U.S. patent application number 10/682340 was filed with the patent office on 2004-04-22 for eddy current testing probe.
This patent application is currently assigned to MARKTEC CORPORATION. Invention is credited to Hiroshima, Tatsuo.
Application Number | 20040075429 10/682340 |
Document ID | / |
Family ID | 19191505 |
Filed Date | 2004-04-22 |
United States Patent
Application |
20040075429 |
Kind Code |
A1 |
Hiroshima, Tatsuo |
April 22, 2004 |
Eddy current testing probe
Abstract
An exciting coil is constructed by winding a winding in a groove
formed on the outer circumference of a circular ring member, and a
detecting coil in the shape of a polygon (such as a triangle and a
pentagon) when seen from the front is positioned. One side of the
detecting coil is placed in a diameter direction of the exciting
coil, inside the exciting coil, and the vertex opposite to the one
side is placed apart from the exciting coil so that the detecting
coil is orthogonal to the exciting coil. A side surface of the
exciting coil on the side opposite to the vertex is placed to face
the surface of a test material, and used as a flaw detection
surface.
Inventors: |
Hiroshima, Tatsuo;
(Katori-gun, JP) |
Correspondence
Address: |
ARMSTRONG, KRATZ, QUINTOS, HANSON & BROOKS, LLP
1725 K STREET, NW
SUITE 1000
WASHINGTON
DC
20006
US
|
Assignee: |
MARKTEC CORPORATION
Tokyo
JP
|
Family ID: |
19191505 |
Appl. No.: |
10/682340 |
Filed: |
October 10, 2003 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
|
10682340 |
Oct 10, 2003 |
|
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|
10260521 |
Oct 1, 2002 |
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Current U.S.
Class: |
324/242 ;
324/240 |
Current CPC
Class: |
G01N 27/9006
20130101 |
Class at
Publication: |
324/242 ;
324/240 |
International
Class: |
G01N 027/90 |
Foreign Application Data
Date |
Code |
Application Number |
Jan 17, 2002 |
JP |
2002-009298 |
Claims
1. An eddy current testing probe comprising: an exciting coil; and
a plurality of detecting coils positioned on a center axis of said
exciting coil so that center axes of said detecting coils are in a
plurality of different directions respectively crossing a center
axis direction of said exciting coil.
2. The eddy current testing probe of claim 1, further comprising a
selector for selecting a maximum output voltage from output
voltages of said plurality of detecting coils.
3. The eddy current testing probe of claim 1, wherein each of said
plurality of detecting coils is composed of a conductor wound in a
shape of a polygon, and is positioned by placing one side of the
polygon on the exciting coil side and placing a vertex opposite to
the one side apart from the exciting coil.
4. The eddy current testing probe of claim 3, further comprising a
selector for selecting a maximum output voltage from output
voltages of said plurality of detecting coils.
Description
CROSS REFERENCE TO RELATED APPLICATION
[0001] This application is a division of Ser. No. 10/260,521, filed
Oct. 1, 2002.
BACKGROUND OF THE INVENTION
[0002] The present invention relates to an eddy current testing
probe comprising an exciting coil and a detecting coil, for use in
detection of surface flaws of a conductive test material.
[0003] An eddy current testing probe is used to detect surface
flaws of conductive materials and products such as metals. FIG. 1
is a schematic view showing schematically the configuration of a
conventional general eddy current testing probe. The conventional
general eddy current testing probe comprises an exciting coil 1 in
the shape of a circular ring, and a detecting coil 2 in the shape
of a circular ring having the same diameter as the exciting coil 1.
The exciting coil 1 and the detecting coil 2 are arranged parallel
to each other, and a surface of the detecting coil 2 on the side
opposite to the exciting coil 1 functions as a flaw detection
surface. When using such an eddy current testing probe, the surface
of a test material T, such as a conductive material and product,
and the flaw detection surface are arranged to face each other with
a suitable distance therebetween, the exciting coil 1 and the
detecting coil 2 are positioned so that the center axis of the
exciting coil 1 is substantially orthogonal to the surface of the
test material T, and then an alternating current is caused to flow
in the exciting coil 1. As a result, an AC magnetic field is
generated around the exciting coil 1, and an eddy current is
induced on the surface of the test material T by the AC magnetic
field.
