U.S. patent application number 09/870265 was filed with the patent office on 2002-12-05 for pulsed signal transition delay adjusting circuit.
This patent application is currently assigned to Samsung Electronics Co., Ltd. Invention is credited to Chung, Dae-Hyun, Kim, Kyu Hyoun.
Application Number | 20020180505 09/870265 |
Document ID | / |
Family ID | 25355046 |
Filed Date | 2002-12-05 |
United States Patent
Application |
20020180505 |
Kind Code |
A1 |
Kim, Kyu Hyoun ; et
al. |
December 5, 2002 |
Pulsed signal transition delay adjusting circuit
Abstract
A delay circuit has an input node receives an input pulsed
signal. A buffer transfers the input signal to a floating node. A
detector outputs to an output node an output voltage that has a
first level, if the voltage at the floating node is below a
threshold, and a second level otherwise. Two similar branches are
used, one for controlling delays in the rising transitions and one
for controlling delays in the falling transitions. For each branch,
a reference terminal carries a reference voltage for biasing the
floating node. A capacitor and a switch are coupled between the
reference terminal and the floating node. The switch opens and
closes responsive to the output voltage. When it opens, it shorts
out the capacitor. An optional phase detector and delay code
generator may be in a feedback arrangement, for continuously
adjusting the reference voltages.
Inventors: |
Kim, Kyu Hyoun; (Kyunggi-do,
KR) ; Chung, Dae-Hyun; (Yongin-City, KR) |
Correspondence
Address: |
MARGER JOHNSON & McCOLLOM
1030 SW Morrison St.
Portland
OR
97205
US
|
Assignee: |
Samsung Electronics Co.,
Ltd
Suwon-City
KR
|
Family ID: |
25355046 |
Appl. No.: |
09/870265 |
Filed: |
May 29, 2001 |
Current U.S.
Class: |
327/263 |
Current CPC
Class: |
H03H 11/265 20130101;
H03K 2005/00071 20130101; H03K 5/08 20130101; H03K 5/13
20130101 |
Class at
Publication: |
327/263 |
International
Class: |
H03H 011/26 |
Claims
The invention claimed is:
1. An integrated circuit comprising: an input node for receiving an
input signal; a floating node; a buffer coupled between the input
node and the floating node; a detector for outputting an output
voltage of a first level if a voltage at the floating node is below
a threshold, and of a second level otherwise; a first reference
terminal carrying a first reference voltage; a first capacitor
coupled between the floating node and the first reference terminal;
and a first switch coupled between the floating node and the first
capacitor, the first switch opening and closing responsive to the
first and second levels of the output voltage.
2. The integrated circuit of claim 1, wherein the first capacitor
is a field effect transistor.
3. The integrated circuit of claim 1, wherein the buffer is an
inverter.
4. The integrated circuit of claim 1, wherein the detector is an
inverter.
5. The integrated circuit of claim 1, wherein the first switch is a
complementary transfer gate of two field effect transistors, which
are controlled by the output voltage.
6. The integrated circuit of claim 1, wherein the first reference
voltage is a ground voltage.
7. The integrated circuit of claim 1, wherein the first reference
voltage is a supply voltage.
8. The integrated circuit of claim 1, further comprising: a first
precharge switch controlled by the output voltage for selectively
shorting a node between the first switch and the first
capacitor.
9. The integrated circuit of claim 1, further comprising: a second
reference terminal carrying a second reference voltage; and a
second capacitor coupled between the floating node and the second
reference terminal.
10. The integrated circuit of claim 9, further comprising: a second
switch coupled between the floating node and the second capacitor,
the second switch opening and closing responsive to the first and
second levels of the output voltage.
11. The integrated circuit of claim 10, wherein the second switch
is a complementary transfer gate of two field effect transistors,
which are controlled by the output voltage.
12. The integrated circuit of claim 10, further comprising: a
second precharge switch controlled by the output voltage for
selectively shorting a node between the second switch and the
second capacitor.
