U.S. patent application number 10/674550 was filed with the patent office on 2004-04-01 for resistive memory element sensing using averaging.
Invention is credited to Baker, R. J..
Application Number | 20040062100 10/674550 |
Document ID | / |
Family ID | 25471677 |
Filed Date | 2004-04-01 |
United States Patent
Application |
20040062100 |
Kind Code |
A1 |
Baker, R. J. |
April 1, 2004 |
Resistive memory element sensing using averaging
Abstract
A system for determining the logic state of a resistive memory
cell element, for example an MRAM resistive cell element. The
system includes a controlled voltage supply, an electronic charge
reservoir, a current source, and a pulse counter. The controlled
voltage supply is connected to the resistive memory cell element to
maintain a constant voltage across the resistive element. The
charge reservoir is connected to the voltage supply to provide a
current through the resistive element. The current source is
connected to the charge reservoir to repeatedly supply a pulse of
current to recharge the reservoir upon depletion of electronic
charge from the reservoir, and the pulse counter provides a count
of the number of pulses supplied by the current source over a
predetermined time. The count represents a logic state of the
memory cell element.
Inventors: |
Baker, R. J.; (Meridian,
ID) |
Correspondence
Address: |
DICKSTEIN SHAPIRO MORIN & OSHINSKY LLP
2101 L STREET NW
WASHINGTON
DC
20037-1526
US
|
Family ID: |
25471677 |
Appl. No.: |
10/674550 |
Filed: |
October 1, 2003 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
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10674550 |
Oct 1, 2003 |
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10290297 |
Nov 8, 2002 |
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10290297 |
Nov 8, 2002 |
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09938617 |
Aug 27, 2001 |
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6504750 |
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Current U.S.
Class: |
365/200 |
Current CPC
Class: |
G11C 11/16 20130101;
G11C 11/1673 20130101; G11C 13/004 20130101; G11C 11/1659 20130101;
G11C 2013/0054 20130101; G11C 13/0061 20130101; G01R 27/02
20130101 |
Class at
Publication: |
365/200 |
International
Class: |
G11C 007/00 |
Claims
1. A method of measuring the resistance of a memory element
comprising: producing a plurality of electrical pulses at a rate
related to said memory element resistance; counting said electrical
pulses over a predetermined time period to produce a pulse count;
and evaluating said pulse count to determine said resistance.
2. A method according to claim 1 wherein each said electrical pulse
comprises a pulse of substantially uniform width.
3. A method according to claim 1 wherein said evaluating comprises
comparing said pulse count to a reference pulse count to determine
said memory element resistance.
4. A method according to claim 3 wherein said evaluating further
comprises determining said memory element resistance as one value
if said pulse count is above said reference pulse count and as
another value if said pulse count is below said reference pulse
count.
5. A method for sensing a resistance of a resistor comprising:
charging a capacitor to a voltage level; discharging said capacitor
through said resistor; generating at least one recharging pulse
each time the voltage on the capacitor falls below a predetermined
value; using said recharging pulse to recharge the voltage on said
capacitor; and determining said resistance from the number of
recharging pulses which are generated during a predetermined period
of time.
6. A method as defined in claim 5 wherein said discharging includes
discharging said capacitor through said resistor at a substantially
constant current.
7. A method of measuring a resistance of a resistor comprising:
applying a known voltage across said resistor such that a first
current flows through said resistor; withdrawing a current equal to
said first current from a capacitor having a charge thereon;
replenishing said charge on said capacitor with a plurality of
current pukes, such that one pulse of said plurality is applied to
said capacitor when a voltage measured across said capacitor falls
below a threshold voltage; counting said plurality of pulses over a
finite time period; and determining a resistance of said resistor
based on said counted pulses.
8. A method as in claim 7 further comprising comparing a value of
counted pulses to a predetermined value to determine said
resistance.
9. A method as in claim 8 wherein when a value of counted pulses is
above a reference value, said resistance is determined as having
one value and when a value of counted pulses is below said
reference value said resistor is determined as having another
value.
