U.S. patent application number 10/218953 was filed with the patent office on 2003-04-24 for peizoelectric microactuator and sensor failure detection in disk drives.
Invention is credited to Guo, Wei, Hatch, Michael R..
Application Number | 20030076121 10/218953 |
Document ID | / |
Family ID | 26913413 |
Filed Date | 2003-04-24 |
United States Patent
Application |
20030076121 |
Kind Code |
A1 |
Guo, Wei ; et al. |
April 24, 2003 |
Peizoelectric microactuator and sensor failure detection in disk
drives
Abstract
A test device and method for testing one of a disk drive
microactuator and a disk drive sensor that includes two
piezoelectric elements. The test device includes a signal
generator, signal analyzer, and a user interface. The test device
is operational to provide a reference signal (e.g. an electrical
signal) to one of the piezoelectric elements in the microactuator
and obtain a test measure from the other one of the piezoelectric
elements. The test measure is then utilized to assess a performance
parameter for the microactuator. The test measure is generated by
the other one of the piezoelectric elements in response to the
reference signal provided to the first one of the piezoelectric
elements. In one embodiment of the invention, the test measure is a
signal generated in response to the reference signal that may be
compared to a known response signal of an operational microactuator
to determine operational characteristics of a subject microactuator
such as circuitry operation and/or damage to the microactuator.
Inventors: |
Guo, Wei; (Fremont, CA)
; Hatch, Michael R.; (Mountain View, CA) |
Correspondence
Address: |
Travis C. Stephenson, Esq.
Suite 411
3151 South Vaughn Way
Aurora
CO
80014
US
|
Family ID: |
26913413 |
Appl. No.: |
10/218953 |
Filed: |
August 13, 2002 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
|
60345037 |
Oct 23, 2001 |
|
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Current U.S.
Class: |
324/727 ;
G9B/20.051; G9B/27.052 |
Current CPC
Class: |
G11B 2220/20 20130101;
G01R 31/2829 20130101; G11B 20/1816 20130101; G11B 27/36
20130101 |
Class at
Publication: |
324/727 |
International
Class: |
G01R 029/22 |
Claims
What is claimed is:
1. A method for testing one of a disk drive microactuator and a
disk drive sensor that includes a pair of piezoelectric elements,
the method comprising the steps of: providing a reference signal to
a first one of the pair of piezoelectric elements; obtaining a test
measure for the second one of the pair of piezoelectric elements,
wherein the test measure is generated by the second one of the pair
of piezoelectric elements in response to the reference signal
provided to the first one of the piezoelectric elements; and
employing the test measure to assess a performance parameter of the
one of the disk drive microactuator and the disk drive sensor.
2. The method of claim 1 wherein the step of employing includes:
comparing the test measure to a predetermined measure to assess the
performance parameter of the one of the disk drive microactuator
and the disk drive sensor.
3. The method of claim 2 comprising the step of: providing an
output indicative of the comparison of the test measure to the
predetermined measure.
4. The method of claim 1 wherein the step of providing the
reference signal includes: providing an electrical signal at a
predetermined voltage to generate the test measure for the second
one of the pair of piezoelectric elements.
5. The method of claim 4 wherein the step of providing the
electrical signal includes: providing the electrical signal at a
plurality of different voltages distributed across a predetermined
range to generate a plurality of test measures from the second one
of the pair of piezoelectric elements.
6. The method of claim 5 wherein the test measure and the plurality
of test measures comprise: a frequency response signal from the
second one of the pair of piezoelectric elements generated in
response to the electrical signal passing through the first one of
the pair of piezoelectric elements.
7. The method of claim 1 wherein the performance parameter
comprises: functionality of circuitry for the one of the disk drive
microactuator and the disk drive sensor.
8. The method of claim 1 wherein the performance parameter
comprises: physical damage to the one of the disk drive
microactuator and the disk drive sensor.
9. The method of claim 1 wherein the step of providing the
reference signal includes: providing the reference signal to a flex
cable connector of a fully assembled disk drive.
10. The method of claim 9 wherein the step of obtaining the test
measure includes: obtaining the test measure from the flex cable
connector of the fully assembled disk drive.
11. A method for testing one of a disk drive microactuator and a
disk drive sensor that includes a pair of piezoelectric elements,
the method comprising the steps of: connecting a test device to the
disk drive; utilizing the test device to provide an electrical
signal to a first one of the pair of piezoelectric elements;
utilizing the test device to obtain a test measure for the second
one of the pair of piezoelectric elements, wherein the test measure
is generated by the second one of the pair of piezoelectric
elements in response to the electrical signal provided to the first
one of the piezoelectric elements; and employing the test measure
to assess a performance parameter of the one of the disk drive
microactuator and the disk drive sensor.
