U.S. patent application number 11/996542 was filed with the patent office on 2009-08-27 for device management method, analysis system used for the device management method, analysis data structure, and maintenance inspection support apparatus used for the device management method.
This patent application is currently assigned to TLV CO., INC.. Invention is credited to Yoshiyasu Fujiwara, Kazunori Oda.
Application Number | 20090216495 11/996542 |
Document ID | / |
Family ID | 37683361 |
Filed Date | 2009-08-27 |
United States Patent
Application |
20090216495 |
Kind Code |
A1 |
Fujiwara; Yoshiyasu ; et
al. |
August 27, 2009 |
Device Management Method, Analysis System Used for the Device
Management Method, Analysis Data Structure, and Maintenance
Inspection Support Apparatus Used for the Device Management
Method
Abstract
A service condition, a cause of a malfunction, or another aspect
of a device in a large group of devices to be managed can be
analyzed in an accurate and efficient manner. A complete test
involving the entire number of devices in a large group of managed
devices (T) is periodically performed to determine whether the
devices are operating normally or have a malfunction; a test result
(Ic) is recorded for each cycle of the complete test, and a device
that has been found to be malfunctioning is repaired or replaced;
and analysis data G, E are created showing a malfunctioning
frequency (N) of each of the managed devices (T) on the basis of
the test result (Ic) of the complete test that spans a plurality of
cycles.
Inventors: |
Fujiwara; Yoshiyasu; (Hyogo,
JP) ; Oda; Kazunori; (Hyogo, JP) |
Correspondence
Address: |
THE WEBB LAW FIRM, P.C.
700 KOPPERS BUILDING, 436 SEVENTH AVENUE
PITTSBURGH
PA
15219
US
|
Assignee: |
TLV CO., INC.
Kakogawa-shi
JP
|
Family ID: |
37683361 |
Appl. No.: |
11/996542 |
Filed: |
July 25, 2006 |
PCT Filed: |
July 25, 2006 |
PCT NO: |
PCT/JP2006/314691 |
371 Date: |
February 18, 2009 |
Current U.S.
Class: |
702/184 |
Current CPC
Class: |
G07C 3/08 20130101; G06Q
10/20 20130101; F01K 13/006 20130101; F16T 1/48 20130101 |
Class at
Publication: |
702/184 |
International
Class: |
G21C 17/00 20060101
G21C017/00 |
Foreign Application Data
Date |
Code |
Application Number |
Jul 25, 2005 |
JP |
2005-214646 |
Jul 26, 2005 |
JP |
2005-216145 |
Jul 27, 2005 |
JP |
2005-217353 |
Claims
1. A device management method comprising: periodically performing a
complete test involving the entire number of devices in a large
group of managed devices to determine whether the devices are
operating normally or have a malfunction; recording a test result
for each cycle of the complete test, and replacing or repairing a
device that has been found to be malfunctioning; and creating
analysis data indicating the malfunctioning frequency of each
managed device based on the test result of a complete test that
spans a plurality of cycles.
2. A device management method comprising: periodically performing a
complete test involving the entire number of devices in a large
group of managed devices to determine whether the devices are
operating normally or have a malfunction, and classifying each of
the managed devices into a plurality of classification categories
according to a prescribed classification criterion; recording a
test result for each cycle of the complete test, and replacing or
repairing a device that has been found to be malfunctioning; and
creating analysis data indicating the relation between the
malfunctioning frequency and the plurality of classification
categories for each of the managed devices, or creating analysis
data indicating the malfunctioning frequency of each managed device
by classification category, based on the test result of a complete
test that spans a plurality of cycles and on the classification
category to which each of the managed devices belongs.
3. A device management method comprising: periodically performing a
complete test involving the entire number of devices in a large
group of managed devices to determine whether the devices are
operating normally or have a malfunction, and classifying each of
the managed devices into a plurality of classification categories
for each of a plurality of prescribed classification criteria
according to the classification criterion; recording a test result
for each cycle of the complete test, and replacing or repairing a
device that has been found to be malfunctioning; and creating
analysis data indicating the relation between the malfunctioning
frequency and the plurality of classification categories for each
of the classification criteria for each of the managed devices, or
creating analysis data indicating the malfunctioning frequency of
each managed device by classification category for each of the
classification criteria, based on the test result of a complete
test that spans a plurality of cycles and on the classification
category for each of the classification criteria to which each of
the managed devices belongs.
4. The device management method according to any of claims 1
through 3, further comprising: performing a retest for each cycle
of the complete test to determine whether the replaced or repaired
device is operating normally or has a malfunction; finishing the
replacing or repairing of the device when the device is confirmed
to be operating normally as a result of the retest; and when the
device is confirmed to be malfunctioning as a result of retesting,
repeating the replacing or repairing of the device until the device
is confirmed to be operating normally as a result of retesting.
5. An analysis system comprising: input means for inputting a test
result of a complete test involving the entire number of devices in
a large group of managed devices to determine whether the devices
are operating normally or have a malfunction; storage means for
accumulating and storing the test result of each cycle of the
complete test that has been input by the input means; and
arithmetic means for creating, in accordance with a preset program,
analysis data that shows the malfunctioning frequency of each of
the managed devices on the basis of the test result of the complete
test that spans a plurality of cycles, as stored in the storage
means.
6. An analysis system comprising: input means for inputting a test
result of a complete test involving the entire number of devices in
a large group of managed devices to determine whether the devices
are operating normally or have a malfunction, and a classification
category to which each of the managed devices belongs; storage
means for accumulating and storing the test result of each cycle of
the complete test that has been input by the input means, and for
storing the associated classification category for each of the
managed devices as input by the input means; and arithmetic means
for creating, in accordance with a preset program, analysis data
indicating the relation between the malfunctioning frequency and
the plurality of classification categories for each of the managed
devices, or analysis data that shows the malfunctioning frequency
of each of the managed devices by classification category, based on
the test result of the complete test that spans a plurality of
cycles and the associated classification category to which each of
the managed devices belongs, as stored in the storage means.
7. An analysis system comprising: input means for inputting a test
result of a complete test involving the entire number of devices in
a large group of managed devices to determine whether the devices
are operating normally or have a malfunction, and a classification
category for each of a plurality of predetermined classification
criteria to which each of the managed devices belongs; storage
means for accumulating and storing the test result of each cycle of
the complete test that has been input by the input means, and for
storing the associated classification category for each of the
classification criteria for each of the managed devices as input by
the input means; and arithmetic means for creating, in accordance
with a preset program, analysis data indicating the relation
between the malfunctioning frequency and the plurality of
classification categories for each of the classification criteria
for each of the managed devices, or analysis data that shows the
malfunctioning frequency of each of the managed devices by
classification category for each of the classification criteria,
based on the test result of a complete test that spans a plurality
of cycles and the associated classification category for each of
the classification criteria to which each of the managed devices
belongs, as stored in the storage means.
8. A data structure for analysis data created for a device
management in which a complete test involving the entire number of
devices in a large group of managed devices is periodically
performed to determine whether the devices are operating normally
or have a malfunction, a test result is recorded for each cycle of
the complete test, and a device that has been found to be
malfunctioning is replaced or repaired; wherein the analysis data
structure is constituted to display a malfunctioning frequency for
each of the managed devices as determined on the basis of test
results of the complete test spanning a plurality of cycles.
9. A data structure for analysis data created for a device
management in which a complete test involving the entire number of
devices in a large group of managed devices is periodically
performed to determine whether the devices are operating normally
or have a malfunction, each of the managed devices is classified
into a plurality of classification categories according to a
prescribed classification criterion, a test result is recorded for
each cycle of the complete test, and a device that has been found
to be malfunctioning is replaced or repaired; wherein the analysis
data structure is constituted to display the relation between the
malfunctioning frequency and plurality of classification categories
for each of the managed devices, or display the malfunctioning
frequency for each of the managed devices by classification
category, as determined on the basis of test results of the
complete test spanning a plurality of cycles, and on the basis of
the classification category to which each of the managed devices
belongs.
