U.S. patent application number 11/731255 was filed with the patent office on 2007-08-23 for germanium-silicon-carbide floating gates in memories.
This patent application is currently assigned to Micron Technology, Inc.. Invention is credited to Kie Y. Ahn, Leonard Forbes.
Application Number | 20070195608 11/731255 |
Document ID | / |
Family ID | 36911770 |
Filed Date | 2007-08-23 |
United States Patent
Application |
20070195608 |
Kind Code |
A1 |
Forbes; Leonard ; et
al. |
August 23, 2007 |
Germanium-silicon-carbide floating gates in memories
Abstract
The use of a germanium carbide (GeC), or a germanium silicon
carbide (GeSiC) layer as a floating gate material to replace
heavily doped polysilicon (poly) in fabricating floating gates in
EEPROM and flash memory results in increased tunneling currents and
faster erase operations. Forming the floating gate includes
depositing germanium-silicon-carbide in various combinations to
obtain the desired tunneling current values at the operating
voltage of the memory device.
Inventors: |
Forbes; Leonard; (Corvallis,
OR) ; Ahn; Kie Y.; (Chappaqua, NY) |
Correspondence
Address: |
SCHWEGMAN, LUNDBERG, WOESSNER & KLUTH, P.A.
P.O. BOX 2938
MINNEAPOLIS
MN
55402
US
|
Assignee: |
Micron Technology, Inc.
|
Family ID: |
36911770 |
Appl. No.: |
11/731255 |
Filed: |
March 30, 2007 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
|
11063825 |
Feb 23, 2005 |
|
|
|
11731255 |
Mar 30, 2007 |
|
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Current U.S.
Class: |
365/185.28 ;
257/E21.209; 257/E29.129 |
Current CPC
Class: |
H01L 29/40114 20190801;
H01L 29/42324 20130101 |
Class at
Publication: |
365/185.28 |
International
Class: |
G11C 16/04 20060101
G11C016/04 |
Claims
1. A method of storing data in a memory device, comprising:
addressing selected ones of a plurality of memory cells with
selected ones of a plurality of word lines and a plurality of bit
lines; increasing a voltage applied to a control gate on the
selected memory cells, the memory cells each including a substrate,
a source region, a drain region and a floating gate disposed
beneath the control gate and separated therefrom by an inter-gate
insulator layer, the floating gate comprising a conductive film
including a mixture of germanium, silicon and carbon; trapping
electrons on the floating gate in response to a positive voltage
having at least a first voltage level being applied to the control
gate for at least a first time period, changing the memory cell to
a first memory state; and ejecting electrons from the floating gate
in response to a negative voltage having at least a second voltage
level being applied to the control gate for at least a second time
period, changing the memory cell to a second memory state.
2. The method of storing data in a memory device of claim 1,
wherein further the floating gate comprises a mixture having a
lower electron affinity than a doped polycrystalline silicon
floating gate.
3. The method of storing data in a memory device of claim 1,
wherein the floating gate composition is selected to obtain a
desired tunneling current value for ejecting electrons from the
floating gate during the second time period when the negative
second voltage level is applied to the control gate.
4. The method of storing data in a memory device of claim 1,
wherein the memory device is controlled as a flash memory.
5. The method of storing data in a memory device of claim 1,
wherein the floating gate has a structure that is one of
micro-crystalline and amorphous.
6. The method of storing data in a memory device of claim 1,
further comprising a programming voltage signal of approximately 12
volts on the control gate for the first time period, a voltage
level of approximately 6 volts on the drain region for at least the
first time period, a voltage level of a ground on the source region
for at least the first time period, and electrons from the
substrate trapped on the gate electrode.
7. The method of storing data in a memory device of claim 1,
further comprising an erase signal of approximately negative 12
volts on the control gate for the second time period, a voltage
level of ground on the source region for at least the second time
period, and electrons ejected from the gate electrode to the
substrate.