12. The method of claim 11 wherein the step of connecting the test
device to the disk drive comprises: connecting the test device to a
flex cable connector on the disk drive.
13. The method of claim 11 wherein the step of employing includes:
utilizing the test device to compare the test measure to a
predetermined measure to assess the performance parameter of the
one of the disk drive microactuator and the disk drive sensor.
14. The method of claim 13 comprising the step of: providing an
output on a user interface of the test device indicative of the
comparison of the test measure and the predetermined measure.
15. The method of claim 11 wherein the step of utilizing the test
device to provide the electrical signal includes: providing the
electrical signal at a predetermined voltage to generate the test
measure in the second one of the pair of piezoelectric
elements.
16. The method of claim 15 wherein the step of utilizing the test
device to provide the electrical signal includes: providing the
electrical signal at a plurality of different voltages distributed
across a predetermined range to generate a plurality of test
measures in the second one of the pair of piezoelectric
elements.
17. The method of claim 16 wherein the corresponding test measure
and the corresponding plurality of test measures comprises: a
frequency response signal of the second one of the pair of
piezoelectric elements to the electrical signal passing through the
first one of the pair of piezoelectric elements.
18. The method of claim 11 wherein the performance parameter
comprises: functionality of circuitry for the one of the disk drive
microactuator and the disk drive sensor.
19. The method of claim 11 wherein the performance parameter
comprises: physical damage to the one of the disk drive
microactuator and the disk drive sensor.
20. A method for testing one of a disk drive microactuator and a
disk drive sensor that includes a pair of piezoelectric elements,
the method comprising: providing a voltage to one of the pair of
piezoelectric elements; measuring a second voltage generated by a
second one of the pair of piezoelectric elements in response to the
first voltage applied to the first one of the pair of piezoelectric
elements; and comparing the measured voltage to a predetermined
measure to determine a performance characteristic of the one of the
disk drive microactuator and the disk drive sensor.
21. The method of claim 20 comprising the step of: providing an
output to a user indicative of the comparison of the measured
voltage and the predetermined measure.
22. The method of claim 20 wherein the step of providing the
voltage includes: providing a plurality of different voltages
distributed across a predetermined range to generate a
corresponding plurality of voltages in the second one of the pair
of piezoelectric elements.
23. The method of claim 20 wherein the performance parameter
comprises: operation of circuitry for the one of the disk drive
microactuator and the disk drive sensor.
24. The method of claim 20 wherein the other performance parameter
comprises: physical damage to the one of the disk drive
microactuator and the disk drive sensor.
25. A test device for testing one of a disk drive microactuator and
a disk drive sensor that includes a pair of piezoelectric elements,
the device comprising: a signal generator to generate and provide a
reference signal to a first one of the pair of piezoelectric
elements; a signal analyzer to obtain a response signal from the
second one of the pair of piezoelectric elements generated in
response to the reference signal passing through the first one of
the pair of piezoelectric elements and compare the generated
response signal to a predetermined response signal for the second
one of the pair of piezoelectric elements; and a user interface to
provide an output indicative of the comparison between the
generated response signal and the predetermined response signal,
wherein the comparison is indicative of a performance parameter for
the one of the disk drive microactuator and the disk drive
sensor.
26. The test device of claim 25 comprising: a test control
processor to generate and provide signals for setting the signal
generator to provide the reference signal at a predetermined
voltage to generate a corresponding response signal from the second
one of the pair of piezoelectric elements.
27. The test device of claim 26 wherein the test control processor
is configured to generate and provide signals for setting the
signal generator to provide the reference signal at a plurality of
predetermined voltages to generate a corresponding plurality of
response signals in the second one of the pair of piezoelectric
elements.
28. The test device of claim 25 wherein the response signal
comprises: a measured voltage generated by the second one of the
pair of piezoelectric elements in response to the electrical signal
passing through the first one of the pair of piezoelectric
elements.
29. The method of claim 25 wherein the performance parameter
comprises: operation of circuitry for the one of the disk drive
microactuator and the disk drive sensor.
30. The method of claim 26 wherein the performance parameter
comprises: physical damage to the one of the disk drive
microactuator and the disk drive sensor.
Description
RELATED APPLICATIONS
[0001] This patent application claims priority from U.S. Patent
Application Serial No. 60/345,037, that was filed on Oct. 23, 2001,
and that is entitled "PZT MICROACTUATOR FAILURE DETECTION BY
MEASURING PZT GENERATED VOLTAGE." The entire disclosure of U.S.
Patent Application Serial No. 60/345,037 is incorporated by
reference herein.
