U.S. patent application number 11/109168 was filed with the patent office on 2006-10-19 for "run-to-run control system and operating method of the same".
Invention is credited to Hung-Wen Chiou.
Application Number | 20060235559 11/109168 |
Document ID | / |
Family ID | 37037361 |
Filed Date | 2006-10-19 |
United States Patent
Application |
20060235559 |
Kind Code |
A1 |
Chiou; Hung-Wen |
October 19, 2006 |
"RUN-TO-RUN CONTROL SYSTEM AND OPERATING METHOD OF THE SAME"
Abstract
A run-to-run control system and a run-to-run controlling method
are proposed. The tool process parameters are real-time collected
during the semiconductor process is performed and are regarded as
the effective factors in the process for providing an optimal
operation variables to the tool for the next process run. After
modeling the metrology parameters with a set of the tool process
parameters with respect to the semiconductor process for its
corresponding process run, a set of optimal operation variables is
determined by the controller and output to the tool to modify the
process recipe of the process. Hence, the process recipe is
real-time changed with the process environment to obtain the
optimal process performance.
Inventors: |
Chiou; Hung-Wen; (Hsinchu
City, TW) |
Correspondence
Address: |
J.C Patents, Inc.
Suite 250
4 Venture
Irvine
CA
92618
US
|
Family ID: |
37037361 |
Appl. No.: |
11/109168 |
Filed: |
April 18, 2005 |
Current U.S.
Class: |
700/109 |
Current CPC
Class: |
G05B 19/41865 20130101;
Y02P 90/26 20151101; Y02P 90/20 20151101; Y02P 90/02 20151101 |
Class at
Publication: |
700/109 |
International
Class: |
G06F 19/00 20060101
G06F019/00 |
Claims
1. A run-to-run control system for controlling a first tool to
perform a first semiconductor process for a plurality of process
runs, the run-to-run control system comprising: means for
determining whether a set of metrology parameters of the first
process is ready; means for receiving a set of tool process
parameters of a first process run of the process runs and the set
of the metrology parameters when the set of the metrology
parameters of the first process run is ready, wherein the set of
the metrology parameters characterizes a process performance of the
first tool for each process run and the set of the tool process
parameters characterizes a process environment during the first
semiconductor process performed by the first tool; means for
determining and updating a modeling set by applying the set of
metrology parameters and the set of the tool process parameters to
a multi-variable modeling function; means for determining a set of
optimal operation variables for the first tool for a second process
run posterior to the first process run by applying at least a
control rule to the modeling set; and means for providing the set
of optimal operation variables to the first tool for processing the
second process run.
2. The run-to-run control system of claim 1 further comprising:
means for real-time collecting sets of process parameters during
the first semiconductor process performed by the first tool in the
first process run; means for clustering the process parameters into
a plurality of process parameter categories; and means for
characterizing the process parameters in every process category to
form the set of the tool process parameters.
3. (canceled)
4. The run-to-run control system of claim 1 further comprising:
means for providing a feed-forward signal from a second tool to the
means for determining the set of optimal operation variables,
wherein a second semiconductor process prior to the first
semiconductor process in a semiconductor manufacturing procedure is
performed with the second tool.
5. The run-to-run control system of claim 4, wherein the means for
determining the set of optimal operation variables for the first
tool for the second process run further refers to the feed-forward
signal.
6. A method for run-to-run controlling a first tool to perform a
first semiconductor process for a plurality of process runs, the
method comprising: determining whether a set of metrology
parameters of the first process run is ready; receiving a set of
tool process parameters of a first process run of the process runs
and the set of the metrology parameters when the set of the
metrology parameters of the first process run is ready, wherein the
set of the metrology parameters characterizes a process performance
of the first tool for each process run and the set of the tool
process parameters characterizes a process environment during the
first semiconductor process is performed by the first tool;
determining and updating a modeling set by applying the set of
metrology parameters and the set of the tool process parameters to
a multi-variable modeling function; determining a set of optimal
operation variables for the first tool for a second process run
posterior to the first process run by applying a plurality of
control rules to the modeling set; and providing the set of optimal
operation variables to the first tool for processing the second
process run.
