U.S. patent application number 11/415041 was filed with the patent office on 2006-11-02 for illumination module for evanescent illumination and microscope.
This patent application is currently assigned to Leica Microsystems CMS GmbH. Invention is credited to Andreas Hecker, Werner Knebel, Kyra Moellmann, Heinrich Ulrich.
Application Number | 20060245047 11/415041 |
Document ID | / |
Family ID | 34395048 |
Filed Date | 2006-11-02 |
United States Patent
Application |
20060245047 |
Kind Code |
A1 |
Hecker; Andreas ; et
al. |
November 2, 2006 |
Illumination module for evanescent illumination and microscope
Abstract
A microscope with a light source that produces an illumination
light beam for evanescently illuminating a sample comprises an
adjustment mechanism with which the polarization of the
illumination light beam may be changed.
Inventors: |
Hecker; Andreas; (Asslar,
DE) ; Knebel; Werner; (Kronau, DE) ;
Moellmann; Kyra; (Trippstadt, DE) ; Ulrich;
Heinrich; (Heidelberg, DE) |
Correspondence
Address: |
HOUSTON ELISEEVA
4 MILITIA DRIVE, SUITE 4
LEXINGTON
MA
02421
US
|
Assignee: |
Leica Microsystems CMS GmbH
Ernst-Leitz-Strasse 17-37
Wetzlar
DE
D-35578
|
Family ID: |
34395048 |
Appl. No.: |
11/415041 |
Filed: |
May 1, 2006 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
|
PCT/EP04/52268 |
Sep 22, 2004 |
|
|
|
11415041 |
May 1, 2006 |
|
|
|
Current U.S.
Class: |
359/368 |
Current CPC
Class: |
G02B 21/06 20130101 |
Class at
Publication: |
359/368 |
International
Class: |
G02B 21/00 20060101
G02B021/00 |
Foreign Application Data
Date |
Code |
Application Number |
Sep 25, 2003 |
DE |
DE 103 44 410.6 |
Sep 10, 2004 |
DE |
DE 102004044309.2 |
Claims
1. Microscope with a light source that produces an illumination
light beam for evanescently illuminating a sample, wherein an
adjustment mechanism is provided with which the polarization of the
illumination light beam may be changed.
2. Microscope according to claim 1, wherein the microscope exhibits
an objective with an objective pupil, and wherein the illumination
light beam for evanescently illuminating the sample exhibits a
focus in the area, of the objective pupil.
3. Microscope according to claim 2, wherein an adjustable beam
deflector is provided with which the position of the focus within
the objective pupil may be moved.
4. Microscope according to claim 1, wherein the adjustment
mechanism comprises a phase plate, preferably a .lamda./2
plate.
5. Microscope according to claim 1, wherein the adjustment
mechanism comprises a Faraday rotator and/or a Pockels cell and/or
double-refractive material and/or a liquid crystal cell.
6. Microscope according to claim 1, wherein the adjustment
mechanism is the control element of a regulator.
7. Microscope according to claim 1, wherein a control mechanism is
provided for measuring and/or monitoring the polarization of the
illumination light beam.
8. Microscope according to claim 7, wherein the control mechanism
comprises a beam splitter that outcouples the measuring light from
the illumination light beam.
9. Microscope according to claim 7, wherein the control mechanism
comprises at least one detector that detects the light power of at
least a part of the measuring light.
10. Microscope according to claim 7, wherein the control mechanism
comprises at least one polarization analyzer, which is preferably
arranged in the beam path of the measuring light before the minimum
of one detector.
11. Microscope according to claim 10, wherein the polarization
analyzer comprises a polarization beam splitter.
12. Microscope according to claim 11, wherein the polarization beam
splitter splits the measuring light into an s-polarized measuring
beam and a p-polarized measuring beam.
13. Microscope according to claim 12, wherein one detector receives
the s-polarized measuring beam and another the p-polarized
measuring beam.
14. Microscope according to claim 7, wherein the control mechanism
is the measuring element of a regulator.
15. Microscope according to claim 1, wherein at least the light
source and the adjustment mechanism are integrated into an
illumination module.