FIELD OF THE INVENTION
[0002] The present invention generally relates to testing of disk
drives, and more particularly, to testing and detecting failures in
piezoelectric microactuators and piezoelectric sensors of disk
drives.
BACKGROUND OF THE INVENTION
[0003] Conventional disk drives typically include a base plate and
a cover that is detachably connected to the base plate to define an
enclosure for various disk drive components. One or more data
storage disks are generally mounted on a spindle which is rotatably
interconnected with the base plate and/or cover so as to allow the
data storage disk(s) to rotate relative to both the base plate and
cover via a spindle motor. An actuator arm assembly (e.g., a single
actuator arm, a plurality of actuator arms, an E-block with a
plurality of actuator arm tips), is interconnected with the base
plate and/or cover by an appropriate bearing or bearing assembly so
as to enable the actuator arm assembly to pivot relative to both
the base plate and cover in a controlled manner.
[0004] A suspension or load beam may be provided for each data
storage surface of each data storage disk. Typically, each disk has
two of such surfaces. All suspensions are appropriately attached to
and extend away from the actuator arm assembly in the general
direction of the data storage disk(s) during normal operations. A
slider is mounted on the free end of each suspension. A transducer,
such as a read/write head, is mounted (e.g., embedded) on each
slider for purposes of exchanging signals with the corresponding
data storage surface of the corresponding data storage disk. In
this regard, each data storage surface of each data storage disk
has a plurality of concentrically disposed tracks that are
available for data storage. Typically, these tracks are circular
and are concentrically disposed on a data storage disk of a disk
drive.
[0005] For high track density drives, the position of the slider,
and thereby each transducer, is often controlled by a "dual-stage
actuation system". In such a system, a first stage including a
voice coil motor or the like is utilized to provide a course
positioning by pivoting the actuator arm assembly and each slider
interconnected therewith to dispose the transducer(s) at a desired
radial position relative to the corresponding data storage disk. In
a second stage, a microactuator is utilized to further position the
transducer(s) at a radial position over a desired track. In this
regard, such microactuators typically operate to move the
transducer radially over the disc surface for track seek operations
and hold the transducer directly over a track on the disc surface
for track following operations. One type of microactuator includes
a pair of piezoelectric ("PZT") elements that expand and contract
in response to an applied voltage to distort the slider to effect
fine positioning of the transducer and slider relative to a desired
track.
[0006] Disk drives also often include different systems to protect
against damage to the data storage disk(s) and/or transducer(s) in
the event that the disk drive is subject to a non-operational shock
event or force ("shock event"). For instance, disk drives may
include a sensor system that detects shock events and prevents
read/write operations until the event has subsided. In another
instance, disk drives may include an active damping system, which
actively dampens vibrational energy from a shock event, to reduce
damage. In either case, it is known to use piezoelectric materials
in these systems. For example, in the case of shock sensors, it is
known to use a pair of piezoelectric elements mounted on a disk
drive housing to detect shock events and prevent read/write
operations during such an event to prevent damage to the disk(s)
and/or transducer(s).
[0007] Currently, several methods exist for testing microactuators
and sensors that include piezoelectric materials. These methods
generally include, measuring capacitance, performing visual checks,
and/or measurement of a mechanical resonance using a Laser Doppler
Vibrometer ("LDV") to generate a mechanical bode plot. Among these
methods, the most reliable is the use of an LDV to measure
mechanical resonance. The output of the LDV test (a bode plot
representing the mechanical resonance characteristics) may then be
compared to known resonance characteristics of an operational
microactuator and/or to determine if the microactuator and/or
sensor is functioning properly. In this regard, if the subject
microactuator and/or sensor is damaged, such resonance
characteristics will vary indicating that the subject microactuator
and/or sensor should be further tested, usually via close visual
inspection, for damage. LDV involves projecting a laser beam onto
one of the PZT elements to sense and measure motion of the element
that may be characterized in a graphical output, usually including
a plot of the log of the frequency versus the measured vibration in
decibels.
[0008] Unfortunately, however, LDV mechanical resonance measurement
is inefficient in that it requires significant setup and
positioning to align the laser beam on the measurement target (one
of the PZT elements). Further, in some cases, such as within an
environmental chamber or when a subject disk drive is completely
sealed, LDV testing is not even possible without removing and/or
disassembling the subject drive to expose the measurement target to
the laser beam. In this regard, the average testing time for a
single microactuator using the LDV method is on the order of about
half an hour to an hour. This in turn oftentimes makes
microactuator and/or sensor testing using LDV economically
infeasible.
