U.S. patent application number 10/805930 was filed with the patent office on 2005-09-22 for method and apparatus for testing rf modules.
This patent application is currently assigned to Nokia Corporation. Invention is credited to Moilanen, Kari, Rousu, Seppo.
Application Number | 20050206570 10/805930 |
Document ID | / |
Family ID | 34912643 |
Filed Date | 2005-09-22 |
United States Patent
Application |
20050206570 |
Kind Code |
A1 |
Rousu, Seppo ; et
al. |
September 22, 2005 |
METHOD AND APPARATUS FOR TESTING RF MODULES
Abstract
A device that has an antenna and an internal RF circuit is
connected by an electrical conductor that has a first portion
coupled to the RF circuit and an opposed, flexibly resilient second
portion. The second portion defines a contact point and a testing
point. The contact point is normally electrically coupled to the
antenna by a bias in the second portion. When a biasing force such
as a RF testing probe exerts force on the testing point through an
aperture of a device housing, the normal bias of the second portion
is overcome and contact is temporarily interrupted between the
antenna and the contact point. The RF probe is placed in electrical
contact with the RF circuit by contact with the testing point,
which may be directly when a cover over the aperture is removable,
or via a conductive pathway imposed through a flexible membrane
that is fixed to the housing as a cover over the aperture.
Inventors: |
Rousu, Seppo; (Oulu, FI)
; Moilanen, Kari; (Oulu, FI) |
Correspondence
Address: |
HARRINGTON & SMITH, LLP
4 RESEARCH DRIVE
SHELTON
CT
06484-6212
US
|
Assignee: |
Nokia Corporation
|
Family ID: |
34912643 |
Appl. No.: |
10/805930 |
Filed: |
March 22, 2004 |
Current U.S.
Class: |
343/702 ;
343/703 |
Current CPC
Class: |
H04B 17/29 20150115;
H04B 17/19 20150115; H01Q 1/243 20130101; H04B 17/15 20150115; H04B
17/17 20150115 |
Class at
Publication: |
343/702 ;
343/703 |
International
Class: |
H01Q 001/24 |
Claims
What is claimed is:
1. A device comprising: a housing defining a housing aperture; a RF
circuit disposed within said housing; an antenna; an electrical
conductor disposed within said housing and defining a first portion
and an opposed movable second portion, wherein said first portion
is coupled to the RF circuit and the second portion defines an
antenna contact point and a testing point spaced from one another,
said testing point aligned with said housing aperture and said
second portion normally biased to couple to said antenna through
the contact point; and a cover over said housing aperture.
2. The device of claim 1 wherein said cover is removable.
3. The device of claim 1 wherein said cover is fixedly coupled to
said housing and defines a flexibly resilient portion disposed over
said housing aperture.
4. The device of claim 3 wherein said flexibly resilient portion
defines a first planar surface facing said aperture and an opposing
second planar surface, said cover further comprising a conductive
pathway from said first to said second planar surfaces.
5. The device of claim 1 wherein said antenna comprises a planar
antenna disposed outside said housing.
6. The device of claim 5 wherein said planar antenna defines an
antenna aperture that is aligned with said housing aperture.
7. The device of claim 6 wherein said housing aperture is a first
housing aperture, and said housing further defines a second housing
aperture aligned with said antenna contact point.
8. The device of claim 1 wherein said testing point is disposed
between said antenna contact point and said electrical conductor
first portion.
9. The device of claim 1 wherein said antenna contact point is
disposed between said testing point and said electrical conductor
first portion.
10. The device of claim 9 wherein said electrical conductor is a
signal-carrying conductor, said device further comprising: a
ground-carrying conductor disposed within said housing and defining
a first grounding portion and an opposed movable second grounding
portion, wherein said first portion is coupled to a common
potential within said device and the second grounding portion
defines a grounding test point and an antenna grounding contact
point disposed between the grounding test point and the grounding
first portion, said grounding testing point aligned with said
housing aperture and said second portion normally biased to couple
to said antenna through the grounding contact point.
11. The device of claim 10 further comprising an insulating member
disposed between said grounding test point and said testing point
of said signal-carrying member, wherein said testing point of said
signal-carrying member is disposed between said grounding test
point and said cover.
