U.S. patent application number 10/675286 was filed with the patent office on 2005-03-31 for computer system having drive temperature self-adjustment for temperature-sensitive measurements.
This patent application is currently assigned to Hitachi Global Storage Technologies. Invention is credited to Escobar, Jorge F., Khurshudov, Andrei.
Application Number | 20050071117 10/675286 |
Document ID | / |
Family ID | 34218168 |
Filed Date | 2005-03-31 |
United States Patent
Application |
20050071117 |
Kind Code |
A1 |
Escobar, Jorge F. ; et
al. |
March 31, 2005 |
COMPUTER SYSTEM HAVING DRIVE TEMPERATURE SELF-ADJUSTMENT FOR
TEMPERATURE-SENSITIVE MEASUREMENTS
Abstract
A computer system that adjusts an internal temperature of a hard
disk drive (HDD) during HDD testing. An HDD test program under the
control of the computer system is performed within a pre-determined
optimal test temperature range. The HDD is kept within this
pre-determined test temperature range by the computer system
switching HDD operation modes back and forth between a higher heat
generating Rapid Seek Mode and a lower heat generating IDLE mode.
The HDD is thus kept within the optimal test temperature range
without the use of external heating and/or cooling devices.
Inventors: |
Escobar, Jorge F.; (San
Jose, CA) ; Khurshudov, Andrei; (San Jose,
CA) |
Correspondence
Address: |
BRACEWELL & PATTERSON, L.L.P.
P.O. BOX 969
AUSTIN
TX
78767-0969
US
|
Assignee: |
Hitachi Global Storage
Technologies
Amsterdam
NL
|
Family ID: |
34218168 |
Appl. No.: |
10/675286 |
Filed: |
September 30, 2003 |
Current U.S.
Class: |
702/132 ;
G9B/25.003; G9B/33.041 |
Current CPC
Class: |
G11B 33/144 20130101;
G11B 25/043 20130101 |
Class at
Publication: |
702/132 |
International
Class: |
G01K 001/00 |
Claims
What is claimed is:
1. A data processing system having a hard disk drive having two
modes of operation, the hard disk drive comprising: means for
setting a desired temperature range for a hard disk drive that is
being tested; means for, upon determining that a temperature inside
the hard disk drive is below the desired temperature range,
changing a mode of operation of the hard disk drive from a first
mode of operation to a second mode of operation, wherein the first
mode of operation generates less heat than the second mode of
operation; and means for, upon determining that the temperature
inside the hard disk drive is above the desired temperature range,
changing the mode of operation of the hard disk drive from the
second mode of operation to the first mode of operation.
2. The data processing system of claim 1, wherein the first and
second modes of operation are seek modes, and wherein the first
seek mode is slower than the second seek mode.
3. The data processing system of claim 1, wherein the first mode of
operation is an IDLE seek mode and the second mode of operation is
a rapid seek mode.
4. A data processing system of claim 1, wherein the first mode of
operation has a slower disk rotation speed than the second mode of
operation.
5. The data processing system of claim 1, wherein the first mode of
operation has a slower clock speed than a second mode of operation
for a processor within the hard disk drive.
6. A data processing system having hard disk drive capable of
maintaining a steady internal temperature during testing operations
of the hard disk drive, the hard disk drive having two modes of
operation, the hard disk drive comprising: means for setting a
desired temperature range for a hard disk drive that is being
tested; means for, upon determining that a temperature inside the
hard disk drive is below the desired temperature range, changing a
mode of operation of the hard disk drive from a first mode of
operation to a second mode of operation, wherein the first mode of
operation generates less heat than the second mode of operation;
and means for, upon determining that the temperature inside the
hard disk drive is above the desired temperature range, changing
the mode of operation of the hard disk drive from the second mode
of operation to the first mode of operation.
7. The data processing system of claim 6, wherein the first and
second modes of operation are seek modes, and wherein the first
seek mode is slower than the second seek mode.