SUMMARY OF THE INVENTION
[0009] In view of the foregoing, a broad objective of the present
invention is to provide a test device and method for testing PZT
microactuators and/or sensors to detect failures in the same.
Another object of the present invention is to provide a reliable
yet efficient test device and method for testing PZT microactuators
and/or sensors in disk drives prior to shipping the drives to a
customer(s). A related objective is to provide a test device and
method for measuring the mechanical resonance of PZT microactuators
and/or sensors for comparison to a predetermined mechanical
resonance for an operational PZT microactuator and/or sensor.
[0010] In carrying out the above objects, and other objects,
features, and advantages of the present invention, a method for
testing PZT microactuators and/or sensors in a disk drive in
accordance with a first aspect is provided. A typical disk drive,
to be discussed in more detail below, generally includes an
appropriate housing (e.g., a base plate and/or cover that
collectively define an enclosed space or the like). A data storage
disk(s) is interconnected with this housing in a manner so as to
allow the data storage disk to move (e.g., rotate) relative to the
housing in a desired manner. That is, the present invention is
applicable to disk drives having only a single data storage disk,
as well as disk drives having a multiple data storage disk
configuration and which are typically mounted on a common spindle
motor or the like. An actuator arm assembly is also interconnected
with the noted housing in a manner that allows the actuator arm
assembly to move relative to the housing in a desired manner. A
transducer is appropriately interconnected with the actuator arm
assembly (e.g., via a suspension or load beam that extends from a
rigid actuator arm, actuator arm tip, or E block, and a slider that
is mounted on the free end of this suspension or load beam and
which includes the noted transducer). Typically, there will be a
transducer for each data storage surface of each data storage disk
utilized by the disk drive, although the broadest aspects of the
present invention do not require such. In any case, an actuator arm
drive assembly appropriately interfaces with the actuator arm
assembly in a manner so as to be able to move the actuator arm
assembly and each transducer that is interconnected therewith to a
desired position (e.g., in relation to a given transducer's
corresponding data storage disk for exchange of a signal
therebetween, such as for purposes of a read and/or write
operation). In this regard, a microactuator and/or sensor having
two PZT elements is also included in the disk drive at an operable
location, which is irrelevant to the present method and device.
[0011] According to the first aspect of the present invention, a
reference signal is provided to one of the two PZT elements in a
microactuator or a sensor. A test measure is then obtained from the
other PZT element that is utilized to assess a performance
parameter for the microactuator or sensor. The test measure is
generated by the other PZT element in response to the reference
signal provided to the first PZT element.
[0012] Various refinements exist of the features noted in relation
to the subject first aspect of the present invention. Further
features may also be incorporated in the subject first aspect of
the present invention as well. These refinements and additional
features may exist individually or in any combination. For
instance, the reference signal may be in the form of an electrical
signal provided to one of the two PZT elements at a predetermined
voltage. The test measure, on the other hand, may be a response
signal, or voltage, received from the other one of the PZT elements
in response to the reference signal passing through the first PZT
element. In accordance with the first aspect, the test measure may
be compared to a predetermined measure to assess a performance
parameter(s) for the microactuator and or sensor. In this regard,
the predetermined measure may be a known response signal for an
operational microactuator and/or sensor. A comparison of the test
measure to the predetermined measure may be utilized to determine
if the current microactuator and/or sensor is damaged, as the
resonant characteristics of a damaged microactuator and/or sensor
will have changed so that the test measure does not correspond to
the predetermined measure for an operational microactuator and/or
sensor. Similarly, if on the other hand, the test measure
corresponds to the predetermined response of an operational
microactuator and/or sensor, it is known that the present
microactuator and/or sensor is undamaged. Further, if no test
measure is received in response to providing the reference signal
to the first one of the PZT elements, it is known that a connection
and/or the circuitry in the closed loop system is faulty.
[0013] In carrying out the above objects, and other objects,
features, and advantages of the present invention, a test device
for testing microactuators and/or sensors in a disk drive in
accordance with a second aspect is provided. The test device
includes a signal generator to generate the reference signal for
the first one of the PZT elements and a signal analyzer to compare
a response signal, e.g. frequency response, from another PZT
element with a predetermined response signal for an operational
microactuator and/or sensor. In this regard, the test device may
also include a user interface to provide an output indicative of
the comparison between the response signal and the predetermined
response signal for an operational microactuator and/or sensor.
[0014] Various refinements exist of the features noted in relation
to the subject second aspect in of the present invention. Further
features may also be incorporated in the second aspect of the
present invention as well. These refinements and additional
features may exist individually or in any combination. For
instance, the test device may further include a test control
processor for generating and providing signals to the signal
generator for setting the reference signal at a predetermined
voltage. The test control processor may also be utilized to
generate signals for setting the reference signal at a plurality of
predetermined voltages that may be provided to the first one of the
PZT elements to generate a corresponding plurality of response
signals from the other one of the PZT elements.
