U.S. patent application number 11/523573 was filed with the patent office on 2007-04-12 for system and method for transferring and aligning wafers.
Invention is credited to Man-Young Lee, Seung-Kun Lee, Young-Kwang Myoung.
Application Number | 20070081886 11/523573 |
Document ID | / |
Family ID | 37911208 |
Filed Date | 2007-04-12 |
United States Patent
Application |
20070081886 |
Kind Code |
A1 |
Myoung; Young-Kwang ; et
al. |
April 12, 2007 |
System and method for transferring and aligning wafers
Abstract
There is provided a method and system for transferring wafers.
Wafers in a FOUP are horizontally aligned by vibrating the FOUP
before unloading the wafers from the FOUP. Thereafter, a mapping
process may be accurately performed, and the wafers stably unloaded
from the FOUP.
Inventors: |
Myoung; Young-Kwang;
(Osan-si, KR) ; Lee; Seung-Kun; (Suwon-si, KR)
; Lee; Man-Young; (Hwaseong-gun, KR) |
Correspondence
Address: |
VOLENTINE FRANCOS, & WHITT PLLC
ONE FREEDOM SQUARE
11951 FREEDOM DRIVE SUITE 1260
RESTON
VA
20190
US
|
Family ID: |
37911208 |
Appl. No.: |
11/523573 |
Filed: |
September 20, 2006 |
Current U.S.
Class: |
414/806 |
Current CPC
Class: |
H01L 21/67775 20130101;
H01L 21/67772 20130101 |
Class at
Publication: |
414/806 |
International
Class: |
B65H 1/00 20060101
B65H001/00 |
Foreign Application Data
Date |
Code |
Application Number |
Sep 23, 2005 |
KR |
2005-88856 |
Claims
1. A method of transferring wafers from a container, the wafers
being inserted into slots within the container, the method
comprising: placing the container on a load port; aligning the
wafers in the container; and thereafter unloading the wafers from
the container, wherein the aligning the wafers comprises shaking
the container by applying an external mechanical force to cause the
wafers to settle onto the slots.
2. The method of claim 1, wherein the shaking of the container
comprises mechanically vibrating the container.
3. The method of claim 2, wherein the vibrating of the container
comprises linearly reciprocating a conveying plate associated with
the load port, and wherein placing the container on the load port
comprises placing the container on the conveying plate.
4. The method of claim 3, further comprising opening a door
provided in a body of the container, wherein the opening of the
door comprises: inserting latch keys formed on a door holder of a
door opener into latch holes formed on the door of the container
before the aligning of the container; and separating the door from
the body of the container after the aligning of the container.
5. The method of claim 1, further comprising, after the unloading
of the wafers from the container: re-loading the wafer into the
container; and thereafter, aligning the wafers in the container by
vibrating the container.
6. The method of claim 1, wherein the shaking of the container
comprises imparting a physical impact to the container.
7. A wafer transfer system adapted to transfer wafers from a
container to a process facility, the wafers being received into
slots within the container, the wafer transfer system comprising: a
load port adapted to receive and support the container; a frame
positioned between the load port and the process facility and
comprising a transfer robot adapted to transfer the wafers from the
container to the process facility; and an alignment unit adapted to
settle the wafers into the slots in horizontal alignment by
mechanically shaking the container supported by the load port.
8. The wafer transfer system of claim 7, wherein the load port
comprises: a station; a conveying plate associated with the station
and adapted to receive the container; and a conveying plate driver
adapted to linearly reciprocate the conveying plate, wherein the
alignment unit comprises a controller adapted to control operation
of the conveying plate driver.
9. The wafer transfer system of claim 7, wherein the alignment unit
comprises a striker adapted to mechanically strike an outer wall of
the container supported by the load port.
10. A wafer aligner adapted to horizontally align wafers inserted
into slots of a container, the substrate aligner comprising: an
alignment station; a shake plate disposed on the alignment station
and adapted to receive the container; and a shake plate driver
adapted to shake the shake plate to thereby cause settling of the
wafers onto their respective slots.