16. Microscope according to claim 15, wherein the illumination
module comprises the control mechanism.
17. Microscope according to claim 15, wherein the microscope
exhibits a microscope stand, and wherein the illumination module is
detachably coupled to the microscope stand.
18. Microscope according to claim 1, wherein a camera and/or a CCD
element and/or an EMCCD element is provided for imaging.
19. Microscope according to one of claims 1 to 18, wherein a power
adjustment element is provided to change the light power of the
illumination light beam.
20. Microscope according to claim 1, wherein the microscope
comprises a scanning microscope, in particular a confocal scanning
microscope.
21. Illumination module with a light source that produces an
illumination light beam for evanescently illuminating a sample,
wherein an adjustment mechanism is provided with which the
polarization of the illumination light beam may be changed.
22. Illumination module according to claim 21, wherein the
microscope exhibits an objective with an objective pupil, and
wherein the illumination light beam for evanescently illuminating
the sample exhibits a focus in the area of the objective pupil.
23. Illumination module according to claim 22, wherein an
adjustable beam deflector is provided with which the position of
the focus within the objective pupil may be moved.
24. Illumination module according to claim 21, wherein the
adjustment mechanism comprises a phase plate, preferably a
.lamda./2 plate.
25. Illumination module according to claim 21, wherein the
adjustment mechanism comprises a Faraday rotator and/or a Pockels
cell and/or double-refractive material and/or a liquid crystal
cell.
26. Illumination module according to claim 21, wherein the
adjustment mechanism is the control element of a regulator.
27. Illumination module according to claim 21, wherein a control
mechanism is provided for measuring and/or monitoring the
polarization of the illumination light beam.
28. Illumination module according to claim 27, wherein the control
mechanism comprises a beam splitter that outcouples the measuring
light from the illumination light beam.
29. Illumination module according to claim 27, wherein the control
mechanism comprises at least one detector that detects the light
power of at least a part of the measuring light.
30. Illumination module according to claim 27, wherein the control
mechanism comprises at least one polarization analyzer, which is
preferably arranged in the beam path of the measuring light before
the minimum of one detector.
31. Illumination module according to claim 30, wherein the
polarization analyzer comprises a polarization beam splitter.
32. Illumination module according to claim 31, wherein the
polarization beam splitter splits the measuring light into an
s-polarized measuring beam and a p-polarized measuring beam.
33. Illumination module according to claim 32, wherein one detector
receives the s-polarized measuring beam and another the p-polarized
measuring beam.
34. Illumination module according to claim 27, wherein the control
mechanism is the measuring element of a regulator.
35. Illumination module according to claim 21, wherein at least the
light source and the adjustment mechanism are integrated into an
illumination module.
36. Illumination module according to claim 35, wherein the
illumination module comprises the control mechanism.
37. Illumination module according to claim 35, wherein the
microscope exhibits a microscope stand, and wherein the
illumination module is detachably coupled to the microscope
stand.
38. Illumination module according to claim 21, wherein a camera
and/or a CCD element and/or an EMCCD element is provided for
imaging.
39. Illumination module according to claim 21, wherein a power
adjustment element is provided to change the light power of the
illumination light beam.
40. Illumination module according to claim 21, wherein the
microscope comprises a scanning microscope, in particular a
confocal scanning microscope.
Description
RELATED APPLICATIONS
[0001] This application is a Continuation of PCT application serial
number PCT/EP2004/052268 filed on Sep. 22, 2004 which in turn
claims priority to German application serial number DE 103 44 410.6
filed on Sep. 25, 2003 and German application serial number DE 10
2004 044 309.2 filed on Sep. 10, 2004, both of which are
incorporated herein by reference in their entirety.
FIELD OF THE INVENTION
[0002] The invention relates to a microscope with a light source
that produces an illumination light beam for evanescently
illuminating a sample.
[0003] The invention further relates to an illumination module with
a light source that produces an illumination light beam.
BACKGROUND OF THE INVENTION
[0004] The task of the present invention is to disclose a
microscope that enables variable adjustment of the penetration
depth of illumination light during evanescent illumination of a
sample.