[0015] Numerous additional features and advantages of the present
invention will become apparent to those skilled in the art upon
consideration of the further description that follows.
BRIEF DESCRIPTION OF THE DRAWINGS
[0016] FIG. 1 is a top view of a disk drive that utilizes a
microactuator having a pair of PZT elements;
[0017] FIG. 2A is a top view of a microactuator for the disk drive
of FIG. 1 that includes a pair of PZT elements;
[0018] FIG. 2B is an example of an electrical schematic for the
microactuator of FIG. 2A;
[0019] FIG. 3 is a schematic diagram illustrating operation of a
transducer in the disk drive of FIG. 1;
[0020] FIG. 4 is a block diagram illustrating an example of the
test device according to one or more aspects of the present
invention;
[0021] FIG. 5 is flow chart depicting an example of an operational
protocol according to the present invention;
[0022] FIG. 6 is a bode plot illustrating a comparison of a test
measure obtained in accordance with the present invention and a
predetermined measure of an operational microactuator; and
[0023] FIG. 7 is another bode plot illustrating a comparison of a
test measure obtained in accordance with the present invention and
a predetermined measure of an operational microactuator.
DETAILED DESCRIPTION
[0024] Reference will now be made to the accompanying drawings,
which assist in illustrating the various pertinent features of the
present invention. Although the present invention will now be
described primarily in conjunction with disk drives, it should be
expressly understood that the present invention may be applicable
to other applications where testing of a PZT microactuator having
two PZT elements is required/desired. Additionally, for purpose of
clarity the present invention will now be described in conjunction
with the testing of a disk drive microactuator having two
piezoelectric elements. It will be appreciated, however, that the
principles described below apply equally to testing of a disk drive
sensor that includes two piezoelectric elements, although such
discussion is omitted to avoid redundancy. In this regard, the
following description of a disk drive is presented for purposes of
illustration and description. Furthermore, the description is not
intended to limit the invention to the form disclosed herein.
Consequently, variations and modifications commensurate with the
following teachings, and skill and knowledge of the relevant art,
are within the scope of the present invention. The embodiments
described herein are further intended to explain best modes known
of practicing the invention and to enable others skilled in the art
to utilize the invention in such, or other embodiments and with
various modifications required by the particular application(s) or
use(s) of the present invention.
[0025] FIGS. 1, 2A, and 2B illustrate one embodiment of a disk
drive 100 configured with a microactuator 200 having a pair of PZT
elements, 202 and 204. The disk drive 100 generally includes a base
plate 102 and a cover (not shown) that may be disposed on the base
plate 102 to define an enclosed housing or space for the various
disk drive components. The disk drive 100 includes one or more data
storage disks 103 of any appropriate computer-readable data storage
media. Typically, both of the major surfaces of each data storage
disk 103 include a plurality of concentrically disposed tracks for
data storage purposes. Each disk 103 is mounted on a hub or spindle
117, which in turn is rotatably interconnected with the disk drive
base plate 102 and/or cover. Multiple data storage disks 103 would
be mounted in vertically spaced and parallel relation on the
spindle 117. Rotation of the disk(s) 103 is provided by a spindle
motor 104 that is coupled to the spindle 117 to simultaneously spin
the data storage disk(s) 103 at an appropriate rate.
[0026] The disk drive 100 also includes an actuator arm assembly
111 that pivots about a pivot bearing 105, which in turn is
rotatably supported by the base plate 102 and/or cover. The
actuator arm assembly 111 includes one or more individual rigid
actuator arms 112 that extend out from near the pivot bearing 105.
Multiple actuator arms 112 would be disposed in vertically spaced
relation, with one actuator arm 112 typically being provided for
each major data storage surface of each data storage disk 103 of
the disk drive 100. Other types of actuator arm assembly
configurations could be utilized as well, such as an "E" block
having one or more rigid actuator arm tips or the like that
cantilever from a common structure. In any case, movement of the
actuator arm assembly 111 is provided by an actuator arm drive
assembly, such as a voice coil motor 107 or the like. The voice
coil motor 107 is a magnetic assembly that controls the operation
of the actuator arm assembly 111 under the direction of control
electronics 113. Any appropriate actuator arm assembly drive type
may be utilized by the disk drive 100, including a linear drive
(for the case where the actuator arm assembly 111 is interconnected
with the base plate 102 and/or cover for linear movement versus the
illustrated pivoting movement about the pivot bearing 105) and
other types of rotational drives.
