel sensor under
test. For example, flat-panel sensors of x-ray devices operate in a
variety of data formats that may depend on the number of individual
devices (e.g., photodetectors) configured with the devices. A
timing device (e.g., an oscillator) may clock out electronic data
from the individual devices in a particular format once the device
converts received x-ray radiation (e.g., photons). Once received,
the software instructions may format the data for processing in a
manner consistent with the original electronic data format of the
flat-panel sensor.
[0046] Thereafter, the processing module may process the formatted
data for analysis, in the processing element 159. The processed
data may be displayed via a display module such as a computer
monitor for analysis by a technician. For example, the displayed
data may indicate certain correctable failures, such as the
improper timing of data being clocked out from the flat-panel
sensor. The technician may analyze the displayed data to determine
component failures with the flat-panel sensor and/or the x-ray
tube, in the process element 160. If there are component failures
(the process element 161), those components may be replaced or
repaired, in the process element 164. Generally, such failures
occur in ancillary circuitry and can be replaced. For example,
oscillator circuitry, amplifier circuitry, and other circuitry are
often configured as ASICs and mounted on a printed circuit board.
Should a particular ASIC fail, that ASIC may be removed from the
printed circuit board and replaced with a similar component. Once
repaired, the process 150 may return to the process element 153 to
reinitiate testing of the x-ray device components.
[0047] If there are no component failures (the process element
161), the test bed may determine a pixel quantity, in the process
element 162. For example, as the processing module processes the
data from the flat-panel sensor, the processing module may
determine a percentage of the flat-panel sensor having operable
pixels. The software structures may also include certain standards
or regulations that the x-ray device under test must meet. In this
regard, the process 150 may determine whether the pixel count meets
a requisite standard in the process element 163 by comparing the
operable pixel quantity in the process element 162 to the standard.
Generally, inoperable pixels cannot be simply replaced because they
are often a part of a larger semiconductor manufacturing process.
Accordingly, if the flat-panel sensor does not meet the requisite
standard, the flat-panel sensor may be replaced, in the process
element 165. However, if the number of operable pixels meets or
exceeds the standard, a report may be generated, in the process
element 166. In this regard, the report may be used by a medical
industry segment (e.g., a hospital, a doctor's office, etc.) as a
basis for reliance. That is, the medical industry segment may use
the report as assurance that it is complying with certain standards
and/or regulations. Alternatively or additionally, the processing
module may determine a rate at which the pixels are failing source
to provide a life expectancy for the flat-panel sensor.
[0048] FIG. 5 is a system level block diagram 200 for reintroducing
an x-ray device into a medical industry segment. In this
embodiment, an x-ray device is acquired from a medical industry
segment 201. The medical industry segment 201 may include a variety
of different organizations, such as hospitals 202, doctor's offices
203, and even original equipment manufacturers 204. These
organizations typically experience breakdowns in their x-ray
devices. These x-ray devices are often costly to replace. However,
repair these devices has generally been limited to component level
replacement, such as replacing an entire flat-panel sensor even
though the flat-panel sensor may be repaired by replacing certain
inoperable components configured with the flat-panel sensor. Even
an original equipment manufacturer 204 will find it easier to
replace an entire flat-panel sensor than to repair the sensor.
[0049] In this regard, the x-ray device may be acquired and
configured with the x-ray device test bed 205. For example, a
repair facility may receive the x-ray device from the medical
industry segment 201. This transfer of the x-ray device from the
medical industry segment 201 to the repair facility may result in a
transfer of the title of the x-ray device to the repair facility.
From there, the repair facility may configure the x-ray device with
the test bed 205 by securing the flat-panel sensor of the x-ray
device with the test bed and coupling a communication link thereto.
The repair facility 205 may also secure the x-ray tube of the x-ray
device with the test bed to test the operability of the x-ray tube.
However, since flat-panel sensors may generally operate with a
variety of x-ray tube types, the x-ray test bed may be configured
with a standard x-ray tube that is used to test a plurality of
flat-panel sensors.
