U.S. patent application number 10/134885 was filed with the patent office on 2003-10-30 for coaxial probe for high temperature and high pressure applications.
Invention is credited to Gard, Alan Moravec.
Application Number | 20030201842 10/134885 |
Document ID | / |
Family ID | 29249327 |
Filed Date | 2003-10-30 |
United States Patent
Application |
20030201842 |
Kind Code |
A1 |
Gard, Alan Moravec |
October 30, 2003 |
COAXIAL PROBE FOR HIGH TEMPERATURE AND HIGH PRESSURE
APPLICATIONS
Abstract
A guided wave radar probe defines a transmission line for use
with a measurement instrument including a pulse circuit connected
to the probe for generating pulses on the transmission line and
receiving reflected pulses on the transmission line. The probe
includes a center conductor for conducting the pulses. A conductive
outer sleeve is coaxial with the center conductor. The conductive
outer sleeve has a process end and a connector end. The process end
is exposed, in use, to a process environment being measured. A
first cylindrical seal element between the center conductor and the
outer sleeve is at the sleeve process end. The first cylindrical
seal element is of a first material adapted to withstand a
relatively high temperature. A second cylindrical seal element is
between the center conductor and the outer sleeve disposed between
the first cylindrical seal element and the connector end. The
second cylindrical seal element is of a second material adapted to
withstand a lower temperature than the first cylindrical seal
element.
Inventors: |
Gard, Alan Moravec;
(Warrenville, IL) |
Correspondence
Address: |
WOOD, PHILLIPS, KATZ, CLARK & MORTIMER
500 W. MADISON STREET
SUITE 3800
CHICAGO
IL
60661
US
|
Family ID: |
29249327 |
Appl. No.: |
10/134885 |
Filed: |
April 29, 2002 |
Current U.S.
Class: |
333/24R |
Current CPC
Class: |
G01F 23/268 20130101;
G01S 13/88 20130101; G01S 7/03 20130101; G01F 23/284 20130101; H01Q
9/005 20130101; H01Q 13/08 20130101 |
Class at
Publication: |
333/24.00R |
International
Class: |
H03H 005/00 |
Claims
I claim:
1. A probe defining a transmission line for use with a measurement
instrument including a pulse circuit connected to the probe for
generating pulses on the transmission line and receiving reflected
pulses on the transmission line, the probe comprising: a center
conductor for conducting the pulses; a conductive outer sleeve
coaxial with the center conductor, the conductive outer sleeve
having a process end and a connector end, the process end being
exposed, in use, to a process environment being measured; a first
cylindrical seal element between the center conductor and the outer
sleeve at the sleeve process end, the first cylindrical seal
element being of a first material adapted to withstand a relatively
high temperature; and a second cylindrical seal element between the
center conductor and the outer sleeve disposed between the first
cylindrical seal element and the connector end, the second
cylindrical seal element being of a second material adapted to
withstand a lower temperature than the first cylindrical seal
element.
2. The probe of claim 1 wherein the first cylindrical seal element
comprises a ceramic seal element.
3. The probe of claim 1 wherein the second cylindrical seal element
comprises a plastic seal element.
4. The probe of claim 1 further comprising a first elastomeric seal
between the center conductor and the second cylindrical seal
element and a second elastomeric seal between the second
cylindrical seal element and the outer sleeve.
5. The probe of claim 4 wherein the first and second elastomeric
seals comprise o-rings.
6. The probe of claim 1 wherein the second cylindrical seal element
comprises two plastic seal elements.
7. The probe of claim 1 further comprising an adapter mounted to
the sleeve at the process end and an electrical connecter at the
connector end capturing the first and second seal elements in the
outer sleeve.
