U.S. patent application number 11/872264 was filed with the patent office on 2008-12-04 for semiconductor integrated circuit device.
This patent application is currently assigned to KABUSHIKI KAISHA TOSHIBA. Invention is credited to Keiko Abe, Mototsugu Hamada, Takahiro Hirai, Hirofumi Morise, Shiho Nakamura.
Application Number | 20080298117 11/872264 |
Document ID | / |
Family ID | 39437252 |
Filed Date | 2008-12-04 |
United States Patent
Application |
20080298117 |
Kind Code |
A1 |
Hamada; Mototsugu ; et
al. |
December 4, 2008 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Abstract
A semiconductor integrated circuit device, has a first variable
resistor element and a second variable resistor element whose
resistances are changed complementarily depending on a current; and
a current path switching circuit that supplies said current from a
power supply by switching between current paths according to
whether a normal operation mode or a read mode is input externally,
wherein said power supply is turned off and then turned on again in
said normal operation mode, and in this state, data corresponding
to the relationship between the magnitudes of the resistances of
said first variable resistor element and said second variable
resistor element is read in said read mode.
Inventors: |
Hamada; Mototsugu;
(Yokohama-Shi, JP) ; Hirai; Takahiro;
(Yokohama-Shi, JP) ; Nakamura; Shiho;
(Fujisawa-Shi, JP) ; Morise; Hirofumi;
(Yokohama-Shi, JP) ; Abe; Keiko; (Yokohama-Shi,
JP) |
Correspondence
Address: |
OBLON, SPIVAK, MCCLELLAND MAIER & NEUSTADT, P.C.
1940 DUKE STREET
ALEXANDRIA
VA
22314
US
|
Assignee: |
KABUSHIKI KAISHA TOSHIBA
Tokyo
JP
|
Family ID: |
39437252 |
Appl. No.: |
11/872264 |
Filed: |
October 15, 2007 |
Current U.S.
Class: |
365/156 |
Current CPC
Class: |
G11C 13/004 20130101;
G11C 14/009 20130101; G11C 2013/0042 20130101; G11C 13/00 20130101;
G11C 2013/0073 20130101; G11C 13/0069 20130101; G11C 5/14 20130101;
G11C 2013/0054 20130101 |
Class at
Publication: |
365/156 |
International
Class: |
G11C 11/34 20060101
G11C011/34 |
Foreign Application Data
Date |
Code |
Application Number |
Oct 20, 2006 |
JP |
2006-286210 |
Claims
1. A semiconductor integrated circuit device, comprising: a first
variable resistor element and a second variable resistor element
whose resistances are changed complementarily depending on a
current; and a current path switching circuit that supplies said
current from a power supply by switching between current paths
according to whether a normal operation mode or a read mode is
input externally, wherein said power supply is turned off and then
turned on again in said normal operation mode, and in this state,
data corresponding to the relationship between the magnitudes of
the resistances of said first variable resistor element and said
second variable resistor element is read in said read mode.
2. A semiconductor integrated circuit device, comprising: a sense
amplifier circuit that is connected to a power supply, outputs
currents from a first current supply terminal and a second current
supply terminal, and outputs a first sense signal from a first
signal terminal and a second sense signal, which is equivalent to
said first sense signal inverted, from a second signal terminal
according to a voltage drop due to output of the currents; a first
variable resistor element that is connected to said first current
supply terminal of said sense amplifier circuit at a first end,
which is one end thereof, and has a resistance that increases when
a current of a predetermined value or greater flows in a first
direction between said first end and a second end, which is the
other end thereof, and decreases when a current of a predetermined
value or greater flows in a second direction, which is opposite to
said first direction, between said first end and said second end; a
second variable resistor element that is connected to said second
current supply terminal of said sense amplifier circuit at a third
end, which is one end thereof, and to the second end of said first
variable resistor element at a fourth end, which is the other end
thereof, and has a resistance that increases when a current of a
predetermined value or greater flows in said second between said
third end and said fourth end and decreases when a current of a
predetermined value or greater flows in said first direction
between said third end and said fourth end; a current path
switching circuit that has a first current path extending between a
first write path terminal connected to said first end and the
ground, a second current path extending between a second write path
terminal connected to said third end and said ground, and a third
current path extending between a point of connection of said second
end and said fourth end and said ground; and an SR flip flop that
is connected to said first signal terminal at a first input
terminal and to said second signal terminal at a second input
terminal and outputs a first output signal from a first output
terminal and a second output signal, which is equivalent to said
first output signal inverted, from a second output terminal
according to the state of the first sense signal and the second
sense signal input thereto, wherein said current path switching
circuit blocks said third current path and limits one of the
current flowing through said first current path and the current
flowing through said second current path according to a data signal
in a normal operation mode, and blocks said first current path and
said second current path and makes said third current path
conductive in a read mode, in which data corresponding to the
relationship between the magnitudes of the resistances of said
first variable resistor element and said second variable resistor
element is read after said power supply is turned off and then
turned on again in said normal operation mode.
3. The semiconductor integrated circuit device according to claim
2, wherein said first current path includes a first MOS transistor
that limits a current under the control of said data signal, said
second current path includes a second MOS transistor that limits a
current under the control of said data signal, and said current
path switching circuit has a control circuit that turns off said
first MOS transistor and said second MOS transistor in said read
mode.
4. The semiconductor integrated circuit device according to claim
2, further comprising: a first current supply circuit and a second
current supply circuit that supply currents to said first variable
resistor element and said second variable resistor element,
respectively, so that a current of a predetermined value or greater
flows through said first variable resistor element and said second
variable resistor element in said normal operation mode.
5. The semiconductor integrated circuit device according to claim
3, further comprising: a first current supply circuit and a second
current supply circuit that supply currents to said first variable
resistor element and said second variable resistor element,
respectively, so that a current of a predetermined value or greater
flows through said first variable resistor element and said second
variable resistor element in said normal operation mode.
6. The semiconductor integrated circuit device according to claim
4, wherein said first current supply circuit and said second
current supply circuit supply said currents to said first variable
resistor element and said second variable resistor element
according to said data signal or a signal output from a logic
circuit forming said SR flip flop.
7. The semiconductor integrated circuit device according to claim
5, wherein said first current supply circuit and said second
current supply circuit supply said currents to said first variable
resistor element and said second variable resistor element
according to said data signal or a signal output from a logic
circuit forming said SR flip flop.
8. The semiconductor integrated circuit device according to claim
4, wherein said first current supply circuit supplies a current
based on a signal equivalent to said first output signal of said SR
flip flop to said first variable resistor element, and said second
current supply circuit supplies a current based on a signal
equivalent to said second output signal of said SR flip flop to
said second variable resistor element.
9. The semiconductor integrated circuit device according to claim
5, wherein said first current supply circuit supplies a current
based on a signal equivalent to said first output signal of said SR
flip flop to said first variable resistor element, and said second
current supply circuit supplies a current based on a signal
equivalent to said second output signal of said SR flip flop to
said second variable resistor element.
10. The semiconductor integrated circuit device according to claim
6, wherein said first current supply circuit supplies a current
based on a signal equivalent to said first output signal of said SR
flip flop to said first variable resistor element, and said second
current supply circuit supplies a current based on a signal
equivalent to said second output signal of said SR flip flop to
said second variable resistor element.
11. The semiconductor integrated circuit device according to claim
7, wherein said first current supply circuit supplies a current
based on a signal equivalent to said first output signal of said SR
flip flop to said first variable resistor element, and said second
current supply circuit supplies a current based on a signal
equivalent to said second output signal of said SR flip flop to
said second variable resistor element.