8. A method of storing data in a memory device having a source
region and a drain region separated by a channel region in a
substrate, a gate insulator adjacent to the channel region, a
floating gate on the gate insulator comprising a conductive film
including germanium, silicon and carbon, an inter-gate insulator on
the floating gate, a control gate on the inter-gate insulator,
comprising: trapping electrons on the floating gate in response to
a positive voltage having a first voltage level applied to the
control gate for a first time period, changing the memory cell to a
first memory state; and ejecting electrons from the floating gate
in response to a negative voltage having a second voltage level
applied to the control gate for a second time period, changing the
memory cell to a second memory state.
9. The method of storing data in a memory device of claim 8,
wherein trapping electrons on the floating gate includes selecting
proportions of germanium, silicon and carbon to obtain a material
having a lower electron affinity than a polycrystalline silicon
floating gate.
10. The method of storing data in a memory device of claim 9,
wherein trapping electrons on the floating gate includes selecting
proportions of germanium, silicon and carbon to obtain a desired
tunneling current value for ejecting electrons from the floating
gate.
11. The method of storing data in a memory device of claim 8,
wherein storing data further includes a programming voltage signal
of 12 volts on the control gate, a voltage level of 6 volts on the
drain region, a voltage level of a reference voltage on the source
region, resulting in electrons from the substrate becoming trapped
on the floating gate.
12. The method of storing data in a memory device of claim 11,
wherein storing data further includes maintaining each of the
programming voltage signal, the drain voltage level and the source
reference voltage level, for at least a desired first time
period.
13. The method of storing data in a memory device of claim 11,
wherein storing data further includes setting the reference voltage
level to a ground voltage level.
14. The method of storing data in a memory device of claim 8,
wherein storing data further includes an erase voltage signal of
negative 12 volts on the control gate, a voltage level of a
reference voltage on the source region, resulting in electrons
trapped on the floating gate being ejected to one of the substrate
and the drain region.
15. The method of storing data in a memory device of claim 11,
wherein storing data further includes maintaining each of the erase
voltage signal and the source reference voltage level, for at least
a desired second time period.
16. The method of storing data in a memory device of claim 8,
wherein trapping electrons on the floating gate further includes a
percentage of germanium about 96%, a percentage of silicon about
0%, and a percentage of carbon about 4%, forming germanium carbide
having a band gap of approximately 1.1 eV.
17. The method of storing data in a memory device of claim 8,
wherein trapping electrons on the floating gate further includes a
percentage of germanium about 25%, a percentage of silicon about
25%, and a percentage of carbon about 50%, forming germanium
silicon carbide having a band gap of approximately 2.5 eV.
18. The method of storing data in a memory device of claim 8,
wherein trapping electrons on the floating gate further includes
selecting a percentage of germanium, silicon and carbon to form a
germanium-silicon carbide having a band gap greater than 1.1 eV and
an electron affinity less than 3.5 eV.
19. The method of storing data in a memory device of claim 8,
wherein trapping electrons on the floating gate further includes
the floating gate having no direct electrical connection to either
of the substrate and the control gate.
20. The method of storing data in a memory device of claim 8,
wherein trapping electrons on the floating gate further includes
the floating gate having at least enough electrical conductivity to
redistribute trapped electrons essentially evenly throughout the
film in a time period less than a minimum time period between one
of a program and an erase signal, and a next one of a program and
an erase signal.
21. The method of storing data in a memory device of claim 8,
wherein trapping electrons on the floating gate further includes a
percentage of germanium of zero, a percentage of silicon of 50%,
and a percentage of carbon of 50%, forming silicon carbide.
22. The method of storing data in a memory device of claim 8,
wherein trapping electrons on floating gate further includes a
percentage of germanium of 50%, a percentage of silicon of zero,
and a percentage of carbon of 50%, forming germanium carbide.
Description
[0001] This application is a divisional of U.S. application Ser.
No. 11/063,825 filed Feb. 23, 2005, which is incorporated herein by
reference in its entirety.
TECHNICAL FIELD
[0002] This application relates generally to semiconductor devices
and device fabrication and, more particularly, to transistor gate
materials and their properties, and in particular to floating gate
devices.
