U.S. patent application number 12/054257 was filed with the patent office on 2008-10-02 for dielectric ceramics and multi-layer ceramic capacitor.
This patent application is currently assigned to Taiyo Yuden Co., Ltd.. Invention is credited to Jun Nishikawa.
Application Number | 20080242532 12/054257 |
Document ID | / |
Family ID | 39795452 |
Filed Date | 2008-10-02 |
United States Patent
Application |
20080242532 |
Kind Code |
A1 |
Nishikawa; Jun |
October 2, 2008 |
DIELECTRIC CERAMICS AND MULTI-LAYER CERAMIC CAPACITOR
Abstract
A multi-layer ceramic capacitor having temperature
characteristics capable of satisfying X8R characteristics and
having a high specific resistance in a high temperature environment
and dielectric ceramics used in the capacitor, the dielectric
ceramics containing, as a main ingredient, a compound represented
by: (Bi.sub.0.5Na.sub.0.5).sub.xBa.sub.1-xTiO.sub.3 in which x is
from 0.05 to 0.2 and containing, from 0.25 mol to 1.50 mol of at
least one rare earth metal selected from Sm, Eu, Gd, Tb, Dy, Ho,
Er, Tm, Yb, and Y based on 100 mol of the main ingredient, from
0.20 mol to 1.5 mol of Mg based on 100 mol of the main ingredient,
and from 0.03 mol to 0.60 mol of at least one metal selected from
V, Cr, and Mn based on 100 mol of the main ingredient.
Inventors: |
Nishikawa; Jun; (Gunma,
JP) |
Correspondence
Address: |
KNOBBE MARTENS OLSON & BEAR LLP
2040 MAIN STREET, FOURTEENTH FLOOR
IRVINE
CA
92614
US
|
Assignee: |
Taiyo Yuden Co., Ltd.
Tokyo
JP
|
Family ID: |
39795452 |
Appl. No.: |
12/054257 |
Filed: |
March 24, 2008 |
Current U.S.
Class: |
501/138 |
Current CPC
Class: |
C04B 2235/3225 20130101;
C04B 2235/3241 20130101; C04B 35/4682 20130101; H01G 4/1227
20130101; H01G 4/30 20130101; C04B 2235/3262 20130101; C04B
2235/3298 20130101; C04B 2235/365 20130101; C04B 2235/3239
20130101; H01B 3/12 20130101; C04B 2235/3418 20130101; C04B
2235/3206 20130101; C04B 2235/36 20130101; C04B 2235/3224 20130101;
C04B 2235/3201 20130101 |
Class at
Publication: |
501/138 |
International
Class: |
C04B 35/462 20060101
C04B035/462 |
Foreign Application Data
Date |
Code |
Application Number |
Mar 26, 2007 |
JP |
2007-79050 |
Claims
1. A dielectric ceramics comprising: a compound having a perovskite
structure represented by:
(Bi.sub.0.5Na.sub.0.5).sub.xBa.sub.1-xTiO.sub.3 in which x is from
0.05 to 0.2 as a first ingredient; from 0.25 mol to 1.50 mol of at
least one rare earth metal selected from Sm, Eu, Gd, Tb, Dy, Ho,
Er, Tm, Yb, and Y, being converted as an oxide of one atom in one
molecule based on 100 mol of the first ingredient; from 0.20 mol to
1.5 mol of Mg being converted as an oxide of one atom in one
molecule, based on 100 mol of the first ingredient; from 0.03 mol
to 0.60 mol of at least one metal selected from V, Cr, and Mn being
converted as an oxide of one atom in one molecule, based on 100 mol
of the first ingredient; and SiO.sub.2 or a glass ingredient mainly
comprising SiO.sub.2.