12. A semiconductor integrated circuit device, comprising: a first
variable resistor element that has a resistance that increases when
a current of a predetermined value or greater flows in a first
direction and decreases when a current of a predetermined value or
greater flows in a second direction, which is opposite to said
first direction; a second variable resistor element that has a
resistance that increases when a current of a predetermined value
or greater flows in said second direction and decreases when a
current of a predetermined value or greater flows in said first;
and a current path switching circuit that supplies said current to
said first variable resistor element and said second variable
resistor element from a power supply by switching between current
paths connected to said first variable resistor element and said
second variable resistor element according to whether a normal
operation mode or a read mode, wherein said power supply is turned
off and then turned on again in said normal operation mode, and in
this state, data corresponding to the relationship between the
magnitudes of the resistances of said first variable resistor
element and said second variable resistor element is read in said
read mode.
Description
CROSS-REFERENCE TO RELATED APPLICATION
[0001] This application is based upon and claims the benefit of
priority from the prior Japanese Patent Application No.
2006-286210, filed on Oct. 20, 2006, the entire contents of which
are incorporated herein by reference.
BACKGROUND OF THE INVENTION
[0002] 1. Field of the Invention
[0003] The present invention relates to a semiconductor integrated
circuit having an SR flip flop circuit.
[0004] 2. Background Art
[0005] With the recent popularization of portable terminals, the
demand for a smaller and less power-consuming semiconductor device
is growing. Therefore, the importance of non-volatile memories in
the portable terminals is also rising.
[0006] Non-volatile memories currently in practical use include
flash memories and ferroelectric memories. For example, portable
terminals, which are required to have a small size, have a
non-volatile memory mounted on a silicon device.
[0007] Flip flops, which are commonly used in silicon devices, lose
the value stored therein when the current supplied thereto is
interrupted. Thus, the flip flops require an additional circuit or
manipulation to restore the internal state when power is turned on.
This leads to a longer time for the flip flops to start
operation.
[0008] There has been proposed a non-volatile flip flop in which
one of a pair of non-volatile variable resistor elements is made to
have a higher resistance, and the other is made to have a lower
resistance in a storage operation, one of a pair of storage nodes
is set at a higher potential, and the other is set at a lower
potential according to the difference between the resistances of
the pair of non-volatile variable resistor elements in a recall
operation, and the pair of non-volatile variable resistor elements
are made of a phase change material that has a higher resistance in
an amorphous state and has a lower resistance in a crystal state
(see Japanese Patent No. 3768504, for example).
[0009] In the conventional flip flop, the resistance of the
non-volatile variable resistor elements varies with the phase
change caused by heating. Therefore, the voltage pulse width
applied for heating has to be finely controlled, for example.
SUMMARY OF THE INVENTION
[0010] According one aspect of the present invention, there is
provided: a semiconductor integrated circuit device, comprising
[0011] a first variable resistor element and a second variable
resistor element whose resistances are changed complementarily
depending on a current; and
[0012] a current path switching circuit that supplies said current
from a power supply by switching between current paths according to
whether a normal operation mode or a read mode is input
externally,
[0013] wherein said power supply is turned off and then turned on
again in said normal operation mode, and in this state, data
corresponding to the relationship between the magnitudes of the
resistances of said first variable resistor element and said second
variable resistor element is read in said read mode.
[0014] According another aspect of the present invention, there is
provided: a semiconductor integrated circuit device, comprising
[0015] a sense amplifier circuit that is connected to a power
supply, outputs currents from a first current supply terminal and a
second current supply terminal, and outputs a first sense signal
from a first signal terminal and a second sense signal, which is
equivalent to said first sense signal inverted, from a second
signal terminal according to a voltage drop due to output of the
currents;
[0016] a first variable resistor element that is connected to said
first current supply terminal of said sense amplifier circuit at a
first end, which is one end thereof, and has a resistance that
increases when a current of a predetermined value or greater flows
in a first direction between said first end and a second end, which
is the other end thereof, and decreases when a current of a
predetermined value or greater flows in a second direction, which
is opposite to said first direction, between said first end and
said second end;
[0017] a second variable resistor element that is connected to said
second current supply terminal of said sense amplifier circuit at a
third end, which is one end thereof, and to the second end of said
first variable resistor element at a fourth end, which is the other
end thereof, and has a resistance that increases when a current of
a predetermined value or greater flows in said second between said
third end and said fourth end and decreases when a current of a
predetermined value or greater flows in said first direction
between said third end and said fourth end;
[0018] a current path switching circuit that has a first current
path extending between a first write path terminal connected to
said first end and the ground, a second current path extending
between a second write path terminal connected to said third end
and said ground, and a third current path extending between a point
of connection of said second end and said fourth end and said
ground; and
[0019] an SR flip flop that is connected to said first signal
terminal at a first input terminal and to said second signal
terminal at a second input terminal and outputs a first output
signal from a first output terminal and a second output signal,
which is equivalent to said first output signal inverted, from a
second output terminal according to the state of the first sense
signal and the second sense signal input thereto,
[0020] wherein said current path switching circuit
[0021] blocks said third current path and limits one of the current
flowing through said first current path and the current flowing
through said second current path according to a data signal in a
normal operation mode, and
[0022] blocks said first current path and said second current path
and makes said third current path conductive in a read mode, in
which data corresponding to the relationship between the magnitudes
of the resistances of said first variable resistor element and said
second variable resistor element is read after said power supply is
turned off and then turned on again in said normal operation
mode.
[0023] According further aspect of the present invention, there is
provided: a semiconductor integrated circuit device, comprising
[0024] a first variable resistor element that has a resistance that
increases when a current of a predetermined value or greater flows
in a first direction and decreases when a current of a
predetermined value or greater flows in a second direction, which
is opposite to said first direction;
[0025] a second variable resistor element that has a resistance
that increases when a current of a predetermined value or greater
flows in said second direction and decreases when a current of a
predetermined value or greater flows in said first; and
[0026] a current path switching circuit that supplies said current
to said first variable resistor element and said second variable
resistor element from a power supply by switching between current
paths connected to said first variable resistor element and said
second variable resistor element according to whether a normal
operation mode or a read mode,
[0027] wherein said power supply is turned off and then turned on
again in said normal operation mode, and in this state, data
corresponding to the relationship between the magnitudes of the
resistances of said first variable resistor element and said second
variable resistor element is read in said read mode.
BRIEF DESCRIPTION OF THE DRAWINGS
[0028] FIG. 1 is a diagram showing a configuration of essential
parts of a semiconductor integrated circuit device 100 according to
a first embodiment of the present invention;
[0029] FIG. 2 is a diagram specifically showing the sense amplifier
circuit of the semiconductor integrated circuit device shown in
FIG. 1;
[0030] FIG. 3 is a diagram specifically showing an example of the
sense amplifier section and the current path switching circuit of
the semiconductor integrated circuit device shown in FIG. 2;
[0031] FIG. 4 is a diagram specifically showing the first and
second network sections of the semiconductor integrated circuit
device shown in FIG. 3;
[0032] FIG. 5 is a diagram specifically showing the SR flip flop of
the semiconductor integrated circuit device shown in FIG. 4;
[0033] FIG. 6 is a diagram for illustrating a case where the
semiconductor integrated circuit device 100 shown in FIG. 5 is in a
normal operation mode (a case where the input first mode switching
signal "NV_R" is "Low");
[0034] FIG. 7 is a diagram for illustrating an operation of the
semiconductor integrated circuit device 100 shown in FIG. 5 to read
data retained in the first variable resistor element and the second
variable resistor element into the SR flip flop;
[0035] FIG. 8 is a diagram showing a configuration of essential
parts of a semiconductor integrated circuit device 200 according to
a second embodiment of the present invention;
[0036] FIG. 9 is a diagram specifically showing the components of
the semiconductor integrated circuit device shown in FIG. 8
including the current path switching circuit;
[0037] FIG. 10 is a diagram specifically showing the first and
second current supply circuits of the semiconductor integrated
circuit device shown in FIG. 9;
[0038] FIG. 11 is a diagram showing a modification of the
semiconductor integrated circuit device shown in FIG. 10;
[0039] FIG. 12 is a diagram showing a configuration of essential
parts of a semiconductor integrated circuit device 300 according to
a third embodiment of the present invention;
[0040] FIG. 13 is a diagram specifically showing the components of
the semiconductor integrated circuit device shown in FIG. 12
including the current path switching circuit;
[0041] FIG. 14 is a diagram specifically showing the first and
second current supply circuits of the semiconductor integrated
circuit device shown in FIG. 13;
[0042] FIG. 15 is a diagram specifically showing another example of
the first and second current supply circuits of the semiconductor
integrated circuit device shown in FIG. 13;
[0043] FIG. 16 is a diagram showing a modification of the
semiconductor integrated circuit device shown in FIG. 15;
[0044] FIG. 17 is a diagram showing a configuration of essential
parts of a semiconductor integrated circuit device according to the
fourth Embodiment of the present invention;
[0045] FIG. 18 is a diagram specifically showing the components of
the semiconductor integrated circuit device shown in FIG. 17
including the current path switching circuit;
[0046] FIG. 19 is a diagram for illustrating a case where the
semiconductor integrated circuit device shown in FIG. 18 is in the
normal operation mode (where the input first mode switching signal
"NV_R" is "Low", and the second mode switching signal "NV_W" is
"Low");
[0047] FIG. 20 is a diagram for illustrating an operation of the
semiconductor integrated circuit device shown in FIG. 18 to write
data in the first variable resistor element and the second variable
resistor element; and
[0048] FIG. 21 is a diagram for illustrating an operation of the
semiconductor integrated circuit device shown in FIG. 18 to read
data retained in the first variable resistor element and the second
variable resistor element into the SR flip flop.
