U.S. patent application number 11/378217 was filed with the patent office on 2007-09-20 for apparatuses and methods for repairing defects in a circuit.
This patent application is currently assigned to Lexmark International, Inc.. Invention is credited to Frank Edward Anderson, Elios Klemo, Bryan Dale McKinley, George Nelson Woolcott.
Application Number | 20070216419 11/378217 |
Document ID | / |
Family ID | 38517141 |
Filed Date | 2007-09-20 |
United States Patent
Application |
20070216419 |
Kind Code |
A1 |
Anderson; Frank Edward ; et
al. |
September 20, 2007 |
APPARATUSES AND METHODS FOR REPAIRING DEFECTS IN A CIRCUIT
Abstract
Methods and apparatuses to repair defects in a circuit, such as
during or subsequent to the manufacture of the circuit. Defects may
be detected through, for example, optical processing of an acquired
image of the circuit or by measuring the strength of a signal
emitted across a pair of conductor plates. If defects are detected,
conductive particles may be applied to the circuit to correct the
detected defects.
Inventors: |
Anderson; Frank Edward;
(Sadieville, KY) ; Klemo; Elios; (Lexington,
KY) ; McKinley; Bryan Dale; (Lexington, KY) ;
Woolcott; George Nelson; (Lancaster, KY) |
Correspondence
Address: |
LEXMARK INTERNATIONAL, INC.;INTELLECTUAL PROPERTY LAW DEPARTMENT
740 WEST NEW CIRCLE ROAD
BLDG. 082-1
LEXINGTON
KY
40550-0999
US
|
Assignee: |
Lexmark International, Inc.
|
Family ID: |
38517141 |
Appl. No.: |
11/378217 |
Filed: |
March 17, 2006 |
Current U.S.
Class: |
324/522 |
Current CPC
Class: |
H05K 2203/013 20130101;
H05K 3/225 20130101; H05K 1/0268 20130101; H05K 2203/162 20130101;
H05K 1/0269 20130101 |
Class at
Publication: |
324/522 |
International
Class: |
G01R 31/08 20060101
G01R031/08 |
Claims
1. A method for repairing defects in a circuit comprising:
detecting defects in a circuit, wherein the act of detecting
comprises emitting a signal across a first conductor plate,
receiving the signal by a second conductor plate, and measuring the
strength of the signal received by the second conductor plate; and
if a defect is detected, applying conductive particles to the
circuit to correct the detected defect, wherein the acts of
detecting and applying are performed using the same apparatus; and
wherein no contact is made with the circuit during the detection of
defects.
2. (canceled)
3. The method of claim 1, wherein detecting defects further
comprises: acquiring an image of the circuit; and optically
processing the image to generate an input signal.
4. (canceled)
5. The method of claim 1, wherein the emitted signal is a radio
frequency signal.
6. The method of claim 1, further comprising: emitting the signal
across a third conductor plate; receiving the signal by a fourth
conductor plate; measuring the strength of the signal received by
the fourth conductor plate; and detecting defects in the circuit
based on the measured signal strength.
7. The method of claim 1, wherein the first conductor plate and the
second conductor plate form a parallel plate capacitor.
8. The method of claim 7, wherein the capacitor is operable to be
passed over a circuit in one of a horizontal direction or a
vertical direction
9. The method of claim 1, further comprising: carrying the first
conductor plate and the second conductor plate over a circuit in
one of a horizontal direction or a vertical direction.
10. The method of claim 9, wherein a control unit directs the
movement of the first conductor plate and the second conductor
plate over the circuit.
11. The method of claim 1, wherein measuring comprises measuring a
voltage across the first conductor and the second conductor.
12. The method of claim 1, further comprising converting an analog
measurement to a digital signal.
13. The method of claim 1, wherein detecting comprises detecting
defects in a circuit during manufacture of the circuit.
14. The method of claim 13, wherein applying the conductive
particles occurs during the manufacture of the circuit.
15. The method of claim 13, wherein applying the conductive
particles occurs subsequent to the manufacture of the circuit.