10. A data structure for analysis data created for a device
management in which a complete test involving the entire number of
devices in a large group of managed devices is periodically
performed to determine whether the devices are operating normally
or have a malfunction, each of the managed devices is classified
into a plurality of classification categories for each of a
plurality of prescribed classification criteria according to each
of the classification criteria, a test result is recorded for each
cycle of the complete test, and a device that has been found to be
malfunctioning is replaced or repaired; wherein the analysis data
structure is constituted to display the relation between the
malfunctioning frequency and plurality of classification categories
for each of the classification criteria for each of the managed
devices, or display the malfunctioning frequency for each of the
managed devices by classification category for each of the
classification criteria, as determined on the basis of test results
of the complete test spanning a plurality of cycles, and on the
basis of the classification category for each of the classification
criteria to which each of the managed devices belongs.
11. A maintenance inspection support apparatus for performing
maintenance inspection of a device installed in a plant based on a
guideline selected from a plurality of maintenance inspection
guidelines, wherein the maintenance inspection support apparatus
comprises: a device layout data management unit for managing layout
data of the device as obtained from device arrangement chart data
that has been entered; a device attribute value acquisition unit
for acquiring a problem device attribute value that has been
identified using an identification code read from an ID tag
attached to a problem device, which is to be subjected to a
maintenance inspection and which is specified while device layout
data managed by the device layout data management unit is being
referenced; a device test data acquisition unit for acquiring
device test data for the problem device; a device evaluation data
generator for combining, for each device, the device attribute
value acquired by the device attribute value acquisition unit and
the device test data acquired by the device test data acquisition
unit, and generating device evaluation data; a database management
unit for appending a history code allowing the device evaluation
data to be managed as a history, registering the device evaluation
data in a database, and extracting device evaluation data that
conforms to a search condition; a classification processor for
classifying the device evaluation data while accessing the database
via the database management unit, and referencing a classification
criteria table; a device analysis processor for performing a
historical evaluation of the device evaluation data extracted from
the database or the device evaluation data classified by the
classification processor, and analyzing an operating state of the
device; and a display unit for displaying analysis results obtained
using the device analysis processor.
12. The maintenance inspection support apparatus according to claim
11, wherein the device evaluation data is analysis data for
indicating a malfunctioning frequency (the number of malfunctions
per unit period) obtained on the basis of test results of a
plurality of cycles of a periodic complete test pertaining to each
device to be managed.
13. The maintenance inspection support apparatus according to claim
11, wherein the device evaluation data is analysis data for
indicating a malfunctioning frequency of a managed device for each
classification category to which the managed device belongs, on the
basis of test results of a plurality of cycles of a periodic
complete test pertaining to each device to be managed.
14. The maintenance inspection support apparatus according to claim
11, wherein the device evaluation data is analysis data for
indicating a malfunctioning frequency of a managed device for a
classification criterion to which the managed device belongs, on
the basis of test results of a plurality of cycles of a periodic
complete test pertaining to each device to be managed.
Description
TECHNICAL FIELD
[0001] The present invention relates to a technique for managing a
large group of steam traps, valves, and other devices installed in
a plant.
BACKGROUND ART
[0002] An example involving steam traps will now be described. To
manage a large group of steam traps (referred to hereinbelow merely
as "traps") installed in a plant, a method has conventionally been
adopted in which, for example, managed trap Nos. 1 to 200 are
selected from a group of 1000 managed traps that are assigned
control numbers 1 to 1000, and each of the selected traps is tested
for malfunctions in a particular year. Managed trap Nos. 201 to 400
are each tested for malfunctions in the next year, and managed trap
Nos. 401 to 600 are each tested for malfunctions in the year after
that. In other words, a method is adopted in which partial tests
are periodically performed to test only some of the managed traps,
and the plurality of managed traps subjected to the partial test is
sequentially rotated.
[0003] When a malfunctioning device is detected in a group of
tested traps being handled during each cycle of partial testing,
the malfunctioning trap is replaced or repaired. In cases in which
a comprehensive trap management log (e.g., a management database)
is created so that a test result is recorded for each and every
managed trap, the test result for each trap in a group of tested
traps being handled during each cycle of partial testing is added
to and recorded in the management log.
[0004] The present applicant has previously proposed a steam trap
management method (see Patent Document 1 below) that is separate
from the above-described management method. According to the
proposed method, all the managed traps, i.e., both normally
functioning traps and malfunctioning traps, are collectively
replaced with recommended traps, a new trap management log is
created, a complete test is then periodically performed to
determine whether any trap in the entire group of managed traps
(i.e., collectively replaced traps) is operating normally or has a
malfunction, the test result for each of the tested traps handled
during each cycle of complete testing is added to and recorded in
the trap management log (i.e., the log is updated), and a trap that
has been found to be malfunctioning is replaced or repaired.
[0005] [Patent Document 1] Japanese Laid-open Patent Publication
No. 2002-140745
DISCLOSURE OF THE INVENTION
Problems that the Invention is Intended to Solve
[0006] However, the first of the conventional management methods
described above involves sequentially rotating the managed traps
being tested during periodic partial testing. The result is that
when a test result for each of a group of tested traps subjected to
each cycle of partial testing is added to and recorded in a trap
management log, mutually different test implementation conditions,
such as the test period, the number of tests, and the test
interval, are included at the same time in the test result for each
managed trap recorded in the trap management log. For this reason,
even if an analysis is made of the service conditions of each of
the managed traps, the cause of the malfunction, or other
information based on the test results for each of the managed traps
recorded in the trap management log, the analysis will not be made
under identical comparison conditions for each managed trap. A
problem is accordingly presented in that inaccuracies will occur
when the analysis is made of the service conditions of each of the
managed traps, the cause of the malfunction, or other
information.
[0007] On the other hand, the second of the conventional management
methods described above involves periodically performing a complete
test for all of the managed traps, and adding to and recording in a
trap management log test results for each of the managed traps for
each cycle of complete testing. Therefore, if an analysis is to be
made of the service conditions of each of the managed traps, the
cause of the malfunction, or other information based on the test
results for each of the managed traps recorded in the trap
management log, the analysis will be performed under the identical
comparison conditions (e.g., the test period, the number of tests,
and the test interval) for each of the managed traps; and an
accurate analysis can be performed in regard to these aspects.
Nevertheless, the fact remains that no method has yet to be
adequately established for accurately and efficiently allowing an
analysis to be performed on the service conditions of each of the
managed traps, the cause of the malfunction, or other
information.
[0008] In view of the above-described situation, a principal object
of the present invention is to provide a device management method,
an analysis system, and a data structure for analysis that can be
used to overcome the above-described problems.
Means for Solving the Problems
[0009] A first aspect of the device management method of the
present invention is characterized in comprising: periodically
performing a complete test involving the entire number of devices
in a large group of managed devices to determine whether the
devices are operating normally or have a malfunction; recording a
test result for each cycle of the complete test; replacing or
repairing a device that has been found to be malfunctioning; and
creating analysis data indicating the malfunctioning frequency of
each managed device based on the test result of a complete test
that spans a plurality of cycles.
[0010] According to this arrangement, analysis data indicating the
malfunctioning frequency (i.e., the number of malfunctions per unit
period) of each managed device are created based on the test result
of a complete test that spans a plurality of cycles obtained
through periodic complete testing. It is accordingly possible to
obtain analysis data showing the malfunctioning frequency of each
managed device as determined under the same comparison conditions
for all of the managed devices (i.e., conditions where the test
period, the number of tests, the test interval, and the like are
the same).