2. A multi-layer ceramic capacitor having multi-layer ceramics of a
substantially hexahedral shape, internal electrodes formed in the
multi-layer ceramics such that they are opposed in the multi-layer
ceramics by way of the dielectric ceramics and led to different end
faces alternately, and external electrodes formed on both end faces
of the multi-layer ceramics and electrically connected with the
internal electrodes led to the end faces respectively, in which a
dielectric ceramics comprising: a compound having a perovskite
structure represented by:
(Bi.sub.0.5Na.sub.0.5).sub.xBa.sub.1-xTiO.sub.3 in which x is from
0.05 to 0.2 as a first ingredient; from 0.25 mol to 1.5 mol of at
least one rare earth metal selected from Sm, Eu, Gd, Tb, Dy, Ho,
Er, Tm, Yb, and Y, being converted as an oxide of one atom in one
molecule, from 0.2 mol to 1.5 mol of Mg being converted as an oxide
of one atom in one molecule, based on 100 mol of the first
ingredient; from 0.03 mol to 0.60 mol of at least one metal
selected from V, Cr, and Mn being converted as an oxide of an atom
in one molecule, based on 100 mol of the first ingredient;
SiO.sub.2 or a glass ingredient mainly comprising SiO.sub.2; and
the internal electrode is formed of Ni or an Ni alloy.
3. A ceramic composition comprising:
(Bi.sub.0.5Na.sub.0.5).sub.xBa.sub.1-xTiO.sub.3, and, for every 100
mol of (Bi.sub.0.5Na.sub.0.5).sub.xBa.sub.1-xTiO.sub.3: 0.25 to 1.5
mol of at least one rare earth metal selected from Sm, Eu, Gd, Tb,
Dy, Ho, Er, Tm, Yb, and Y; 0.03 to 0.60 mol of at least one metal
selected from V, Cr, and Mn; and 0.2 to 1.5 mol of Mg.
4. The composition of claim 3, wherein the composition further
comprises a sintering aid.
Description
BACKGROUND OF THE INVENTION
[0001] 1. Field of the Invention
[0002] The present invention concerns dielectric ceramics and a
multi-layer ceramic capacitor using them and the invention can
provide a multi-layer ceramic capacitor having internal electrodes
formed of Ni or Ni alloy and with less temperature change of
electrostatic capacity in a temperature range from 150.degree. C.
to 200.degree. C.
[0003] 2. Description of the Related Art
[0004] For multi-layer ceramic capacitors used for electronic
equipments such as portable equipments and telecommunications
equipments, a demand for decreasing the size and increasing the
capacitance has been increased more and more. As a small-sized
large capacitance multi-layer ceramic capacitor, a multi-layer
ceramic capacitor in which an internal electrodes are formed of Ni
has been known as disclosed, for example, in JP-A-2001-39765. Such
a multi-layer ceramic capacitor can satisfy X7R characteristics
(permittivity stays within .+-.15% in a temperature range from
-55.degree. C. to +125.degree. C., with 25.degree. C. as a
reference).
[0005] However, for the multi-layer ceramic capacitor, reliability
under severer circumstances has been required in recent years
depending on the application use. For example, multi-layer ceramic
capacitors have become used in car-mounted electronic equipments
such as electronic engine control units mounted in car engine
rooms, antilock brake systems, etc. Since stable operation is
demanded for such the car-mounted electronic equipment, in a low
temperature environment at -20.degree. C. or lower or a high
temperature environment at +130.degree. C. or higher, multi-layer
ceramic capacitors used therein have also been demanded to provide
a satisfactory temperature stability even under such severe
circumstances.
[0006] For satisfying such a demand, dielectric ceramic
compositions and multi-layer ceramic capacitors capable of
satisfying X8R characteristics (permittivity or electrostatic
capacity stays within .+-.15% in a temperature range from
-55.degree. C. to +150.degree. C., with 25.degree. C. as a
reference) have been proposed, for example, as disclosed in
JP-A-2005-272263.
[0007] The multi-layer ceramic capacitors disclosed in the JP-A
Nos. 2001-39765 and 2005-272263 have dielectric ceramic
compositions mainly comprising barium titanate. Barium titanate has
a curie point at 125.degree. C. and the permittivity lowers
abruptly as the temperature exceeds 125.degree. C. Accordingly,
while it is possible to confine permittivity or electrostatic
capacity within .+-.15% in a temperature range from -55.degree. C.
to +125.degree. C., it has been extremely difficult to confine the
rate of permittivity or rate of change of electrostatic capacity
within .+-.15% also including a temperature range that exceeds
125.degree. C. In a case of further decreasing the thickness of
dielectric ceramics between the internal electrodes for further
decreasing the size and increasing the capacity, there has been a
problem that no sufficient insulation resistance can be obtained.