16. The method of claim 1, wherein detecting comprises detecting a
defect having a width of approximately one micrometer situated in a
substrate having a thickness of approximately two micrometers.
17. The method of claim 1, further comprising taking a control
action if a defect is detected.
18. An apparatus for repairing defects in a circuit, comprising: a
carrier; a detector at least partially carried by the carrier and
configured to detect a defect in a circuit by measuring a strength
measurement of a signal passed through a circuit; and a printing
device carried by the carrier and configured to apply conductive
particles to the circuit to correct the detected defect; and
wherein the detector and the printing device do not make contact
with the circuit.
19. (canceled)
20. The apparatus of claim 18, further comprising a control unit in
communication with the detector, the control unit including program
logic operable to detect defects in the circuit based on the
received strength measurement and, if a defect is detected, to
correct the defect by controlling the printing device.
21. A method for repairing defects in a circuit comprising:
detecting defects in a circuit; and if a defect is detected,
applying conductive particles to the circuit to correct the
detected defect, wherein the acts of detecting and applying are
performed using the same apparatus; wherein no contact is made with
the circuit during the detection of defects; and wherein detecting
of the defect cannot be done visually or optically.
Description
FIELD OF THE INVENTION
[0001] The present invention is directed to apparatuses and methods
for repairing defects in a circuit, and, more particularly, in one
embodiment, to apparatuses and methods for repairing defects in a
circuit without requiring contact with the circuit.
BACKGROUND OF THE INVENTION
[0002] A circuit, such as a circuit board, typically includes
patterns of conductive material attached to a non-conductive
carrier (e.g., a board or other substrate). For example, conductive
wires and other circuit elements may be attached to a
non-conductive board or substrate. In order for the circuit to
function properly, there should be no defects in the conductive
material that might interrupt the planned flow of electricity in
the circuit. Therefore, it may be necessary to test the conductive
material for defects. Typically, if a defect exist, there will be
an unusually high resistance in a conductor.
[0003] Several methods exist in the prior art for testing circuit
boards for defects. One such method involves the use of a flying
probe tester that brings test probes into contact with the end
points of each conductor and measures the resistance of the path.
This method has the disadvantage of being very slow and
mechanically difficult to manage because all conductor paths must
be tested individually by contacting the circuit board with test
probes.
[0004] Similar to a flying probe tester, a bed of nails tester
makes contact with a circuit board in order to locate defects. In
this type of tester, a testing instrument having many compressible
contact points or nails is placed into contact with a circuit
board. Each of the contact points are input into a multiplexer
which cycles the testing instrument through all combinations of
nails that should span a common conductor. In this manner, the
integrity of the conductors is verified. A bed of nails tester,
however requires an expensive custom fixture designed for a
particular circuit board and is typically utilized only with
circuit boards undergoing mass production.
[0005] Another method for detecting circuit defects is the
performance of an optical inspection of the exposed conductors.
Images are acquired of the circuit board and processed to locate
faults. This method is not very accurate because only defects large
enough to be captured by the camera will be detected. Therefore,
many conductors may have faults that will go undetected because
they do not show a visible feature. An X-Ray machine may also be
used to locate conductor defects. This method may be capable of
revealing internal conductor faults, but it requires complicated
machinery and a knowledgeable operator. Detecting faults in this
manner, therefore, can be very expensive due to equipment cost and
the skill intensive requirements of an operator.
[0006] All of the methods described above are designed to be
performed following the construction of a circuit board. In these
traditional tests, detection cannot be performed until the circuit
board has finished undergoing an etching chemical process to remove
unwanted conductor material. An alternative method for constructing
a circuit involves a process in which conductors are applied to the
substrate instead of conductive material being removed from a
previously uniform covering.
[0007] Accordingly, there is a need for an improved method of
repairing circuit defects that can be conducted concurrently with
the assembly of the circuit board without making contact with the
circuit.