8. The data processing system of claim 6, wherein the first mode of
operation is an IDLE seek mode and the second mode of operation is
a rapid seek mode.
9. A data processing system of claim 6, wherein the first mode of
operation has a slower disk rotation speed than the second mode of
operation.
10. The data processing system of claim 6, wherein the first mode
of operation has a slower clock speed than a second mode of
operation for a processor within the hard disk drive.
11. A data processing system having hard disk drive capable of
being rapidly warmed before testing, the hard disk drive having a
first and second mode of operation, the hard disk drive comprising:
means for setting a desired temperature range for a hard disk drive
that is to be tested; and means for, upon determining that a
temperature inside the hard disk drive is below the desired
temperature range, setting a mode of operation of the hard disk
drive to a first mode of operation, wherein the first mode of
operation generates more heat than a second mode of operation,
until the desired temperature range is reached.
12. The data processing system of claim 11, wherein the first and
second modes of operation are seek modes, and wherein the first
seek mode is faster than the second seek mode.
13. The data processing system of claim 11, wherein the first mode
of operation is a rapid seek mode and the second mode of operation
is an IDLE seek mode.
14. The data processing system of claim 11, wherein the first mode
of operation has a slower disk rotation speed than the second mode
of operation.
15. The data processing system of claim 11, wherein the first mode
of operation has a slower clock speed than a second mode of
operation for a processor within the hard disk drive.
Description
BACKGROUND OF THE INVENTION
[0001] 1. Technical Field
[0002] The present invention relates in general to storage systems,
and in particular disk drives. Still more particularly, the present
invention relates to a computer system capable of controlling the
temperature of a disk drive during testing using the disk drive's
own hardware and sensors.
[0003] 2. Description of the Related Art
[0004] A hard disk drive (HDD) is a digital data storage device
that writes and reads data via magnetization changes of a magnetic
storage disk along concentric tracks. The HDD is tested before
being shipped to the customer. In addition, the customer often
tests the HDD on a periodic basis after the HDD is operational. The
HDD can be tested either for on/off failures or for gradual
performance degradation.
[0005] On/off failures are failures in which an item fails, such as
a cable breaks, a disk does not spin, a read/write head does not
function at all, etc. Such failures are easy to identify and
locate, but may require putting the HDD in an artificial condition,
such as temperature extremes, high vibration, etc., that makes such
an on/off failure more likely. Such conditions can cause undetected
damage to the HDD, and thus on/off failure analysis has inherent
limitation.
[0006] Gradual performance degradation occurs before an on/off
failure. While such performance degradation may be caused by the
same conditions that cause an on/off failure, evaluation of gradual
performance degradation is typically performed under conditions
much less severe than those that may cause an on/off failure.
[0007] Data produced by gradual performance degradation is used to
conduct a predictive failure analysis. The gradual performance
degradation data can be extrapolated or otherwise
manipulated/evaluated to predict an ultimate on/off failure, or
else an unacceptable performance degradation. This type of data
extrapolation is referred to as Predictive Failure Analysis (PFA).
PFA evaluates performance using either a "symptom driven" process
or a "measurement driven" process.
[0008] The symptom driven process evaluates error logs. That is,
when a failure in disk rotation speed, data read/writes, noise
reduction, etc. occurs, an error log is generated, allowing the
tester to identify the cause of the problem. Such a process is
similar to an on/off failure analysis, except that the HDD has not
entirely failed; rather only a partial function of the HDD has
failed.
[0009] The measurement driven process detects Generalized Error
Measurements (GEM), which detects changes in performance, although
not necessarily functional errors. That is, a GEM may detect an
increase in the distance between a read/write head and a disk
surface, or an increase in noise in a digital signal read by the
read/write head, but such increases do not cause a failure of the
entire HDD or an HDD component, and thus are not considered
"errors." Nonetheless, such GEMs are good indicators of potential
problems, especially if the conditions causing the GEMs are allowed
to persist or increase. For example, if the distance between the
read/write head and disk surface (known as the "flying height" of
the head) increases beyond an expected tolerance as the operating
temperature of the disk surface increases, then a failure can be
predicted if the temperature continues to rise beyond the normal
operating temperature or remains at the normal operating
temperature for an extended period of time.