12. The device of claim 1 wherein said first portion is fixedly
coupled to said RF circuit and said antenna contact point remains
coupled to said antenna by said normal bias of said second
portion.
13. The device of claim 1 wherein said RF circuit is a
radiotelephone transceiver and the device is a mobile terminal.
14. The device of claim 1 wherein the cover is water resistant.
15. A method to temporarily disconnect an antenna fixed to a
wireless device from circuitry internal to the wireless device
comprising: locating a flexibly resilient convex membrane along an
outer surface of a wireless device housing; and depressing the
flexibly resilient convex membrane with an electrical testing probe
to disconnect an antenna of the device from the internal circuitry;
receiving an electrical signal from the internal circuitry to the
device at the testing probe; and removing the testing probe from
the membrane.
16. The method of claim 15 wherein depressing the flexibly
resilient convex membrane with an electrical testing probe
comprises applying the testing probe to a conductive portion of the
membrane.
17. The method of claim 15 executed on a completed wireless device
wherein the housing completely envelops the internal circuitry.
18. The method of claim 15 executed on a wireless device under
construction wherein the housing does not completely envelop the
internal circuitry.
19. A method to temporarily disconnect an antenna fixed to a
wireless device from circuitry internal to the wireless device
comprising: locating a removable cover along an outer surface of a
wireless device housing; removing said cover to expose an aperture
through said housing; inserting an electrical testing probe into
the aperture to disconnect an antenna of the device from internal
circuitry by depressing a portion of a flexible electrical
conductor; receiving an electrical signal from the circuitry
internal to the device at the testing probe; and removing the
testing probe from the aperture and replacing a cover over said
aperture.
Description
TECHNICAL FIELD
[0001] This invention relates generally to the field of radio
frequency (RF) testing and, more specifically, relates to the
testing of RF circuits located in wireless devices in a manner that
does not require removal of the module housing or antenna.
BACKGROUND
[0002] There has been a great increase in the development of RF
components, especially in mobile stations and similar such devices.
The advancement of mobile stations has prompted the increase in the
number of RF components that require production line and service
testing of RF signals for conformance to government and industry
standards. The testing and characterization of these RF signals has
been important to quality control in the production and repair of
mobile terminals.
[0003] The complexity of wireless devices is increasing, and as a
result, this requires more testing time for the individual RF
components. Costs are typically determined by such factors as labor
and the number of test devices needed. As in any mass production
undertaking, optimizing these cost factors is an important
consideration.
[0004] For reasons of expediency of both production and servicing
it is optimal to test RF signals from RF components without
dis-assembling the host wireless device. Also, it is preferable to
conduct RF testing without a connected antenna in order to measure
RF output power accurately. In the testing of receiver circuits, a
connected antenna can receive interference signals, thus preventing
the accurate testing of the receiver circuits. It is preferred to
conduct RF testing without a connected antenna in order to limit
the undesirable transmission of RF energy from the antenna. This
undesirable transmission can interfere with surrounding electrical
equipment. There have been methods provided in the prior art for
testing RF devices, which, when used in servicing a mobile station,
generally require the removal of the antenna, housing, or other
components. In some types of mobile stations, the antenna must
first be removed to allow for RF testing of the antenna connection.
In addition, the mobile station must usually be dis-assembled into
various parts.
[0005] In the manufacture of mobile stations, RF testing is usually
first conducted prior to complete assembly. Such testing is usually
followed by final assembly and a further RF test of the fully
assembled device. This method is repetitious and inefficient, and
further exposes the device and its internal components to damage
that could frustrate other quality controls.
[0006] In a service center it is possible to install new software
on a malfunctioning mobile station with little or no disassembly of
the device. Afterwards, the mobile station typically requires
testing prior to being returned to the customer. It would be
advantageous if the mobile station could be RF tested in the
service center without dis-assembly to identify and isolate
malfunctioning component(s).
[0007] Sometimes an antenna must be removed in a service center,
exposing it to damage. Some wireless devices contain an aperture
for RF testing. However, these apertures can expose sensitive
internal components to damaging environmental factors such as
moisture or dust during normal use by the customer. Such
contamination may also enter if a mobile station's housing is
breached during testing that requires dis-assembly. One example of
an aperture is in U.S. Pat. No. 6,469,673, which describes an
aperture in a planar radiator element of a mobile station for
testing of RF signals. Apart from the advantages it offers, this
aperture appears to provide for the above-mentioned environmental
exposure.