Particularly, there have been problems that no sufficient
insulation resistance can be obtained under a high temperature
environment exceeding 125.degree. C.
SUMMARY OF THE INVENTION
[0008] The present invention provides a multi-layer ceramic
capacitor having temperature characteristics capable of satisfying
X8R characteristics and having an insulation resistance in a high
temperature environment of 100 M.OMEGA.m or higher being converted
as a specific resistance of dielectric ceramics between internal
electrodes. The invention also provides dielectric ceramics for use
in the multi-layer ceramic capacitor described above.
[0009] In one embodiment,
[0010] dielectric ceramics comprise, as a main ingredient, a
compound having a perovskite structure represented by:
(Bi.sub.0.5Na.sub.0.5).sub.xBa.sub.1-xTiO.sub.3
in which x is from 0.05 to 0.2, and containing,
[0011] from 0.25 mol to 1.5 mol of at least one rare earth metal
selected from Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, and Y, being
converted as one oxide of one atom in one molecule, from 0.2 mol to
1.5 mol of Mg being converted as one oxide of one atom in one
molecule, and
[0012] from 0.03 mol to 0.60 mol of at least one metal selected
from V, Cr, and Mn being converted as an oxide of one atom in one
molecule, based on 100 mol of the main ingredient, and,
[0013] SiO.sub.2 or a glass ingredient mainly comprising
SiO.sub.2.
[0014] In one embodiment, dielectric ceramics that can be used for
a multi-layer ceramic capacitor having temperature characteristics
capable of satisfying the X8R characteristics and having specific
resistance of 100 M.OMEGA.m or higher in a high temperature
environment of 125.degree. C. to 200.degree. C. can be
obtained.
[0015] In further embodiments, a multi-layer ceramic capacitor
comprises multi-layer ceramics of a substantially hexahedral shape,
internal electrodes formed in the multi-layer ceramics such that
they are opposed in the multi-layer ceramics by way of the
dielectric ceramics and led to different end faces alternately, and
external electrodes formed on both end faces of the multi-layer
ceramics and electrically connected with the internal electrodes
led to the end faces respectively, in which the dielectric ceramics
are formed of dielectric ceramics and the internal electrodes are
formed of Ni or Ni alloy.
[0016] In other embodiments, a multi-layer ceramic capacitor has
temperature characteristics capable of satisfying the X8R
characteristics, has an insulation resistance of 100 M.OMEGA.m or
higher in a high temperature environment at 125.degree. C. to
200.degree. C. and, further, has a high temperature acceleration
life time property of 10,000 sec or more at 200.degree.
C.--20V/.mu.m.
[0017] In further embodiments a multi-layer ceramic capacitor has
the temperature characteristics capable of satisfying the X8R
characteristics, has the insulation resistance of 100 M.OMEGA.m or
higher in a high temperature environment and, further, has a high
temperature acceleration life time property of 10,000 sec or more
at 200.degree. C.--20 V/.mu.m. Further embodiments of the invention
include dielectric ceramics for use in the multi-layer ceramic
capacitor described above.
BRIEF DESCRIPTION OF THE DRAWING
[0018] FIG. 1 is a schematic view showing a cross section of a
multi-layer ceramic capacitor.
DESCRIPTION OF THE PREFERRED EMBODIMENTS
[0019] In one embodiment, the dielectric ceramics can be formed by
using (Bi.sub.0.5Na.sub.0.5).sub.xBa.sub.1-xTiO.sub.3 as a main
ingredient and mixed therewith a first material containing an oxide
of Mg, at least one metallic oxide selected from V, Cr and Mn, and
an oxide of at least one rare earth metal selected from Sm, Eu, Gd,
Tb, Dy, Ho, Er, Tm, Yb, and Y, and a second material comprising
SiO.sub.2 or a glass ingredient such as B.sub.2O.sub.3--SiO.sub.2
series glass or Li.sub.2O--SiO.sub.2 series glass, the
compositional ratio described above and sintering them.