[0027] A load beam or suspension 109 is attached to the free end of
each actuator arm 112 and cantilevers therefrom. Typically, the
suspension 109 is biased generally toward its corresponding disk
103 by a spring-like force. A slider 110 is disposed at or near the
free end of each suspension 109. What is commonly referred to as
the "head" 206 (e.g., transducer) is appropriately mounted on the
slider 110 and is used in disk drive read/write operations. A
microactuator 200 is also appropriately mounted on the slider 110,
as shown in FIG. 2A and in the circuit diagram of FIG. 2B. The
microactuator 200 includes a pair of PZT elements, 202 and 204,
that are differentially driven to achieve fine positioning of the
head 206 relative to a desired track on the corresponding disk 103.
In this regard, differential voltages are applied to the PZT
elements, 202 and 204, to cause opposing expansion and contraction
of the elements, 202 and 204, to effect movements of the slider 110
and position the head 206 over a desired track on the corresponding
disk 103.
[0028] The head 206 on the slider 110 may utilize various types of
read/write technologies. The biasing forces exerted by the
suspension 109 on its corresponding slider 110 thereby attempt to
move the slider 110 in the direction of its corresponding disk 103.
Typically, this biasing force is such that if the slider 110 were
positioned over its corresponding disk 103, without the disk 103
being rotated at a sufficient velocity, the slider 110 would be in
contact with the disk 103.
[0029] The head 206 and microactuator 200 are interconnected with
the control electronics 113 of the disk drive 100 by a flex cable
115 that is typically mounted on the actuator arm assembly 111.
Signals are exchanged between the head 206 and its corresponding
data storage disk 103 for disk drive read/write operations.
Similarly, signals are exchanged between the microactuator 200 to
position the head 206 for such read write operations. In this
regard, the voice coil motor 107 is utilized to pivot the actuator
arm assembly 111 to simultaneously move the head 206 on its slider
110 along a path 108 and "across" the corresponding data storage
disk 103 to position the head 206 at the desired/required radial
position on the disk 103 (i.e., at the approximate location of the
correct track on the data storage disk 103) for disk drive
read/write operations.
[0030] When the disk drive 100 is not in operation, the actuator
arm assembly 111 is pivoted to a "parked position" to dispose each
slider 110 generally at or beyond a perimeter of its corresponding
data storage disk 103, but in any case in vertically spaced
relation to its corresponding disk 103. This is commonly referred
to in the art as being a dynamic load/unload disk drive
configuration. In this regard, the disk drive 100 includes a ramp
assembly 106 that is disposed beyond a perimeter of the data
storage disk 103 to typically both move the corresponding slider
110 vertically away from its corresponding data storage disk 103
and to also exert somewhat of a retaining force on the actuator arm
assembly 111. Any configuration for the ramp assembly 106 that
provides the desired "parking" function may be utilized. The disk
drive 100 could also be configured to be of the contact start/stop
type, where the actuator arm assembly 111 would pivot in a
direction to dispose the slider(s) 110 typically toward an inner,
non-data storage region of the corresponding data storage disk 103.
Terminating the rotation of the data storage disk(s) 103 in this
type of disk drive configuration would then result in the slider(s)
110 actually establishing contact with or "landing" on their
corresponding data storage disk 103, and the slider 110 would
remain on the disk 103 until disk drive operations are
re-initiated. In either configuration, it may be desirable to
attempt to retain the actuator arm assembly 111 in this parked
position if the disk drive 100 is exposed to a shock event. In this
regard, the disk drive 100 includes an actuator arm assembly latch
101 that moves from a non-latching position to a latching position
to engage the actuator arm assembly 111 to preclude the same from
pivoting in a direction that would tend to drag the slider(s) 110
across their corresponding data storage disk 103.
[0031] The slider 110 of the disk drive 100 may be configured to
"fly" on an air bearing during rotation of its corresponding data
storage 103 at a sufficient velocity. This is schematically
illustrated in FIG. 3. Here the arrow represents the direction of
rotation of the disk 103 relative to the slider 110, while the fly
height of the slider 110 is represented by reference numeral 304
(measured from a reference plane of the mean of the surface
roughness of the disk 103). In FIG. 3, the slider 110 is disposed
at a pitch angle such that its leading edge 302 of the slider 110
is disposed further from its corresponding data storage disk 103
than its trailing edge 300. The head 206 would typically be
incorporated on the slider 110 generally toward its trailing edge
300 since this is positioned closest to its corresponding disk 103.
Other pitch angles could be utilized for flying the slider 110.