BACKGROUND
[0003] The electronic device industry uses many different types of
memory in computers and other electronic systems, such as
automobiles and traffic control systems. Different types of memory
have different access speeds and different cost per stored bit. For
example, items of memory that require rapid recovery may be stored
in fast static random access memory (RAM). Information that is
likely to be retrieved a very short time after storage may be
stored in less expensive dynamic random access memory (DRAM). Large
blocks of information may be stored in low cost, but slow access
media such as magnetic disk. Each type of memory has benefits and
drawbacks, for example DRAMs lose the stored information if the
power is shut off. While the magnetic memory can retain the stored
information when the power is off (known as non-volatile), the time
to retrieve the information is hundreds of times slower than
semiconductor memory such as RAM. One type of non-volatile
semiconductor memory device is electrically programmable read-only
memory (EPROM). There are also electrically-erasable programmable
read-only memory (EEPROM) devices. One type of EEPROM is erasable
in blocks of memory at one time, and is known as flash memory.
Flash memory is non-volatile like magnetic memory, is much faster
than magnetic memory like RAM, and is becoming widely used for
storing large amounts of data in computers. However, writing
information to a conventional flash memory takes a higher write
voltage than it does to write information to conventional RAM, and
the erase operation in flash requires a relatively long time
period.
[0004] Conventional EEPROM devices, such as flash memory, may
operate by either storing electrons on an electrically isolated
transistor gate, known as a floating gate, or not storing electrons
on the floating gate. Typically the write (or program) operation
and the erase operation are performed by another transistor gate,
known as the control gate, which is located above the floating
gate. A large positive voltage on the control gate will draw
electrons from the substrate through the gate oxide and trap them
on the floating gate. The erase operation uses a large negative
voltage to drive any stored electrons on the floating gate off of
the gate and back into the substrate, thus returning the floating
gate to a zero state. This operation may occur through various
mechanisms, such as Fowler-Nordheim (FN) tunneling. The rate at
which the electrons can be transported through the insulating gate
oxide to and from the floating gate is an exponential factor of
both the thickness of the insulator and of the electrical height of
the insulation barrier between the substrate and the floating gate.
Grown gate oxides have great height, and slow tunneling.
[0005] Electronic devices have a market driven need to reduce the
size and power consumption of the devices, such as by replacing
unreliable mechanical memory like magnetic disks, with transistor
memory like EEPROM and flash. These increasingly small and reliable
memories will likely be used in products such as personal computers
(PCs), personal digital assistants (PDAs), mobile telephones,
laptop PCs, and even in replacing the slow hard disk drives in full
sized computer systems. This is because a solid state device, such
as flash memory, is faster, more reliable and has lower power
consumption than a complex and delicate mechanical system such as a
high speed spinning magnetic disk. What is needed is an improvement
in the erase time for EEPROM devices. With improved erase times,
the high density of flash memory, and a speed of operation
comparable to DRAMs, flash memory might replace both magnetic
memory and DRAMs in certain future computer devices and
applications.
BRIEF DESCRIPTION OF THE DRAWINGS
[0006] FIG. 1 illustrates a transistor with a germanium silicon
carbide gate, according to embodiments of the present subject
matter;
[0007] FIG. 2 illustrates a non-volatile memory element with a
germanium silicon carbide gate, according to embodiments of the
present subject matter;
[0008] FIG. 3 is an energy band diagram for a polysilicon gate
transistor;
[0009] FIG. 4 is an energy band diagram for a silicon carbide gate
transistor, according to an embodiment;
[0010] FIG. 5 is a diagram showing bandgap versus electron affinity
according to an embodiment; and
[0011] FIG. 6 illustrates a diagram for an embodiment of an
electronic system having devices with a floating gate transistor
containing a mixture of germanium, silicon and carbon according to
an embodiment.
DETAILED DESCRIPTION
[0012] The following detailed description refers to the
accompanying drawings that show, by way of illustration, specific
aspects and embodiments in which the present invention may be
practiced. These embodiments are described in sufficient detail to
enable those skilled in the art to practice the present invention.
Other embodiments may be utilized and structural, logical, and
electrical changes may be made without departing from the scope of
the present invention. The various embodiments are not necessarily
mutually exclusive, as some embodiments can be combined with one or
more other embodiments to form new embodiments.