[0004] If there is a flaw on the surface of the test material T,
the eddy current flows along the flaw. Therefore, when the eddy
current testing probe is moved from a portion where no flaw is
present to a portion where a flaw is present, the path of the eddy
current changes. Accordingly, the strength and direction of a
magnetic field caused by the eddy current vary, and a voltage
between the terminals (output voltage) of the detecting coil 2
induced by this magnetic field changes. Since this voltage change
is generally detectable as a change in the amplitude and phase of
AC voltage, the amplitude and phase of the voltage between the
terminals of the detecting coil 2 are measured, and the
presence/absence and properties of flaw on the surface of the test
material T are detected from the measured results.
[0005] Compared to other eddy current testing device such as a
through coil that carries out an eddy current test by inserting a
test material into a solenoid coil, an eddy current testing probe
as mentioned above is applicable to various shapes of test
materials and has a simple structure, and therefore it is used in a
variety of fields. In such a conventional eddy current testing
probe, however, the output of the detecting coil 2 contains a phase
component due to the distance between the exciting coil 1 and the
surface of the test material T, i.e., so-called lift-off, and a
change in lift-off is detected as a noise component. Therefore,
there are disadvantages that it is difficult to detect only a flaw
and it is hard to adopt a phase analysis used for analyzing the
properties of flaw such as the type and depth of the flaw.
[0006] The following description will explain an operational
principle of the conventional eddy current testing probe. A voltage
Vc between the terminals of the detecting coil 2 is expressed by
the sum of a voltage Vex induced by a magnetic field generated by
an exciting current Iex flowing in the exciting coil 1 and a
voltage Vin induced by a magnetic field generated by an eddy
current Iin.
Vc=Vex+Vin (1)
[0007] Here, the voltages Vex and Vin can be expressed by equations
(2) to (5).
Vex=A.multidot.(d.phi.ex/dt) (2)
.phi.ex=B.multidot.Iex+.PHI.1(d) (3)
Vin=C.multidot.(d.phi.in/dt) (4)
.phi.in=D.multidot.Iin+.PHI.2(d) (5)
[0008] where A, B, C, D: constants,
[0009] .phi.ex: the strength of the magnetic field generated by the
exciting current Iex,
[0010] .PHI.1(d): a varying component of .phi.ex due to a change in
lift-off d,
[0011] .phi.in: the strength of the magnetic field generated by the
eddy current Iin, and
[0012] .PHI.2(d): a varying component of .phi.in due to a change in
lift-off d.
[0013] Thus, when the lift-off d changes, since the magnetic fields
.phi.ex and .phi.in vary accordingly, both of the amplitude and
phase of the voltage Vc between the terminals of the detecting coil
2 change.
[0014] For such a reason, when the lift-off changes or the angle of
the exciting coil 1 to the surface of the test material T changes,
there occurs a change in the noise component and the phase
component due to lift-off, contained in the output of the detecting
coil 2 as described above. Therefore, conventionally, there has
been used eddy current testing probes having a structure capable of
scanning the surface of the test material T while maintaining
constant lift-off, or a structure capable of measuring the amount
of lift-off and correcting the output of the detecting coil 2 so as
to remove the component due to lift-off from the output. Such eddy
current testing probes have the problems of complicated structures
and high prices.
[0015] In order to solve the problems, the following eddy current
testing probe was proposed, and reported at p.131 of the Abstract
of Fall Conference, 2000, of the Japanese Society for
Non-Destructive Inspection (hereinafter referred to as the "prior
art reference"). FIG. 2 is a schematic view showing schematically
the configuration of the eddy current testing probe reported in the
prior art reference, and FIG. 3 is an explanatory view for
explaining the operational principle of the eddy current testing
probe. As shown in FIG. 2, this eddy current testing probe
comprises an exciting coil 1 in the shape of a circular ring and a
detecting coil 2 in the shape of a quadrangular ring, and the
exciting coil 1 and the detecting coil 2 are positioned so that the
center axis of the detecting coil 2 is orthogonal to the center
axis of the exciting coil 1 in the state where one side of the
detecting coil 2 is placed in a diameter direction of the exciting
coil 1, inside the exciting coil 1.
[0016] FIGS. 4A and 4B are explanatory views for explaining the
path of the eddy current generated on the surface of the test
material T. As shown in FIG. 4A, when there is no flaw on the
surface of the test material T, the eddy current on the surface of
the test material T flows in a circumferential direction equal to
the winding direction of the exciting coil 1. In this case, almost
no magnetic field is generated in a direction crossing the
detecting coil 2 by the eddy current, and therefore almost no
electromotive force is generated in the detecting coil 2. Further,
in this case, since the output of the detecting coil 2 is
substantially zero, even when lift-off changes, the output of the
detecting coil 2 contains almost no noise component due to the
change in lift-off.
