U.S. patent application number 12/400444 was filed with the patent office on 2009-09-17 for solar energy module having repair line, solar energy assembly having the same, method of repairing the solar energy module and method of trimming the solar energy assembly.
Invention is credited to Dong-Uk Choi, Seung-Jae Jung, Byoung-June Kim, Jin-Seock Kim, Czang-Ho Lee, Joon-Young Seo, Myung-Hun Shin.
Application Number | 20090229596 12/400444 |
Document ID | / |
Family ID | 40801984 |
Filed Date | 2009-09-17 |
United States Patent
Application |
20090229596 |
Kind Code |
A1 |
Shin; Myung-Hun ; et
al. |
September 17, 2009 |
SOLAR ENERGY MODULE HAVING REPAIR LINE, SOLAR ENERGY ASSEMBLY
HAVING THE SAME, METHOD OF REPAIRING THE SOLAR ENERGY MODULE AND
METHOD OF TRIMMING THE SOLAR ENERGY ASSEMBLY
Abstract
A method of electrically eliminating defective solar cell units
that are disposed within an integrated solar cells module and a
method of trimming an output voltage of the integrated solar cells
module are provided, where the solar cells module has a large
number (e.g., 50 or more) of solar cell units integrally disposed
therein and initially connected in series one to the next. The
method includes providing a corresponding plurality of repair pads,
each integrally extending from a respective electrode layer of the
solar cell units, and providing a bypass conductor integrated
within the module and extending adjacent to the repair pads.
Pad-to-pad spacings and pad-to-bypass spacings are such that
pad-to-pad connecting bridges may be selectively created between
adjacent ones of the repair pads and such that pad-to-bypass
connecting bridges may be selectively created between the repair
pads and the adjacently extending bypass conductor.
Inventors: |
Shin; Myung-Hun;
(Gyeonggi-do, KR) ; Choi; Dong-Uk; (Seoul, KR)
; Kim; Byoung-June; (Seoul, KR) ; Kim;
Jin-Seock; (Chungcheongnam-do, KR) ; Lee;
Czang-Ho; (Gyeonggi-do, KR) ; Jung; Seung-Jae;
(Seoul, KR) ; Seo; Joon-Young; (Seoul,
KR) |
Correspondence
Address: |
Haynes and Boone, LLP;IP Section
2323 Victory Avenue, SUITE 700
Dallas
TX
75219
US
|
Family ID: |
40801984 |
Appl. No.: |
12/400444 |
Filed: |
March 9, 2009 |
Current U.S.
Class: |
126/569 |
Current CPC
Class: |
H02S 40/36 20141201;
H01L 31/046 20141201; H02S 50/10 20141201; H01L 31/05 20130101;
H01L 31/0201 20130101; H01L 31/042 20130101; Y02E 10/50
20130101 |
Class at
Publication: |
126/569 |
International
Class: |
F24J 2/00 20060101
F24J002/00 |
Foreign Application Data
Date |
Code |
Application Number |
Mar 12, 2008 |
KR |
2008-22800 |
Jan 23, 2009 |
KR |
2009-06188 |
Claims
1. A solar energy module comprising: a plurality of successive unit
cells, each unit cell including: a set of electrode layers
comprising a lower electrode layer and an upper electrode layer; a
set of one or more semiconductor layers disposed between the lower
electrode layer and the upper electrode layer and defining a
photo-electric converter that converts photonic energy into
electrical energy; and a repair pad electrically connected to an
electrode layer in the set of electrode layers and protruding
outwardly so as to allow connection to a like repair pad of an
adjacent unit cell and/or connection to another adjacent structure;
wherein an electrode layer of a first unit cell of the successive
unit cells electrically connects to an electrode layer of a next
adjacent unit cell, if any, of the successive unit cells so that
the successive unit cells are thereby connected in series with each
other; and a bypass conductor extending adjacent to the plurality
of repair pads to function for each unit cell as said other
adjacent structure to which the respective repair pad of the unit
cell may be connected.
2. The solar energy module of claim 1, wherein the unit cells
interconnect one to the next along a first direction, and
electrical connections from the upper electrode layer of the first
unit cell to the lower electrode layer of the next adjacent unit
cell are made along the first direction.
3. The solar energy module of claim 2, further comprising a first
module output line connected to a repair pad of a peripheral first
unit cell among the successive unit cells; and a second module
output line connected to a repair pad of a peripheral second unit
cell among the successive unit cells.
4. The solar energy module of claim 3, wherein the unit cells are
disposed on a substrate such that the lower electrode layer of each
cell is closer to the substrate than the upper electrode layer, and
wherein each repair pad integrally extends from and beyond the
lower electrode layer of its respective unit cell.
5. The solar energy module of claim 3, wherein the unit cells are
disposed on a substrate such that the lower electrode layer of each
cell is closer to the substrate than the upper electrode layer and
wherein each repair pad integrally extends from and beyond the
upper electrode layer of its respective unit cell.
6. The solar energy module of claim 3, further comprising a first
bridge connecting the repair pad of a corresponding
deemed-as-defective unit cell with the bypass conductor; and a
second bridge connecting the repair pad of a corresponding
deemed-as-normal unit cell with the bypass conductor, wherein
repair pads of adjacent other cells are primarily not connected to
one another, the first and the second bridges thereby define a
corresponding parallel bypass circuit around the defective unit
cell or around two or more defective unit cells disposed between
the first and the second bridges in said series connection of the
successive unit cells.
7. The solar energy module of claim 6, wherein a first portion of
the bypass conductor connecting the first bridge to the second
bridge is divided from a second other portion of the bypass
conductor.
8. The solar energy module of claim 6, further comprising a third
bridge connecting the repair pad of a deemed-as-defective further
unit cell with the repair pad of an adjacent deemed-as-normal unit
cell so as to thereby define a corresponding parallel circuit
bypassing around the defective further unit cell in said series
connection of the successive unit cells.
9. The solar energy module of claim 2, further comprising a first
module output line connected to a first end portion of the bypass
conductor; and a second module output line connected to a second
end portion of the bypass conductor; wherein the first and second
module output lines extend in a direction substantially orthogonal
to an extension direction of the bypass conductor.
10. The solar energy module of claim 9, wherein first and second
portions of the bypass conductor which are respectively connected
with the first and the second module output lines, and respectively
connect with the repair pads of a highest-voltage outputting unit
cell and a lowest-voltage outputting unit cell of the module, and
the first and second portions of the bypass conductor are
respectively divided apart from other portions of the bypass
conductor.
11. The solar energy module of claim 9, wherein each repair pad
extends from the lower electrode layer of its respective unit
cell.
12. The solar energy module of claim 9, wherein each repair pad
extends from the upper electrode layer.
13. The solar energy module of claim 9, further comprising a fourth
bridge connecting the repair pad of a corresponding defective unit
cell with the bypass conductor; and a fifth bridge connecting the
repair pad of a corresponding normal unit cell with the bypass
conductor, wherein repair pads of adjacent cells are primarily not
connected to one another, the fourth and the fifth bridges thereby
define a corresponding parallel circuit bypass around the defective
unit cell or one or more defective unit cell between the fourth and
the fifth bridges in said series connection of the successive unit
cells.
14. The solar energy module of claim 13, wherein a portion of the
bypass conductor connecting the fourth bridge to the fifth bridge
is divided apart from other portions of the bypass conductor.
15. The solar energy module of claim 13, further comprising a sixth
bridge connecting the repair pad of a defective unit cell with the
repair pad of an adjacent normal unit cell so as to thereby define
a corresponding parallel circuit bypassing around the defective
unit cell in said series connection of the successive unit
cells.
16. The solar energy module of claim 9, wherein the repair pads of
the successive unit cells are initially manufactured to be
integrally connected with the bypass conductor, and after said
initial manufacturing a separation portion is formed on the
respective repair pads of deemed-to-be-normal unit cells so as to
thereby electrically divide the normal unit cells from the bypass
conductor.
17. The solar energy module of claim 16, wherein portions of the
bypass conductor which are integrally formed with the repair pads
of the high-voltage outputting unit cell and the low-voltage
outputting unit cell are divided from other portions of the bypass
conductor.
18. The solar energy module of claim 16, wherein the repair pad of
a normal unit cell next to one side of a defective set of one or
more successive defective unit cells is integrally formed with the
bypass conductor, the separation portion is formed on the repair
pad of a normal unit cell next to the other side of the defective
set so that the one or more successive defective unit cells are
electrically divided from series connection of the successive unit
cells.
19. The solar energy module of claim 18, wherein a portion of the
bypass conductor connecting the one or more successive defective
unit cells with each other is divided from other portions of the
bypass conductor.
20. A solar energy assembly comprising: a plurality of solar energy
modules, each of the solar energy modules including: an array of
successively connected unit cells, each unit cell including: (a) a
set of electrode layers comprising a lower electrode layer and an
upper electrode layer; (b) a set of one or more semiconductor
layers disposed between the lower electrode layer and the upper
electrode layer and defining a photo-electric converter that
converts photonic energy into electrical energy; and (c) a repair
pad electrically connected to an electrode layer of the set of
electrode layers and protruding outwardly so as to allow connection
to a like repair pad of an adjacent unit cell and/or connection to
another adjacent structure; wherein the upper electrode layer of a
first unit cell of the array electrically connects to a lower
electrode layer of an next adjacent unit cell, if any, of the array
so that the unit cells are connected in series with each other; a
first bypass line extending adjacent to the repair pad of the unit
cell whose output corresponds to a high-voltage output of the
array; and a second bypass line extending adjacent to the repair
pad of the unit cell whose output corresponds to a low-voltage
output of the array; a first output line connecting the respective
repair pads corresponds to the high-voltage output of the solar
energy modules in parallel with each other; and a second output
line connecting to the respective repair pads corresponds to the
low-voltage output of the solar energy modules in parallel with
each other.