[0011] Accordingly, if an analysis is thus performed using analysis
data showing the malfunctioning frequency of each managed device as
determined under the same comparison conditions, then in the case
that, e.g., a specific device among the managed devices has a
higher malfunctioning frequency than the others even if the devices
are the same model, it will be possible to make a presumption, with
a high degree of certainty, that the problem relates not to the
device itself, but to the conditions under which the device in
question was installed or used; or otherwise to make an accurate
and efficient analysis of the service conditions of each of the
managed traps, the cause of the malfunction, or other aspects. The
device management method is extremely useful in this regard.
[0012] As used with reference to this arrangement, the term
"periodic complete test" is not limited to a complete test
performed at precise predetermined intervals, but also refers to a
complete test performed, for example, approximately every six
months, a complete test performed approximately every year, or any
other complete test that can be regarded as being performed on a
roughly regular basis. The same applies hereinbelow.
[0013] Also, the term "malfunctioning frequency of a managed
device" does not refer to the malfunctioning frequency of one
managed device as such (i.e., the malfunctioning frequency of a
single device) but, strictly speaking, refers to the malfunctioning
frequency of a device provided to an installation site that
accommodates a single managed device. Therefore, a case may be
considered in which two malfunctions occur in the managed devices
on a single installation site, and the managed devices are replaced
each time a malfunction occurs. In such a case, each of the
replaced devices experiences only one malfunction as such, but the
managed devices on this installation site are considered to have
two malfunctions when the malfunctioning frequency is calculated.
The same applies hereinbelow.
[0014] A second aspect of the device management method of the
present invention is characterized in comprising: periodically
performing a complete test involving the entire number of devices
in a large group of managed devices to determine whether the
devices are operating normally or have a malfunction, and
classifying each of the managed devices into a plurality of
classification categories according to a prescribed classification
criterion; recording a test result for each cycle of the complete
test; replacing or repairing a device that has been found to be
malfunctioning; and creating analysis data indicating the relation
between the malfunctioning frequency and the plurality of
classification categories for each of the managed devices, or
creating analysis data indicating the malfunctioning frequency of
each managed device by classification category, based on the test
result of a complete test that spans a plurality of cycles and on
the classification category to which each of the managed devices
belongs.
[0015] According to this arrangement, it is possible to determine
either set of analysis data under the same comparison conditions
for all of the managed devices; i.e., conditions where the test
period, the number of tests, the test interval, and the like are
the same.
[0016] Accordingly, if an analysis is thus performed using analysis
data determined under the same comparison conditions, then in the
case that, e.g., one of the managed devices that has an "A"
classification category has a higher malfunctioning frequency than
devices having another classification category, even if the
installation conditions are the same, it will be possible to make a
presumption, with a high degree of certainty, that the device
belonging to the "A" classification category is incompatible with
the given installation conditions; or otherwise to make an accurate
and efficient analysis of the service conditions of each of the
managed traps, the cause of the malfunction, or other aspects. The
device management method is extremely useful in this regard.
[0017] A third aspect of the device management method of the
present invention is characterized in comprising: periodically
performing a complete test involving the entire number of devices
in a large group of managed devices to determine whether the
devices are operating normally or have a malfunction, and
classifying each of the managed devices into a plurality of
classification categories for each of a plurality of prescribed
classification criteria according to the classification criterion;
recording a test result for each cycle of the complete test;
replacing or repairing a device that has been found to be
malfunctioning; and creating analysis data indicating the relation
between the malfunctioning frequency and the plurality of
classification categories for each of the classification criteria
for each of the managed devices, or creating analysis data
indicating the malfunctioning frequency of each managed device by
classification category for each of the classification criteria,
based on the test result of a complete test that spans a plurality
of cycles and on the classification category for each of the
classification criteria to which each of the managed devices
belongs.
[0018] According to this arrangement, it is possible to obtain
either set of analysis data under the same comparison conditions
for all of the managed devices; i.e., conditions where the test
period, the number of tests, the test interval, and the like are
the same.
[0019] Accordingly, if an analysis is thus performed using analysis
data determined under the same comparison conditions, then in the
case that, e.g., one of the managed devices that belongs to an "A1"
classification category in the classification according to an "A"
classification criterion and to a "B2" classification category in
the classification according to a "B" classification criterion has
a higher malfunctioning frequency than other devices, even if the
installation conditions are the same, it will be possible to make a
presumption, with a high degree of certainty, that the device
belonging to the "A1/B2" classification category is incompatible
with the given installation conditions; or otherwise to make an
accurate and efficient analysis of the service conditions of each
of the managed traps, the cause of the malfunction, or other
aspects. The device management method is extremely useful in this
regard.
[0020] A fourth aspect of the device management method of the
present invention is characterized in comprising: performing a
retest for each cycle of the complete test to determine whether the
replaced or repaired device is operating normally or has a
malfunction; finishing the replacing or repairing of the device
when the device is confirmed to be operating normally as a result
of the retest; and when the device is confirmed to be
malfunctioning as a result of retesting, repeating the replacing or
repairing of the device until the device is confirmed to be
operating normally as a result of retesting.
[0021] According to this arrangement, the replacing or repairing of
the device is performed until the device is confirmed to be
operating normally as a result of retesting. It is accordingly
possible to prevent a malfunctioning device from being left in a
malfunctioning state as a result of a replacement or repair failure
in each cycle of the complete test, and to enable the
malfunctioning device to be reliably placed in a normal state. It
is accordingly possible to increase the validity of analysis data
created on the basis of test results for complete tests spanning a
plurality of cycles; i.e., the validity of analysis data obtained
by determining the malfunctioning frequency of each of the managed
devices under the same comparison conditions. It is also possible
to increase the accuracy with which such analysis data is used to
make analyses of the service conditions of each of the managed
traps, the cause of the malfunction, or other information.
[0022] A first aspect of the analysis system of the present
invention is characterized in comprising: input means for inputting
a test result of a complete test involving the entire number of
devices in a large group of managed devices to determine whether
the devices are operating normally or have a malfunction; storage
means for accumulating and storing the test result of each cycle of
the complete test that has been input by the input means; and
arithmetic means for creating, in accordance with a preset program,
analysis data that shows the malfunctioning frequency of each of
the managed devices on the basis of the test result of the complete
test that spans a plurality of cycles, as stored in the storage
means.
[0023] According to this arrangement, the test results for each
cycle of the complete test are input by the input means, whereas
the test results for each cycle of the complete test that have been
inputted are accumulated and stored in the storage means. The
storage means accordingly stores the test results for a complete
test spanning a plurality of cycles.
[0024] Since the arithmetic means creates, in accordance with a
preset program, analysis data that shows the malfunctioning
frequency of each of the managed devices on the basis of the test
result of the complete test that spans a plurality of cycles as
stored in the storage means, it is possible to obtain analysis data
showing the malfunctioning frequency for each of the managed
devices as determined under the same comparison conditions for all
of the managed devices; i.e., conditions where the test period, the
number of tests, the test interval, and the like are the same.
[0025] Accordingly, if the analysis data is used to make an
analysis of the service conditions of each of the managed traps,
the cause of the malfunction, or other information, then it will be
possible to make an accurate and efficient analysis in the same
manner as with the device management method of the first aspect.
The analysis system is extremely useful for device management in
this regard.
[0026] Furthermore, the fact that the analysis data can be
automatically created by the arithmetic means makes it possible to
facilitate and streamline the entire analysis operation, including
the creation of the analysis data, and hence to facilitate and
streamline the entire device management operation.
[0027] A second aspect of the analysis system of the present
invention is characterized in comprising: input means for inputting
a test result of a complete test involving the entire number of
devices in a large group of managed devices to determine whether
the devices are operating normally or have a malfunction, and a
classification category to which each of the managed devices
belongs;
[0028] storage means for accumulating and storing the test result
of each cycle of the complete test that has been input by the input
means, and for storing the associated classification category for
each of the managed devices as input by the input means; and
[0029] arithmetic means for creating, in accordance with a preset
program, analysis data indicating the relation between the
malfunctioning frequency and the plurality of classification
categories for each of the managed devices, or analysis data that
shows the malfunctioning frequency of each of the managed devices
by classification category, based on the test result of the
complete test that spans a plurality of cycles and the associated
classification category to which each of the managed devices
belongs, as stored in the storage means.
