U.S. patent application number 10/531277 was filed with the patent office on 2005-12-08 for image reading device and image reading method.
Invention is credited to Izumi, Yoshihiro, Oda, Tomohiko, Teranuma, Osamu, Uehara, Kazuhiro.
Application Number | 20050270590 10/531277 |
Document ID | / |
Family ID | 32171026 |
Filed Date | 2005-12-08 |
United States Patent
Application |
20050270590 |
Kind Code |
A1 |
Izumi, Yoshihiro ; et
al. |
December 8, 2005 |
Image reading device and image reading method
Abstract
The image reading device of the present invention includes (i) a
sensor substrate which functions as a photoelectric transfer
element having a photodetecting TFT and a pixel capacitor and (ii)
a driving IC for applying a voltage to a gate electrode of the
photodetecting TFT so as to drive the photodetecting TFT into an ON
state or an OFF state. The driving IC applies a voltage, whose
polarity is opposite to average polarity of a voltage making the
photodetecting TFT in the OFF state, to the gate electrode of the
photodetecting TFT in an arbitrary period. Thus, it is possible to
provide the image reading device which can suppress variation of a
photodetecting TFT property (resistance value) which is observed in
a short time.
Inventors: |
Izumi, Yoshihiro;
(Kashihara-shi, JP) ; Uehara, Kazuhiro;
(Tenri-shi, JP) ; Oda, Tomohiko; (Tenri-shi,
JP) ; Teranuma, Osamu; (Nara-shi, JP) |
Correspondence
Address: |
NIXON & VANDERHYE, PC
901 NORTH GLEBE ROAD, 11TH FLOOR
ARLINGTON
VA
22203
US
|
Family ID: |
32171026 |
Appl. No.: |
10/531277 |
Filed: |
April 13, 2005 |
PCT Filed: |
September 16, 2003 |
PCT NO: |
PCT/JP03/11794 |
Current U.S.
Class: |
358/474 ;
257/E27.146; 358/506 |
Current CPC
Class: |
H04N 1/0318 20130101;
H01L 27/14676 20130101 |
Class at
Publication: |
358/474 ;
358/506 |
International
Class: |
H04N 001/04 |
Foreign Application Data
Date |
Code |
Application Number |
Oct 24, 2002 |
JP |
2002-309967 |
Claims
1. An image reading device, which uses a thin film transistor
having a photo response property as a photodetecting element,
comprising driving means for applying a voltage to a gate electrode
of the thin film transistor so as to drive the thin film transistor
into an ON state or an OFF state, wherein the driving means applies
a voltage, whose polarity is opposite to average polarity of a
voltage making the thin film transistor in the OFF state, to the
gate electrode in an arbitrary period.
2. The image reading device as set forth in claim 1, wherein the
arbitrary period is a period in which image reading is not
performed.
3. The image reading device as set forth in claim 1, wherein a time
in which the voltage is applied in the arbitrary period is set so
that a rate indicating relative variation of a bright current of
the thin film transistor is within a range of from 0.9 to 1.1.
4. The image reading device as set forth in claim 1, the arbitrary
period is a period whose length is 3% to 30% with respect to an
entire period in which the thin film transistor is driven.
5. The image reading device as set forth in claim 1, wherein, when
images are sequentially read at an arbitrary cycle, the cycle
ranges from 0.1 Hz to 10 Hz.
6. The image reading device as set forth in claim 1, wherein the
photodetecting element functions as a pixel selection element for
selecting a pixel.
7. The image reading device as set forth in claim 1, wherein a
potential of the voltage applied to the gate electrode in the
arbitrary period is set to be equal to a potential of the voltage
making the thin film transistor in the ON state.
8. An image reading device, which uses a thin film transistor
having a photo response property as a photodetecting element,
comprising a driving circuit for applying a voltage to a gate
electrode of the thin film transistor so as to drive the thin film
transistor into an ON state or an OFF state, wherein the driving
circuit applies a voltage, whose polarity is opposite to average
polarity of a voltage making the thin film transistor in the OFF
state, to the gate electrode in an arbitrary period.
9. A flat bed scanner, provided with an image reading device which
uses a thin film transistor having a photo response property as a
photodetecting element, comprising a driving circuit for applying a
voltage to a gate electrode of the thin film transistor so as to
drive the thin film transistor into an ON state or an OFF state,
wherein the driving circuit applies a voltage, whose polarity is
opposite to average polarity of a voltage making the thin film
transistor in the OFF state, to the gate electrode in an arbitrary
period.
10. A handy scanner, provided with an image reading device which
uses a thin film transistor having a photo response property as a
photodetecting element, comprising a driving circuit for applying a
voltage to a gate electrode of the thin film transistor so as to
drive the thin film transistor into an ON state or an OFF state,
wherein the driving circuit applies a voltage, whose polarity is
opposite to average polarity of a voltage making the thin film
transistor in the OFF state, to the gate electrode in an arbitrary
period.
11. An image reading method, in which a document image is read by
detecting a photoelectric transfer amount of a photoelectric
transfer element which has (i) a thin film transistor having a
photo response property and (ii) a storage capacitor connected to
the thin film transistor, the method comprising: a first step of
charging the storage capacitor with a predetermined amount of
electric charge; a second step of discharging the electric charge
from the storage capacitor, by emitting light to the thin film
transistor while the thin film transistor is being in an OFF state,
after charging the storage capacitor with the electric charges; a
third step of detecting the photoelectric transfer amount of the
photoelectric transfer element by obtaining an amount of remaining
electric charge in the storage capacitor after discharging the
electric charge; and a fourth step, when the three steps are
regarded as one cycle of image reading, of applying a voltage,
whose polarity is opposite to average polarity of a voltage making
the thin film transistor in the OFF state, to a gate electrode of
the thin film transistor within a period in which the third step
shifts to the first step of a next cycle.
12. The method as set forth in claim 11, wherein a time in which
the voltage is applied to the gate electrode in the fourth step is
set so that a rate indicating relative variation of a bright
current of the thin film transistor is within a range of from 0.9
to 1.1.
13. The method as set forth in claim 11, wherein the fourth step is
carried out once in a plurality of cycles.
14. The method as set forth in claim 11, wherein the fourth step is
carried out in a period whose length is 3% to 30% with respect to
an entire period in which the thin film transistor is driven.
15. The method as set forth in claim 11, wherein the cycle ranges
from 0.1 Hz to 10 Hz.
16. The method as set forth in claim 11, wherein a potential of the
voltage applied to the gate electrode in the fourth step is set to
be equal to a potential of the voltage making the thin film
transistor in the ON state.
17. The method as set forth in claim 11, wherein application of the
voltage to the gate electrode that should be performed in the
fourth step is performed not in the fourth step but in a period in
which the storage capacitor is charged with a predetermined amount
of the electric charge in the first step of the next cycle.
18. The method as set forth in claim 11, wherein the thin film
transistor functions as both a pixel selection element for
selecting a pixel and the photodetecting element.
Description
TECHNICAL FIELD
[0001] The present invention relates to an image reading device and
an image reading method in which a thin film transistor having a
photo response property is used as a photodetecting element.
BACKGROUND ART
[0002] There has been widely used a flat bed scanner, which can
read a two-dimensional image by causing a linear sensor (CCD linear
sensor and the like) whose pixels are disposed in a line manner (X
direction) to perform line scanning (Y direction), as a
contact-type image reading device for reading a document or a
photograph.
[0003] However, since a scanner having such linear sensor includes
a mechanical scanning system for reading the two-dimensional image,
there is limit in making the scanner thinner and lighter, so that
there arises such a problem that it is difficult to improve a
reading speed.
[0004] Then, there is developed an active-matrix-type
two-dimensional image sensor (image reading device), in which
photodetecting elements (photodiode, phototransistor, and the like)
and switching elements (thin film transistor and the like) are
disposed in a two-dimensional manner, so as to make the image
reading device thinner and lighter and to improve the reading
speed.
[0005] According to the method, it is possible to read the
two-dimensional image without using the mechanical scanning system,
so that it is possible to realize not more than {fraction (1/10)}
thickness, weight, and the reading time, compared with "flat bed
scanner" using a conventional CCD line sensor, thereby realizing an
image reading device which can be conveniently used.
[0006] An example of the active-matrix-type image reading device is
an active-matrix-type image reading device disclosed in Patent
Document 1: Japanese Utility Model Publication No. 8055/1990
(Jitsukaihei 2-8055) (Publication date: Jan. 18, 1990) and Patent
Document 2: Japanese Unexamined Patent Publication No. 243547/1993
(Tokukaihei 5-243547) (Publication date: Sep. 21, 1993).
[0007] An active matrix array (active matrix substrate) used in the
active-matrix-type image reading device includes pixels disposed in
an XY matrix manner as shown in FIG. 21, and each pixel has a
photodetecting thin film transistor (referred to as photodetecting
TFT), a switching thin film transistor (referred to as switching
TFT), and a pixel capacitor (storage capacitor).
[0008] FIG. 32 shows a property of the photodetecting TFT of the
pixel. When light reflected by a surface of a document is incident
on the TFT under such condition that a voltage of a gate electrode
is set to Vgl so as to turn OFF the TFT (a condition under which a
source-drain electrode functions as a high resistor), a
source-drain current increases from a dark current (I dark) to a
bright current (I photo). That is, a resistance value of the TFT is
made lower.
