U.S. patent application number 11/653008 was filed with the patent office on 2007-07-12 for process monitor for laser and plasma materials processing of materials.
This patent application is currently assigned to HYPERTHERM, INC.. Invention is credited to William J. Connally, Kenneth J. Woods.
Application Number | 20070158319 11/653008 |
Document ID | / |
Family ID | 32990031 |
Filed Date | 2007-07-12 |
United States Patent
Application |
20070158319 |
Kind Code |
A1 |
Connally; William J. ; et
al. |
July 12, 2007 |
Process monitor for laser and plasma materials processing of
materials
Abstract
A method for monitoring the processing of a workpiece includes
directing an incident laser beam onto the workpiece and measuring a
signal emitted from the workpiece. At least two signals are
generated by a detector based upon the emitted signal. A workpiece
processing quality is determined based upon the ratio of the two
output signals and a magnitude of one of the two outputs.
Inventors: |
Connally; William J.;
(Grantham, NH) ; Woods; Kenneth J.; (Lebanon,
NH) |
Correspondence
Address: |
PROSKAUER ROSE LLP
ONE INTERNATIONAL PLACE 14TH FL
BOSTON
MA
02110
US
|
Assignee: |
HYPERTHERM, INC.
HANOVER
NH
|
Family ID: |
32990031 |
Appl. No.: |
11/653008 |
Filed: |
January 12, 2007 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
|
10403775 |
Mar 31, 2003 |
7186947 |
|
|
11653008 |
Jan 12, 2007 |
|
|
|
Current U.S.
Class: |
219/121.83 |
Current CPC
Class: |
B23K 10/00 20130101;
B23K 31/125 20130101; B23K 26/032 20130101; B23K 26/034
20130101 |
Class at
Publication: |
219/121.83 |
International
Class: |
B23K 26/03 20060101
B23K026/03 |
Claims
1-13. (canceled)
14. An apparatus for processing and monitoring a workpiece, the
apparatus comprising: a light source that directs an incident laser
beam onto a workpiece; an optical detector for measuring at least
one signal emitted from said workpiece in response to the incident
laser beam, said optical detector generating two outputs based on
said at least one signal; and a light source monitor in
communication with said optical detector, wherein said light source
monitor determines whether a condition of the processing, of the
workpiece is an overcombustion cutting condition or a
non-penetrating cutting condition based upon a ratio of said two
outputs and a magnitude of at least one of said two outputs.
15. The apparatus of claim 14 wherein said detector comprises a
sandwich detector.
16. The apparatus of claim 14 wherein said detector comprises two
elements.
17. The apparatus of claim 14 wherein the light source monitor
determines the condition of the processing of the workpiece by:
determining a location in a lookup table based on said ratio and
said magnitude of at least one of said two outputs; and extracting
a value from said lookup table based upon said location in said
lookup table.
18. The apparatus of claim 14 wherein the apparatus determines a
value for said two outputs and said magnitude of at least one of
said two outputs indicative of a good cut by cutting a test
workpiece.
19. The apparatus of claim 14 wherein said magnitude of the at
least one of said two outputs is a maximum value.
20. The apparatus of claim 14 wherein said detector comprises at
least two detector elements.
21. The apparatus of claim 14 wherein said two outputs comprise a
first spectral band of light and a second spectral band of
light.
22. The apparatus of claim 21 wherein said first spectral band of
light has a lower band of wavelengths than the second spectral band
of light.
23. The apparatus of claim 21 wherein said first spectral band of
light is a spectral band between about 450 nm and about 650 nm.
24. The apparatus of claim 21 wherein said second spectral band of
light is a spectral band between about 950 nm and about 1150
nm.
25. The apparatus of claim 14 wherein said light source comprises a
cutting head, said cutting head comprises a plenum, a nozzle, a
focusing lens, and an optical receiver.
26. The apparatus of claim 14 wherein said apparatus further
comprises an optical receiver in communication with said detector
for receiving said at least one signal.