[0030] According to this arrangement, the test results for each
cycle of the complete test are input by the input means, whereas
the test results for each cycle of the complete test that have been
inputted are accumulated and stored in the storage means. The
storage means accordingly stores the test results for a complete
test spanning a plurality of cycles, while also storing the
associated classification category to which each of the managed
devices belongs, as input by the input means.
[0031] The arithmetic means creates, in accordance with a preset
program, either of two sets of analysis data on the basis of the
test result of the complete test that spans a plurality of cycles,
and the classification category to which each of the managed
devices belongs, as stored in the storage means. The creating of
this data accordingly makes it possible to obtain analysis data
under the same comparison conditions for all of the managed
devices; i.e., conditions where the test period, the number of
tests, the test interval, and the like are the same.
[0032] Accordingly, if the analysis data is used to make an
analysis of the service conditions of each of the managed traps,
the cause of the malfunction, or other information, based on the
relationship with the plurality of classification categories, then
it will be possible to make an accurate and efficient analysis in
the same manner as with the device management method of the second
aspect. The analysis system is extremely useful for device
management in this regard.
[0033] Furthermore, the fact that the analysis data can be
automatically created by the arithmetic means makes it possible to
facilitate and streamline the entire analysis operation, including
the creation of the analysis data, and hence to facilitate and
streamline the entire device management operation.
[0034] A third aspect of the analysis system of the present
invention is characterized in having: input means for inputting a
test result of a complete test involving the entire number of
devices in a large group of managed devices to determine whether
the devices are operating normally or have a malfunction, and a
classification category for each of a plurality of predetermined
classification criteria to which each of the managed devices
belongs; storage means for accumulating and storing the test result
of each cycle of the complete test that has been input by the input
means, and for storing the associated classification category for
each of the classification criteria for each of the managed devices
as input by the input means; and arithmetic means for creating, in
accordance with a preset program, analysis data indicating the
relation between the malfunctioning frequency and the plurality of
classification categories for each of the classification criteria
for each of the managed devices, or analysis data that shows the
malfunctioning frequency of each of the managed devices by
classification category for each of the classification criteria,
based on the test result of a complete test that spans a plurality
of cycles and the associated classification category for each of
the classification criteria to which each of the managed devices
belongs, as stored in the storage means.
[0035] According to this arrangement, the test results for each
cycle of the complete test are input by the input means, whereas
the test results for each cycle of the complete test that have been
inputted are accumulated and stored in the storage means. The
storage means accordingly stores the test results for a complete
test spanning a plurality of cycles, while also storing the
associated classification category for each of the classification
criteria to which each of the managed devices belongs, as input by
the input means.
[0036] The arithmetic means creates, in accordance with a preset
program, either of two sets of analysis data on the basis of the
test result of the complete test that spans a plurality of cycles,
and the classification category for each of the classification
criteria to which each of the managed devices belongs, as stored in
the storage means. The creating of this data accordingly makes it
possible to obtain analysis data under the same comparison
conditions for all of the managed devices; i.e., conditions where
the test period, the number of tests, the test interval, and the
like are the same.
[0037] Accordingly, if the analysis data is used to make an
analysis of the service conditions of each of the managed traps,
the cause of the malfunction, or other information, based on the
relationship with the plurality of classification categories for
each of the classification criteria, then it will be possible to
make an accurate and efficient analysis in the same manner as with
the device management method of the third aspect. The analysis
system is extremely useful for device management in this
regard.
[0038] Furthermore, the fact that the analysis data can be
automatically created by the arithmetic means makes it possible to
facilitate and streamline the entire analysis operation, including
the creation of the analysis data, and hence to facilitate and
streamline the entire device management operation.
[0039] A first aspect of the analysis data structure of the present
invention is a data structure for analysis data created for a
device management in which a complete test involving the entire
number of devices in a large group of managed devices is
periodically performed to determine whether the devices are
operating normally or have a malfunction, a test result is recorded
for each cycle of the complete test, and a device that has been
found to be malfunctioning is replaced or repaired; wherein the
analysis data structure is characterized in being constituted to
display a malfunctioning frequency for each of the managed devices
as determined on the basis of test results of the complete test
spanning a plurality of cycles.
[0040] According to this arrangement, analysis data is used to
display the malfunctioning frequency for each of the managed
devices; i.e., the malfunctioning frequency determined under the
same comparison conditions for all of the managed devices
(conditions where the test period, the number of tests, the test
interval, and the like are the same), as determined on the basis of
test results of a complete test spanning a plurality of cycles,
obtained using periodic complete tests.
[0041] Accordingly, if an analysis is made of the service
conditions of each of the managed traps, the cause of the
malfunction, or other information, based on the malfunctioning
frequency for each of the managed devices as displayed, then it
will be possible to make an accurate and efficient analysis in the
same manner as with the device management method of the first
aspect. The analysis system is extremely useful for device
management in this regard.
[0042] A second aspect of the analysis data structure of the
present invention is a data structure for analysis data created for
a device management in which a complete test involving the entire
number of devices in a large group of managed devices is
periodically performed to determine whether the devices are
operating normally or have a malfunction, each of the managed
devices is classified into a plurality of classification categories
according to a prescribed classification criterion, a test result
is recorded for each cycle of the complete test, and a device that
has been found to be malfunctioning is replaced or repaired; the
analysis data structure characterized in being constituted to
display the relation between the malfunctioning frequency and
plurality of classification categories for each of the managed
devices, or display the malfunctioning frequency for each of the
managed devices by classification category, as determined on the
basis of test results of the complete test spanning a plurality of
cycles, and on the basis of the classification category to which
each of the managed devices belongs.
[0043] According to this arrangement, analysis data is used to
display the relation between the malfunctioning frequency and the
plurality of classification categories for each of the managed
devices as determined under the same comparison conditions for all
of the managed devices (i.e., conditions where the test period, the
number of tests, the test interval, and the like are the same), or
the malfunctioning frequency of each of the managed devices by
classification category as determined under the same comparison
conditions for all of the managed devices.
[0044] Accordingly, if an analysis is made, in regard to the
relationship with the plurality of classification categories, of
the service conditions of each of the managed traps, the cause of
the malfunction, or other information, based on the relation
between the malfunctioning frequency and the plurality of
classification categories for each of the managed devices, or the
malfunctioning frequency of each of the managed devices by
classification as displayed, then it will be possible to make an
accurate and efficient analysis in the same manner as with the
device management method of the second aspect. The analysis system
is extremely useful for device management in this regard.
[0045] A third aspect of the analysis data structure of the present
invention is a data structure for analysis data created for a
device management in which a complete test involving the entire
number of devices in a large group of managed devices is
periodically performed to determine whether the devices are
operating normally or have a malfunction, each of the managed
devices is classified into a plurality of classification categories
for each of a plurality of prescribed classification criteria
according to each of the classification criteria, a test result is
recorded for each cycle of the complete test, and a device that has
been found to be malfunctioning is replaced or repaired; the
analysis data structure characterized in being constituted to
display the relation between the malfunctioning frequency and
plurality of classification categories for each of the
classification criteria for each of the managed devices, or display
the malfunctioning frequency for each of the managed devices by
classification category for each of the classification criteria, as
determined on the basis of test results of the complete test
spanning a plurality of cycles, and on the basis of the
classification category for each of the classification criteria to
which each of the managed devices belongs.
[0046] According to this arrangement, analysis data is used to
display the relation between the malfunctioning frequency and the
plurality of classification categories for each of the
classification criteria for each of the managed devices as
determined under the same comparison conditions for all of the
managed devices (i.e., conditions where the test period, the number
of tests, the test interval, and the like are the same), or the
malfunctioning frequency of each of the managed devices by
classification category for each of the classification criteria as
determined under the same comparison conditions for all of the
managed devices.