[0005] This task is solved by a microscope wherein an adjustment
mechanism is provided with which the polarization of the
illumination light beam may be changed.
[0006] A further task of the present invention is to disclose an
illumination module for a microscope that enables illumination of a
microscopic sample during evanescent sample of illumination with
adjustable penetration depth.
[0007] The further task is solved by an illumination module wherein
the illumination module can be coupled to a microscope for the
purpose of evanescent illumination of a sample, and wherein an
adjustment mechanism is provided with which the polarization of the
illumination light beam may be changed.
[0008] It has been recognized, according to the invention, that the
penetration depth (and the light power) of an evanescent
illumination field in a sample is dependent on the polarization of
the illumination light that strikes the cover glass-sample
interface or the sample holder-sample interface, respectively.
[0009] By means of the microscope according to the invention or the
illumination module according to the invention, respectively, the
orientation of sample objects (such as molecules, cell components,
etc.) may also advantageously be determined, as well as the
corresponding isotropy of the refracted space.
[0010] In a preferred variant, the microscope exhibits an objective
with an objective pupil, whereby the illumination light beam for
evanescently illuminating the sample exhibits a focus in the area
of the objective pupil. Preferably, an adjustable beam deflector is
provided with which the position of the focus within the objective
pupil may be moved. This creates an additional possibility for
changing the penetration depth.
[0011] It has also been recognized, according to the invention,
that in addition to the polarization, the penetration depth of an
evanescent illumination field in a sample is dependent on the angle
at which total reflection occurs at the cover glass interface or at
the sample holder interface, respectively. This angle is directly
correlated with the angle relative to the optical axis at which the
illumination light beam provided for evanescent sample illumination
exits the objective via the front lens. This angle, in turn, is
dependent on the distance to the optical axis at which the
illumination light beam passes through the rear focal plane of the
objective (pupil). In order to have available a largely parallel
illumination light beam for evanescently illuminating a sample, the
illumination light beam must exhibit a focus in the rear focal
plane of the objective. Finally, the distance of the focus to the
optical axis of the objective determines said angle, and thereby
the penetration depth of the evanescent field in the sample that is
to be tested.
[0012] In a preferred embodiment of the microscope according to the
invention, an adjustable beam deflector is arranged in the beam
path of the illumination light beam. The beam deflector preferably
comprises at least one galvanometric mirror. In order to position
the focus at any given location within the objective pupil, the
beam deflector preferably comprises two galvanometric mirrors,
which cause deflection of the illumination light beam in different
lateral directions (e.g., x- and y-direction). The beam deflector
may also comprise rotatable or tippable prisms and/or rotatable or
tippable mirrors. The use of acousto-optical or electro-optical
deflection elements can also be envisioned.
[0013] The adjustment mechanism with which the polarization of the
illumination light beam may be adjusted preferably comprises a
phase plate, preferably a rotatable .lamda./2 plate--preferably
motorized. The adjustment mechanism may also comprise a Faraday
rotator and/or a Pockels cell and/or a double-refractive material
and/or a liquid crystal cell.
[0014] In a particularly preferred embodiment of the microscope or
of the illumination module, respectively, the adjustment mechanism
is the control element of a regulator, which adjusts the
polarization according to settings input by the user.
[0015] In a very particularly preferred variant, storage memory is
provided in which--preferably sample-specific--polarization
settings are stored to achieve different penetration depths. In
this manner, adjustment, according to the invention, is
quantifiable and reproducible.
[0016] A control mechanism is preferably provided to measure and/or
monitor the polarization of the illumination light beam. In a
preferred variant, the control mechanism is the measuring element
of the regulator.
[0017] Advantageously, the control mechanism may comprise a beam
splitter that outcouples the measuring light from the illumination
light beam. In an advantageous embodiment, the control element
comprises at least one detector that detects the light power of at
least a part of the measuring light.