[0009] Note that, a photodetecting principle, in which photo
response of the source-drain current of the TFT which is turned OFF
is utilized, is disclosed in Patent Document 3: Japanese Unexamined
Patent Publication No. 18978/1983 (Tokukaisho 58-18978)
(Publication date: Feb. 3, 1983). When the principle is used, a
size of I photo varies depending on brightness of a photogenic
subject such as a document surface, i.e., a reflection coefficient
of light, so that differences occur in an amount of an electric
charge stored in the storage capacitor of each pixel (or discharged
from the storage capacitor) due to differences in I photo. Electric
charge amount distributions (in-plane distributions) of the storage
capacitor are sequentially read by using the switching TFT of the
active matrix substrate, so that it is possible to obtain the
two-dimensional information of the photogenic subject.
[0010] Generally, in the TFT, a-Si (amorphous silicon) or poly-Si
(polycrystalline silicon) are used as a semiconductor material, and
SiN or SiO.sub.2 obtained by performing a plasma CVD film formation
is used as a material for a gate insulating film. It is known that:
the TFT is driven for an extended period of time in such a state
that a bias stress is applied to the gate electrode, so that
carrier is injected into the gate insulating film or an interface
between the gate insulating film and a semiconductor film, thereby
shifting Vth (threshold value voltage). Then, it is pointed out
that: the shift of Vth has influence on a lifetime of a display
device or an X ray imaging device using such TFT.
[0011] For example, in case of using the TFT as a switching element
(address element) of the display device, when Vth of the TFT shifts
while being used for an extended period of time, there arises such
a problem that a display performance is deteriorated. Thus, for
example, Patent Document 4: Japanese Unexamined Patent Publication
No. 347753/1994 (Tokukaihei 6-347753) (Publication date: Dec. 22,
1994) discloses such method that: a voltage, whose polarity is
opposite to a bias applied to the gate electrode while the display
device is in an ON state, is applied to the gate electrode while
the display device is in an OFF state so as to restore the shift of
Vth of the TFT.
[0012] While, in case of using the TFT as a switching element
(address element) of the X ray imaging device, the shift of Vth of
the TFT makes a dynamic range of a detection signal smaller, so
that there arises such a problem that detection of a feeble signal
is unstable. Thus, for example, Patent Document 5: Japanese
unexamined Patent Publication No. 151669/2002 (Tokukai 2002-151669,
Publication date: May 24, 2002) (Corresponding U.S. application No.
U.S. 2002/0093581A1, Publication date: Jul. 18, 2002) discloses
such method that: a voltage, whose polarity is opposite to a bias
applied to the gate electrode while the device is operating, is
applied to the gate electrode while the device is not operating so
as to prevent Vth of the TFT from shifting.
[0013] Such shifting phenomenon of Vth of the TFT is regarded as a
troublesome problem caused in the case where the TFT is used as the
switching element of the display device or the X ray imaging device
and the device is used for an extended period of time. Further, in
order to solve the problem, trial to restore or prevent the Vth
shifting within the lifetime has been performed in view of using
the device for an extended period of time.
[0014] Incidentally, the present inventors found that a similar
problem occurs not only in the case of using the TFT as the
switching element (address element) as described above but also a
case of using the TFT as a photodetecting element (photodetecting
TFT).
[0015] Concretely, when Vgl (i.e., negative bias) was applied to a
photodetecting gate electrode, such variation that a value of I
dark or I photo gradually increases, that is, such variation that a
resistance value of the TFT gradually drops was found. Moreover,
not the Vth shifting in a long range that has been the troublesome
problem, but variation of the resistance value that occurs in an
extremely short time was observed. When a single TFT is measured by
using a probe, it was found that: as shown in FIG. 33, the
variation of the resistance value began right after a gate voltage
of Vgl (here, -10V) had been applied, and the resistance value
dropped so as not to exceed 20% in 15 minutes.
[0016] In the case of the conventional TFT used as the switching
element of the display device or the X ray imaging device, the TFT
is used merely as a switch for performing line-sequential address,
so that there is no problem in using the TFT as long as the
resistance value of the TFT is not less than a certain reference
(or not more than the reference). Thus, the variation of the
resistance value of the TFT which occurs in a short time such as 15
minutes has not been regarded as a problem conventionally.
[0017] However, in a case of an image reading device using the TFT
as the photodetecting element, the resistance value shifting of the
TFT occurs as variation of the detection signal. Thus, there arises
the following problem.
[0018] Generally, in the image reading device, a calibration
operation is performed before using the device (for example, right
after a power source is turned ON), and sensitivity of the
photodetecting TFT element and correction data of a gray scale
property are obtained. Further, in the next step, actual image
reading is performed, and image correction is performed on the
basis of the aforementioned correction data.
[0019] However, when the resistance value of the TFT varies in a
short time as described above, there arises such a problem that it
is impossible to perform proper image correction on the basis of
the correction data obtained in the first calibration operation. In
order to solve the problem, calibration may be performed frequently
(for example, every time an image is obtained), but this method is
not preferable since the operability of the image reading device is
largely lowered.
[0020] Further, when influences exerted by the short-time
variations of the TFT are accumulated, this causes such large
variation that it is possible to restore the data, so that
long-time reliability may be lost.
[0021] Thus, the following fact was found: in the case of using the
TFT as the photodetecting element (photodetecting TFT), it is
required to suppress the variation of the resistance value of the
TFT, that is observed in a short-time (approximately 15 minutes)
sequential operation, so as not to exceed 10%, so that any solution
for this problem is required.
[0022] The present invention was conceived in view of the foregoing
problems, and its object is to provide an image reading device and
an image reading method by which it is possible to inhibit the
photodetecting TFT property (resistance value) observed in a short
time.
DISCLOSURE OF INVENTION
[0023] The image reading device of the present invention, which
uses a thin film transistor having a photo response property as a
photodetecting element, includes a driving circuit for applying a
voltage to a gate electrode of the thin film transistor so as to
drive the thin film transistor into an ON state or an OFF state,
wherein the driving circuit applies a voltage, whose polarity is
opposite to average polarity of a voltage making the thin film
transistor in the OFF state, to the gate electrode in an arbitrary
period.
[0024] According to the arrangement, by applying a voltage, whose
polarity is opposite to average polarity of the voltage making the
thin film transistor in the OFF state, to the gate electrode in the
arbitrary period, it is possible to prevent disadvantage which
occurs in case of keeping on applying the voltage, making the thin
film transistor in the OFF state, to the gate electrode, that is,
it is possible to suppress the short-time variation of a resistance
value of the thin film transistor.
[0025] In this manner, by suppressing the short-time variation of
the resistance value of the thin film transistor used as a
photodetecting element, it is possible to appropriately correct (i)
sensitivity of the thin film transistor and (ii) correction data
that has been obtained in a calibration operation performed to
obtain the correction data with respect to a gray scale
property.
[0026] As the correction data at this time, it is possible to use
first calibration data that has been obtained in a calibration
operation performed right after turning ON a power source of the
device, so that it is not necessary to frequently perform the
calibration operation unlike conventional techniques.
[0027] Further, influences of the short-time variation of the
resistance value of the thin film transistor are not accumulated,
so that there is no possibility that the variation is so large that
it is difficult to restore the variation. Thus, it is possible to
obtain the reliability kept for an extended period of time.
[0028] Therefore, it is possible to perform image reading stably
for an extended period of time. As a result, it is possible to
obtain such advantage that the operability and the reliability of
the image reading device are improved.
[0029] It is preferable that the arbitrary period is a period in
which the image reading is not performed so as not to influence the
image reading.
[0030] Generally, when the thin film transistor is used as a
photodetecting element, it is necessary to suppress the short-time
variation of the resistance value of the thin film transistor so as
not to exceed 10% in consideration for the light detection
accuracy.
[0031] Then, in order to suppress the short-time variation of the
resistance value of the thin film transistor so as not to exceed
10%, the following procedure is performed.
[0032] A time for applying a voltage in the arbitrary period is set
so that a rate indicating relative variation of a bright current of
the thin film transistor is within a range from 0.9 to 1.1.
[0033] Further, the arbitrary period is set to be a period whose
length is 3% to 30% with respect to an entire period in which the
thin film transistor is driven.
[0034] Further, when images are sequentially read at an arbitrary
cycle, the cycle is set to 0.1 Hz to 10 Hz.
[0035] Further, the photodetecting element may function as a pixel
selection element for selecting a pixel.
[0036] In this case, it is possible to realize an image reading
device, having a simple structure, which realizes highly-fine image
reading, and it is also possible to improve the operability and the
reliability of the device.
[0037] Further, a potential of a voltage applied to the gate
electrode in the arbitrary period may be set to be equal to a
potential of a voltage in the case where the thin film transistor
is in the ON state.
[0038] In this case, a potential of the voltage applied to the gate
electrode in the arbitrary period may be set to be equal to a
potential of a voltage making the thin film transistor in the ON
state, so that the voltage applied to the gate electrode can be
used as both (i) the voltage making the thin film transistor in the
ON state and (ii) a voltage which functions as the compensation
signal.
[0039] Thus, it is not necessary to switch the voltage in a
complicate manner, so that it is possible to simplify the structure
of the driver for driving the gate electrode. As a result, it is
possible to miniaturize the device and to reduce the power
consumption.
[0040] An image reading method, in which a document image is read
by detecting a photoelectric transfer amount of a photoelectric
transfer element which has (i) a thin film transistor having a
photo response property and (ii) a storage capacitor connected to
the thin film transistor, includes: a first step of charging the
storage capacitor with a predetermined amount of electric charge; a
second step of discharging the electric charge from the storage
capacitor, by emitting light to the thin film transistor while the
thin film transistor is being in an OFF state, after charging the
storage capacitor with the electric charges; a third step of
detecting the photoelectric transfer amount of the photoelectric
transfer element by obtaining an amount of remaining electric
charge in the storage capacitor after discharging the electric
charge; and a fourth step, when the three steps are regarded as one
cycle of image reading, of applying a voltage, whose polarity is
opposite to average polarity of a voltage making the thin film
transistor in the OFF state, to a gate electrode of the thin film
transistor within a period in which the third step shifts to the
first step of a next cycle.