[0017] On the other hand, as shown in FIG. 4B, when there is a flaw
on the surface of the test material T, the eddy current flows along
the flaw. When the detecting coil 2 is parallel to the longitudinal
direction of the flaw, as shown in FIG. 3, a magnetic field is
generated in the direction crossing the detecting coil 2 by the
eddy current, and an electromotive force is generated in the
detecting coil 2.
[0018] For such reasons, according to the eddy current testing
probe reported in the prior art reference, since the output of the
detecting coil 2 contains almost no noise component, it is possible
to significantly improve the flaw detection accuracy.
[0019] However, the above-described eddy current testing probe
reported in the prior art reference has a problem that the output
of the detecting coil 2 still contains a noise component for
reasons explained below.
[0020] FIG. 5 is a schematic view for explaining the state of a
magnetic field generated around the eddy current testing probe
reported in the prior art reference. As shown in FIG. 5, in the
eddy current testing probe, since a solenoid coil having a short
length relative to the coil diameter is often used as the exciting
coil 1, the magnetic field generated by the exciting coil 1
contains not only a magnetic flux perpendicular to the surface of
the test material T, but also a magnetic flux curved to the outside
of the exciting coil 1 as the distance from the exciting coil 1 in
the center axis direction thereof increases.
[0021] Accordingly, inside the detecting coil 2, the magnetic field
in a direction crossing the detecting coil 2 increases as the
distance from the exciting coil 1 increases, and therefore the
noise component corresponding to a change in lift-off is contained
in the output of the detecting coil 2.
[0022] On the other hand, compared to the case where the
longitudinal direction of flaw and the detecting coil 2 are
parallel, when the longitudinal direction of flaw and the detecting
coil 2 are not parallel, the output of the detecting coil 2
decreases. Further, when the longitudinal direction of flaw and the
detecting coil 2 are perpendicular, there is a problem that the
flaw is undetectable and the flaw detection accuracy is low.
BRIEF SUMMARY OF THE INVENTION
[0023] It is an object of the present invention to provide an eddy
current testing probe capable of enabling a detecting coil to
contain almost no component crossing the detecting coil, of a
magnetic field generated by an exciting coil, in the inside of the
detecting coil and reducing the noise component corresponding to a
change in lift-off, contained in the output of the detecting coil,
by positioning the detecting coil obtained by winding a conductor
in the shape of a polygon such as a triangle and a pentagon so that
one side of the polygon is placed on the exciting coil side and the
vertex opposite to the one side is placed apart from the exciting
coil.
[0024] Another object of the present invention is to provide an
eddy current testing probe capable of detecting a flaw in a stable
manner, irrespective of the direction of the flaw, by positioning a
detecting coil whose center axis is in a direction crossing the
center axis direction of an exciting coil on the center axis of the
exciting coil and rotating the detecting coil about the center axis
of the exciting coil.
[0025] Still another object of the present invention is to provide
an eddy current testing probe capable of detecting the longitudinal
direction of a flaw and accurately detecting the properties of the
flaw, including the direction of the flaw relative to the test
material, by detecting the rotation angle of the detecting
coil.
[0026] Yet another object of the present invention is to provide an
eddy current testing probe capable of detecting a flaw in a stable
manner, irrespective of the longitudinal direction of the flaw, by
positioning a plurality of detecting coils whose center axes are in
a plurality of different directions respectively crossing the
center axis direction of the exciting coil.
[0027] A further object of the present invention is to provide an
eddy current testing probe capable of obtaining an output voltage
indicating the properties of flaw most accurately by selecting the
maximum output voltage from the output voltages of a plurality of
detecting coils, and thereby improving the flaw detection
accuracy.
[0028] An eddy current testing probe according to the first aspect
of the present invention is an eddy current testing probe
comprising: an exciting coil; and a detecting coil whose center
axis is in a direction crossing a center axis direction of the
exciting coil, wherein the detecting coil is composed of a
conductor wound in a shape of a polygon, and positioned by placing
one side of the polygon on the exciting coil side and placing a
vertex opposite to the one side apart from the exciting coil.