[0008] Some mobile stations protect against environmental
contaminants such as water and dust by including more occlusive
seals, some of which are water resistant. Minor additional expense
associated with these more occlusive seals is justified by the
increased longevity of the internal components, which remain better
protected. However, such seals also make routine maintenance more
difficult and raise maintenance expenses.
[0009] Some mobile stations include a specific RF connector on the
printed wire board that is dedicated to RF testing only, and
provides no direct advantage to the customer. It would be useful to
remove this kind of connector, as it adds to the cost and the
required printed wire board area.
[0010] What is needed in the art is an apparatus and method for
testing RF components that are internal to a wireless device
without requiring the device be disassembled, and/or without
leaving the internal components exposed to environmental
contaminants such as dust or water during normal use.
SUMMARY
[0011] The foregoing and other problems are overcome, and other
advantages are realized, in accordance with the presently preferred
embodiments of these teachings. In accordance with one aspect of
the present invention is a device for transmitting wireless
signals. The device includes a housing that defines an aperture, an
RF circuit and an electrical conductor each disposed within the
housing, an antenna, and a cover over the aperture. The electrical
conductor, preferably a spring metal, defines a first portion and
an opposed movable second portion. The first portion is coupled to
the RF circuit, preferably by a fixed connection such as a solder,
ultrasonic bond, conductive adhesive, and the like. The second
portion defines an antenna contact point and a testing point that
are spaced from one another. The testing point is aligned with the
aperture in the housing, and the second portion of the conductor is
normally biased to couple to the antenna through the contact point.
Preferably, the contact point directly contacts the antenna, though
intermediary components may be disposed without departing from the
broader aspects of the invention. Most preferably, conductive
coupling between the contact point and the antenna is maintained
only by the bias of the second portion of the conductor.
[0012] The cover over the aperture may be removable, such as a plug
or adhesive tape. But preferably, the cover is fixedly attached to
the housing and includes a flexibly resilient membrane disposed
directly over the aperture. The membrane preferably includes a
conductive portion through it. When the RF testing point of the
conductor is depressed, such as might be done by a probe through
the aperture (for the removable cover) or by depressing the
membrane, the second portion of the conductor moves so that
electrical contact between the contact point and the antenna is
broken. The probe is coupled to the RF circuit through the testing
point of the conductor, so the internal components of the device
may be tested without dis-assembling the device housing. Other
alternative embodiments are disclosed in the detailed description
section below.
[0013] In accordance with a yet still further aspect of the
invention, there is provided a method to temporarily disconnect an
antenna that is fixed to a wireless device, from circuitry that is
internal to the wireless device. The method includes locating a
flexibly resilient convex membrane along an outer surface of a
wireless device housing, and depressing the flexibly resilient
convex membrane with an electrical testing probe to disconnect an
antenna of the device from the internal circuitry. Preferably, the
membrane includes a conductive pathway from exterior of the device
to interior, via the aperture over which the membrane is located,
and depressing the membrane deflects it from a convex to a concave
shape. Once the antenna is disconnected, an electrical signal is
received at the probe from the internal circuitry. The testing
probe is then removed from the membrane, which is released from its
concave shape and returns to its convex shape.
[0014] In accordance with another method to temporarily disconnect
an antenna fixed to a wireless device from circuitry internal to
the wireless device, a removable cover is located along an outer
surface of a wireless device housing and removed to expose an
aperture through the housing. An electrical testing probe is
inserted into the aperture far enough to depressing a portion of a
flexible electrical conductor, thereby disconnecting an antenna of
the device from the internal circuitry. An electrical signal from
the internal circuitry is received at the testing probe, the
testing probe is removed from the aperture, and a cover is replaced
over the aperture, preferably the original cover.
[0015] For either method, two probes may be used on one or two
different embodiments of the invention. One probe is used as
described above, and reads out (or inputs) as signal from (or to)
the RF circuit. The other probe disconnects an antenna from ground,
and need not be electrically coupled to the device components.