11. The wafer aligner of claim 10, wherein the shake plate driver
is adapted to vibrate the shake plate.
12. The wafer aligner of claim 10, wherein the shake plate driver
reciprocates the shake plate back and forth, right and left, or up
and down.
13. The Wafer aligner of claim 10, wherein the container is a
hermetic container.
14. The wafer aligner of claim 13, wherein the hermetic container
comprises a Front Open Unified Pod (FOUP).
Description
BACKGROUND OF THE INVENTION
[0001] 1. Field of the Invention
[0002] Embodiments of the invention relate to an apparatus and a
method for handling wafers during the fabrication of semiconductor
devices. More particularly, embodiments of the invention relate to
an apparatus and method for horizontally aligning wafers in a
container.
[0003] This application claims priority to Korean Patent
Application No. 2005-88856 filed Sep. 23, 2005, the subject matter
of which is hereby incorporated by reference.
[0004] 2. Description of the Related Art
[0005] Semiconductor devices are fabricated by applying a complex
sequence of processes to wafers that serve as a substrate for the
devices. Fabrication processes are generally performed in a
so-called "clean room" wherein an extreme degree of cleanliness is
maintained. To avoid potential contamination and aid in the
efficient handling of wafers, they are commonly stored and
transferred in open type wafer containers within the clean room
environment. However, it is very expensive to maintain a clean room
at the required level of cleanliness. As a result, clean rooms tend
to be relatively small in size, but are often surrounded by
ancillary clean areas having a very high degree of cleanliness, but
not nearly as clean as the clean room itself. Wafers are often
stored in these ancillary clean areas in hermetically sealed wafer
containers. Such containers are used to protect wafers from
contamination by foreign substance (e.g., particles), as well as
trace chemical contamination. The so-called Front Open Unified Pod
(hereinafter, referred to as FOUP) is one example of a
conventionally available hermetic wafer container.
[0006] The fabrication of contemporary semiconductor devices is
characterized by increasing wafer diameters (e.g., a migration from
200 to 300 mm), and increased automation of the fabrication
processes. Automation of fabrication processes, including the
transfer of wafers to/from a clean room, is facilitated by wafer
transfer systems. The Equipment Front End Module (hereinafter,
referred to as EFEM) is one type of commonly used wafer transfer
system. The EFEM is connected within a semiconductor fabrication
facility so as to transfer wafers between one or more FOUPs and
various work stations, including clean rooms, within the
facility.
[0007] An exemplary load port for an EFEM is disclosed in U.S. Pat.
No. 6,473,996. When a FOUP is placed on a station of the load port,
a door of the FOUP is opened by a door opener. A determination is
then made as to whether wafers are loaded into a plurality of slots
within the FOUP. A mapping process is then performed to identify
the number of the wafers loaded in the FOUP. If data about a
particular wafer in a slot does not correspond to the mapping data,
the transfer process is interrupted. On the other hand, if the
mapping data corresponds, then the wafers are removed from the FOUP
and transferred to the identified process facility. Once the wafers
are completely processed, they are returned to the FOUP and the
door of the FOUP is closed to again hermetically seal the FOUP from
the external environment.
[0008] A FOUP may be transferred between work stations in a process
facility (and between different process facilities) by automated
devices, such as overhead transfer equipment or human workers.
Wafers inserted in the slots of the FOUP often deviate from a true
horizontal plane during transfer of the FOUP due to mechanical
vibrations. In such cases, the deviating wafers can not be
accurately detected by the sensor performing the mapping process.
As a result, the mapping data is different from the predetermined
data, generating facility errors and interrupting the process.
Also, deviating wafers may not be stably loaded on a transferring
arm. Unstably loaded wafers may fall from the transferring arm and
be damaged.