[0013] The terms wafer and substrate used in the following
description include any structure having an exposed surface with
which to form an integrated circuit (IC) structure. The term
substrate is understood to include semiconductor wafers. The term
substrate is also used to refer to semiconductor structures during
processing, and may include other layers that have been fabricated
thereupon. Both wafer and substrate include doped and undoped
semiconductors, epitaxial semiconductor layers supported by a base
semiconductor or insulator, as well as other semiconductor
structures well known to one skilled in the art. The term conductor
is understood to generally include n-type and p-type semiconductors
and the term insulator or dielectric is defined to include any
material that is less electrically conductive than the materials
referred to as conductors or as semiconductors.
[0014] The term "horizontal" used in this application is defined as
a plane parallel to the conventional plane or surface of a wafer or
substrate, regardless of the orientation of the wafer or substrate.
The term "vertical" refers to a direction perpendicular to the
horizontal as defined above. Prepositions, such as "on", "side" (as
in "sidewall"), "higher", "lower", "over" and "under" are defined
with respect to the conventional plane or surface being on the top
surface of the wafer or substrate, regardless of the orientation of
the wafer or substrate. The following detailed description is,
therefore, not to be taken in a limiting sense, and the scope of
the present invention is defined only by the appended claims, along
with the full scope of equivalents to which such claims are
entitled.
[0015] Field effect transistors (FETs) are used in many different
electronic devices, including memory devices. FETs are used both as
access transistors and as memory elements. The structure of a
typical FET 100 is shown in FIG. 1, where a lightly doped substrate
102 has a heavily oppositely doped source region 104 and drain
region 106. The portion of the substrate 102 located between the
source region 104 and the drain region 106 is known as the channel
region 108, and may have a doping level that is different from the
doping level of the substrate 102, and may even be counter doped to
have a doping type opposite of the substrate. The substrate may be
either lightly doped P type or N type, and the diffused source and
drain regions will be heavily doped with the opposite doping type.
There is a gate oxide 110 located over the channel region 108, and
making at least some contact with each of the source region 104 and
drain region 106. The gate oxide 110 is an insulator, such as
thermally grown silicon dioxide, and at normal operating voltages
prevents current flow from the substrate 102 to a conductive gate
electrode 112. Conductive gate electrode 112 is located on top of
the gate oxide 110, and also extends at least some distance over
each of the source region 104 and drain region 106. Conventional
gate electrodes are formed of doped polycrystalline silicon (poly
or polysilicon). Embodiments of the present subject matter form
gate electrode 112 with a germanium silicon carbide (GeSiC)
composition. In operation, when a signal is directed to the gate
112 over an electrical connection 120, the signal voltage affects
the concentration of electrical carriers in the channel region 108.
For example, if a positive voltage having a greater value than what
is known as the threshold voltage of the transistor 100 is applied
to gate 112, then the relatively small number of electrons
(negative carriers) in the P type substrate 102 will be attracted
to the channel region 108 in great enough numbers to overwhelm the
positive holes in the channel region, and thus temporarily convert
the channel region to be N type as long as the positive voltage is
applied to the gate 112. Thus a large enough positive voltage
(known as the threshold voltage) on the gate 112 will electrically
connect the source region 104 to the drain region 106 and turn on
the transistor 100. The threshold voltage depends upon the
thickness and dielectric constant of the gate insulator 110, the
doping level of the channel region 108, and the electron affinity
of the material forming the gate electrode 112. Thus, a gate
electrode made of a material such as GeSiC may have the threshold
voltage of the transistor adjusted to a desired level by changing
the electron affinity of the transistor, and may thus reduce the
number and size of ion implantation adjustments of the channel
doping level.
[0016] The illustrative floating gate transistor 200, as shown in
FIG. 2, may have a lightly doped substrate 202 with a heavily
oppositely doped source region 204 and drain region 206. For
example, the substrate 202 may be a lightly doped P type region,
and the source region 204 and drain region 206 would then be
heavily doped N+ type. The portion of the substrate 202 located
between the source region 204 and the drain region 206 is again
known as the channel region 208, and may have a doping level that
is different from the doping level of the substrate 202. There is a
gate oxide 210 located over the channel region 208, which is an
insulator such as thermally grown silicon dioxide. There is an
electrically floating conductive gate 212, located on top of the
gate oxide 210, which unlike the previously discussed transistor
100 of FIG. 1, has no direct connection to signal voltages, and is
typically called a floating gate since it is electrically floating.