[0029] In the state where a side surface of the exciting coil on
the side opposite to a vertex of the detecting coil at a distance
from the exciting coil (the vertex in a position closer to the
inside center of the exciting coil relative to one side of the
polygon placed on the exciting coil side) is placed to face a test
material, by causing an alternating current to flow in the exciting
coil, it is possible to detect a flaw on the surface of the test
material. In the detecting coil in the shape of a polygonal ring
whose top part space becomes narrower as the distance from the
exciting coil in a direction crossing the exciting coil increases,
it is possible to make the space inside the detecting coil smaller
as the distance from the exciting coil increases, thereby enabling
the space inside the detecting coil to contain almost no magnetic
field in a direction crossing the detecting coil.
[0030] FIGS. 6A and 6B are explanatory views for explaining the
direction of the magnetic field in the vicinity of the detecting
coil. As shown in FIG. 6A, in the detecting coil 2 in the shape of
a quadrangular ring, the distance between two sides placed in the
direction crossing the exciting coil 1 is uniform irrespective of
the distance from the exciting coil 1. In contrast, as shown in
FIG. 6B, in the detecting coil 2 in the shape of a polygonal ring
like a triangle ring with the narrowed top part space, the distance
between two sides placed in the direction crossing the exciting
coil decreases as the distance from the exciting coil 1 increases.
Therefore, in the space inside the detecting coil 2 in the shape of
a quadrangular ring with four equal angles, in the outside space of
a portion distant from the exciting coil 1, a large magnetic field
in a direction crossing the detecting coil 2 is contained. On the
other hand, in the detecting coil 2 in the shape of a polygonal
ring like a triangle ring with the narrowed top space, since the
inside space becomes smaller as the distance from the exciting coil
1 increases, almost no magnetic field in a direction crossing the
detecting coil 2 is contained in the space inside the detecting
coil 2. The magnetic field in the direction crossing the detecting
coil 2 induces a voltage between the terminals of the detecting
coil 2, and the strength of such a magnetic field varies according
to a change in lift-off. Therefore, the induced voltage also
changes according to a change in lift-off, causing a noise
component. Accordingly, in the eddy current testing probe of the
first aspect, it is possible to reduce the noise component
corresponding to a change in lift-off, contained in the output of
the detecting coil 2.
[0031] An eddy current testing probe of the second aspect of the
present invention is based on an eddy current testing probe
comprising an exciting coil and a detecting coil, and the detecting
coil is positioned on the center axis of the exciting coil so that
a center axis of the detecting coil is in a direction crossing a
center axis direction of the exciting coil and the detecting coil
is rotatable about the center axis of the exciting coil.
[0032] The detecting coil whose center axis is in a direction
crossing the center axis direction of the exciting coil is
positioned on the center axis of the exciting coil, and the
detecting coil is rotated about the center axis of the exciting
coil. When the detecting coil and the longitudinal direction of a
flaw become parallel to each other, the maximum output voltage is
generated in the detecting coil. The output voltage generated at
this moment accurately indicates the properties of the flaw.
Therefore, by obtaining this output voltage, it is possible to
detect a flaw accurately and detect a flaw in a stable manner
irrespective of the longitudinal direction of the flaw.
[0033] In the eddy current testing probe of the second aspect, the
rotation angle of the detecting coil is detected. During one
rotation of the detecting coil, when the maximum output voltage is
generated, the detecting coil and the flaw are parallel. By
obtaining the rotation angle of the detecting coil at this moment,
it is possible to detect the longitudinal direction of the flaw and
accurately detect the properties of the flaw, including the
direction of the flaw relative to the test material.
[0034] An eddy current testing probe of the third aspect of the
present invention is based on an eddy current testing probe
comprising an exciting coil and a plurality of detecting coils, and
the respective detecting coils are positioned on the center axis of
the exciting coil so that center axes of the detecting coils are in
a plurality of different directions respectively crossing a center
axis direction of the exciting coil.
[0035] The plurality of detecting coils whose center axes are in a
plurality of different directions respectively crossing the center
axis direction of the exciting coil are positioned on the center
axis of the exciting coil. Consequently, irrespective of the
orientation of the longitudinal direction of a flaw, it is possible
to detect the flaw with a detecting coil which is substantially
parallel to the flaw. It is thus possible to detect a flaw in a
stable manner, irrespective of the longitudinal direction of the
flaw.
[0036] In the eddy current testing probe of the third aspect, the
maximum output voltage is selected from the output voltages of the
plurality of detecting coils. A detecting coil generates the
maximum output voltage when the detecting coil becomes parallel to
a flaw. Accordingly, the detecting coil generating the maximum
output voltage is in a position more parallel to the flaw than the
other detecting coils, and this output voltage indicates the
properties of the flaw more accurately than the other output
voltages. Therefore, a selected output voltage accurately shows the
properties of flaw, and such a structure can improve the flaw
detection accuracy.