[0018] A particularly preferred variant is one in which the control
mechanism comprises at least one polarization analyzer, which is
preferably arranged in the beam path of the measuring light before
the minimum of one detector. It may, for example, be a polarization
foil, a double-refractive prism (e.g., a Glan-Thomson prism), or a
polarization beam splitter, which may, for example, be implemented
as a cube.
[0019] In a particular embodiment of the microscope or of the
illumination module, respectively, the polarization beam splitter
splits the measuring light into an s-polarized measuring beam and a
p-polarized measuring beam. Preferably, two detectors are provided,
of which one detector receives the s-polarized measuring beam and
the other the p-polarized measuring beam. In this manner, precise
conclusions may be drawn from the light power measured by both
detectors regarding the polarization of the illumination light
beam. Preferably, a processing module is provided with which the
measurement data are processed. The processing module may also be a
component of the regulator.
[0020] At least the light source and the adjustment mechanism are
preferably integrated into an illumination module that may be
detachably coupled to a microscope stand or to an already existent
microscope. The illumination module preferably also comprises the
control mechanism. A bayonet coupling is preferably provided.
[0021] The microscope preferably comprises a camera and/or a CCD
element and/or an EMCCD element for the purpose of imaging.
[0022] In a preferred variant, a power adjustment mechanism is
provided to change the light power of the illumination light beam.
This may, for example, be a mechanical beam attenuator, an LCD
module, or an electro-optical--or acousto-optical--component (e.g.,
AOTF).
[0023] The microscope preferably comprises a scanning microscope,
in particular a confocal scanning microscope.
[0024] In a particular variant, at least the light source and the
adjustment mechanism are integrated into an illumination module,
which preferably may be coupled to a microscope and/or to a
microscope stand.
[0025] The illumination module according to the invention provides
the advantage that it may be coupled as a retrofit to an already
existent microscope or microscope stand.
SUMMARY OF THE INVENTION
[0026] It is a task of the present invention to disclose a
microscope that enables variable adjustment of the penetration
depth of illumination light, in particular for evanescent
illumination of a sample.
[0027] This task is solved by a microscope, wherein an adjustment
mechanism is provided with which the spatial position of the focus
within the plane of the objective pupil may be changed.
[0028] A further task of the present invention is to disclose an
illumination module for a microscope that enables illumination of a
microscopic sample, in particular for evanescent sample
illumination with adjustable penetration depth.
[0029] The further task is solved by an illumination module,
wherein the illumination module may be coupled to a microscope such
that the illumination light beam in the plane of the objective
pupil of the microscope exhibits a focus, and wherein the
illumination module comprises an adjustment mechanism with which
the spatial position of the focus within the plane of the object
pupil may be changed.
[0030] It has been recognized, according to the invention, that the
penetration depth of an evanescent illumination field in a sample
is dependent on the angle at which total reflection at the cover
glass interface or at the sample holder interface occurs. This
angle is directly correlated with the angle relative to the optical
axis at which the illumination light beam which is provided for
evanescent sample illumination exits from the objective via the
front lens. This angle, in turn, is dependent upon the distance
from the optical axis at which the illumination light beam passes
through the rear focal plane of the objective (pupil). In order to
have available a largely parallel illumination light beam for the
purpose of evanescent sample illumination, the illumination light
beam must exhibit a focus in the rear focal plane of the objective.
Finally, the distance of the focus to the optical axis of the
objective determines the aforementioned angle, and therewith the
penetration depth of the evanescent field in the sample to be
tested.
[0031] In a preferred embodiment of the microscope according to the
invention, the adjustment mechanism comprises an adjustable beam
deflector that is arranged in the beam path of the illumination
light beam. Preferably, the beam deflector comprises at least one
galvanometric mirror. In order to position the focus at any given
location within the objective pupil, the beam deflector preferably
comprises two galvanometric mirrors, which cause deflection of the
illumination light beam in different lateral directions (e.g., x-
and y-direction). The beam deflector may also comprise rotatable or
tippable prisms and/or rotatable or tippable mirrors. The use of
acousto-optical or electro-optical deflection elements can also be
envisioned.
