U.S. patent application number 11/629953 was filed with the patent office on 2007-11-08 for analytical instruments, assemblies, and methods.
Invention is credited to Dennis JR. Barket, Mark Gregory, Garth E. Patterson, Jason Springston.
Application Number | 20070258861 11/629953 |
Document ID | / |
Family ID | 35782243 |
Filed Date | 2007-11-08 |
United States Patent
Application |
20070258861 |
Kind Code |
A1 |
Barket; Dennis JR. ; et
al. |
November 8, 2007 |
Analytical Instruments, Assemblies, and Methods
Abstract
Person-portable mass analysis instrumentation configured to
perform nultidimensional mass analysis is provided. Mass analysis
instrumentation can include a housing encompassing components of
the instrumentation with the housing of the instrumentation
defining a space having a volume of equal to or less than about
100,000 cm.sup.3. Instrument assemblies are also provided that can
include a housing coupled to an instrument component isolation
assembly, wherein the component isolation assembly is isolated from
an environment exterior to the housing. Exemplary instrument
assemblies can include at least first and second components
configured to provide analysis with a housing of the instrument at
least partially encompassing the first and second components and
the first component being rigidly affixed to the housing. An
isolation assembly can also be provided that is rigidly affixed to
the second component with the isolation assembly being isolated
from received inputs of the housing.
Inventors: |
Barket; Dennis JR.;
(Lafayette, IN) ; Patterson; Garth E.; (Brookston,
IN) ; Gregory; Mark; (Lafeyette, IN) ;
Springston; Jason; (Carmel, IN) |
Correspondence
Address: |
WELLS ST. JOHN P.S.
601 W. FIRST AVENUE, SUITE 1300
SPOKANE
WA
99201
US
|
Family ID: |
35782243 |
Appl. No.: |
11/629953 |
Filed: |
June 13, 2005 |
PCT Filed: |
June 13, 2005 |
PCT NO: |
PCT/US05/20783 |
371 Date: |
July 24, 2007 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
|
60580144 |
Jun 15, 2004 |
|
|
|
60580582 |
Jun 16, 2004 |
|
|
|
Current U.S.
Class: |
422/89 ;
422/400 |
Current CPC
Class: |
G01N 1/405 20130101;
G01N 30/7206 20130101; G01N 2035/00326 20130101; H01J 49/02
20130101; G01N 30/06 20130101; H01J 49/0022 20130101; G01N 30/722
20130101 |
Class at
Publication: |
422/089 ;
422/099 |
International
Class: |
G01N 30/02 20060101
G01N030/02; B01L 11/00 20060101 B01L011/00 |
Claims
1. A person-portable mass analysis instrument configured to perform
multidimensional mass analysis.
2. The instrument of claim 1 wherein the multidimensional mass
analysis comprises sequential mass spectrometry analyses.
3. The instrument of claim 1 further comprising a sample inlet
component coupled to a mass analysis component, the sample inlet
component being configured to receive a sample for analysis and
prepare the sample for mass analysis by the mass analysis
component, wherein the mass analysis component is configured to
perform the multidimensional mass analysis.
4. The instrument of claim 3 further comprising a process circuitry
component coupled to one or both of the sample inlet component and
the mass analysis component, wherein the process circuitry
component is configured to one or more of acquire data, store data,
and manipulate acquired data generated by one or both of the sample
inlet component and the mass analysis component.
5. The instrument of claim 4 wherein the process circuitry is
configured to be accessed from remote process and storage
circuitry.
6. The instrument of claim 3 wherein the sample inlet component is
configured to be coupled to a plurality of sampling components.
7. The instrument of claim 6 wherein one or more of the sampling
components are modular.
8. The instrument of claim 3 wherein the sample inlet component is
configured to be coupled to a plurality of analyte modification
components.
9. The instrument of claim 8 wherein one or more of the analyte
modification components are modular.
10. The instrument of claim 3 further comprising: a housing
encompassing at least the mass analysis component; and an isolator
coupled to the housing and at least one component within the
housing.
11. The instrument of claim 10 wherein the isolator is configured
to isolate the one component from one or more of shock, vibration,
electronic, and thermal inputs received by the housing.
12. The instrument of claim 3 wherein the mass analysis component
is configured to perform multidimensional mass analysis without gas
chromatography.
13. A mass analysis instrument comprising: a mass analysis
component coupled to a sample preparation component, the sample
preparation component being configured to receive a sample for
analysis and expose the sample to a composition; a
consumables-generation component coupled to the sample preparation
component, the consumables-generation component being configured to
generate the composition; and a housing coupled to one or more of
the mass analysis component, the sample preparation component, and
the consumables-generation component, the housing defining a space
encompassing the instrument, wherein the composition is generated
by the consumables-generation component from within the space.
14. The instrument of claim 13 wherein: the sample preparation
component is configured to perform chromatography, the
chromatography partitioning a portion of the sample into a mobile
phase; and the composition comprises the mobile phase.
15. The instrument of claim 14 wherein the chromatography comprises
gas chromatography and the composition is a gas.
16. The instrument of claim 15 wherein the composition comprises
nitrogen.
17. The instrument of claim 13 wherein the mass analysis component
is configured to perform multidimensional mass analysis.
18. The instrument of claim 17 wherein the mass analysis component
comprises a cylindrical ion trap.
19. The instrument of claim 13 further comprising a process and
control component coupled to at least the mass analysis component,
the process and control component being configured to provide mass
analysis parameters to the mass analysis component, wherein the
mass analysis parameters comprise waveforms.
20. A mass analysis instrument comprising a housing encompassing
components of the instrument, the components comprising a
processing and control component, a sample inlet component, a
sample preparation component, a mass analysis component, and a
detection component, wherein the housing defines a space having a
volume of equal to or less than about 100,000 cm.sup.3.
21. The instrument of claim 20 wherein the sample inlet component
is coupled to the sample preparation component, the sample inlet
component being configured to receive a sample and provide the
sample to the sample preparation component, wherein the sample
inlet component comprises a syringe port.
22. The instrument of claim 20 wherein the sample inlet component
is coupled to the sample preparation component, the sample
preparation component being configured to receive a sample from the
sample inlet component, wherein the sample preparation component is
configured to perform gas chromatography.
23. The instrument of claim 20 wherein the sample inlet component
is coupled to the mass analysis component, the mass analysis
component being configured to receive a sample from the sample
inlet component, wherein the mass analysis component is configured
to perform multidimensional mass analysis.
24. The instrument of claim 23 wherein the mass analysis component
is coupled to the processing and control component, the processing
and control component being configured to provide mass analysis
parameters to the mass analysis component.
25. The instrument of claim 24 wherein the mass analysis parameters
include waveforms.
26. The instrument of claim 25 wherein the mass analysis component
comprises a cylindrical ion trap.
27. The instrument of claim 20 wherein the mass analysis component
is coupled to the detection component, the detection component
being configured to receive ionized analytes from the mass analysis
component, wherein the detection component comprises an electron
multiplier.