7. The method of claim 6, wherein before the step of receiving the
tool process parameters and the metrology parameters, the method
further comprises: real-time collecting sets of process parameters
during the first semiconductor process performed by the first tool
in the first process run; clustering the process parameters into a
plurality of process parameter categories; and characterizing the
process parameters in every process category to form the set of the
tool process parameters.
8. (canceled)
9. The method of claim 6, wherein before the step of determining
the set of optimal operation variables for the first tool for the
second process run, the method further comprises steps of:
providing a feed-forward signal from a second tool, wherein a
second semiconductor process prior to the first semiconductor
process in a semiconductor manufacturing procedure is performed by
the second tool.
10. The method of claim 9, wherein the step for determining the set
of optimal operation variables for the first tool for the second
process run is performed not only by applying the control rules to
the modeling set but also by referring to the feed-forward signal.
Description
BACKGROUND OF THE INVENTION
[0001] 1. Field of Invention
[0002] The present invention relates to a control system and a
method for operating the system. More particularly, the present
invention relates to a run-to-run control system and a run-to-run
controlling method.
[0003] 2. Description of Related Art
[0004] Currently, in the semiconductor process, a metrology process
for checking the process performance is performed every several
process runs. The metrology process includes several measurement
categories, such as thickness, depth, uniformity, critical
dimension, defect count, film quality etc. When the result of the
metrology process of the current tool shows that the process
performance is abnormal, a feed-back signal is transmitted to the
process controller of the current tool to modify the current
process recipe in order to adjust the process performance to be
normal. Sometimes, if the performance shifting of the current tool
is not serious, a feed-forward signal is transmitted from the
current tool to another tool for performing a semiconductor process
next to the current semiconductor process in the semiconductor
manufacturing procedure. By referring to the feed-forward signal,
the performance shifting caused by the current tool can be
compensated by the subsequent semiconductor process.
[0005] However, the metrology process is not performed for every
process run of each wafer since it takes long time to perform the
metrology process. Hence, the result of the metrology process does
not real-time reflect the timing at which the process performance
starts to change due to the variation of the process environment.
Even though the feed-back signal used for modifying the current
process recipe and the feed-forward signal used for modifying the
current process recipe to compensate the previous performance
shifting are provided, the modified process recipe does not
instantly respond to the change of the process environment.
Therefore, the modified process recipe is not the optimal process
recipe for the current tool to perform the current semiconductor
process on that moment.
SUMMARY OF THE INVENTION
[0006] Accordingly, at least one objective of the present invention
is to provide a run-to-run control system and a run-to-run
controlling method for controlling a tool to perform a
semiconductor process for a plurality of process runs. During the
process is performed by the tool, the tool process parameters are
real-time collected. By referring the tool process parameters of
the current process run or historic process runs with the metrology
parameters of the current process run or the historic process runs,
the model for relating the tool process parameters to the metrology
parameters is updated for each or several process runs and the
process controller can provide the optimal operation variables for
the tool every process run based on the modeling result from the
model. Hence, the process recipe is real-time changed with the
process environment to provide the optimal process performance.
[0007] To achieve these and other advantages and in accordance with
the purpose of the invention, as embodied and broadly described
herein, the invention provides a run-to-run control system for
controlling a first tool to perform a first semiconductor process
for a plurality of process runs. The run-to-run control system
comprises means for receiving a set of tool process parameters of a
first process run of the process runs and a set of metrology
parameters, wherein the set of the metrology parameters
characterizes a process performance of the first tool for each
process run and the set of the tool process parameters
characterizes a process environment during the first semiconductor
process is performed by the first tool. The run-to-run control
system also comprises means for determining a modeling set by
applying the set of metrology parameters and the set of the tool
process parameters to a multi-variable modeling function. Further,
the run-to-run control system comprises means for determining a set
of optimal operation variables for the first tool for a second
process run posterior to the first process run by applying a
plurality of control rules to the modeling set and means for
providing the set of optimal operation variables to the first tool
for processing the second process run.