DETAILED DESCRIPTION
[0049] In the following, embodiments of the present invention will
be described with reference to the drawings.
First Embodiment
[0050] FIG. 1 is a diagram showing a configuration of essential
parts of a semiconductor integrated circuit device 100 according to
a first embodiment of the present invention, which is an aspect of
the present invention.
[0051] As shown in FIG. 1, the semiconductor integrated circuit
device 100 has a sense amplifier circuit 1, a first variable
resistor element 2, a second variable resistor element 3, a current
path switching circuit 4 and an SR flip flop 5.
[0052] The sense amplifier circuit 1 is connected to a power supply
"VDD" and receives a clock signal "CP" and a first mode switching
signal "NV_R". As described later, the first mode switching signal
"NV_R" is a signal for switching between a "normal operation mode"
in which the semiconductor integrated circuit device functions as a
D-type flip flop and a "read mode" in which data corresponding to
the relationship between the magnitudes of the resistances of the
first variable resistor element 2 and the second variable resistor
element 3 is read.
[0053] In addition, the sense amplifier circuit 1 outputs currents
from a first current supply terminal 1a and a second current supply
terminal 1b. According to a voltage drop due to output of the
currents, the sense amplifier circuit 1 outputs a first sense
signal from a first signal terminal 1c and outputs a second sense
signal, which is equivalent to the first sense signal inverted,
from a second signal terminal 1d in synchronization with the clock
signal "CP" or the first mode switching signal "NV_R".
[0054] The first variable resistor element 2 is connected to the
first current supply terminal 1a of the sense amplifier circuit 1
at a first end 2a, which is one end thereof.
[0055] The resistance of the first variable resistor element 2
increases if a current of a predetermined value or greater flows
between the first end 2a and a second end 2b, which is the other
end thereof, in a first direction (in the direction from the first
end 2a to the second end 2b, or in other words, in the rightward
direction, in this example). The resistance of the first variable
resistor element 2 decreases if a current of a predetermined value
or greater flows therethrough in a second direction opposite to the
first direction (in the direction from the second end 2b to the
first end 2a, or in other words, in the leftward direction, in this
example).
[0056] The second variable resistor element 3 is connected to the
second current supply terminal 1b of the sense amplifier circuit 1
at a third end 3a, which is one end thereof. The second variable
resistor element 3 is connected to the second end 2b of the first
variable resistor element 2 at a fourth end 3b, which is the other
end thereof.
[0057] The resistance of the second variable resistor element 3
increases if a current of a predetermined value or greater flows
between the third end 3a and the fourth end 3b in the second
direction (in the direction from the third end 3a to the fourth end
3b, or in other words, in the leftward direction, in this example).
The resistance of the second variable resistor element 3 decreases
if a current of a predetermined value or greater flows therethrough
in the first direction (in the direction from the fourth end 3b to
the third end 3a, or in other words, in the rightward direction, in
this example).
[0058] As the first variable resistor element 2 and the second
variable resistor element 3, a spin injection device may be
used.
[0059] (1) In U.S. Pat. No. 5,695,864, for example, there is
disclosed that if a current of a critical value or greater flows
through the spin injection device for a critical time or longer,
magnetization reversal occurs according to the direction of the
current. (2) In Appl. Phys. Lett. Vol. 77, pp. 3809 (2000), F. J.
Albert et al., for example, there is disclosed that if
magnetization reversal occurs, the resistance of the spin injection
device varies with the magnetization reversal.
[0060] From the facts (1) and (2), there is known a physical
phenomenon that, if a current of a predetermined value or greater
flows through the spin injection device, the resistance of the spin
injection device varies (increases and decreases) according to the
direction of the current.
[0061] The current path switching circuit 4 has a first current
path extending between a first write path terminal 4e connected to
the first end 2a and the ground (ground potential "VSS"), a second
current path extending between a second write path terminal 4f
connected to the third end 3a and the ground (ground potential
"VSS"), and a third current path extending between a point of
connection of the second end 2b and the fourth end 3b and the
ground (ground potential "VSS"). To the current path switching
circuit 4, a data signal "D", the clock signal "CP" and the first
mode switching signal "NV_R" are input.
[0062] The SR flip flop 5 is connected to the first signal terminal
1c at a first input terminal "SB" thereof and to the second signal
terminal 1d at a second input terminal "RB" thereof.
[0063] The SR flip flop 5 outputs a first output signal from a
first output terminal "QB" and outputs a second output signal,
which is equivalent to the first output signal inverted, from a
second output terminal "Q" according to the state of the first
sense signal and the second sense signal input thereto.
[0064] According to the present invention, the input/output logic
of the SR flip flop 5 can be inverted.
[0065] FIG. 2 is a diagram specifically showing the sense amplifier
circuit of the semiconductor integrated circuit device shown in
FIG. 1.
[0066] As shown in FIG. 2, the sense amplifier circuit 1 has a
first network section 6 that outputs a signal in response to the
clock signal "CP" or the first mode switching signal "NV_R", a
second network section 8 that outputs a signal in response to the
clock signal "CP" or the first mode switching signal "NV_R", and a
sense amplifier section 7 that outputs the first sense signal and
the second sense signal from the first signal terminal 1c and the
second signal terminal 1d according to a voltage drop due to output
of the currents from the first current supply terminal 1a and the
second current supply terminal 1b in synchronization with the
output signals of the first network section 6 and the second
network section 8.
[0067] FIG. 3 is a diagram specifically showing an example of the
sense amplifier section and the current path switching circuit of
the semiconductor integrated circuit device shown in FIG. 2.
[0068] As shown in FIG. 3, the sense amplifier section 7 has a
first p-type MOS transistor 7a connected to a power supply voltage
"VDD" at the source thereof, and a first n-type MOS transistor 7b
connected to the drain of the first p-type MOS transistor 7a at the
drain thereof, to the gate of the first p-type MOS transistor 7a at
the gate thereof and to the first end 2a of the first variable
resistor element 2 at the source thereof.
[0069] The sense amplifier section 7 further has a second p-type
MOS transistor 7c connected to the power supply voltage "VDD" at
the source thereof, to the drain of the first p-type MOS transistor
7a at the gate thereof and to the gate of the first p-type MOS
transistor 7a at the drain thereof, and a second n-type MOS
transistor 7d connected to the drain of the second p-type MOS
transistor 7c at the drain thereof, to the gate of the second
p-type MOS transistor 7c at the gate thereof and to the third end
3a of the second variable resistor element 3 at the source
thereof.
[0070] The drain of the first p-type MOS transistor 7a is connected
to the output of the first network 6 and the first input "SB" of
the SR flip flop 5.