Conventionally, floating gates are typically formed of doped
polysilicon. Embodiments of the present subject matter form
floating gate 212 with a germanium silicon carbide composition.
There is an inter-gate dielectric or insulator 214 which
electrically separates the floating gate 212 from a control gate
216, which is also typically made of polysilicon. In operation the
control gate is connected to signal voltage 220. The signal voltage
220 must be larger than the signal voltage 120 for the conventional
transistor since the control gate is further from the channel
region 208 and because the electrons in the channel region must be
at a high enough voltage to be injected through the gate oxide 210
to become trapped on floating gate 212. A given signal voltage
level will provide a current of electrons through the gate oxide
210 that depends exponentially upon the level of the signal
voltage, the thickness of the gate oxide 206 and the electrical
height of the barrier formed by the gate oxide 210 between the
energy levels of the substrate at the channel 208 and the energy
level of the floating gate 212. Changing the material of the
substrate 202 or of the floating gate 212 changes the electrical
height of the barrier formed by the gate oxide 210, and radically
changes the amount of current that tunnels through the gate oxide
206 by means of Fowler-Nordheim tunneling. Thus, changing the
tunneling barrier height results in erase operations that have
larger currents at a given erase voltage level, and therefore
result in faster erase times for memory devices. Another advantage
of lowering the tunneling barrier height is that lower erase
voltages may be used. Lower erase voltages mean lower electrical
fields for a given dielectric thickness, and therefore reduced
reliability issues such as time dependent dielectric breakdown of
the gate insulator and inter-gate insulator.
[0017] The reason that changing the material of the substrate or of
the floating gate changes the electrical height of the tunneling
barrier is best understood by examination of what is known as an
energy band diagram, as shown in FIG. 3 for the typical memory
transistor discussed in FIG. 2 and used in flash memory. As noted
above, the excellent quality of grown gate oxides results in a
large electrical height of the tunneling barrier formed by the
oxide. This high quality oxide results in lower programming
currents and lower erase currents and causes slower memory
operation. An issue with other gate insulators besides grown
oxides, such as chemical vapor deposited (CVD) oxides, silicon
nitride, aluminum oxide, tantalum oxide, and titanium oxides, is
that the results have proven unacceptable from a device electrical
performance point of view, including high levels of what are known
as surface states. If the surface states are reduced by growing a
thin oxide underneath the deposited oxide, then the interface
between the two insulators may have large numbers of what are known
as trap states, and may have band gap discontinuities and
differences in the conductivity of the insulator films. Thus,
changing the gate insulator to reduce the tunneling barrier height
and voltage may pose problems, particularly with maintaining
consistent time-dependent device electrical operation.
[0018] Another method of changing the tunneling voltage, and thus
equivalently increasing the tunneling current at a particular
voltage level, is to change the overall tunneling barrier height by
increasing the internal energy level of the conductors on either
side of the insulator, rather than by lowering the insulator
barrier level. Changing the silicon substrate to some other
material may cause numerous practical problems in the fabrication
of devices, since so much is known about the use of silicon.
Changing the material of the floating gate to a material with what
is known as a lower electron affinity, denoted by the lower case
Greek letter Chi (.chi.) results in higher tunneling currents. A
lower electron affinity reduces the effective height of the
insulator tunneling barrier, which as noted previously has an
exponential effect on the amount of tunneling current at a given
voltage.
[0019] A transistor built on a single crystal silicon substrate has
a band gap diagram 300, with a conduction level 302, a valence
level 304, and a Fermi level 306, as shown for a lightly doped P
type silicon substrate with reference to the vacuum level 308,
which represents the amount of energy it would take to remove an
electron from the silicon. On the opposite side of a gate oxide
309, heavily doped N type polycrystalline silicon will have a
conduction level 310, a Fermi level 312 and a valence level 314.