[0037] The above and further objects and features of the invention
will more fully be apparent from the following detailed description
with accompanying drawings.
BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS
[0038] FIG. 1 is a schematic view showing schematically the
configuration of a conventional general eddy current testing
probe;
[0039] FIG. 2 is a schematic view showing schematically the
configuration of an eddy current testing probe reported in a prior
art reference;
[0040] FIG. 3 is an explanatory view for explaining the operational
principle of the eddy current testing probe reported in the prior
art reference;
[0041] FIGS. 4A and 4B are views for explaining the path of an eddy
current generated on the surface of a test material;
[0042] FIG. 5 is a schematic view for explaining the state of a
magnetic field generated around the eddy current testing probe
reported in the prior art reference;
[0043] FIGS. 6A and 6B are explanatory views for explaining the
direction of the magnetic field in the vicinity of a detecting
coil;
[0044] FIG. 7 is a perspective view showing the structure of
essential parts of an eddy current testing probe of the first
embodiment;
[0045] FIG. 8 is a plan view showing the structure of essential
parts of the eddy current testing probe of the first
embodiment;
[0046] FIG. 9 is a front view showing the structure of essential
parts of the eddy current testing probe of the first
embodiment;
[0047] FIG. 10 is a block diagram showing the configuration of an
eddy current testing device using an eddy current testing probe
(the first and second embodiments) of the present invention;
[0048] FIG. 11 is a front view showing the structure of essential
parts of an eddy current testing probe of the second
embodiment;
[0049] FIG. 12 is a block diagram showing the configuration of an
eddy current testing device using an eddy current testing probe
(the third embodiment) of the present invention;
[0050] FIG. 13 is a perspective view showing the structure of
essential parts of an eddy current testing probe of the fourth
embodiment;
[0051] FIG. 14 is a block diagram showing the configuration of an
eddy current testing device using the eddy current testing probe
(the fourth embodiment) of the present invention;
[0052] FIG. 15 is a plan view showing the structure of a test
material used in experiments; and
[0053] FIGS. 16A and 16B are graphs showing the results of the
experiments.
DETAILED DESCRIPTION OF THE INVENTION
[0054] The following description will explain the present invention
in detail, based on the drawings illustrating some embodiments
thereof
[0055] (First Embodiment)
[0056] FIGS. 7, 8 and 9 are the perspective view, plan view and
front view showing the structure of essential parts of an eddy
current testing probe of the first embodiment. In these figures, 1
is an exciting coil, and 2 is a detecting coil. The exciting coil 1
is constructed by forming circumferentially a groove 12 with a
width of 1 mm and a depth of 1.5 mm on the outer circumference of a
polycarbonate circular ring member 11 with an outside diameter of
12 mm, an inside diameter of 6 mm and a thickness of 5 mm and
winding 120 turns a winding 13 with an outside diameter of 300
.mu.m, made of a copper wire coated with a polyimide resin, in the
groove 12.
[0057] Meanwhile, the detecting coil 2 is constructed by forming
circumferentially a groove 22 with a width of 1 mm and a depth of 1
mm on the outer circumference of a 3 mm-thick polycarbonate
triangular member 21, which is in the shape of an equilateral
triangle with a side length slightly smaller than 6 mm when seen
from the front, and winding 100 turns a winding 23 with an outside
diameter of 70 .mu.m, made of a copper wire coated with a polyimide
resin, in the groove 22.
[0058] Note that while the exciting coil 1 has a circular ring
shape, the shape is not necessarily limited to this, and, needless
to say, the exciting coil 1 may have other shape such as a
quadrangular ring shape or a triangular ring shape. Moreover, while
the triangular member 21 is in the shape of an equilateral triangle
when seen from the front, the shape is not necessarily limited to
this, and, needless to say, the triangular member 21 may be in the
shape of an isosceles triangle, for example, when seen from the
front.
[0059] Such a detecting coil 2 is positioned perpendicular to the
exciting coil 1, and its one side is inserted into the circular
ring member 11 of the exciting coil 1 until the lower surface of
the detecting coil 2 aligns with the lower surface of the exciting
coil 1.
[0060] Needless to say, the exciting coil 1 and the detecting coil
2 are not necessarily limited to the above-mentioned dimensions and
material, and other dimensions and materials may be used.