SUMMARY OF THE INVENTION
[0009] Embodiments of the present invention provide an apparatus
and a method for handling wafers which ensures that wafers are
inserted into the slots of a container without deviation from a
desired planar arrangement. This result reduces handling errors,
process interruptions, and the potential for damage to the
wafers.
[0010] In one embodiment, the invention provides; a method of
transferring wafers from a container, the wafers being inserted
into slots within the container, the method comprising; placing the
container on a load port, aligning the wafers in the container, and
thereafter unloading the wafers from the container, wherein
aligning the wafers comprises shaking the container by applying an
external mechanical force to cause the wafers to settle onto the
slots.
[0011] In another embodiment, the invention provides a wafer
transfer system adapted to transfer wafers from a container to a
process facility, the wafers being received into slots within the
container, the wafer transfer system comprising; a load port
adapted to receive and support the container, a frame positioned
between the load port and the process facility and comprising a
transfer robot adapted to transfer the wafers from the container to
the process facility, and an alignment unit adapted to settle the
wafers into the slots in horizontal alignment by mechanically
shaking the container supported by the load port.
[0012] In another embodiment, the invention provides a wafer
aligner adapted to horizontally align wafers inserted into slots of
a container, the substrate aligner comprising; an alignment
station, a shake plate disposed on the alignment station and
adapted to receive the container, and a shake plate driver adapted
to shake the shake plate to thereby cause settling of the wafers
onto their respective slots.
BRIEF DESCRIPTION OF THE DRAWINGS
[0013] FIG. 1 is a view illustrating an example of a wafer handling
apparatus employing a wafer transfer system according to an
embodiment of the invention;
[0014] FIG. 2 is a perspective view of the container in FIG. 1;
[0015] FIG. 3 is a perspective view of the load port in FIG. 1;
[0016] FIGS. 4A and 4B are respective views illustrating a case
wherein a wafer deviates from a desired plane arrangement, and a
case wherein wafers are properly aligned in a container;
[0017] FIG. 5 is a perspective view of a load port in which an
aligner having a striker is installed;
[0018] FIG. 6 is a flowchart illustrating a method of transferring
wafers in a wafer transfer system according to an embodiment of the
invention;
[0019] FIGS. 7 to 10 are related views illustrating a process of
separating the door from the body of the container of the apparatus
shown in FIG. 1; and
[0020] FIG. 11 is a view illustrating another example of an aligner
adapted to align wafers in a container.
DESCRIPTION OF EMBODIMENTS
[0021] Reference will now be made to several embodiments of the
invention, examples of which are illustrated in the accompanying
drawings. However, the present invention is not limited to only the
illustrated embodiments. Rather, the embodiments are presented as
teaching examples.
[0022] FIG. 1 is a view illustrating a wafer handling apparatus
employing a wafer transfer system 30 according to an embodiment of
the invention. Referring to FIG. 1, the wafer handling apparatus
generally comprises a container 10, a wafer transfer system 30, and
a process facility (or work station) 20.
[0023] Container 10 is adapted to receive semiconductor substrates
in the form of wafers. A hermetic container may be used as
container 10 to protect the wafers from particle and/or chemical
contamination during transfer. In one particular embodiment of the
invention a FOUP is used as the hermetic container.
[0024] FIG. 2 is a perspective view of FOUP 10. Referring to FIG.
2, FOUP 10 comprises a body 12 having an interior space accessible
through a door 14. A plurality of slots 12a are formed parallel to
one another in at least one inner wall of body 12, and are adapted
to receive respective edge portions of an inserted wafer. Latch
holes 14b and registration holes 14a are formed in door 14 of FOUP
10. A plate spring (not shown) may be installed in an inner side of
the door 14 to press the wafers into FOUP 10 when door 14 is
closed.
[0025] Process facility 20 may perform a chemical vapor deposition
process, a dry etching process, a thermal treatment, a development
process, or a cleaning process, etc. Although is not shown, a load
lock chamber, a transfer chamber, and process chambers adapted to
perform one or more of the aforementioned processes may be included
in process facility 20.