[0047] Accordingly, if an analysis is made, in regard to the
relationship with the plurality of classification categories for
each of the classification criteria, of the service conditions of
each of the managed traps, the cause of the malfunction, or other
information, based on the relation between the malfunctioning
frequency and the plurality of classification categories for each
of the classification criteria for each of the managed devices, or
the malfunctioning frequency of each of the managed devices by
classification category for each of the classification criteria as
displayed, then it will be possible to make an accurate and
efficient analysis in the same manner as with the device management
method of the third aspect. The analysis system is extremely useful
for device management in this regard.
[0048] The analysis data used in the implementation according to
the aforedescribed aspects may be written data printed on paper or
the like, electronic data displayed on a computer display, or any
other type of data capable of displaying content.
[0049] The display mode for the variety of relations indicated
based on the analysis data when the aforedescribed aspects are
implemented is not limited to a display mode that uses graphs,
tables, or formulae to show the relation, and includes display
modes in which the relations are indicated using drawings, symbols,
colors, and the like.
[0050] The mode for displaying the malfunctioning frequency in the
analysis data is not limited to a numeric display of the frequency,
and includes a numeric display of the number of malfunctions
assuming that the sampling period is the same for all of the
managed devices, and also includes a display mode for visually
depicting the frequency and number of malfunctions using graphs,
tables, drawings, symbols, colors, or the like.
[0051] Another main subject matter of the present invention is a
maintenance inspection support apparatus for performing maintenance
inspection of a device installed in a plant based on a guideline
selected from a plurality of maintenance inspection guidelines. The
maintenance inspection support apparatus of the present invention
comprises: a device layout data management unit for managing layout
data of the device as obtained from device arrangement chart data
that has been entered; a device attribute value acquisition unit
for acquiring a problem device attribute value that has been
identified using an identification code read from an ID tag
attached to a problem device, which is to be subjected to a
maintenance inspection and which is specified while device layout
data managed by the device layout data management unit is being
referenced; a device test data acquisition unit for acquiring
device test data for the problem device; a device evaluation data
generator for combining, for each device, the device attribute
value acquired by the device attribute value acquisition unit and
the device test data acquired by the device test data acquisition
unit, and generating device evaluation data; a database management
unit for appending a history code allowing the device evaluation
data to be managed as a history, registering the device evaluation
data in a database, and extracting device evaluation data that
conforms to a search condition; a classification processor for
classifying the device evaluation data while accessing the database
via the database management unit, and referencing a classification
criteria table; a device analysis processor for performing a
historical evaluation of the device evaluation data extracted from
the database or the device evaluation data classified by the
classification processor, and analyzing an operating state of the
device; and a display unit for displaying analysis results obtained
using the device analysis processor.
[0052] An important point regarding the maintenance inspection
support apparatus shall be described below. In order for the
analysis results obtained using the device analysis processor, or
other data, to be used for managing the maintenance inspection
operation of a plant, the device analysis processor computes graphs
and evaluation maps showing the malfunctioning frequency of the
devices based on the analysis results or device evaluation data
obtained from the database via the database processing unit. These
graphs and maps are displayed on the display unit, and the device
status can be readily ascertained.
[0053] There follow three examples of data types that can be
acquired as device evaluation data.
[0054] A first type is analysis data for indicating a
malfunctioning frequency (the number of malfunctions per unit
period) obtained on the basis of test results of a plurality of
cycles of a periodic complete test pertaining to each device to be
managed.
[0055] If such analysis data is used, then in the case that, e.g.,
a specific device among managed devices of the same type has a
higher malfunctioning frequency than the others, then it will be
possible to presume that the problem relates not to the device
itself, but to the conditions under which the device in question
was installed or used. It will also be possible to make an accurate
and efficient analysis of the service conditions of each of the
managed traps, the cause of the malfunction, or other aspects.
[0056] A second type is analysis data for indicating a
malfunctioning frequency of a managed device for each
classification category to which the managed device belongs, on the
basis of test results of a plurality of cycles of a periodic
complete test pertaining to each device to be managed.
[0057] An application-based classification category is provided;
e.g., managed devices used in normal pipework, and managed devices
used for main pipelines; the malfunctioning frequency of the
managed device is measured for each of the classification
categories; and the analysis data is obtained. Using analysis data
obtained in this manner makes it possible to presume that in the
case that a managed device having a specific classification
category has a high malfunctioning frequency even if the
installation conditions are the same, it will be possible to
presume that the device having that classification category is
incompatible with the given installation conditions. It is
accordingly possible to make an accurate and efficient analysis of
the service conditions of each of the managed traps, the cause of
the malfunction, or other aspects.
[0058] A third type is analysis data for indicating a
malfunctioning frequency of a managed device for a classification
criterion to which the managed device belongs, on the basis of test
results of a plurality of cycles of a periodic complete test
pertaining to each device to be managed.
[0059] "Classification criterion" refers, e.g., to a pipework
application to which a managed device is attached, and a
configuration of a managed device. Classification criteria are
further broken into classification categories. For example, the
classification categories described above, such as the devices used
in normal pipework and the devices used in main pipelines, are
grouped under the single classification criterion referred to as
"applications. T" Classification categories such as "float-type,"
"bucket-type," and "disk-type" are grouped under the single
classification criterion referred to as "configurations." The
malfunctioning frequency of managed devices according to
classification criteria is obtained using these established
groupings, whereby, in the case that a managed device belonging to
a specific plurality of classification criteria has a high
malfunctioning frequency, it will be possible to presume that the
device in question is incompatible with the installation
conditions. It is accordingly possible to make an accurate and
efficient analysis of the service conditions of each of the managed
traps, the cause of the malfunction, or other aspects.
BRIEF DESCRIPTION OF THE DRAWINGS
[0060] FIG. 1 is a perspective view of a management unit;
[0061] FIG. 2 is a circuit diagram of the management unit;
[0062] FIG. 3 is a perspective view showing a test mode;
[0063] FIG. 4 is view showing the display mode of a management
database;
[0064] FIG. 5 is a view showing the display mode of a facility
chart image;
[0065] FIG. 6 is a view showing an analysis graph;
[0066] FIG. 7 is a view showing an analysis graph; and
[0067] FIG. 8 is a functional block view of a portable PC.
KEY
[0068] T Managed device [0069] Ic Test result [0070] N
Malfunctioning frequency [0071] G, E Analysis data [0072] 2 Input
means [0073] 14a, 14b Input means [0074] 17 Storage means [0075] Pb
Preset program [0076] 16 Arithmetic means
BEST MODE FOR CARRYING OUT THE INVENTION
[0077] FIGS. 1 and 2 show a management unit 1 used in the
management of a large group of vapor traps T installed in a
chemical plant or other vapor-using facility. The management unit 1
is composed of a testing unit 2, a portable personal computer 3
(abbreviated as "portable PC" hereinbelow), and an ID tag reader
4.
[0078] The testing unit 2 has a keypad 5 as an operating unit, a
miniature display 6 as a display unit, an internal CPU 7 (central
processing unit) as an arithmetic unit, and an internal memory 8 as
a storage unit. A testing program Pa is stored in the memory 8. The
testing unit 2 operates in accordance with the testing program Pa
executed by the CPU 7.
[0079] The testing unit 2 has a probe 9. The distal end of the
probe 9 is provided with a sensor 10 for detecting the supersonic
vibrations and temperature at an external surface of a trap T while
pressed against the external surface of the trap, as shown in FIG.
3. Vibration and temperature signals sensed by the sensor 10 are
input to the testing unit 2 via a connecting cord 11 (or an
infrared communication means or other wireless communication
means).