[0071] The drain of the second p-type MOS transistor 7c is
connected to the output of the second network 8 and the second
input "RB" of the SR flip flop 5.
[0072] As shown in FIG. 3, the current path switching circuit 4 has
a third n-type MOS transistor 4a that is connected to the first end
2a of the first variable resistor element 2 at the drain thereof
and receives the data signal "D" at the gate thereof, and a fourth
n-type MOS transistor 4b that is connected to the third end 3a of
the second variable resistor element 3 at the drain thereof and to
the source of the third n-type MOS transistor 4a at the source
thereof and receives a data signal "DB", which is the data signal
"D" inverted", at the gate thereof.
[0073] The current path switching circuit 4 further has a fifth
n-type MOS transistor 4c that is connected to the sources of the
third n-type MOS transistor 4a and the fourth n-type MOS transistor
4b at the drain thereof and to the ground potential at the source
thereof and receives the clock signal "CP" at the gate thereof, and
a sixth n-type MOS transistor 4d that is connected to the second
end 2b of the first variable resistor element 2 and the fourth end
3b of the second variable resistor element 3 at the drain thereof
and to the ground potential at the source thereof and receives the
first mode switching signal "NV_R" at the gate thereof.
[0074] That is, the first current path of the current path
switching circuit 4 includes the third n-type MOS transistor 4a.
The second current path of the current path switching circuit 4
includes the fourth n-type MOS transistor 4b.
[0075] The first and second current paths are blocked by the fifth
n-type MOS transistor 4c according to the clock signal "CP". The
third current path is blocked by the sixth n-type MOS transistor 4d
according to the first mode switching signal "NV_R".
[0076] FIG. 4 is a diagram specifically showing the first and
second network sections of the semiconductor integrated circuit
device shown in FIG. 3.
[0077] As shown in FIG. 4, the first network section 6 has a third
p-type MOS transistor 6a that is connected to the power supply
voltage "VDD" at the source thereof and receives the first mode
switching signal "NV_R" at the gate thereof, and a fourth p-type
MOS transistor 6b that is connected to the drain of the third
p-type MOS transistor 6a at the source thereof and to the drain of
the first p-type MOS transistor 7a at the drain thereof, which
constitutes the output of the first network section 6, and receives
the clock signal "CP" at the gate thereof.
[0078] As shown in FIG. 4, the second network section 8 has a fifth
p-type MOS transistor 8a that is connected to the power supply
voltage "VDD" at the source thereof and receives the first mode
switching signal "NV_R" at the gate thereof, and a sixth p-type MOS
transistor 8b that is connected to the drain of the fifth p-type
MOS transistor 8a at the source thereof and to the drain of the
second p-type MOS transistor 7c at the drain thereof, which
constitutes the output of the second network section 8, and
receives the clock signal "CP" at the gate thereof.
[0079] FIG. 5 is a diagram specifically showing the SR flip flop of
the semiconductor integrated circuit device shown in FIG. 4.
[0080] As shown in FIG. 5, the SR flip flop 5 has a first NAND
circuit 5a connected to the drain of the first p-type MOS
transistor 7a at an input thereof that constitutes the first input
"SB", and a second NAND circuit 5b that is connected to the drain
of the second p-type MOS transistor 7c and the output of the first
NAND circuit 5a at different inputs thereof and connected to
another input of the first NAND circuit 5a at the output
thereof.
[0081] The SR flip flop 5 further has a first inverter 5c that is
connected to the output of the first NAND circuit 5a at the input
thereof and outputs the first output signal and a second inverter
5d that is connected to the output of the second NAND circuit 5b at
the input thereof and outputs the second output signal, which is
equivalent to the first output signal inverted.
[0082] One of the inputs of the first NAND circuit 5a constitutes
the first input "SB" of the SR flip flop 5.
[0083] One of the inputs of the second NAND circuit 5b constitutes
the second input "RB" of the SR flip flop 5.
[0084] Now, there will be described an operation in which power
supply to the semiconductor integrated circuit device 100
configured as described above is temporarily stopped when the
semiconductor integrated circuit device 100 is operating normally,
and then power supply is resumed to output retained data.
[0085] FIG. 6 is a diagram for illustrating a case where the
semiconductor integrated circuit device 100 shown in FIG. 5 is in a
normal operation mode (a case where the input first mode switching
signal "NV_R" is "Low"). In FIG. 6, nonconductive MOS transistors
are not shown (the same holds true for the following
description).
[0086] When the semiconductor integrated circuit device 100 shown
in FIG. 5 is in the normal operation mode, that is, when the first
mode switching signal "NV_R" is "Low", the semiconductor integrated
circuit device 100 has a circuit configuration shown in FIG. 6. As
shown in FIG. 6, since the first mode switching signal "NV_R" is
"Low", the sixth n-type MOS transistor 4d is turned off, and the
current path switching circuit 4 blocks the third current path.
Furthermore, the current path switching circuit 4 controls the
on/off state of the third n-type MOS transistor 4a and the fourth
n-type MOS transistor 4b according to the data signal "D" and the
data signal "DB" equivalent to the data signal "D" inverted,
thereby limiting one of the current flowing through the first
current path and the current flowing through the second current
path.
[0087] Thus, in the normal operation mode, the whole of the
semiconductor integrated circuit device 100 operates in the same
manner as a D-type flip flop (F/F).
[0088] In the normal operation mode, the direction of the current
flowing through the first variable resistor element 2 and the
second variable resistor element 3 differs according to whether the
data signal "D" is "High" or "Low".
[0089] As described above, for example, the first variable resistor
element 2 has a lower resistance when the current flows in the
leftward direction and has a higher resistance when the current
flows through the rightward.
[0090] On the other hand, the second variable resistor element 3
has a higher resistance when the current flows in the leftward
direction and has a lower resistance when the current flows through
the rightward.
[0091] With such a circuit configuration, for example, if the data
signal "D" is "High", and the clock signal "CP" changes from "low"
to "High", a current flows through the first variable resistor
element 2 and the second variable resistor element 3 in the
leftward direction. In this case, the first variable resistor
element 2 has a lower resistance, and the second variable resistor
element 3 has a higher resistance.
[0092] Then, in this state, power supply from the power supply
"VDD" to the semiconductor integrated circuit device 100 is
stopped. As a result, charges on all the nodes in the semiconductor
integrated circuit device 100 are discharged. Therefore, the
internal condition defined by those charges is not retained.
However, since a current of a predetermined value or greater does
not flow if power supply from the power supply "VDD" is stopped,
the relationship between the magnitudes of the resistances of the
first variable resistor element 2 and the second variable resistor
element 3 is maintained.
[0093] After power supply from the power supply "VDD" is stopped,
power supply from the power supply "VDD" to the semiconductor
integrated circuit device 100 is resumed to activate the
semiconductor integrated circuit device 100. At this time, the
clock signal "CP" is fixed at the "Low" state.
[0094] Now, there will be described an operation in the read mode
in which data retained in the first variable resistor element 2 and
the second variable resistor element 3 (data corresponding to the
relationship between the magnitudes of the resistances thereof) is
read into the SR flip flop 5 (an operation at the time when the
first mode switching signal "NV_R" is changed from "Low" to
"High").
[0095] The "read mode" described above refers to a mode in which
the power supply "VDD" is turned off and then turned on again in
the normal operation mode, and in this state, data corresponding to
the relationship between the magnitudes of the resistances of the
first variable resistor element 2 and the second variable resistor
element 3 is read into the SR flip flop 5. In the read mode, the
first mode switching signal "NV_R" is "High".
[0096] In this way, in the read mode, the current path switching
circuit 4 blocks the first and second current paths and makes the
third current path conductive.
[0097] FIG. 7 is a diagram for illustrating an operation of the
semiconductor integrated circuit device 100 shown in FIG. 5 to read
data retained in the first variable resistor element 2 and the
second variable resistor element 3 into the SR flip flop 5. In FIG.
7, as described above, the clock signal "CP" is fixed at the "Low"
state.