[0020] In one embodiment, the dielectric ceramics can be obtained
as described below. At first,
(Bi.sub.0.5Na.sub.0.5).sub.xBa.sub.1-xTiO.sub.3 as the main
ingredient can be synthesized. For example, as the starting
material, 1-x mol of BaCO.sub.3, 0.25.times. mol of
Bi.sub.2O.sub.3, and 0.25.times. mol of Na.sub.2CO.sub.3 are
provided based on 1 mol of TiO.sub.2 and weighed such that x is
within a range from 0.05 to 0.2. Water can be added to the starting
materials and they can be wet blended by using a ball mill, bead
mill, or dispamil. The mixture can be dried and the dried product
can be calcined being kept at 900.degree. C. for one hour to obtain
a powder of (Bi.sub.0.5Na.sub.0.5).sub.xBa.sub.1-xTiO.sub.3 as the
main ingredient. In the
(Bi.sub.0.5Na.sub.0.5).sub.xBa.sub.1-xTiO.sub.3, the curie point
shifts to a higher temperature side than that for BaTiO.sub.3, and
has a curie point in a range from 150.degree. C. to 200.degree. C.
Accordingly, lowering of the permittivity at 125.degree. C. to
200.degree. C. is decreased compared with existent dielectric
ceramics using BaTiO.sub.3, and the rate of permittivity change can
easily be confined within .+-.15%.
[0021] Based on 100 mol of the powder of the obtained main
ingredient, 0.25 mol to 1.5 mol of a rare earth metal being
converted as an oxide of one atom in one molecule, 0.2 mol to 1.5
mol of Mg being converted as an oxide of one atom in one molecule,
and from 0.03 mol to 0.60 mol of a transition metal such as V, Cr
or Mn being converted as an oxide of one atom in one molecule are
added and, further, SiO.sub.2 or a glass ingredient mainly
comprising SiO.sub.2 can be added. They may be wet blended and
dried to form a dielectric ceramic composition. The dielectric
ceramic composition may be used for forming the dielectric ceramic
layer of a multi-ceramic capacitor. Being converted as an oxide of
one atom in one molecule means conversion into an oxide having one
metal atom in one molecule. For example, Ho.sub.2O.sub.3 is
converted as HoO.sub.3/2. SiO.sub.2 or the glass ingredient mainly
comprising SiO.sub.2 can be added for sintering the dielectric
ceramics at 1150 to 1400.degree. C. While the additive amount is
not restricted particularly, SiO.sub.2 or the glass ingredient
mainly comprising SiO.sub.2 is preferably added by 0.5 to 20 mass
parts based on 100 mass parts of the main ingredient in order that
the glass ingredient is not deposited after sintering between the
dielectric ceramics and the internal electrodes and lowers of the
permittivity.
[0022] As shown in FIG. 1, a multi-layer ceramic capacitor 1 of
this embodiment has substantially hexahedron multi-layer ceramics 2
having dielectric ceramics 3 and internal electrodes 4 formed such
that they are opposed by way of the dielectric ceramics 3 and led
out to different end faces alternatively, and external electrodes 5
are formed on both end faces of the multi-layer ceramics 2 so as to
be electrically connected with the internal electrodes. On the
external electrode 5, a first plating layer 6 for protecting the
external electrode 5 and a second plating layer 7 for improving the
solder wetting property are formed optionally on the external
electrode 5.
[0023] A method of manufacturing the multi-layer ceramic capacitor
can be described. A dielectric ceramic composition of the invention
can be prepared. A butyral-based or acrylic-based organic binder, a
solvent and other additives can be mixed to form a ceramic slurry.
The ceramic slurry can be sheeted by using a coating device such as
a roll coater to form a ceramic green sheet of a predetermined
thickness as dielectric ceramics.
[0024] A conductive paste of an Ni or Ni based alloy may be coated
in a predetermined pattern-shape by screen printing on the ceramic
green sheet to form a conductive layer as an internal electrode.