[0010] Test condition parameters, including temperature, required
during the detection of GEMs are established by a test engineer.
For example, the test engineer may write a test program that
measures flying height when the disk drive is operating at
30.degree. C..+-.4.degree.. In order to keep the HDD at or near
this range of temperatures, various methods are used in the prior
art. Most such methods include test bench heating or cooling
devices, which force regulated hot or cold air across or into the
HDD until the desired test temperature condition is reached. Such
heaters/coolers require additional test bench footprint space,
electrical outlets, feedback controls, and cost.
[0011] In addition, an operations computer may test its HDD
periodically. Such testing also requires the temperature of the HDD
to be within pre-determined levels during testing, typically using
the HDD's on-board cooling system (fan). However, such fans can
only cool, not warm up, the HDD.
[0012] What is needed, therefore, is a method for regulating the
temperature of an HDD, which is being tested, without the need for
and use of additional hardware.
SUMMARY OF THE INVENTION
[0013] In view of the foregoing, the present invention provides a
computer system that adjusts an internal temperature of a hard disk
drive (HDD) during HDD testing. An HDD test program under the
control of the computer system is performed within a pre-determined
optimal test temperature range. The HDD is kept within this
pre-determined test temperature range by the computer system
switching HDD operation modes back and forth between a higher heat
generating Rapid Seek Mode and a lower heat generating IDLE mode.
The HDD is thus kept within the optimal test temperature range
without the use of external heating and/or cooling devices.
[0014] The above, as well as additional objectives, features, and
advantages of the present invention will become apparent in the
following detailed written description.
BRIEF DESCRIPTION OF THE DRAWINGS
[0015] The novel features believed characteristic of the invention
are set forth in the appended claims. The invention itself,
however, as well as a preferred mode of use, further purposes and
advantages thereof, will best be understood by reference to the
following detailed description of an illustrative embodiment when
read in conjunction with the accompanying drawings, where:
[0016] FIG. 1a depicts a preferred hard disk drive (HDD) and HDD
tester used in the present invention;
[0017] FIG. 1b illustrates additional detail of a disk platter
stack used in the HDD of FIG. 1a;
[0018] FIG. 2 is a chart of temperatures generated by different
operations modes, Rapid Seek and IDLE, of the HDD;
[0019] FIG. 3 is a chart showing the non-linear relationship
between Performance Measurement Units (PMUs), which quantify HDD
operation anomalies, and time when the HDD is in an IDLE mode of
operation;
[0020] FIG. 4 is a chart showing the linear relationship between
PMUs and the temperature of the HDD;
[0021] FIG. 5 is a flow chart of steps taken to rapidly increase
the initial internal temperature of the HDD for testing by
activating the Rapid Seek Mode of the HDD;
[0022] FIG. 6 is a flow chart of steps taken using the Rapid Seek
and IDLE modes to maintain the internal temperature of the HDD
during testing; and
[0023] FIG. 7 is a flow chart of steps taken using the Rapid Seek
and IDLE modes to ensure that the HDD is within a requisite
temperature range needed to conduct a HDD test.
DETAILED DESCRIPTION OF A PREFERRED EMBODIMENT
[0024] With reference now to the figures and in particular FIG. 1a,
there is depicted a block diagram of a hard disk drive (HDD) 100 as
contemplated by the present invention. HDD 100 has a set of hard
disks 120, which are rigid platters composed of a substrate and a
magnetic medium. Since the substrate is non-magnetic, both sides of
each hard disk 120 can be coated with the magnetic medium so that
data can be stored on both sides of each hard disk 120.