27. The apparatus of claim 26 wherein said optical receiver
comprises at least one port for conveying said at least one signal
to a cable, said cable for conveying said at least one signal to
said detector.
28-29. (canceled)
Description
RELATED APPLICATIONS
[0001] This application is a divisional application of, and claims
priority to, U.S. patent application Ser. No. 10/403,775, filed
Mar. 31, 2003, now U.S. Pat. No. 7,186,947, the disclosure of which
is incorporated herein by reference in its entirety.
FIELD OF THE INVENTION
[0002] The present invention relates generally to an apparatus and
method for determining the quality of the processing performed by a
material processing system and, more particularly to an apparatus
and method that uses an optical signal emitted by a workpiece
during material processing to determine the quality of the
processing being performed.
BACKGROUND OF THE INVENTION
[0003] Material processing apparatus, such as lasers and plasma arc
torches, are widely used in the cutting, welding, and heat treating
of metallic materials. A laser-based apparatus generally includes a
nozzle through which a gas stream and laser beam pass to interact
with a workpiece. Both the beam and the gas stream exit the nozzle
through an orifice and impinge on a target area of the workpiece.
The laser beam heats the workpiece. The resulting heating of the
workpiece, combined with any chemical reaction between the gas and
workpiece material, serves to heat, liquefy and/or vaporize a
selected area of workpiece, depending on the focal point and energy
level of the beam. This action allows the operator to cut or
otherwise modify the workpiece.
[0004] Similarly, a plasma arc torch generally includes a cathode
block with an electrode mounted therein, a nozzle with a central
exit orifice mounted within a torch body, electrical connections,
passages for cooling and arc control fluids, a swirl ring to
control fluid flow patterns in the plasma chamber formed between
the electrode and nozzle, and a power supply. The torch produces a
plasma arc, which is a constricted ionized jet of a plasma gas with
high temperature and high momentum that exits through the nozzle
orifice and impinges on the workpiece. Gases used in the torch can
be non- reactive (e.g., argon or nitrogen), or reactive (e.g.,
oxygen or air).
[0005] It is generally desirable that the results of any material
processing be of high quality. For example, the edges of the cut
kerf produced by laser and plasma cutting should be dross free,
smooth, straight and uniform. Edge irregularities caused by, for
example, uneven heating of the workpiece by the laser, excessive
chemical reactions between the assist gas and workpiece, or
incomplete removal of cutting debris, should be minimized.
[0006] Presently, the operation of CNC-controlled laser cutting
systems typically requires several manual parameter adjustments to
achieve workpiece processing results of desired quality.
Consequently, users typically choose conservative values of process
parameters to ensure process reliability over a wide range of
operating conditions. The tradeoff often results in an accompanying
decrease in material processing productivity (e.g., due to a
reduced cutting speed in laser cutting). For more aggressive
process parameters to be used, a reliable and automated means of
monitoring the cutting process is necessary, which could alert the
user to degradation in the quality of the cut in real time. Such a
system could also be required to adjust to changes in operating
conditions to maintain optimal process performance, i.e., good cut
quality and maximum productivity.
SUMMARY OF THE INVENTION
[0007] The present invention relates to a method for monitoring the
processing of a workpiece by a laser beam. An incident laser beam
is directed onto the workpiece and then using an optical detector
measures at least one signal emitted from the workpiece as a result
of the incident laser beam. The detector generates two or more
outputs based upon the at least one signal emitted from the
workpiece. A light source monitor determines workpiece processing
quality based upon a ratio of the two or more outputs as well as a
magnitude of at least one of the two outputs. In one embodiment,
the magnitude of the at least one of the two outputs may be a
maximum value.
[0008] Various embodiments of the invention can include the
following steps. Determining workpiece processing quality can
include determining a location in a lookup table based on the ratio
of the two outputs and the magnitude of at least one of the two
outputs, followed by extracting a quality value from that location
in the lookup table.