10. A method of measuring an impedance of a memory element
comprising: applying a substantially uniform voltage across said
memory element; flowing a substantially uniform current into said
memory element from a charge reservoir; flowing a plurality of
current pulses into said charge reservoir; controlling the flow of
said plurality of current pulses in response to a quantity of
charge in said charge reservoir; counting said plurality of current
pulses over a definite time to produce a pulse count; and relating
an impedance value of said memory element to said pulse count.
11. A method as defined in claim 10 wherein said impedance is an
electrical resistance.
12. A method as defined in claim 10 wherein said impedance is a
capacitance.
13. A method as defined in claim 10 wherein said impedance is an
inductance.
14. A memory integrated circuit comprising: a capacitor; a
resistor; a first circuit for conducting current from said
capacitor through said resistor; a controlled current source for
delivering current to said capacitor; a comparator for comparing a
voltage on said capacitor to a reference voltage and supplying a
pulse to turn on said current source when the voltage on said
capacitor falls below said reference voltage; a pulse counter
operatively connected to said comparator output for counting pulses
generated by said comparator; and a second circuit for determining
the value of said resistance based on the value stored in said
pulse counter.
15. A memory integrated circuit as defined in claim 14 wherein said
comparator further comprises a clock input, the output of said
comparator changing state only when a clock signal applied to said
clock input changes state.
16. A memory integrated circuit as defined in claim 14 wherein said
second circuit is adapted to compare said value stored in said
pulse counter to a reference value and determine whether said
stored value is greater or less than said reference value.
17. A memory integrated circuit as defined in claim 14 wherein said
first circuit further comprises: a transistor having a source
operatively connected to said capacitor, a gate, and a drain; and a
differential amplifier having a non-inverting input operatively
connected to a first reference voltage, an output operatively
connected to said gate, and an inverting input operatively
connected to said drain and to said resistor.
18. A memory integrated circuit as defined in claim 14 wherein said
second circuit further comprises a digital comparator adapted to
receive said value stored in said pulse counter and to receive a
reference value, and to compare said stored value to said reference
value to produce an output.
19. A resistance measuring circuit comprising: a capacitor having a
first terminal; a voltage controlled current source operatively
connected to said first terminal, said current source adapted to
withdraw current from said capacitor and supply said current to a
resistor to be measured, said current source adapted to control
said current according to a voltage measured across said resistor;
a current pulse generator having an output operatively connected to
said first terminal, a clock input adapted to receive a periodic
clock signal, and a voltage sensor, said pulse generator adapted to
generate a current pulse synchronously with said clock signal
whenever said sensor indicates that a voltage at said first
terminal is below a threshold voltage, whereby a plurality of
current pulses are generated over time; a first counter adapted to
count cycles of said periodic dock signal to produce a clock count;
a second counter adapted to count pulses produced by said pulse
generator to produce a pulse count; and a circuit for determining a
resistance value of said resistor in response to said pulse count
and said clock count.
20. A resistance measuring circuit as in claim 19 wherein said
voltage sensor further comprises a clocked comparator.
21. A resistance measuring circuit as in claim 19 wherein said
current pulse generator further comprises a current source
transistor having a source connected to a supply voltage, a gate,
and a drain, a clocked comparator having an inverting input
connected to said drain and to said first terminal, a non-inverting
input connected to a reference voltage equal to said threshold
voltage, an output connected to said gate, and a clock input
adapted to receive said clock signal.
22. A resistance measuring circuit as in claim 19 wherein said
circuit for determining resistance value further comprises a
digital comparator adapted to compare said pulse count to a
reference count and produce a first output if said pulse count is
above said reference count and a second output if said pulse count
is below said reference count.
23. A memory storage device comprising: a row line and a column
line; a memory cell including a cell resistor connected between
said row line and said column line; a control transistor having a
first gate, a first terminal connected to said column line and a
second terminal; a switch for grounding said row line; an amplifier
having a first input connected to a first reference voltage source,
a second input connected to said column line, and an output
connected to said first gate; a capacitor having a terminal
connected to said second terminal of said control transistor; a
current supply transistor having a second gate, a first terminal
connected to a power source, and a second terminal connected to
said capacitor terminal; a comparator having a first input
connected to a second reference voltage source, and a second input
connected to said capacitor terminal, said comparator having a
pulse output which is connected to said second gate for turning on
said current supply transistor when a voltage at said capacitor
terminal falls below said second reference voltage; and a circuit
responsive to the output of said comparator for determining the
resistance of said cell resistor.