[0008] In the present invention, the run-to-run control system may
further comprises means for real-time collecting sets of process
parameters during the first semiconductor process is performed by
the first tool in the first process run, means for clustering the
process parameters into a plurality of process parameter categories
and means for characterizing the process parameters in every
process category to form the set of the tool process parameters,
wherein the tool process parameters may be obtained by calculating
the average, the sum or the maximum value of the process parameters
in each category. Moreover, the run-to-run control system also
comprises means for determining whether the metrology parameters of
the first process run are ready. Therefore, means for determining
optimal operation variables is computed by the most updated
modeling set created by using the historic metrology parameters and
the corresponding tool process parameters prior to the first
process run in the process runs when the set of the metrology
parameters of the first process run is not ready and means for
determining the modeling set is updated by using the metrology and
tool process parameters of the first process run when the set of
the metrology parameters of the first process run is ready.
Further, the run-to-run control system comprises means for
providing a feed-forward signal from a second tool to the means for
determining the set of optimal operation variables, wherein a
second semiconductor process prior to the first semiconductor
process in a semiconductor manufacturing procedure is performed by
the second tool. Also, in the run-to-run control system, the means
for determining the set of optimal operation variables for the
first tool for the second process run further refers to the
feed-forward signal.
[0009] The present invention also provides a method for run-to-run
controlling a first tool to perform a first semiconductor process
for a plurality of process runs. The method comprises steps of
receiving a set of tool process parameters of a first process run
of the process runs and a set of metrology parameters, wherein the
set of the metrology parameters characterizes a process performance
of the first tool for each process run and the set of the tool
process parameters characterizes a process environment during the
first semiconductor process is performed by the first tool. A
modeling set is determined by applying the set of metrology
parameters and the set of the tool process parameters to a
multi-variable modeling function. A set of optimal operation
variables for the first tool for a second process run posterior to
the first process run is determined by applying a plurality of
control rules to the modeling set. The set of optimal operation
variables is provided to the first tool for processing the second
process run.
[0010] In the present invention, before the step of receiving the
tool process parameters and the metrology parameters, the method
further comprises steps of real-time collecting sets of process
parameters during the first semiconductor process is performed by
the first tool in the first process run. The process parameters are
clustering into a plurality of process parameter categories and the
process parameters in every process category are characterized to
form the set of the tool process parameters. Moreover, before the
step of receiving the tool process parameters and the metrology
parameters, the method further comprises steps of determining
whether the metrology parameters of the first process run is ready.
When the set of metrology parameters of the first process run is
not ready, the most updated modeling set created by using the
historic metrology parameters and corresponding tool process
parameters prior to the first process run is provided. When the set
of the metrology parameters of the first process run is ready, the
set of the metrology parameters of the first process run is
provided to update the modeling set. Before the step of determining
the set of optimal operation variables for the first tool for the
second process run, the method further comprises steps of providing
a feed-forward signal from a second tool, wherein a second
semiconductor process prior to the first semiconductor process in a
semiconductor manufacturing procedure is performed by the second
tool. In addition, the step for determining the set of optimal
operation variables for the first tool for the second process run
is performed not only by applying the control rules to the modeling
set but also by referring to the feed-forward signal.
[0011] It is to be understood that both the foregoing general
description and the following detailed description are exemplary,
and are intended to provide further explanation of the invention as
claimed.
BRIEF DESCRIPTION OF THE DRAWINGS
[0012] The accompanying drawings are included to provide a further
understanding of the invention, and are incorporated in and
constitute a part of this specification. The drawings illustrate
embodiments of the invention and, together with the description,
serve to explain the principles of the invention.
[0013] FIG. 1 is a process flow diagram, schematically illustrating
a run-to-run controlling method according to one of the preferred
embodiment of the present invention.
DESCRIPTION OF THE PREFERRED EMBODIMENTS
[0014] In the invention, a novel run-to-run control system and a
novel run-to-run controlling method are proposed. Because the tool
process parameters are real-time collected during the process is
performed and are regarded as the effective factors in the process
for providing a optimal operation variables to the tool for the
next run, the process recipe of the process is real-time changed
with the process environment to obtain the optimal process
performance.