SUMMARY OF THE INVENTION
[0008] According to one embodiment of the invention, there is
disclosed a method for repairing defects in a circuit. The method
includes detecting a defect in a circuit. If a defect is detected,
conductive particles are applied to the circuit to correct the
detected defect. The acts of detecting and applying are performed
using the same apparatus.
[0009] According to a further exemplary embodiment, the act of
detecting defects includes emitting a signal across a first
conductor plate, receiving the signal by a second conductor plate,
and measuring the strength of the signal received by the second
conductor plate. The measured signal strength can be examined in
order to, for example, detect defects in the circuit.
Alternatively, defects may be detected by acquiring an image of the
circuit and optically processing the image in order to locate
defects.
[0010] According to another embodiment of the inventions, there is
disclosed an apparatus for repairing defects in a circuit. The
apparatus includes a detector configured to detect a defect in a
circuit and a printing device, such as an inkjet print head,
configured to apply conductive particles to the circuit. In some
embodiments, defects in the circuit are detected without making
contact with the circuit.
[0011] Other embodiments, objects, features and advantages of the
present inventions will become apparent to those skilled in the art
from the detailed description, the accompanying drawings and the
appended claims.
BRIEF DESCRIPTION OF THE DRAWINGS
[0012] Having thus described the invention in general terms,
reference will now be made to the accompanying drawings, which are
not necessarily drawn to scale, and wherein:
[0013] FIG. 1 is a schematic diagram of an apparatus for repairing
defects in a circuit, according to an illustrative embodiment of
the present invention.
[0014] FIG. 2 is a block diagram of a control unit used in an
apparatus for repairing defects in a circuit, according to an
illustrative embodiment of the present invention.
[0015] FIG. 3 is an exemplary flowchart of the control logic used
by the control unit, according to an embodiment of the present
invention.
[0016] FIG. 4 is a graph depicting an example of data analyzed by
the control unit, according to an embodiment of the present
invention.
[0017] FIG. 5 is an example of a circuit demonstrating a voltage
drop across a conductor fault, according to an embodiment of the
present invention.
DETAILED DESCRIPTION OF EXEMPLARY EMBODIMENTS OF THE INVENTIONS
[0018] The present inventions now will be described more fully
hereinafter with reference to the accompanying drawings, in which
some, but not all embodiments of the inventions are shown. Indeed,
these inventions may be embodied in many different forms and should
not be construed as limited to the embodiments set forth herein;
rather, these embodiments are provided so that this disclosure will
satisfy applicable legal requirements. Like numbers refer to like
elements throughout.
[0019] The present inventions are described below with reference to
block diagrams of systems, methods, apparatuses and computer
program products according to an exemplary embodiment. It will be
understood that each block of the block diagrams, and combinations
of blocks in the block diagrams, respectively, can be implemented
by computer program instructions. These computer program
instructions may be loaded onto a general purpose computer, special
purpose computer, or other programmable data processing apparatus
to produce a machine, such that the instructions which execute on
the computer or other programmable data processing apparatus create
means for implementing the functionality of each block of the block
diagrams, or combinations of blocks in the block diagrams discussed
in detail in the descriptions below.
[0020] These computer program instructions may also be stored in a
computer-readable memory that can direct a computer or other
programmable data processing apparatus to function in a particular
manner, such that the instructions stored in the computer-readable
memory produce an article of manufacture including instruction
means that implement the function specified in the block or blocks.
The computer program instructions may also be loaded onto a
computer or other programmable data processing apparatus to cause a
series of operational steps to be performed on the computer or
other programmable apparatus to produce a computer implemented
process such that the instructions that execute on the computer or
other programmable apparatus provide steps for implementing the
functions specified in the block or blocks.
[0021] Accordingly, blocks of the block diagrams support
combinations of means for performing the specified functions,
combinations of steps for performing the specified functions and
program instruction means for performing the specified functions.
It will also be understood that each block of the block diagrams,
and combinations of blocks in the block diagrams, can be
implemented by special purpose hardware-based computer systems that
perform the specified functions or steps, or combinations of
special purpose hardware and computer instructions.