8. A probe defining a transmission line for use with a measurement
instrument including a pulse circuit connected to the probe for
generating pulses on the transmission line and receiving reflected
pulses on the transmission line, the probe comprising: a center
conductor for conducting the pulses; a conductive outer sleeve
coaxial with the center conductor, the conductive outer sleeve
having a process end and a connector end, the process end being
exposed, in use, to a process environment being measured; a
cylindrical ceramic seal element between the center conductor and
the outer sleeve at the sleeve process end; and first and second
cylindrical plastic seal elements between the center conductor and
the outer sleeve disposed axially aligned between the ceramic seal
element and the connector end.
9. The probe of claim 8 further comprising a first elastomeric seal
between the center conductor and the second cylindrical plastic
seal element and a second elastomeric seal between the second
cylindrical plastic seal element and the outer sleeve.
10. The probe of claim 9 wherein the first and second elastomeric
seals comprise o-rings.
11. The probe of claim 8 further comprising an adapter mounted to
the sleeve at the process end and an electrical connecter at the
connector end capturing the seal elements in the outer sleeve.
12. A guided wave radar probe for use in high temperature high
pressure process environments with a process instrument having a
control housing assembly with a control connection comprising: an
elongate cylindrical hollow seal adapter receivable in an opening
of the process vessel; a conductive outer sleeve, the conductive
outer sleeve having a process end and a connector end, the process
end being connected to the adapter; a center conductor coaxial with
the outer sleeve and the adapter and connectable to the control
connection, in use, for conducting and guiding guided wave radar
electrical signals; a first cylindrical seal element between the
center conductor and the outer sleeve at the sleeve process end,
the first cylindrical seal element being of a first material
adapted to withstand a relatively high temperature; a second
cylindrical seal element between the center conductor and the outer
sleeve disposed between the first cylindrical seal element and the
connector end, the second cylindrical seal element being of a
second material adapted to withstand a lower temperature than the
first cylindrical seal element; and elastomeric seals between the
center conductor and the second cylindrical seal element and
between the second cylindrical seal element and the outer
sleeve.
13. The guided wave radar probe of claim 12 wherein the first
cylindrical seal element comprises a ceramic seal element.
14. The guided wave radar probe of claim 12 wherein the second
cylindrical seal element comprises a plastic seal element.
15. The guided wave radar probe of claim 12 further comprising a
first elastomeric seal between the center conductor and the second
cylindrical seal element and a second elastomeric seal between the
second cylindrical seal element and the outer sleeve.
16. The guided wave radar probe of claim 15 wherein the first and
second elastomeric seals comprise o-rings.
17. The guided wave radar probe of claim 12 wherein the second
cylindrical seal element comprises two plastic seal elements.
18. The guided wave radar probe of claim 12 further comprising an
adapter mounted to the sleeve at the process end and an electrical
connecter at the connector end capturing the first and second seal
elements in the outer sleeve.
19. A probe defining a transmission line for use with a measurement
instrument including a pulse circuit connected to the probe for
generating pulses on the transmission line and receiving reflected
pulses on the transmission line, the probe comprising: a center
conductor for conducting the pulses; a conductive outer sleeve
coaxial with the center conductor, the conductive outer sleeve
having a process end and a connector end, the process end being
exposed, in use, to a process environment being measured; a
plurality of cylindrical seal elements between the center conductor
and the outer sleeve, the seal elements being mounted in series
between the sleeve process end and the connector end, the one seal
element at the process end being of ceramic.
20. The probe of claim 19 wherein the plurality of cylindrical seal
elements all comprise ceramic seal elements.
21. The probe of claim 19 wherein the other cylindrical seal
element comprise a plastic seal elements.
22. The probe of claim 19 further comprising a first elastomeric
seal between the center conductor and the cylindrical seal element
at the connector end and a second elastomeric seal between the
cylindrical seal element at the connector end and the outer
sleeve.
23. The probe of claim 22 wherein the first and second elastomeric
seals comprise o-rings.
Description
FIELD OF THE INVENTION
[0001] This invention relates to guided wave radar measurement
instruments and, more particularly, to a probe for a guided wave
radar measurement instrument.