[0080] The ID tag reader 4 is provided to the distal end of an arm
12 mounted on the probe 9, with the arm being able to be switched
between the extended position shown by the broken line and the
retracted position shown by the solid line. When the ID tag reader
4 is brought close to an ID tag 13 attached in the vicinity of each
tested trap while the arm 12 is extended, the area number, trap
number, and other trap identification information Ia of the
corresponding trap T recorded in the ID tag 13 are read by the ID
tag reader 4 and are input to the testing unit 2.
[0081] The portable PC 3 has a keyboard 14a, stylus 14b, and mouse
(not shown) as operating units; a display 15 as a display unit; an
internal CPU 16 as an arithmetic unit; and an internal hard disk 17
as a storage unit. A management program Pb is stored on the hard
disk 17. The portable PC 3 operates in accordance with the
management program Pb executed by the CPU 16.
[0082] The portable PC 3 can have two-way communication with the
testing unit 2 via a connecting cord 18 (or an infrared
communication means or other wireless communication means). The
trap identification information Ia that is read by the ID tag
reader 4 is input to the testing unit 2 and the portable PC 3.
[0083] The memory 8 of the testing unit 2 stores the model,
application, service vapor pressure, and other types of trap
attribute information Ib of each of the tested traps T. The testing
unit 2 retrieves from the memory 8 the trap attribute information
Ib of the tested trap T specified by the trap identification
information Ia that was read by the ID tag reader 4. The trap
attribute information Ib thus read and the vibrations and
temperature sensed by the sensor 10 are evaluated using
determination criteria information Da. The determination criteria
information Da may, for example, include tables for calculating the
vapor leakage rate or the like from the trap model, temperature,
and vibration. The determination criteria information Da is stored
in the memory 8. Obtaining the vapor leakage rate as a result of
the evaluation makes it possible to determine whether the tested
trap T is operating normally or has a malfunction. In addition, the
malfunction category can also be determined, such as whether the
leak is large, medium, or small, whether there is a blowout or an
obstruction, or the like.
[0084] The testing unit 2 stores the following information in the
memory 8: trap reference information Id that may include a test
date, notes, and a plurality of other entries that are input by
operating the keypad 5 or the like for each of the tested traps T,
and the results of determining whether the traps operate normally
or have a malfunction, as well as the results of determining the
malfunction category as trap test results Ic (trap test
information). In the process, the trap test results Ic are
correlated with the trap identification information Ia and trap
attribute information Ib. These types of information are also
transmitted to the portable PC 3.
[0085] In the testing unit 2, the four types of information Ia, 1b,
1c, and Id about the tested traps T specified by the trap
identification information Ia that was read by the ID tag reader 4
(or information about the tested traps T specified by operating the
keypad 5 or in any other way) are displayed on the miniature
display 6 in scrollable form.
[0086] The hard disk 17 of the portable PC 3 stores a management
database Db in which the trap attribute information Ib about the
tested traps T (i.e., managed traps), the trap test results Ic of
each of the tests performed by the testing unit 2, the trap
reference information Id, and the like are recorded in relation
with the trap identification information Ia. In the portable PC 3
that has received the trap test results Ic from the testing unit 2,
a database update function is initiated, and the trap test results
Ic and trap reference information Id are cumulatively recorded in
the management database Db for the specified tested traps T.
[0087] The management database Db may not have any entries of the
managed traps T that correspond to the trap identification
information Ia read by the ID tag reader 4. When this happens, the
portable PC 3 creates a record as a database creation function
wherein an entry that is related to the managed traps T (i.e.,
unrecorded traps) and corresponds to the trap identification
information Ia is newly established in the management database Db.
The trap test results Ic and trap reference information Id about
the managed traps T transmitted from the testing unit 2 are
recorded in the management database Db at this point.
[0088] In addition, the portable PC 3 has a database display
function whereby the four types of information Ia to Id about each
of the managed traps T recorded in the management database Db are
displayed on the display 15 in tabular form, as shown in FIG. 4. In
this database display, the table on the display 15 is scrolled so
as to display entries related to tested traps T specified by the
trap identification information Ia that was read by the ID tag
reader 4, or to tested traps T specified by operating the keyboard
14a, stylus 14b, or the like. In cases in which the information Ia
to Id about each of the managed traps T has been written or
rewritten by operating the keyboard 14a or the like, the content
stored in the management database Db is subjected to a write or
rewrite operation accordingly.
[0089] The portable PC 3 (i.e., the management program Pb) has a
mapping function and an analysis data creation function in addition
to the database updating and creating function and the database
display function described above. With the mapping function, a
schematic facility chart image G showing the facility provided with
a large group of managed traps T such as the one shown in FIG. 5 is
displayed on the display 15 on the basis of facility chart
information Dc stored on the hard disk 17. This display is provided
instead of the above-described tabular database display shown in
FIG. 4. In addition, display elements E (icons) that show
individual tested traps T are overlaid on the facility chart image
G and displayed on the display 15 in an arrangement that conforms
to the actual trap positions. The overlaying is performed on the
basis of the trap arrangement information Dd about each of the
tested traps T that is stored on the hard disk 17 in the same
manner.
[0090] When any of the display elements E displayed in the facility
chart image G on the display 15 of the portable PC 3 is selected by
operating the stylus 14b or the like and is designated for
execution, the information Ia to Id about the managed trap T that
corresponds to this display element E is read from the management
database Db and displayed as a separate frame in the facility chart
image G on the display 15.
[0091] In addition, as an analysis information creation function of
the portable PC 3, the application of the corresponding trap T can
be displayed using differences in the shape of the display elements
E on the basis of the trap attribute information Ib of each of the
managed traps T recorded in the management database Db, as shown in
FIG. 5. In this case, a square indicates a general use, a triangle
indicates a trace use, and a circle indicates the main pipeline
use. Based on the trap test result Ic for each managed trap T
cumulatively recorded in the management database Db, and depending
on the differences in the border color or pattern of the display
elements E, the number N of malfunctions of the corresponding trap
T in the most recent preset period (e.g., 3 years) is displayed. In
this example, a thin solid border indicates zero times, a thin
broken border indicates a single time, and a thick solid border
indicates a plurality of times.
[0092] As used herein, the term "number N of malfunctions (i.e.,
malfunctioning frequency in a preset period)" refers to the number
of malfunctions experienced by managed traps T installed at a
single installation site that accommodates the traps, rather than
the number of malfunctions of a single managed trap T as such.
[0093] A single entry or a plurality of entries in any type of
information Ia to Id about the managed traps T is similarly
displayed as the analysis data creation function in the form of a
tabular database display in the portable PC 3, as shown in FIG. 4.
In this display, the classification categories (i.e., general use,
trace use, main pipeline use, and other classification categories
in the "application" entry) of these entries are specified as
search conditions by operating the keyboard 14a, the stylus 14b, or
the like, whereupon the information Ia to Id recorded in the
management database Db is displayed in tabular form on the display
15 only for the managed traps T that belong to these classification
categories. For example, specifying "float type" as a search
condition for the model entry in the trap attribute information Ib
causes the information Ia to Id recorded in the management database
Db to be displayed on the display 15 only for float-type managed
traps T.
[0094] The portable PC 3 further has the following analysis data
creation function. When a graphic display is specified in a state
in which two entries selected from the information Ia to Id about
the managed traps T are indicated by operating the keyboard 14a,
stylus 14b, or the like, the number of traps belonging to the
classification categories of one of the entries and the number of
traps belonging to the classification categories of the other entry
(i.e., the number of traps in each classification category for the
second entry) are displayed on the display 15 on the basis of the
information Ia to Id recorded in the management database Db. The
display is in the form of a 3D bar graph, pie graph, or other
specified graph. For example, a graph is displayed on the display
15, as shown in FIG. 6, by indicating a model entry in the trap
attribute information Ib and indicating entries classified by the
malfunction categories in the trap test result Ic for an arbitrary
cycle, and specifying a graphic display based on a 3D bar graph.