24. A memory device as defined in claim 23, wherein said circuit
comprises: a first pulse counter having an input receiving a dock
signal and a second pulse counter having an input receiving an
output of said comparator, said circuit determining said resistance
by determining the value held in said second counter when said
first counter reaches a predetermined value.
25. A logic state sensor for a magnetic random access memory cell
comprising: a controlled voltage supply; an electronic charge
reservoir; a current source; a pulse counter; said controlled
voltage supply operatively connected to a resistive element of a
magnetic random access memory device to maintain a substantially
constant voltage across said resistive element; said electronic
charge reservoir operatively connected to said controlled voltage
supply to provide a current through said resistive element; said
current source operatively connected to said charge reservoir to
repeatedly supply a pulse of current to recharge said charge
reservoir upon a predetermined depletion of electronic charge from
said reservoir; wherein said pulse counter count is a number of
said pulses supplied by said current source over a predetermined
time period, the contents of said pulse counter representing a
logic state of said memory cell.
26. A processor system comprising: a processor; and a memory device
coupled to said processor, said memory device including, a row line
and a column line; a memory cell including a cell resistor
connected between said row line and said column line; a control
transistor having a first gate, a first terminal connected to said
column line and a second terminal; a switch for grounding said row
line; an amplifier having a first input connected to a first
reference voltage source, a second input connected to said column
line, and an output connected to said first gate; a capacitor
having a terminal connected to said second terminal of said control
transistor; a current supply transistor having a second gate, a
first terminal connected to a power source, and a second terminal
connected to said capacitor terminal; a comparator having a first
input connected to a second reference voltage source, and a second
input connected to said capacitor terminal, said comparator
providing a pulse output which is connected to said second gate for
turning on said current supply transistor when a voltage at said
capacitor terminal falls below said second reference voltage; and a
circuit responsive to the output of said comparator for determining
the resistance of said cell resistor.
27. A processor system comprising: a processor and a memory device
coupled to said processor, said memory device including a memory
cell logic state sensor, said sensor including a controlled voltage
supply; an electronic charge reservoir; a current source; a pulse
counter; said controlled voltage supply operatively connected to a
resistive element of a magnetic random access memory device to
maintain a substantially constant voltage across said resistive
element; said electronic charge reservoir operatively connected to
said controlled voltage supply to provide a current through said
resistive element; said current source operatively connected to
said charge reservoir to repeatedly supply a pulse of current to
recharge said charge reservoir upon a predetermined depletion of
electronic charge from said reservoir; wherein said pulse counter
count is a number of said pulses supplied by said current source
over a predetermined time period, the contents of said pulse
counter representing a logic state of said memory cell.
Description
BACKGROUND OF THE INVENTION
[0001] 1. Field of the Invention
[0002] The present invention relates to the field of resistor-based
memory circuits. More particularly, it relates to a method for
precisely sensing the resistance value of a resistor-based memory
cell, for example, an MRAM magnetic memory cell.
[0003] 2. Description of the Related Art
[0004] FIG. 1 shows one example of a resistor based memory. The
memory includes a memory cell array 90 having a plurality of row
lines 100 arranged in normal orientation to a plurality of column
lines 110. Each row line is connected to each of the column lines
by a respective of resistor 120.
[0005] A magnetic random access memory (MRAM) is one approach to
implementing a resistor based memory. In an MRAM, each resistive
memory cell includes a magnetizable film. The resistance of the
cell varies, depending on the magnetization state of the film.
Logical data can be stored by magnetizing the film of particular
cells so as to represent the logic states of the data. The stored
data can be read by measuring the resistance of the cells, and
interpreting the resistance values measured as logic states. Making
the required resistance measurements, however, is problematic.
[0006] In a resistance memory, one resistance value, e.g., a higher
value, may be used to signify a logic "HIGH" while another
resistance value, e.g., a lower value, may be used to signify a
logic "LOW." The stored logic state can be detected by measuring
the memory cell resistance using Ohm's law. For example, resistance
is determined by holding voltage constant across a resistor and
measuring, directly or indirectly, the current that flows through
the resistor. Note that, for MRAM sensing purposes, the absolute
magnitude of resistance need not be known; only whether the
resistance is above or below a value that is intermediate to the
logic high and logic low values.