28. An instrument assembly comprising a housing coupled to an
instrument component isolation assembly, wherein the component
isolation assembly is isolated from an environment exterior to the
housing.
29. The assembly of claim 28 further comprising at least one
instrument component coupled to the instrument component isolation
assembly, the at least one component being within a space defined
by the housing.
30. The assembly of claim 29 wherein the at least one component
comprises a pump assembly.
31. The assembly of claim 28 wherein the instrument component
isolation assembly comprises a frame defining a space within the
housing.
32. The assembly of claim 31 further comprising at least one
instrument component, the instrument component residing within the
space.
33. The assembly of claim 32 wherein the instrument component is
coupled to the instrument isolation assembly.
34. The assembly of claim 31 wherein the frame comprises a platform
and further comprising a plurality of isolators, each of the
isolators having one end coupled to the platform and another end
coupled to the housing.
35. The assembly of claim 34 wherein at least one of the isolators
is configured to isolate the platform from one or more of shock,
vibration, electronic, and thermal inputs received by the
housing.
36. The assembly of claim 34 wherein at least four isolators are
coupled to the platform.
37. The assembly of claim 34 wherein the frame of the component
isolation assembly further comprises at least two sidewalls
extending from the platform, the sidewalls having isolators coupled
thereto, each isolator having one end coupled to a sidewall and
another end coupled to the housing.
38. The assembly of claim 37 wherein a mass analysis component
resides within the space.
39. The assembly of claim 38 wherein the mass analysis component
comprises a pump assembly.
40. The assembly of claim 31 wherein the frame comprises a platform
and at least two sidewalls extending vertically from the platform,
each of the sidewalls being individually coupled to the housing by
an isolator.
41. An instrument assembly comprising: at least two instrument
components configured to provide analysis, the two components
comprising a first component and a second component; an instrument
housing at least partially encompassing the first and second
components, wherein the first component is rigidly affixed to the
instrument housing; and an instrument component isolation assembly
rigidly affixed to the second component, the isolation assembly
being isolated from received inputs of the housing.
42. The assembly of claim 41 wherein the two components are mass
analysis instrument components.
43. The assembly of claim 42 wherein the first component is a
processing and control component and the second component is a pump
assembly.
44. The assembly of claim 43 wherein the pump assembly comprises a
turbomolecular pump.
45. The assembly of claim 42 wherein the first component is a
sample inlet component and the second component is a mass analysis
component.
46. The assembly of claim 45 wherein the sample inlet component
comprises a capillary membrane inlet.
47. The assembly of claim 45 wherein the mass analysis component
comprises a cylindrical ion trap.
48. The assembly of claim 45 wherein the first component is
flexibly coupled to the second component.
49. The assembly of claim 42 wherein the first component is a
processing and control component and the second component comprises
a mass analysis component, the mass analysis component being
coupled to the processing and control component.
50. The assembly of claim 49 wherein the processing and control
component is configured to provide mass analysis parameters to the
mass analysis component.
51. The assembly of claim 50 wherein the mass analysis parameters
comprise waveforms.
52. An analytical instrument comprising: an instrument housing
encompassing at least two analytical components, a first component
and a second component, wherein the first component is rigidly
affixed to the housing; and an instrument isolation assembly
shock-mounted to the housing, the instrument isolation assembly
being rigidly affixed to the second component.
53. The instrument of claim 52 wherein: the instrument housing
comprises a floor; and the instrument isolation assembly comprises
a base shocked mounted to the floor of the instrument housing.
54. The instrument of claim 53 wherein: the instrument housing
comprises housing-sidewalls extending vertically from the floor;
and the instrument isolation assembly comprises assembly-sidewalls
extending vertically from the base, the assembly-sidewalls being
shock mounted to the housing-sidewalls.
55. The instrument of claim 54 wherein the second component is
rigidly affixed to the assembly-sidewalls.
56. The instrument of claim 55 wherein the first component
comprises a processing and control component and the second
component comprises a mass analysis component.
57. The instrument of claim 56 wherein the processing and control
component is coupled to the mass analysis component, the processing
and control component being configured to provide mass analysis
parameters to the mass analysis component.
58. The instrument of claim 56 wherein the mass analysis component
comprises a cylindrical ion trap.
59. The instrument of claim 52 wherein the shock-mount comprises a
wire rope isolator.
Description
CLAIM FOR PRIORITY
[0001] This application claims priority to U.S. Provisional Patent
Application No. 60/580,144, filed Jun. 15, 2004 entitled Instrument
Assemblies and Methods, and U.S. Provisional Patent Application No.
60/580,582, filed Jun. 16, 2004, entitled Mass Spectrometry
Instruments, the entirety of which are incorporated by reference
herein.
TECHNICAL FIELD
[0002] The present disclosure relates to analytical instruments,
instrumentation, instrument assemblies, and analytical methods.
More specific embodiments include mass analysis instrumentation as
well as mass analysis methods.
BACKGROUND ART
[0003] Analytical instrumentation and particularly mass analysis
instrumentation can be utilized to determine both the identity and
amount of unknown compounds and mixtures. It is desirable to
determine the identity and amount of unknown compounds and mixtures
at their point of origin rather than obtaining a sample and
transporting that sample to a laboratory for analysis, at least in
that sampling and transportation of samples can contaminate the
sample obtained and/or because sampling is not practical.
Furthermore, it may be important to quickly ascertain the identity
and amount of unknown compounds and sampling and transportation of
the sample does not facilitate quick analysis.
[0004] Mass analysis instrumentation, such as mass spectrometers,
are an exemplary analytical instrument recognized as being one of
the most definitive detection techniques available. Mass
spectrometers are capable of providing a reproducible signal that
is diagnostic of almost any compound that can be introduced into
the system. The capability that mass spectrometry provides is
sought after for many uses including field applications where the
instrument would ideally be brought to the sample rather than the
more traditional transportation of the sample to the
laboratory.
[0005] Typically analytical instrumentation of this sophistication
is limited to laboratory use only and cannot be used in the field
for practical reasons such as size or fragility. In the field, for
example, instruments are not sheltered from inputs from the
environment, the instruments can be exposed to travel which can jar
and/or shock the instrument or other adverse conditions may occur.
Accordingly, mass spectrometers may be limited to laboratory use
for a variety of reasons, including the fragility of the mass
spectrometer's vacuum system, which the instrument may be reliant
upon to reduce the operating pressure within a mass spectrometer's
mass analyzer. Depending on the type of mass analyzer used, higher
pressure can cause a change in ion flight path, de-phasing of ion
motion, etc., which can lead to the acquisition of erroneous
data.
[0006] At least some analytical instrumentation and methods
described herein provide an increased accommodation of
environmental inputs such as shock which may be experienced in some
analysis applications. Some embodiments of the analytical
instrumentation and methods are portable and can be transported to
where the chemistry happens, outside the laboratory.