21. The solar energy assembly of claim 20, wherein the first and
the second output lines are directly connected to the repair pads
corresponding to the high-voltage output and the low-voltage output
respectively.
22. The solar energy assembly of claim 20, wherein the first output
line is directly connected to the first bypass line which is
connected to the repair pad corresponding to the high-voltage
output, and the second output line is directly connected to the
second bypass line which is connected to the repair pad
corresponding to the low-voltage output.
23. The solar energy assembly of claim 22, further comprising a
first bridge connecting the first bypass line to the repair pad
corresponding to the high-voltage output; and a second bridge
connecting the second bypass line to the repair pad corresponding
to the low-voltage output.
24. The solar energy assembly of claim 23, wherein a portion of the
first bypass line connected to the repair pad corresponding to the
high-voltage output is divided from the other of the first bypass
line, and a portion of the second bypass line connected to the
repair pad corresponding to the low-voltage output is divided from
the other of the second bypass line.
25. The solar energy assembly of claim 20, wherein each repair pad
extends from the lower electrode layer of its respective unit
cell.
26. The solar energy assembly of claim 20, wherein each repair pad
extends from the upper electrode layer.
27. The solar energy assembly of claim 20, wherein the number of
the unit cells disposed between the high-voltage output and the
low-voltage output is determined so that respective module output
voltages of the solar energy modules, whether trimmed or not, are
substantially the same as each other.
28. The solar energy assembly of claim 27, further comprising a
third bridge directly connecting the repair pads of adjacent unit
cells with each other.
29. The solar energy assembly of claim 28, at least one of repair
pads connected with each other by the third bridge is a repair pad
of a defective unit cell.
30. The solar energy assembly of claim 27, wherein at least one of
the solar energy modules further comprises at least one of a fourth
bridge and a fifth bridge, the fourth bridge directly connecting a
first repair pad to the first bypass line, and the fifth bridge
directly connecting a second repair pad to the second bypass
line.
31. The solar energy assembly of claim 30, wherein at least one of
the first repair pads connected to the first bypass line by a
plurality of the fourth bridges respectively is a repair pad of a
defective unit cell, and at least one of the second repair pads
connected to the second bypass line by a plurality of the fifth
bridges respectively is a repair pad of a defective unit cell.
32. A method of repairing or trimming a solar energy module, the
solar energy module comprising an array of successive unit cells,
the module including an upper electrode layer which is disposed on
a corresponding one or more semiconductor layers of each unit cell
where the semiconductor layers define a photo-electric converter
and the upper electrode layer of a first of the cells being
electrically connected to a lower electrode layer under
semiconductor layers of a next adjacent unit cell along a first
direction so that the successive unit cells are thereby connected
in series with each other, the method comprising at least one of
performing a first bypassing and performing a second bypassing,
wherein said performing of the first bypassing includes connecting
repair pads extending from electrode layers of a first unit cell
and a second unit cell to a bypass line so that one or more unit
cells including the first unit cell or the second unit cell are
bypassed, and wherein said performing of the second bypassing
including directly connecting repair pads of a third unit cell and
a fourth unit cell with each other so that at least one of the
third unit cell and the fourth unit cell is bypassed.
33. The method of repairing or trimming a solar energy module of
claim 32, wherein performing the first bypassing and the second
bypassing, electrically connecting a repair pad extending from the
lower electrode of a defective unit cell to a repair pad extending
from the lower electrode of a next adjacent unit cell along the
first direction.
34. The method of claim 32, wherein performing the first bypassing
and the second bypassing, electrically connects a repair pad
extending from the upper electrode of a defective unit cell to a
repair pad extending from the upper electrode of a next adjacent
unit cell along the opposite direction to the first direction.
35. The method of claim 32, wherein performing the first bypassing
further includes dividing a portion of bypass line which connects
the repair pads of the first and the second unit cells from the
other of the bypass line.
36. The method of claim 32, wherein connecting the repair pads with
each other or to the bypass line includes forming pad-to-pad bridge
or pad-to-bypass bridge.
37. The method of claim 32, further comprising: dividing a module
output line from the repair pad of a peripheral first unit cell of
the array; connecting the module output line to an end portion of
the bypass line; and dividing a portion of the bypass line
connected to the output line from another portion of the bypass
line.
38. A method of repairing a solar energy module, the solar energy
module comprising an array of successive unit cells, an upper
electrode layer which is disposed on one or more semiconductor
layers of the unit cell defining a photo-electric converter being
electrically connected to a lower electrode layer under
semiconductor layers of a next adjacent unit cell along a first
direction so that the successive unit cells are connected in series
with each other, the method comprising dividing the repair pad
extending from an electrode layer of a normal unit cell and
primarily integrally formed with bypass line from the bypass line;
and dividing a portion of the bypass line primarily integrally
formed with a defective unit cell from the other of the bypass
line.
39. The method of repairing a solar energy module of claim 38,
wherein the repair pad extending from the lower electrode of the
normal unit cell next adjacent the defective unit cell along the
first direction is not divided from the bypass line but is
maintained to be primarily integral formed-state.
40. The method of repairing a solar energy module of claim 38,
wherein the repair pad extending from the upper electrode of the
normal unit cell next adjacent the defective unit cell along the
opposite direction to the first direction is not divided from the
bypass line but is maintained to be primarily integral
formed-state.
41. The method of repairing a solar energy module of claim 38,
further comprising dividing a portion of the bypass line from the
other of the bypass line, the portion of the bypass line integrally
formed with the repair pad corresponding to voltage output of the
array and connected to output line of the solar energy module.
42. A method of trimming a solar energy assembly, the solar energy
assembly comprising a plurality of solar energy modules, each of
the solar energy modules comprising an array of successive unit
cells, an upper electrode layer which is disposed on a
corresponding one or more semiconductor layers of each unit cell
where the semiconductor layers define a photo-electric converter,
and the upper electrode layer of a first of the cells being
electrically connected to a lower electrode layer under
semiconductor layers of a next adjacent unit cell along a first
direction, so that the successive unit cells are thereby connected
in series with each other, the method comprising defining a voltage
which is to be substantially output by all the solar energy modules
of the assembly as a reference output voltage; where necessary
bypassing one or more cells in each of the solar energy modules so
as to thereby cause each to have the reference output voltage; and
parallel connecting respective voltage outputs of the solar energy
modules with each other by using output lines of the solar energy
modules.
43. The method of trimming a solar energy assembly of claim 42,
wherein defining the reference output voltage comprises: detecting
unit output voltages of the unit cells of the solar energy module
using a probe; and determining the module output voltage of each
solar energy module as the total of the detected unit output
voltages of its unit cells.
44. The method of trimming a solar energy assembly of claim 43,
wherein parallel connecting respective voltage outputs comprises:
connecting a first output line of each solar energy modules with
each other, each of the first output lines being directly connected
to a repair pad of a top unit cell whose output corresponds to a
high-voltage output of the array; and connecting a second output
line of each solar energy modules with each other, each of the
second output lines being directly connected to a repair pad of a
bottom unit cell whose output corresponds to a low-voltage output
of the array.
45. The method of trimming a solar energy assembly of claim 43,
wherein parallel connecting respective voltage outputs comprises:
connecting a repair pad of a top unit cell to a first bypass line
connected to a first output line of each solar energy modules, the
top unit cell among the selected number of unit cells for the solar
energy module to have an output voltage substantially the same as
the reference output voltage; and connecting a repair pad of a
bottom unit cell among the selected number of unit cells to a
second bypass line connected to a second output line of each solar
energy modules.
46. The method of trimming a solar energy assembly of claim 45,
wherein parallel connecting respective voltage outputs further
comprises: dividing a portion of the first bypass line connecting
the repair pad of the top unit cell to the first output line from
the other of the first bypass line; and dividing a portion of the
second bypass line connecting the repair pad of the bottom unit
cell to the second output line from the other of the second bypass
line.
47. The method of trimming a solar energy assembly of claim 43,
wherein repairing each of the solar energy modules comprises
bypassing at least one unit cell of at least one solar energy
module.
48. The method of trimming a solar energy assembly of claim 43,
wherein bypassing at least one unit cell comprises at least one of
performing a first bypassing and performing a second bypassing,
performing the first bypassing including connecting repair pads
extending from electrode layers of a first unit cell and a second
unit cell to a bypass line so that one or more unit cells including
the first unit cell or the second unit cell are bypassed, and
performing the second bypassing including directly connecting
repair pads of a third unit cell and a fourth unit cell with each
other so that at least one of the third unit cell and the fourth
unit cell is bypassed.
Description
PRIORITY STATEMENT
[0001] This application claims priority under 35 U.S.C. .sctn. 119
to Korean Patent Application No. 2008-22800, filed on Mar. 12, 2008
and to Korean Patent Application No. 2009-6188 filed on Jan. 23,
2009, both in the Korean Intellectual Property Office (KIPO), where
the disclosures of both applications are incorporated herein by
reference in their entireties.
BACKGROUND
[0002] 1. Field of Invention
[0003] The present disclosure of invention relates to a solar
energy module, a solar energy assembly having the solar energy
module, a method of repairing the solar energy module and a method
of trimming the solar energy assembly. More particularly, the
disclosure relates to a solar energy module which includes unit
cells of a thin-film type.
[0004] 2. Description of Related Technology
[0005] Generally, a solar energy module of a thin-film type (e.g.,
amorphous silicon) includes a plurality of unit cells which are
connected in series with each other where each operative unit cell
generates electrical energy at a respective voltage in response to
absorbed solar radiation. The unit cells may be integrally formed
on a glass substrate through an integrated circuit batch
process.