[0041] According to the arrangement, by applying a voltage, whose
polarity is opposite to average polarity of the voltage making the
thin film transistor in the OFF state, to the gate electrode in the
arbitrary period, it is possible to prevent disadvantage which
occurs in case of keeping on applying the voltage, making the thin
film transistor in the OFF state, to the gate electrode, that is,
it is possible to suppress the short-time variation of a resistance
value of the thin film transistor.
[0042] In this manner, by suppressing the short-time variation of
the resistance value of the thin film transistor used as a
photodetecting element, it is possible to appropriately correct (i)
sensitivity of the thin film transistor and (ii) correction data
that has been obtained in a calibration operation performed to
obtain the correction data with respect to a gray scale
property.
[0043] As the correction data at this time, it is possible to use
first calibration data that has been obtained in a calibration
operation performed right after turning ON a power source of the
device, so that it is not necessary to frequently perform the
calibration operation unlike conventional techniques.
[0044] Further, influences of the short-time variation of the
resistance value of the thin film transistor are not accumulated,
so that there is no possibility that the variation is so large that
it is difficult to restore the variation. Thus, it is possible to
obtain the reliability kept for an extended period of time.
[0045] Therefore, it is possible to perform image reading stably
for an extended period of time. As a result, it is possible to
obtain such advantage that the operability and the reliability of
the image reading device are improved.
[0046] Moreover, within a period constituted of the first step to
the third step for image reading, i.e., within a period in which
the third step shifts to the first step of the next cycle, the
voltage having the opposite polarity is applied, so that the
application of the voltage does not influence the image
reading.
[0047] Thus, even in the case where images are sequentially read,
the application of the voltage does not influence the image
reading, so that it is possible to perform the image reading
stably. As a result, it is possible to improve the operability and
the reliability of the image reading device.
[0048] The fourth step may be carried out once in a plurality of
cycles.
[0049] In this case, it is possible to shorten a period from the
third step (excluding the fourth step) to the first step of the
next cycle, so that when images are sequentially read, it is
possible to give continuity to the read images until the fourth
step is carried out.
[0050] As described above, when the thin film transistor is used as
a photodetecting element, it is necessary to suppress the
short-time variation of the resistance value of the thin film
transistor so as not to exceed 10% in consideration for the
photodetection accuracy.
[0051] Then, in order to suppress the short-time variation of the
resistance value of the thin film transistor so as not to exceed
10%, the following procedure is performed.
[0052] A time in which the voltage is applied to the gate electrode
in the fourth step is set so that a rate indicating relative
variation of a bright current of the thin film transistor is within
a range of from 0.9 to 1.1.
[0053] Further, the fourth step is carried out in a period whose
length is 3% to 30% with respect to an entire period in which the
thin film transistor is driven.
[0054] Further, the cycle is set to 0.1 Hz to 10 Hz.
[0055] Further, the thin film transistor may function as both a
pixel selection element and the photodetecting element.
[0056] In this case, it is possible to realize an image reading
device, having a simple structure, which realizes highly-fine image
reading, and it is also possible to improve the operability and the
reliability of the device.
[0057] Further, a potential of the voltage applied to the gate
electrode in the arbitrary period may be set to be equal to a
potential of a voltage making the thin film transistor in the ON
state.
[0058] In this case, a potential of the voltage applied to the gate
electrode in the arbitrary period may be set to be equal to a
potential of a voltage making the thin film transistor in the ON
state, so that the voltage applied to the gate electrode can be
used as both (i) the voltage making the thin film transistor in the
ON state and (ii) a voltage which functions as the compensation
signal.
[0059] Thus, it is not necessary to switch the voltage in a
complicate manner, so that it is possible to simplify the structure
of the driver for driving the gate electrode. As a result, it is
possible to miniaturize the device and to reduce the power
consumption.
[0060] Further, application of the voltage to the gate electrode
that should be performed in the fourth step may be performed not in
the fourth step but in a period in which the storage capacitor is
charged with a predetermined amount of electric charge in the first
step of the next cycle.
[0061] In this case, it is not necessary to provide a period for
carrying out the fourth step, so that it is possible to shorten a
period from the third step to the first step of the next cycle.
[0062] Thus, when images are sequentially read, it is possible to
improve the reading speed, and it is also possible to improve the
operability of the device.
[0063] For a fuller understanding of the nature and advantages of
the invention, reference should be made to the ensuing detailed
description taken in conjunction with the accompanying
drawings.
BRIEF DESCRIPTION OF DRAWINGS
[0064] FIG. 1 is a block diagram schematically showing an
arrangement of an image reading device according to one embodiment
of the present invention.
[0065] FIG. 2 is a block diagram schematically showing an
arrangement of a two-dimensional image sensor provided with the
image reading device shown in FIG. 1.
[0066] FIG. 3 is a cross sectional view schematically showing an
arrangement of the image reading device shown in FIG. 1.
[0067] FIG. 4 is a block diagram schematically showing a sensor
substrate provided on the two-dimensional image sensor shown in
FIG. 2.
[0068] FIG. 5 is a flow chart of the reading operation of the image
reading device shown in FIG. 1.
[0069] FIG. 6 is an equivalent circuit diagram of the
two-dimensional image sensor shown in FIG. 2.
[0070] FIG. 7 is a timing chart of a reading operation of the image
reading device shown in FIG. 1.
[0071] FIG. 8 shows sequence of the reading operation of the image
reading device shown in FIG. 1.
[0072] FIG. 9 is a timing chart of scanning performed in the
sequence shown in FIG. 8.
[0073] FIG. 10 is another equivalent circuit diagram of the
two-dimensional image sensor shown in FIG. 2.
[0074] FIG. 11 shows sequence of compensation driving performed in
the reading operation of the image reading device shown in FIG.
1.
[0075] FIG. 12 is a timing chart of scanning A performed in the
sequence shown in FIG. 11.
[0076] FIG. 13 is a timing chart of scanning B performed in the
sequence shown in FIG. 11.
[0077] FIG. 14 is a timing chart of scanning C performed in the
sequence shown in FIG. 11.
[0078] FIG. 15 shows sequence of another compensation driving
performed in the reading operation of the image reading device
shown in FIG. 1.
[0079] FIG. 16 shows sequence of still another compensation driving
performed in the reading operation of the image reading device
shown in FIG. 1.
[0080] FIG. 17 is a timing chart of scanning A performed in the
sequence shown in FIG. 16.
[0081] FIG. 18 is a timing chart of scanning A+B performed in the
sequence shown in FIG. 16.
[0082] FIG. 19 shows sequence of further another compensation
driving performed in the reading operation of the image reading
device shown in FIG. 1.
[0083] FIG. 20 shows sequence of yet another compensation driving
performed in the reading operation of the image reading device
shown in FIG. 1.
[0084] FIG. 21 is a block diagram schematically showing a sensor
substrate of a two-dimensional image sensor provided with an image
reading device according to another embodiment of the present
invention.
[0085] FIG. 22 is a block diagram schematically showing an
arrangement of the image reading device provided on the
two-dimensional image sensor.
[0086] FIG. 23 is a timing chart of a reading operation of the
image reading device shown in FIG. 22.
[0087] FIG. 24 shows sequence of compensation driving performed in
the reading operation of the image reading device shown in FIG.
22.
[0088] FIG. 25 is a timing chart of scanning A performed in the
sequence shown in FIG. 24.
[0089] FIG. 26 is a timing chart of scanning B performed in the
sequence shown in FIG. 24.
[0090] FIG. 27 is a timing chart of scanning C performed in the
sequence shown in FIG. 24.
[0091] FIG. 28 is a timing chart showing timing at which a
compensation signal is inputted.
[0092] FIG. 29 is a graph showing a relationship between (i) a
compensation signal period and (ii) relative variation of I photo
that is accompanied by variation of a TFT property.
[0093] FIG. 30 is a cross sectional view schematically showing a
TFT used to derive the graph shown in FIG. 29.
[0094] FIG. 31 a graph showing a relationship between (i) a frame
frequency and (ii) relative variation of I photo that is
accompanied by variation of the TFT property.
[0095] FIG. 32 is a graph showing properties of a gate current and
a source-drain current of the TFT in case where light is
emitted.
[0096] FIG. 33 is a graph showing variation-with-time of a TFT
resistance value that has been measured in a single TFT on the
basis of probe measurement.
BEST MODE FOR CARRYING OUT THE INVENTION
[0097] Before describing an embodiment of the present invention, a
principle of the present invention will be described as follows
with reference to FIG. 28 to FIG. 31.
[0098] The present inventors supposed that: it is possible to
prevent the aforementioned problem, that is, "variation of the TFT
resistance value that is observed in a short time" by applying a
voltage (a compensation signal or a compensation pulse), whose
polarity is opposite to average polarity of a bias applied to a
gate electrode while the device is operating, to the gate electrode
as in the case of preventing the TFT Vth shifting which is
conventionally observed in using it for an extended period of time,
and the present inventors performed the following basic
experiment.