[0007] Sensing the logic state of an MRAM memory element is
difficult because the technology of the MRAM device imposes
multiple constraints. In a typical MRAM device an element in a high
resistance state has a resistance of about 1M.OMEGA.. An element in
a low resistance state has a resistance of about 950K.OMEGA.. The
differential resistance between a logic one and a logic zero is
thus about 50 K.OMEGA., or 5% of scale.
[0008] Accordingly, there is a need for a simplified resistance
measuring circuit able to repeatably and rapidly distinguish
resistance values varying by less than 5% on a one M.OMEGA.
scale.
BRIEF SUMMARY OF THE INVENTION
[0009] The invention provides a method and apparatus for measuring
the resistance of a resistive memory element. The resistance is
measured by charging a capacitor, allowing the capacitor to
discharge through a selected resistive memory element while
maintaining a substantially constant voltage across the resistive
memory element, sensing the charge remaining on the capacitor,
repeatedly recharging the capacitor with a pulse of definite charge
each time the capacitor voltage drops to a predetermined value, and
determining a time average current into the capacitor based on a
duty cycle of the recharging pulses. Knowledge of the time average
current into the capacitor, yields the current flowing into the
resistor since the current flowing into the capacitor must equal
the current flowing out of the capacitor and into the resistor. One
can measure or set the voltage across the resistive memory element
and determine the resistance of the element from the current
through the element and the voltage across it.
[0010] In various aspects of the invention, the actual resistance
of the memory element is not calculated. Instead, the number of
capacitor charging pulses is counted, and the numerical count thus
acquired is compared to a reference count value. The reference
value is chosen to lie between count values representing logical
one and logical zero. Therefore a count value greater than the
reference indicates one logical state, and a count value less than
the reference value indicates another. In a further aspect of the
invention, more than one reference value is established, and a
memory element capable of exhibiting more than two resistance
values is used. Consequently the memory element may store more than
two logical values. The logical values are determined based on the
relationship between the count value counted and the standard
values used to establish thresholds between logical values.
[0011] In a further aspect, the apparatus and method of the
invention may be used to measure the resistance or impedance of any
resistive or impedance device.
[0012] These and other aspects and features of the invention will
be more clearly understood from the following detailed description
which is provided in conjunction with the accompanying
drawings.
BRIEF DESCRIPTION OF THE DRAWINGS
[0013] FIG. 1 shows a conventional magnetic random access memory
array in schematic form;
[0014] FIG. 2 shows a magnetic random access memory device
according to one aspect of the present invention in schematic form,
including resistance sensing circuits;
[0015] FIG. 3 shows a portion of a magnetic random access memory
device according to one aspect of the invention including a sensing
circuit and sneak resistance;
[0016] FIG. 4 shows a circuit for sensing resistance using
averaging according to one aspect of the present invention;
[0017] FIG. 5 shows a graphical representation of sensing circuit
digital output over time according to one aspect of the present
invention;
[0018] FIG. 6 shows a graphical representation of voltage across a
capacitor over time according to one aspect of the present
invention;
[0019] FIG. 7 shows a computer system incorporating a digital
memory according to one aspect of the present invention.
DETAILED DESCRIPTION OF THE INVENTION
[0020] FIG. 2 shows a portion of a resistive memory device
according to the invention. The device includes an array 200 of
Magnetic Random Access Memory (MRAM) elements, a plurality of
electrically conductive row lines 210, and a plurality of
electrically conductive column lines 220. Each row line is
connected to each of the plurality of column lines by a respective
MRAM resistive element 230. A plurality of switches 240, typically
implemented as transistors, are each switchingly connected between
one of the row lines and a first source of constant potential
(ground) 250. A plurality of sensing circuits 260, are respectively
connected to the plurality of column lines 220. Each sensing
circuit 260 includes a source of constant electrical potential
(V.sub.A) which is applied to the respective column line. A
plurality of pull-up voltage sources 215, supplying voltage
V.sub.A, are respectively connected to each of the plurality of row
lines 210.