[0006] When one of the series-connected unit cells of the
integrated solar energy module experiences a full or partial loss
of function due for example to a short circuit or a disconnection
or a drop in output voltage, the performance and/or lifetime of the
solar energy module may become degraded.
[0007] Thus, a solar energy module having a defect such as
mentioned above may not be suitable for use in fields requiring
long term reliability. For example, even after manufacture of an
almost fully operable module but with one defective cell (or but
with a short run burst of defects such as in a few
immediately-adjacent-to-each-other cells), the entire solar energy
module may become unusable for its intended purpose and may have to
be discarded despite the fact that it contains a substantially
large number of good cells. On the other hand, if an efficient
method of detecting defects and repairing the solar energy module
can be devised, it may be possible to avoid the need for discarding
an entire solar energy module due to only a single cell defect or a
spot-like defect wherein just a few close together cells are
defective.
[0008] In view of the general requirement imposed on mass
production lines to produce modules of substantially same
performance and of good long term reliability, uniformity among
solar energy modules is important. As mentioned, the unit cells of
the solar energy module are conventionally connected in series with
each other. A solar energy assembly typically includes a plurality
of such solar energy modules which are connected in parallel with
each other so that their currents may be summed. If the module
output voltages of each of the solar energy modules are not
uniformly essentially the same, the long-term reliability of the
solar energy modules may be decreased due to large short circuiting
currents flowing among the parallel-wise connected circuits that
have substantially different output voltages.
[0009] When a same mass production process is performed on a given
integrated substrate, the output voltages of each of the unit cells
on that one substrate tend to be nearly the same as each other.
About 50 to 100 of the unit cells are typically connected in series
with each other on the integrated substrate to form the integrated
solar energy module.
[0010] The output voltage of each of the unit cells has a variation
of about .+-.5% due to variations in the manufacturing process.
This variation of the output voltage of a single unit cell may be
very small, however, the variation of the output voltage of a large
number of unit cells (in other words, of a module) may be on the
order about several volts.
[0011] Typically, the solar energy modules are connected in
parallel in an electrical power generation system. Thus, it is
desirable for the module output voltages to be uniform with one
another for long-term reliability. Accordingly, in addition to a
method of repairing when defective unit cells are present, a method
for preventing or controlling the variations of the parallel-wise
connected solar energy modules is desired.
SUMMARY
[0012] The present disclosure of invention provides a
monolithically integrated solar energy module in which repair may
be easily effected for individual defective unit cells or for
groups of defective unit cells and/or in which individual module
voltage output may be easily trimmed to match a predefined
reference voltage.
[0013] Example embodiments of the present disclosure also include a
solar energy assembly including a plurality of solar energy modules
connected in parallel to one another.
[0014] Example embodiments of the present disclosure also include a
method of repairing a solar energy module having one or more
defective cells.
[0015] Example embodiments of the present disclosure also include a
method of trimming modules in the solar energy assembly so that
they are substantially matched with one another.
[0016] According to one aspect of the present disclosure, a solar
energy module includes a plurality of unit cells that are connected
in series and an integrated bypass line extending alongside the
series of unit cells. Each unit cell includes a set of integrated
electrode layers, a set of one or more integrated semiconductor
layers and an integrated repair pad. The set of integrated
electrode layers includes a lower electrode layer and a spaced
apart upper electrode layer facing the lower electrode layer. The
set of semiconductor layers is disposed between the lower electrode
layer and the upper electrode layer and defines a photo-electric
converter that converts photonic energy into electrical energy. The
repair pad is electrically connected to the electrode layer and
protrudes toward one side of the cell unit. An electrode layer of a
first unit cell is electrically connected to an electrode layer of
a next adjacent unit cell, if any, so that the successive unit
cells are thereby connected in series with each other. The bypass
line is disposed closely adjacent to a plurality of the repair pads
so as to function for each unit cell as said other adjacent
structure to which the respective repair pad of the unit cell may
be connected.
[0017] According to another aspect of the present disclosure, a
solar energy assembly includes a plurality of solar energy modules,
a first output line and a second output line. Each of the solar
energy modules includes an array of successively connected unit
cells, a first bypass line and a second bypass line. Each of the
unit cells includes a set of electrode layers including a lower
electrode layer and an upper electrode layer facing each other, a
set of one or more semiconductor layers disposed between the lower
electrode layer and the upper electrode layer, and a repair pad
being electrically connected to an electrode layer of the set of
electrode layers and protruding outwardly from one side of the unit
cell. The upper electrode layer of a first unit cell is integrally
connected to a lower electrode layer of a next adjacent unit cell,
if any, so that the unit cells are integrally connected in series
with each other. The first bypass line extends adjacent to the
repair pad of the unit cell corresponding to a high-voltage output
of the array. The second bypass line extends adjacent to the repair
pad of the unit cell corresponding to a low-voltage output of the
array where the difference between the high and low voltages is
substantially equal to a pre-defined reference voltage. The first
output line connects the respective repair pads corresponding to
the high-voltage output of the solar energy modules in parallel
with each other. The second output line connects the respective
repair pads corresponding to the low-voltage output of the solar
energy modules in parallel with each other.
[0018] According to still another aspect ofthe present disclosure,
in a method of repairing or trimming the solar energy module, where
the solar energy module includes an array of successive unit cells,
and where an upper electrode layer which is disposed on a
corresponding one or more semiconductor layers of each unit cell is
electrically connected to a lower electrode layer under
semiconductor layers of a next adjacent unit cell along a first
direction so that the successive unit cells are connected in series
with each other, the method includes at least one of performing a
first bypassing and performing a second bypassing. The first
bypassing includes connecting repair pads extending from electrode
layers of a first unit cell and a second unit cell to a bypass line
so that one or more unit cells including the first unit cell or the
second unit cell are bypassed. The second bypassing includes
directly connecting repair pads of a third unit cell and a fourth
unit cell with each other so that at least one of the third unit
cell and the fourth unit cell is bypassed.
[0019] According to still another aspect of the present disclosure,
in a method of trimming a solar energy assembly including a
plurality of solar energy modules, each of the solar energy modules
includes an array of successive unit cells. An upper electrode
layer which is disposed on a corresponding one or more
semiconductor layers of each unit cell where the semiconductor
layers define a photo-electric converter, and the upper electrode
layer of a first of the cells is electrically connected to a lower
electrode layer under semiconductor layers of a next adjacent unit
cell along a first direction, so that the successive unit cells are
thereby connected in series with each other. A reference output
voltage for the solar energy modules is defined as a voltage which
is to be substantially output by all for the solar energy modules
of the assembly where necessary bypassing one or more cells in each
repairing each of the solar energy modules so as to thereby cause
each to have the reference output voltage. Respective voltage
outputs of the solar energy modules are connected parallel with
each other by using output lines of the solar energy modules.
[0020] According to a further example embodiment, when a defective
unit cell is detected after forming a solar energy module by
forming a thin film during a mass production process, the defective
unit cell may be bypassed so that the yield of operable modules may
be increased.
[0021] In addition, the module output voltage may become uniform so
that the reliability of the module may be increased when combined
with other modules.
BRIEF DESCRIPTION OF THE DRAWINGS
[0022] The above and other features and advantages of the present
disclosure of invention will become more apparent by describing in
detailed example embodiments thereof with reference to the
accompanying drawings in which:
[0023] FIG. 1 is a plan view illustrating a solar energy module in
accordance with an embodiment;
[0024] FIG. 2 is a cross-sectional view illustrating the solar
energy module taken along a line I-I' in FIG. 1;
[0025] FIG. 3 is a cross-sectional view illustrating the solar
energy module taken along a line II-II' in FIG. 1;
[0026] FIG. 4 is an equivalent circuit diagram for the unit cell in
FIG. 2;
[0027] FIG. 5 is a flowchart illustrating a method of repairing the
solar energy module in accordance with a first embodiment;
[0028] FIG. 6 is a cross-sectional view illustrating an example
method of testing the unit cell for defects;
[0029] FIG. 7 is a cross-sectional view illustrating another
example method of testing the unit cell for defects;
[0030] FIG. 8 is a graph of a current generated from the unit cell
in relation to a test voltage applied to the unit cell as
illustrated in FIGS. 6 and 7;
[0031] FIG. 9 is a plan view of the solar energy module repaired
according to one or more methods described in FIGS. 5 and 9;
[0032] FIG. 10 is an equivalent circuit diagram illustrating the
solar energy module in FIG. 9;
[0033] FIG. 11 is a plan view illustrating a first embodiment of a
solar energy assembly in accordance with the disclosure;
[0034] FIG. 12 is an equivalent circuit diagram illustrating the
solar energy assembly in FIG. 11;
[0035] FIG. 13 is a flowchart illustrating a method of trimming the
solar energy assembly of FIG. 11;
[0036] FIG. 14 is a plan view illustrating a solar energy assembly
including solar energy modules which may be trimmed to have
substantially the same module output voltages as each other;
[0037] FIG. 15 is an enlarged view illustrating a first area, A in
FIG. 14;
[0038] FIG. 16 is a plan view illustrating a second embodiment of a
solar energy module in accordance with the disclosure;
[0039] FIG. 17 is a plan view illustrating a solar energy assembly
including solar energy modules which may be trimmed to have
substantially the same module output voltage as each other in
accordance with a second embodiment;
[0040] FIG. 18 is an enlarged view illustrating a second area, B in
FIG. 17;
[0041] FIG. 19 is a plan view illustrating a solar energy module in
accordance with another example embodiment;
[0042] FIG. 20 is a cross-sectional view illustrating the solar
energy module taken along a line III-III' in FIG. 19;
[0043] FIG. 21 is a plan view illustrating a solar energy module in
accordance with still another example embodiment;
[0044] FIG. 22 is a flowchart illustrating method of repairing the
solar energy module in FIG. 21; and
[0045] FIG. 23 is a plan view illustrating a solar energy module in
accordance with a fifth embodiment.