SUMMARY
[0007] According to an embodiment, person-portable mass analysis
instrumentation configured to perform multidimensional mass
analysis are provided. Mass analysis instrumentation can include a
mass analysis component coupled to a sample preparation component
with a consumables-generation component coupled to the sample
preparation component. The consumables-generation component can be
configured to generate a composition used by the sample preparation
component. The instrumentation can also include a housing coupled
to one or more of the mass analysis component, the sample
preparation component, and the consumables-generation component
with the housing defining a space encompassing the instrument.
[0008] Mass analysis instrumentation are also provided that can
include a housing encompassing components of the instrumentation,
with the components including a processing and control component, a
sample inlet component, a sample preparation component, a mass
analysis component, and/or a detection component. The housing of
the instrumentation can define a space having a volume of equal to
or less than about 100,000 cm.sup.3.
[0009] Instrument assemblies are provided that can include a
housing coupled to an instrument component isolation assembly,
wherein the component isolation assembly is isolated from an
environment exterior to the housing. Exemplary instrument
assemblies can include at least two instrument components
configured to provide analysis, a first component and a second
component. An instrument housing at least partially encompassing
the first and second components can be provided, with the first
component being rigidly affixed to the instrument housing. An
instrument component isolation assembly can also be provided that
is rigidly affixed to the second component with the isolation
assembly being isolated from received inputs of the housing.
BRIEF DESCRIPTION OF THE DRAWINGS
[0010] Preferred embodiments of the invention are described below
with reference to the following accompanying drawings.
[0011] FIG. 1 is an illustrative view of an instrument according to
an embodiment.
[0012] FIG. 2 is an illustrative representation of instrument
components according to an embodiment.
[0013] FIG. 3 is an illustrative view of the instrument of FIG. 1
according to an embodiment.
[0014] FIG. 4 is an illustrative view of the instrument of FIG. 1
according to an embodiment.
[0015] FIG. 5 is an illustrative view of the instrument of FIG. 1
according to an embodiment.
[0016] FIG. 6 is an illustrative view of the instrument of FIG. 1
according to an embodiment.
[0017] FIG. 7 is an illustrative view of the instrument of FIG. 1
according to an embodiment.
[0018] FIG. 8 is an illustrative view of the instrument of FIG. 1
according to an embodiment.
[0019] FIG. 9 is an illustrative view of the instrument of FIG. 1
according to an embodiment.
[0020] FIG. 10 is an illustrative view of the instrument of FIG. 1
according to an embodiment.
[0021] FIG. 11 is an isometric view of the instrument of FIG. 1
according to an embodiment.
[0022] FIG. 12A is an isometric view of the instrument of FIG. 1
according to an embodiment.
[0023] FIG. 12B is top view of the instrument of FIG. 12A according
to an embodiment.
[0024] FIG. 12C is a front view of the instrument of FIG. 12A
according to an embodiment.
[0025] FIG. 12D is a side view of the instrument of FIG. 12A
according to an embodiment.
[0026] FIG. 12E is an isometric view of the instrument of FIG. 12A
according to an embodiment.
[0027] FIG. 13 is an illustrative representation of an instrument
assembly according to an embodiment.
[0028] FIG. 14 is an illustrative representation of the instrument
assembly of FIG. 13 according to an embodiment.
[0029] FIG. 15 is an isometric view of the instrument assembly of
FIG. 13 according to an embodiment.
[0030] FIG. 16 is an isometric view of the instrument assembly of
FIG. 13 according to an embodiment.
[0031] FIG. 17 is an isometric view of the instrument assembly of
FIG. 13 according to an embodiment.
[0032] FIG. 18 is an isometric view of the instrument assembly of
FIG. 13 according to an embodiment.
[0033] FIG. 19 is an isometric view of the instrument assembly of
FIG. 13 according to an embodiment.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
[0034] At least some embodiments provide analytical instruments,
assemblies, and/or methods. Exemplary configurations of these
instruments, assemblies, and/or methods are described with
reference to FIGS. 1-19.
[0035] Referring first to FIG. 1, an exemplary analytical
instrument 10 is depicted that includes a supporting structure 12
coupled to at least one of instrument components 14. Analytical
instrument 10 can include mass analysis instrumentation such as
mass spectrometry instrumentation, for example. The Minotaur 300
and 400 instruments available from Griffin Analytical Technologies,
3000 Kent Avenue, West Lafayette, Ind. 47906 are exemplary of
instrument 10.
[0036] In exemplary embodiments, structure 12 can support,
surround, and/or partially surround components 14. According to
some embodiments, structure 12 can be referred to as a frame, base,
case, cabinet, and/or any structure that can define a space
occupied by components 14. An exemplary material of structure 12
includes aluminum. In some configurations the space defined by
structure 12 is no greater than or equal to about
45.3.times.45.3.times.48.8 cm (100,142 cm.sup.3) and in other
exemplary embodiments the space defined by structure 12 is no
greater than or equal to about 25.15.times.50.55.times.38.35 cm
(48,756 cm.sup.3). Components 14 can be configured to provide mass
analysis including mass spectrometry analysis, for example. In
exemplary configurations, instrument 10 can weigh less than 22.6
kgs.
[0037] Exemplary configurations of instrument 10 are
person-portable. Person-portable instruments include those
instruments that can be transported by an individual outside the
traditional laboratory. These instruments can be self-contained
including a power source, or they can be configured to be coupled
to external power sources available in the field. Person-portable
instruments are of a size and weight that allows them be to
transported by a person of ordinary size and strength, including
military personnel. Person-portable instruments can weigh less than
22.6 kgs and/or define a volume of less than or equal to about
100,000 cm.sup.3 in some embodiments and in others the instrument
can define a volume from about 100,000 cm.sup.3 to about 50,000
cm.sup.3. As discussed in more detail below, person-portable
instruments can also be rugged in that they can be configured to
withstand environmental inputs such as shock from physical
impacts.
[0038] With reference to FIG. 2, instrument components 14 can
include mass analysis components, such as sample inlet component 16
operationally connected and/or coupled to an ion source component
18 which can be operationally connected and/or coupled to a mass
separator component 20 which can be operationally connected and/or
coupled to a detector component 22. Any and/or all of these
components alone or in combination can be operationally connected
and/or coupled to a processing and control device component 24.
Exemplary embodiments provide for the use of components 14 to
perform mass analysis including mass spectrometry. Components 14
can be operationally connected as shown in FIG. 2 or operationally
connected in other configurations enabling mass analysis methods.
Further, other arrangements including more or less or alternative
components are possible.
[0039] As depicted in FIG. 2, a sample 26 can be introduced into
sample inlet component 16. For purposes of this disclosure, sample
26 represents any chemical composition including both inorganic and
organic substances in solid, liquid, and/or vapor form. Specific
examples of sample 26 suitable for analysis include volatile
compounds such as toluene or other specific examples including
highly-complex non-volatile protein based structures such as
bradykinin. In certain aspects, sample 26 can be a mixture
containing more than one substance or in other aspects sample 26
can be a substantially pure substance. Analysis of sample 26 can be
performed according to exemplary aspects described below.
[0040] Sample inlet component 16 can be configured to introduce an
amount of sample 26 into instrument 10 (FIG. 1) for analysis.