BACKGROUND OF THE INVENTION
[0002] Knowledge of level in industrial process tanks or vessels
has long been required for safe and cost-effective operation of
plants. Many technologies exist for making level measurements.
These include buoyancy, capacitance, ultrasonic and microwave
radar, to name a few. Recent advances in micropower impulse radar
(MIR), also known as ultra-wideband (UWB) radar, in conjunction
with advances in equivalent time sampling (ETS), permit development
of low power and lost cost time domain reflectometry (TDR)
instruments.
[0003] In a TDR instrument, a very fast pulse with a rise time of
500 picoseconds, or less, is propagated down a probe, that serves
as a transmission line, in a vessel. The pulse is reflected by a
discontinuity caused by a transition between two media. For level
measurement, that transition is typically where the air and the
material to be measured meet. These instruments are also known as
guided wave radar (GWR) measurement instruments.
[0004] The design of a GWR liquid level measurement probe for steam
and other high temperature/pressure applications requires a seal
assembly that satisfies both mechanical and electrical
requirements. Mechanically, the seal must simultaneously be
resistant to the corrosive effect of steam, withstand process
temperatures of 600.degree. F. and above, pressures in excess of
2000 psi, and carry the tensile and bending loads induced by a
center conductor extending into the process vessel. Electrically,
the seal assembly must be electrically transparent to the radar
signal to allow proper functioning of the system. In addition, the
mechanical design affects the electrical characteristics so that
the two are interrelated.
[0005] Plastic materials, such as PTFE, are often used as process
seals for lower temperature and lower pressure probes. Plastic has
a low dielectric constant. This permits the design to achieve the
needed electrical impedance within dimensional constraints imposed
by conventional 3/4" inch NPT process connections while maintaining
adequate structural integrity. Sealing of the plastic process seal
is usually performed by o-rings. However, plastic material and
o-rings are not capable of withstanding the high temperatures
encountered in steam service, and the like.
[0006] Ceramic materials offer high temperature capability and
resistance to temperature and steam. However, sealing ceramics to
metals is difficult and the ceramic materials are susceptible to
cracking under thermal shock. Typically, ceramic seals are brazed
to the metal. However, the coefficients of thermal expansion for
ceramics are much less than for high temperature and pressure
steels. The large differences in the amount that the ceramic and
steel expand and contract between the braising, steam service and
room temperature results in large stresses. These stresses tend to
damage the ceramic and/or the braised joint. Even a pin hole leak
in the ceramic or braising will cause the probe to fail.
Compensating for the thermal expansion differences results in
complex and costly seal designs.
[0007] The present invention is directed to overcoming one or more
of the problems discussed above, in a novel and simple manner.
SUMMARY OF THE INVENTION
[0008] In accordance with the invention, a probe is reliably sealed
without susceptibility to thermal shock while providing
transparency for electrical signals.
[0009] Broadly, in accordance with one aspect of the invention, a
probe defines a transmission line for use with a measurement
instrument including a pulse circuit connected to the probe for
generating pulses on the transmission line and receiving reflected
pulses on the transmission line. The probe includes a center
conductor for conducting the pulses. A conductive outer sleeve is
coaxial with the center conductor. The conductive outer sleeve has
a process end and a connector end. The process end is exposed, in
use, to a process environment being measured. A first cylindrical
seal element between the center conductor and the outer sleeve is
at the sleeve process end. The first cylindrical seal element is of
a first material adapted to withstand a relatively high
temperature. A second cylindrical seal element is between the
center conductor and the outer sleeve disposed between the first
cylindrical seal element and the connector end. The second
cylindrical seal element is of a second material adapted to
withstand a lower temperature than the first cylindrical seal
element.
[0010] Further features and advantages of the invention will be
readily apparent from the specification and from the drawings.
BRIEF DESCRIPTION OF THE DRAWINGS
[0011] FIG. 1 is an elevation view of a measurement instrument
including a probe in accordance with the invention;
[0012] FIG. 2 is a sectional view of the probe of FIG. 1 mounted to
a process vessel; and
[0013] FIG. 3 is a generalized block diagram illustrating operation
of the measurement instrument of FIG. 1.
