U.S. patent application number 11/127103 was filed with the patent office on 2005-10-20 for method and device for in situ layer thickness determination.
Invention is credited to Bast, Ulrich, Beyer, Roman, Reiche, Ralph.
Application Number | 20050229847 11/127103 |
Document ID | / |
Family ID | 29225654 |
Filed Date | 2005-10-20 |
United States Patent
Application |
20050229847 |
Kind Code |
A1 |
Bast, Ulrich ; et
al. |
October 20, 2005 |
Method and device for in situ layer thickness determination
Abstract
A method and device for layer thickness determination allows for
the layer thickness to be determined in situ during the coating
process. This is achieved using a sensor which has an electrical
property which, as a result of the coating process, changes in a
manner which is representative of the layer thickness which has
been reached. As such, this property can be measured.
Inventors: |
Bast, Ulrich; (Muenchen,
DE) ; Beyer, Roman; (Berlin, DE) ; Reiche,
Ralph; (Berlin, DE) |
Correspondence
Address: |
HARNESS, DICKEY & PIERCE, P.L.C.
P.O. BOX 8910
RESTON
VA
20195
US
|
Family ID: |
29225654 |
Appl. No.: |
11/127103 |
Filed: |
May 12, 2005 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
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11127103 |
May 12, 2005 |
|
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10434165 |
May 9, 2003 |
|
|
|
6936299 |
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Current U.S.
Class: |
118/712 ;
118/715 |
Current CPC
Class: |
C23C 2/14 20130101; C23C
4/12 20130101; C23C 14/545 20130101; C23C 16/52 20130101; G01B 7/06
20130101; C23C 4/16 20130101 |
Class at
Publication: |
118/712 ;
118/715 |
International
Class: |
B05C 021/00; G01B
007/06 |
Foreign Application Data
Date |
Code |
Application Number |
May 10, 2002 |
EP |
02010628.2 |
Claims
What is claimed is:
1. A device for in situ layer thickness determination during a
coating process, comprising: a sensor, adapted to be changed by the
coating process in such a way that, as a result, an electrical
property of the sensor which bears a correlation to the layer
thickness is influenced; and means for measuring the change in the
electrical property to determine the layer thickness.
2. The device as claimed in claim 1, wherein the sensor consists of
MCrAlY, where M is an element selected from the group consisting of
iron, cobalt and nickel.
3. The device as claimed in claim 1, wherein the coating process is
an alitizing process.
4. The device as claimed in claim 1, wherein the electrical
property is the electrical resistance.
5. The device as claimed in claim 1, wherein the sensor is a
sintered part.
6. The device as claimed in claim 1, wherein the coating process is
a chemical vapor deposition process.
7. The device as claimed in claim 1, wherein the coating process is
used for the internal coating of a component.
Description
DOMESTIC PRIORITY
[0001] This application is a divisional of allowed application Ser.
No. 10/434,165, filed on May 9, 2003, the entire contents of which
are hereby incorporated by reference and for which priority is
claimed under 35 U.S.C. .sctn.120.
FOREIGN PRIORITY
[0002] The present application hereby claims priority under 35
U.S.C. .sctn.119 on European patent application number EP
02010628.2 filed May 10, 2002, the entire contents of which are
hereby incorporated herein by reference.
FIELD OF THE INVENTION
[0003] The invention generally relates to a method and/or device
for layer thickness determination.
BACKGROUND OF THE INVENTION
[0004] In coating processes, such as for example internal alitizing
processes (aluminizing of internal surfaces), the layer thickness
is determined by way of a metallographic examination. For this
purpose, a wire specimen is introduced into the coating process at
a location which is representative of a component which is to be
coated. After the coating process has ended, the wire specimen is
removed and is then, expensively, cut open and examined. Each
coating process is monitored and documented by the use of
concomitant working specimens. These measuring and testing methods
do not allow coating processes which are not to spec to be
corrected as they are ongoing. Therefore, this is a very expensive
form of quality assurance.
SUMMARY OF THE INVENTION
[0005] It is an object of an embodiment of the invention to provide
a method and device for layer thickness determination which solves
at least one of the problems outlined above.
[0006] An object may be achieved by a method or device in which a
sensor is exposed to the coating process in the same way as the
component which is to be treated, and an electrical property of
this sensor is measured. This property changes as a result of the
coating process, so that in situ layer thickness determination
during the coating process is possible.
[0007] The method is suitable in particular for alitizing processes
in which aluminum is introduced into a component
(refurbishment).
[0008] The electrical resistance is preferably used as a simple
electrical measurement variable which is representative of the
coating result.
[0009] The sensor is, for example, a sintered body, since a
sintered body can take up the applied coating material in a
representative way (accumulation and diffusion rate).
Alternatively, it may be, for example, also porous or, for example,
made from the material of the component which is to be coated or
from MCrAlY.
[0010] The method and/or device is particularly suitable for
coating processes in the interior of a component, since these are
not readily accessible.
BRIEF DESCRIPTION OF THE DRAWINGS
[0011] An exemplary embodiment of the invention is illustrated in
simplified form in the drawings, in which:
[0012] FIG. 1 shows a component with a sensor, which component is
coated, with the method according to an embodiment of the invention
being used for layer thickness determination, and
[0013] FIG. 2 shows a measuring arrangement having a sensor for the
method according to an embodiment of the invention.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
[0014] FIG. 1 shows a hollow component 1 which is to be coated, for
example, on an inner surface 4. However, the method can also be
used for the in situ layer thickness determination of external
surfaces.
[0015] A layer 7 of the material M is applied to the inner surface
4 by means of known processes, such as for example CVD (chemical
vapor deposition) processes, electrochemical processes or other
known coating processes. A sensor 10 is arranged in the cavity 19
of the component 1 and is therefore coated in the same way as the
component 1 which is to be treated.
[0016] FIG. 2 shows an enlarged view of the sensor 10.
[0017] The sensor 10 consists of a material which has an electrical
property, such as for example its electrical resistance, impedance,
capacitance or the like, which changes as a result of some form of
interaction with the material M which forms the layer. The sensor
10 may be of any desired shape, i.e. may, for example, be a piece
of wire or in the shape of a small plate.
[0018] The sensor 10 is connected to an electrical measuring unit
16 via electrical lines 13; the measuring unit measures the
electrical parameter which changes as a result of the sensor 10
being coated with the material M. The way in which the layer
thickness is dependent on the electrical variable is known from
calibration curves determined in preliminary tests.
[0019] The method is used in particular for internal alitizing
processes in which aluminum is applied to an inner surface 4 of a
component 1 (M=Al). In this case, the sensor consists, for example,
of the material MCrAlY (M=Fe, Co, Ni) and changes with the aluminum
applied during a CVD process in such a manner that the measured
electrical characteristic variable changes in a manner which is
representative of the coating result.
LIST OF REFERENCE SYMBOLS
[0020] 1 Component
[0021] 4 Inner surface
[0022] 7 Layer
[0023] 10 Sensor
[0024] 13 Electrical line
[0025] 16 Electrical evaluation/control
[0026] 19 Cavity
[0027] The invention being thus described, it will be obvious that
the same may be varied in many ways. Such variations are not to be
regarded as a departure from the spirit and scope of the invention,
and all such modifications as would be obvious to one skilled in
the art are intended to be included within the scope of the
following claims.
* * * * *