[0032] In a further embodiment of the invention, the adjustment
mechanism comprises a light-conducting fiber which is at least
partially movable. In this variant, mechanical positioners are
preferably provided that enable the light outgoing end of the
light-conducting fiber to be positioned precisely within the
objective pupil. The illumination light beam in this further
development of the invention is focused onto the light incoming end
of the light-conducting fiber, conveyed through the
light-conducting fiber, and de facto again exhibits a focus at the
outcoupling end that is positioned within the objective pupil,
because of the small diameter of customarily used light-conducting
fibers.
[0033] As previously explained, it is particularly important to
adjust the distance of the focus of the illumination light beam in
the objective pupil relative to the optical axis of the objective
in order to adjust the penetration depth of the evanescent field in
the sample region.
[0034] It can be particularly advantageous for certain applications
to drive the adjustment mechanism such that the focus describes a
selectable curve path within the objective pupil plane. By so
doing, particularly homogeneous illumination can, for example, be
achieved. In certain experiments, it is possible with this variant
to effect constant alternation in polarization direction. In a
particularly preferred embodiment of the invention, the curve path
is a circular path. An embodiment of the invention in which the
curve path is a circular path the midpoint of which lies on the
optical axis of the objective is very particularly preferred. In
this variant, the penetration depth remains constant while the
focus describes the circle of the curve path, whereby, however, the
illumination light beam that exits from the objective is
continuously coupled to the cover glass or to the sample holder
from various directions. It is also possible to select different
coupling directions in order to compare the resultant, possibly
different, images of the sample.
[0035] In a very preferred variant, a compensating optic is
provided in order to compensate for unevennesses in the objective
pupil plane.
[0036] Preferably, the microscope objective is exchangeable (e.g.,
objective turret), whereby a compensating optic is provided to
compensate for the various pupil positions of different objectives.
The distances between the front focal plane and the rear focal
plane may differ from objective to objective, which may lead to
problems because in order to achieve optimal evanescent sample
illumination, the focus of the illumination light beam must lie
more or less exactly in the objective pupil. The aforementioned
compensating optic, which may for example, be a zoom optic or
several exchangeable optics arranged on a turret, compensates for
these differences in distance.
[0037] In a preferred embodiment of the microscope according to the
invention, a light trap is provided to eliminate unused
illumination light. Only a portion of the illumination light
coupled to the cover glass or sample holder actually evanescently
illuminates the sample. The light, which again exits from the cover
glass or from the sample holder after several total reflections,
many return to the microscope again and lead to imaging
disturbances (as a result, for example, of scattered light). This
is avoided, according to the invention, by a suitably arranged
light trap.
[0038] In a particularly preferred embodiment of the microscope, a
switch is provided for switching between classic incident
illumination and evanescent sample illumination. The switch may,
for example, comprise a wing mirror.
[0039] Preferably, the light cone is variable, in particular for
changing the azimuth. An aperture optic such as an iris optic
arranged in the intermediate image plane may be provided in order
to set the diameter of the illumination light beam that exits from
the microscope objective.
[0040] In a particular embodiment a camera is provided for imaging.
The camera may, in a particularly preferred variant, be implemented
as a color camera, or as a CCD camera.
[0041] Preferably, the objective exhibits a numeric aperture that
is greater than 1.4, in particular greater than 1.45, in particular
greater than 1.6. Preferably, the numeric aperture of the objective
is 1.45 or 1.65.
[0042] In a particular variant, at least the light source and the
adjustment mechanism are incorporated in a single illumination
module, which can preferably be coupled to a microscope and/or a
microscope stand.
[0043] The illumination module, according to the invention, offers
the advantage that it may be coupled as a retrofit to a preexistent
microscope or microscope stand.
BRIEF DESCRIPTION OF THE DRAWINGS
[0044] The object of the invention is schematically represented in
the diagram, and is described below on the basis of figures,
wherein elements that have the same function are given the same
reference numbers. They show:
[0045] FIG. 1 a microscope according to the invention:
[0046] FIG. 2 a further microscope according to the invention,
and
[0047] FIG. 3 a further microscope according to the invention with
an illumination module.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
[0048] FIG. 1 shows a microscope 1 according to the invention with
an objective 3 and a light source 5, which is implemented as a
laser 7 and which produces an illumination light beam 9. The
illumination light beam 9 emitted by the light source 5 enables
evanescent illumination of a sample 11 that is positioned on a
sample holder 13. The illumination light beam 9 exhibits a focus
19, which is represented by a point, on the plane 15 of the
objective pupil 17. Several optical elements for directing and
shaping the beam are located in the beam path of the microscope 1.