After laminating ceramic green sheets each formed with the
conductive layer by a required number, they can be press bonded to
form uncalcined ceramic layered body. After cutting and dividing
the same into individual chips, the binder is removed in an
atmospheric air or a non-oxidation gas such as nitrogen.
[0025] After removing the binder, a conductive paste can be coated
to the internal electrode exposure surface of the individual chip
to form a conductive film as an external electrode 5 An individual
chip formed with the conductive film can be baked in a
nitrogen-hydrogen atmosphere at a predetermined temperature (oxygen
partial pressure: about 10.sup.-10 atm). The external electrode 5
may be prepared also by baking an individual chip to form
multi-layer ceramics 2 and then coating and baking a conductive
paste containing glass frits to the internal electrode exposure
surface. For the external electrode 5, a metal identical with that
of the internal electrode can be used, as well as Ag, Pd, AgPd, Cu,
or Cu alloy can be used. Further, a first plating layer 6 can be
formed with Ni, Cu, etc. on the external electrode 5, and a second
plating layer 7 can be formed with Sn or Sn alloy further thereon
to obtain a multi-layer ceramic capacitor 1.
EXAMPLES
[0026] At first, as the starting material for the main ingredient
(Bi.sub.0.5Na.sub.0.5).sub.xBa.sub.1-xTiO.sub.3, BaCO.sub.3,
TiO.sub.2, Bi.sub.2O.sub.3, and Na.sub.2CO.sub.3 were weighed and
prepared such that x had a value in Table-1 while considering, for
example, the amount reached as ions in the subsequent wet blending
or amount that evaporates during baking. Then, those provided
starting materials were wet blended for 15 hr by a ball mill, dried
and then calcined at 900.degree. C. for one hour to obtain a powder
of a main ingredient. Usual BaTiO.sub.3 was adopted for No. 1.
TABLE-US-00001 TABLE 1 (Bi.sub.0.5Na.sub.0.5).sub.xBa.sub.1-xTiO
Rare earth Mg Transition metal M No. x Additive amount (mol)
Additive amount (mol) Additive amount (mol) * 1 0 Ho 1.0 1.0 Mn
0.10 2 0.05 Ho 1.0 1.0 Mn 0.10 3 0.07 Ho 1.0 1.0 Mn 0.10 4 0.1 Ho
1.0 1.0 Mn 0.10 5 0.15 Ho 1.0 1.0 Mn 0.10 6 0.2 Ho 1.0 1.0 Mn 0.10
* 7 0.25 Ho 1.0 1.0 Mn 0.10 * 8 0.1 Ho 0.1 1.0 Mn 0.10 9 0.1 Ho
0.25 1.0 Mn 0.10 10 0.1 Ho 1.0 0.2 Mn 0.60 11 0.2 Ho 1.0 1.5 Mn
0.10 12 0.1 Ho 1.5 1.0 Mn 0.10 * 13 0.1 Ho 2.0 1.0 Mn 0.10 * 14 0.1
Ho 1.0 0.1 Mn 0.10 15 0.1 Ho 1.0 0.2 Mn 0.10 16 0.1 Ho 1.5 1.0 Mn
0.03 17 0.07 Ho 1.0 1.0 Mn 0.60 18 0.1 Ho 1.0 1.5 Mn 0.10 * 19 0.1
Ho 1.0 2.0 Mn 0.10 * 20 0.1 Ho 1.0 1.0 Mn 0.00 21 0.1 Ho 1.0 1.0 Mn
0.03 22 0.1 Ho 0.25 1.5 Mn 0.10 23 0.2 Ho 1.5 0.2 Mn 0.10 24 0.1 Ho
1.0 1.0 Mn 0.60 * 25 0.1 Ho 1.0 1.0 Mn 1.00 26 0.1 Y 1.0 1.0 Mn
0.10 27 0.1 Sm 1.0 1.0 Mn 0.10 28 0.1 Eu 1.0 1.0 Mn 0.10 29 0.1 Gd
1.0 1.0 Mn 0.10 30 0.1 Tb 1.0 1.0 Mn 0.10 31 0.1 Dy 1.0 1.0 Mn 0.10
32 0.1 Er 1.0 1.0 Mn 0.10 33 0.1 Tm 1.0 1.0 Mn 0.10 34 0.1 Yb 1.0
1.0 Mn 0.10 35 0.1 Dy:Ho 1.0 1.0 Mn 0.10 36 0.1 Ho 1.0 1.0 V 0.10
37 0.1 Ho 1.0 1.0 Cr 0.10 38 0.1 Ho 1.0 1.0 V:Mn 0.10 *Out of the
range of the invention
[0027] Then, the oxide of the rare earth metal, MgO, and the oxide
of the transition metal were added each in an amount shown in Table
1 being converted as an oxide of one atom in one molecule based on