[0026] Wafer transfer system 30 transfers the wafers between FOUP
10 and process facility 20. In the illustrated example, wafer
transfer system 30 comprises a load port 100, a frame 200, a
transfer robot 220, and an alignment unit 300. Frame 200 has a
substantially rectangular shape. Of the sidewalls of frame 200, a
transfer port 202a allowing transfer of the wafers W is formed on a
rear wall 202 adjacent to process facility 20. An opening is formed
in a front wall 204 which faces rear wall 202. An exhaust port 206
is provided at a lower portion of frame 200 to exhaust air.
[0027] A fan filter unit 240 is provided at an upper portion of
frame 200 to help maintain cleanliness within frame 200. A fan 242
generates a streamline flow of air from the upper portion of frame
200 down towards the lower portions of frame 200. A filter 244
removes contamination particles from the air entering frame
200.
[0028] Transfer robot 220 is provided in frame 200 to transfer the
wafers between FOUP 10 and process facility 20. One or more
transfer robots 220 may be so provided.
[0029] A mapping unit 260 is also provided in wafer transfer system
30 to determine whether wafers are placed in slots 12a of FOUP 10.
Mapping unit 260 may comprise a light emitting sensor and a light
receiving sensor (both not shown), and may be associated with
transfer robot 220 or a door holder 182. One conventionally
understood mapping method applicable to the working example shown
in FIG. 1 determines the presence or absence of wafers by
selectively illuminating portions of container 10 with light and
detecting a return optical signal.
[0030] Load port 100 contacts front wall 204 of frame 200 and
supports FOUP 10 during the transfer process. FIG. 3 is a
perspective view further illustrating load port 100 of FIG. 1.
[0031] Referring to FIGS. 1 and 3, load port 100 comprises a
vertical frame 160, a station 120, a conveying plate 140, a plate
driver 170, and a door opener 180. Vertical frame 160 is inserted
into opening of front wall 204 of frame 200 so as to be connected
with frame 200. A through hole 162 is formed in vertical frame 160
to facilitate the transfer of the wafers. In the illustrated
example, through hole 162 has a substantially rectangular
shape.
[0032] Station 120 is mounted on a side of vertical frame 160, and
conveying plate 140 is coupled onto an upper surface of station
120. In the illustrated example, station 120 has a substantially
flat upper surface, and a guide groove 122 is formed in a middle
portion of the flat upper surface to act as a guide for a conveying
plate 140 to linearly move towards vertical frame 160.
[0033] Conveying plate 140 has an upper plate 142 of substantially
rectangular shape and a lower plate 144 extending downward from
upper plate 142 and being inserted into guide groove 122. A
plurality of kinematic fins 142a may be formed on conveying plate
140. In use, kinematic fins 142a are inserted into grooves (not
shown) formed in a lower surface of FOUP 10, such that FOUP 10 is
placed in a predetermined position on conveying plate 140.
[0034] Door opener 180 opens and closes door 14 of FOUP 10 once
FOUP 10 has been placed on conveying plate 140. Door opener 180
includes door holder 182, an arm 184, and a holder driver (not
shown). Door holder 182 is formed with a size and shape
corresponding to through hole 162. Arm 184 is fixedly coupled to a
rear surface of door holder 182. The holder driver is coupled to
arm 184, as to facilitate movement of arm 184 up, down, right or
left. The holder driver may be installed in station 120. Latch keys
182b adapted for insertion to latch holes 14b of door 14 (see, FIG.
2) and registration pins 182a adapted for insertion to registration
holes 14a are installed on door holder 182.
[0035] As illustrated above, the wafers are inserted into slots 12a
within FOUP 10. However, the wafers may be inserted in such a
manner that deviations from a desired planar alignment (e.g., a
horizontal planar alignment) occur. Alternatively, mechanical
vibrations caused by auto-transfer system, such as an overhead
transfer (not shown), may cause deviations in the alignment of the
wafers within FOUP 10. Under these circumstances, mapping unit 260
may fail to properly detect the presence of deviating wafers within
FOUP 10 during the mapping process.