[0032] Referring to FIG. 4, to allow for assessment of the
performance of the microactuator 200, one embodiment of the present
invention provides for the use of an externally positioned
(relative to the disk drive 100) test device 400. The test device
400 is electrically connected to the piezoelectric elements, 202
and 204, via a closed loop circuit. Specifically, the test device
400 includes a connector 402. The connector 402 is of the type
commonly used in the art to connect to a conventional flex cable
connector included on the disk drive 100 for connection to a PCBA
board of a disk drive. In other words, the connector 402 is of the
type utilized on PCBA boards for the connection of the disk drive
100. In this regard, leads 404 and 406 from the test device 400
connect to the corresponding pins within the connector 402 that are
matched to the microactuator 200. Advantageously, the use of the
conventional flex cable connector on the disk drive 100 for the
connection of the test device 400 eliminates the prior art
requirement of having to remove and/or disassemble a subject disk
drive, e.g. 100, to expose the microactuator 200.
[0033] To provide for testing of the microactuator 200, the test
device 400 includes a signal generator 408 to provide an input
electrical signal, e.g. a reference signal, over the path 404 to
one of the piezoelectric elements 202 and 204. More particularly,
the test device 400 also includes a test control processor 412 and
signal analyzer 410. The test control processor 412 provides
signals for setting the signal generator 408 to output the
reference signal at a predetermined voltage. The test control
processor 412 also provides the reference signal characteristics to
the signal analyzer 410, which stores the reference signal
characteristics for assessing the performance of the microactuator
200, as will be further discussed below. In this regard, the test
control processor 412 may also provide signals for setting the
signal generator 408 to output the reference signal that may be
swept across a predetermined voltage range for purposes discussed
further below. The reference signal may be any signal capable of
exciting one of the piezoelectric elements 202 and 204. Some
examples of the reference signal include without limitation, a
swept sine, periodic chirp, or random noise.
[0034] The signal analyzer 410, in turn, analyzes a response
electrical signal generated by the other one of the piezoelectric
elements, 202 and 204, in response to the input reference signal by
the signal generator 408. As will become apparent from the
following description, the signal analyzer 410 performs comparisons
of the reference signal characteristics and the response signal
characteristics that are usable to determine performance
characteristics of the microactuator 200. In this regard, the test
device 400 also includes a user interface 414 that includes a
display 416 for displaying the results of the signal comparisons
made by the signal analyzer 410. The user interface 414 also
includes an input module 418 for receiving inputs from a user
providing instruction to the test control processor 412 with regard
to setting the reference signal.
[0035] FIG. 5 is a flow chart illustrating an example of an
operational protocol according to the present invention. FIG. 6 is
an example of an output provided by the signal analyzer 410 to the
display 416. In the example illustrated in FIG. 5, the reference
signal is provided to the piezoelectric element 202 and the
response signal is generated by the piezoelectric element 204.
Alternatively, as will be appreciated, the present protocol works
equally well where the reference signal is provided to the
piezoelectric element 204 and the response signal is generated by
the piezoelectric element 202.
[0036] On FIG. 5, the operation begins at step 500. At step 502 the
test device 400 is connected to a subject disk drive, e.g. drive
100, via the connector 402, by plugging the connector 402 into the
flex cable connector on the drive 100. At step 504, a user inputs
the characteristics of the reference signal into the input module
418 of the user interface 415. At step 506, the test device 400
generates and provides a reference signal to the piezoelectric
element 202 over the lead 404. More specifically, the test control
processor 412 provides signals to the signal generator 408
according to inputs from the user at the input module 418. In turn,
the signals from the test control processor 412 set the signal
generator 408 to output a reference signal at a predetermined
voltage.
[0037] At step 508, the test device 400 measures a frequency
response signal (e.g. voltage) generated by the piezoelectric
element 204 in response to the reference signal (e.g. voltage)
passing through the piezoelectric element 202. The response signal,
and more particularly, the generated voltage by element 202, in
turn, is directly related to the electrical single passing through
the piezoelectric element 202. The electrical signal passing
through the element 202 is in turn, related to the mechanical
characteristics of the piezoelectric elements 202 and 204. In other
words, the application of the electrical signal or voltage to the
piezoelectric element 202 induces a mechanical strain in the
element 202 that is transmitted to the piezoelectric element 204,
thereby generating a responsive voltage in the piezoelectric
elements 204. At step 510, data indicative of the performance
characteristics of the microactuator 200 is provided to the user
interface 414, and specifically to the display 416 for output to a
user. At step 512, the operation ends.