DETAILED DESCRIPTION OF THE INVENTION
[0014] Referring to FIG. 1, a level measuring process instrument 10
according to the invention as illustrated. The process instrument
10 uses micropower impulse radar (MIR) in conjunction with
equivalent time sampling (ETS) and ultra-wide band (UWB)
transceivers for measuring level. Particularly, the instrument 20
uses guided wave radar for sensing level. While the embodiments
described herein relates to a MIR level sensing apparatus, various
aspects of the invention may be used with other types of process
instruments for measuring various process parameters.
[0015] The process instrument 10 includes a control housing 12, a
probe 14 and a connector 16 for connecting the probe 14 to the
control housing 12. The probe 14 is typically mounted to a process
vessel 18, see FIG. 2, using a threaded fitting 20. The housing 12
is then secured to the probe 14 as by threading the connector 16 to
the probe 14 and to the housing 12. The housing 12 and connector 16
may be as generally described in Mulrooney, et al., U.S. Pat. No.
6,062,095, issued May 16, 2000, the specification of which is
hereby incorporated by reference herein. As described therein, a
probe comprises a high frequency transmission line which, when
placed in a fluid, can be used to measure level of the fluid.
Particularly, the probe is controlled by electronics in the housing
12 for determining level in the vessel 18.
[0016] The electronics mounted in the housing 12 may be, for
example, as described in Carsella, et al., U.S. application Ser.
No. 09/336,194, filed Jun. 18, 1999, the specification of which is
hereby incorporated by reference herein, or as described in Benway,
et al., U.S. application Ser. No. 09/878,895, filed Jun. 11, 2001,
the specification of which is also incorporated by reference
herein. As described in each of the two referenced applications,
electronics in the control housing 12 includes a pulse circuit 22,
see FIG. 3, connected to the probe 14. The pulse circuit 22
generates pulses, represented by an arrow 24, on the transmission
line and receives reflected pulses, represented by an arrow 26,
from the transmission line. The reflected pulses represent
impedance changes on the transmission line.
[0017] Referring to FIG. 2, the probe 14 is illustrated in greater
detail. The probe 14 includes a seal assembly, as described, which
reliably seals the probe 14 without susceptibility to thermal shock
while providing transparency for electrical signals.
[0018] The probe 14 includes the adapter fitting 20 having a nut 30
at an upper end and an NPT thread 32 at a lower end for securing
the probe 14 to the process vessel 18. The adapter fitting 20
includes a cylindrical through opening 36 and a counter bore 38 at
the upper end defining a shoulder 40. The adapter fitting 20 is
constructed of metal.
[0019] A metal, tubular outer sleeve 42 has a process end 44 and a
connector end 46. The outer sleeve process end 40 is connected to
the adapter fitting 20. Particularly, the outer sleeve 42 is
received in the counter bore 38 abutting the shoulder 40 and is
secured thereto as by a weld joint 48. The inner wall of the outer
sleeve 42 includes threads 56 at the connector end 46 to receive an
electrical connector 48.
[0020] The electrical connector 48 includes a female connector pin
50. The electrical connector 48 defines a quick connect using the
pin 50 for connection to the pulse circuit 22, see FIG. 3. An
insulating bushing 52 centers the center pin 50 and is held in
place with a lock nut 54 threaded into the outer sleeve inner
threads 56. The outer sleeve 42 also includes outer threads 58 at
the connector end 46 for threading the probe 14 to the connector
16, see FIG. 1.
[0021] A metal center shaft 60, defining a center conductor, is
received in the female connector pin 50 and is secured thereto in a
conventional manner. As such, the center conductor 60 is coaxial
with the outer sleeve 42 and also the adapter fitting 20. The
center conductor 60 is of a length so that it extends downwardly
through the adapter fitting 20.