Preferably, this other probe is connected to printed wire board
ground to enable RF testing.
[0016] Furthermore, other types of probes can also provide for the
disconnection of the antenna in the same manner as was described
for the first probe. The RF testing of the internal circuitry/RF
circuit can involve RF tuning of the device. Alternatively, the
first probe can contain two or more contacts, wherein one is used
for RF testing and one is used for RF grounding which can remove
the need for a second RF probe. RF testing may include RF
tuning.
[0017] The invention can be utilized in both production and service
centers. Through the invention, testing can be done without
significant disassembly of the device. In addition, the use of
dedicated RF test connectors can be avoided on the printed wire
board, resulting in saved space on the printed wire board, which
reduces costs.
[0018] An advantage of the current invention is that the removal of
parts is not necessary and thus dramatically decreases the
potential for damage (e.g., to the antenna radiator). Yet another
advantage of the current invention is that seals and membranes do
not have to be removed (in some embodiments), and in fact, the
mobile station may be tested while remaining completely closed.
This is advantageous because every time a mobile terminal is opened
its capability to tolerate environmental damage is generally
reduced. One example of a prior art antenna feed structure that can
be used with the current invention is in U.S. Patent Application
Ser. No. 2002/0000946.
[0019] An alternative use for the current invention is in a mobile
station vehicle kit that mounts a mobile station within a vehicle.
Such vehicle kits generally connect the device to external power
and sometimes to an external antenna to extend range and increase
signal strength. The vehicle kit can readily couple an external
antenna to a mobile device that incorporates the present invention,
just as an RF probe can de-couple the mobile device's antenna and
couple to its internal RF circuitry. Such and arrangement may
result in higher current consumption and thus decreased standby and
talk time, but vehicle kits typically provide power to the mobile
device from the vehicle rather than the mobile's battery,
offsetting that disadvantage.
[0020] The invention can be used also for DC (direct current) and
digital signal applications. In general, the invention can be used
with various types of equipment that operate on input and output
signals, such as, RF, DC, data and digital signals. This can be
done without providing an open aperture in certain embodiments.
[0021] In high-frequency technology the transmission line between
the feeding source and the circuit that feeds the feeding source is
an important consideration in RF testing. The transmission line
losses should be relatively small, and the transmission line should
not significantly affect the impedance matching. Due to the
advantages of the current invention, printed wire board RF
connectors are not needed and thus additional transmission line
losses are avoided. As will be evident, the present invention
facilitates impedance matching to a great degree.
BRIEF DESCRIPTION OF THE DRAWINGS
[0022] The foregoing and other aspects of these teachings are made
more evident in the following Detailed Description of the Preferred
Embodiments, when read in conjunction with the attached Drawing
Figures, wherein:
[0023] FIG. 1 is a sectional view of a wireless device employing a
preferred embodiment of the present invention.
[0024] FIG. 2 is similar to FIG. 1 but showing operation of the
wireless device in a testing mode using a RF testing probe.
[0025] FIG. 3 is a sectional view of a wireless device employing an
alternative embodiment of the present invention.
[0026] FIG. 4 is similar to FIG. 3 but showing operation of the
wireless device in testing mode using a RF testing probe.
[0027] FIG. 5 is a perspective view showing the overall wireless
device of FIGS. 2 or 4 with the probe or vehicle kit coupled
thereto.
[0028] FIG. 6 is a sectional view of a wireless device employing a
second alternative embodiment wherein a single probe may disconnect
multiple antenna connections simultaneously.
DETAILED DESCRIPTION
[0029] FIG. 1 is a sectional view of a portion of a wireless device
10, such as a mobile station, a hand-held gaming device, a personal
communication device, or any device that contains an RF circuit 12
that feeds an antenna. Often, the RF circuit 12 is a separate
component, though it may be only part of the entire circuitry
disposed in a printed wiring board. FIG. 1 discloses the components
located in the wireless device 10 that provide for a method and
apparatus for disconnecting an antenna to provide for RF testing.