Also, a graph is displayed on the display 15, as shown in FIG. 7,
by indicating entries classified by the malfunction categories in
the trap test result Ic for a preceding cycle and indicating
entries classified by the malfunction categories in the trap test
result Ic for the current cycle, and specifying a graphic display
based on a pie graph.
[0095] A large group of vapor traps T is managed according to the
following sequence (a) to (f) using a management unit 1 configured
as described above.
[0096] (a) It is determined by consultations with the trap
management requester which of the vapor traps at a facility are to
be designated as managed traps T. Specifically, it is determined
based on discussions with the management requester whether all the
vapor traps at the facility are to be designated as managed traps
T, only the vapor traps in some of the sections at the facility are
to be designated as managed traps T, only the vapor traps belonging
to a specific vapor system in the facility are to be designated as
managed traps T, or the like.
[0097] (b) Facility chart information Dc and trap arrangement
information Dd, which are stored on the hard disk 17 of the
portable PC 3, are created based on a facility arrangement chart,
pipeline system chart, or the like presented by the management
requester, and the facility chart information Dc and trap
arrangement information Dd thus created are stored on the hard disk
17 of the portable PC 3.
[0098] (c) As an initial operation, the test operator brings the
management unit 1 to the installation site of each of the managed
traps T while consulting the facility chart image G displayed on
the display 15 of the portable PC 3 and the display elements E on
the facility chart image G, attaches an ID tag 13 to each of the
managed traps T, and reads the trap identification information Ia
by using the ID tag reader 4. Entries related to each of the
managed traps T are thereby created by the database creation
function in the management database Db of the hard disk 17 in the
portable PC 3. In addition, the trap identification information Ia
and the display elements E for each of the managed traps T are
correlated by the operation of a stylus 14b or the like.
[0099] In addition to attaching ID tags 13 and reading the trap
identification information Ia, the test operator also confirms the
trap attribute information Ib and trap reference information Id for
each of the managed traps T, and enters the trap attribute
information Ib and trap reference information Id into the
management database Db of the portable PC 3 by operating the
keyboard 14a, stylus 14b, or the like. The management database Db
is thus created anew for all the managed traps T.
[0100] Furthermore, the ID tags 13 are attached, the trap
identification information Ia is read, and the trap attribute
information Ib and trap reference information Id is entered. The
test operator thereby enters trap attribute information Ib and trap
reference information Id for each of the managed traps T into the
memory 8 of the testing unit 2 from the management database Db of
the portable PC 3 for each of the managed traps T. The testing unit
2 is used to test each of the managed traps T, and the test results
Ic are stored in the memory 8 of the testing unit 2 and are entered
into the management database Db of the portable PC 3.
[0101] (d) After the initial operation has concluded, the current
condition (e.g., malfunction rate, total vapor leakage, monetary
loss due to vapor leakage, and the like) of all the managed traps T
is reported to the management requester on the basis of the trap
test results Ic for the entire number of the managed traps T
recorded in the management database Db of the portable PC 3. An
initial overhaul is then performed by consultation with the
management requester. The overhaul is either a complete overhaul in
which the entire number of the managed traps T is replaced with
recommended traps (e.g., traps with reduced vapor leakage when
operating normally, traps more suitable for the installation
conditions or service conditions, or the like), or a partial
overhaul in which only malfunctioning managed traps T are repaired
or replaced with recommended traps.
[0102] In the initial overhaul, the replaced or repaired devices
are retested using the testing unit 2 to determine whether the
devices operate normally or have a malfunction. The repair or
replacement is completed for those of the managed traps T that have
been confirmed by the retesting to operate normally. For those of
the managed traps T that have been confirmed by the retesting to
have a malfunction, the repair or replacement is repeated until the
retesting confirms that the devices operate normally.
[0103] Once a replaced or repaired managed trap T is confirmed by
the retesting to operate normally, a replacement or repair record
is made for this managed trap T; i.e., the fact of the replacement
or repair is recorded in the management database Db of the portable
PC 3, as are the post-replacement or post-repair trap attribute
information Ib, trap test result Ic, and trap reference information
Id.
[0104] (e) After the initial operation is completed, a complete
test is performed periodically, such as annually or semiannually.
The testing unit 2 is used to test the entire number of the managed
traps T (i.e., to perform a test in which trap identification
information Ia is read by the ID tag reader 4 for each trap T, and
the probe 9 is brought against the trap T) irrespective of whether
a complete or partial overhaul was performed as the initial
overhaul. Each time the complete test is performed, trap test
results Ic about each of the managed traps T is added to the
management database Db. If a malfunctioning trap is detected, this
trap is repaired or replaced with a recommended trap.
[0105] In each cycle of complete testing, a replaced or repaired
device is retested by the testing unit 2 to determine whether the
device is operating normally or has a malfunction. This retesting
is part of the complete test, similarly to an initial overhaul. A
managed trap T that has been confirmed by the retesting to operate
normally is not replaced or repaired, whereas a managed trap T that
has been confirmed by the retesting to have a malfunction is
repeatedly replaced or repaired until the retesting confirms that
the device is operating normally. Once a replaced or repaired
managed trap T is confirmed by the retesting to operate normally, a
replacement or repair record is made for this managed trap T; i.e.,
the fact of the replacement or repair is added to the management
database Db of the portable PC 3, as are the post-replacement or
post-repair trap attribute information Ib, trap test result Ic, and
trap reference information Id.
[0106] In each cycle of complete testing, another testing mode can
be adopted instead of the testing mode in which the management unit
1 composed of a testing unit 2, portable PC 3, and ID tag reader 4
is used by the test operator as a portable unit to test each
managed trap T in the same manner as during the previous cycle of
initial overhauling accompanied by the creation of a management
database Db. Specifically, it is also possible to adopt a testing
mode in which only the testing unit 2 provided with an ID tag
reader 4 is used by the test operator as a portable unit to test
each managed trap T, and the trap test result Ic and trap reference
information Id about each of the managed traps T recorded in the
memory 8 of the testing unit 2 is collectively entered into the
management database Db of the portable PC 3 after the test.
[0107] (f) The service condition of managed traps T, the cause of a
malfunction, and the like are analyzed after each cycle of complete
testing or in another suitable period by using an analysis data
creation function of the portable PC 3 such as the one described
above. Examples of analysis data creation functions include
displaying the type of application based on the shape of a display
element E, displaying the number N of malfunctions by the type of
border on a display element E, displaying recorded information Ia
to Id only for managed traps T of a specific classification
category, or displaying a graph. The results of the analysis are
reported to the management requester, and appropriate measures are
taken for the facility based on the results.
[0108] In performing maintenance inspections on traps T and other
plant facility devices (the term "trap T" has been used here in
relation to such devices, but the word "device," which is a general
term, will be adopted hereinbelow) at a plant facility, the
above-described portable PC 3 uses a signal from the ID tag reader
4 or testing unit 2, and provides efficient assistance in
performing maintenance inspections on plant facility devices. In
particular, the computer provides efficient assistance to the
operator when maintenance inspection is to be performed on a device
used in a plant facility according to maintenance inspection
guidelines. These guidelines include a complete overhaul strategy
in which a complete overhaul is performed to replace the entire
number of devices to be subjected to maintenance inspections with
recommended devices, and a complete test involving the entire
number of the managed devices is then periodically repeated; and a
partial overhaul strategy in which a partial overhaul is performed
to repair only those of the managed devices that have a
malfunction, or to replace the malfunctioning devices with
recommended devices, and a complete test involving the entire
number of the managed devices is then periodically repeated. For
this reason, the functions of the portable PC 3 are configured
using programs and hardware such as those shown in FIG. 8.
[0109] Graphic user interfaces are extensively used in the portable
PC 3 in order to transmit information to the operator in an easily
understandable manner by presenting a graphic display via the
display 15, and to allow comments to be entered by the simple
operation of the operating units 14a, 14b via a graphic screen. The
unit that implements such a graphic user interface is a GUI unit
30. This unit operates in close coordination with the OS installed
on the portable PC 3, and is linked with a functional unit involved
in the maintenance inspection operation assistance provided by the
portable PC 3 and described below.