Depending upon sample 26, sample inlet component 16 may be
configured to prepare sample 26 for ionization. Types of sample
inlet components 16 can include batch inlets, direct probe inlets,
chromatographic inlets, and permeable, semi-permeable, solid phase
microextraction (SPME), and/or capillary membrane inlets. Exemplary
inlets include those described in U.S. Provisional Patent
Application Ser. No. 60/579,816 filed Jun. 14, 2004, entitled
Sample Introduction Assemblies and Methods, the entirety of which
is incorporated by reference herein. Sample inlet component 16 can
also include means for preparing sample 26 for analysis in the gas,
liquid, and/or solid phase. In some aspects, sample inlet component
16 may be combined with ion source component 18.
[0041] Ion source component 18 can be configured in exemplary
embodiments to receive sample 26 directly or, in other exemplary
embodiments, to receive sample 26 from sample inlet component 16.
Ion source component 18 can be configured to convert portions or an
entirety of sample 26 into analyte ions in one example. This
conversion can include the bombardment of sample 26 with electrons,
ions, molecules, and/or photons. This conversion can also be
performed by thermal or electrical energy.
[0042] Ion source component 18 may utilize, for example, electron
ionization (EI, typically suitable for the gas phase ionization),
photo ionization (PI), chemical ionization, and/or electrospray
ionization (ESI). For example, in PI, the photo energy can be
varied to vary the internal energy of the sample. Also, when
utilizing ESI, sample 26 can be energized under atmospheric
pressure. Potentials applied when utilizing ESI can be varied to
cause varying degrees of dissociation as described in International
Application number PCT/US04/012849 filed Apr. 26, 2004, entitled
Instrumentation, Articles of Manufacture, and Analysis Methods, the
entirety of which is incorporated by reference herein. Furthermore,
exemplary ion source components include those described in U.S.
Provisional Patent Application No. 60/585,113 filed Jul. 2, 2004,
entitled Spectrometry Instruments, Assemblies and Methods, the
entirety of which is incorporated by reference herein.
[0043] Ion source component 18 can also be configured to fragment
analytes without ionizing the analytes. In exemplary
implementations, the analytes may be fragmented after ionization.
An exemplary fragmentation technique includes collisionally
activated disassociation.
[0044] The analyte ions can proceed from ion source component 18 to
mass separator component 20, for example. Mass separator component
18 can include one or more of linear quadrupoles, triple
quadrupoles, quadrupole ion traps (Paul), cylindrical ion traps,
linear ion traps, rectilinear ion traps, ion cyclotron resonance,
quadrupole ion trap/time-of-flight mass spectrometers, or other
structures. Exemplary mass separator components include those
described in International Patent Application No. PCT/US03/38587,
filed Dec. 2, 2003, entitled Processes for Designing Mass
Separators and Ion Traps, Methods for Producing Mass Separators and
Ion Traps, Mass Spectrometers, Ion Traps, and Methods for Analyzing
Samples, the entirety of which is incorporated by reference herein.
Mass separator component 18 can also include focusing lenses as
well as tandem mass separator components such as tandem ion traps
or ion traps and quadrupoles in tandem. In one implementation, at
least one of multiple tandem mass separator components can be an
ion trap. Tandem mass separator components can be placed in series
or parallel. In an exemplary implementation, tandem mass separator
components can receive ions from the same ion source component. In
an exemplary aspect, the tandem mass separator components may have
the same or different geometric parameters. The tandem mass
separator components may also receive analyte ions from the same or
multiple ion source components.
[0045] Analytes may proceed to detector component 22 from mass
separator component 20. Exemplary detector components include
electron multipliers, Faraday cup collectors, photographic and
scintillation-type detectors. Exemplary detector components also
include those described in U.S. Provisional Patent Application No.
60/607,940 filed Sep. 7.sup.th, 2004 entitled Mass Spectrometry
Analysis Techniques and Mass Spectrometry Circuitry, the entirety
of which is incorporated by reference herein.
[0046] Acquisition and generation of data can be facilitated with
processing and control device component 24. Exemplary embodiments
provide that the progression of mass spectrometry analysis from
sample inlet component 16 to detector component 22 can be
controlled and monitored by a processing and control device
component 24. Processing and control device component 24 can be a
computer or mini-computer or other appropriate circuitry that is
capable of controlling components 14. This control can include, for
example, the specific application of voltages to ion source
component 18 and mass separator component 20, as well as the
introduction of sample 26 via sample inlet component 16, and may
further include determining, storing and ultimately displaying mass
spectra recorded from detector component 22. Processing and control
device component 24 can contain data acquisition and searching
software. In one aspect, such data acquisition and searching
software can be configured to perform data acquisition and
searching that includes the programmed acquisition of total analyte
count. In another aspect, data acquisition and searching parameters
can include methods for correlating the amount of analytes
generated to predetermine programs for acquiring data. Exemplary
configurations of processing and control components include those
described in U.S. Provisional Patent Application No. 60/607,890
filed Sep. 7, 2004, entitled Analysis Methods and Devices, as well
as International Patent Application No. PCT/US04/29029 filed Sep.
4.sup.th, 2003 entitled Analysis Device Operational Programming
Methods and Analysis Device Methods, the entirety of both of which
are incorporated by reference herein.
[0047] As the space defined by structure 12 (e.g., FIG. 1) can be
considered small when compared to typical instruments, in exemplary
embodiments, instrument 10 can be person-portable and/or packable
and, components 14 can be configured to provide multiple levels of
analysis (e.g., multidimensional analysis such as MS/MS) from a
person-portable instrument. Structure 12 can be coupled to
components 14 via attachment devices, and structure 12 may include
openings (not shown) to allow access to components 14. These
openings can remain open or structure 12 may include doors or
panels allowing access to components 14 upon respective opening or
removal.
[0048] Referring to FIG. 3, an exemplary configuration of
components 14 of instrument 10 are shown that can include at least
one of sample inlet components 16 coupled to structure 12.
Instrument components 14 can also include at least one of analysis
components 28 coupled to at least one of sample inlet components 16
and at least one of processing and control components 24. Analysis
components 28 can include components configured to perform
analytical analysis including but not limited to components 18, 20,
and 22 described above. As exemplarily depicted, at least one of
processing and control components 24 can be coupled to at least one
of sample inlet components 16 and structure 12. Embodiments of
instrument components 14 include structure 12 only being coupled to
at least one of sample inlet components 16 with none of processing
and control components 24 being coupled to structure 12. Instrument
components 14 can be configured to provide mass spectral data, for
example. Instrument components 14 can further include power supply
coupled to processing and control components 24 and, as necessary,
inlet components 16 and analysis components 24. Exemplary power
supply 30 can include portable batteries such as sealed lead-acid
and/or lithium ion or polymer batteries. In other embodiments,
power supply 30 may be located outside the space defined by
structure 12.