[0098] When power supply from the power supply "VDD" to the
semiconductor integrated circuit device 100 is resumed, the first
variable resistor element 2 has a lower resistance, and the second
variable resistor element 3 has a higher resistance. Therefore, if
the first mode switching signal "NV_R" changes from "Low" to
"High", the potential at a first node 7e decreases earlier than
that at a second node 7f. When the potential at the first node 7e
decreases to a potential that causes turn-on of the second p-type
MOS transistor 7c, the potential at the second node 7f is restored
to the power supply voltage. As a result, after a lapse of a
certain time, the potentials (potential values) at the first node
7e and the second node 7f are read into the SR flip flop 5.
[0099] In this case, since the potential at the first node 7e is
"Low", the second output terminal "Q" is in the "High" state, and
the first output terminal "QB" is in the "Low" state. The states of
the first output terminal "QB" and the second output terminal "Q"
are the same as those in the case where the data signal "D" is
"High". Thus, even after the power supply "VDD" is turned off, the
semiconductor integrated circuit device 100 retains the values at
the time when the data signal "D" is "High". In other words, the
semiconductor integrated circuit device 100 operates as a
non-volatile flip flop.
[0100] Then, the first mode switching signal "NV_R" is changed from
"High" to "Low", and the clock signal "CP" fixed at "Low" is
restored to a normal variable state. As a result, the semiconductor
integrated circuit device 100 returns to the normal operation mode
described above and operates as a D-type flip flop.
[0101] As described above, the semiconductor integrated circuit
device according to this embodiment can be readily made to operate
as a non-volatile flip flop.
Second Embodiment
[0102] In the first embodiment, there has been described a
configuration in which, in the normal operation mode, a current of
a predetermined value or greater flows through the first and second
variable resistor elements to change the resistances thereof.
[0103] In the second embodiment, there will be described a
configuration in which current supply circuits supply an additional
current to make a current of a predetermined value or greater flow
through a first variable resistor element and a second variable
resistor element with higher reliability.
[0104] FIG. 8 is a diagram showing a configuration of essential
parts of a semiconductor integrated circuit device 200 according to
the second embodiment of the present invention, which is an aspect
of the present invention. In FIG. 8, the same reference numerals as
those in FIG. 1 denote the same parts as those in the first
embodiment.
[0105] As shown in FIG. 8, the semiconductor integrated circuit
device 200 has a sense amplifier circuit 1, a first variable
resistor element 2, a second variable resistor element 3, a current
path switching circuit 9, and an SR flip flop 5. The parts other
than the current path switching circuit 9 are the same as those in
the first embodiment.
[0106] The current path switching circuit 9 has a first current
path extending between a first write path terminal 4e connected to
a first end 2a and the ground (ground potential "VSS"), a second
current path extending between a second write path terminal 4f
connected to a third end 3a and the ground (ground potential
"VSS"), and a third current path extending between a point of
connection of a second end 2b and a fourth end 3b and the ground
(ground potential "VSS").
[0107] To the current path switching circuit 9, a data signal "D",
a clock signal "CP", a first mode switching signal "NV_R" and a
second mode switching signal "NV_W" are input.
[0108] As described later, the second mode switching signal "NV_W"
is a signal to indicate whether to supply an additional current to
the first variable resistor element 2 and the second variable
resistor element 3 to flow a current of a predetermined value or
greater through the first variable resistor element 2 and the
second variable resistor element 3 (that is, to increase or
decrease the resistances thereof) in a "normal operation mode".
[0109] FIG. 9 is a diagram specifically showing the components of
the semiconductor integrated circuit device shown in FIG. 8
including the current path switching circuit. In FIG. 9, the same
reference numerals as those in FIG. 5 denote the same parts as
those in the first embodiment.
[0110] As shown in FIG. 9, the current path switching circuit 9
described above has a third n-type MOS transistor 4a that is
connected to the first end 2a of the first variable resistor
element 2 at the drain thereof and receives the data signal "D" at
the gate thereof, and a fourth n-type MOS transistor 4b that is
connected to the third end 3a of the second variable resistor
element 3 at the drain thereof and to the source of the third
n-type MOS transistor 4a at the source thereof and receives a data
signal "DB" at the gate thereof.
[0111] The current path switching circuit 9 further has a fifth
n-type MOS transistor 4c that is connected to the sources of the
third n-type MOS transistor 4a and the fourth n-type MOS transistor
4b at the drain thereof and to the ground potential at the source
thereof and receives the clock signal "CP" at the gate thereof, and
a sixth n-type MOS transistor 4d that is connected to the second
end 2b of the first variable resistor element 2 and the fourth end
3b of the second variable resistor element 3 at the drain thereof
and to the ground potential at the source thereof and receives the
first mode switching signal "NV_R" at the gate thereof.
[0112] That is, the first current path of the current path
switching circuit 9 includes the third n-type MOS transistor 4a.
The second current path of the current path switching circuit 9
includes the fourth n-type MOS transistor 4b.
[0113] The first and second current paths are blocked by the fifth
n-type MOS transistor 4c according to the clock signal "CP". The
third current path is blocked by the sixth n-type MOS transistor 4d
according to the first mode switching signal "NV_R".
[0114] The current path switching circuit 9 further has a first
current supply circuit 9a connected between a power supply "VDD"
and the first end 2a, and a second current supply circuit 9b
connected between the power supply "VDD" and the third end 3a.
[0115] FIG. 10 is a diagram specifically showing the first and
second current supply circuits of the semiconductor integrated
circuit device shown in FIG. 9. In FIG. 10, the same reference
numerals as those in FIG. 5 denote the same parts as those in the
first embodiment.
[0116] As shown in FIG. 10, the first current supply circuit 9a has
a seventh p-type MOS transistor 9c that is connected to the power
supply "VDD" at the source thereof and receives the data signal "D"
at the gate thereof, and an eighth p-type MOS transistor 9d that is
connected to the drain of the seventh p-type MOS transistor 9c at
the source thereof and to the first end 2a at the drain thereof and
receives a signal "NV_WB", which is equivalent to the second mode
switching signal "NV_W" inverted, at the gate thereof.
[0117] The second current supply circuit 9b has a ninth p-type MOS
transistor 9e that is connected to the power supply "VDD" at the
source thereof and receives the data signal "DB" at the gate
thereof, and a tenth p-type MOS transistor 9f that is connected to
the drain of the ninth p-type MOS transistor 9e at the source
thereof and to the third end 3a at the drain thereof and receives
the signal "NV_WB" at the gate thereof.
[0118] The signal "NV_WB" is generated by a circuit not shown based
on the second mode switching signal "NV_W", for example.
[0119] Now, there will be described an operation of the
semiconductor integrated circuit device 200 configured as described
above to retain data in the first variable resistor element 2 and
the second variable resistor element 3 with higher reliability in
the normal operation mode.
[0120] The operation of the semiconductor integrated circuit device
200 at the time when the signal "NV_WB" is "High" (the second mode
switching signal "NV_W" is "Low") in the normal operation mode is
the same as the operation of the semiconductor integrated circuit
device 100 according to the first embodiment shown in FIG. 5 in the
normal operation mode. In other words, the semiconductor integrated
circuit device operates as a D-type flip flop.
[0121] Thus, there will be described an operation in the case where
the signal "NV_WB" is "Low" (the second mode switching signal
"NV_W" is "High"). The clock signal "CP" is fixed at "Low", and the
first mode switching signal "NV_R" is fixed at "Low".
[0122] If the signal "NV_WB" is "Low", a current flows through the
spin-injection variable resistor elements according to the data
signals "D" and "DB". For example, if the data signal "D" is
"High", a current flows in the leftward direction. The amount and
duration of the current can be controlled by adjusting the size of
the eighth p-type MOS transistor 9d and the tenth p-type MOS
transistor 9f and the time in which the signal "NV_WB" is kept at
"Low". At this time, as in the first embodiment described above,
the first variable resistor element 2 has a lower resistance, and
the second variable resistor element 3 has a higher resistance.