[0009] In one embodiment, the two outputs of the detector may
comprise a first spectral band of light and a second spectral band
of light. In another embodiment, the first spectral band of light
may comprise a lower band of wavelengths of light than the second
spectral band. In another embodiment, the first spectral band of
light may be a spectral band between about 450 nm and about 650 nm,
and the second spectral band of light may be a spectral band
between about 950 nm and about 1,150 nm.
[0010] In one embodiment, the invention features an apparatus for
processing and monitoring a workpiece. The apparatus includes a
light source that directs an incident laser beam onto a workpiece.
An optical detector is included for measuring at least one signal
emitted from the workpiece in response to the incident laser beam.
The optical detector can generate two outputs based on the at least
one signal. The apparatus also includes a light source monitor that
is in communication with the optical detector. The light source
monitor can determine workpiece processing quality based upon a
ratio of the two outputs and a magnitude of at least one of the two
outputs.
[0011] In various embodiments of the invention, the light source
monitor can determine a location in a lookup table based on the
ratio and the magnitude of at least one of the two outputs, and
then extracts a quality value from that location in the lookup
table. In another embodiment, the magnitude of the at least one of
the two outputs may be a maximum value.
[0012] The foregoing and other objects, aspects, features, and
advantages of the invention will become more apparent from the
following description and from the claims.
BRIEF DESCRIPTION OF THE DRAWINGS
[0013] In the drawings, like reference characters generally refer
to corresponding parts throughout the different views. The drawings
are not necessarily to scale, emphasis instead generally being
placed on illustrating the principles and concepts of the
invention.
[0014] FIG. 1 is a block diagram of a material processing apparatus
in accordance with an embodiment of the present invention.
[0015] FIG. 2A is a schematic sectional view of a processing head
assembly in accordance with an embodiment of the present
invention.
[0016] FIG. 2B is a close-up schematic sectional view of a nozzle
in accordance with an embodiment of the present invention.
[0017] FIG. 3 is a block diagram of a material processing apparatus
comprising a light source monitor in accordance with an embodiment
of the present invention.
[0018] FIG. 4A is a perspective view of an optical receiver of a
material processing apparatus for monitoring the light emitted by a
workpiece in accordance with an embodiment of the present
invention.
[0019] FIG. 4B is a cross-section view of an embodiment of a laser
cutting head and an optical receiver of the present invention.
[0020] FIG. 4C is a close-up cross-section view of a port in
accordance with an embodiment of the present invention.
[0021] FIG. 5 is an illustration of a detector system for
monitoring quality of the processing performed by a material
processing apparatus in accordance with an embodiment of the
present invention.
[0022] FIG. 6 is a graph of data representative of an embodiment of
a material processing system of the present invention.
DETAILED DESCRIPTION
[0023] As shown in the drawings for the purposes of illustration, a
system according to the invention monitors the processing of a
workpiece in an industrial environment. The system serves as an
on-line cut monitor system that is insensitive to cutting direction
and operates in near real-time to provide a reliable indication of
cut quality. Measurement of the temperature of the cutting front
has been found to be a generally reliable indicator of cut quality.
More specifically, when a clean cut is being produced under optimal
conditions, the average cut face temperature is relatively
constant. Significant deterioration in cut quality, e.g., the
presence of excessive dross, uneven kerf width, or rough cut edges
are typically accompanied by variations in the cut face
temperature. The system according to the invention is capable of
detecting a gross change in the average temperature and irregular
fluctuations in temperature of varying amplitude and frequency. In
particular, the system measures light intensity at two spectral
bands. The measured intensities are processed (e.g. a ratio of the
spectral bands is determined and the results are used in
conjunction with a lookup table to ascertain a cut-quality in
real-time. In addition, remote sensing of the temperature relative
to a laser beam has been found to be advantageous.
[0024] FIG. 1 shows a schematic sectional view of an embodiment of
a material processing system 100. An energy source 102 generates an
energy beam 110 and delivers it to a processing head assembly 104.