The wireless device 10 contains an RF circuit 12 available for RF
testing. The RF circuit 12 is electrically connected to an antenna
radiator 14 via an electrically conductive path. The electrically
conductive path comprises an electrical conductor such as the
depicted antenna spring member 16. The spring member 16 has a first
portion 16A that is coupled to the RF circuit 12 such as through an
antenna pad 18, and a second portion 16B that defines a contact
point 30 and a testing point 32. The second portion 16B of the
spring member 16 is normally biased so that the contact point 30 is
normally in biased contact with the antenna radiator 14.
[0030] The antenna radiator 14 is made of any suitable material,
such as a copper foil, copper laminate, or other materials known in
the art. The antenna radiator 14 may also be a Midi antenna
radiator. Midi is a manufacturing technology that provides a
plastic material that is plated with a conducting material.
Preferably, as with midi but not exclusive thereto, a lower
insulator layer 28 is disposed between the antenna radiator 14 and
the housing 22, and a protective outer layer 29 overlies a surface
of the antenna opposite the housing 22, preferably the entire
surface opposite the housing.
[0031] As illustrated in the embodiment of FIG. 1, a cover 20
includes a membrane 21 that is disposed over a first aperture 34
defined by a housing 22 of the wireless device 10, preferably
forming a water resistant seal over the first aperture 34. The
testing point 32 of the spring member 16 is also aligned with the
first aperture 34. The antenna radiator 14 is preferably a planar
antenna as shown in FIG. 1 or a rod-type antenna (not shown). The
antenna spring member 16 is detachably coupled to the antenna at
the contact point 30 to the antenna 14 due to the bias of the
second portion 16B of the spring member 16. Regardless of type,
where the antenna 14 overlies the first housing aperture 34, the
antenna 14 also defines an aperture so as not to completely
obstruct the first housing aperture 34. Where present, the lower
insulating layer 28 and the protective outer layer 29 also define a
similar aperture.
[0032] The cover 20 is preferably made from a plurality of
resiliently flexible layers 21A, 21B, 21C, such as depicted in the
expanded view of FIG. 1, though a single layer of sufficiently
pliable and resilient material may be employed. At rest, the
membrane 21 preferably defines a concave shape protruding from an
exterior surface of the housing 22, and is flexibly resilient so
that it may be depressed by an external biasing force into a
concave shape, as in FIG. 2, and return to the illustrated convex
shape when a biasing force is removed. In this embodiment, the
cover 20 is fixedly coupled to the housing 22. Fixedly coupled in
that context includes coupled so that the cover 20 is not normally
removed from the housing 22, and includes coupled via resilient
plastic retaining clips affixed to a frame about the membrane 21, a
pressure fit, ultrasonic or heat welding, and the like. That the
cover 20 may be non-destructively removed from the housing 22 does
not render it coupled to the housing 22 in a non-fixed manner.
[0033] Disposed within the membrane 21 is a conductive pathway 38,
such as a metal body defining a generally cylindrical shape, that
penetrates between a first or external surface 40 of the membrane
21 and an opposing second or interior surface 42 of that membrane.
The conductive pathway 38 is insulated, preferably by the membrane
21 itself, from contact with the antenna 14. For example, the first
aperture 34 measures about 2 mm in diameter, the membrane measures
at least 2 mm in diameter, and the conductive pathway is centered
over the aperture and measures only about 1 mm in diameter so that
it does not contact at any point the antenna 14 (which defines an
aperture of at least 2 mm to match that of the housing 22).
[0034] Again with reference to FIG. 1, the housing 22 further
defines a second aperture 36. The contact point 30 of the spring
member 16 is biased to normally contact the antenna 14 through the
second aperture 36. A corresponding aperture through any existing
insulating layer 34 may be necessary to effect this electrical
connection.
[0035] Preferably, a planar antenna 14 is used as depicted in FIG.
1. However, the planar antenna 14 may be disposed within the
housing 22, or a rod antenna may be used with or without a planar
conductive plate to enable the present invention to selectively
de-couple the antenna from internal circuitry. In an embodiment
where the rod-type antenna is used, (not shown), what is
illustrated as the antenna radiator 14 may instead be an antenna
conduction layer that does not serve as an antenna.