[0123] Then, the power supply "VDD" is turned off and then turned
on again. After that, in the state where the signal "NV_WB" is
"High" (the second mode switching signal "NV_W" is "Low"), as in
the first embodiment, data based on the relationship between the
magnitudes of the resistances of the first variable resistor
element 2 and the second variable resistor element 3 is read into
the SR flip flop 5.
[0124] In this way, in the normal operation mode, the first current
supply circuit 9a and the second current supply circuit 9b supply a
current to the first variable resistor element 2 and the second
variable resistor element 3 so that a current of a predetermined
value or greater flows through the first variable resistor element
2 and the second variable resistor element 3 according to the
second mode switching signal "NV_W" and the data signal "D".
[0125] In this way, a current of a predetermined value or greater
can be flowed through the first variable resistor element 2 and the
second variable resistor element 3 with higher reliability.
Therefore, data recording in the first variable resistor element 2
and the second variable resistor element 3 based on the
relationship between the magnitudes of the resistances can be
achieved with higher reliability.
[0126] As described above, the first current path includes the
third n-type MOS transistor 4a that limits the current under
control of the data signal, and the second current path includes
the fourth n-type MOS transistor 4b that limits the current under
the control of the data signal. When these MOS transistors are in
the on state, the MOS transistors add a parasitic capacitance to
the first variable resistor element 2 and the second variable
resistor element 3. The parasitic capacitance can reduce the
accuracy of the operation in the read mode.
[0127] Now, there will be described a modification of the
semiconductor integrated circuit device 200 configured for reducing
the parasitic capacitance.
[0128] FIG. 11 is a diagram showing a modification of the
semiconductor integrated circuit device shown in FIG. 10. In FIG.
11, the same reference numerals as those in FIG. 10 denote the same
parts as those in FIG. 10.
[0129] As shown in FIG. 11, in a semiconductor integrated circuit
device 200a, the current path switching circuit 9 further has a
first control circuit 9g that turns off the third n-type MOS
transistor 4a in the read mode, and a second control circuit 9h
that turns off the fourth n-type MOS transistor 4b in the read
mode.
[0130] For example, the first control circuit 9g is constituted by
a first NOR circuit 9i that receives the data signal "DB" and the
first mode switching signal "NV_R", performs an arithmetic
operation thereon and outputs the result of the arithmetic
operation to the gate of the third n-type MOS transistor 4a.
[0131] For example, the second control circuit 9h is constituted by
a second NOR circuit 9j that receives the data signal "D" and the
first mode switching signal "NV_R", performs an arithmetic
operation thereon and outputs the result of the arithmetic
operation to the gate of the fourth n-type MOS transistor 4b.
[0132] For example, in the read mode (when the first mode switching
signal "NV_R" is "High"), the output signals of the first NOR
circuit 9i and the second NOR circuit 9j are "Low". As a result,
the gates are set at the "Low" level, and the third n-type MOS
transistor 4a and the fourth n-type MOS transistor 4b are turned
off. Thus, the parasitic capacitance produced by the third n-type
MOS transistor 4a and the fourth n-type MOS transistor 4b
decreases, and therefore, the parasitic capacitances of the first
variable resistor element 2 and the second variable resistor
element 3 are balanced. Thus, the difference between the effects of
the parasitic capacitances of the first variable resistor element 2
and the second variable resistor element 3 on the currents flowing
therethrough decreases.
[0133] Therefore, the retained data can be read by the SR flip flop
5 with higher reliability.
[0134] As described above, the semiconductor integrated circuit
device according to this embodiment can be readily made to operate
as a non-volatile flip flop with higher reliability.
Third Embodiment
[0135] In the second embodiment, there has been described a
configuration in which the current supply circuits supply an
additional current to make a current of a predetermined value or
greater flow through the first and second variable resistor
elements with higher reliability.
[0136] In a third embodiment, there will be described another
configuration in which current supply circuits supply an additional
current to make a current of a predetermined value or greater flow
through a first variable resistor element and a second variable
resistor element with higher reliability.
[0137] FIG. 12 is a diagram showing a configuration of essential
parts of a semiconductor integrated circuit device 300 according to
the third embodiment of the present invention, which is an aspect
of the present invention. In FIG. 12, the same reference numerals
as those in FIG. 8 denote the same parts as those in the second
embodiment.
[0138] As shown in FIG. 12, the semiconductor integrated circuit
device 300 has a sense amplifier circuit 1, a first variable
resistor element 2, a second variable resistor element 3, a current
path switching circuit 10, and an SR flip flop 5. The parts other
than the current path switching circuit 9 are the same as those in
the first embodiment.
[0139] The current path switching circuit 10 has a first current
path extending between a first write path terminal 4e and the
ground (ground potential "VSS"), a second current path extending
between a second write path terminal 4f and the ground (ground
potential "VSS"), and a third current path extending between a
point of connection of a second end 2b and a fourth end 3b and the
ground (ground potential "VSS").
[0140] To the current path switching circuit 10, a data signal "D",
a clock signal "CP", a first mode switching signal "NV_R", a second
mode switching signal "NV_W", and a signal equivalent to a signal
output from an output terminal "Q" of the SR flip flop are input.
Signals equivalent to the signal output from the output terminal
"Q" of the SR flip flop include a signal output from a logic
circuit constituting the SR flip flop.
[0141] FIG. 13 is a diagram specifically showing the components of
the semiconductor integrated circuit device shown in FIG. 12
including the current path switching circuit. In FIG. 13, the same
reference numerals as those in FIG. 9 denote the same parts as
those in the second embodiment.
[0142] As shown in FIG. 13, the current path switching circuit 10
described above has a third n-type MOS transistor 4a that is
connected to a first end 2a of the first variable resistor element
2 at the drain thereof and receives the data signal "D" at the gate
thereof, and a fourth n-type MOS transistor 4b that is connected to
a third end 3a of the second variable resistor element 3 at the
drain thereof and to the source of the third n-type MOS transistor
4a at the source thereof and receives a data signal "DB", which is
the data signal "D" inverted, at the gate thereof.
[0143] The current path switching circuit 10 further has a fifth
n-type MOS transistor 4c that is connected to the sources of the
third n-type MOS transistor 4a and the fourth n-type MOS transistor
4b at the drain thereof and to the ground potential at the source
thereof and receives the clock signal "CP" at the gate thereof, and
a sixth n-type MOS transistor 4d that is connected to the second
end 2b of the first variable resistor element 2 and the fourth end
3b of the second variable resistor element 3 at the drain thereof
and to the ground potential at the source thereof and receives the
first mode switching signal "NV_R" at the gate thereof.
[0144] That is, the first current path of the current path
switching circuit 10 includes the third n-type MOS transistor 4a.
The second current path of the current path switching circuit 10
includes the fourth n-type MOS transistor 4b.
[0145] The first and second current paths are blocked by the fifth
n-type MOS transistor 4c according to the clock signal "CP". The
third current path is blocked by the sixth n-type MOS transistor 4d
according to the first mode switching signal "NV_R".
[0146] The current path switching circuit 10 further has a first
current supply circuit 10a connected between a power supply "VDD"
and the first end 2a, and a second current supply circuit 10b
connected between the power supply "VDD" and the third end 3a.
[0147] FIG. 14 is a diagram specifically showing the first and
second current supply circuits of the semiconductor integrated
circuit device shown in FIG. 13.
[0148] As shown in FIG. 14, the first current supply circuit 10a
has a seventh p-type MOS transistor 10c that is connected to the
power supply "VDD" at the source thereof and receives a signal
(referred to as a signal "QI" herein) equivalent to a signal "QI"
output from a first NAND circuit 5a, which is a logic circuit
forming the SR flip flop 5, at the gate thereof, and an eighth
p-type MOS transistor 10d that is connected to the drain of the
seventh p-type MOS transistor 10c at the source thereof and to the
first end 2a at the drain thereof and receives a signal "NV_WB" at
the gate thereof. Signals equivalent to the signal "QI" include a
signal output from the second output terminal "Q" (the same holds
true for the following description).