[0022] The inventions may be implemented through an application
program running on an operating system of a computer. The
inventions also may be practiced with other computer system
configurations, including hand-held devices, multiprocessor
systems, microprocessor based or programmable consumer electronics,
mini-computers, mainframe computers, etc.
[0023] Application programs that can be components of the invention
may include routines, programs, components, data structures, etc.
that implement certain abstract data types, perform certain tasks,
actions, or tasks. In a distributed computing environment, the
application program (in whole or in part) may be located in local
memory, or in other storage. In addition, or in the alternative,
the application program (in whole or in part) may be located in
remote memory or in storage to allow for the practice of the
inventions where tasks are performed by remote processing devices
linked through a communications network. Exemplary embodiments of
the present inventions will hereinafter be described with reference
to the figures, in which like numerals indicate like elements
throughout the several drawings.
[0024] FIG. 1 is a schematic diagram of an apparatus for repairing
defects in a circuit, according to an illustrative embodiment of
the present invention. A detector, such as detection apparatus 100,
may include an RF source 105, an emitter pad 110, a horizontal scan
plate 115, a vertical scan plate 120, a control unit 125, a
vertical detection circuit 130, a horizontal detection circuit 135,
and two analog-to-digital converters 140, 145. Further, the emitter
pad 110 may include a horizontal emitter plate 150, a vertical
emitter plate 155, and a conductor shield 160. The emitter pad 110
emits a signal through at least one of the emitter plates 150, 155
that creates an electric field between at least one of the emitter
plates 150, 155 and at least one of the scan plates 115, 120. This
electric field is detected by at least one of the detection
circuits 130, 135 and passed to the control unit 125, where
conductor defects may be identified, as will be explained in
greater detail below.
[0025] According to one embodiment of the present invention, the RF
source 105 provides a signal to the emitter pad 110 that is used to
emit an electric field from the emitter pad 110. The RF source may
be a one hundred MHz radio frequency signal, but it is to be
understood that any signal capable of producing an electric field
between plates of a capacitor may be used in such an embodiment.
The emitter pad 110 may emit the signal through the horizontal
emitter plate 150 or the vertical emitter plate 155, depending on
whether the circuit will be scanned in the horizontal direction or
the vertical direction, as will be explained in greater detail
below.
[0026] At least one of the two scan plates 115, 120 may receive the
electric field emanating from one of the two emitter plates 150,
155. More particularly, the horizontal scan plate 115 may receive
the signal emitted through the horizontal emitter plate 150, and
the vertical scan plate 120 may receive the signal emitted through
the vertical emitter plate 155. All of the plates 115, 120, 150,
155 may be constructed out of conductive plates so that adjacent
plates function as a capacitor. More specifically, a capacitor may
be created by the horizontal emitter plate 150 being placed in
parallel with the horizontal scan plate 115. Similarly, a capacitor
may be created by the vertical emitter plate 155 being placed in
parallel with the vertical scan plate 120. It will be understood by
those skilled in the art that the plates 115, 120, 150, 155 can be
constructed out of any material such that a capacitor is created
out of plates placed next to one another in a parallel
arrangement.
[0027] Additionally, a conductor shield 160 may be formed along the
edge of the emitter pad 110 in such a manner as to separate the
emitter plates 150, 155 and the scan plates 115, 120. More
particularly, the conductor shield 160 may be formed between the
horizontal emitter plate 150 and the horizontal scan plate 115.
Similarly, the conductor shield 160 may be formed between the
vertical emitter plate 155 and the horizontal scan plate 120. The
conductor shield 160 may reduce the direct reception of a signal
emanating from the emitter pad 110 that is received by one of the
scan plates 115, 120. Furthermore, the conductor shield 160 may be
constructed from any insulator or dielectric material suitable for
use between the plates of a capacitor, as will be understood by
those of ordinary skill in the art. According to an exemplary
embodiment of the present invention, the emitter pad 110, the
horizontal scan plate 120, and the vertical scan plate 125 may be
passed over one or more conductors of a circuit in order to detect
defects in the conductors.