[0036] Operation of the apparatus of the present invention will now
be described. An at rest position is illustrated at FIG. 1, and
represents a mobile station or other wireless device 10 as used
under normal conditions by a retail user. The membrane 21 defines a
convex shape that protrudes slightly from the adjacent exterior
surface of the device 10. A minimal gap or space is preferably
defined between the conductive pathway 38 and the testing point 32,
as illustrated in the expanded portion of FIG. 1. Contact between
them may cause additional power drain in isolated instances, but
will otherwise not frustrate the present invention. The contact
point 30 of the spring member remains in contact with the antenna
14 through the second aperture 36 defined by the housing 22 due to
the bias of the second portion 16B of the spring member 16.
Preferably, that bias is the only means by which the second portion
16B contacts the antenna 14.
[0037] FIG. 2 depicts the apparatus of FIG. 1 but with a biasing
force such as a RF test probe 46 pressed against the cover 20. Two
arrows 48, 50, in FIG. 2 indicate movement of components, at least
some of which is simultaneous. The RF test probe 46 is aligned with
the conductive pathway 38. As the RF test probe 46 moves (first
arrow 48) to depress the conductive pathway 38 and drive the
membrane 21 to a concave geometry, any gap between the testing
point 32 and the conductive pathway 38 is eliminated. Following
elimination of that gap, movement thereafter described for FIG. 2
is simultaneous. The second portion 16B of the spring member 16 is
driven (second arrow 50) away from the housing 22, or at least away
from that portion of the housing that defines the first aperture
34. This movement (second arrow 50) of the entire second portion
drives the contact point 30 away from the antenna 14, breaking
electrical contact therewith as an electrical contact is
established between the RF test probe 46 and the RF circuit 12
through the spring member 16.
[0038] Due to the desire to define a sufficiently large space
between the contact point 30 and the antenna 14 when in the test
position of FIG. 2, without having a cover 20 that protrudes
excessively from the adjacent exterior surface of the device 10
when not in the test position (as in FIG. 1), it is preferable to
dispose the contact point 30 nearer an end of the spring member 16
and the testing point 32 between the contact point and the first
portion 16A. This enables a small deflection at the testing point
32 to effect a larger movement at the contact point 30 for the
embodiment of FIGS. 1-2. This also enables the antenna to contact a
terminal end (the contact point 30) of the contactor 16 when in the
normal, non-testing mode of operation. This provides a more
positive contact than a protruding `stub` located apart from an end
of the conductor 16. Such a stub is depicted as the testing point
32 in FIGS. 1-2.
[0039] An alternative embodiment is described at FIGS. 3-4, of
which FIG. 3 depicts components in their normal, at rest
orientation, and FIG. 4 depicts components in their orientation
when in a testing mode. Like reference numbers indicate like
components to the extent not explicitly distinguished. As shown in
FIG. 3, a wireless device 10 includes a RF circuit 12, a spring
contactor 16 having a first portion 16A coupled to the RF circuit
12 and an opposing flexibly resilient second portion 16B for
selectively coupling to an antenna 14. While the housing 22 defines
a first 34 and second 36 aperture, their orientation with respect
to one another is reversed as compared to the preferred embodiment
of FIGS. 1-2. This is because in the embodiment of FIGS. 3-4, the
relative positions of the contact point 30 and the testing point 32
are also reversed as compared to the preferred embodiment.
[0040] Specifically, the testing point 32 is preferably disposed
near an end of the second portion 16B and the contact point 30 is
preferably disposed between the testing point 32 and the first
portion 16A. The reverse order is possible. The cover 20 is not
fixedly attached but is removable attached so that it may re
readily removed for testing the RF circuit in accordance with a
method of using the apparatus of the alternative embodiment. While
the cover 20 of the alternative embodiment remains preferably water
resistant and most preferably water proof, it may be a piece of
adhesive tape or more durably a removable plug. A special tool not
readily available to retail users of a mobile station or other
wireless device 10 will inhibit curious users from removing and
potentially losing such a plug 20.
[0041] In the at rest position when the device is not being
subjected to testing, the alternative embodiment of FIG. 3 includes
the contact point 30 protruding through the second aperture 36 to
contact the antenna 14. The bias of the second portion 16B retains
the contact point 30 in such electrical contact. A relatively large
gap, preferably greater than a thickness of the housing 22 in the
area of the first aperture 34, divides the testing point 32 from
the removable cover 20.