[0149] The second current supply circuit 10b has a ninth p-type MOS
transistor 10e that is connected to the power supply "VDD" at the
source thereof and receives a signal (referred to as a signal "QIB"
herein) equivalent to a signal "QIB", which is the signal "QI"
inverted, at the gate thereof, and a tenth p-type MOS transistor
10f that is connected to the drain of the ninth p-type MOS
transistor 10e at the source thereof and to the third end 3a at the
drain thereof and receives the signal "NV_WB" at the gate thereof.
Signals equivalent to the signal "QIB" include a signal output from
a first output terminal "QB" (the same holds true for the following
description).
[0150] Now, there will be described an operation of the
semiconductor integrated circuit device 300 configured as described
above to retain data in the first variable resistor element 2 and
the second variable resistor element 3 with higher reliability in
the normal operation mode.
[0151] The operation of the semiconductor integrated circuit device
300 at the time when the signal "NV_WB" is "High" (the second mode
switching signal "NV_W" is "Low") in the normal operation mode is
the same as the operation of the semiconductor integrated circuit
device 100 according to the first embodiment shown in FIG. 5 in the
normal operation mode. In other words, the semiconductor integrated
circuit device operates as a D-type flip flop.
[0152] Thus, there will be described an operation in the case where
the signal "NV_WB" is "Low" (the second mode switching signal
"NV_W" is "High"). In this example, the clock signal "CP" is fixed
at "High", and the first mode switching signal "NV_R" is fixed at
"Low".
[0153] If the signal "NV_WB" is "Low", a current flows through the
spin-injection variable resistor elements according to the signals
"QI" and "QIB". For example, if the signal "QI" is "High", a
current flows in the leftward direction. The amount and duration of
the current can be controlled by adjusting the size of the eighth
p-type MOS transistor 10d and the tenth p-type MOS transistor 10f
and the time in which the signal "NV_WB" is kept at "Low". At this
time, as in the first embodiment described above, the first
variable resistor element 2 has a lower resistance, and the second
variable resistor element 3 has a higher resistance.
[0154] Then, the power supply "VDD" is turned off and then turned
on again. After that, in the state where the signal "NV_WB" is
"High" (the second mode switching signal "NV_W" is "Low"), as in
the first embodiment, data based on the relationship between the
magnitudes of the resistances of the first variable resistor
element 2 and the second variable resistor element 3 is read into
the SR flip flop 5.
[0155] In this way, in the normal operation mode, the first current
supply circuit 10a and the second current supply circuit 10b supply
a current to the first variable resistor element 2 and the second
variable resistor element 3 so that a current of a predetermined
value or greater flows through the first variable resistor element
2 and the second variable resistor element 3 according to the
second mode switching signal "NV_W" and the signals "QI" and "QIB"
equivalent to the output signals of logic circuits forming the SR
flip flop 5.
[0156] In this way, a current of a predetermined value or greater
can be flowed through the first variable resistor element 2 and the
second variable resistor element 3 with higher reliability.
Therefore, data recording in the first variable resistor element 2
and the second variable resistor element 3 based on the
relationship between the magnitudes of the resistances can be
achieved with higher reliability.
[0157] FIG. 15 is a diagram specifically showing another example of
the first and second current supply circuits of the semiconductor
integrated circuit device shown in FIG. 13.
[0158] As shown in FIG. 15, a first current supply circuit 10a has
an eighth p-type MOS transistor 10d that receives a current based
on a signal "QIB" at the source thereof, is connected to a first
end 2a at the drain thereof and receives a signal "NV_WB" at the
gate thereof.
[0159] A second current supply circuit 10b has a tenth p-type MOS
transistor 10f that is connected to the power supply "VDD" and
receives a current based on a signal "QI" at the source thereof, is
connected to the third end 3a at the drain thereof and receives the
signal "NV_WB" at the gate thereof.
[0160] A semiconductor integrated circuit device 300a operates in
the same manner as the semiconductor integrated circuit device 300
shown in FIG. 14, because the eighth p-type MOS transistor 10d and
the tenth p-type MOS transistor 10f are controlled by the signal
"NV_WB".
[0161] In the semiconductor integrated circuit device 300a, the
currents based on the signals "QI" and "QIB" flow through the first
variable resistor element 2 and the second variable resistor
element 3.
[0162] For the semiconductor integrated circuit device 300a, for
example, the number of transistors can be reduced, while the load
capacitance of the signals "QI" and "QIB" output from the first
NAND circuit 5a and the second NAND circuit 5b increases.
[0163] Now, as in the second embodiment, there will be described a
modification of the semiconductor integrated circuit device 300
configured for reducing the parasitic capacitance of produced by
the third n-type MOS transistor 4a and the fourth n-type MOS
transistor 4b.
[0164] FIG. 16 is a diagram showing a modification of the
semiconductor integrated circuit device shown in FIG. 15.
[0165] As shown in FIG. 16, in a semiconductor integrated circuit
device 300b, the current path switching circuit 10 further has a
first control circuit 10g that turns off the third n-type MOS
transistor 4a in the read mode, and a second control circuit 10h
that turns off the fourth n-type MOS transistor 4b in the read
mode.
[0166] For example, the first control circuit 10g is constituted by
a first NOR circuit 10i that receives the data signal "DB" and the
first mode switching signal "NV_R", performs an arithmetic
operation thereon and outputs the result of the arithmetic
operation to the gate of the third n-type MOS transistor 4a.
[0167] For example, the second control circuit 10h is constituted
by a second NOR circuit 10j that receives the data signal "D" and
the first mode switching signal "NV_R", performs an arithmetic
operation thereon and outputs the result of the arithmetic
operation to the gate of the fourth n-type MOS transistor 4b.
[0168] For example, in the read mode (when the first mode switching
signal "NV_R" is "High"), the output signals of the first NOR
circuit 10i and the second NOR circuit 10j are "Low". As a result,
the gates are set at the "Low" level, and the third n-type MOS
transistor 4a and the fourth n-type MOS transistor 4b are turned
off. Thus, the capacitance produced by the third n-type MOS
transistor 4a and the fourth n-type MOS transistor 4b is
eliminated, and therefore, the parasitic capacitances of the first
variable resistor element 2 and the second variable resistor
element 3 become equal. Thus, the difference between the effects of
the parasitic capacitances of the first variable resistor element 2
and the second variable resistor element 3 on the currents flowing
therethrough decreases.
[0169] Therefore, the retained data can be read by the SR flip flop
5 with higher reliability.
[0170] Furthermore, the first current supply circuit 10a has an
eighth p-type MOS transistor 10d that receives a current based on
the signal "QIB" at the source thereof, is connected to the first
end 2a at the drain thereof and receives the signal "NV_WB" at the
gate thereof, and a ninth n-type MOS transistor 10k that receives a
current based on the signal "QIB" at the drain thereof, is
connected to the first end 2a at the source thereof and receives
the second mode switching signal "NV_WB" at the gate thereof.
[0171] Furthermore, the second current supply circuit 10b has a
tenth p-type MOS transistor 10f that is connected to the power
supply "VDD" and receives a current based on the signal "QI" at the
source thereof, is connected to the third end 3a at the drain
thereof and receives the signal "NV_WB" at the gate thereof, and a
tenth n-type MOS transistor 10l that receives a current based on
the signal "QI" at the drain thereof, is connected to the third end
3a at the source thereof and receives the second mode switching
signal "NV_W" at the gate thereof.
[0172] In this way, the first current supply circuit 10a and the
second current supply circuit 10b use two MOS transistors to supply
currents based on the signals "QI" and "QIB" to the first variable
resistor element 2 and the second variable resistor element 3.
Thus, the currents based on the signals "QI" and "QIB" can be
supplied to the first variable resistor element 2 and the second
variable resistor element 3 with higher reliability that in the
case shown in FIG. 15.