[0022] The probe 14 further comprises an extender shaft 62
connected to the center conductor 60 and extending downwardly into
the vessel 18. An extender outer sleeve 64 is coaxial with the
extender shaft 62 and is connected to a lower end of the adapter
fitting 20. The length of the extender shaft 62 and extender outer
sleeve 64 depend on the particular application.
[0023] As described, the pulse circuit 22 is connected to the probe
14 via the electrical connector 48. The pulse circuit 22 generates
pulses on the transmission line, defined by the center conductor 60
and extender shaft 62, and also receives reflected pulses on the
transmission line. The outer sleeve 42, adapter fitting 20, and
extender outer sleeve 64 act as a ground.
[0024] In accordance with the invention, the probe 14 is provided
with an improved seal assembly adapted to be impervious to process
fluid and to provide a temperature drop to ensure that all seal
elements are capable of withstanding temperatures they are exposed
to.
[0025] Particularly, the seal assembly comprises a ceramic seal
element 70, first and second plastic seal elements 72 and 74,
respectively, a set of outer o-rings 76 and a set of inner o-rings
78. The seal elements 70, 72 and 74 are generally cylindrical
having an outer diameter slightly less than an inner diameter of
the outer sleeve 42 to be received therein. The seal elements 70,
72 and 74 also have inner diameters slightly greater than an outer
diameter of the center conductor 60 for receiving the same. The
ceramic seal element 70 is positioned at the outer sleeve process
end 44 resting on the adapter fitting shoulder 40. The first
plastic seal element 72 is abutting the ceramic seal element 70.
The second plastic seal element 74 is abutting the first plastic
seal element 72 having its upper end 76 proximate the outer sleeve
connector end 46. As described, the seal elements 70, 72 and 74 are
loosely received in the outer sleeve 42 and are captured between
the adapter fitting 20 and the electrical connector 48. The outer
o-rings 76 are between the second plastic seal element 74 and the
outer sleeve 42. The inner o-rings 78 are between the center
conductor 60 and the second plastic seal element 74. The o-rings 76
and 78 comprise elastomeric o-rings. The sets of o-rings 76 and 78
are positioned longitudinally above a center position of the second
plastic seal element 74.
[0026] Together the seal elements 70, 72 and 74, the center
conductor 60 and outer sleeve 42 form a coaxial transmission line
with an integral high temperature, high pressure seal. The seal
elements 70,72 and 74 are designed to be impervious to process
fluids and to provide a temperature drop to ensure that the
individual seal elements 70, 72 and 74 are capable of withstanding
the temperatures they are exposed to. Particularly, the ceramic
seal element 70, being directly exposed to the process material, is
adapted to withstand a relatively high temperature compared to the
plastic seal elements 72 and 74.
[0027] The center conductor 60 carries and guides the probe pulse
in a conventional manner. The outer sleeve 42 provides the process
connection, pressure boundary and ground path for the electrical
signal. The ceramic seal element 70 and plastic seal elements 72
and 74 are placed end to end between the center conductor 60 and
outer sleeve 42 and perform several functions. Particularly, they
serve to position the center conductor 60 along the center line
axis of the outer sleeve 42, create a fiducial signal, control
impedance and provide a thermal barrier between the process fluid
and the o-ring seals 76 and 78.
[0028] The ceramic seal element 70 is positioned at the process
interface at the outer sleeve process end 44. The ceramic seal
element 70 provides high temperature and steam resistance. The
ceramic material blocks the steam from freely traveling up the
length of the probe. Heat is lost to the ambient atmosphere through
convection and radiation from the outer sleeve 42, resulting in a
temperature drop going up the probe. The length of the ceramic seal
element 70 provides a sufficient temperature drop so that the
temperature at the interface with the first plastic seal element 72
is below the maximum of service temperature of the plastic
material.