DETAILED DESCRIPTION
[0046] Although teachings of the present disclosure are described
more fully hereinafter with reference to the accompanying drawings,
the underlying concepts may, however, be embodied in many different
forms and should not be construed as limited to the exemplary
embodiments set forth herein. Rather, these exemplary embodiments
are provided so that this disclosure will be thorough and complete,
and will fully convey its teachings to those skilled in the
pertinent art. In the drawings, the sizes and relative sizes of
layers and regions may be exaggerated for sake of clarity.
[0047] It will be understood that when an element or layer is
referred to as being "on," "connected to" or "coupled to" another
element or layer, it can be directly on, connected or coupled to
the other element or layer or intervening elements or layers may be
present. In contrast, when an element is referred to as being
"directly on," "directly connected to" or "directly coupled to"
another element or layer, there are no intervening elements or
layers present. Like numerals refer to like elements throughout. As
used herein, the term "and/or" includes any and all combinations of
one or more of the associated listed items.
[0048] It will be understood that, although the terms first,
second, third etc. may be used herein to describe various elements,
components, regions, layers and/or sections, these elements,
components, regions, layers and/or sections should not be limited
by these terms. These terms are only used to distinguish one
element, component, region, layer or section from another region,
layer or section. Thus, a first element, component, region, layer
or section discussed below could be termed a second element,
component, region, layer or section without departing from the
teachings of the present invention.
[0049] Spatially relative terms, such as "beneath," "below,"
"lower," "above," "upper" and the like, may be used herein for ease
of description to describe one element or feature's relationship to
another element(s) or feature(s) as illustrated in the figures. It
will be understood that the spatially relative terms are intended
to encompass different orientations of the device in use or
operation in addition to the orientation depicted in the figures.
For example, if the device in the figures is turned over, elements
described as "below" or "beneath" other elements or features would
then be oriented "above" the other elements or features. Thus, the
exemplary term "below" can encompass both an orientation of above
and below. The device may be otherwise oriented (rotated 90 degrees
or at other orientations) and the spatially relative descriptors
used herein interpreted accordingly.
[0050] The terminology used herein is for the purpose of describing
particular exemplary embodiments and is not intended to be limiting
of the present disclosure. As used herein, the singular forms "a,"
"an" and "the" are intended to include the plural forms as well,
unless the context clearly indicates otherwise. It will be further
understood that the terms "comprises" and/or "comprising," when
used in this specification, specify the presence of stated
features, integers, steps, operations, elements, and/or components,
but do not preclude the presence or addition of one or more other
features, integers, steps, operations, elements, components, and/or
groups thereof.
[0051] Exemplary embodiments are described herein with reference to
cross-sectional illustrations that are schematic illustrations of
idealized example embodiments (and intermediate structures) of the
present invention. As such, variations from the shapes of the
illustrations as a result, for example, of manufacturing techniques
and/or tolerances, are to be expected. Thus, example embodiments
herein should not be construed as limited to the particular shapes
of regions illustrated herein but are to include deviations in
shapes that result, for example, from manufacturing. For example,
an implanted region illustrated as a rectangle will, typically,
have rounded or curved features and/or a gradient of implant
concentration at its edges rather than a binary change from
implanted to non-implanted region. Likewise, a buried region formed
by implantation may result in some implantation in the region
between the buried region and the surface through which the
implantation takes place. Thus, the regions illustrated in the
figures are schematic in nature and their shapes are not intended
to illustrate the actual shape of a region of a device and are not
intended to limit the scope of the present invention.
[0052] Unless otherwise defined, all terms (including technical and
scientific terms) used herein have the same meaning as commonly
understood by one of ordinary skill in the pertinent art to which
this disclosure belongs. It will be further understood that terms,
such as those defined in commonly used dictionaries, should be
interpreted as having a meaning that is consistent with their
meaning in the context of the relevant art and will not be
interpreted in an idealized or overly formal sense unless expressly
so defined herein.
[0053] Hereinafter, the present disclosure of invention will be
explained in detail with reference to the accompanying
drawings.
[0054] FIG. 1 is a plan view illustrating a solar energy module 1
in accordance with a first embodiment. FIG. 2 is a cross-sectional
view illustrating the solar energy module 1 taken along a line I-I'
in FIG. 1.
[0055] Referring to FIGS. 1 and 2, the solar energy module 1
includes a plurality of horizontally extending unit cells 5 and a
vertically extending bypass line 70, both integrally formed on a
monolithic substrate 50.
[0056] Operative normal ones of the unit cells 5 can generate
electrical power in response to externally supplied incident light
such as the solar light shown entering from the bottom of the
electrically-insulating and light-passing substrate 50 in FIG. 2.
As seen in FIG. 1, the horizontal unit cells 5 are disposed one
after another along a first vertical direction D1 (vertical in FIG.
1) and they are initially all electrically connected in series with
each other along that first direction D1. In the illustrated
exemplary embodiment, the solar energy module 1 is formed of a thin
film construct (e.g., it uses thin films of amorphous silicon as
its active layer). Thus, the solar energy module 1 includes a light
passing (e.g., transparent) and electrically insulating substrate
50 such as a glass substrate or a plastic one or a combination of
both.
[0057] Each of the unit cells 5 includes a set of electrodes
referenced as 10 and disposed on the substrate 50, a plurality of
semiconductor layers referenced as 20 and a local repair pad 30
(where the lead line of reference number 30 terminates at the top
edge of the repair pad in FIG. 1).
[0058] The electrode set 10 includes a lower electrode layer 11 and
an upper electrode layer 15 (where the respective lead lines of
reference numbers 11, 15 terminate at the top edges of the
respective lower and upper electrode layers in FIG. 1).
[0059] As seen in FIG. 2, the lower electrode layer 11 is formed on
an upper face of the substrate 50 and may be formed of transparent
and electrically conductive materials, for example, one or more
transparent conductive oxides (TCO's, e.g., ITO, IZO, etc.).
[0060] The upper electrode layer 15 is disposed above the lower
electrode layer 11 and facing the lower electrode layer 11. The
upper electrode layer 15 may be formed to include a light
reflecting metal (e.g., reflective aluminum). Thus, the upper
electrode layer 15 may function as a light reflecting
electrode.
[0061] The set of semiconductor layers 20 is disposed between the
lower electrode layer 11 and the upper electrode layer 15. The
semiconductor layers set 20 can generate an electromotive force
(e.g., a voltage) in response to absorbed incident light such as
solar light transmitted through the substrate 50 and through the
lower electrode layer 11. An electric field may be formed between
the lower electrode layer 11 and the upper electrode layer 15 due
to the electromotive force, so that an electric current may be
generated by the unit cells 5 when connected to an appropriate
load.
[0062] The type of semiconductors used in layer 20 may be varied.
For example, the illustrated set of semiconductor layers 20 may
define a PIN junction diode. Such a PIN diode may be formed by
stacking a P-type semiconductor layer 21 (e.g., a-Si), an intrinsic
(I-type) semiconductor layer 23 and an N-type semiconductor layer
25 according to this recited order to form the semiconductor layers
set 20. (Although not explicitly shown in FIG. 2, it is understood
that vertical sidewall faces (e.g., 7) of the stacked semiconductor
layers (e.g., 21=P, 23=I, 25=N) are insulated for example by a thin
oxide (not shown) so as to prevent shorting through adjacent
vertical sides of electrodes 11 and 15.) Since the semiconductor
layers set 20 may define an optical absorption diode which absorbs
light and responsively generates an electrical voltage and/or
current, a unit cell 5 is formed. The currents and/or voltages
generated by the respective unit cells 5 may be collected through
output lines which are connected to selected ones of the lower
electrode layers 11 and the upper electrode layers 15,
respectively.
[0063] The electrode set 10 and the semiconductor layers set 20 may
be formed on the substrate 50 by using thin-film deposition
processes. A cell-to-cell separation space 27 may be formed through
the upper electrode layer 15 and through the semiconductor layers
set 20, where separation space 27 is periodically repeated along
the D1 direction as illustrated in FIG. 2. The unit cells 5 are
thus separated from each other by the cell-to-cell separation
spaces 27. First insulating sidewalls (not shown) may be formed on
the inside walls of each cell-to-cell separation spaces for
providing electrical insulation.
[0064] In one embodiment, each of the unit cells 5 may have a width
about 1 cm (as measured in the D1 direction of FIG. 2) and a length
about 1 m or more (in other words, an aspect ratio of about 1:100
or more). Thus, each of the unit cells 5 may have the shape of an
elongated rectangle or bar as seen in FIG. 1. The unit cells 5 are
electrically connected in series with each other along the first
direction D1 which is substantially perpendicular to the
longitudinal axes of the unit cells 5.
[0065] For example, the upper electrode layer 15 of a first of the
unit cells 5 may be electrically connected to the lower electrode
layer 11 of an adjacent second of the unit cells 5 along the first
direction D1 as is schematically illustrated in FIG. 2. Each
contact hole 26 is formed through the semiconductor layers set 20,
so that the lower electrode layer 11 is partially exposed at the
bottom of the otherwise insulated contact hole 26 (into which hole,
electrode layer 15 descends). The upper electrode layer 15 of the
adjacent unit cell 5 extends down to the bottom of the contact hole
26 so as to be electrically connected to the lower electrode layer
11 of the next cell along the D1 direction (to its right as shown
in FIG. 2). Prior to deposition of layer 15, insulating sidewalls
(not shown) may be formed on the insides of each contact hole 26 so
as to thereby insulate the semiconductor layers set 20 from the
portion of the upper electrode layer 15 that descends down into
contact hole 26.