A fluid source 106 supplies a fluid, such as an assist gas, to the
processing head assembly 104. A chamber 114 receives a fluid
supplied by the fluid source 106. A nozzle 108 is also disposed
within the processing head assembly 104. The energy beam 110 and
fluid pass through chamber 114 and the nozzle 108 and impinge on a
workpiece 112 to cut, weld, heat treat, or otherwise modify the
workpiece 112.
[0025] In one embodiment, the energy source 102 is a plasma source
and the energy beam 110 is a plasma. In another embodiment, the
energy source 102 is a laser and the energy beam 110 is a laser
beam. In the plasma source embodiment, the chamber 114 can be a
plasma chamber. In the laser source embodiment, the chamber 114 can
be a plenum.
[0026] FIG. 2A illustrates additional details of the processing
head 104 and the nozzle 108. FIG. 2B provides a close-up view of a
portion of the nozzle 108. The nozzle includes a central exit
orifice 206. In some embodiments, a baffle 202 is disposed relative
to the nozzle 108. The baffle 202 includes an opening 204 that is
perpendicular to an axis of propagation of the energy beam 110 and
substantially coincident with the central exit orifice 206.
[0027] The "working end" of the processing head assembly 104 is
that portion closest to the workpiece 112. The working end
typically degrades from use because of its direct exposure to the
extreme conditions present on the workpiece 112 during material
processing. These conditions include, for example, high temperature
and a local atmosphere of highly reactive gas.
[0028] In one embodiment, the axis of the nozzle 108 is aligned
with an axis of the processing head assembly 104. This ensures the
energy beam 110 is centered in the central exit orifice 206 as it
passes through en route to the workpiece 112. To maintain
alignment, the nozzle 108 can have surfaces 208 that are contoured
over a predetermined axial extent. The contoured surfaces 208 mate
with adjacent structure of the processing head assembly 104. This
mating action results in the coaxial alignment of the nozzle 108
and the processing head assembly 104, thereby improving accuracy
and cut quality and extending the operational life of the working
end of the assembly 104.
[0029] Referring to FIG. 3, the material processing system 100
includes an optical detector 320 that is used to measure a signal
324 that is emitted by the workpiece 112. The signal 324 is emitted
by the workpiece in response to the energy beam 110 that impinges
upon the workpiece 112. In one embodiment, the signal 324 can be an
emission. The optical detector 320 generates an output 328 based
upon the signal 324 measured by the optical detector 320. In one
embodiment, the optical detector 320 is a silicon photodiode two
color detector, model no. PIN-44DP sold by UDT Sensors, Inc.,
located in Hawthorne, Calif. The output 328 is provided to a light
source monitor 332. In one embodiment, two optical detectors 320
can be used, where each detector is sensitive to different
frequency ranges of the signal 324. The output of the two optical
detectors in response to a first wavelength range 328a and a second
wavelength range 328b are electrical signals transmitted to the
light source monitor 332 via wires. In another embodiment, two
optical detectors 320 can be replaced by one sandwich detector,
which detects two ranges of wavelengths. In one embodiment, the
sandwich detector can be sandwich detector, model no. PIN-DSS, sold
by UDT Sensors, Inc., located in Hawthorne, Calif.
[0030] The light source monitor 332 determines the quality of the
processing being performed on the workpiece 112 based upon the
outputs 328a and 328b. In one embodiment, the light source monitor
332 can be a stand alone microprocessor. In another embodiment, the
light source monitor 332 can be computerized numeric controller
sold by Hyperthermn Automation, located in West Lebanon, N.H.
[0031] To determine the quality of the processing being performed
on the workpiece 112, the apparatus uses two-color pyrometry to
evaluate the signal 324 emitted from the workpiece 112 in response
to the energy beam 110. Two-color (i.e., two wavelengths of light)
pyrometry involves the calculation of the radiant light intensity
in discrete, narrow spectral bands. The system measures the radiant
light intensity to determine the relative temperature of the kerf
being formed by the head assembly (e.g., the cut zone). S .lamda.