[0099] FIG. 28 shows a signal waveform of a voltage applied to the
gate electrode of the photodetecting TFT as an experiment. The
signal waveform shows such condition that: a compensation signal,
whose polarity is opposite to that of an OFF voltage (Vgl) applied
to the gate electrode, is applied once in a single frame (3 frames
occur in every second). In the present experiment, a period in
which the compensation signal having the opposite polarity is
applied (compensation signal period) A is used as a parameter so as
to observe the resistance value variation of the TFT.
[0100] Note that, the photodetecting TFT used in the present
experiment is a bottom-gate-type TFT as shown in FIG. 30. That is,
the gate electrode is provided on a substrate constituted of a
glass substrate and the like, and the gate insulating film is
formed on the gate electrode, and a semiconductor layer (a-Si) is
formed on the gate insulating film as a photosensitive
semiconductor film which functions as the aforementioned channel
section, and a contact layer, a source electrode, and a drain
electrode are formed on the semiconductor layer. Further, a
protection film is formed so as to entirely cover the
photodetecting TFT.
[0101] FIG. 29 is a graph showing relative variation of a bright
current (I photo), accompanied by property variation (resistance
value variation) of the photodetecting TFT arranged as shown in
FIG. 30, before and after applying the signal whose signal waveform
is shown in FIG. 28. In this graph, a lateral axis shows the
compensation signal period A, and a vertical axis shows the
relative variation of the bright current (I photo) of the TFT.
[0102] Note that, a value of the bright current (I photo) of the
photodetecting TFT is a value in a case where a gate voltage Vg of
the photodetecting TFT is -10V and a source-drain voltage Vsd of
the photodetecting TFT is 1V and light emission from the
photodetecting TFT to the channel section is 10001x. Further, a
condition under which the signal waveform shown in FIG. 28 is
applied (stress applying condition) is such that: a voltage
indicated by the signal waveform is continuously applied for 15
minutes without light emission.
[0103] As apparent from the graph shown in FIG. 29, it was found
that: by setting the compensation signal period A to 10 to 100
msec, preferably more or less than 33 msec, it was possible to
suppress the relative variation of the bright current (I photo) of
the photodetecting TFT so as not to exceed 10% with respect to the
signal application to the gate electrode that was performed for 15
minutes. Note that, it was experimentally found that: variation in
the first 15 minutes was large, and the variation tended to be
saturated after the first 15 minutes.
[0104] In other words, it is preferable to set a waveform
indicating a voltage inputted to the gate electrode so that time in
which the compensation signal (opposite polarity) is applied is 3
to 30%, preferably approximately 10% with respect to one frame
period.
[0105] Next, the same experiment was performed except that a duty
ratio is fixed so that the compensation signal period A with
respect to each frame period was {fraction (1/10)} and the frame
frequency was used as a parameter. At this time, the voltage Vg was
continuously applied for 15 minutes without light emission, and a
condition under which I photo was measured was the same as the
condition shown in FIG. 29. As a result, it was found that: as
shown in FIG. 31, at 0.1 Hz to 10 Hz regarded as a practically
readable cycle in performing the image reading, the relative
variation of the bright current (I photo) of the photodetecting TFT
was kept in the substantially same condition.
[0106] Thus, the following property was confirmed: in the
photodetecting TFT, the voltage Vgl is applied to the gate
electrode so as to turn OFF the photodetecting TFT in an ordinary
state, but by adopting such sequence that the compensation signal
of 3 to 30%, preferably approximately 10%, which had opposite
polarity, is applied, it was possible to suppress the unfavorable
resistance value variation of the photodetecting TFT which was
observed in a short time.
[0107] Note that, the application period of the compensation signal
that has been calculated here does not need to be provided in each
frame, but a plurality of application periods may be provided in
each frame, or a single application period may be provided in a
plurality of frames. That is, the compensation signal is applied to
the gate electrode for a period of 3% to 30% as an average,
preferably approximate 10%, with respect to an entire period in
which an image is read by using the photodetecting TFT (entire
period in which the photodetecting TFT is driven).
[0108] The following description will explain an example where the
present invention is specifically applied to a device.
Embodiment 1
[0109] One embodiment of the present invention is described
below.
[0110] Note that, the present embodiment describes an example where
an image reading device of the present invention is applied to a
two-dimensional image sensor.
[0111] First, a photodetecting TFT (photosensor) used in the
two-dimensional image sensor is described, and next, the
two-dimensional image sensor will be described.
[0112] The photosensor is basically an inversely staggered thin
film transistor (TFT) (as long as an upper gate electrode is made
of light-transmission material, the photosensor may be the
inversely staggered thin film transistor). That is, as shown in
FIG. 3, the photodetecting TFT 7 is arranged so that: a bottom gate
electrode 11 made of alminium (Al), tantalum (Ta), and the like is
formed on an insulating substrate (transparent substrate) 9 made of
glass and the like, and a gate insulating film (protection film) 13
made of silicon nitride (SiN) is formed so as to cover the bottom
gate electrode 11 and the insulating substrate 9.
[0113] On the bottom gate electrode 11, a semiconductor layer
(photosensitive semiconductor layer) 12 made of i-type amorphous
silicon (i-a-Si) so as to be positioned opposite to the gate
electrode 11, and above the semiconductor layer 12, a source
electrode 10 and a drain electrode 15 are formed so as to be
positioned opposite to each other with a predetermined gap
therebetween.
[0114] The source electrode 10 and the drain electrode 15 are
respectively connected to the semiconductor layer 12 via an n+
silicon layer 4.
[0115] On the source electrode 10 and the drain electrode 15, a
protection insulating film 14 is formed, and these members
constitute a transistor (inversely staggered thin film
transistor).
[0116] Emission light 2 is emitted from a back light unit 18 on the
side of the insulating substrate 9 to the photodetecting TFT 7, and
the emission light 2 is transmitted through an opening section 6,
and is reflected by a document 1, so that the emission light 2 is
emitted to the semiconductor layer 12.
[0117] Further, the photodetecting TFT 7 controls a voltage applied
to the bottom gate electrode 11, so that it is possible to control
a conduction state or a non-conduction state. For example, when a
positive voltage is applied to the bottom gate electrode 11 of the
photodetecting TFT 7, an n channel is formed in the semiconductor
layer 12, and when a voltage is applied to a gap between the source
electrode 10 and the drain electrode 15, a current flows.
[0118] A relationship between a gate voltage of the photodetecting
TFT 7 and a source-drain current is as shown in the graph of FIG.
32.
[0119] Next, the two-dimensional image sensor using the
photodetecting TFT 7 arranged in the foregoing manner is described
with reference to FIG. 2.
[0120] FIG. 2 is a block diagram schematically showing an
arrangement of the two-dimensional image sensor. Note that, the
two-dimensional image sensor described here is a contact-type image
sensor. Further, the present embodiment describes the
two-dimensional image sensor, but the image reading device of the
present invention may be a one-dimensional image sensor.
[0121] As shown in FIG. 2, the two-dimensional image sensor
according to the present embodiment includes: a plurality of pixels
(not shown) disposed in a matrix manner; and a sensor substrate
(photoelectric transfer element) 20, constituting a sensor section
(photosensor), which is in a shape of a flat plate, wherein a
plurality of driving ICs (driving means) 19 . . . and a plurality
of detection ICs (photoelectric transfer amount detecting means) 25
. . . are connected to a periphery of the sensor substrate 20.
[0122] Each driving IC 19 drives the photodetecting TFT 7 (see FIG.
1), provided on each pixel of the sensor substrate 20, that will be
described later, and is connected to each of gate lines 22 . . .
provided on the sensor substrate 20. The number of the gate lines
22 . . . varies depending on a size and a pixel pitch of the sensor
substrate 20. However, the number of the gate lines 22 . . . ranges
from several hundreds to several thousands, and a plurality of the
driving ICs 9 . . . detect output from the gate lines 22 . . . . In
this case, the number of outputs of each driving IC 19 is several
hundreds for example.
[0123] The driving ICs 19 are mounted on a driving print substrate
21, and the driving ICs 19 and the driving print substrate 21
constitute a driving circuit 28.
[0124] The driving print substrate 21 is connected to a
control/communication substrate (including light emission
controlling means) 24, and includes a circuit which controls the
driving ICs 19 and functions as an interface of the
control/communication substrate 24.
[0125] While, each of detection ICs 25 detects an output from the
sensor substrate 20 that has been obtained as a result of driving
of the photodetecting TFT 7 provided on the sensor substrate 20.
The detection ICs 25 are connected to data lines 23 . . . of the
sensor substrate 20. Also the number of the data lines 23 . . .
varies depending on the size and the pixel pitch of the sensor
substrate 20. However, the number of the data lines 23 . . . ranges
from several hundreds to several thousands, and a plurality of the
detection ICs 25 . . . detect output from the data lines 23 . . . .
The number of inputs of each detection IC 25 is several hundreds
for example.
[0126] The detection ICs 25 are mounted on a detection print
substrate (image information outputting means) 26, and the
detection ICs 25 and the detection print substrate 26 constitute a
detection circuit (detecting means) 29.
[0127] The detection print substrate 26 is connected to the
control/communication substrate 24, and includes a circuit which
controls the detection ICs 25 and functions as an interface of the
control/communication substrate 24.
[0128] The control/communication substrate 24 includes a circuit,
such as a CPU and a memory, which deals with a signal which does
not synchronize with (a) line reading scanning and (b) a frame
cycle of the sensor substrate 20, and the control/communication
substrate 24 communicates with external circuits and controls the
photoelectric transfer device entirely.
[0129] A back light unit 18 is constituted of an LED, a light
guiding plate, and a light diffusing plate.
[0130] Turning ON/OFF of the LED is controlled by the
control/communication substrate 24.