[0049] Referring to FIG. 4, sample inlet components 16 are shown
that include sample introduction port 32 coupled to structure 12
and at least one of sample preparation components 34. Port 32 may
be rigidly affixed to structure 12, for example. Sample
introduction port 32 can be configured to receive a sample for
analysis by instrument 10 (FIG. 1). Exemplary sample introduction
ports 32 include syringe ports configured to receive the sample and
convey the sample to sample preparation components 34.
[0050] Depending upon the sample, sample introduction port 32 may
be configured to prepare the sample for introduction into sample
preparation component 34 as well as remaining components 14 (FIG.
1). According to the exemplarily depicted embodiment of FIG. 4,
sample introduction port 32 is configured to prepare the sample for
introduction into sample preparation components 34. Sample
introduction port 32 may be configured to convert the sample to a
form suitable for transfer, for example, a solid sample can be
converted to a liquid and/or a gas, or a liquid sample can be
converted to a gas and/or a solid, likewise gases may be converted
to liquids and/or solids depending on the configuration of
instrument 10. Types of sample introduction ports 32 can include
batch inlets, direct probe inlets, and permeable, semi-permeable,
solid phase microextraction (SPME) and/or capillary membrane
inlets. Sample inlet component 16 can be configured to utilized
different sample introduction ports simultaneously. For example,
sample introduction port 32 can be configured, in one embodiment,
as parallel ports with one port configured to receive sample from a
syringe and another port configured to receive sample from another
instrument such as an automated air sampling device.
[0051] Sample preparation components 34 can be configured to
prepare the sample received from port 32 for analysis by analysis
components 28. As exemplarily depicted, sample preparation
components 34 can be coupled to analysis components 28. According
to alternative embodiments, analysis components 28 can be directly
coupled to port 32. For example, analysis component 28 can be
configured to receive the sample from the batch inlets, direct
probe inlets, SPME, and/or capillary membrane inlets described
above. In accordance with the exemplarily depicted embodiments of
FIG. 4, sample preparation component 34 can be configured to
separate the sample through, for example, chromatography. For
example, component 34 can be configured as a gas chromatography
apparatus. In exemplary embodiments, the gas chromatography
apparatus can include capillary columns and in other embodiments
the apparatus can be configured to perform fast gas
chromatography.
[0052] As exemplarily depicted in FIG. 4, sample inlet component 16
can include consumables generator 36. In exemplary embodiments,
consumables generator 36 can be configured to generate consumables
for use during the operation of instrument 10. For example, where
sample preparation component 34 is configured to process the sample
by gas chromatography, consumables generator 36 can be configured
to provide carrier gas to the gas chromatograph. In exemplary
embodiments, generator 36 is configured as a nitrogen generator and
nitrogen is utilized as a carrier gas during the gas chromatography
performed by sample preparation component 34. Generator 36 can also
include a helium generator, and/or in exemplary embodiments,
generator 36 can include an air purifier. Nitrogen, helium, and air
exemplary of compositions that may be combined with samples to
facilitate analysis, such as carrier gases. Generator 36 can also
include a tank and/or reservoir of the composition, such as
nitrogen, helium, and/or air. Exemplary aspects also include
generator 36 configured to provide consumables to port 32. For
example, in the case where port 32 is configured to be flushed
either before or after the sample is received, generator 36 can be
configured to provide flushing gases to port 32. In exemplary
embodiments, high vacuum pumps such as turbo pumps can be
configured at the diaphragm head of a rough pump. In exemplary
embodiments, generator 36 can be used external to instrument 10.
Exemplary aspects also include providing consumables from outside
instrument 10, such as configuring instrument 10 to be coupled to a
tank of consumable carrier gas.
[0053] Referring to FIG. 5, analysis components 28 are depicted
that include analysis chamber 38 coupled to vacuum component 40.
Analysis chamber 38 can be coupled to sample inlet components 16 to
facilitate the progression of sample from sample introduction port
32 (FIG. 4). Analysis chamber 38 is typically maintained under
sufficient vacuum to facilitate mass spectrometry analysis.
Analysis chamber 38 can be constructed of aluminum or stainless
steel, but other materials sufficient to maintain vacuum will be
appropriate. Vacuum component 40 is configured to provide
sufficient vacuum within analysis chamber 38 to facilitate mass
spectrometry analysis. Exemplary vacuum components 40 include
getter pumps, piston pumps, and/or turbo pumps. In exemplary
embodiments, rugged pumps capable of providing sufficient vacuum
can be utilized. In exemplary embodiments, vacuum component 40 can
include both a high vacuum pump and a rough pump. In exemplary
implementations, the rough pump and high vacuum pump can be
configured to share common components such as circuitry and/or
power supply. Components 28 include those described in
International Patent Application No. PCT/US04/01144, filed Jan. 16,
2004, entitled Mass Spectrometer Assemblies, Mass Spectrometry
Vacuum Chamber Lid Assemblies, and Mass Spectrometer Operational
Methods, the entirety of which is incorporated by reference
herein.
[0054] At least portions of mass analysis components 42 can be
within analysis chamber 38. In exemplary embodiments, analysis
components 42 can be configured to be modular, thereby facilitating
sufficient maintenance and/or removal and replacement. Mass
analysis components 42 can include one or more of components 18,
20, and/or 22 described herein. An exemplary chamber 38, including
components 42 is described in International Patent Application No.
PCT/US04/01144 filed Jan. 16, 2004, entitled Mass Spectrometer
Assemblies, Mass Spectrometry Vacuum Chamber Lid Assemblies, and
Mass Spectrometer Operational Methods, the entirety of which is
incorporated by reference herein.
[0055] Referring to FIG. 6, an exemplary configuration of analysis
components 42 is depicted that includes an analyte modification
component 44 coupled to both sample inlet component 16 and detector
component 22. Analyte modification component 44 can be configured,
in exemplary embodiments, to receive the sample directly from port
32 (FIG. 4) or, in other exemplary embodiments, to receive the
sample from sample preparation component 34 (FIG. 4). Analyte
modification component 44 can be any component configured to modify
an analyte upon exposure of the analyte to the analyte modification
component. For example, analyte modification component 44 can be
configured as an ionization component to process/ionize the sample
according to one or more parameters to form ionized analytes, such
as component 18 described above. In this configuration, analyte
modification component parameters include ionization parameters
that can include parameters that affect one or more of the amount
of ionization, dissociation, and/or fragmentation of the sample
when exposed to analyte modification component 44. The formation of
ionized analytes from the sample can include the bombardment of the
sample with electrons, ions, molecules and/or photons. The
formation of ionized analytes within analyte modification component
44 can also be performed by thermal or electrical energy according
to the ionization parameter and its value.
[0056] Analyte modification component 44 may be configured as, for
example, an electron ionization component (EI, typically suitable
for gas phase ionization), a photo ionization component (PI), a
chemical ionization component, collisionally activated dissociation
component (CID), electrospray ionization (ESI), Flame Ionization,
and/or Atmospheric Pressure Chemical Ionization (APCI). Analyte
modification component 44 can be configured to operate with other
components. In exemplary embodiments, both an EI and CID may be
configured in line or parallel to receive and modify sample.