.times. d .times. .times. .lamda. = 2 .times. .pi. .times. .times.
c 2 .times. h .lamda. 5 .times. 1 e hc / k .times. .times. T
.times. .times. .lamda. - 1 .times. d .times. .times. .lamda. , ( 1
) ##EQU1##
[0032] Mathematically, the radiant light intensity of a black body
over a narrow band of wavelength d.lamda. centered around the
wavelength .lamda., is given by: where c is the speed of light, h
is Planck's constant, k is Boltzmann's constant and T is the
temperature of the blackbody. The ratio of the intensities detected
at two different wavelengths, .lamda..sub.1 and .lamda..sub.2 is:
Intensity .times. .times. Ratio = S .lamda. 2 .times. d .times.
.times. .lamda. 2 S .lamda. 1 .times. d .times. .times. .lamda. 1 =
e hc / kT .times. .times. .lamda. 1 - 1 e hc / kt .times. .times.
.lamda. 2 - 1 .times. ( .lamda. 1 .lamda. 2 ) 5 .times. d .lamda. 2
d .lamda. 1 . ( 2 ) ##EQU2## If the two wavelength bands are equal
(i.e., if the light is filtered by two narrow bandpass filters of
equal bandwidth d.lamda.=d.lamda.=d.lamda..sub.2), and the two
wavelengths are fixed, the Intensity Ratio becomes: Intensity
.times. .times. Ratio .apprxeq. ( .lamda. 1 .lamda. 2 ) 5 .times. e
hc / kT .function. ( .lamda. 2 - .lamda. 1 / .lamda. 1 .times.
.lamda. 2 ) = C 1 .times. e C 2 / T , ( 3 ) ##EQU3## where C.sub.1
and C.sub.2 are constants. For the case
.lamda..sub.2>.lamda..sub.1, C.sub.2 is a positive constant,
implying that the Intensity Ratio is a monotonically decreasing
function of temperature, i.e., a lower Intensity Ratio indicates a
higher relative temperature. Thus, the Intensity Ratio is a
function of the temperature of the radiating body, which in this
case is the temperature of the cut zone.
[0033] Advantages of this processing technique become evident when
considering the circumstances under which overcombustion or
non-penetrating cutting conditions occur during material
processing. In both these cases, the radiant light intensity
signals (S.sub..lamda.1 and S.sub..lamda.2) rise in magnitude above
their values calculated during clean cutting conditions; however,
their ratio increases for the overcombustion cutting condition and
the ratio decreases for the non-penetrating cutting condition. For
the non-penetrating cutting condition, the radiant light intensity
emitted by the workpiece increases as the temperature of the
workpiece increases, thereby leading to an increase in the radiant
light intensity signals (S.sub..lamda.1 and S.sub..lamda.2) and a
decrease in the Intensity Ratio according to Eqn. (3). For the
overcombustion cutting condition, the temperature of the workpiece
drops and the Intensity Ratio increases. In addition, the
overcombustion cutting condition generally results in a wider kerf.
Due to the wider kerf "visible" to the receiver, the magnitude of
the light level incident upon the detectors is large, which causes
both of the radiant light intensity signals (S.sub..lamda.1 and
S.sub..lamda.2) to increase. If a single wavelength detection
scheme was used, the light source monitor would be unable to
distinguish an overcombustion cutting condition from a
non-penetrating cutting condition. Further, employing the two
wavelength (S.sub..lamda.1 and S.sub..lamda.2) processing technique
for determining cutting quality and assuming a specific material
composition and thickness (e.g., 12.7 mm steel), the optimal range
for the Intensity Ratio is, generally, independent of average laser
power and the exit diameter of the nozzle. This is an advantage in
that the light source monitor 332 could be used in different
material processing system installations without requiring an
operator to determine custom operating parameters.