[0131] As shown in FIG. 4, the sensor substrate 20 is not arranged
so that the switching TFT and the photodetecting TFT are disposed
in each pixel but is arranged so that a single thin film transistor
(photodetecting TFT 7) functions as both the switching TFT and the
photodetecting TFT.
[0132] Thus, in the sensor substrate 20, a single thin film
transistor functions as both (i) the switching TFT for selecting a
pixel and (ii) the photodetecting TFT for functioning as a photo
sensor.
[0133] In the sensor substrate 20, as shown in FIG. 2, the driving
circuit 51 is constituted of the driving print substrate 21 and the
driving ICs 19 . . . , and the reading circuit 52 is constituted of
the detection print substrate 26 shown in FIG. 2 and the detection
ICs 25 . . . , and a gate electrode of each photodetecting TFT 7 is
connected to the gate line 22, and a source electrode of each
photodetecting TFT 7 is connected to the data line 23. Note that,
in the sensor substrate 20 shown in FIG. 4, there is provided a
capacitor wiring 53 connected to the pixel capacitor 17 which
functions as an electric charge storage capacitor. Further, the
capacitor wiring 53 is connected to a power source (Vcs), and is
used in precharging the pixel capacitor 17 described later.
[0134] In the sensor substrate 20, as shown in FIG. 4, a single
photodetecting TFT 7 which functions as both (i) the switching TFT
and (ii) the photosensor and a single pixel capacitor 17 are
disposed in each pixel.
[0135] The following description will detail the detection IC 25
which constitutes the reading circuit 52.
[0136] As shown in FIG. 1, each of the detection ICs 25, which are
prepared corresponding to the number of detected lines (several
hundreds lines for example), internally includes an integration
amplifier 33, a low pass filter 34, an amplifier 35, a sample hold
circuit 36, and the like, and there are provided an analog
multiplexer 37 and an A/D (analog/digital) converting circuit 38 at
the following stage of the sample hold circuit 36.
[0137] Further, in the detection IC 25, dual mutual sampling is
performed so as to remove offsetting and noise of each circuit.
[0138] In the detection IC 25 arranged in this manner, electric
charge of the auxiliary capacitor 17 that has been inputted via the
data line 23 to the detection IC 25 is, first, inputted to the
integration amplifier 33 as negative input, so that the integration
amplifier 33 outputs a potential in proportion to the inputted
electric charge. Further, a reference voltage (Vref) 32 is inputted
to the integration amplifier 33 as positive input.
[0139] Output of the integration amplifier 33 is inputted to the
amplifier 35 via the low pass filter 34 provided to reduce the
noise, and is amplified by a predetermined scale factor, and is
then outputted.
[0140] Further, the output of the amplifier 35 is inputted to the
sampling hold circuit 36, and is temporarily stored there, and a
value of the stored output is outputted to one of a plurality of
inputs of the analog multiplexer 37.
[0141] The output of the analog multiplexer 37 is inputted to the
A/D converting circuit 38 positioned at the next stage, and the
output is converted from analog data to digital data in the A/D
converting circuit 38, and the converted data is outputted to the
control/communication substrate 24 as image data.
[0142] Further, the integration amplifier 33 has a reset switch 30,
and the reset switch 30 is controlled by output of the control
section 31 of the detection IC 25. The control section 31 controls
the detection IC 25 and functions as an interface of the detection
print substrate 26.
[0143] Here, the photodetecting TFT 7 arranged in the foregoing
manner is driven as follows.
[0144] That is, in the photodetecting TFT 7, as shown in FIG. 3,
emission light 2 is emitted from the back light unit 18 on the side
of the insulating substrate 9, and the emission light 2 is
transmitted through the opening section 6, and is reflected by the
document 1, and is emitted to the semiconductor layer 12 having
photosensitivity.
[0145] Here, the photodetecting TFT 7 can control its conduction
state (ON)/non-conduction state (OFF) by controlling a voltage
applied to the bottom gate electrode 11. For example, when a
positive voltage is applied to the bottom gate electrode 11 of the
photodetecting TFT 7, an n-channel is formed in the semiconductor
layer 12, and when a voltage is applied between the source
electrode 10 and the drain electrode 15, a current flows
therebetween.
[0146] Further, when emitting light in the non-conduction state (a
state in which a negative voltage is applied to the gate
electrode), a light current is induced in the semiconductor layer
12, so that a drain current (I photo) corresponding to the number
of electron holes induced by the emission light, i.e.,
corresponding to light volume of the emission light, flows between
the source electrode 10 and the drain electrode 15. That is, a
resistance value between the source and the drain drops. While,
when light is not emitted (OFF), the drain current (I dark) is
extremely small, for example, is approximately 10.sup.-14 A
(ampere).
[0147] Here, a voltage from the driving IC 19 is applied to the
gate line connected to the gate electrode of the photodetecting TFT
7, and a property of the resistance value of the photodetecting TFT
7 varies, so that, in an ordinary state, a voltage whose polarity
causes an OFF state is applied and a voltage having opposite
polarity (compensation signal) is applied once in each frame for a
predetermined period. This will be detailed later.
[0148] Next, operations of the two-dimensional image sensor
arranged in the foregoing manner are described as follows with
reference to FIG. 5. FIG. 5 is a flow chart showing how the
two-dimensional image sensor operates.
[0149] First, the pixel capacitor (Cs) 17 is precharged (step S1).
Here, the pixel capacitor (storage capacitor) 17 is precharged by
using the data line 23 or the capacitor wiring 53. Note that, in
case of precharging the pixel capacitor 17 by using the data line
23, it is necessary to turn ON the photodetecting TFT 7.
[0150] Next, the back light is emitted (step S2). Here, light (for
example, light reflected by the document) is emitted to the sensor
substrate 20 for a predetermined period by means of the back light
unit under such condition that the photodetecting TFT 7 is turned
OFF. As a result, due to such a property that a current flowing
between the source and the drain (bright current I photo) increases
only in a part to which the light is emitted (that is, due to a
property reducing the resistance), the electric charge of the pixel
capacitor 17 that has been precharged is discharged. While, in a
part to which the light is not emitted, the electric charge of the
pixel capacitor 17 is maintained.
[0151] Next, the back light is turned OFF (step S3).
[0152] Further, the electric charge is read (step S4). That is, the
light emission to the sensor substrate 20 is stopped, and the
photodetecting TFTs 7 are sequentially turned ON, so that electric
charge remaining in the pixel capacitor 17 is read, and plane
distributions of image information are read. This operation is
performed in the detection IC 25 which constitutes the
aforementioned reading circuit 52.
[0153] A procedure in which the two-dimensional image sensor
arranged in the foregoing manner is driven is such that: as shown
by the flow chart of FIG. 5, the aforementioned basic steps S1 to
S4 are performed, so that it is possible to obtain two-dimensional
distributions of light, i.e., image information of the document.
Further, these operations are repeatedly performed, so that it is
also possible to perform sequential image reading.
[0154] Here, the step S1 corresponds to a first step for charging
the pixel capacitor 17 functioning as the storage capacitor to a
predetermined level, and the step S2 corresponds to a second step
for turning OFF the photodetecting TFT 7 so as to discharge the
electric charge from the pixel capacitor 17 that has been charged
due to the emission light to the photodetecting TFT 7.
[0155] Further, the steps S3 and S4 correspond to a third step for
calculating the electric charge of the pixel capacitor 17 in
accordance with the discharge amount so as to detect a
photoelectric transfer amount of the sensor substrate 20 which
functions as a photoelectric transfer element.
[0156] Further, when the foregoing three steps (the first step to
the third step) are regarded as one cycle of image reading, a
voltage whose polarity is opposite to average polarity of a voltage
making the photodetecting TFT 7 in the OFF state is applied to the
gate electrode of the photodetecting TFT 7 within a period in which
the third step shifts to the first step of the next cycle.
[0157] Here, operations of the two-dimensional image sensor
arranged in the foregoing manner are detailed as follows with
reference to FIG. 6 to FIG. 9. FIG. 6 focuses on a single data line
in the equivalent circuit such as the image reading device shown in
FIG. 4 and shows not only the data line but also reading circuit
portions in detail.
[0158] First, as shown in FIG. 6, each of the reading circuits
(detection ICs), constituting the two-dimensional image sensor,
which are prepared corresponding to the number of detected lines
(several hundreds lines for example), internally includes an
electric charge integration amplifier, an amplifier, a sample hold
circuit, and the like, and there is provided an A/D
(analog/digital) converting circuit 1, via an analog multiplexer
(corresponding to 37 shown in FIG. 1), that is positioned at the
following stage of the sample hold circuit. Output of the electric
charge integration amplifier is inputted to the amplifier, and is
outputted after being amplified by a predetermined scale
factor.
[0159] A low pass filter (corresponding to 34 shown in FIG. 1) for
removing noise components is inserted between the electric charge
integration amplifier and the amplifier. The low pass filter may be
inserted or may be omitted.
[0160] Output of the amplifier is inputted to the sampling hold
circuit, and is temporarily stored there, and a value of the stored
output is outputted to one of a plurality of inputs of the analog
multiplexer. The output of the analog multiplexer is inputted to
the A/D converting circuit positioned at the next stage, and the
output is converted from analog data to digital data in the A/D
converting circuit, and the converted data is externally
outputted.
[0161] Next, with reference to FIGS. 6 and 7, the following
description will explain a specific example of how the
two-dimensional image sensor arranged in the foregoing manner
operates over time. FIG. 7 is a time chart concerning the
respective portions. Here, each operation performed in each time
that corresponds to each step shown in FIG. 4 is described. Note
that, for convenience in description, hereinafter, the
photodetecting TFT 7 is referred to merely as TFT.