[0066] An electrode separation gap 8 is formed between the adjacent
lower electrode layers, for example by use of sidewall insulating
material. The semiconductor layers set 20 may extend into the
electrode separation gap 8 without making sidewall contact with the
adjacent lower electrodes 11 and 11' (the prime indicating the next
cell in the D1 direction). Gap insulating layers (not shown) may be
formed on inside of each electrode separation gap 8 to insulate the
semiconductor layers set 20 and the lower electrode 11 between the
adjacent unit cells 5.
[0067] FIG. 3 is a cross-sectional view illustrating the solar
energy module 1 taken along a line II-II' in FIG. 1.
[0068] Referring to FIGS. 1 to 3, the repair pad 30 protrudes from
the electrode set 10 along the cell's longitudinal axis toward one
side of the unit cell 5. In this example embodiment, the repair pad
30 is integrally formed seamlessly with, or is otherwise
electrically connected to the lower electrode layer 11. The repair
pad 30 extends beyond the lower electrode 1 along the cell's
longitudinal axis direction and thus protrudes in an exposed manner
from the end portion of the unit cell 5. The lower electrode layer
11 and the repair pad 30 may be formed from a same material (e.g.,
ITO, IZO, etc.). The repair pads 30 of two adjacent cells may be
used to bypass (e.g., short out) a single defective unit cell 5
among the adjacent cells and to thus provide a repair for the
defect. Here, "to repair a defect" refers to creating a
cell-bypassing closed circuit connection around the defective unit
cell 5 while leaving the rest of the array of the unit cells 5
connected to each other in series and thus allowing the remaining
nondefective cells to operate in series while electrically
bypassing the defective (e.g., open) unit cell 5.
[0069] The aforementioned bypass line 70 is formed closely adjacent
to, but spaced apart from the plurality of repair pads 30 of the
respective unit cells 5. The bypass line or conductor 70 may extend
along the first direction D1 (vertical in FIG. 1) and may include
narrow sections as well as wide sections as shown in FIG. 1. When a
defective unit cell 5 is disposed in an identified row, the
integrated bypass line 70 may be used to bypass the row of the
identified defective unit cell 5.
[0070] The bypass line 70 and the repair pads 30 may be formed on
the same layer or on different layers of the substrate 50. When the
bypass line 70 and the repair pads 30 are formed on the same layer,
repair processes for the defective unit cell 5 may become more
efficient.
[0071] The solar energy module 1 may further include a first module
output line 93 and a second module output line 95. The first output
line 93 (where the lead line of reference number 93 terminates at
the top edge of the first module output line in FIG. 1) is
integrally connected to the module's topmost repair pad 30, where
the latter corresponds to a maximum high-voltage output of the
solar energy module 1. The second module output line 95 (where the
lead line of reference number 95 terminates at the bottom edge of
the second module output line in FIG. 1) is integrally connected to
the module's lowermost repair pad 30 where the latter corresponds
to a lowest output voltage (e.g., ground or negative) of the solar
energy module 1.
[0072] The probability that the topmost unit cell 5 and/or the
bottom most unit cell 5 respectively disposed on the ends of the
array of the unit cells 5 will be defective is relatively small.
Thus, in one embodiment, the first output line 93 and the second
output line 95 may be directly connected to the repair pads 30 of
the top unit cell 5 and the bottom unit cell 5 respectively rather
than through the bypass line 70. (In an alternate embodiment, e.g.,
that of FIG. 16, the vertical bypass line 70 is directly connected
to the top and bottom module output lines, 393, 395 and cuts are
made into the vertical bypass line 70 at the points where it is
strap-wise connected to a topmost and bottommost cell of the
array.)
[0073] FIG. 4 is an equivalent circuit diagram for the unit cell 5
in FIG. 2 and is used for explaining some of the different kinds of
defects that may occur.
[0074] Referring to FIG. 4, the semiconductor layers set 20 is
represented as the optical absorption diode 20 which absorbs light
and generates a corresponding electromotive force resulting in the
production of current J.sub.Light. The same reference number 20 is
used for the optical absorption diode 20 and the semiconductor
layers 20.
[0075] A contact series resistor, R-series is effectively formed at
an interface between the lower electrode layer 11 and the P-type
semiconductor layer 21 and/or at an interface between the upper
electrode layer 15 and the N-type semiconductor layer 25. The
contact resistor, R-series is an internal resistance of the unit
cell 5 and is thus connected in series with the idealized optical
absorption diode 20 as illustrated in FIG. 4.
[0076] The cell generated voltage which appears between the lower
electrode layer 11 and the upper electrode layer 15 may have a
lower voltage level (V) than that of the internal electromotive
force (V+IR) produced by the diode 20 due to the ohmic drop (I*R)
of the contact resistor, R-series. In addition, a first current Ij
outputted from the internal diode 20 will be increased when the
resistance of the contact resistor R-series is decreased and diode
voltage remains unchanged. The resistance of the contact
resistance, R-series of a normal unit cell 5 may be very small.
However, a defective cell may have a substantially greater contact
resistor, R-series which disadvantageously impedes flow of series
current through the series connected array of plural diodes.
[0077] A portion of the ideal current, I.sub.J generated by each
ideal diode 20 may fail to be drawn out at the output terminal (V,
I) and instead may be lost as shunt loss current I.sub.rsh through
a parasitic shunt resistance, R.sub.shunt. For example, a portion
of the generated current may be leaked along cell side faces 7 of
the cell-to-cell separation space 27 and may be leaked along the
electrode separation gap 8 as illustrated in FIG. 2.
[0078] The resistance of the effective shunt resistance (R-shunt)
in good cells may be very large, so that loss due to this mechanism
is substantially negligible. As seen in FIG. 4, this loss mechanism
is referred to as a leakage resistor R-shunt and the leakage
resistor R-shunt is connected in parallel with the optical
absorption diode 20.
[0079] When the resistance of the leakage resistor R-shunt is very
large (as it should be in a normal unit cell 5), the cell output
current I is substantially the same as the ideal current I.sub.J
output by the optical absorption diode 20.
[0080] In accordance with an example embodiment, each repair pad 30
extends from the lower electrode layer 11 toward one side of the
respective unit cell 5 and toward the bypass line 70 where the
vertical bypass line 70 is disposed to be closely adjacent to and
normally spaced apart and insulated from the repair pads 30, but
where the spacing may be conveniently closed by one or more means
so as to thereby connect the unit cell 5 to the adjacent bypass
line 70. By cutting the bypass line 70 in appropriate places and/or
connecting the bypass line 70 to adjacent repair pads 30 in
appropriate places, a repair processes may be optionally performed
for one or more defective unit cells 5 of the integrated module, so
that the mass production yield of usable solar energy modules 1 may
thereby be increased.
[0081] FIG. 5 is a flowchart illustrating an exemplary method of
repairing the solar energy module in accordance with a first
embodiment by using the repair pads 30 and/or the adjacent bypass
line 70.
[0082] Referring to FIG. 5, in this embodiment, the method of
repairing the solar energy module may be used in repairing the
solar energy module 1 of FIGS. 1 to 4. In the method of repairing,
at least one of a first bypassing and a second bypassing is
performed. The performing order for the first bypassing and the
second bypassing may be varied and repeated as deemed
appropriate.
[0083] In the optional first bypassing step S10, the repair pads 30
of a first unit cell 5 and a second unit cell 5 are connected to
the bypass line 70 so that one or more unit cells 5 including at
least one of the first unit cell 5 or the second unit cell 5 are
bypassed (step S10).
[0084] First, before bypassing is implemented, each unit cell 5 is
inspected to determine if the unit cell 5 is a defective unit cell
5. A defective unit cell 5 may be deemed as such if it fails to
have desired properties substantially close to that of the ideal
optical absorption diode 20 and its associated series and shunt
resistances (R.sub.series, R.sub.shunt). Inspection and
determination may be carried out by automated means such as by
automated test equipment (ATE) with appropriate computer software
controlling the inspection and the subsequent repair process if
needed.
[0085] One method by which it may be determined whether a given
unit cell 5 has any defects or not is by determining whether an I
versus V graph (see FIG. 8) for that cell shows a current outputted
from the unit cell 5 in relation to a potential difference formed
between the lower electrode layer 11 and the upper electrode layer
15 as substantially following a desired rectification graph of a
current in relation to voltage for an ideal diode 20 or not.
[0086] FIG. 6 is a cross-sectional view illustrating a first
example method of testing a corresponding unit cell 5 for defects.
FIG. 7 is a cross-sectional view illustrating another example
method of testing the unit cell 5 for defects.
[0087] Referring to FIGS. 6 and 7, a set of probes 104 may be used
to test the unit cell 5. For example, the probes 104 are contacted
with the upper electrode layers 15 adjacent to each other,
respectively, and a varied test voltage (V) may be applied between
the upper electrode layers 15 as illustrated in FIG. 6 while
resulting current (I) is measured (or vise versa).
[0088] Alternatively, the probes 104 are contacted with the lower
electrode layers 11 (e.g., to pads 30) adjacent to each other,
respectively, and the test voltage may be applied to the lower
electrode layers 11 as illustrated in FIG. 7.
[0089] The upper electrode layer 15 of one of the unit cells 5 of
the solar energy module 1 illustrated in FIGS. 1 to 4 is
electrically connected to the lower electrode layer 11 of another
one of the unit cells 5 adjacent to the one of the unit cells 5
along the first direction D1. Thus, when the time varied or
discretely sampled test voltages are applied to the unit cell 5 as
illustrated in FIGS. 6 and 7, the test voltage is applied to the
lower electrode layer 11 and the upper electrode layer 15 of the
same unit cell 5.