[0110] A device layout data management unit 31 performs a
management task wherein device layout data is loaded from the
outside. In the device layout data, device positions are linked to
map data related to the plant site on the basis of device layout
plan data digitized so as to indicate the layout of devices
scheduled for maintenance inspections. When each device is
subjected to a maintenance inspection, an assistance screen such as
the one shown in FIG. 5 is displayed on the display 15 on the basis
of the device layout data managed by the device layout data
management unit 31, and the operator is notified of problem
devices, which are devices that need to undergo a maintenance
inspection next. Problem devices specified by the operator are
confirmed by a problem device specifier 32. An identification
symbol (trap identification information Ia) that is read by the ID
tag reader 4 from an ID tag 13 attached to a problem device can be
used as a key code for a device attribute value (trap attribute
information Ib) stored in the memory 8 of the testing unit 2 in the
above-described embodiment. Therefore, a device attribute value of
the device specified by the identification symbol can be acquired
by the portable PC 3. A device attribute value acquisition unit 33
is provided in order to acquire the device attribute value of the
device specified via the ID tag 13 in this manner. The device
specified by the ID tag 13, i.e., the problem device, is tested by
the testing unit 2, whereby a test signal (trap test result Ic)
sent from the testing unit 2 is processed by a device test data
acquisition unit 34 as device test data that shows whether each
device is operating normally or has a malfunction.
[0111] The device attribute values acquired by the device attribute
value acquisition unit 33 and device test data acquired by the
device test data acquisition unit 34 are sent to a device
evaluation data generator 35, and are combined there in a mode in
which the corresponding devices are linked to specific
identification symbols to form device evaluation data. The device
evaluation data thus generated for each of the problem devices is
stored in a database Db. The device evaluation data for each device
is stored in the database Db each time a periodic maintenance
inspection operation is performed, and this device evaluation data
is treated as history information about each of the devices. For
this reason, a database management unit 36 is provided for
recording the device evaluation data in the database Db after a
history code (date or the like) is added so that the history [of
each device] can be managed, and extracting device evaluation data
that matches search conditions in which history conditions are also
included. Since the devices recorded in the database Db are sorted
into a large group of classification categories in accordance with
the specifications of these devices, a classification that
corresponds to these classification categories is needed when the
device evaluation data is analyzed and on other occasions. A
function is therefore provided wherein the device evaluation data
is classified while a classification processor 37 accesses the
database Db and references a classification criteria table 38 via
the database management unit 36.
[0112] A device analysis processor 39 for analyzing the operational
state of each device on the basis of the history of the device
evaluation data has an algorithm for performing a statistical
analysis in terms of malfunctioning frequency as described above,
and also has a visualizing algorithm for visually representing the
analysis results in the form of a graph, map, or other format.
Since the malfunctioning frequency is significantly affected by the
location or the conditions of use, the device evaluation data
serving as the analysis source is used in accordance with the
analysis target either in the form of data directly extracted from
the database Db or in the form of data classified by the
classification processor 37.
[0113] For the analysis results and the like obtained by the device
analysis processor 39 to be used in performing maintenance
inspections in a plant facility, a performance computation unit 40
is provided with a function whereby the malfunction rate, total
vapor leakage, monetary loss due to vapor leakage, and the like of
each device are calculated and the economic results of the
maintenance inspection operation are computed on the basis of the
analysis results and of device evaluation data obtained from the
database Db via the database management unit 36.
[0114] The following types of maintenance inspection guidelines
have been offered for use in the maintenance inspection of plant
facility devices: a complete overhaul strategy in which a complete
overhaul is performed to replace the entire number of devices to be
subjected to maintenance inspections with recommended devices, and
a complete test involving the entire number of the managed devices
is then periodically repeated; and a partial overhaul strategy in
which a partial overhaul is performed to repair only those of the
managed devices that have a malfunction, or to replace the
malfunctioning devices with recommended devices, and a complete
test involving the entire number of the managed devices is then
periodically repeated. Selection of either of the two strategies as
appropriate varies with each plant facility. Therefore, the problem
of which of the strategies to select in accordance with the plant
facility scheduled for a maintenance inspection can be resolved by
evaluating past performance. An assistance information generator 41
is accordingly provided. The assistance information generator 41
has an algorithm for generating support information (economic
effects of each strategy at a variety of plant facilities, and the
like) whereby either of the above-described two strategies is
selected as a maintenance inspection guideline on the basis of
economic effects evaluated by the performance computation unit 40.
The algorithm for generating such support information can be
constructed in a simple manner by adopting a decision theory system
such as a neural network or an expert system. The assistance
information generator 41 has an algorithm for selecting a
recommended device for use in a specific site based on the analysis
results, and is able to appraise the operator of a recommended
device when a device is to be replaced at a specific site.
Other Embodiments
[0115] Other embodiments of the present invention are described
next.
[0116] Vapor traps are given as examples of managed devices in the
above-described embodiment, but the managed devices used in the
implementation of the present invention are not limited to vapor
traps alone, and may also include various valves or tanks, as well
as production equipment and machine tools.
[0117] According to the above embodiment, there is presented a
device management method for classifying individual devices to be
managed (traps to be managed) into a plurality of classification
categories (e.g., normal use, trace use, and main pipeline use)
according to a prescribed classification criterion (e.g., by
application), and, based on test results for a complete test
spanning a plurality of cycles and on the classification category
to which each of the managed devices belongs, for creating analysis
data indicating the malfunctioning frequency for each of the
managed devices, the malfunctioning frequency for each of the
managed devices by the classification category, and a relation
between the malfunctioning frequency and the plurality of
classification categories.
[0118] It is also possible, however, to instead adopt a device
management method for classifying individual devices to be managed
into a plurality of classification categories for each of a
plurality of prescribed classification criteria (e.g., by
application) according to the classification criteria (e.g., normal
use, trace use, main pipeline use, and other classification
categories; and float-type, bucket-type, disk-type, and other
classification categories), and, based on test results for a
complete test spanning a plurality of cycles and on the
classification category for each of the classification criteria to
which each of the managed devices belongs, for creating analysis
data indicating the relation between the malfunctioning frequency
and the plurality of classification categories for each of the
classification criteria for each of the managed devices, or
analysis data indicating the malfunctioning frequency of each of
the managed devices by the classification category for each of the
classification criteria.
[0119] According to the above embodiment, there is presented an
analysis system having arithmetic means for creating, in accordance
with a preset program and on the basis of test results for a
complete test spanning a plurality of cycles and the prescribed
classification category for individual devices to be managed as
stored in storage means, analysis data indicating the
malfunctioning frequency for each of the managed devices, the
malfunctioning frequency for each of the managed devices by the
classification category, and a relation between the malfunctioning
frequency and the plurality of classification categories.
[0120] It is also possible, however, to instead adopt an analysis
system having input means for inputting a test result of a complete
test and a classification category for each of a plurality of
prescribed classification criteria to which individual devices to
be managed belong; storage means for accumulating and storing the
test result of each cycle of the complete test that has been input
by the input means; and arithmetic means for creating, in
accordance with a preset program, analysis data indicating the
malfunctioning frequency for each of the managed devices, the
malfunctioning frequency for each of the managed devices by the
classification category, and a relation between the malfunctioning
frequency and the plurality of classification categories. The
analysis data is created on the basis of test results for the
complete test spanning a plurality of cycles and the associated
classification category for each of the classification criteria for
each of the managed devices, as stored in the storage means.
INDUSTRIAL APPLICABILITY
[0121] The present invention can be applied to the management or
support of maintenance inspection operations involving a large
group of devices typified by vapor traps, valves, and other devices
installed in a plant.
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