[0173] Furthermore, even if the values of the data signals "D" and
"DB" vary during operation, a predetermined current can be supplied
to the first variable resistor element 2 and the second variable
resistor element 3 as far as the values of the signals "QI" and
"QIB" are equal to or greater than a predetermined value.
[0174] As described above, the semiconductor integrated circuit
device according to this embodiment can be readily made to operate
as a non-volatile flip flop with higher reliability.
Fourth Embodiment
[0175] In the embodiments 2 and 3, there has been described
configurations in which current supply circuits supply an
additional current to make a current of a predetermined value or
greater flow through the first and second variable resistor
elements with higher reliability.
[0176] In a fourth Embodiment, there will be described a
configuration in which a current path switching circuit ensures
that a current of a predetermined value flows through first and
second variable resistor elements with higher reliability even if a
data input signal varies during writing.
[0177] FIG. 17 is a diagram showing a configuration of essential
parts of a semiconductor integrated circuit device according to the
fourth Embodiment of the present invention, which is an aspect of
the present invention. In FIG. 17, the same reference numerals as
those in FIG. 12 denote the same parts as those in the third
embodiment.
[0178] As shown in FIG. 17, a semiconductor integrated circuit
device 400 has a sense amplifier circuit 1, a first variable
resistor element 2, a second variable resistor element 3, a current
path switching circuit 11, and an SR flip flop 5. The parts other
than the current path switching circuit 11 are the same as those in
the first embodiment.
[0179] The current path switching circuit 11 has a first current
path extending between a first write path terminal 4e and the
ground (ground potential "VSS"), a second current path extending
between a second write path terminal 4f and the ground (ground
potential "VSS"), and a third current path extending between a
point of connection of a second end 2b and a fourth end 3b and the
ground (ground potential "VSS"). To the current path switching
circuit 11, a data signal "D", a clock signal "CP", a first mode
switching signal "NV_R", a second mode switching signal "NV_W", and
a signal equivalent to a signal output from an output terminal "Q"
of the SR flip flop are input.
[0180] FIG. 18 is a diagram specifically showing the components of
the semiconductor integrated circuit device shown in FIG. 17
including the current path switching circuit. In FIG. 18, the same
reference numerals as those in FIG. 5 denote the same parts as
those in the first embodiment.
[0181] As shown in FIG. 18, in addition to the same components as
those of the current path switching circuit 4 shown in FIG. 5, the
current path switching circuit 11 described above has an eleventh
n-type MOS transistor 11a that is connected to a first current
supply terminal 1a at the drain thereof and to a first end 2a at
the source thereof and receives the first mode switching signal
"NV_R" at the gate thereof, and a twelfth n-type MOS transistor 11b
that is connected to a second current supply terminal 1b at the
drain thereof and to a third end 3a at the source thereof and
receives the first mode switching signal "NV_R" at the gate
thereof.
[0182] In addition to the same components as those of the current
path switching circuit 4 shown in FIG. 5, the current path
switching circuit 11 described above further has a first clocked
inverter 11c that receives a signal "QI", is connected to the first
end 2a at the output thereof, and is controlled by the first mode
switching signal "NV_R", a second clocked inverter 11d that
receives a signal "QIB", is connected to the first end 2a at the
output thereof and is controlled by the first mode switching signal
"NV_R", and a thirteenth n-type MOS transistor 11e that is
connected to the second current supply terminal 1b at the source
thereof and receives the first mode switching signal "NV_R" at the
gate thereof.
[0183] Now, there will be described an operation of the
semiconductor integrated circuit device 400 configured as described
above to retain data in the first variable resistor element 2 and
the second variable resistor element 3 with higher reliability in
the normal operation mode.
[0184] FIG. 19 is a diagram for illustrating a case where the
semiconductor integrated circuit device shown in FIG. 18 is in the
normal operation mode (where the input first mode switching signal
"NV_R" is "Low", and the second mode switching signal "NV_W" is
"Low").
[0185] As shown in FIG. 19, the operation of the semiconductor
integrated circuit device 400 at the time when the input first mode
switching signal "NV_R" is "Low", and the second mode switching
signal "NV_W" is "Low" in the normal operation mode is the same as
the operation of the semiconductor integrated circuit device 100
according to the first embodiment shown in FIG. 5 in the normal
operation mode. In other words, the semiconductor integrated
circuit device operates as a D-type flip flop.
[0186] Now, there will be described an operation of the
semiconductor integrated circuit device 400 to write data in the
first variable resistor element 2 and the second variable resistor
element 3 in the normal operation mode.
[0187] FIG. 20 is a diagram for illustrating an operation of the
semiconductor integrated circuit device shown in FIG. 18 to write
data in the first variable resistor element 2 and the second
variable resistor element 3. In FIG. 20, the first mode switching
signal "NV_R" is "Low", and the second mode switching signal "NV_W"
is "High".
[0188] In this state, a current of a predetermined value or greater
is made to flow through the variable resistor elements in the
leftward or rightward direction according to the values of the
currents based on the signals "QI" and "QIB", thereby increasing or
decreasing the resistances of the first variable resistor element 2
and the second variable resistor element 3.
[0189] Then, the power supply "VDD" is turned off and then turned
on again. After that, the semiconductor integrated circuit device
400 reads data retained in the first variable resistor element 2
and the second variable resistor element 3 into the SER flip
flop.
[0190] FIG. 21 is a diagram for illustrating an operation of the
semiconductor integrated circuit device shown in FIG. 18 to read
data retained in the first variable resistor element 2 and the
second variable resistor element 3 into the SR flip flop. In FIG.
21, the second mode switching signal "NV_W" is fixed at "Low", and
the clock signal "CP" is fixed at "Low".
[0191] If the first mode switching signal "NV_R" changes from "Low"
to "High", as in the first embodiment, the semiconductor integrated
circuit device 400 reads data based on the relationship between the
magnitudes of the resistances of the first variable resistor
element 2 and the second variable resistor element 3 into the SR
flip flop 5.
[0192] In this way, in the normal operation mode, the current path
switching circuit 11 supplies a current to the first variable
resistor element 2 and the second variable resistor element 3 so
that a current of a predetermined value or greater flows through
the first variable resistor element 2 and the second variable
resistor element 3 according to the first mode switching signal
"NV_R", the second mode switching signal "NV_W" and the signals
"QI" and "QIB".
[0193] In this way, a current of a predetermined value or greater
can be flowed through the first variable resistor element 2 and the
second variable resistor element 3 with higher reliability.
Therefore, data recording in the first variable resistor element 2
and the second variable resistor element 3 based on the
relationship between the magnitudes of the resistances can be
achieved with higher reliability.
[0194] Then, the first mode switching signal "NV_R" is changed from
"High" to "Low", thereby restoring the clock signal "CP" fixed in
the "Low" state to the normal variable state. As a result, the
semiconductor integrated circuit device 400 returns to the normal
operation mode described above and operates as a D-type flip flop
as in the first embodiment.
[0195] As described above, the semiconductor integrated circuit
device according to this embodiment can be readily made to operate
as a non-volatile flip flop with higher reliability.
[0196] In the embodiments described above, the resistance of the
first variable resistor element increases when a current of a
predetermined value or greater flows therethrough from the first
end to the opposite second end and decreases when a current of a
predetermined value or greater flows therethrough from the second
end to the first end. Furthermore, the resistance of the second
variable resistor element increases when a current of a
predetermined value or greater flows therethrough from the third
end to the fourth end and decreases when a current of a
predetermined value or greater flows therethrough from the fourth
end to the third end.
[0197] However, even if the relationship between the direction of
the current flowing through the first and second variable resistor
elements and the variation of the resistances thereof is reversed,
the same advantages as those of the embodiments described above can
be achieved by inserting an inverter or appropriately reversing the
logical configuration of each circuit component.
[0198] Furthermore, even if the logic of the first mode switching
signal "NV_R", the second mode switching signal "NV_W", the clock
signal "CP" and the data signal "D" is reversed, the same
advantages as those of the embodiments described above can be
achieved by inserting an inverter or appropriately reversing the
logical configuration of each circuit component.
* * * * *