[0042] In the testing position of the alternative embodiment shown
in FIG. 4, the removable cover 20 is removed from obstructing the
first aperture 34, and a RF testing probe 46 is inserted
therethrough. After first contacting the testing point 32, the
probe is inserted further (third arrow 52) to overcome the normal
bias of the second portion 16B of the spring member 16. This drives
the second portion 16B away from the portion of the housing that
defines the second aperture 36, breaking contact between the
contact point 30 and the antenna 14. The probe 46 is already in
contact with the testing point 32 at the time contact is broken
between the contact point 30 and the antenna 14. A collar 54may be
disposed on the probe to ensure it is not inserted an excessive
distance into the first aperture 34. Such excessive insertion might
alter the normal bias of the second portion 16B such that, upon
removal of the probe 46, the contact point 30 will not return to
firmly contact the antenna 14. Such a collar 54 should be disposed
on the probe 46 such that a distance between a surface of the
collar nearest the probe tip exceeds a distance between the testing
point 32 and an exterior surface of the wireless device 10 in the
immediate vicinity of the first aperture 34. Preferably, a
difference between those distances is less than 5 mm . After
testing using the alternative embodiment of FIGS. 3-4, the
removable cover 20 is replaced.
[0043] FIG. 5 is a side partial cutaway view of the wireless device
10, specifically, a mobile station defining a keypad 56 and a
display interface 56 along a surface of the device 10 opposite that
through which a test probe 46 may be employed using the present
invention. FIG. 5 best illustrates how the present invention may be
used for other than RF testing purposes. Rather than a RF testing
probe, the device 10 of FIG. 5 may be clipped into a vehicle mount
and an exterior antenna coupler may instead couple to the RF
circuit 12 in the same manner described above that the RF test
probe 46 would couple. In such an application, the preferred
embodiment would likely garner better market acceptance, as users
would likely not embrace removing and replacing a plug each time
they wanted the increased signal strength and call reliability that
coupling to a vehicle external antenna generally yields.
[0044] In certain instances, it is desirable to use multiple RF
testing probes 46. A wireless device 10 may be equipped with more
than one copy of the present invention (identical or different
embodiments) to enable separate probes or separate probe tips of
the same probe 46 to separately contact different points within the
RF circuit 12. For example, one RF probe 46 may define two tips, of
which one is a ground and the other reads out signals to be
analyzed.
[0045] Generally, an antenna will have at least two parallel
connections to the printed wire board PWB. One connection is for
grounding the antenna and the other parallel connection feeds a
signal to the antenna. If only one connection is disconnected, RF
testing is typically not optimal because of the possibility of the
undesirable transmission of RF energy from the parallel
(unconnected) antenna connection. Therefore, each separate antenna
connection is disconnected by a separate probe or by a single RF
testing probe 46. The invention can be implemented so that all of
the probes needed for disconnection of all the antenna connections
are integrated into the same cylinder or hoop of probes.
[0046] Such an embodiment is depicted at FIG. 6. In summary, this
embodiment includes two spring members, one carrying an electrical
signal 16 as previously described, and one carrying a common
potential, termed the grounding member 60. Both are coupled to
separate portions of the antenna 14.
[0047] As shown in FIG. 6, the signal member 16 is coupled to an
antenna pad 18 at a first portion 16A, and a flexible second
portion 16B defines both a contact point 30A that is normally
biased to contact one portion of the antenna 14 via a second
aperture 36 through the housing 22 and a signal testing point 32A
disposed in alignment with a first housing aperture 34. This is
similar to that described with reference to FIGS. 3-4. The
grounding member 60 similarly defines a first portion 60A that is
fixed to a grounding pad 62 and an opposed flexible second portion
60B that defines a ground contact point 30B that is normally biased
to contact a grounded portion of the antenna 14 through a third
aperture 66 defined by the housing 22. The second portion 60B of
the grounding member 60 further defines a ground testing point 32B
that is also aligned with the first aperture 34, but separated from
the testing point 32A of the signal-carrying member 16 by an
electrical insulator 64, preferably a rigid body insulator. The
first aperture 34 is extended to penetrate any portions of the
insulating layer 28, antenna 14, and protective outer layer 29 that
may be present. A cover 20 may be the membrane type as described
with reference to FIGS. 1-2, or the removable type as described
with reference to FIGS. 3-4. FIG. 6 illustrates the membrane type.