[0090] FIG. 8 shows a variety of possible graphs of a measured
current I passing through the unit cell 5 in relation to an applied
and changed test voltage V applied to the unit cell 5 as
illustrated in FIGS. 6 and 7.
[0091] Referring to FIGS. 4 and 8, when the resistance of the
contact resistance R-series of the unit cell 5 is very small and
the resistance of the leakage resistance R-shunt is very large, the
unit cell 5 is regarded as a normal unit cell 5. In the normal unit
cell 5, when output voltage V exceeds a critical or threshold
voltage Voc, a positive and large output current I is outputted
from the unit cell 5. A normal rectification graph of a current (I)
in relation to voltage (V) of a diode 20 as illustrated with a
solid un-dotted line in FIG. 8 may be obtained from the normal unit
cell 5. This normal rectification graph may be made without
supplying light to the tested cell and instead merely determining
what the forward bias threshold voltage Voc of the cell is and what
the reverse bias current is, as well as what I versus V curve looks
like at other sample points in the I versus V plane.
[0092] A curve marked with triangle dots in FIG. 8 is a
characteristic curve of current in relation to the voltage of the
unit cell 5, which is obtained when the resistance of the contact
resistor R-series is larger than a predefined limit, so that the
unit cell 5 loses the characteristics of an ideal diode 20. An
abnormal curve of a current in relation to voltage of the unit cell
5 as mentioned above shows up when the contacts between the lower
electrode layer 11 and the semiconductor layer 20 and between the
upper electrode layer 15 and the semiconductor layer 20 are not
good. The loss of current output (I) versus test voltage (V)
applied is due to the large resistance of the contact resistor
R-series, so that an output current of the defective unit cell 5 is
much smaller than that of the normal unit cell 5 with output
voltages of the defective unit cell 5 and the normal unit cell 5
being the same.
[0093] A curve marked with circle dots in FIG. 8 is a
characteristic curve of a current in relation to the voltage of the
unit cell 5, which is obtained when the resistance of the leakage
resistance R-shunt is smaller than a respective predefined limit,
so that the unit cell 5 loses the characteristics of an ideal diode
20 and appears to function more like just a linear resistor rather
than a nonlinear diode. Referring to FIG. 4, when the resistance of
the leakage resistor R-shunt is smaller than the limit, although
the output voltage V of the defective unit cell 5 is smaller than
the critical voltage Voc, a relatively large current may flow
between the lower electrode layer 11 and the upper electrode layer
15, so that the unit cell 5 loses the characteristics of an ideal
diode 20 that blocks current flow when operating below
V.sub.OC.
[0094] When a defective unit cell 5 is detected, the electrodes 10
of the defective unit cell 5 may be electrically shorted to one
another in one embodiment, for example by connecting nearby repair
pads to the bypass line 70 or directly shorting the repair pads
30.
[0095] FIG. 9 is a plan view of the solar energy module 1 repaired
according to one or more methods described in FIGS. 5 and 9.
[0096] Referring to FIG. 9, in this exemplary embodiment, when a
first defective unit cell, say C4, is next adjacent to a second
defective unit cell, say C5, the repair pad 30 extending from the
lower electrode 11 of the first defective unit cell C4 is connected
to the bypass line 70 and the repair pad 30 extending from the
lower electrode 11 of the next non-defective unit cell, C6 is
connected to the bypass line 70. For example, as part of such a
defects bypassing process, a first bridge 35 is formed to connect
the repair pad 30 of the first defective unit cell C4 to the bypass
line 70. The first bridge 35 may partially overlap with the
selected repair pad 30 and the bypass line 70. The first bridge 35
may be formed for example by soldering or by other space closing
conductive means. A second bridge 37 is similarly formed to connect
the repair pad 30 of the non-defective unit cell C6 to the bypass
line 70.
[0097] In the above example, two normal unit cells are connected to
the bypass line 70; namely, the normal cell C6 immediately
following the sequence of defective cells, C4 and C5; and the
normal cell (to the left of C4) immediately preceding the sequence
of defective cells, C4 and C5. Thus, the bypass line 70 or a
selectively cut-out portion 72 thereof, bypasses the defective
cells while linking the normal cells together.
[0098] In the exemplary first bypassing, finally, a portion 72 of
the bypass line 70 which connects the defective unit cell C4 to the
normal unit cell C6 is divided (by cut 81) from the other portion
74 of the bypass line 70 so that the defective unit cells are
bypassed (step S20).
[0099] For example, the portion 72 of the bypass line 70 and the
other portion 74 of the bypass line 70 may be divided from each
other at dividing points 81 and 82 as illustrated in FIG. 9 by a
computer-controlled laser beam or other appropriate means. Thus, a
consecutive series of the defective unit cells C4 and C5 may be
eliminated from the array of the successive unit cells 5 connected
in series with each other while the series connection of good cells
is maintained.
[0100] In the second bypassing, the repair pads 30 next adjacent to
each other are connected to each other without using the bypass
line 70 (step S30).
[0101] For example, when a defective unit cell C1 is between normal
unit cells C2 and C3 (cells that are operative within prespecified
mass production specifications), and normal unit cell C2 is next
adjacent to the defective unit cell C1 in the D1 direction, the
repair pad 30 extending from the lower electrode 11 of the
defective unit cell C1 is connected to the repair pad 30 extending
from the lower electrode 11 of the next adjacent (in D1 direction)
normal unit cell C2 by a third bridge 33. This shorts out the
defective unit cell C1 as seen in FIG. 10. Thus the defective unit
cell C1 may be eliminated from the array of the successive unit
cells 5 which otherwise remain connected in series with each
other.
[0102] In this exemplary embodiment, when the topmost unit cell 5
and/or the bottom most unit cell 5 are defective (see again FIG. 1
and module output lines 93, 95), a third bypassing may further be
performed. In the third bypassing, the first module output line 93
and/or the second module output line 95 are respectively divided
off from the repair pads 30 of the top unit cell 5 and the bottom
unit cell 5 respectively as appropriate for the given repair. The
first module output line 93 and/or the second module output line 95
are then directly connected to the top end and/or the bottom end of
the bypass line 70 respectively as appropriate for the given
repair. The bypass line 70 is then connected to the repair pads 30
of a new next topmost operative unit cell 5 and/or a new next
bottom most operative unit cell 5 of the array of successive unit
cells 5 as appropriate for the given repair. Thus, the primarily
defective top and bottom unit cells 5 may be eliminated from the
array of the successive unit cells 5 connected in series with each
other.
[0103] The performing order for steps of the method for repairing
the solar energy module 1 in FIGS. 5 to 9 may be varied from that
recited above.
[0104] FIG. 10 is an equivalent circuit diagram illustrating the
solar energy module 1 in FIG. 9.
[0105] Referring to FIG. 10, when the defective unit cells C4 and
C5 are consecutive, the defective unit cells C4 and C5 are skipped
over in the array of the successive unit cells 5 by the first
bypassing using portion 72 of the bypass line 70. When the
nonconsecutive single defective unit cell C1 is next adjacent (in
the D1 direction) to the normal unit cell C2, the nonconsecutive
defective unit cell C1 is directly connected to the normal unit
cell C2 by bridging together their repair pads so that the normal
unit cells C2 and C3 on both sides of the defective unit cell C1
are thereby electrically connected around the defective unit cell
C1 by the second, repair-pads-only bypassing without use the bypass
line 70.
[0106] FIG. 11 is a plan view illustrating a solar energy assembly
3 having a plurality of modules in accordance with a first
embodiment of FIG. 1. FIG. 12 is an equivalent circuit diagram
illustrating the solar energy assembly 3 in FIG. 11.
[0107] Referring to FIGS. 11 and 12, in this example embodiment,
the solar energy assembly 3 includes a plurality of solar energy
modules M1, M2 and M3, where the respective first module output
lines 93 and the second module output lines 95 are integrally
connected together to define respective first and second assembly
output lines 93' and 95' (same reference number used here).
[0108] In the embodiment of FIG. 11, the three modules M1, M2 and
M3 are integrally disposed side-by-side on a common monolithic
substrate (e.g., a glass plate). Alternatively, the solar energy
modules M1, M2 and M3 may be individually attached as separate
substrates to form a common substrate and/or they are mounted to an
underlying common substrate and connections between the respective
module output lines 93 and 95 are made so as to provide
substantially equivalent couplings in the assembly wherein the
three modules M1, M2 and M3 are connected in parallel to one
another by means of the first output line 93 and the second output
line 95. As seen, in FIG. 11, the first output line 93 is an
integral extension of the topmost repair pads, and the second
output line 95 is an integral extension of the bottommost repair
pads while first and second portions 71, 75 of the adjacent bypass
lines 70 may be cut apart from one another.
[0109] The solar energy modules M1, M2 and M3 are substantially the
same as the solar energy module 1 illustrated in FIGS. 1 to 4,
except for the fact that the first module output lines 93' and the
second module output lines 95 are joined together respectively.
Thus, corresponding reference numbers are used for corresponding
elements and further descriptions of the solar energy modules M1,
M2 and M3 of this example embodiment are omitted.
[0110] In this example embodiment, each of the solar energy modules
M1, M2 and M3 is fabricated to include a respective bypass line 70.
The bypass line 70 includes a first bypass line portion 71 and a
second bypass line portion 75 where the latter may be cut apart
from the first bypass line portion 71 if desired.
[0111] The first output line 93 integrally connects the repair pads
30 of the unit cells 5 corresponding to the high-voltage output
terminals of the solar energy modules M1, M2 and M3 in parallel
with each other. The second output line 95 integrally connects the
repair pads 30 of the unit cells 5 corresponding to the low-voltage
output terminals of the solar energy modules M1, M2 and M3 in
parallel with each other. In this example embodiment, the
high-voltage output terminal and the low-voltage output terminal
correspond to the topmost unit cell 5 and the bottom most unit cell
5 of each of the solar energy modules M1, M2 and M3.