[0036] Accordingly, alignment unit 300 is adapted to align the
wafers within FOUP 10 in a desired planer alignment. In one
embodiment, alignment unit 300 vibrates or shakes FOUP 10 to
motivate any deviating wafers into a desired horizontal alignment.
In one specific embodiment, alignment member 300 mechanically
vibrates or strikes FOUP 10 to accomplish this result.
[0037] In one embodiment, FOUP 10 is vibrated linear reciprocation.
In this exemplary approach, a controller 310 within alignment unit
300 controls movement of plate driver 170. Controller 310 controls
the movement of plate driver 170 in such a manner that conveying
plate 140, whereon FOUP 10 has been placed, is linearly
reciprocated. For example, controller 310 controls the plate driver
170, such that conveying plate 140 reciprocates back and forth with
guide groove 122. A reciprocating distance as well as the speed of
reciprocation for conveying plate 140 may be defined such that the
wafers in FOUP 10 are sufficiently vibrated to ensure a flat
horizontal alignment within their respective slots 12a.
[0038] FIGS. 4A and 4B are comparative views illustrating one case
wherein a wafer within a plurality of wafers W in not properly
seated within its slot 12a, and another case following mechanical
vibration of the wafers within FOUP 10. As illustrated in FIG. 4A,
when FOUP 10 is initially placed on load port 100, one edge of a
wafer W is properly placed within a slot 12a, but the other edge of
the wafer is not. However, when FOUP 10 is vibrated, the unseated
edge of the wafer properly settles onto slot 12a, thus properly
aligning the wafer.
[0039] The wafers W are aligned in FOUP 10 before door 14 is
opened. This prevents the wafers W from falling out of FOUP 10 when
it's vibrated. The wafers W may be aligned in FOUP 10, after latch
keys 182b of door holder 182 are coupled to latch holes 14b of door
14 to unlock door 14, but before door 14 is separated from body 12
of FOUP 10.
[0040] In the aforementioned method, conveying plate 140 linearly
reciprocates along guide groove 122 to vibrate FOUP 10. However,
FOUP 10 may be vibrated using other methods. For example, conveying
plate 140 may be reciprocated or vibrated in any reasonable
direction using many different techniques.
[0041] Also, in the aforementioned exemplary method, conveying
plate 140 is acted upon to vibrate FOUP 10. However, FOUP 10 may be
vibrated by reciprocating door holder 182, up, down, right and/or
left, or back and forth when FOUP 10 is coupled to door holder
182.
[0042] In another embodiment, an alignment unit 300 may include a
striker 320 adapted to mechanically strike FOUP 10. FIG. 5
illustrates an example wherein striker 320 is installed on load
port 100. Referring to FIG. 5, striker 320 includes a strike bar
322, a moving rod 324, and the strike bar driver (not shown).
Strike bar 322 is adapted to strike FOUP 10 or conveying plate 140
to directly impart a settling impact to FOUP 10. Strike bar 322 may
have a rod shape terminating in a spherical head. Strike bar 322 is
horizontally disposed relative to conveying plate 140. Moving rod
324 is coupled to strike bar 322, and in the illustrated example
includes a horizontal rod 324a horizontally disposed to penetrate
through a hole 124 formed in a sidewall of station 120 and a
vertical rod 324b vertically extending from an end of horizontal
rod 324a. Strike bar 322 is coupled to an end of vertical rod 324b.
Moving rod 3245 is mechanically coupled to the strike bar
driver.
[0043] A method of transferring wafers using the aforementioned
wafer transfer system 30 will now sequentially described with
collective reference to FIGS. 6 to 10. FIG. 6 is a flowchart
illustrating an exemplary method of transferring wafers according
to an embodiment of the invention, and FIGS. 7 to 10 are related
views sequentially illustrating a process of separating door 14
from body 12 of FOUP 10.