[0028] A motorized carrier (not shown), as will be understood by
those skilled in the art, can carry the emitter pad 110, horizontal
scan plate 120, and vertical scan plate 125 over the one or more
conductors. The motorized carrier may move in either a horizontal
or a vertical direction. It is to be understood, however, that the
motorized carrier may be moved in any direction over the conductors
of a circuit. Furthermore, the motorized carrier may be moved over
the conductors of a circuit without making contact with the
circuit. The movement of the motorized carrier may be controlled by
the control unit 125. According to yet another embodiment of the
present invention, the circuit pattern may be stored in the control
unit 125, as will be explained in greater detail below. With data
related to the conductor pattern of the circuit, the control unit
125 may control the movement of the motorized carrier over the
circuit so as to pass over all areas of the conductors on the
circuit. It will further be understood that the control unit 125
could direct the movement of additional motorized carriers
containing emitter pads and scan plates in order to scan multiple
areas of a circuit simultaneously.
[0029] The scan plates 115, 120 can be connected to detection
circuits 130, 135 capable of measuring the signal strength between
the scan plates 115, 120 and the emitter pad 110. More
particularly, the horizontal scan plate 115 might be connected to a
horizontal detection circuit 135, while the vertical scan plate is
connected to a vertical detection circuit 130. The horizontal
detection circuit 135 may measure the signal strength between the
horizontal emitter plate 150 and the horizontal scan plate 115.
Similarly, the vertical detection circuit 130 may measure the
signal strength between the vertical emitter plate 155 and the
vertical scan plate 120. As will be understood by those of skill in
the art, a potential difference or voltage will be generated
between the plates of a capacitor. Thus, when the emitter pad 110
is emitting a signal, a voltage may be generated between either the
horizontal emitter plate 150 and the horizontal scan plate 115 or
between the vertical emitter plate 155 and the vertical scan plate
120.
[0030] The horizontal detection circuit 135 may measure the voltage
generated between the horizontal emitter plate 150 and the
horizontal scan plate 115. The vertical detection circuit 130 may
measure the voltage between the vertical emitter plate 155 and the
vertical scan plate 120. Further, the detection circuits 130, 135
may have a logarithmic response, as will be understood by those
skilled in the art, which allows very small differences in
magnitude to be detected. Therefore, very small differences in
voltage may be detected by the detection circuits 130, 135.
[0031] The voltage measurements detected by the detection circuits
130, 135 may be converted to a digital signal by way of
analog-to-digital (A/D) converters 140, 145 and then sent to the
control unit 125 for processing. More particularly a voltage
measurement detected by the horizontal detection circuit 135 may be
passed through a horizontal A/D converter 145 and then passed to
the control unit 125. Likewise, a voltage measurement detected by
the vertical detection circuit 130 may be passed through a vertical
A/D converter 140 and then passed to the control unit 125.
[0032] The control unit 125 can control the movement of the
motorized carrier over the circuit and process data measurements
received from the A/D converters 140, 145 in order to detect
defects in the circuit. The control unit 125 may control the
movement of the motorized carrier through a movement connection
165, which is capable of carrying a signal from the control unit
124 to the motorized carrier. FIG. 2 is a block diagram of the
control unit 125, according to an illustrative embodiment of the
present invention. The control unit 125 can include a memory 205
that stores programmed logic 215 (e.g., software). The memory 205
might also include measurement data 220 utilized in the operation
of the present invention and an operating system 225. The
measurement data 220 may include the voltage measurements passed to
the control unit 125 from the A/D converters 140, 145.