[0061] The eddy current testing probe constructed as described
above is positioned so that its lower surface functioning as the
flaw detection surface faces the surface of a test material T in
the shape of a flat plate, for example, with an appropriate
distance from the test material T, and is used by scanning the
surface of the test material T in this state.
[0062] FIG. 10 is a block diagram showing the configuration of an
eddy current testing device using the eddy current testing probe of
the first embodiment. The exciting coil 1 is connected to an
oscillator 3, so that an alternating current produced by the
oscillator 3 is supplied to the exciting coil 1. Besides, the
detecting coil 2 is connected to an amplifier 4, so that the output
from the detecting coil 2 is amplified. The amplifier 4 is
connected to an analysis unit 5 composed of a CPU, memory, etc. The
output from the amplifier 4 is converted into a digital signal by
an A/D converter (not shown) incorporated in the analysis unit 5,
and processed by the CPU.
[0063] Meanwhile, the output from the oscillator 3 is phase-shifted
by a predetermined amount by a phase-shifter 6, and then supplied
to the analysis unit 5. Like the output from the amplifier 4, the
output from the phase-shifter 6 is also converted into a digital
signal by the A/D converter incorporated in the analysis unit 5,
and then supplied to the CPU. The analysis unit 5 performs a
phase-analysis using a known technique, based on the signal
outputted from the amplifier 4 and the signal outputted from the
phase-shifter 6. The result of the analysis is displayed on a
display device 7 such as a CRT connected to the analysis unit
5.
[0064] In the above-described configuration, the alternating
current is supplied from the oscillator 3 to the exciting coil 1,
and a magnetic field is generated around the exciting coil 1. When
there is no flaw on the surface of the test material T, an eddy
current in the same direction as the winding direction of the
exciting coil 1 flows on the surface of the test material T, and a
magnetic field is generated by this eddy current.
[0065] The detecting coil 2 is positioned perpendicular to the test
material T, and the space inside the detecting coil 2 becomes
smaller as the distance from the test material T increases.
Therefore, almost no magnetic field crossing the detecting coil 2
is generated by the eddy current flowing in the same direction as
the winding direction of the exciting coil 1. Accordingly, almost
no electromotive force is generated in the detecting coil 2, and
the output from the amplifier 4 becomes substantially zero.
[0066] Besides, when lift-off changes, the strength of the magnetic
field generated in the vicinity of the surface of the test material
T by the exciting coil 1 varies. Therefore, the strength of the
eddy current generated on the test material T changes, and the
strength of the magnetic field generated by the eddy current
varies. However, since the magnetic field generated by the eddy
current hardly crosses the detecting coil 2, almost no
electromotive force is generated in the detecting coil 2, and the
output from the amplifier 4 is still substantially zero.
Consequently, the output of the detecting coil 2 contains almost no
noise component caused by lift-off.
[0067] On the other hand, when there is a flaw on the surface of
the test material T, the eddy current flows along the flaw, and the
strength and direction of a magnetic field due to the eddy current
change relative to the strength and direction of a magnetic field
caused by the eddy current flowing when no flaw is present on the
surface of the test material T. Consequently, the magnetic field
crosses the detecting coil 2, an electromotive force is generated
in the detecting coil 2, and the output from the amplifier 4
changes.
[0068] (Second Embodiment)
[0069] FIG. 11 is a front view showing the structure of essential
parts of an eddy current testing probe of the second embodiment.
Since the second embodiment is basically the same as the first
embodiment, the same reference numbers are designated and detailed
explanation is omitted. The difference is that the detecting coil 2
is in the form of a house-shaped pentagon when seen from the front,
and a polygonal member 21a in the shape of a pentagon is used and a
winding (see 23 of FIGS. 7 and 8) is wound around the polygonal
member 21a. Hence, by positioning the detecting coil 2 so that one
side of the polygon is placed on the exciting coil 1 side and the
vertex opposite to the one side is placed apart from the exciting
coil 1, it is possible to obtain similar functions and effects as
the first embodiment. In other words, in the detecting coil 2 in
the form of a house-shaped pentagonal ring, since the inside space
becomes smaller as the distance from the exciting coil 1 increases,
it is possible to enable the space inside the detecting coil 2 to
contain almost no magnetic field in the direction crossing the
detecting coil 2.