[0057] In reaction form, an exemplary analyte modification is
demonstrated by equation 1 below:
M+E.fwdarw.M+*+E'.fwdarw.M++F++N+E'' (1) wherein M represents the
neutral analyte, E represents the energy provided to M; M+*
represents an internally excited ion; E' represents any E not
deposited into M+* as internal or kinetic energy; M+, F+ and N
represent charged analyte, charged dissociation products, and
neutral dissociation products, respectively; and E'' represents any
E not remaining in M+, F+ or N as internal or kinetic energy. In
one embodiment, analyte modification component 44 can impact the
amount of dissociation of sample into these other molecules (F+ and
N).
[0058] Analyte modification component 44 can also include analyte
derivitisation components such as chemical derivitisation
components for use in combination with gas chromatography and or
liquid chromatography sample preparation components. Furthermore,
embodiments are contemplated that include analyte modification
component 44 configured as multiple components, such as both an
electron impact ionization source and a chemical ionization
source.
[0059] Other contemplated embodiments include acquiring a data set
with analyte modification component 44 configured in one
configuration and acquiring another data set with analyte
modification component 44 in another configuration. For example, a
data set can be acquired with analyte modification component 44
configured as an electron ionization component and another data set
can be acquired with analyte modification component 44 configured
as a chemical ionization component.
[0060] Samples modified in analyte modification component 44 can be
detected in detection component 22, for example. Exemplary
detection components include electron multipliers, Faraday cup
collectors, photographic, and scintillation-type detectors as
described above.
[0061] Referring next to FIG. 7, components 42 are shown that
include mass separator component 20 coupled to analyte modification
component 44 and detector component 22. Processing and control
components 24 can be coupled to components 42 as well as
modification, mass separator, and/or detector components 44, 20,
and/or 22 respectively. Mass separator component 20 can include one
or more of linear quadrupoles, triple quadrupoles, quadrupole ion
traps (Paul), cylindrical ion traps, linear ion traps, rectal
linear ion traps, ion cyclotron resonance, time-of-flight mass
spectrometers, ion mobility or other structures. Mass separator
component 20 can also include focusing lenses as well as tandem
mass separator components such as tandem ion traps or an ion trap
and quadrupole ion trap in tandem.
[0062] In one implementation, at least one of the multiple tandem
mass separator components can be an ion trap. Tandem mass separator
components can be placed in series or parallel. In an exemplary
implementation, tandem mass separator components can receive ions
from the same analyte modification component 34. In an exemplary
aspect, the tandem mass separator components may have the same or
different geometric parameters. The tandem mass separator
components may also receive analyte ions from the same or multiple
analyte modification components 44. In exemplary implementations,
mass separator component 20 can be configured to provide
multidimensional mass separation and/or analysis. When configured
for multidimensional mass analysis, the instrument can provide for
the analysis of mixtures without the aid of the sample preparation
component as described above, gas and/or liquid chromatography, for
example.
[0063] An exemplary mass separator component 20 useful in
accordance with one embodiment is a cylindrical ion trap (CIT).
CITs typically include three components: a trapping volume; and two
endcaps. Typically an AC current or RF voltage is applied to the
trapping volume at a predefined rate (e.g., controlled by 50) to
eject trapped analytes which are subsequently detected. RF voltage
ramps may include variables such as power and/or frequency.
Combinations of these variables in predefined amounts are typically
referred to as waveforms. Generally, waveforms can be optimized to
increase detection of specific analytes of interest. Waveforms can
also be optimized to allow for multiple stages of mass
analysis.
[0064] In an exemplary embodiment, mass separator component 20 can
be a cylindrical ion trap and the mass separator parameter of the
cylindrical ion trap can be a parameter that influences the
mass-to-charge ratio of ionized analytes received by detector
component 22. An exemplary cylindrical ion trap parameter value
that influences the mass-to-charge ratio of ionized analytes
received by detector component 22 is a mass-to-charge ratio range
that can be specified as waveform values.
[0065] Referring to FIG. 8, spectrometry components 42 are shown
configured having analyte modification component 46 coupled to mass
separator component 48 in addition to previously detailed
components 44, 20, and 22, for example. The configuration of
spectrometry component 42 in FIG. 8 is sometimes referred to as a
MS/MS or a tandem mass separator configuration.
[0066] As exemplarily depicted, analyte modification component 44
can be configured to receive the sample from sample inlet component
16 and provide, in one embodiment, an ionization energy to the
sample to form a group of ionized analytes. In an exemplary aspect,
analyte modification component 44 can be configured to provide
ionization energy to the sample to form a first group of ionized
analytes. Mass separator component 20 can be configured to receive
the first group of ionized analytes and provide a first separation
waveform to separate a first mass-to-charge ratio range of the
first group of ionized analytes. Analyte modification component 46
can be configured to receive the first range of ionized analytes
and provide a second analyte modification component parameter value
to the first range of ionized analytes to form a second group of
ionized analytes. Mass separator component 48 can be configured to
receive the second group of ionized analytes and provide a second
separation waveform to separate a second mass-to-charge ratio range
of the second group of ionized analytes. Detector component 22 can
be configured to detect the ionized analytes of the ranges received
from mass separator component 48.
[0067] Referring next to FIG. 9, spectrometry components 42 can be
configured, as shown, to include analyte modification component 50
coupled to mass separator component 52 in addition to components
44, 20, 46, 48, and 22 already detailed above. In an exemplary
embodiment, spectrometry components 42 are configured to perform
MS/MS/MS. As configured in FIG. 8, spectrometry components 42 can
add an additional level of spectrometry to spectrometry component
42 as configured in FIG. 7. All the components described above can
be controlled, monitored, and/or have data acquired from by
processing and control components 24. In exemplary embodiments,
all, or at least more than one of, the components described above
can be coupled to processing and control components 24.
[0068] Referring to FIG. 10, processing and control component 24 is
shown having user interface 54 coupled to structure 12 of
instrument 10 (FIG. 1). Processing and control component 24 can
also include processing circuitry 56 coupled to both user interface
54 and storage circuitry 58.
[0069] According to one embodiment, user interface 54 can be
coupled to structure 12 and provide user access to process
circuitry 56. User interface 54 can take the form of a touch screen
aligned with the exterior of structure 12 in exemplary embodiments,
and user interface 54 can be within the volume defined by structure
12 and access to user interface 54 can be had through access
panels, doors or openings in structure 12. In other embodiments,
user interface 54 can be a computer interface that is configured to
provide access to another process and control component, for
example a stand alone computer. In exemplary embodiments, the
computer interface can be a wireless interface and in other
embodiments, the computer interface can take the form of a TCP/IP
or a standard LAN connection. In exemplary embodiments, instrument
10 can be configured to accumulate and store sample data
unattended. In other embodiments, instrument 10 can be configured
to allow access to data and further provide for the manipulation of
the data acquired. According to another embodiment, instrument 10
can be configured to send data to a remote computer upon
acquisition.