[0033] A processor 227 can utilize the operating system 225 to
execute the programmed logic 215, and in doing so, also utilize the
measurement data 220. A data bus 230 provides communication between
the memory 205 and the processor 227. Users interface with the
control unit 125 via a user interface device(s) 235 such as a
keyboard, mouse, control panel, or any other devices capable of
communicating digital data to the control unit 125. The control
unit 125 is in communication with the emitter pad 110 and the A/D
converters 140, 145 and perhaps other external devices, via an I/O
Interface 240. In the illustrated embodiment, the control unit 125
is integrated into the repair apparatus, though it may be
co-located or even located remotely to the other components of the
apparatus. Further the control unit 125 and the programmed logic
215 implemented thereby may include software, hardware, firmware or
any combination thereof.
[0034] FIG. 3 is an exemplary flowchart of the control logic used
by the control unit 125, according to an embodiment of the present
invention. After the detection device is started up, the control
unit determines the direction in which a circuit will be scanned at
block 305. As mentioned earlier, a pattern of the circuit may be
stored in the memory 205 of the control unit 125. The control unit
125 may utilize this pattern to ensure that the motorized carrier,
emitter pad 110, and scan plates 115, 120 pass over all areas of
the circuit so that every conductor on the circuit may be tested
for defects.
[0035] After the scan direction has been determined, the control
unit 125 initiates a scan of the circuit at block 310. The RF
source 105 may begin sending a signal to be emitted by the emitter
pad 110. The signal is emitted throughout the scan as the motorized
carrier passes over all areas of the circuit. The detection
circuits 130, 135 continuously measure the voltage across the
conductors formed by the emitter plates 150, 155 and the scan
plates 115, 120, as explained above. These voltages are passed to
the A/D converters 140, 145, and digital measurement data is passed
from the A/D converters 140, 145 to the control unit 125. During
the scan, the control unit 125 continuously monitors the
measurement data passed to it, as indicated by block 315. The
measurement data may be, for example, actual measurements of the
voltage across the capacitors or an absolute value representative
of a change in the voltage across the capacitors.
[0036] At block 320, the control unit 125 determines whether the
measurement data indicates a defect along a conductor or a
conductor trace in the circuit. If no defect is present, the
control unit 125 returns to its monitoring of received measurement
data 315. If however, a defect is detected, then the control unit
might take corrective action, as indicated by block 325.
[0037] According to an embodiment of the present invention, this
corrective action 325 may be any control action. Control actions
may include, but are not limited to transmitting a defect detection
message, shutting down the scan, or initiating a procedure to
repair the defective conductor. Repairing the defective conductor
may include jetting conductive particles onto the circuit to
eliminate the defect, such as by using a printing device such as an
inkjet print head. Additionally, any transmitting of defect
messages may be recorded in the memory 205 of the control system
125.
[0038] The voltage across a capacitor will be significantly higher
when a scanned conductor has no defects in it. When a conductor
defect is passed over, there will be a sudden drop in voltage due
to the greater resistance created by the defect in the conductor.
This greater resistance will disrupt the electric field between the
plates of a conductor leading to a lower voltage through the
conductor.
[0039] While monitoring received measurement data 320, the control
unit 125 may attempt to locate instances in which the voltage
measured across a capacitor drops suddenly and then recovers,
indicating a place in which the circuit conductor has a higher
resistance or impedance than average. The control unit 125 may
monitor the rate of change in measured voltage per distance
traveled along a trace of the conductor to determine whether or not
there is a defect in the conductor. In this manner, the control
unit 125 may locate defects in a circuit without making contact
with the circuit. It will also be understood by those skilled in
the art that defects could be detected by using an optical scanning
technique in which images of a circuit are processed in order to
locate defects.
[0040] A scan for defects may be conducted, for example, during the
manufacture of a circuit, or during a defect detection process
subsequent to manufacture. Additionally, as previously referenced,
a defect may be repaired by jetting conductive particles or
conductive ink on a circuit to generate a conductive circuit trace
that is substantially free of defects. A printing device, such as
an inkjet print head (not shown), may be utilized to deposit
droplets of conductive ink onto the circuit to create a conductive
pathway as described in U.S. patent application Ser. No.
11,305,828, filed on Dec. 16, 2005 (Attorney Docket No.
2004-0958.3), which is assigned to the assignee of the present
invention, the entire contents of which are incorporated herein by
reference.