[0070] Regarding the polygon shape of the detecting coil 2, in
order to make the top part (inside space) distant from the exciting
coil 1 small as described above, a polygon with an odd number of
sides is preferred to a polygon with an even number of sides as it
is more easily constructed. However, if it is possible to make the
inside space smaller according to the distance from the exciting
coil 1 in the crossing direction, the shape is not necessarily
limited to a polygon with an odd number of sides, and the detecting
coil 2 may have, for example, a trapezoid shape with the upper side
(the side distant from the exciting coil 1) shorter than the lower
side. In the case of the trapezoid shape, there are two vertexes
opposite to one side placed on the exciting coil 1 side. In this
case, the respective vertexes are also placed apart from the
exciting coil 1 inward. Note that since the above-described effect
is not obtained by a quadrangle (square) with four equal angles,
this shape is, of course, excluded from the polygon mentioned here.
Moreover, from a manufacturing standpoint, although polygon with
three or more angles is available, polygon with four or more angles
and the narrower top such as trapezoid has the advantages of easy
winding of coil and less risk of disconnection compared to
triangle.
[0071] (Third Embodiment)
[0072] FIG. 12 is a block diagram showing the configuration of an
eddy current testing device using an eddy current testing probe of
the third embodiment. The detecting coil 2 is connected to the
rotation shaft of a motor M arranged coaxially with the exciting
coil 1 so that it is rotatable about the center axis of the
exciting coil 1. Moreover, the detecting coil 2 is connected to a
rotary encoder R, and the rotary encoder R is connected to the
analysis unit 5 so as to detect the rotation angle of the detecting
coil 2.
[0073] In the analysis unit 5, upon the receipt of the output from
the rotary encoder R, the rotation angle of the detecting coil 2 is
computed. Then, the maximum output is extracted from the outputs of
the amplifier 4 obtained during one rotation of the detecting coil
2, and the phase-analysis is performed using this output. The
result of the analysis is outputted to the display device 7
together with the rotation angle of the detecting coil 2.
[0074] Since other structures of the eddy current testing probe and
eddy current testing device of the third embodiment are the same as
those of the eddy current testing probe and eddy current testing
device of the first embodiment, they are designated with the same
reference numbers, and the explanation thereof is omitted.
[0075] Note that, in the third embodiment, while the detecting coil
2 has a triangular ring shape, the shape is not necessarily limited
to this, and, needless to say, the detecting coil 2 may have other
shape such as a quadrangular ring shape, pentagonal ring shape or a
circular ring shape. Moreover, in the third embodiment, while the
detecting coil 2 is rotatable about the center axis of the exciting
coil 1, the detecting coil 2 is not necessarily limited to this
structure, and may be arranged to be swingable about the center
axis of the exciting coil 1.
[0076] (Fourth Embodiment)
[0077] FIG. 13 is a perspective view showing the structure of
essential parts of an eddy current testing probe of the fourth
embodiment. The dimensions of the circular ring member 11 are 10 mm
in outside diameter, 6 mm in inside diameter, and 3 mm in
thickness. Since other structures of the exciting coil 1 of the
fourth embodiment are the same as the exciting coil 1 of the first
embodiment, they are designated with the same reference numbers,
and the explanation thereof is omitted.
[0078] Besides, the eddy current testing probe of the fourth
embodiment has three detecting coils 2a, 2b and 2c. Each of the
detecting coils 2a, 2b and 2c has a square ring shape, and is
constructed by forming 100 turns of winding 25 with a thickness of
5 .mu.m, a line width of 3 .mu.m and a line spacing of 3 .mu.m in a
quadrangle member 24 produced by winding a strip of film with a
width of 1 mm and a thickness of 50 .mu.m into a square shape with
a side length of 5 mm.
[0079] The film is composed of two sheets of polyimide films bonded
together, and each winding 25 is formed by bonding a 5 .mu.m-thick
copper foil onto one of the polyimide films and etching the copper
foil. Then, this polyimide film with copper foil is bonded to the
other polyimide film with the winding 25 therebetween and bent into
a square shape to form each of the detecting coils 2a, 2b and
2c.
[0080] The detecting coils 2a, 2b and 2c thus constructed are
arranged at an interval of 60.degree. between the respective
detecting coils 2a, 2b and 2c in such a state that the center
portions of the upper sides of the respective detecting coils 2a,
2b and 2c overlap each other in the order of the detecting coils
2a, 2b and 2c downward and the center portions of the respective
lower sides overlap each other in the order of the detecting coils
2a, 2b and 2c downward.