[0162] (1) Step S1: time t4 to time t7
[0163] Since the reset switch of the electric charge integration
amplifier is ON at time t4, a feedback capacitor of the electric
charge integration amplifier is short-circuited, so that an output
of the electric charge integration amplifier is the reference
voltage (Vref). Thus, also output of the amplifier is Vref. When a
Cs electrode driving voltage is applied at time t5 under such
condition, electric charge flows from the storage capacitor (Cs) to
the side of the drain, but the electric charge integration
amplifier is reset under such condition that the TFT is ON, so that
the electric charge disappears.
[0164] Next, when a gate driving signal is turned OFF at time t6, a
potential of the storage capacitor (Cs) varies. That is, the
storage capacitor (Cs) is precharged. Note that, FIG. 6 shows an
example of the case where the storage capacitor (Cs) is precharged
by driving the Cs electrode, but it is also possible to precharge
the storage capacitor (Cs) by driving the reference potential
(Vref) of the electric charge integration amplifier (CSA) as shown
in FIG. 10.
[0165] (2) Step S2: time t7 to time t1
[0166] Electric charge of the storage capacitor charged at time t7
is kept at a time constant determined on the basis of the OFF
resistance value and the storage capacitance value of the TFT from
time t7 to time t1 (that is, until the next cycle). Here, light
emission is performed with respect to the document for a
predetermined period from time t7 to time t1.
[0167] Then, in a TFT's part to which the light is emitted, the
resistance value of the TFT is made lower, so that the electric
charge of the storage capacitor flows to the side of the source of
the TFT, the TFT drain voltage approximates Vref. While, in a part
to which the light is not emitted, the electric charge of the
storage capacitor is kept so as to keep the resistance value of the
TFT high, so that the TFT drain voltage is not largely varied. As a
result, there occurs a difference between the part to which the
light is irradiated and the part to which the light is not emitted
in terms of the drain voltage (that is, an amount of the electric
charges remaining in the storage capacitor) during a period from
time t7 to time t1.
[0168] (3) Steps S3 and S4: time t1 to time t4
[0169] The reset switch of the electric charge integration
amplifier is turned OFF at time t1, so that the electric charge
integration amplifier is released from a resetting condition. The
gate driving signal is applied at time t2, so that the TFT is
turned ON. When the TFT is turned ON, the electric charge of the
storage capacitor moves to the feedback capacitor of the
integration amplifier. With this movement, output of the electric
charge integration amplifier is determined. Here, as to the output
of the integration amplifier, a continuous line corresponds to the
part to which light is emitted, and a broken line corresponds to
the part on which the light is not irradiated. Output of the
amplifier is such that: an output value of the integration
amplifier.times.G (gain), and this value is sampled at time t3.
Thus, image information of the document that has been obtained
during the light emission period is obtained as an electric signal.
Note that, during the period, the light emission is made OFF so
that the light does not influence the operations of the TFT in
reading the data. After reading the data, the reset switch of the
integration amplifier is turned ON.
[0170] By performing the operations (1) to (3) repeatedly, it is
possible to successively obtain images. When the light is emitted,
three primary colors of R, G, and B are sequentially switched and
emitted, so that it is also possible to read color images.
[0171] Incidentally, it is general that there are a plurality of
gate lines (scanning lines), so that entire sequence is as shown in
FIG. 8, and its timing chart is as shown in FIG. 9. FIG. 8 shows an
example of a case where there are 512 gate lines.
[0172] That is, as shown in FIGS. 8 and 9, differences are brought
about in the electric charge remaining in the storage capacitor
(i.e., drain voltage) during the light emission period, and the
gate is made to scan in a line-sequential manner during a period in
which the light emission is stopped, and output corresponding to
the electric charge remaining in the storage capacitor is obtained
in a sequential manner, thereby obtaining the image information.
Note that, for convenience in description, the foregoing
description does not mention influences caused by (i) parasitic
capacitance Cgs between the gate line and the data line electrode
and (ii) feedthrough (coupling effect of Cgs and Cgd with respect
to variation of the gate signal).
[0173] Here, in terms of a waveform of the driving voltage of the
gate that is shown in FIG. 7, an OFF period Toff in which the gate
is turned OFF is set to be much longer than an ON period Ton in
which the gate is turned ON in an ordinary state. This is based on
the following reason: in the Toff period, a stored electric charge
is discharged due to an OFF state of the TFT (that is, a high
resistance state), so that a time constant required in discharging
is larger. It is necessary that the Toff is approximately several
hundreds msec. While, since the ON resistance value of the TFT is
small in the Ton period, a time constant concerning movement of the
electric charge moved by the TFT is few .mu.sec.
[0174] Thus, dozens to 100 .mu.sec is sufficient as Ton even when
various kinds of margins are taken into consideration.
Specifically, it is possible to realize the driving on the basis of
such setting that: Ton/Toff=100 .mu.sec/200 msec. That is, a period
in which the ON voltage (positive bias) is applied to the gate line
is an instant period, and in most of the time, the OFF voltage
(negative bias) is applied. In other words, average polarity of the
driving voltage is negative bias.
[0175] In such an ordinary driving method, a bias having single
polarity is effectively applied to the gate electrode, so that
short-time variation of the resistance value of the photodetecting
TFT obviously occurs as shown in FIG. 33. This arises a practical
problem.
[0176] Then, in order to solve the problem, the present invention
adopts the following compensation driving method.
[0177] The following description will explain an example of the
compensation driving method of the present embodiment with
reference to FIGS. 11 to 14.
[0178] FIG. 11 shows a timing chart obtained by adding a
compensation driving process to the timing chart shown in FIG. 8,
and is different in that: the scanning period shown in FIG. 8 is
divided into "scanning A" and "scanning C", and there is provided
"scanning B" therebetween.
[0179] The scanning A is scanning performed mainly with respect to
"data detection" of the steps S3 and S4, and corresponds to a
period in which the TFT is driven as shown in the timing chart
shown in FIG. 12.
[0180] The scanning C is scanning performed mainly with respect to
"precharging Cs" of the step S1, and corresponds to a period in
which the TFT is driven as shown in the timing chart shown in FIG.
14.
[0181] While, the scanning B is scanning performed with respect to
the compensation signal that has been added to apply a compensation
bias to the gate electrode of the TFT, and corresponds to a period
in which the TFT is driven as shown in the timing chart shown in
FIG. 13. That is, in the scanning B, a compensation pulse
(compensation signal) is applied to the gate electrode of the TFT
for a predetermined period so as to intentionally apply a positive
bias.
[0182] Here, the compensation pulse is applied to the gate
electrode, at timings slightly different in respective gate lines
(rows), on the basis of a driving frequency of the gate driver (for
example, 3 MHz), and the application is performed so that ON
periods overlap each other in the respective scanning lines. Thus,
even if the compensation pulse period (compensation signal period)
is long, it is possible to minimize a time taken to finish applying
the compensation pulse to all the data lines, so that this
technique is useful.
[0183] Of course, it is needless to say that: it is more preferable
to apply the compensation pulse to all the scanning lines at once
by adopting a gate driver which can drive all the gate lines at
once.
[0184] According to the compensation driving method, it is possible
to adjust a relationship between the ON period Ton and the OFF
period Toff in the TFT. Actually, on the basis of the
aforementioned experiment result, a relationship in terms of an
average time is set so that Ton/Toff={fraction (3/100)} to
{fraction (3/10)}, preferably {fraction (1/10)}. As a result, it is
possible to largely reduce the short-time variation of the
resistance value of the photodetecting TFT that has been a
problem.
[0185] Note that, in the steps S3 and S4, it is preferable that a
potential of the compensation signal corresponds to an ON potential
of the gate in case where the TFT functions as a switching element
for address. Thus, it is possible to obtain such an advantage that
an output voltage of the gate driver can be shared.
[0186] In FIG. 11, the scanning B is performed in each reading
cycle. However, as long as Ton/Toff={fraction (3/100)} to {fraction
(3/10)} in a relation ship in terms of an average time, that is, in
a time taken to perform all the operations of the image reading,
the scanning B may be performed in a plurality of reading
cycles.
[0187] Further, the compensation pulse means not only a rectangular
waveform signal, but also a signal of a curved waveform or a signal
having not only a single waveform but also plural waveforms in
combination.
[0188] Further, as shown in FIG. 15, light emission may be
performed during a period of the scanning B (that is, a period in
which the compensation signal is applied to the gate electrode). In
this case, it is possible to shorten a time taken to turn ON the
gate electrode.
[0189] Further, FIG. 16 shows a state in which an effect of the
scanning C is combined with that of the scanning B, and the
scanning B+C enables "providing the compensation signal" and
"prerecharging Cs" to be performed in single scanning. In this
case, the scanning A shows a period in which the TFT is driven as
shown in the timing chart shown in FIG. 17, and the scanning B+C
shows a period in which the TFT is driven as shown in the timing
chart shown in FIG. 18. In this manner, by reducing the number of
times scanning is performed, it is possible to reduce the power
consumption required in driving the two-dimensional image sensor
which functions as the image reading device.
[0190] FIG. 19 shows a modification example of FIG. 11, and the
scanning of the compensation signal is added so that single
scanning is performed in a plurality of reading cycles. In order to
make it easy to understand the arrangement, FIG. 19 shows an
example of the case where the scanning of the compensation signal
is added so that single scanning is performed in 3 cycles, but
actually the scanning of the compensation signal may be added so
that single scanning is performed in several dozens to several
hundreds cycles. Thus, in an ordinary cycle period in which the
compensation signal is not applied, a period in which the
compensation signal is added does not prevent the reading operation
performed in real time. That is, during a period from the
compensation signal scanning to the next compensation signal
scanning, it is possible to see the read images in a sequential
manner.