[0034] The exclusive use of the Intensity Ratio to control cut
speed, however, can also lead to ambiguous results. FIG. 6 shows a
plot of the radiant light intensity signals (S.sub..lamda.1 or
S.sub..lamda.2), as well as the intensity ratio vs. cut speed for a
test cut, where the cut speed is varied from 0 to 2 meters/minute.
FIG. 6 shows four cut conditions that occur as the test cut speed
changes from 0 to 2 meters/minute. The first region "A" is the
starting region, which ranges from 0 to about 0.33 meters/minute.
In the starting region the kerf front is almost vertical and
emissions are small. The second region "B" is a region where cut
speed is slower than optimal. In this embodiment, region B extends
from about 0.33 to 0.9 meters/minute. Region B is categorized in
that both (S.sub..lamda.1 or S.sub..lamda.2 are increasing, while
the intensity ratio is decreasing because S.sub..lamda.2 is
increasing faster than S.sub..lamda.1. The third region "C" is
categorized as a good cut zone region because the cut speed is
generally optimal. In this embodiment, the C region extends from
about 0.9 to 1.1 meters/minute. The fourth region "D" is a region
where the cut speed is faster than optimal and results in a
non-penetrating cut. In this embodiment, region D is any cutting
speed greater than about 1.1 meters/minute. Region D is categorized
in that the intensity ratio is decreasing from the intensity levels
in the generally optimized cut zone C, and the absolute values of
S.sub..lamda.1 and S.sub..lamda.2 are increasing. The Intensity
Ratio can have the same value on either side of region C at two
very different cut speeds, for example, one peak at a low speed and
the other at a higher speed. A material processing system in which
quality is based on the Intensity Ratio solely would be unable to
distinguish between these two different conditions.
[0035] The light source monitor 332 addresses this problem by using
a magnitude of at least one of the radiant light intensity signals
(S.sub..lamda.1 or S.sub..lamda.2) along with the Intensity Ratio
to determine the cutting quality. For an overcombustion cutting
condition, the radiant light intensity signals (S.sub..lamda.1 or
S.sub..lamda.2) both increase in magnitude. Thus, by specifying a
threshold for either wavelength (S.sub..lamda.1 or S.sub..lamda.2)
signal, an overcombustion cutting condition can be detected. The
condition associated with an overcombustion cut can be detected
when the Intensity Ratio is greater than a predetermined upper
limit and one of the wavelength (S.sub..lamda.1 or S.sub..lamda.2)
signal exceeds a second predetermined limit. In one embodiment, the
magnitude can be a maximum. In another embodiment, the magnitude
can be a minimum. In another embodiment, the magnitude can be
between the minimum and maximum.
[0036] For a non-penetrating cutting condition, the radiant light
intensity signals (S.sub..lamda.1 or S.sub..lamda.2) both increase
in magnitude. Thus, by specifying a threshold for either wavelength
(S.sub..lamda.1 or S.sub..lamda.2) signal, in conjunction with a
threshold in the Intensity Ratio a non-penetrating cutting
condition can be detected. The condition associated with a
non-penetrating cut can be detected when the Intensity Ratio is
less than a predetermined lower limit and either wavelength
(S.sub..lamda.1 or S.sub..lamda.2) signal increases above a second
predetermined limit. In one embodiment, the magnitude can be a
maximum. In another embodiment, the magnitude can be a minimum. In
another embodiment, the magnitude can be between the minimum and
maximum.
[0037] Similarly, for very low and very high cutting speeds, the
Intensity Ratio calculated for these conditions could be similar,
thus masking the character (e.g., whether the cut is penetrating or
non-penetrating) of the cut quality. At low cutting speeds, both
radiant light intensity signals (S.sub..lamda.1 or S.sub..lamda.2)
are small in value. For high speeds (e.g., above the optimum
cutting speed range), both the radiant light intensity signals
(S.sub..lamda.1 or S.sub..lamda.2) increase in value as the laser
fails to penetrate the workpiece and instead heats up the
workpiece.