[0025] An actuator arm 124 moves a slider 132, which is gimbal
mounted to the actuator arm 124. The slider 132 carries a magnetic
read/write head 122 to a specified lateral position above the
surface of the hard disk 120 when a voice coil motor (VCM) 126
swings the actuator arm 124.
[0026] With reference now to FIG. 1b, there is depicted additional
detail of hard disks 120. Hard disks 120 are a stack of hard disk
platters, shown in exemplary form as hard disks 120a-b. Preferably,
more than two platters are used, but only two are shown for
purposes of explanation. As a spindle motor 132 turns spindle 128,
each hard disk 120 connected to spindle 128 rotates at speeds in
excess of 10,000 revolutions per minutes (RPMs). Each hard disk 120
has two surfaces, one or both of which can be magnetized to store
data. Thus, hard disk 120a is able to store data on both sides
using read/write heads 122a and 122b. Hard disk 120b stores data on
only one side using read/write head 122c. Thus, the system
illustrated in FIG. 1b is a two-platter three-head HDD. By swinging
the actuator arm 124 (and thus causing the movement of slider 132
and read/write head 122) and rotating the spindle 128 (and thus
spinning hard disk 120), read/write head 122 can be positioned
above any spot above the surface of the hard disk 120.
[0027] Referring again to FIG. 1a, data reads/writes between a host
system 102 and magnetic head 122 are under the control of a
controller 104. Controller 104 includes an interface (I/F) 112
coupled to host system 102. Coupled to I/F 112 is a hard disk
controller (HDC) 108, which coordinates read/write operations, and
controls modes of operation of HDD 100, including Active Seek and
IDLE Modes, about which more is discussed below.
[0028] Coupled to HDC 108 is a random access memory 106, which
caches data to be read/written at hard disk 120. Read/write circuit
116 includes an analog-to-digital converter (ADC) and a
digital-to-analog converter (DAC). The ADC is used to convert
analog signals into digital signals for reads from the hard disk
120. The DAC is used to convert digital values into appropriate
analog signals for writes to the hard disk 120. A microprocessor
unit (MPU) 110, under the control of a micro-program stored in read
only memory (ROM) 114, controls a VCM driver 118. VCM driver 118
controls movement of the VCM 126 using a 9-bit DAC, which converts
a digital control signal from MPU 110 into an analog control signal
for VCM 126. Typically, VCM driver 118 also works in coordination
with a controller (not shown) for spindle 128, to provide proper
positioning of read/write head 122 above the surface of hard disk
120 during read/write operations.
[0029] Testing of HDD 100 is performed under the control of a HDD
tester 136. HDD tester 136 may be under the control of a standalone
test computer (not shown) in a test laboratory, a program that is
embedded in ROM 114, or a test program in host system 102, which is
running HDD 100 under post-delivery operational conditions under
the control of user or automatic hardware. HDD tester 136 samples
data from read/write circuit 116, evaluating the form (amplitude,
noise, etc.) as well as content (ones and zeros) of the data. HDD
tester 136 also receives temperature readings from thermal probe
130, which measures the temperature inside the housing for HDD 100.
HDD tester 136 also receives test data from a test circuitry 134,
which includes circuitry for measuring flight height of read/write
heads 122, deformation of slider 132, rotational speed of spindle
128, seek travel time of read/write heads 122, etc. HDD tester 136
is also able to control modes of operation of HDD 100, including
Rapid Seek Mode and IDLE Mode, via communication with HDC 108.
[0030] As described above, HDD in an exemplary form has two seek
modes: Rapid Seek and IDLE. During Rapid Seek Mode, more than 150
data seeks/second may occur. This generates a large amount of heat,
mainly from current flowing through coils (not shown) in VCM 126,
but also due to metal friction caused by contacts against bearings
(not shown) in VCM 126. During IDLE mode, the disks continue to
spin at normal operational RPM's, but VCM 126 is much less active,
as there are perhaps as few as 5 data seeks/minute. This slower
seek mode results in much less current flowing through VCM 126,
resulting in much less heat dissipation from the coils in VCM
126.