[0070] In one embodiment, the progression of analysis from sample
inlet component 16 to analysis component 28 can be controlled
and/or monitored by processing circuitry 56 in the described
exemplary embodiment. Processing circuitry 56 may be implemented as
a processor or other structure configured to execute executable
instructions including, for example, software and/or firmware
instructions. Other exemplary embodiments of processing circuitry
56 include hardware logic, PGA, FPGA, ASIC, and/or other
structures. These examples of processing circuitry 56 are for
illustration and other configurations are possible.
[0071] Processing circuitry 56 can be configured to control the
values of analytical component parameters defined by the user of
instrument 10 and/or monitor the components described above.
Control of the analytical component parameter values by processing
circuitry 56 can include, for example, dictating a predefined
application of ionization energy by modification components 44, 46,
and/or 50, for example. Exemplary monitoring includes the recording
of data received from detector component 22. By varying analytical
component parameter values, sample characteristics and/or data can
be obtained. Exemplary sample characteristics and data can include
mass spectra.
[0072] In one aspect, processing circuitry 56 may execute data
acquisition and searching programming and be configured to perform
data acquisition and searching that includes the acquisition of
sample characteristics such as total ion current or mass spectra.
In another aspect, processing circuitry 56 can be configured to
associate detected sample characteristics such as total ion current
responsive to one or more analytical parameters such as an
ionization parameter including electron impact ion source
energy.
[0073] Processing circuitry 56 can be configured to store and
access data from storage circuitry 58. Storage circuitry 58 is
configured to store electronic data and/or programming such as
executable instructions (e.g., software and/or firmware), data, or
other digital information, and may include processor-usable media.
Processor-usable media includes any article of manufacture which
can contain, store or maintain programming, data and/or digital
information for use by or in connection with an instruction
execution system including processing circuitry, in the exemplary
embodiment. For example, exemplary processor-usable media may
include any one of physical media such as electronic, magnetic,
optical, electromagnetic, and infrared or semiconductor media. Some
more specific examples of processor-usable media include, but are
not limited to, a portable magnetic computer diskette, such as a
floppy diskette, zip disk, hard drive, random access memory, read
only memory, flash memory, cache memory, and/or other
configurations capable of storing programming, data, or other
digital information. Embodiments also include configurations where
processing and control components 24 can be configured to acquire
sample data and analyze acquired data unattended. For example,
sample inlet component 16 can be configured as an auto-sampler and,
in exemplary embodiments, air samples can be acquired at predefined
intervals as dictated by processing and control component 24.
Processing and control component 24 can be configured according to
predefined user parameters to acquire sample data. In other
embodiments, processing and control component 24 can be configured
to forward data and/or instrument status to remote locations via
wireless and/or wired communication.
[0074] Referring next to FIG. 11, mass spectrometry instrument 10
can be configured as shown that includes structure 12 defining a
volume within which components 14 reside. As exemplarily depicted,
components 14 include sample introduction port 32 above analysis
component 28 with sample preparation component 34, in this case, a
gas chromatography column, placed adjacent analysis component 28.
Analysis components 28 are configured to perform multidimensional
analysis, such as the MS/MS analysis as described above. Instrument
10 of FIG. 11 can also include processing and control components 24
proximate the exterior of instrument 10. In particular embodiments,
components 24 can be integrated into access panels (not shown) or
doors (not shown) of structure 12. As exemplarily depicted,
instrument 10 is configured to have user interface 54 located at
the lower front portion of structure 12. As depicted, interface 54
includes at least one gauge and valves to control sample inlet
components 32 and 34. As illustrated, instrument 10 has a width of
25.15 cm, a depth of 50.55 cm, and a height of 38.35 cm. As
exemplarily depicted in FIG. 11, structure 12 can define a space
encompassing instrument components 14 of less than or equal to
about 50,000 cm.sup.3.
[0075] Referring to FIGS. 12A-E, instrument 10 may be configured as
shown to include housing 12 according to an exemplary embodiment.
As depicted in FIG. 12A, housing 12 is configured as a frame having
a base or floor 60 with supports or sidewalls 62 extending
vertically therefrom and supporting a top 64. Top 64 can be
configured with access opening 66. Access opening 66 can be
configured to provide access to instrument components within the
space defined by housing 12, as described above. For example,
access opening 66 can provide access to processing circuitry 56.
Top 64 can also be coupled to processing and control components 24
and sample introduction port 32. As exemplarily depicted, analysis
chamber 38 and vacuum component 40 are encompassed by housing 12.
Instrument 10 of FIG. 12A can be configured with openings 68
fabricated into housing 12, for example. Openings 68, in exemplary
embodiments, can be configured to receive motorized fans that in
some embodiments can facilitate cooling of the space defined by
housing 12.
[0076] Referring to FIG. 12B, a top view of instrument 10 of FIGS.
12A-E is shown with instrument 10 configured with a cover 70 over
top 64. Cover 70 can include handles 72 that can facilitate the
portability of instrument 10, for example. As illustrated, the
depth of instrument 10 can be 45.3 cm. Referring to FIG. 10C., a
front view of instrument 10 of FIGS. 12A-E is shown with side panel
74 in place over the frame and access panels 76 in place in side
panels. As illustrated, the width of instrument 10 of FIG. 12A-E
can be 45.3 cm. According to exemplary embodiments, panels 76 can
be removed and/or replaced with vent covers. In an exemplary
aspect, when panels 76 are removed or replaced with vent covers
cooling of the spaced defined by housing 12 can be facilitated by
directing air intake from these vent covers through the space to
fans in openings 68 (FIG. 12A) for example. Referring to FIG. 12D,
a side view of instrument 10 of FIGS. 12A-E is shown with side
panel 74 in place over the frame. As illustrated, the height of
instrument 10 can be 48.8 cm. FIG. 12E is exemplary of a
perspective view of instrument 10 as exemplarily depicted in FIGS.
12A-E.
[0077] At least some of the embodiments of the description provide
instrumentation and assemblies as well as instrumentation isolation
components and systems including instrumentation operational
methods. Exemplary configurations of these assemblies and methods
are described with reference to FIGS. 13-19.
[0078] Referring first to FIG. 13, an exemplary embodiment of
instrument 10 is shown that includes housing 12 at least partially
encompassing analysis components 14. In the shown embodiment,
components 14 are isolated from housing 12 by an isolator 15. In
the shown embodiment, housing 12 at least partially encompasses
isolator 15. Isolator 15 isolates components 14 from at least some
inputs experienced by housing 12, in one embodiment. Inputs
experienced by housing 12 can include inputs from the surrounding
environment of instrument 10. Exemplary inputs include those of
shock, vibration, electrical, and/or thermal inputs. An exemplary
isolator 15 includes a shock-mount system. Such an isolator 15 can
include a plurality of shock-mounts or a singular shock-mount.