[0191] However, it is necessary to set the time, in which the
compensation signal is added, to be long so that Ton/Toff={fraction
(3/100)} to {fraction (3/10)} in average. Thus, this is such
reading mode that: after reading images for one minute in real
time, there occurs a blank period in which the compensation signal
is added for several seconds.
[0192] Likewise, it is possible to apply a process, in which single
scanning of the compensation signal is added in plural reading
cycles, to the sequence shown in FIG. 16, as shown in FIG. 20.
[0193] However, in adopting the process in which single scanning of
the compensation signal is added in plural reading cycles, there is
a case where the timing at which the compensation signal is added
(cycle) deviates from a most appropriate range of the frame
frequency shown in the aforementioned preliminary experiment (FIG.
13). In this case, it is preferable to adjust a voltage value
(amplitude) of the added compensation signal so that the voltage
value is most appropriate.
[0194] Note that, in the aforementioned embodiment, the description
is given on the compensation driving method of the image reading
device in which a single TFT element functions as both the
photodetecting TFT and the switching TFT, but it is possible to
apply the compensation driving method to an image reading device in
which the photodetecting TFT and the switching TFT are separately
provided. Also in this case, a signal applied to the gate electrode
of the photodetecting TFT is adjusted (that is, the compensation
pulse is introduced), and a condition under which the compensation
pulse is applied is set as required so that Ton/Toff={fraction
(3/100)} to {fraction (3/10)}. Thus, it is possible to obtain the
effect of the present invention.
[0195] The following Embodiment 2 will explain an example of the
image reading device in which the photodetecting TFT and the
switching TFT are separately provided.
Embodiment 2
[0196] Another embodiment of the present invention is described as
follows. Note that, as in Embodiment 1, also the present embodiment
will explain an example of the two-dimensional image sensor which
functions as an image reading device.
[0197] The two-dimensional image sensor according to the present
embodiment includes a sensor substrate 40 shown in FIG. 21.
[0198] As shown in FIG. 21, the sensor substrate 40 includes (i)
gate lines 22 each of which is extended from a driving circuit 51
as an electric wiring and (ii) data lines 23 each of which is
extended from a reading circuit 52 as an electric wiring, and the
gate lines 22 and the data lines 23 are disposed in an X-Y matrix
manner (lattice manner), and each lattice sections each pixel. Each
pixel includes: a thin film transistor (referred to as switching
TFT) 41; a thin film transistor for light detection which functions
as a phototransistor (referred to as photodetecting TFT) 42; and a
pixel capacitor 43 which functions as an electric charge storage
capacitor.
[0199] The following description explains a principle of basic
operations of the sensor substrate 40.
[0200] The photodetecting TFT 42 of each pixel is set to be in an
OFF state while applying a predetermined bias (Vss) so that a dark
current I dark is kept low. Under this condition, when light
emitted from the outside is incident on the photodetecting TFT,
photo-excited carrier is generated in a channel section, so that a
resistance value of the photodetecting TFT 42 drops. The resistance
value variation of the photodetecting TFT occurs as a difference in
a current (bright current I photo) flowing between a source and a
drain of the photodetecting TFT 42, i.e., a difference in an amount
of electric charge flowing in each photodetecting TFT 42. As a
result, a difference occurs in a charging amount (or discharging
amount) of the pixel capacitor 43 connected to each photodetecting
TFT 42.
[0201] Then, the switching TFT 41 provided on each pixel is driven
so as to be in an ON state in a line-sequential manner, so that it
is possible to read, via the data line 23, the amount of electric
charge stored in each pixel capacitor 43, so that it is possible to
obtain plain distribution information of an image on the basis of
light which is incident on the sensor substrate 40.
[0202] The plane distribution information of the image is detected
by means of the detection IC 25 constituting the reading circuit
52.
[0203] As shown in FIG. 22, each of the detection ICs 25, which are
prepared corresponding to the number of detected lines (several
hundreds lines for example), internally includes an integration
amplifier 33, a low pass filter 34, an amplifier 35, a sample hold
circuit 36, and the like, and there are provided an analog
multiplexer 37 and an A/D (analog/digital) converting circuit 38 at
the following stage of the sample hold circuit 36.
[0204] Further, in the detection IC 25, dual mutual sampling is
performed so as to remove offsetting and noise of each circuit.
[0205] In the detection IC 25 arranged in this manner, electric
charge of the auxiliary capacitor 17 that has been inputted via the
data line 23 to the detection IC 25 is, first, inputted to the
integration amplifier 33 as negative input, so that the integration
amplifier 33 outputs a potential in proportion to the inputted
electric charge. Further, a reference voltage (Vref) 32 is inputted
to the integration amplifier 33 as positive input.
[0206] Output of the integration amplifier 33 is inputted to the
amplifier 35 via the low pass filter 34 provided to reduce the
noise, and is amplified by a predetermined scale factor, and is
then outputted.
[0207] Further, the output of the amplifier 35 inputted to the
sampling hold circuit 36, and is temporarily stored there, and a
value of the stored output is outputted to one of a plurality of
inputs of the analog multiplexer 37.
[0208] The output of the analog multiplexer 37 is inputted to the
A/D converting circuit 38 positioned at the next stage, and the
output is converted from analog data to digital data in the A/D
converting circuit 38, and the converted data is outputted to the
control/communication substrate 24 as image data.
[0209] Further, the integration amplifier 33 has a reset switch 30,
and the reset switch 30 is controlled by output of the control
section 31 of the detection IC 25. The control section 31 controls
the detection IC 25 and functions as an interface of the detection
print substrate 26.
[0210] Here, the photodetecting TFT 42 arranged in the foregoing
manner is driven as in the photodetecting TFT 7 of Embodiment
1.
[0211] That is, in the photodetecting TFT 42, emission light 2
emitted from the back light unit 18 is reflected by the document 1,
and is irradiated to a semiconductor layer (not shown) having
photosensitivity. Here, the photodetecting TFT 42 is arranged so
that: since a property of the resistance value of the
photodetecting TFT 42 varies, a voltage which has polarity causing
an OFF state is applied in an ordinary state so that a voltage
having opposite polarity (compensation signal) is applied for a
predetermined period once in each frame. This is detailed as
follows.
[0212] The following description explains operations of the
two-dimensional image sensor arranged in the foregoing manner with
reference to FIGS. 23 to 27. FIG. 23 is a timing chart showing a
case where the compensation signal is not applied in the
two-dimensional image sensor of two-transistor type (in which the
switching TFT and the photodetecting TFT are separately provided on
each pixel). FIG. 23 shows a case where a DC bias is applied to Vss
so as to be always in an OFF state.
[0213] In case of driving the TFT as shown in the timing chart,
there arises such a problem that the resistance value of the
photodetecting TFT varies in a short time, so that the reading
accuracy is deteriorated.
[0214] Then, the two-dimensional image sensor may be driven by
sequence shown in FIG. 24. That is, in order to suppress the
foregoing property of the TFT, sequence for applying a compensation
signal may be adopted.
[0215] In FIG. 24, a basic idea is the same as in the case of the
one-transistor-type two-dimensional image scanner shown in FIG. 11,
and a scanning period is divided into "scanning A" and "scanning
C", and "scanning B" which is a period for applying a compensation
bias to the gate electrode of the photodetecting TFT is provided
between the scanning A and the scanning C.
[0216] The scanning A is scanning performed with respect to "data
detection", and is a period in which the TFT is driven as shown in
the timing chart shown in FIG. 25.
[0217] The scanning C is scanning performed with respect to
"precharging Cs", and is a period in which the TFT is driven as
shown in the timing chart shown in FIG. 27.
[0218] While, the scan B is scanning performed with respect to the
compensation signal that has been added to apply a compensation
bias to the gate electrode of the TFT, and corresponds to a period
in which the TFT is driven as shown in the timing chart shown in
FIG. 27. That is, in the scanning B, a compensation pulse
(compensation signal) is applied to the gate electrode of the TFT
for a predetermined period so as to intentionally apply a positive
bias.
[0219] However, in this case, as apparent from FIG. 21, all the
gate electrodes of the photodetecting TFT are short-circuited, so
that the compensation signals are simultaneously inputted to the
gates of the photodetecting TFTs of all the pixels. Thus, it is not
necessary to perform scanning. Also in this case, a signal applied
to the gate electrode of the photodetecting TFT is adjusted (that
is, the compensation pulse is introduced), and a condition under
which the compensation pulse is applied is set as required so that
Ton/Toff={fraction (3/100)} to {fraction (3/10)}. Thus, it is
possible to obtain the effect of the present invention.
[0220] As described above, in both the cases of (i) the
one-transistor-type two-dimensional image sensor described in
Embodiment 1 and (ii) the two-transistor-type two-dimensional image
sensor described in Embodiment 2, by applying the compensation
signal, it is possible to suppress the short-time variation of the
resistance value of the photodetecting TFT, so that it is possible
to improve the operability and the reliability of the
two-dimensional image sensor which functions as an image reading
device using the photodetecting TFT. Further, the arrangement is
effective since the compensation signal can be added in such a
period that the image reading is not influenced.
[0221] Further, the present invention is effective also in a
photodetecting TFT of an input-output-combination-type display,
provided with (i) a display function and (ii) a photodetecting
function, which is disclosed in the aforementioned Patent Document
5: Japanese Unexamined Patent Publication No. 151669/2002 (Tokukai
2002-151669) (Publication date: May 24, 2002) (Corresponding U.S.