[0112] The solar energy modules M1, M2 and M3 of the solar energy
assembly 3 may initially include the same number of operative unit
cells 5. When module output voltage is drawn out from the same
number of the unit cells 5 in each of the solar energy modules M1,
M2 and M3, the isolated module output voltage of each solar energy
modules M1, M2 and M3 may nonetheless be different from each other
due to variations in a manufacturing process. (In one embodiment,
isolated module output voltages are estimated by adding the
individually measured IV curves of the operative cells and
determining expected total voltage for a given expected current
flow.) When the module output voltage of each of the solar energy
modules M1, M2 and M3 are different from each other, the lifetimes
of the solar energy modules M1, M2 and M3 and the solar energy
assembly 3 may be reduced due to the flow of undesired shunt
currents.
[0113] Thus, it is desirable to make the isolated module output
voltages as close to each other as practical for expected operating
conditions (e.g., expected current outputs). In order to make the
module output voltages be substantially the same as each other, the
number of operative unit cells 5 between the high-voltage output
terminal and the low-voltage output terminal may be trimmed to be
different from each other in the respective solar energy modules
M1, M2 and M3. Thus, the module output voltages in the solar energy
modules M1, M2 and M3 may be individually trimmed so as to be
substantially the same as each other. Trimming may be carried out
with or without repair of defective cells.
[0114] FIG. 13 is a flowchart illustrating a method of trimming for
the solar energy assembly 3 in accordance with a first embodiment.
FIG. 14 is a plan view illustrating a solar energy assembly 3
including solar energy modules M1, M2 and M3 which have been
trimmed to have substantially the same module output voltage as
each other. FIG. 15 is an enlarged view illustrating a first area A
in FIG. 14.
[0115] Referring to FIGS. 13 to 15, a method of trimming for a
solar energy assembly 3 may be automated so as to be implemented
substantially by computer-driven test and repair equipment and may
be used to automatically trim the solar energy modules in the solar
energy assembly 3 in FIG. 11 to have substantially the same
individual module output voltages as each other.
[0116] In the method of testing and trimming for a solar energy
assembly 3, a reference output voltage is produced by a reference
source (not shown) for common use in performing testing and
trimming among the individual solar energy modules M1, M2 and M3
(step S40).
[0117] To produce the reference output voltage, unit output
voltages of normal unit cells 5 of the solar energy modules M1, M2
and M3 are sampled at different current levels (including for
example by driving the unit cells with a reference current source
that produces one or more predefined reference current magnitudes)
using a probe such as illustrated in FIG. 6 or FIG. 7 and the
individual cell voltages of operative (normal) cells are summed by
the test computer or otherwise to thereby determine the respective
isolated module output voltages of each solar energy modules M1, M2
and M3 under expected operating conditions (e.g., when solar
radiation is such that each module produces an expected current
output). In one embodiment, the lowest of the determined individual
module output voltages is defined as the reference output voltage.
In an alternate embodiment, a voltage slightly lower than the
lowest of the determined individual module output voltages may be
defined as a common lowest denominator or reference output voltage
to which all the modules will be trimmed.
[0118] After determining the reference output voltage, the solar
energy modules M1, M2 and M3 are repaired and/or trimmed so as to
make each of the module output voltage of solar energy modules M1,
M2 and M3 be substantially the same as the reference output voltage
(step S50).
[0119] A method of repairing and trimming the solar energy modules
M1, M2 and M3 may be substantially the same as the method of
repairing the solar energy module 1 illustrated in FIGS. 5 to 10,
except that not only are defective unit cells bypassed but also one
or more normal unit cells may be bypassed for trimming the modules
of the solar energy assembly 3 and thereby substantially equalizing
their respective, isolated output voltages.
[0120] For example, when one or more module output voltages of the
solar energy modules M1, M2 and M3 may be higher than the reference
output voltage, at least one unit cell 5 between the top unit cell
5 and the bottom unit cell 5 of the solar energy modules M1, M2 and
M3 may be excluded (bypassed) from the array of unit cells 5 thus
eliminating its contribution to the total module output
voltage.
[0121] In FIG. 14, a first solar energy module Ml is repaired
and/or trimmed by using the first bypassing and the second
bypassing, a second solar energy module M2 is repaired or trimmed
by using the second bypassing and a third solar energy module M3 is
repaired or trimmed by using the first bypassing. As a result of
the repairing and/or trimming, each of the module output voltage of
solar energy modules M1, M2 and M3 becomes substantially the same
as the reference output voltage.
[0122] After trimming by repairing or otherwise, in one embodiment,
the originally isolated output terminals of the solar energy
modules M1, M2 and M3 are connected to each other in parallel by
the assembly output lines (step S60).
[0123] For example, the first output line 93 integrally connects
the repair pads 30 of the unit cells 5 corresponding to the
high-voltage output terminals of the solar energy modules M1, M2
and M3 in parallel with each other. The second output line 95
integrally connects the repair pads 30 of the unit cells 5
corresponding to the low-voltage output terminals of the solar
energy modules M1, M2 and M3 in parallel with each other.
[0124] FIG. 16 is a plan view illustrating a solar energy module
301 in accordance with a second example embodiment.
[0125] The solar energy module 301 is substantially the same as the
solar energy module 1 illustrated in FIGS. 1 to 4, except that the
module out put lines 393, 395 are originally (prior to cutting and
bridging) integrally connected to a bypass line 370. Corresponding
reference numbers are used in FIG. 16 for corresponding elements
and thus further descriptions of the solar energy module 301 beyond
those involving the differences of this example embodiment are
omitted.
[0126] In this example embodiment 301, the first module output line
393 and the second module output line 395 are respectively
connected directly to the top end and the bottom end of the bypass
line 370. In FIG. 16, a top unit cell 5 and a bottom unit cell 5
are normal and correspond to a high-voltage terminal and a
low-voltage terminal of the solar energy module 301 respectively.
The first out put line 393 and the second output line 395 are
electrically connected to the repair pads 330 of unit cells
correspond to the high-voltage terminal and the low-voltage
terminal by the bypass line 370 and by a first bridge 361 that
couples the cut line 370 to the top cell and by a second bridge 362
that couples the cut line 370 to the bottom cell. More
specifically, isolated top and bottom portions of the bypass line
370 are defined by selective cutting of the bypass line 370 and
these isolated top and bottom portions are selectively connected by
bridges 361, 362 to the respective repair pads 330 of the
high-voltage cell and the low-voltage cell. Alternatively, if the
top unit cell 5 and/or the bottom unit cell 5 had been defective,
the selective cutting of the bypass line 370 to define its isolated
top and bottom portions may have been carried out differently
and/or the selective formation of bridges to operative unit cells 5
may have been carried out differently so as to tap to the
corresponding high-voltage terminal and low-voltage terminal of the
module 301.
[0127] In this example embodiment, a method of repairing the solar
energy module 301 is substantially the same as the method of
repairing the solar energy module illustrated in FIGS. 5 to 10,
except that of not including the third bypassing, further including
connecting the bypass line 370 to the repair pads 330 correspond to
the high-voltage terminal and the low-voltage terminal, and further
including dividing portions of the bypass line 370 connected to the
repair pads 330 correspond to the high-voltage terminal and the
low-voltage terminal from the other of the bypass line 370. Thus,
further descriptions of the method of repairing the solar energy
module 301 of this example embodiment are omitted.
[0128] In FIG. 16, the solar energy module 301 is repaired by the
second bypassing so that one of the unit cells 305 connected to
each other by the third bridge 363 may be excluded (bypassed) from
the array of the unit cells 305.
[0129] FIG. 17 is a plan view illustrating a solar energy assembly
303 including solar energy modules M1, M2 and M3 which may be
trimmed to have substantially the same module output voltages as
each other in accordance with a second embodiment. FIG. 18 is an
enlarged view illustrating a second area B in FIG. 17.
[0130] Referring to FIGS. 17 and 18, in this example embodiment,
the solar energy assembly 303 is substantially the same as the
solar energy assembly 3 illustrated in FIGS. 11 and 12, except for
using the solar energy module 301 illustrated in FIG. 16. Thus,
corresponding reference numbers are used for corresponding elements
and further descriptions of the solar energy assembly 303 of this
example embodiment are omitted.
[0131] In this example embodiment, a method of trimming for the
modules of the solar energy assembly 303 is substantially the same
as method of trimming for the solar energy assembly 3 illustrated
in FIGS. 13, 14 and 15, except for a method of connecting output
terminals of solar energy modules M1, M2 and M3 in parallel with
each other by output lines.
[0132] In this example embodiment, the method of connecting output
terminals of the solar energy modules M1, M2 and M3 are the same as
a method illustrated in FIG. 16. The repair pads 330 of unit cells
305 correspond to the high-voltage terminal and the low-voltage
terminal of each of the solar energy modules M1, M2 and M3 are
connected to a first bypass line portion 371 and a second bypass
line portion 375 by the first bridge 361 and the second bridge 362
respectively. The first assembly output line 393 and the second
assembly output line 395 are directly and originally connected to
the top end portion of the first bypass line portion 371 and the
bottom end portion of the second bypass line portion 375
respectively.
[0133] FIG. 19 is a plan view illustrating a solar energy module
501 in accordance with another example embodiment. FIG. 20 is a
cross-sectional view illustrating the solar energy module 501 taken
along a line III-III' in FIG. 19.