There may, for example, be a first optic 21, a second optic 23, and
an optic 25, which produce a first intermediate image plane 27 and
a second intermediate image plane 29. An adjustment mechanism 31 is
provided with which the polarization of the illumination light beam
9 may be changed. The adjustment mechanism 31 is implemented as a
.lamda./2 plate 33 that is rotatable around the optical axis. For
each rotational position of the .lamda./2 plate 33 there is an
associated resultant polarization setting of the illumination light
beam 9. The penetration depth in the sample 11 and the light power
of the evanescent field may be varied with the adjustment mechanism
31. The .lamda./2 plate 33 is rotated by a servomotor 51.
[0049] The detection light 35 issuing from the sample 11 passes
through the objective 3 as well as through the beam splitter 39,
which directs the illumination light beam 9 to the objective 3, and
through it to a detector 41, which is implemented as a CCD camera.
The beam splitter 39 is implemented as a dichroic beam splitter,
and designed such that the light at the wavelength of the
illumination light beam is reflected, whereas light at the
wavelength of the detection light 35 may pass through.
[0050] The detection light data are transferred to a data
processing module 45. Correlation of image objects with various
layer depths of the sample from the first and the second detection
light data ensues in the data processing module 45, and a 3-D data
stack is produced, which is displayed as a three-dimensional image
of the sample 11 or of the illuminated area of the sample on a
display monitor 47 of a PC 49.
[0051] In order to measure and monitor the set polarization of the
illumination light beam 9, a beam splitter 53 is arranged in the
further beam path of the illumination light beam 9, which splits
off a small portion of the illumination light beam 9 as a measuring
beam 55 for polarization measurement. The measuring beam 55 is
split by a polarization beam splitter 57 into an s-polarized
partial beam 63, which is detected by a first detector 59, and a
p-polarized partial beam 65, which is detected by a second detector
61. Conclusions may be drawn about the polarization of the
illumination light beam 9 from the ratio of the light power
measured by the first detector 59 and by the second detector 61.
The rotational position of the .lamda./2 plate 33 is set according
to user input via a feedback system, which is not shown. The
processing module 67 receives the measurement signals from the
first detector 59 and the second detector 61, as well as the user
input settings from the PC, and adjusts the rotational position of
the .lamda./2 plate 33 with the help of the servomotor 51. Memory
is provided in the PC 49 in which are stored the sample-specific
polarization settings for achieving various penetration depths such
that the user may input penetration depths directly without having
to determine the associated polarization setting.
[0052] FIG. 2 shows a further microscope according to the invention
in which in addition to the adjustment mechanism 31 for setting the
polarization of the illumination light beam, the spatial position
of the focus 19 within the plane 15 of the objective pupil 17 may
also be adjusted with the help of an adjustable beam deflector 69.
The adjustable beam deflector 69 comprises a cardanically suspended
rotating mirror, which is not shown. The distance of the focus 19
to the optical axis 71 of the objective 3 may be adjusted, and the
penetration depth of the illumination light beam in the sample 11
thereby varied using the adjustment mechanism 31.
[0053] FIG. 3 shows a further microscope according to the invention
with an illumination module 73 that has already been coupled to an
existent microscope 75 to achieve adjustable evanescent
illumination with regard to penetration depth and with regard to
illumination light power. The illumination module 73 exhibits a
bayonet mount, which is not shown, for optical mounting to the
microscope 75. Furthermore, the illumination module 73 also
exhibits plugs, also not shown, for the electrical and electronic
connections.
[0054] The invention was described in relation to a particular
embodiment. However, it is clear that changes and variations may be
implemented without abandoning the scope of the following
claims.
* * * * *