The gate oxide 309 has an energy level value 316, whose difference
from the vacuum level 308 represents the electron affinity .chi. of
the gate oxide, typically thermally grown silicon dioxide. For good
quality thermally grown silicon dioxide, the value of .chi. is 0.9
eV. For electrons on the floating gate conduction band 310, the
value of electron affinity .chi. is the difference between 310 and
the vacuum level 308, and for doped polysilicon is approximately
4.1 eV. Thus, the barrier that an electron tunneling from the
floating gate 212 conduction band 310 to the silicon substrate 202
in the area of the channel 208, must traverse during an erase
operation is the height represented by the difference between the
top of the gate oxide 316 and the conduction band 310, or 4.1 eV
minus 0.9 eV, or about 3.2 eV. As noted previously, the tunneling
rate is an exponential factor of the height of the barrier, and the
width of the oxide, which is controlled by the process parameter of
gate oxide thickness.
[0020] The distance between the conduction level 310 and the
valence level 314 is known as the band gap, and has a value in
silicon of approximately 1.1 eV. Since the value of electron
affinity for the gate oxide is not going to change, then the use of
a floating gate material that has a larger band gap would result in
a lower electron affinity, and thus a reduced tunneling barrier.
Changing the electron affinity of the gate material also changes
the threshold voltage of the transistor, and may be used in
conjunction with channel doping levels and gate insulator thickness
and dielectric constant to adjust the threshold voltage level.
[0021] FIG. 4 illustrates the band gap diagram 400 for an
embodiment of a silicon carbide gate material. There is still a
silicon substrate conduction level 402, a silicon substrate valence
level 404, and a Fermi level 406 with reference to the vacuum level
408. On the opposite side of the thermally grown silicon dioxide
gate oxide 409, the illustrative silicon carbide gate will have a
conduction level 410, a Fermi level 412 and a valence level 414,
all of which may be different from the values in the case of
polysilicon gates. The gate oxide 409 still has the same energy
value 416, and electron affinity .chi. of the gate oxide, typically
0.9 eV. The band gap for silicon carbide depends upon the ratio of
silicon to carbon, and varies from the silicon value of 1.1, as
noted above, to the pure carbon value of approximately 4.2 eV. For
a silicon carbide mixture, the value of the band gap is about 2.1
eV to 2.6 eV depending upon the percentage of carbon. Since the
conduction band is now closer to the vacuum level 408, the electron
affinity is lower, about 3.7 eV, and the height of the tunneling
barrier is now lower, typically below 2.8 eV, which is lower than
the tunneling barrier found in the case of polysilicon of about 3.2
eV. Thus, the tunneling barrier is lowered, and even a small
difference in tunneling barrier height causes a large change in
tunneling current. For germanium carbide, a very similar band
diagram shows a tunneling barrier that extends from a larger value
than that of polysilicon for a pure germanium gate of 3.6 eV, to a
barrier value that is the same as the polysilicon value of 3.2 eV
at a 4% carbon content, to lower values for increased carbon
content above the 4% level. The values for silicon, silicon carbide
and germanium carbide are discussed in more detail with respect to
FIG. 5 later in this disclosure. Increased tunneling current flow
at a given erase voltage value results in much faster erase
operations and improved EEPROM or flash memory operational
speeds.
[0022] Crystalline silicon carbide and silicon germanium carbide
can be epitaxially grown on a silicon substrate and may be used in
both metal oxide semiconductor field effect transistors (MOSFET) or
bipolar transistor devices, with the silicon substrate acting as a
seed layer for crystal growth. In an embodiment the silicon
carbide, germanium carbide and silicon germanium carbide are
microcrystalline or amorphous. Such microcrystalline layers or
amorphous layers may be grown on insulator layers such as silicon
dioxide gate insulator layers, or other insulator layers, by
chemical vapor deposition (CVD), laser assisted CVD, plasma CVD,
ultra-high vacuum CVD, or sputtering.