[0134] Referring to FIG. 19 and 20, in this example embodiment, the
solar energy module 501 is substantially the same as the solar
energy module 1 illustrated in FIGS. 16 to 18, except for the
location of repair pad 530 and adjacent bypass line 571 (which as
seen in FIG. 20 are disposed in line with the top of the unit cell
505 rather than its bottom). Thus, corresponding reference numbers
are used for corresponding elements and further descriptions of the
solar energy module 501 of this example embodiment are omitted.
[0135] In this example embodiment, the special repair pad 530
extends from an upper electrode layer 515 of a unit cell 505 and
protrudes out of one side of the unit cell 505 to rest on an
adjacent insulating step. Bypass line 570 is formed also on the
stepped up insulator (mounted on substrate 550) so as to have
substantially the same layer height as the repair pad 530.
[0136] In a method of repairing for a solar energy module 501 in
this example embodiment, when two defective unit cells C5 and C6
are successively disposed, the consecutive defective unit cells C5
and C6 are excluded from the array of unit cells 505 by a first
bypassing. For example, the repair pad 530 which extends from the
upper electrode 515 of the defective unit cell C6 next adjacent to
the defective unit cell C5 along the first direction D1 is
connected to a second bypass line 571 by a first bridge 563. In
addition, the repair pad 530 extending from the upper electrode 515
of a normal unit cell C4 is connected with the second bypass line
571 by a second bridge 564. The normal unit cell 505 is next
adjacent to the defective unit cell C5 along the opposite direction
to the first direction D1.
[0137] The method of repairing the solar energy module 501 in this
example embodiment is substantially the same as the method of
repairing the solar energy module 301 illustrated in FIGS. 16 to
18, except for the elements mentioned above. Thus, corresponding
reference numbers are used for corresponding elements and further
descriptions of the method of repairing the solar energy module 501
in this example embodiment are omitted.
[0138] The solar energy assembly in this example embodiment is
functionally, substantially the same as the solar energy assembly
illustrated in FIGS. 17 and 18, except for including the solar
energy module 501 illustrated in FIGS. 19 and 20. Thus, further
descriptions of the solar energy assembly in this example
embodiment are omitted.
[0139] The method of trimming the solar energy assembly in this
example embodiment is substantially the same as the method of
trimming the solar energy assembly illustrated in FIGS. 16 to 18,
except for using the method of repairing the solar energy assembly
of this example embodiment. Thus, further descriptions of the
method of trimming the solar energy assembly in this example
embodiment are omitted.
[0140] FIG. 21 is a plan view illustrating a solar energy module
701 in accordance with still another example embodiment.
[0141] Referring to FIG. 21, the solar energy module 701 in this
example embodiment is substantially the same as the solar energy
module 301 illustrated in FIGS. 16 to 18, except that repair pads
730 extend from the lower electrode layers 711 of the unit cells
705, respectively, and all of the repair pads 730 are initially all
formed to integrally join with the bypass line 770. In other words,
all the bridges from the respective repair pads 730 to the bypass
line 770 are initially intact rather than open circuits. Further
descriptions of non-different details of the solar energy module
701 in this example embodiment are omitted.
[0142] In this example embodiment, when all of the unit cells 705
are proven to be normal by test (automated or otherwise), cuts are
made; by laser beam or otherwise for all originally intact bridges
except for the repair pads 730 of the unit cells 705 corresponding
to the high-voltage output terminal and the low-voltage output
terminal, the bridge portions of the repair pads 730 of the other
unit cells 705 thus separating the other cells from the bypass line
770. As with detection and selection steps described above, various
detection and selection steps (e.g., deciding which bridges to cut)
described below may be carried out by automated means such as by
use of appropriate software provided in a general purpose or
special purpose computer.
[0143] If defective unit cells such as C1, C3 and C5 are detected
among the unit cells 705 then the following procedure may be used.
The positions of defective unit cells C1, C3 and C5 are marked as
defective ones in a computer readable memory, for example with an X
symbol for purposes of illustration and the positions of normal
unit cells 705 are marked with an O as illustrated in FIG. 21
(where the marking is either actually on the substrate and/or
virtually by use of appropriate computer software). The solar
energy module 701, which is repaired by bypassing the defective
unit cells C1, C3 and C5, is illustrated in FIG. 21.
[0144] FIG. 22 is a flowchart illustrating method of repairing the
solar energy module 701 in FIG. 21.
[0145] Referring to FIG. 21 and 22, in the method of repairing the
solar energy module 701, an electrode layers 710 of the normal unit
cells 705 are electrically cut from the bypass line 770 (step
S710).
[0146] For example, the repair pads 730 which extend from the lower
electrode layers 711 of the normal unit cells 705 are cut from the
bypass line 770 at cutting points 781 using a laser beam or another
appropriate selective and computer controlled cutting method. While
the repair pads 730 of normal unit cells C2, C4 and C6 next
adjacent to the defective unit cells C1, C3 and C5 along the first
direction D1 are not divided from the bypass line 770 but
maintained to be initially integral formed state with the bypass
line 770.
[0147] Portions of the bypass line 770 integrally formed with the
defective unit cells and the next adjacent normal unit cells are
divided from the other of the bypass line 770 (step S720).
[0148] For example, first portions 772 of the bypass line 770 which
connects the defective unit cells C1, C3 and C5 with the normal
unit cells C2, C4 and C6 adjacent to the defective unit cells C1,
C3 and C5 along the first direction D1 are divided from second
portions 774 of the bypass line 770. Thus, the lower electrode
layers 711 of the defective unit cells C1, C3 and C5 and the lower
electrode layers 711 of the normal unit cells C2, C4 and C6 are
electrically connected to each other, so that the defective unit
cells C1, C3 and C5 may be bypassed and cannot contribute to the
module output voltage.
[0149] In the method of repairing the solar energy module 701, the
normal unit cells CH and CL which respectively correspond to the
high-voltage output terminal and the low-voltage output terminal of
the solar energy module 701 are not cut from the bypass line
770.
[0150] The solar energy assembly in this example embodiment is
substantially the same as the solar energy assembly illustrated in
FIGS. 16 to 18, except for including the solar energy module 701 in
FIG. 21. Thus, further descriptions of the solar energy assembly in
this example embodiment are omitted.
[0151] The method of trimming the solar energy assembly in this
example embodiment is substantially the same as the method of
trimming the solar energy assembly illustrated in FIGS. 16 to 18
except using the method of repairing the solar energy module
illustrated in FIGS. 21 and 22. Thus, further descriptions of the
method of trimming the solar energy assembly in this example
embodiment are omitted.
[0152] FIG. 23 is a plan view illustrating a solar energy module
901 in accordance with a fifth embodiment.
[0153] Referring to FIG. 23, the solar energy module 901 in this
example embodiment is substantially the same as the solar energy
module 701 illustrated in FIG. 21 except that the repair pads 930
extend from the upper electrode layer 915 of the unit cell 905.
Thus, further descriptions of the solar energy module 901 in this
example embodiment are omitted.
[0154] In a method of repairing solar energy module 901 in this
example embodiment, the repair pads 930 which extend from the upper
electrode layers 915 of the normal unit cells 905 are cut from the
bypass line 970 at cutting points defined along the pads 930. While
the repair pads 930 of normal unit cells C2, C4 and C6 next
adjacent to the defective unit cells C1, C3 and C5 along the
opposite direction to the first direction D1 are not divided from
the bypass line 970 but maintained to be initially integral formed
state with the bypass line 970. Thus, the upper electrode layers
911 of the defective unit cells C1, C3 and C5 and the upper
electrode layers 911 of the normal unit cells C2, C4 and C6 are
electrically connected to each other, so that the defective unit
cells C1, C3 and C5 may be bypassed and cannot contribute to the
module output voltage.
[0155] Except for the above mentioned, the method of repairing
solar energy module 901 is substantially the same as the method of
repairing solar energy module 701 illustrated in FIG. 21 and 22.
Thus, further descriptions of the method of repairing the solar
energy module 901 in this example embodiment are omitted.
[0156] The solar energy assembly in this example embodiment is
substantially the same as the solar energy assembly illustrated in
FIGS. 16 to 18, except including the solar energy module 901 in
FIG. 23. Thus, further descriptions of the solar energy assembly in
this example embodiment are omitted.
[0157] The method of trimming the solar energy assembly in this
example embodiment is substantially the same as the method of
trimming the solar energy assembly illustrated in FIG. 23 except
using the method of repairing the solar energy module 901
illustrated in FIG. 23. Thus, further descriptions of the method of
trimming the solar energy assembly in this example embodiment are
omitted.
[0158] According to some example embodiments of the present
disclosure, one or more defective unit cells 905 may be bypassed so
that the mass production yields of the solar energy module and the
solar energy assembly may be increased. Also, the isolated module
output voltages of the solar energy modules may be made more
uniform by trimming so that the reliability of the solar energy
module and the solar energy assembly may be increased. Thus, the
present disclosure may be used in manufacturing and repairing of
solar energy modules such as those that includes unit cells of a
thin-film type connected in series with each other and the solar
energy assembly including a plurality of such solar energy
modules.
[0159] The foregoing is illustrative and is not to be construed as
limiting of the teachings provided herein. Although a few example
embodiments have been described, those skilled in the art will
readily appreciate from the above that many modifications are
possible in the example embodiments without materially departing
from the novel teachings and advantages of the present disclosure.
Accordingly, all such modifications are intended to be included
within the scope of the present teachings. In the below claims,
means-plus-function clauses are intended to cover the structures
described herein as performing the recited function and not only
structural equivalents but also functionally equivalent structures.
Therefore, it is to be understood that the foregoing is
illustrative and is not to be construed as limited to the specific
example embodiments disclosed, and that modifications to the
disclosed example embodiments, as well as other example
embodiments, are intended to be included within the scope of the
teachings.
* * * * *