[0021] In operation, an exemplary switch 240, such as switch 270
associated with a particular row line 280, is closed so as to bring
that row line to ground potential and a particular column line,
e.g., 320 is sensed to read the resistance value of a particular
resistor 310.
[0022] FIG. 3, shows the resulting electrical circuit for the
relevant portion 300 of the memory array when row 280 is grounded.
As shown, memory element 310 to be sensed is connected between a
grounded row line 280 and a particular column line 320. Also
connected to the column line 320 are a plurality of other resistive
memory elements (e.g. elements 330, 340, 350, 360, 370) each of
which is connected at its opposite end to a pull-up voltage source
V.sub.A 215 through a respective row line 210. In addition, a
respective sensing circuit 400 is connected to the column line 320.
The sensing circuit 400 indudes a voltage supply that maintains the
column line 320 at electrical potential V.sub.A.
[0023] The other resistive memory elements (those tied to
ungrounded row lines) 330, 340, 350, 360, 370, form an equivalent
resistance referred to as sneak resistance. The effective
resistance of the sneak resistance is small. A typical value for
sneak resistance might be 1 K.OMEGA.. Nevertheless, because both
ends of each ungrounded resistor are ideally maintained at the same
potential (here V.sub.A) as the column line 320, net current flow
through the sneak resistance is desirably nearly zero.
[0024] In contrast, a measurable current flows through the grounded
resistor memory element 310. This measurable current allows
evaluation of the resistance of the memory clement 310 by the
sensing circuit 400.
[0025] One proposal for sensing the resistance value of a memory
cell is to charge a capacitor to a predetermined first voltage and
then discharge the capacitor through the memory cell resistance
until it holds a second lower predetermined voltage. The time taken
for the capacitor to discharge from the first to the second voltage
is a measure of cell resistance. A problem with this approach is
that since the resistance values representing the different logic
states of a cell are very close in value (only 5% difference) it is
difficult to obtain an accurate and reliable resistance
measurement, even if digital counting techniques are employed to
measure the discharge time of the capacitor.
[0026] Thus, even when using digital counting techniques, the
discharge time of the capacitor must be counted quite precisely to
sense the different resistance values and distinguish logic states.
To achieve this precision, either the counting clock must be
operated at a high frequency or the capacitor must be discharged
relatively slowly. Neither of these options is desirable, since
slow capacitor discharge means slow reading of stored memory
values, and a high dock frequency requires high frequency
components. In either case, a counter having a large number of
stages is also required.
[0027] The present invention provides a resistive measuring circuit
and operating method which rapidly ascertains a resistive value
without storing large data counts, and without requiring highly
precisioned components.
[0028] FIG. 4 illustrates an exemplary embodiment of a resistance
sensing circuit 500 constructed in accordance with the invention.
Sensing circuit 500 relies on the cyclical discharge of a capacitor
510 to determine the value of a memory cell resistance 520. The
duty cycle of a recharging signal for the capacitor 510 represents
a value of resistance 520.
[0029] The resistance measuring circuit 500 outputs a bit stream
from an output 900 of a comparator 910. The ratio of logic one bits
to a total number of bits (or, in and other aspect of the
invention, the ratio of logic one bits to logic zero bits) in the
bit stream yields a numerical value. This numerical value
corresponds to the current that flows through the resistance 520 in
response to a known applied voltage. For example, assume that a
current source can deliver current at two discrete current levels,
corresponding to two different states of a logical input signal.
When the signal is in logic one state, the source delivers, for
example, 2 .mu.A. When the signal is in a logic zero state, the
source delivers, for example, 0 .mu.A. The logical input signal is
monitored over a finite time span corresponding to a number of
bit-length time periods. Over that time span, the number of logic
one and logic zero bits arc recorded. By straightforward algebra,
the average current delivered by the current source over the
corresponding time span may be calculated as follows: 1 IAVG = (
number of logic 1 bits ) * 2 A + ( number of logic 0 bits ) * 0 A
total number of bits in the signal
[0030] As an example, if, over a time span corresponding to 4
cycles, there is one logic one bit and three logic zero bits then
the average current over the four cycles is 0.5 .mu.A. 2 IAVG = 1 *
2 A + 3 * 0 A 4 = 0.5 A
[0031] The operation of the FIG. 4 sensing circuit is now described
in greater detail. An MRAM resistive memory element 520 to be
sensed has a first end 530 connected to a column line 540 and a
second end 550 connected to ground 250 through a row line 560 and
switch 565. Also connected to the column line 540 is a first end
570 of a sneak resistance 580. The sneak resistance has a second
end 590 connected to a source of constant potential V.sub.A 215.