[0031] It is noted here that while the present invention uses Rapid
Seek Mode and IDLE mode to illustrate different seek modes having
different seek rates and heat generation/dissipation, the present
invention contemplates any two seek modes having different seek
rates with correlative different heat generation/dissipation
levels. Thus a first seek mode is defined as any mode having a
higher seek rate than a second seek mode, such that the first seek
mode generates/dissipates more heat than the second seek mode. In a
preferred embodiment, the first seek mode has a seek rate between
50 and 150 seeks/second, and the second seek mode has a seek rate
between 1 and 50 seeks/minute.
[0032] The different amounts of heat generated by the Rapid Seek
and IDLE modes are charted in FIG. 2, which depicts
temperature/time curves for the Rapid Seek Mode and the IDLE mode.
As shown, the Rapid Seek Mode not only generates higher ultimate
levels of heat after reaching steady state (reaching about
52.degree. C. after approximately 50 minutes), but Rapid Seek Mode
also generates heat faster. Thus, the Rapid Seek Mode causes the
drive temperature to reach 42.degree. C. in only 20 minutes,
compared to the IDLE Mode that causes the drive temperature to
reach 42.degree. C. in about 50 minutes.
[0033] Performance Measurement Units (PMUs) are quantified
measurement units describing performance of a HDD. An exemplary PMU
is IBM's Generalized Error Measurement (GEM) described above. PMUs
describe performance deviations. A PMU does not represent a true
error, but rather a deviation from optimal performance. Thus, PMUs
are quantified for issues such as high or low read/write head
flying height, signal noise from readings from the read/write head,
channel noise, signal coherence, irregular signal amplification,
etc.
[0034] As described in the graph of FIG. 3, the number of PMUs
increase during the time that the HDD is warming up. The longer the
HDD is warming up, the more PMUs are generated, until the HDD
reaches its steady temperature state. Thus, the graph of FIG. 3 has
a linear relationship with the IDLE chart-line of FIG. 2. This
relationship is described in a more general manner in FIG. 4, which
shows a linear correlation between the number of PMUs and the HDD
temperature. This linear correlation is the same whether the HDD
temperature is generated during Rapid Seek Mode or IDLE Mode.
[0035] The present invention takes advantage of the different heat
generating rates/levels of the Rapid Seek Mode and the IDLE Mode
shown in FIG. 2. One method of utilizing this difference is shown
in the flow-chart of FIG. 5, which depicts an HDD being initially
turned on for testing (block 500). The HDD needs to be heated, as
soon as possible, to a requisite test temperature range. To
accomplish this heating, the HDD is initially run in Rapid Seek
Mode (block 502), until the HDD actual temperature (T.sub.i)
reaches the desired test temperature range (query block 504), as
determined by an HDD tester using a temperature probe within the
HDD. This desired test temperature is defined/selected by a test
program in the HDD tester. The desired test temperature range is
defined as temperature "T" plus or minus acceptable deviation
temperature "dT."
[0036] When running the HDD in Rapid Seek Mode has generated enough
heat to reach the desired test temperature range, the HDD is then
placed in IDLE mode (block 506), since the HDD test program should
be performed (or in some cases must be performed) while the HDD is
in IDLE mode. The HDD test program is then run (block 508). In a
preferred embodiment, the test program is run at a steady-state
temperature for IDLE mode. Referring back to FIG. 2, while in the
IDLE mode, once the HDD reaches about 42.degree. C., the HDD will
continue to remain at this temperature as long as the HDD remains
in IDLE mode. However, by initially running the HDD in the Rapid
Seek Mode, this steady state temperature is reached much faster (in
about 20 minutes instead of the 50 minutes it would have taken the
IDLE mode). Thus, the present invention allows the HDD to warm-up
to the desired HDD test temperature in a significantly shorter
amount of time, thus improving test throughput and resulting in
significant savings in time and money.