The membrane 21 is fixedly coupled to the housing 22, and a
conductive pathway 38 passes through it. When the membrane 21 is
depressed from its depicted convex shape, the conductor urges the
second portion of both the signal carrying member 16 and the
grounding member 60A downward (as depicted) as force is transferred
through the conductive pathway 38 and the insulator 64. As this
occurs, electrical contact between the antenna 14 and the contact
point 30A of the signal carrying member 16 is interrupted, as it is
between the antenna 14 and the ground contact point 30B of the
grounding member 60. As depicted, preferably the testing point 32A
of the signal-carrying member 16 is disposed between the membrane
21 or other cover 20 and the ground testing point 32B of the
grounding member 60.
[0048] In this manner, a single RF testing probe 46 may
simultaneously disconnect more than one electrical connector 16, 60
from the antenna 14 while making contact with the underlying RF
circuit 12. Ground may be provided to the device 10 through its
normal external power receptacle (not shown). That external ground
sets the potential at the grounding pad 62, and may also serve as a
ground for the RF testing probe in a grounding connection external
to the device 10. Since both the RF probe 46 and the device 12 are
linked to the same external ground, the end result is the same as
if the RF device 46 was itself linked to the grounding pad 62
within the device 10.
[0049] Alternatively, a signal-carrying spring member and a
grounding spring member, each as in FIGS. 1-2, may be disposed
separately and independently de-coupled from the antenna by
separate probes at separate membranes. In that instance, the probe
de-coupling the grounding member need not be a RF test probe and
the associated membrane need not include a conductive portion, as
electrical current need not flow from the spring member to that
non-RF testing probe. Either of the alternatives of this paragraph
may also be used with the embodiment of FIGS. 3-4.
[0050] The RF devices of the current invention can involve various
signaling types. For example, the signaling types can involve
pulsed transmission and pulsed reception, as well as, continuous
transmission and continuous reception signaling type RF devices.
The disconnected antenna system can be one of a single frequency
band antenna, a multi-frequency band antenna, a single mode antenna
system and a multimode antenna system. The testing can involve the
testing of the transmitter or the receiver. The individual antenna
types can be Pifa, loop, slot and whip antennas or others known in
the art. The shape and length of transmission line conductors may
vary.
[0051] The current invention as described in the figures thus
allows for the production-line and service testing of wireless
devices without removing the wireless device housing 22, or any
component associated with the antenna spring member 16.
[0052] Based on the foregoing description, it can be appreciated
that the current invention does not require dedicated printed
wiring board (PWB) testing components that are conventionally
required to allow for testing. In addition, conventional spring
contact pins, known in the trade as pogo pins, are not needed.
Unlike other previously used methods, the invention can allow for
complete or at least partial assembly of an wireless device that
can then have the complete or at least partially assembled wireless
device RF tested before it leaves the production facility or,
alternatively, have the completely assembled wireless device RF
tested when servicing is required without having to remove any of
the components of the completely assembled wireless device. These
embodiments are advantageous in that they provide a solution that
eliminates the requirement for antenna disassembly, or the removal
of wireless device components, prior to RF testing, and does so at
low cost and low complexity.
[0053] The use of the teachings of this invention may also be
employed in other than wireless terminals, which may be viewed as a
presently preferred, but not limiting application for these
teachings. The foregoing description has provided by way of
exemplary and non-limiting examples a full and informative
description of the best method and apparatus presently contemplated
by the inventor(s) for carrying out the invention. However, various
modifications and adaptations may become apparent to those skilled
in the relevant arts in view of the foregoing description, when
read in conjunction with the accompanying drawings and the appended
claims. As but for some examples, the use of other similar or
equivalent switches may be attempted by those skilled in the art
such as discrete transistors coupled with a mechanical relay or
solenoid, or any other type of switch that can perform
substantially the same function of opening the electrically
conductive path. However, all such and similar modifications of the
teachings of this invention will still fall within the scope of
this invention.
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