[0015] FIG. 1 is a process flow diagram, schematically illustrating
a run-to-run controlling method according to one of the preferred
embodiment of the present invention. As shown in FIG. 1, in the
step S101, a first semiconductor process is currently preformed by
a first tool for a first process run. Meanwhile, in the step S103,
tool sensors (not shown) are real-time detecting a set of tool
process parameters. The set of the tool process parameters
characterizes a process environment during the first semiconductor
process is performed by the first tool. The tool process parameters
include a plurality of categories comprising the gas flow, the
pressure, the power, the process time, temperature, exposure dosage
etc. Furthermore, the method for the tool sensors to provide the
set of the tool process parameters can, for example but not limited
to, comprises the steps of real-time detecting a set of process
parameters every defined sampling time during the first
semiconductor process is performed by the first tool in the first
process run. Then, the collected process parameters are clustered
into a plurality of process parameter categories such as gas flow,
the pressure, the power, the process time, temperature and exposure
dosage. Furthermore, the process parameters in every process
category are characterized to form the set of the tool process
parameters. For example but not limited to, for the process
parameters in the same process category, the process parameters'
characterized value, such as the average value of the process
parameters, the sum of the process parameters or the maximum value
of the process parameters, is used as the tool process parameter of
the category.
[0016] After the first tool is done with the first semiconductor
process for the first process run, a metrology process 200 is
performed by a metrology tool to evaluate the process performance
of the first tool for the first process run. In the step S105, a
decision for determining whether the metrology parameter of the
first process run is ready is made. That is, in this step, the
metrology process for obtaining the metrology parameters
representing the process performance of the first tool for the
first process run may not be finished. When the determining result
is that the metrology parameters of the first process run are not
ready, a most updated modeling set created by using the historic
metrology and the tool process parameters from step S103 are
provided for the next step S109. In other words, the modeling set
is not updated. When the determining result shows that the
metrology parameters of the first process run are ready, the
metrology parameters of the first process run are provided to
update the modeling set for the next step S107. The categories of
the metrology parameters include, for example, thickness, depth,
critical dimension, film quality, defect counts overlay offset
parameters, yield etc.
[0017] In the step S107, both the set of metrology parameters and
the corresponding set of the tool process parameters are provided
to a modeling means. Based on a model, the modeling means relates
the set of the metrology parameters to the tool process parameters
to generate a modeling set. The model can be a multi-variable
function with the tool process parameters as the input variables of
the function and with the metrology parameters as output of the
function. The model means can be a computer program code consisted
of several sub-program code and program segments. Further, the
modeling set comprises tool process arguments and metrology
arguments.
[0018] Thereafter, in the step S109, the most updated modeling set
and the most updated tool process parameters from the step S103 are
provided to a process controller (not shown). In the process
controller, by applying a plurality of control rules to the
modeling set, a set of optimal operation variables for the first
tool for a second process run subsequent to the first process run
is determined. The control rules may comprise the concept of
maximizing a portion of the metrology arguments such as yield and
minimizing a portion of the metrology arguments such as overlay
effect in the modeling set. More specifically, for the tool process
arguments with respect to the yield of the metrology arguments, the
value of the tool process arguments is adjusted to maximize the
value of the metrology argument, wherein the adjustment range for
the value of the tool process arguments is limited by the operation
variable range of the first tool. This concept can be represented
by the following expression: Max Process .times. .times. Arguments
.function. ( Yield ) , ##EQU1## wherein Yield=function (x.sub.1,
x.sub.2, . . . ), x.sub.1=process argument 1, x.sub.2=process
argument 2 and the formula of Yield function is created in the step
S107. Meanwhile, for the tool process arguments with respect to the
metrology arguments possessing the need for meeting the ideal
performance values, the value of the tool process arguments is
adjusted to minimizing the summation value of difference between
the metrology arguments and the ideal performance values/target
value respectively, wherein the adjustment range for the value of
the tool process arguments is subject to the operation variable
range of the first tool. This concept can be represented by the
following expression: Min Process .times. .times. Arguments .times.
( Metrology .times. .times. Arguments - Target .times. .times.
value ) 2 ##EQU2## , wherein Metrology arguments=function (x.sub.1,
x.sub.2, . . . ), x.sub.1=process argument 1, x.sub.2=process
argument 2 and the formula of the function is created in the step
S107.