100 mol of the obtained main ingredient
(Bi.sub.0.5Na.sub.0.5).sub.xBa.sub.1-xTiO.sub.3. Further, SiO.sub.2
was added by 10 mass parts based on 100 mass parts of the main
ingredient (Bi.sub.0.5Na.sub.0.5).sub.xBa.sub.1-xTiO.sub.3 and the
mixture was wet blended for 15 hours in a ball mill, and dried to
obtain a dielectric ceramic powder.
[0028] Polyvinyl butyral, an organic solvent and a plasticizer were
added and mixed to the powder described above to form a ceramic
slurry. The ceramic slurry was coated and sheeted on a PET film by
a roll coater to obtain a long ceramic green sheet of 5 .mu.m
thickness and 20 cm width. An Ni internal electrode paste was
coated on the ceramic green sheet by screen printing to form an
internal electrode pattern in which paste films each of a 7.6
mm.times.1.6 mm rectangle-shape are arranged in a grid-shape each
at 0.4 mm distance. The ceramic green sheet formed with the
internal electrode pattern was punched into a 15 cm.times.15 cm
size, and stacked by the number of 21 sheets while displacing the
internal electrode patterns each by one-half pattern alternately in
the longitudinal direction to form a layered body. The layered body
was press bonded and then cut and divided each into a 4.0
mm.times.2.0 mm size to form a raw chip. The binder was removed
from the raw chip in a nitrogen atmosphere at 500.degree. C., and
an Ni external electrode paste was coated and baked being kept in a
reducing atmosphere (nitrogen-hydrogen atmosphere, oxygen partial
pressure: 10.sup.-10 atm) by keeping at 1200.degree. C. for one
hour and then the temperature was lowered to a room temperature at
a temperature-fall speed of 750.degree. C./hr.
[0029] For the thus obtained multi-layer ceramic capacitors each
sized 3.2.times.1.6 mm, with the thickness of the dielectric
ceramics layer of 3 .mu.m, rate of capacitance change (temperature
characteristics), insulation resistances and high temperature
acceleration life time property were measured and collectively
shown in Table 2. The rate of capacitance change was shown as the
rate of change based on the electrostatic capacity at 25.degree. C.
as a reference. Further, the rate of capacitance change was within
a range of +15% for the range from -55.degree. C. to 125.degree.
C., for each of the samples excepting for sample No. 7. For the
insulation resistance, a resistance was measured at a temperature
of 200.degree. C. and at a measuring voltage of 7 V/.mu.m with the
measuring terminal of a mega ohmmeter being in contact with the
external electrode, and a specific resistance was calculated based
on the intersection area of the internal electrodes and the
thickness of the dielectric ceramics between the internal
electrodes. This was carried out for the sample each selected at
random by the number of 10 and an average value thereof was taken.
Further, the high temperature acceleration life time property was
measured for the samples selected at random by the number of 10 at
200.degree. C. and under a load of 20 V/.mu.m and an average value
for the time where the resistance of the 10 specimens was lowered
to 1 M.OMEGA.m or lower.
TABLE-US-00002 TABLE 2 Acceler- Specific ation Rate of capacitance
change resistance life time No. 125.degree. C. 150.degree. C.