[0038] It should be noted that intensity ratio vs. cutting speed
charts, like the one shown in FIG. 6, should be generated for
different workpiece materials and thickness, as well as for
different laser systems. The will allow the user to determine the
generally optimal cutting range for a given material, with a given
thickness, for a given laser system.
[0039] In another embodiment, illustrated in FIG. 4A, an optical
receiver 400, having an annular shape is provided for monitoring at
least one optical signal emitted from the cut zone of a processed
workpiece. In this one embodiment, the receiver 400 comprises eight
ports 410 that are located equally spaced around the circumference
of a ring 420 of the receiver 400. The optical signal that passes
through each port 410 is subsequently passed via individual optical
fibers (not shown) to each of three fiber optic cables 430a, 430b,
and 430c (generally 430). The portion of the optical signal passed
through each port 410 is divided equally among each cable 430.
[0040] In this embodiment, the receiver 400 is located within a
laser cutting head 104, as shown in FIGS. 4B and 4C. The cables 430
(only one cable 430 is shown for purposes of clarity) are each
connected to an individual optical detector 320. The optical
signals 324 are passed to each optical detector 320 by each
respective cable 430. The detectors 320 measure the radiant light
intensity of the optical signals 324 emitted from the workpiece 112
in response to the energy beam 110. The output (i.e., the radiant
light intensity in a discrete, narrow spectral band) of each
detector 320 is then passed to a light source monitor, such as the
light source monitor 332 of FIG. 3. In one embodiment, the light
source monitor provides an operator with an indication of the
quality of the cut produced by the material processing apparatus.
In another embodiment, the light source monitor may be an input to
a real time monitoring system, such as the system described in U.S.
Pat. No. 6,947,802, entitled "Centralized Control Architecture for
a Laser Materials Processing System" filed on Mar. 31, 2003, the
disclosure of which is hereby incorporated by reference in its
entirety.
[0041] Alternative spacing and numbers (e.g., 3 or greater) of
ports 410 and respective optical fibers may be used in other
embodiments. However, it is generally desirable to use a sufficient
number (e.g., greater than three) of ports 410 to ensure that the
receiver 400 measures the average light emitted by the workpiece
undergoing material processing. When a sufficient number of ports
(e.g., greater than three) are used, the determination of cut
quality is insensitive, or less sensitive, to the cutting
direction.
[0042] In another embodiment, illustrated in FIG. 5, the cables
430a, 430b, and 430c transmit the optical signals to a detector
system 500. The optical signals passing through the cables 430a and
430c are subsequently passed through two signal filters 530a and
530c, respectively. The filters 530a and 530c condition the optical
signals passed through the filters so they each represent a narrow
spectral band of radiant light intensity as described previously
herein. By way of example, the filters 530a and 530c are filter
model nos. F10-1050.0-4-0.50 and F10-560.0-4-0.50, sold by CVI
Laser Corp, located in Putnam, Conn. The radiant light intensity
signals (S.sub..lamda.1) passed by filter 530a represents a narrow
band of light at a wavelength of light centered at about 560 nm,
but generally between about 450 nm and about 650 nm. The radiant
light intensity signals (S.sub..lamda.2) passed by filter 530c
represents a narrow band of light at a wavelength of light centered
at about 1,050 nm, but generally between about 950 nm and about
1,150 nm.
[0043] The radiant light intensity signals (S.sub..lamda.1 or
S.sub..lamda.2) output by the filters 530aand 530c pass to
detectors 320a and 320c, respectively. Detectors 320a and 320c
convert the radiant light intensity signals (S.sub..lamda.1 or
S.sub..lamda.2) into electrical signals or outputs 522a and 522c,
respectively. The outputs 522a and 522c are subsequently passed to
a signal conditioning module 510. The signal conditioning module
510, e.g., amplifies the outputs 522a and 522c and passes the
amplified signals to the light source monitor 332. The light source
monitor 332 determines the processing quality of a workpiece based
upon the outputs 522a and 522c. The light source monitor 322
calculates a ratio (i.e., the Intensity Ratio of Eqn. 3) of the
output 522a relative to the output 522c. Typically, the ratio is
calculated in real-time or at discrete predetermined points in time
to create an indication of processing quality as a function of
time. The light source monitor 332 also extracts a magnitude, for
example, the magnitude of the outputs 522a or 522c at the same
predetermined points in time as the ratio is calculated. In one
embodiment, the magnitude can be a maximum. In another embodiment,
the magnitude can be a minimum. In another embodiment, the
magnitude can be between the minimum and maximum.