[0044] Door holder 182 is inserted into through hole 162, and FOUP
10 is placed on conveying plate 140 by an overhead transfer (FIG.
7, S10).
[0045] Conveying plate 140 then moves towards door holder 182.
Registration pins 182a of door holder 182 are inserted into
registration holes 14a of door 14, and latch keys 182b of door
holder 182 are inserted into latch holes 14b of door 14. Latch keys
182b of door holder 182 rotate in latch holes 14b, and thus door
holder 182 is coupled to door 14 (FIG. 8, S20).
[0046] Conveying plate 140 reciprocates along a guide groove 122,
vibrating FOUP 10 (FIG. 9, S30).
[0047] Then, door holder 182 moves back and down under the control
of the holder driver. Thus, door 14 of FOUP 10 is separated from
body 12, thereby opening FOUP 10 (FIG. 10, S40).
[0048] In the aforementioned embodiment, FOUP 10 is vibrated after
door 14 of FOUP 10 is coupled to door holder 182. However, on the
other hand, FOUP 10 may be vibrated before door 14 of FOUP 10 is
coupled to door holder 182.
[0049] Next, the presence or absence of wafers in slots 12a is
detected by mapping unit 260. A process is performed wherein
detected data is checked in relation to predetermined input data.
Then, wafers are sequentially unloaded from FOUP 10 by transfer
robot 220, and transferred to process facility 20. Once processed,
a wafer is re-loaded back into FOUP 10.
[0050] Once all wafers have been processed, door holder 182 moves
up and forward, and door 14 of FOUP 10 is again coupled to body 12.
The latch keys rotate, and conveying plate 140 moves along guide
groove 122 in a direction away from door holder 182. Selectively,
after door 14 of FOUP 10 is coupled to body 12, conveying 140 may
linearly reciprocate along guide groove 122, thereby settling and
aligning the wafers W in FOUP 10.
[0051] In the aforementioned embodiment, the wafers are aligned in
FOUP 10 before being transferred from FOUP 10 by wafer transfer
system 30. However, in another embodiment of the invention, the
wafers may be aligned using another approach. This approach relies
on an aligner 400 to horizontally align wafers in a container 10.
This approach will be briefly described with reference to FIG.
11.
[0052] Referring to FIG. 11, aligner 400 is adapted to horizontally
align the wafers in FOUP 10, and comprises an alignment station
420, a shake plate 440, a shake plate driver 460, and a controller
480. Shake plate 440 is installed on an upper surface of alignment
station 420. Shake plate 440 is substantially flat and has an upper
plate 442 whereon FOUP 10 is placed, and a lower plate 444
extending downward from upper plate 442. In the illustrated
example, upper plate 442 has a substantially rectangular shape, and
lower plate 444 protrudes downward from a middle portion of upper
plate 442.
[0053] An inserting groove 446 is formed through alignment station
420, and lower plate 444 of shake plate 440 is inserted into
inserting groove 446. Inserting groove 446 has a larger diameter
than that of lower plate 444. Shake plate driver 460 is installed
under lower plate 444 to vibrate lower plate 444 up and down, right
and left, and/or a back and forth. When FOUP 10 is placed on shake
plate 440, shake plate driver 460 is controlled by controller 480
to vibrate shake plate 440. In one embodiment, shake plate driver
460 may linearly reciprocate shake plate 440 to vibrate the shake
plate 440.
[0054] According to these various embodiments of the present
invention, wafer placed in a container, such as a FOUP, may be
stably transferred because the wafers are all properly aligned
within the container. As a result, a subsequently performed mapping
process may accurately determine the presence and absence of wafers
within the container.
[0055] While the invention has been described in the context of
several embodiments, it will be apparent to those skilled in the
art that various modifications and variations can be made thereto.
Thus, it is intended that the present invention covers all such
modifications and variations that fall within the scope of the
appended claims and their equivalents.
* * * * *