[0038] In this regard, micro-actuators, such as microactuator 200,
are formed by depositing and/or forming one or more thin layers of
PZT film onto a layer of substrate material. The substrate material
is shaped to provide the structural support for the microactuator
200, while the PZT layers provide the force to actuate the system,
in this case fine positioning of the head 206. In this regard, the
resonant characteristics of the microactuator 200 will change if
there is any damage to the microactuator 200. As such, the
resultant response voltage generated by the piezoelectric element
204, in response to the reference signal passing through the
piezoelectric elements 202, may be utilized to assess whether the
microactuator 200 is operative and further whether the
microactuator 200 is damaged.
[0039] In this regard, test device 400, and specifically the signal
analyzer 410, uses predetermined data regarding the response signal
to generate the data indicative of the assessment results for the
display 416. For instance, it will be appreciated that a response
signal from the piezoelectric element 204 is predeterminable for a
given reference signal provided to the piezoelectric element 202 in
an operable microactuator 200. Thus, a predetermined response
signal for the piezoelectric element 204 may be employed to assess
the performance of the microactuator 200. For instance to determine
operational characteristics of the microactuator 200, a comparison
of the actual response signal from the element 204 to the known, or
predetermined, response signal from the element 204 may be
utilized. In a preferred example, a comparison of the gain in
decibels, which is a logarithmic measure of a voltage ratio to the
frequency of the input electrical signal, may be utilized. Such
comparisons are conventionally provided in the form of a bode plot
consisting of the log of the gain as a function of the log of the
input frequency as illustrated in FIG. 6.
[0040] In this regard, a comparison of a response signal (R1) from
the piezoelectric element 204 to a known expected response signal
(R2) for the piezoelectric element 204, provides a fast efficient
method of determining operational characteristics of the
microactuator 200. For instance, the receipt of the response signal
(R1) provides a preliminary assessment of the performance of
microactuator 200, e.g. an indication that the circuitry of the
microactuator 200 is operational. In other words, if the response
signal (R1) is not received, then it may be determined that one or
more connections or circuitry components of the microactuator 200
are faulty. In the event that the preliminary assessment indicates
that the circuitry and interconnections appear operational, the
process may continue to further assess the performance of the
microactuator 200 by the comparison of the response signal (R1)
with the known expected response signal (R2). Thus, in the case
illustrated on FIG. 6, where the response signal (R1) and the
expected response signal (R2) do not correspond, it is known that
the microactuator 200 is damaged as the resonant characteristics of
the microactuator 200 have changed. In other words, if the
microactuator 200 is not damaged, the response signal from the
piezoelectric element 204 will correspond at least substantially to
the predetermined or known response signal expected from an
operational microactuator 200 as illustrated in FIG. 7, where no or
substantially no distinction exists between the response signal
(R1) and predetermined response signal (R2). In this regard, a
magnitude range or frequency shift range may also be utilized
wherein if the response signal (R1) is within the range, it may be
determined that the microactuator 200 is not damaged and if the
response signal (R1) is outside of the range the microactuator 200
is damaged.
[0041] In another approach, a plurality of response signal
measurements may be made in corresponding relation to the setting
of the reference signal at a corresponding plurality of different
voltages e.g., high to low or low to high voltages. Such sweeping
of the reference signal yields a plurality of response signal
measurements from which performance characteristics, e.g. damage
and circuitry operation may be identified through analysis of the
expected responses signals e.g. (R2) and the received responses
signals, e.g. (R1).
[0042] Alternatively, measurement of the frequency response of the
piezoelectric element 204 may be made for only a small range or
window of the expected response signal (R2) where the microactuator
is sensitive to the reference signal. For instance, with reference
to FIG. 6, measurement of the frequency response signal (R1) may be
taken for the window including the first peak in (R2) between
frequencies f.sub.5 and f.sub.8. Advantageously, measurement over
smaller ranges of the expected response signal (R2) shortens
testing time and permits selection of ranges where the
piezoelectric element 204 is especially sensitive to the reference
signal. As with the above example a frequency shift range or
magnitude range may be defined for the response signal (R1) wherein
if the response signal (R1) is within the range, it may be
determined that the microactuator 200 is not damaged and if the
response signal (R1) is outside of the range the microactuator 200
is damaged.
[0043] The foregoing description of the present invention has been
presented for purposes of illustration and description.
Furthermore, the description is not intended to limit the invention
to the form disclosed herein. Consequently, variations and
modifications commensurate with the above teachings, and skill and
knowledge of the relevant art, are within the scope of the present
invention. The embodiments described hereinabove are further
intended to explain best modes known of practicing the invention
and to enable others skilled in the art to utilize the invention in
such, or other embodiments and with various modifications required
by the particular application(s) or use(s) of the present
invention. It is intended that the appended claims be construed to
include alternative embodiments to the extent permitted by the
prior art.
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