[0019] In addition, in the step S111, a feed-forward signal from a
second tool 202 is provided to the controller while the set of
optimal operation variables is going to be determined, wherein a
second semiconductor process prior to the first semiconductor
process in a semiconductor manufacturing procedure is performed by
the second tool. Therefore, the decision for determining the set of
the optimal operation variables not only depends on applying the
control rules to the modeling set but also takes the feed-forward
signal into consideration. Hence, the optimal operation variables
not only real-time changes with the variation of the process
environment but also compensates the performance shifting caused by
a pre-tool during a pre-semiconductor process is performed by the
pre-tool, wherein the pre-semiconductor is prior to the first
semiconductor process in the semiconductor manufacturing
procedure.
[0020] Moreover, in the step S113, the set of optimal operation
variables for the first tool is input from the process controller
to the first tool in order to modify the process recipe for the
second process run.
[0021] The run-to-run control system for controlling the first tool
to perform the first semiconductor process for several process runs
comprises means for receiving a set of tool process parameters of a
first process run of the process runs and a set of metrology
parameters, means for determining a modeling set, means for
determining a set of optimal operation variables for the first tool
and means for providing the set of optimal operation variables to
the first tool for processing the second process run. More
specifically, the set of the metrology parameters characterizes a
process performance of the first tool for each process run and the
set of the tool process parameters characterizes a process
environment during the first semiconductor process is performed by
the first tool. Also, the modeling set can be determined by
applying the set of metrology parameters and the set of the tool
process parameters to a multi-variable modeling function (the step
S107). Moreover, the set of optimal operation variables is
determined by applying at least a control rule to the modeling set
(the step S109). Practically, the means in the run-to-run control
system for controlling the first tool corresponding to the steps of
the run-to-run controlling method mentioned above can be
represented by the computer program codes respectively. That is,
most of the steps performed in the run-to-run control system can be
performed by executing a computer program code via at least one
electric calculator, such as computer. Furthermore, the computer
program code mentioned above can be a program code consisted of
several sub-program code and program segments.
[0022] In addition, the run-to-run control system further comprises
several tool sensors for real-time collecting sets of process
parameters during the first semiconductor process is performed by
the first tool in the first process run, means for clustering the
process parameters into a plurality of process parameter categories
and means for characterizing the process parameters in every
process category to form the set of the tool process parameters.
Preferably, the means mentioned here in the run-to-run control
system can be represented by the computer program codes
respectively. That is, most of the steps performed in the
run-to-run control system can be performed by executing a computer
program code via at least one electric calculator, such as
computer. Furthermore, the computer program code mentioned above
can be a program code consisted of several sub-program code and
program segments.
[0023] Moreover, the run-to-run control system includes means for
determining whether the metrology parameters of the first process
run is ready (the step S105). When the set of the metrology
parameters of the first process run is ready, the modeling set is
updated using the metrology parameters and the tool process
parameters of the first process run. Also, the run-to-run control
system further comprises means for providing a feed-forward signal
from a second tool (the step 111) to the means for determining the
set of optimal operation variables, wherein a second semiconductor
process prior to the first semiconductor process in a semiconductor
manufacturing procedure is performed by the second tool. The set of
optimal operation variables for the first tool for the second
process run is determined by further referring to the feed-forward
signal (the step S109). For example but not limited to, the means
mentioned here in the run-to-run control system can be represented
by the computer program codes respectively. That is, most of the
steps performed in the run-to-run control system can be performed
by executing a computer program code via at least one electric
calculator, such as computer. Furthermore, the computer program
code mentioned above can be a program code consisted of several
sub-program code and program segments.
[0024] During the process is performed by the tool, the tool
process parameters which truly reflect the current process
environment for the current process run are real-time collected. By
referring the tool process parameters of the current process run
with the most updated model by using the latest metrology
parameters of the current process run or the historic process runs
and the corresponding tool process parameters, the process
controller provides the optimal operation variables for the tool
every process run. Hence, the process recipe is real-time changed
with the process environment to provide the optimal process
performance.
[0025] It will be apparent to those skilled in the art that various
modifications and variations can be made to the structure of the
present invention without departing from the scope or spirit of the
invention. In view of the foregoing descriptions, it is intended
that the present invention covers modifications and variations of
this invention if they fall within the scope of the following
claims and their equivalents.
* * * * *