[0081] Note that, in the fourth embodiment, while the overlapping
order of the upper sides of the detecting coils 2a, 2b and 2c and
the overlapping order of the lower sides are the same, the orders
are not necessarily limited to this, and, needless to say, the
overlapping order of the upper sides of the detecting coils 2a, 2b
and 2c and the overlapping order of the lower sides may differ from
each other. Further, in the fourth embodiment, while the number of
the detecting coils is three, the number is not necessarily limited
to this, and two detecting coils, or four or more detecting coils
may be used. Besides, in the fourth embodiment, while the detecting
coil has a quadrangular ring shape, the shape is not necessarily
limited to this, and, needless to say, the detecting coil may have
other shape such as a triangular ring shape, pentagonal ring shape
or a circular ring shape.
[0082] FIG. 14 is a block diagram showing the configuration of an
eddy current testing device using the eddy current testing probe of
the fourth embodiment. The detecting coils 2a, 2b and 2c are
connected to amplifiers 4a, 4b and 4c, respectively, and the
amplifiers 4a, 4b and 4c are connected to a selection circuit 8
composed of a CPU, memory, etc. The outputs of the amplifiers 4a,
4b and 4c are converted into digital signals by an A/D converter
(not shown) incorporated in the selection circuit 8, and then
supplied to the CPU. The CPU judges which is the maximum output
among the outputs of the amplifiers 4a, 4b and 4c, selects the
maximum output, and outputs it to the analysis unit 5.
[0083] Since other structures of this eddy current testing device
are the same as those of the above-mentioned eddy current testing
device shown in FIG. 10, they are designated with the same
reference numbers, and the explanation thereof is omitted.
[0084] Comparative experiments were performed for the eddy current
testing probe of the fourth embodiment and an eddy current testing
probe reported in the prior art reference (hereinafter referred to
as the "conventional eddy current testing probe"). The conventional
eddy current testing probe was constructed by positioning a
detecting coil having the same shape as the detecting coil 2a of
the fourth embodiment orthogonally to an exciting coil having the
same shape as the exciting coil 1 of the fourth embodiment so that
one side of the detecting coil was placed in a diameter direction
of the exciting coil, inside the exciting coil.
[0085] FIG. 15 is a plan view showing the structure of a test
material T used in the experiments. The test material T was a steel
plate in a rectangular parallelepiped shape in the plan view and
having flaws extending in three directions from the center portion
thereof (a portion shown by A in FIG. 15). The experiments were
carried out by scanning the conventional eddy current testing probe
and the eddy current testing probe of the fourth embodiment in the
direction shown by the arrow. Note that, in the flaw detection by
the conventional eddy current testing probe, the detecting coil was
positioned perpendicular to the scanning direction.
[0086] FIGS. 16A and 16B are graphs showing the results of the
experiments. In these figures, the abscissa shows the position in
the scanning direction, while the ordinates shows the output
voltage of the detecting coil. In the flaw detection by the
conventional eddy current testing probe, as shown in FIG. 16A, the
output of the detecting coil changes significantly in the portion
A, but has almost no change in other portions. Therefore, it can be
understood that the probe detects only a flaw in the portion A,
extending in a direction orthogonal to the scanning direction,
i.e., in a direction parallel to the detecting coil.
[0087] On the other hand, in the flaw detection by the eddy current
testing probe of the fourth embodiment, as shown in FIG. 16B, the
output changes significantly not only in the portion A, but also in
front of and behind the portion A. Hence, it can be understood that
the probe detects not only a flaw extending in a direction parallel
to the detecting coil, but also flaws extending in other
directions.
[0088] As described above, according to the present invention, by
placing one side of the polygon of the detecting coil in the shape
of a polygonal ring whose inside space becomes narrower as the
distance from the exciting coil in a direction crossing the
exciting coil increases, on the exciting coil side and placing the
vertex opposite to the one side apart from the exciting coil, it is
possible to make the space inside the detecting coil smaller as the
distance from the exciting coil in a direction crossing the
exciting coil increases. Therefore, almost no magnetic field in a
direction crossing the detecting coil is contained in the space
inside the detecting coil, and it becomes possible to reduce the
noise component corresponding to a change in lift-off, contained in
the output of the detecting coil.
[0089] As this invention may be embodied in several forms without
departing from the spirit of essential characteristics thereof, the
present embodiments are therefore illustrative and not restrictive,
since the scope of the invention is defined by the appended claims
rather than by the description preceding them, and all changes that
fall within metes and bounds of the claims, or equivalence of such
metes and bounds thereof are therefore intended to be embraced by
the claims.
* * * * *