[0037] After reaching an optimal test temperature, it would be
advantageous to maintain such an optimal test temperature, assuming
that remaining in IDLE mode alone will not keep the testing
temperature steady. Referring then to FIG. 6, an initial condition
is assumed that the HDD test is currently running in the proper
test temperature range (block 602). The HDD temperature is then
constantly monitored by the HDD tester using the thermal probe
inside the HDD, and this internal temperature is adjusted using the
Rapid Seek Mode and IDLE Modes of the HDD. If the temperature
(T.sub.i) of the HDD is too high (query block 604), then the HDD
test program is suspended (block 606) and the HDD allowed to
continue in IDLE mode until it cools down enough to resume the HDD
test. If the temperature of the HDD is too low (query block 608),
then the HDD test is suspended (block 610), and the HDD drive is
run in Rapid Seek Mode until the HDD is warm enough to continue the
HDD test. As soon as the HDD is back within the proper temperature
range, then the HDD test is resumed (block 612) and continues until
the HDD test is complete (query block 614).
[0038] Periodically, an operational HDD needs to be tested. FIG. 7
describes such a situation and a preferred embodiment of the
present invention. Assuming that an HDD is in normal operation in a
computer system, a determination is made (query block 702) as to
whether it is time to conduct an HDD test. If so, then the HDD test
program reads/determines what the requisite test temperature range
is for the HDD test (block 704). The HDD tester, using the
temperature probe inside the HDD, compares the initial internal
temperature (T.sub.i) of the HDD with the requisite test
temperature range (T.+-.dT) for the HDD test program. If the
initial temperature is too high (query block 706), then the HDD is
put into IDLE mode (block 708) to cool down. If the initial
temperature is too low (query block 710), then the HDD is put into
Rapid Seek Mode (block 712) to heat up. When the HDD is in the
proper temperature range, the HDD is put into IDLE mode (if not
already) and the HDD test is run (block 714). The temperature is
continually monitored, and the HDD test is suspended whenever the
HDD temperature is outside the test temperature range (blocks 708
and 712). This monitoring/adjustment continues until the HDD test
is completed (query block 716).
[0039] The present invention therefore affords a method for
reaching and maintaining a desired internal temperature of a HDD
during testing operations using only existing hardware and existing
HDD modes of operation. By using the Rapid Seek Mode, the HDD is
quickly put in condition for testing. By maintaining the HDD within
the proper range of temperatures as described, false errors, caused
by testing at an improper temperature, are avoided, and product
yield is increased.
[0040] While the present invention has been described and
illustrated using seek modes having different heat
generation/dissipation levels, it is understood that the scope of
the present invention includes the use of any two modes of HDD
operation in which the HDD has two modes of operation, the first
mode generating/dissipating more heat than the second mode of
operation. Thus, more or less heat may be generated in different
modes of operation that have different speeds of spindle motor 132,
different clock/operation speeds of MPU 110, etc.
[0041] It should be further understood that at least some aspects
of the present invention may alternatively be implemented in a
program product. Programs defining functions on the present
invention can be delivered to a data storage system or a computer
system via a variety of signal-bearing media, which include,
without limitation, non-writable storage media (e.g., CD-ROM),
writable storage media (e.g., a floppy diskette, hard disk drive,
read/write CD ROM, optical media), and communication media, such as
computer and telephone networks including Ethernet. It should be
understood, therefore in such signal-bearing media when carrying or
encoding computer readable instructions that direct method
functions in the present invention, represent alternative
embodiments of the present invention. Further, it is understood
that the present invention may be implemented by a system having
means in the form of hardware, software, or a combination of
software and hardware as described herein or their equivalent.
[0042] While the invention has been particularly shown and
described with reference to a preferred embodiment, it will be
understood by those skilled in the art that various changes in form
and detail may be made therein without departing from the spirit
and scope of the invention.
* * * * *