[0029] Because the ceramic seal element 70 is loose, but captured
within the outer sleeve 42, as described, the ceramic material is
subjected to only pressure and thermal shock stresses. The ceramic
material is unaffected by the pressures encountered in steam
service. Since no seal is made between the metal parts and the
ceramic, if the ceramic material cracks due to thermal stress, then
the seal integrity is not compromised. The electrical performance
is also unaffected by cracks.
[0030] The plastic seal elements 72 and 74 act similarly to the
ceramic seal element 70. They are of sufficient length to result in
a temperature drop such that the temperature at the o-rings 76 and
78 is within the allowable rating for the o-ring elastomeric
material. Plastic materials are inherently resistant to cracking
from thermal shock, so that the overall design is highly resistance
to rapid changes in temperature as might be encountered if the
probe 14 is installed into a hot chamber.
[0031] Because sealing is accomplished by the o-rings 76 and 78 at
the upper end of the seal assembly, some process fluid can migrate
into the spaces between the seal elements 70, 72 and 74, and the
o-rings 76 and 78. Clearances between the center conductor 60, seal
element 70, 72 and 74, and outer sleeve 42 are kept minimal to
reduce the amount of fluid permitted in the seal region. A small
amount of fluid does not significantly affect the electrical
performance of the seal assembly. Additionally, thermal expansion
coefficient of the plastic is higher than that of the steel shaft
center conductor 60 and the outer sleeve 42.
[0032] The geometry and dielectric constant of the plastic seal
elements 72 and 74 creates a drop in impendence with respect to the
nominal impedance of the probe and coaxial cable system. The
impendence drop at the top of the probe 14 produces a fiducial
signal from which level measurements are referenced. Since the
electrical signal travels slower through the plastic seal elements
72 and 74, and the ceramic seal element 70, due to the higher
dielectric constant of those materials, the fiducial signal is
separated in time from the level pulse in all cases, permitting
flooded cage operation. This design also reduces the complexity of
the center conductor 60 since no undercut of the shaft is required
to produce the fiducial signal.
[0033] The composition of the plastic seal elements 72 and 74 and
the ceramic seal element 70, as well as their dimensions, may be
varied to account for different process conditions such as
temperature, pressure and process fluid. For example, the length of
the ceramic seal element 70 could be increased relative to the
plastic seal element 72 and 74 to allow operation at a higher
temperature. The plastic seal element 72 and 74 could also be
replaced entirely to permit usage of the seal assembly at
temperatures or pressures too high for plastic elements.
[0034] In an illustrative example, the probe 14 includes a ceramic
seal element 70 that is approximately one half inch long. The first
plastic seal element 72 is two inches long and the second plastic
seal element 74 is 2.5 inches long. This configuration provides
temperature capability to approximately 600.degree. F. For
temperature ranges up to 550.degree. F., all three seal elements
70, 72 and 74 could be made from high temperature plastic with the
same overall length as just described. To provide temperature
capability above 600.degree. F., the overall length of the seal
elements can be increased by adding additional ceramic elements 70
of one half inch length. Each additional one half inch length
ceramic seal element provides approximately a 50.degree. F.
increase in maximum allowable temperature.
[0035] For higher temperature and/or pressure applications, or for
process fluids that are not compatible with plastic seal elements,
the seal elements 72 and 74 may comprise ceramic seal elements.
Alumina ceramic, for example, can be machined to a sufficiently low
surface finish to permit sealing by the O rings 76 and 78. The
electrical characteristics of alumina ceramic are such that the
fiducial signal would be generated in the same manner as with the
use of plastic seal elements. Ceramic seal elements have higher
allowable compressive stress levels and service temperatures
compared to plastics. Hence, an all ceramic design is capable of
increased temperature and pressure limits.
[0036] The illustrative example described above uses the minimum
amount of ceramic necessary for temperature compatability while
minimizing manufacturing costs as ceramic is more expensive than an
equivalent amount of plastic.
[0037] Thus, in accordance with the invention, there is provided a
probe having an improved seal assembly that is not susceptible to
thermal shock while providing transparency for electrical
signals.
* * * * *