[0050] In any case, the test bed 205 may be linked with a
conditioning module 206 to return the x-ray device to an operable
status. For example, the x-ray device test bed 205 may extract data
from the x-ray device under test that indicates the inoperability
of one or more components of the x-ray device. Once those
components have been identified, a conditioning module 206 may be
used to replace and/or repair those components.
[0051] In one embodiment, the x-ray device test bed 205 and/or the
conditioning module 206 are linked with a database 207 that is used
to compile data pertaining to x-ray devices. For example, when one
x-ray device has been tested, data pertaining to inoperable
features and various failure rates of components of the x-ray
device may be compiled and stored with the database 207. The
conditioning module 206 and/or the x-ray device test bed 205 may
retrieve such information when encountering a similar x-ray device
such that the inoperable components can be more readily identified
and repaired.
[0052] Once repaired, the x-ray device may be transferred to a
medical industry segment 208. For example, the x-ray device may be
transferred to a hospital 209, a doctor's office 210, a merchant
211, etc. The components of the medical industry segment 208 to
which the x-ray device may be transferred may be the same or
different from the components of the medical industry segment 201.
For example, since title of the x-ray device may have been
transferred when acquired, the title of the x-ray device may be
transferred to a different medical industry segment. However, the
invention is not intended to be so limited as the x-ray device may
be acquired in bailment.
[0053] FIG. 6 is another system level block diagram for
reintroducing an x-ray device into a medical industry segment that
includes a mapping module 230. The mapping module 230, of this
embodiment, maybe used to retrieve data from the database 207 per
mapping to information pertaining to an x-ray device under test.
For example, the x-ray device test bed 205 may acquire certain
information 233 pertaining to the x-ray device under test. This
information 203 may include schematic information, electronic
component information, flat-panel sensor type information, and the
like. Such information may have been previously acquired during the
testing of a similar x-ray device. The previously acquired
information 231 may be stored in a database 207 and categorized
within the database 207 by device type. For example, the database
207 may include sectors 232.sub.1 . . . N that are each reserved
for storing information pertaining to a particular x-ray device.
The mapping module 230 may retrieve this previously acquired
information 231 from the database 207 for comparison to the newly
acquired information 233. In this regard, the mapping module 230
may identify certain features of the newly acquired information 233
(e.g., flat-panel sensor type, data formatting, circuit diagrams,
etc.) that are relevant to the previously acquired information 231.
The mapping module 230 may then use the information 231 to
supplement the information 233. That is, the mapping module 230 may
identify portions of the information 233 that have yet to be fully
resolved via the x-ray device test bed 205 but may be resolved by
means of the information 231.
[0054] In one embodiment, the mapping module 230 is a software
module that is configured with the storage element 106 of FIG. 3.
In this regard, the rules processing engine 103 may retrieve the
mapping module 230 to direct the processing module 100 to retrieve
the information 231 (e.g., a copy thereof) from the database 207
for comparison of the newly acquired data from the x-ray device
test bed 205.
[0055] While the invention has been illustrated and described in
detail in the drawings and foregoing description, such illustration
and description is to be considered as exemplary and not
restrictive in character. For example, certain embodiments
described hereinabove may be combinable with other described
embodiments and/or arranged in other ways (e.g., process elements
may be performed in other sequences). Accordingly, it should be
understood that only the preferred embodiment and variants thereof
have been shown and described and that all changes and
modifications that come within the spirit of the invention are
desired to be protected. Additionally, the variable "N" used herein
is merely intended to denote an integer greater than 1. It is not
intended to necessarily equate one set of devices to another. For
example, the number of A/D converters in FIG. 2 denoted by the
variable "N" may not equate to the number of flat-panel sensors
denoted by the variable "N" FIG. 3. However, the number "N" of
flat-panel sensors 102 in FIG. 3 may equal the number "N" of device
specific software modules 109 in FIG. 3, although not required.
* * * * *