The sneak resistance 580 represents a plurality of MRAM resistive
elements associated with the particular column line 540 and with a
respective plurality of unselected row lines, as described above
with reference to FIG. 3.
[0032] A first operational amplifier (op-amp) integrator 600 is
provided which has a non-inverting (positive) input 610, an
inverting (negative) input 620, a calibrate offset input 630, and
an output 640. The output 640 of the first op-amp 600 is connected
to a control input (gate) 700 of a first transistor 710, which in
this exemplary embodiment is an N-channel transistor.
[0033] The first transistor 710 includes a drain 720 connected to
both the selected column line 540 and the inverting input 620 of
the first op-amp 600. The first transistor also includes a source
730 operatively connected to a first terminal 740 of a capacitor
510. The capacitor 510 includes a second terminal 750 operatively
connected to a ground potential 250. The source 730 of the first
transistor 710 is also connected to a drain 760 of a second
transistor 770. In this exemplary embodiment, this second
transistor 770 is a PMOS transistor. The second transistor 770
includes a source 780 and a gate 790, in addition to the drain 760.
The source 780 is operatively connected to a supply voltage 800,
which in this exemplary embodiment is 2.5 volts. The gate 790 is
operatively connected to an output 900 of a clocked comparator 910.
The docked comparator 910, shown as a docked second operational
amplifier, includes the output 900, a non-inverting (positive)
input 920, an inverting (negative) input 930, and a dock input 940
connected to a source of a clock signal 950. The comparator 910 may
be implemented as a simple clocked latch, or the comparator 910 may
be simply enabled by the dock CLK signal.
[0034] The output 900 of the second op-amp is also connected to a
counter 1000 which counts the rising transitions at the comparator
output 900. The non-inverting input 920 of the second op-amp 910 is
connected to a source of a reference voltage 960 (1 volt in the
exemplary embodiment shown).
[0035] A second counter 1010 counts the total number of transitions
of the clock 950 during a measuring cycle. This counter 1010
includes an input 1020 for receiving clock signal 950 and at output
1030 that exhibits a signal when counter 1010 reaches a
predetermined count. The output 1030 is connected to a latch input
1040 of a latching buffer 1050. The latching buffer 1050 includes a
data input 1060 and data output 1070. The data input 1060 is
connected to a data output 1080 of the first counter 1000. The data
output 1070 is connected to a first data input 1090 of a digital
comparator 1100. The digital comparator 1100 includes a second data
input 1110 connected to a data output 1120 of a source of a
reference value 1130. In one embodiment, the source of the
reference value 1130 is a buffer or other device holding a digital
number.
[0036] The sensing circuit 500 operates in the following manner
when activated when a row line is grounded and a resistance value
is to be sensed. Capacitor 510 is initially discharged, resulting
in a negative output signal on the output 900 of the second op-amp
910. This causes the second transistor 770 to be placed in a
conductive state, permitting capacitor 510 to begin charging. When
the voltage on capacitor 510 equals that applied to the
non-inverting input 920 of the second op-amp 910 (here 1 volt), the
output 900 of the second op-amp changes state to a positive value
at the next transition of the clock 950. This turns off the second
transistor 770. The charge stored on capacitor 510 is discharged
through the first transistor 710 and cell resistance 520 under the
control of the first op-amp 600. The first op-amp 600 tries to
maintain a constant voltage VA on the selected column line 540.
[0037] As charge is depleted from capacitor 510 the voltage on the
capacitor drops until it falls below the voltage (1 volt) applied
to the reference input 920 of the clocked comparator 910. After
this threshold is passed, the next positive clock transition
applied to the dock input 940 causes the output of comparator 910
to go low again turning on the second transistor 770 and causing
current to begin flowing through the second transistor 770 to
recharge capacitor 510.