[0041] The inkjet print head may be controlled by the control unit
125 or by a separate controller that receives a detect detection
signal from the control unit. By combining defect detection means
with an inkjet print head capable of depositing conductive
particles on a circuit, defects may be detected and automatically
repaired during the manufacture of the circuit. In an exemplary
embodiment, the inkjet printhead can be carried by the same carrier
as that used with the emitter pad 110, horizontal scan plate 120,
and/or vertical scan plate 125. Further, although the repairing of
a circuit is described herein with respect to the capacitive
detection method described above, the repair may also be the result
of an optical detection of defects in the circuit. Similar to the
capacitive detection method, an illustrative embodiment of the
present invention might utilize the same carrier to carry both an
inkjet printhead and an optical emitter and/or sensor.
[0042] FIGS. 4-5 illustrate an example of the detection of a defect
in a circuit, according to an embodiment of the present invention.
FIG. 4 is a graph depicting a voltage 400 passed across a conductor
during the scan of a conductor that contains a defect. The measured
voltage 400 of FIG. 4 may represent an analog voltage detected by
one of the detection circuits 130, 135 or a digital voltage passed
to the control unit 125 from one of the A/D converters 140, 145.
The first area 405 of the graph depicts a relatively high voltage
passing across a conductor. There is a sudden drop or dip in the
voltage in the second area 410 of the graph followed by a return to
a relatively high voltage in the third area 415 of the graph. The
dip in voltage shown in the second area 410 indicates a defect in
the conductor being scanned. This drop in voltage will be
recognized by the control unit 125 and an appropriate corrective
action may be taken.
[0043] FIG. 5 is a simple circuit diagram demonstrating a voltage
drop across a conductor fault, according to an embodiment of the
present invention. FIG. 5 is representative of the defect
graphically depicted in FIG. 4. The circuit in FIG. 5 is included
only to aid in understanding the operation of the present
invention, and it illustrates measurements that may be taken and
analyzed as a circuit diagram 505. As illustrated in FIG. 5, a
voltage source 505 emits a signal through three capacitors 510,
515, 520 and then through a resistor 525. The three capacitors 510,
515, 520 are representative of the three areas 405, 410, 415 of the
graph in FIG. 4.
[0044] More particularly, the first capacitor 510 corresponds to
the first area 405 in which there is no defect in a conductor; the
second capacitor 515 corresponds to the second area 410 in which
there is a defect in a conductor; and the third capacitor 520
corresponds to the third area 415 in which there is no defect in a
conductor. A switch 535 may be closed allowing current in the
circuit 500 to bypass the second capacitor 515. With the switch 535
closed, the current in the circuit 500 flows through the first
capacitor 510, the third capacitor 520, and the resistor 525 only.
If the voltage of the circuit 500 is measured at an output pin 530,
it will be significantly higher than a voltage measurement if the
switch 535 were open, indicating a good conductor. If the switch
535 were opened, however, the current in the circuit 500 would flow
through all three capacitors 510, 515, 520 and the resistor. If the
voltage of the circuit 500 is measured at an output pin 530, it
will be significantly lower than the prior measurement, indicating
a defect in the conductor. Because of the added resistance created
by the defect, capacitance of the second capacitor 515 will be
greater than the other two capacitors 510, 520, which leads to a
lower voltage being passed across the capacitor. Therefore, at the
output pin 530, the potential of the circuit 500 will be lower,
leading to a lower voltage reading which is representative of the
defect in the conductor.
[0045] Many modifications and other embodiments of the inventions
set forth herein will come to mind to one skilled in the art to
which these inventions pertain having the benefit of the teachings
presented in the foregoing descriptions and the associated
drawings. Therefore, it is to be understood that the inventions are
not to be limited to the specific embodiments disclosed and that
modifications and other embodiments are intended to be included
within the scope of the appended claims. Although specific terms
are employed herein, they are used in a generic and descriptive
sense only and not for purposes of limitation.
* * * * *