Application No. U.S. 2002/0093581).
[0222] As described above, the image reading device of the present
invention, which uses a thin film transistor having a photo
response property as a photodetecting element, includes driving
means for applying a voltage to a gate electrode of the thin film
transistor so as to drive the thin film transistor into an ON state
or an OFF state, wherein the driving circuit applies a voltage,
whose polarity is opposite to average polarity of a voltage making
the thin film transistor in the OFF state, to the gate electrode in
an arbitrary period.
[0223] Therefore, by applying a voltage, whose polarity is opposite
to average polarity of the voltage making the thin film transistor
in the OFF state, to the gate electrode in the arbitrary period, it
is possible to prevent disadvantage which occurs in case of keeping
on applying the voltage, making the thin film transistor in the OFF
state, to the gate electrode, that is, it is possible to suppress
the short-time variation of a resistance value of the thin film
transistor.
[0224] In this manner, by suppressing the short-time variation of
the resistance value of the thin film transistor used as a
photodetecting element, it is possible to appropriately correct (i)
sensitivity of the thin film transistor and (ii) correction data
that has been obtained in a calibration operation performed to
obtain the correction data with respect to a gray scale
property.
[0225] As the correction data at this time, it is possible to use
first calibration data that has been obtained in a calibration
operation performed right after turning ON a power source of the
device, so that it is not necessary to frequently perform the
calibration operation unlike conventional techniques.
[0226] Further, influences of the short-time variation of the
resistance value of the thin film transistor are not accumulated,
so that there is no possibility that the variation is so large that
it is difficult to restore the variation. Thus, it is possible to
obtain the reliability kept for an extended period of time.
[0227] Therefore, it is possible to perform image reading stably
for an extended period of time. As a result, it is possible to
obtain such advantage that the operability and the reliability of
the image reading device are improved.
[0228] It is preferable that the arbitrary period is a period in
which the image reading is not performed so as not to influence the
image reading.
[0229] Generally, when the thin film transistor is used as a
photodetecting element, it is necessary to suppress the short-time
variation of the resistance value of the thin film transistor so as
not to exceed 10% in consideration for the light detection
accuracy.
[0230] Then, in order to suppress the short-time variation of the
resistance value of the thin film transistor so as not to exceed
10%, the following procedure is performed.
[0231] A time for applying a voltage in the arbitrary period is set
so that a rate indicating relative variation of a bright current of
the thin film transistor is within a range from 0.9 to 1.1.
[0232] Further, the arbitrary period is set to be a period whose
length is 3% to 30% with respect to an entire period in which the
thin film transistor is driven.
[0233] Further, when images are sequentially read at an arbitrary
cycle, the cycle is set to 0.1 Hz to 10 Hz.
[0234] Further, the photodetecting element may function as a pixel
selection element for selecting a pixel.
[0235] In this case, it is possible to realize an image reading
device, having a simple structure, which realizes highly-fine image
reading, and it is also possible to improve the operability and the
reliability of the device.
[0236] Further, a potential of a voltage applied to the gate
electrode in the arbitrary period may be set to be equal to a
potential of a voltage in the case where the thin film transistor
is in the ON state.
[0237] In this case, a potential of the voltage applied to the gate
electrode in the arbitrary period may be set to be equal to a
potential of a voltage making the thin film transistor in the ON
state, so that the voltage applied to the gate electrode can be
used as both (i) the voltage making the thin film transistor in the
ON state and (ii) a voltage which functions as the compensation
signal.
[0238] Thus, it is not necessary to switch the voltage in a
complicate manner, so that it is possible to simplify the structure
of the driver for driving the gate electrode. As a result, it is
possible to miniaturize the device and to reduce the power
consumption.
[0239] An image reading method, in which a document image is read
by detecting a photoelectric transfer amount of a photoelectric
transfer element which has (i) a thin film transistor having a
photo response property and (ii) a storage capacitor connected to
the thin film transistor, includes: a first step of charging the
storage capacitor with a predetermined amount of electric charge; a
second step of discharging the electric charge from the storage
capacitor, by emitting light to the thin film transistor while the
thin film transistor is being in an OFF state, after charging the
storage capacitor with the electric charges; a third step of
detecting the photoelectric transfer amount of the photoelectric
transfer element by obtaining an amount of remaining electric
charge in the storage capacitor after discharging the electric
charge; and a fourth step, when the three steps are regarded as one
cycle of image reading, of applying a voltage, whose polarity is
opposite to average polarity of a voltage making the thin film
transistor in the OFF state, to a gate electrode of the thin film
transistor within a period in which the third step shifts to the
first step of a next cycle.
[0240] Therefore, by applying a voltage, whose polarity is opposite
to average polarity of the voltage making the thin film transistor
in the OFF state, to the gate electrode in the arbitrary period, it
is possible to prevent disadvantage which occurs in case of keeping
on applying the voltage, making the thin film transistor in the OFF
state, to the gate electrode, that is, it is possible to suppress
the short-time variation of a resistance value of the thin film
transistor.
[0241] In this manner, by suppressing the short-time variation of
the resistance value of the thin film transistor used as a
photodetecting element, it is possible to appropriately correct (i)
sensitivity of the thin film transistor and (ii) correction data
that has been obtained in a calibration operation performed to
obtain the correction data with respect to a gray scale
property.
[0242] As the correction data at this time, it is possible to use
first calibration data that has been obtained in a calibration
operation performed right after turning ON a power source of the
device, so that it is not necessary to frequently perform the
calibration operation unlike conventional techniques.
[0243] Further, influences of the short-time variation of the
resistance value of the thin film transistor are not accumulated,
so that there is no possibility that the variation is so large that
it is difficult to restore the variation. Thus, it is possible to
obtain the reliability kept for an extended period of time.
[0244] Therefore, it is possible to perform image reading stably
for an extended period of time. As a result, it is possible to
obtain such advantage that the operability and the reliability of
the image reading device are improved.
[0245] Moreover, within a period constituted of the first step to
the third step for image reading, i.e., within a period in which
the third step shifts to the first step of the next cycle, the
voltage having the opposite polarity is applied, so that the
application of the voltage does not influence the image
reading.
[0246] Thus, even in the case where images are sequentially read,
the application of the voltage does not influence the image
reading, so that it is possible to perform the image reading
stably. As a result, it is possible to improve the operability and
the reliability of the image reading device.
[0247] The fourth step may be carried out once in a plurality of
cycles.
[0248] In this case, it is possible to shorten a period from the
third step (excluding the fourth step) to the first step of the
next cycle, so that when images are sequentially read, it is
possible to give continuity to the read images until the fourth
step is carried out. Thus, it is possible to display the read
images with continuity.
[0249] As described above, when the thin film transistor is used as
a photodetecting element, it is necessary to suppress the
short-time variation of the resistance value of the thin film
transistor so as not to exceed 10% in consideration for the
photodetection accuracy.
[0250] Then, in order to suppress the short-time variation of the
resistance value of the thin film transistor so as not to exceed
10%, the following procedure is performed.
[0251] A time in which the voltage is applied to the gate electrode
in the fourth step is set so that a rate indicating relative
variation of a bright current of the thin film transistor is within
a range of from 0.9 to 1.1.
[0252] Further, the fourth step is carried out in a period whose
length is 3% to 30% with respect to an entire period in which the
thin film transistor is driven.
[0253] Further, the cycle is set to 0.1 Hz to 10 Hz.
[0254] Further, the thin film transistor may function as both a
pixel selection element and the photodetecting element.
[0255] In this case, it is possible to realize an image reading
device, having a simple structure, which realizes highly-fine image
reading, and it is also possible to improve the operability and the
reliability of the device.
[0256] Further, a potential of the voltage applied to the gate
electrode in the arbitrary period may be set to be equal to a
potential of a voltage making the thin film transistor in the ON
state.
[0257] In this case, a potential of the voltage applied to the gate
electrode in the arbitrary period may be set to be equal to a
potential of a voltage making the thin film transistor in the ON
state, so that the voltage applied to the gate electrode can be
used as both (i) the voltage making the thin film transistor in the
ON state and (ii) a voltage which functions as the compensation
signal.
[0258] Thus, it is not necessary to switch the voltage in a
complicate manner, so that it is possible to simplify the structure
of the driver for driving the gate electrode. As a result, it is
possible to miniaturize the device and to reduce the power
consumption.
[0259] Further, application of the voltage to the gate electrode
that should be performed in the fourth step may be performed not in
the fourth step but in a period in which the storage capacitor is
charged with a predetermined amount of electric charge in the first
step of the next cycle.
[0260] In this case, it is not necessary to provide a period for
carrying out the fourth step, so that it is possible to shorten a
period from the third step to the first step of the next cycle.
Thus, when images are sequentially read, it is possible to improve
the reading speed, and it is also possible to improve the
operability of the device.
[0261] The invention being thus described, it will be obvious that
the same way may be varied in many ways. Such variations are not to
be regarded as a departure from the spirit and scope of the
invention, and all such modifications as would be obvious to one
skilled in the art are intended to be included within the scope of
the following claims.
INDUSTRIAL APPLICABILITY
[0262] The image reading device of the present invention can be
preferably applied to a device, required to be smaller or to be
miniaturized, which uses a TFT as a photodetecting element, for
example, the image reading device can be preferably applied to a
contact-type flat bed scanner, PDA (Personal Digital Assistants),
and the like, each of which reads a document and a photograph.
* * * * *