Exemplary isolators can include wire rope isolators. While depicted
in FIG. 13 as a single isolator, isolator 15 can include a
plurality of isolators and, in other embodiments these isolators
can be placed at desired locations isolating components 14 from
housing 12. In exemplary embodiments, the entirety of instrument 10
may be isolated by isolating the instrument from its environment
through the use of isolators between it and, in exemplary
implementations, a base, platform, and/or floor, while at the same
time isolating all or a portion of components 14 from housing
12.
[0079] Exemplary components 14 include those described above (FIG.
2), such as components 18, 20, and/or 22, in analysis chamber 38
being coupled to a vacuum component 40. To achieve the vacuum
within the analysis chamber single or multiple pumps can be
utilized as vacuum component 40. Exemplary pumps include those that
do not require any moving parts, such as ion pumps and getter
pumps. Components 14 can be configured as the mass spectrometer
described in U.S. Pat. No. 5,426,300, herein incorporated by
reference. According to some embodiments, ion and getter type pumps
cannot provide significant levels of pumping capacity for extended
periods of time especially when a high flow of carrier gas into the
apparatus is utilized. This can be the case when gas chromatography
is utilized as a sample introduction component, as a carrier gas is
utilized to transport the sample through the sample inlet and thus
requires some flow of gas into the mass spectrometer's vacuum
chamber. An exemplary pump having moving parts that may be utilized
is a turbomolecular pump, which can be fragile.
[0080] Referring next to FIG. 14, an exemplary embodiment of
instrument 10 is shown that includes a housing 12 at least
partially encompassing components 14. As exemplarily depicted in
FIG. 14, components 14 include mass analysis components 78 and 80
which may correspond to one or more of components 28 described
above. As depicted in FIG. 14, component 78 can be isolated from
received inputs (e.g., experienced by housing 12) by isolator 15
while at the same time component 80 is rigidly affixed to housing
12. In other arrangements all components of the instrument may be
isolated using one or more of isolator 15. Isolator 15 can include
shock-mounts. Shock-mounts can be chosen based on the highest shock
anticipated, the level of shock that can be transferred to the
instrument after shock distribution, the weight of the instrument,
and/or the amount of travel space available within the space
defined by housing 12. Component 78 that is isolated from housing
12 by isolator 15 can include vacuum component 40, such as the
turbomolecular pump. Component 78 can also include fragile
components of analysis components 14. Component 80 can include
those components more rugged and able to be affixed to housing 12
that are not as susceptible to shock and/or environmental inputs
received by housing 12. Isolator 15 can also include a shock-mount
and/or component isolation assembly. Component 18 can be flexibly
coupled to component 78, for example, via flexible tubing and/or
configuring the components within instrument 10 to allow for
sufficient space for motion between the components.
[0081] Referring to FIG. 15, an embodiment of instrument 10 is
shown that includes housing 12 supporting a component isolation
assembly 82 that is isolated from housing 12 by isolators 15.
Component isolation assembly 82 can include a component isolation
assembly base 84 as well as component isolation assembly sidewalls
86. Sidewalls 86 can extend vertically upward from base 84 and
provide for attachment of isolators 15 to sidewalls 86. In the
shown embodiment, component 78 can include an analyzer manifold 88
described in detail in PCT Application Serial No. PCT/US04/01144,
filed Jan. 16, 2004, entitled Mass Spectrometer Assemblies, Mass
Spectrometry Vacuum Chamber Lid Assemblies, and Mass Spectrometer
Operational Methods, the entirety which is herein incorporated by
reference. Analyzer manifold 88 can be connected to electronic
components via wiring in an exemplary embodiment. Analyzer manifold
can be coupled with vacuum component 40. In the exemplarily
depicted embodiment, analyzer manifold 88 can be coupled to
sidewalls 86 with component 40 extending through an opening 90 in
base 84 of component isolation assembly 82. Component 40 can be in
fluid connection via flexible tubing, in an exemplary embodiment,
to a backing pump or rough pump (not shown).
[0082] Referring next to FIG. 16, an embodiment of instrument 10 is
shown that includes an embodiment of component isolation assembly
82. According to an embodiment, component isolation assembly 82 can
include a component isolation assembly base 84 that supports
sidewalls 86 and an additional vacuum component 40A, such as a
backing pump. Component isolation assembly 82 can be rigidly
affixed to components 78. As exemplarily depicted in FIG. 16
component isolation assembly 82 is rigidly affixed to analyzer
manifold 88 and additional vacuum component 40A. In this
configuration component 40 can be coupled with component 40A. As
exemplary depicted in FIG. 16, component isolation assembly 82 can
be isolated from housing 12 by at least four isolators 15 shown
coupled to assembly base 84 proximate the bases corners and at
least one additional isolator (not shown) coupled to about the
center of base 84. In exemplary embodiments these additional
isolators can be coupled to base 84 below component 40A.
[0083] Referring next to FIG. 17, an embodiment of instrument 10 is
shown that includes instrument housing 12 supporting isolators 15
that isolate an embodiment of component isolation assembly 82 from
housing 12. Component isolation assembly 82 includes a base 84 and
sidewalls 86 that can be rigidly affixed to and/or support
components 78. In the exemplarily depicted embodiment, component
isolation assembly 82 is rigidly affixed to and/or supports
analyzer manifold 88, component 40A, and circuitry 56. As
exemplarily depicted, circuitry 56 can be coupled to analyzer
manifold 88 via cables, for example. While the depicted embodiments
demonstrate the isolation of analysis components that include the
analyzer manifold 88, components 40 and 40A, as well as circuitry
56, any combination of components 14 can be isolated according to
the systems and methods described herein. For example, any and all
the components described above may be mounted as described, to the
exclusion of other components that may be rigidly affixed to
housing 12. Further, components 78 may be individually isolated
with each desired component having affixed thereto its own isolator
15.
[0084] Referring next to FIG. 18, an exemplary embodiment of
instrument 10 is shown that includes housing 12 at least partially
encompassing a component isolation assembly 82. Housing 12 can
include a base 60, supporting frame structure 62 extending upward,
with a top or lid 64. In the shown embodiment of FIG. 18, top 64
can include handles 72. Component isolation assembly 82 can include
a component isolation assembly base 84 and component isolation
assembly sidewalls 86. Component isolation assembly base 84 can
also include an opening 90. In exemplary embodiments, opening 90
can be configured to receive components 78 (not shown). Component
isolation assembly 82 can be isolated from housing 12 by isolators
15. In the exemplarily depicted embodiment, isolators 15 can be
placed along base 84 and along sidewalls 86. Isolators 15 can be
affixed to housing 12 at points, for example, on frame 62 and base
60 of housing 12.
[0085] Referring next to FIG. 19, an embodiment of instrument 10 is
shown with components 78 affixed to component isolation assembly.
As described above, components 78 can include analyzer manifold 88
and vacuum component 40. In the shown exemplary embodiment of FIG.
19, circuitry 56 can be rigidly affixed to housing 12 while
analyzer manifold 88 can be rigidly affixed to component isolation
assembly 82 with vacuum component 40 extending through opening 90
of base 84. Exemplary circuitry 56 that can be rigidly affixed to
housing 12 includes the RF circuitry of instrument 10.
* * * * *