[0038] In one embodiment, the capacitor 510 is recharged during one
dock cycle of dock source 950, so the comparator output 900
switches to high and the second transistor 770 is shut off again at
the next positive clock transition. Transistor 770 is sized to
allow a substantially constant current (e.g., 2.5 .mu.A) to flow to
capacitor 510 when transistor 770 is in a conductive state.
[0039] The described charging and discharging of capacitor 510
under the control of the first 710 and second 770 transistors
occurs repeatedly during one sense cycle. Each time the output of
the comparator 910 goes low, a current pulse is allowed to pass
through the second transistor 770 and the first counter 1000
incremented. Each time the clock signal 950 transitions positive,
the second counter 1010 is incremented. When the second counter
1010 reaches a preset value, it triggers the latch 1050, which
latches that number of pulses counted by the first counter 1000
during the sensing period. The number of pulses counted is latched
onto the data output 1070 (and data input 1090). The comparator
1100 then evaluates the values presented at the first and second
data inputs 1090, 1110, and ascertains whether the value at the
first data input 1090 is larger or smaller than the reference value
at the second data input 1110. The reference value at input 1110 is
set between two count values which correspond to "hi" and "low"
resistance states for resistor 520. Thus if the value of the first
data input 1090 is larger than the reference value, then a first
logical value (e.g. logic one) is output on an output 1140 of the
digital comparator 1100. If the value of the first data input 1090
is smaller than the reference value, then a second logical value
(e.g. logic zero) is output on the output 1140 of the digital
comparator 1100. In a variation, a comparator 1100 capable of
comparing the digital value applied at the data input 1090 to a
plurality of reference values 1110 can distinguish a value stored
in a single resistive memory element as between multiple resistance
values. In a further variation, the capacitor 510 is pre-charged
prior to a measuring cycle. By pre-charging the capacitor 510, the
number of cycles of the clock signal 950 required to measure the
state of the memory element is reduced. In another variation the
capacitor is not pre-charged, in which case sensing the resistance
of the memory element takes longer, but the circuitry and/or
process is simplified.
[0040] FIGS. 5 and 6 show an exemplary relationship between the
output signal produced at output 900 of the clocked comparator 910
and the voltage on capacitor 510 over time.
[0041] FIG. 5 shows the output signal produced by the clocked
comparator when a 100 MHz dock signal is applied to the dock input
940. At a clock frequency of 100 MHz, clock pulses are spaced at an
interval of 10 ns. In the example shown, the output of the clocked
comparator is high 1160 for one dock pulse (10 ns) and low 1170 for
three dock pulses (30 ns). This corresponds to the voltage waveform
shown in FIG. 6. In FIG. 6, the voltage of the capacitor 510 is
shown to begin rising when the output 900 of the clocked comparator
goes low (time A), thereby turning on the PMOS transistor 770. The
voltage rises for 30 ns, or three clock pulses until time B. At
time B, the output of the clocked comparator goes high again,
turning off the PMOS transistor. The voltage on the capacitor 510
then begins to drop again while the PMOS device remains off for one
clock pulse, or 10 ns (until time C). Accordingly, in the example
shown, the duty cycle of the signal output by the docked comparator
910 is 75% (three on-pulses for every off-pulse).
[0042] FIG. 9 shows a computer system 1200 including a digital
memory 1210 having a resistance measuring memory cell sensor
according to the invention. The computer 1200, as shown includes a
central processing unit (CPU) 1220, for example, a microprocessor,
that communicates with one or more input/output (I/O) devices 1230
over a bus 1240. The computer system also includes peripheral
devices such as disk storage 1250 and a user interface 1260. It may
be desirable to integrate the processor and memory on a single IC
chip.
[0043] While preferred embodiments of the invention have been
described and illustrated above, it should be understood that these
are exemplary of the invention and are not to be considered as
limiting. Additions, deletions, substitutions, and other
modifications can be made without departing from the spirit or
scope of the present invention. Accordingly, the invention is not
to be considered as limited by the foregoing description but is
only limited by the scope of the appended claims.
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