175.degree. C. 200.degree. C. .OMEGA. m (sec) * 1 -10.6 -22.2 -23.7
-25.0 2.0E+09 7.2E+04 2 -11.8 -10.1 -11.1 -23.4 1.2E+09 6.9E+04 3
-12.5 -11.1 -10.2 -16.8 9.3E+08 7.0E+04 4 -13.8 -12.8 -12.0 -11.2
9.1E+08 6.8E+04 5 -14.2 -13.3 -12.9 -11.6 9.0E+08 6.6E+04 6 -14.2
-13.4 -13.2 -12.1 6.8E+08 6.5E+04 * 7 -15.5 -13.9 -13.6 -12.9
3.9E+08 3.9E+04 * 8 -9.8 -7.9 -8.2 -10.9 6.9E-06 0 9 -11.9 -12.9
-12.7 -12.4 4.2E+08 4.5E+04 10 -11.2 -11.6 -12.4 -12 2.9E+08
8.8E+04 11 -14.8 -14.1 -12.9 -11.9 7.2E+08 5.4E+04 12 -14.1 -12.9
-11.1 10.7 1.1E+09 7.6E+04 * 13 Characteristics cannot be evaluated
due to lack of sinterability * 14 -9.8 -10.9 -13.1 -15.6 5.5E+07
3.0E+03 15 -11.6 -11.7 -12.3 -13.9 3.8E+08 4.3E+04 16 -13.4 -12.7
-10.9 -10.2 1.9E+09 6.1E+04 17 -12.6 -12 -11.1 -15.9 4.4E+08
7.9E+04 18 -13.5 -12.5 -12.4 -12.1 8.8E+08 9.3E+04 * 19
Characteristics cannot be evaluated due to lack of sinterability *
20 -13.4 -12.3 -12.2 -11.9 4.9E+05 0 21 -13.5 -12.8 -12.4 -12.1
1.8E+09 4.4E+04 22 -12.1 -13.4 -12.5 -12.1 5.1E+08 6.1E+04 23 -12.1
-12.5 -12.9 -13.9 5.4E+08 3.7E+04 24 -14 -12.9 -12.6 -13.0 5.5E+08
9.6E+04 * 25 -14.1 -12.9 -12.8 -12.7 3.3E+07 7.1E+04 26 -12.9 -12.8
-12.4 -11.2 7.9E+08 6.3E+04 27 -13.5 -11.9 -10.9 -10.9 6.8E+08
2.2E+04 28 -13.4 -11.9 -10.9 -10.8 5.5E+08 2.1E+04 29 -13.5 -12.0
-11.4 -11.2 7.2E+08 3.2E+04 30 -12.8 -13.0 -12.5 -12.0 8.1E+08
4.3E+04 31 -13.9 -13.1 -12.0 -11.3 9.6E+08 8.4E+04 32 -13.2 -12.8
-12.3 -11.8 9.4E+08 5.9E+04 33 -13.0 -12.1 -12.0 -11.7 7.6E+08
5.5E+04 34 -12.9 -12.7 -12.0 -11.3 5.5E+08 3.1E+04 35 -13.1 -12.5
-11.9 -11.5 9.7E+08 7.7E+04 36 -13.0 -13.1 -12.3 -12.0 8.7E+08
8.8E+04 37 -12.9 -11.9 -12.1 -12.0 9.3E+08 8.6E+04 38 -13.5 -13.1
-12.5 -11.5 9.0E+08 7.5E+04 *Out of the range of the invention
[0030] Based on the result for sample Nos 1 to 7 with the value x
being changed, dielectric ceramics having temperature
characteristics capable of satisfying X8R characteristics and
having a specific resistance of 100 M.OMEGA.m or higher in a high
temperature environment can be obtained by defining the value x in
(Bi.sub.0.5Na.sub.0.5).sub.xBa.sub.1-xTiO.sub.3 as the main
ingredient to a range of 0.05 to 0.20. Further, a multi-layer
ceramic capacitor having a high temperature acceleration life time
property exceeding 10,000 sec or more in a case at 200.degree.