[0023] FIG. 5 is a graph 500 that illustrates the ability to adjust
the tunneling barrier height, and thus the tunneling barrier
current level, for various embodiments of mixtures of silicon 504,
germanium 506, and carbon in the form of diamond 508. The values of
germanium carbide of varying percentages of germanium are shown by
the line connecting 506 and 508, including the interesting point
510 where a 4% carbon value in germanium provides the same band gap
1.1 eV as pure silicon 504, but with a lower electron affinity
.chi. and thus improved tunneling currents and faster erase
operations without other significant electrical changes in the
transistor operation due to changes in the band gap value. Silicon
carbide values are projected on the line from 504 to 508, with
silicon carbide having a band gap with a 2.1 eV value shown at 512.
Various embodiments of the present disclosed methods and devices
can be found in the region of the graph between 510 and 512 and the
entire area between the lines representing germanium carbide and
silicon carbide compositions. An illustrative silicon germanium
carbide material with equal amounts of silicon and germanium and
varying amounts of carbon would have a band gap to electron
affinity .chi. curve that fits about halfway between the germanium
carbide line and the silicon carbide line.
[0024] FIG. 6 depicts a diagram of an embodiment of a system 600
having a controller 602 and a memory 606. Controller 602 and/or
memory 606 include a transistor having a gate electrode made of a
mixture of germanium, silicon and carbon. System 600 also includes
an electronic apparatus 608, and a bus 604, where bus 604 may
provide electrical conductivity and data transmission between
controller 602 and electronic apparatus 608, and between controller
602 and memory 606. Bus 604 may include an address, a data bus, and
a control bus, each independently configured. Bus 604 also uses
common conductive lines for providing address, data, and/or
control, the use of which may be regulated by controller 602. In an
embodiment, electronic apparatus 608 includes additional memory
devices configured similarly to memory 606. Electronic apparatus
608 may include, but is not limited to, information handling
devices, wireless systems, telecommunication systems, fiber optic
systems, electro-optic systems, and computers. An embodiment
includes an additional peripheral device or devices 610 coupled to
bus 604. In an embodiment controller 602 is a processor. Any of
controller 602, memory 606, bus 604, electronic apparatus 608, and
peripheral device or devices 610 may include a gate electrode
formed of a mixture of silicon, germanium and carbon in accordance
with the disclosed embodiments.
[0025] System 600 may include, but is not limited to, information
handling devices, telecommunication systems, and computers.
Peripheral devices 610 may include displays, additional storage
memory, or other control devices that may operate in conjunction
with controller 602 and/or memory 606. It will be understood that
embodiments are equally applicable to any size and type of memory
circuit and are not intended to be limited to a particular type of
memory device.
CONCLUSION
[0026] An embodiment has a floating gate transistor with a gate
made of a material having a lower tunneling barrier and thus lower
erase times. Another embodiment has the floating gate formed of
germanium silicon carbide. Another embodiment has the composition
of the floating gate determined by a desired tunneling current.
Another embodiment includes a transistor with a conventional gate
having the composition of the germanium silicon carbide adjusted to
optimize the threshold of a metal oxide semiconductor field effect
transistor (MOSFET).
[0027] An embodiment for a method for forming a floating gate
memory device includes forming a floating gate having a lower
tunneling barrier by forming the gate of a mixture of germanium,
silicon and carbon. Another embodiment includes a method of storing
data by setting the voltage of the control gate, drain diffusion
and source diffusion to either trap electrons on a floating gate
made of germanium, silicon and carbon, or by ejecting trapped
electrons from the floating gate by Fowler-Nordheim tunneling.
[0028] Applications include structures for transistors, memory
devices such as flash, and electronic systems with gates containing
a mixture of germanium, silicon and carbon, and methods for forming
such structures.
[0029] Although specific embodiments have been illustrated and
described herein, it will be appreciated by those of ordinary skill
in the art that any arrangement that is calculated to achieve the
same purpose may be substituted for the specific embodiments shown.
It is to be understood that the above description is intended to be
illustrative, and not restrictive, and that the phraseology or
terminology employed herein is for the purpose of description and
not of limitation. Combinations of the above embodiments and other
embodiments will be apparent to those of skill in the art upon
studying the above description. The scope of the embodiments of the
present invention should be determined with reference to the
appended claims, along with the full scope of equivalents to which
such claims are entitled.
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