[0044] The light source monitor 332 then compares the ratio and the
magnitude with a lookup table stored within the light source
monitor 332 to determine the quality of the material processing
being performed at the predetermined points in time. In one
embodiment, the lookup table is a collection of experimental data
that is predetermined by the manufacturer of the system or by an
operator of the system. The table can include data for different
workpiece materials (e.g., steel, aluminum, and titanium),
different material thickness, different cutting rates, different
cutting accelerations, and different cutting profiles (e.g., curves
or straight lines). An example of data for a straight line cut of
mild steel that could be included in a lookup table is provided
below: TABLE-US-00001 Material Target Max Magnitude Thickness Ratio
S1 1/4'' 2.8 4 1/2 4 3 3/4 5 2.5
[0045] By way of example, the measure of the quality of the
material processing being performed at a specific point in time can
be a value that indicates, e.g., whether the material processing
system is operating in a condition that results in overcombustion
cutting conditions, clean (normal) cutting conditions or
non-penetrating cutting conditions of the workpiece.
[0046] FIG. 6 illustrates an example of data acquired by an
embodiment of a material processing apparatus used to cut a 12.7 mm
thick steel workpiece using a laser system. The graph depicts two
filtered signals 530a and 530c as S.sub..lamda.2and S.sub..lamda.1.
FIG. 6 also shows a ratio of the S.sub..lamda.1 and S.sub..lamda.2
signals. The S.sub..lamda.2 data represents the filtered radiant
light intensity (measured by a detector in a narrow spectral band
that has a center wavelength equivalent to the wavelength of light,
which in one embodiment can be a wavelength of about 675 nm. The
S.sub..lamda.1 data represents the radiant light intensity
(measured by a detector in a narrow spectral band that has a center
wavelength equivalent to the wavelength of light, which in one
embodiment can be a wavelength of about 560 nm. In other
embodiments, the optical signal can be filtered between a range of
about 450 nm and about 1050 nm. The ratio data represents the ratio
of the S.sub..lamda.2 data and the S.sub..lamda.1 data (i.e., a
representation of the Intensity Ratio as described herein).
[0047] It should be noted that any pair of spectral bands can be
used based upon the material to be processed, the thickness of the
material, and the equipment to be used. Typically, the spectral
band can be any range between about 300-2000 nm.
[0048] The X-axis of the graph represents the speed of the cutting
process, where cut speed increases from 0 to 2 meters per minute.
Also indicated in the graph is region C, the good cut zone (e.g.,
minimal dross or desirable kerf size). The graph also illustrates a
slower than optimal condition, region B, at a cut speed ranging
from about 0.33 to 0.9 meters/minute. Region D is a faster than
optimal cutting condition, where the cut speed is greater than
about 1.1 meters/minute. Finally, the graph also illustrates a
starting region, region A, which ranges from 0 to about 0.33
meters/minute.
[0049] By varying the speed of the cut, this allows for
experimental determination of a good cutting region, an
overcombustion region, and a non-penetration cutting region. In
addition to a predetermined lookup table, the conditions can be
determined automatically by a test cut as described in FIG. 6 and
an algorithm can be used to identify the optimal region for
cutting.
[0050] Variations, modifications, and other implementations of what
is described herein will occur to those of ordinary skill in the
art without departing from the spirit and the scope of the
invention claimed. Accordingly, the invention is to be defined not
by the preceding illustrative description but instead by the spirit
and scope of the following
* * * * *