C.--20 V/.mu.m. Further, by changing rate of x as within a range
from 0.1 to 0.2, temperature characteristics that the rate of
electrostatic capacity change is within a .+-.15% range at
25.degree. C. as a reference for a temperature range from
-55.degree. C. to 200.degree. C. can be obtained. In a case where
the value x was out of the range of the invention, the rate of
electrostatic capacity change at 25.degree. C. reference did not
fall within .+-.15% range within the temperature range of
125.degree. C. to 200.degree. C.
[0031] Based on the result for the samples Nos. 8 to 13 with the
additive amount of the oxide of the rare earth metal (Ho) being
increased or decreased, dielectric ceramics having temperature
characteristics capable of satisfying the X8R characteristics and
having a specific resistance of 100 M.OMEGA.m or higher in a high
temperature environment could be obtained by defining the additive
amount to a range from 0.25 mol to 1.50 mol based on 100 mol of the
main ingredient and, further, a multi-layer ceramic capacitor
having a high temperature acceleration life time property of 10,000
sec or more at 200.degree. C.--20 V/.mu.m could be obtained. In a
case where the additive amount of the oxide of the rare earth metal
was out of the range of the invention, sintering failure was caused
or the specific resistance in the high temperature environment was
lower than 100 M.OMEGA.m, and the high temperature acceleration
life time property was less than 10,000 sec at 200.degree. C.--20
V/.mu.m.
[0032] Based on the result for samples Nos. 14 to 19 with the
additive amount of the oxide of Mg being increased or decreased,
dielectric ceramics having temperature characteristics capable of
satisfying the X8R characteristics and having a specific resistance
of 100 M.OMEGA.m or higher in a high temperature environment could
be obtained by defining the additive amount to a range from 0.20
mol to 1.50 mol based on 100 mol of the main ingredient and,
further, a multi-layer ceramic capacitor having a high temperature
acceleration life time property of 10,000 sec or more at
200.degree. C.--20 V/.mu.m could be obtained. In a case where the
additive amount of the oxide of Mg was out of the range of the
invention, sintering failure was caused or the specific resistance
in the high temperature environment was lower than 100 M.OMEGA.m,
and the high temperature acceleration life time property was less
than 10,000 sec at 200.degree. C.--20 V/.mu.m.
[0033] Based on the result for samples Nos. 20 to 25 within the
additive amount of the oxide of the transition metal (Mn) being
increased or decreased, dielectric ceramics having temperature
characteristics capable of satisfying the X8R characteristics and
having a specific resistance of 100 M.OMEGA.m or higher in a high
temperature environment could be obtained by defining the additive
amount to a range from 0.03 mol to 0.60 mol based on 100 mol of the
main ingredient and, further, a multi-layer ceramic capacitor
having a high temperature acceleration life time property of 10,000
sec or more at 200.degree. C.--20 V/.mu.m could be obtained. In a
case where the additive amount of the oxide of Mn was out of the
range of the invention, the specific resistance in the high
temperature environment was lower than 100 M.OMEGA.m.
[0034] Based on the result for samples Nos. 26 to 34 in which the
rare earth metal was substituted by rare earth metals other than
Ho, the same effect was obtained also in a case of substituting the
rare earth metal by those other than Ho. Further, based on the
result for the sample No. 35 using two kinds of rare earth metals,
i.e., Ho and Dy, the same effect was obtained also by using two
types of rare earth element.
[0035] Based on the result for sample Nos. 36 to 37 in which the
transition metal was substituted by transition metals other than
Mn, same effect was obtained also in a case of substituting Mn by V
or Cr. Further, based on the result for sample No. 38 using two
kinds of transition metals, i.e., V and Mn, the same effect was
obtained also by using two types of transition metals.
[0036] From the result described above, the invention can provide a
multi-layer ceramic capacitor having temperature characteristics
capable of satisfying the X8R characteristics, and a specific
resistance of 100 M.OMEGA.m or higher in a high temperature
environment and, further, a high temperature acceleration life time
property of 10,000 or more at 200.degree. C.--20 V/.mu.m. Further,
the invention can provide dielectric ceramics for use in the
multi-layer ceramic capacitor having the characteristics as
described above.
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