13. A pulse transition delay circuit for adjusting a rising delay
and a falling delay of an input pulse signal, the circuit
comprising: an input node for receiving the input signal; a
floating node; a buffer coupled between the input node and the
floating node; a detector for outputting an output voltage of a
first level if a voltage at the floating node is below a threshold,
and of a second level otherwise; a first rising signal terminal for
receiving a first rising delay control signal regarding a rising
delay of the output voltage with respect to a corresponding rising
transition of the input voltage; a first rising capacitor coupled
between the floating node and the first rising signal terminal; a
rising switch coupled between the floating node and the first
rising capacitor, the rising switch opening and closing responsive
to the first and second levels of the output voltage; a first
falling signal terminal for receiving a first falling delay control
signal regarding a falling delay of the output voltage with respect
to a corresponding falling transition of the input voltage; a first
falling capacitor coupled between the floating node and the first
falling signal terminal; a falling switch coupled between the
floating node and the first falling capacitor, the falling switch
opening and closing responsive to the first and second levels of
the output voltage.
14. The circuit of claim 13, further comprising: a second rising
signal terminal for receiving a second rising delay control signal
regarding the rising delay; and a second rising capacitor coupled
between the second rising signal terminal and the rising
switch.
15. The circuit of claim 13, further comprising: a second falling
signal terminal for receiving a second falling delay control signal
regarding the falling delay; and a second falling capacitor coupled
between the second falling signal terminal and the falling
switch.
16. The circuit of claim 13, further comprising: a phase detector
for sensing a phase delay between rising transitions of the output
signal and corresponding transitions of the input signal to
generate a rising sense signal, and for sensing a phase delay
between falling transitions of the output signal and corresponding
transitions of the input signal to generate a falling sense signal;
and a delay code generator for generating the rising delay control
signal responsive to the rising sense signal, and the falling delay
control signal responsive to the falling sense signal.
17. A circuit for receiving an input signal and generating an
output signal having predetermined delay characteristics with
respect to the input signal, comprising: a phase detector for
sensing a phase delay between rising transitions of the output
signal and corresponding transitions of the input signal to
generate a rising sense signal, and for sensing a phase delay
between falling transitions of the output signal and corresponding
transitions of the input signal to generate a falling sense signal;
a delay code generator for generating a rising delay control signal
responsive to the rising sense signal, and a falling delay control
signal responsive to the falling sense signal; and a variable delay
circuit for receiving the input signal and for generating the
output signal responsive to the rising delay control signal and the
falling delay control signal.
18. The circuit of claim 17, further comprising: a second delay
circuit.
19. The circuit of claim 18, wherein the second delay circuit
delays the input signal before the input signal reaches the phase
detector.
20. The circuit of claim 17, wherein the variable delay circuit
includes: an input node for receiving the input signal; a floating
node; a buffer coupled between the input node and the floating
node; a detector for outputting an output voltage of a first level
if a voltage at the floating node is below a threshold, and of a
second level otherwise; a first rising signal terminal for
receiving the rising delay control signal; a first rising capacitor
coupled between the floating node and the first rising signal
terminal; a rising switch coupled between the floating node and the
first rising capacitor, the rising switch opening and closing
responsive to the first and second levels of the output voltage; a
first falling signal terminal for receiving the falling delay
control signal; a first falling capacitor coupled between the
floating node and the first falling signal terminal; a falling
switch coupled between the floating node and the first falling
capacitor, the falling switch opening and closing responsive to the
first and second levels of the output voltage.
Description
BACKGROUND OF THE INVENTION
[0001] 1. Field of the Invention
[0002] The present invention is related to the field of integrated
circuits, and more specifically to delay circuits for adjusting
delays of pulsed signals.
[0003] 2. Description of the Related Art
[0004] In integrated circuits there is a need to have a delay
circuit to provide signal delays for various functions. Delay
circuits can be found in internal clock generation for clock
signals in dynamic random access memories (DRAMs), and also in
power supplies of internal semiconductor chips for controlling the
timing of pump voltages.
[0005] Referring now to FIG. 1, an example of such a delay circuit
100 is described. Circuit 100 is initially taught in the U.S. Pat.
No. 5,920,221.
[0006] The voltage is input at a node 10, which is connected to an
RC network 11. RC network 11 includes a resistor 12, and two
directional, oppositely coupled capacitors 18, 19. The signal then
passes through a signal detector 14 and an inverter circuit 16. The
voltage output on a node 17 is fed back to capacitors 18, 19 of the
RC network 11.
[0007] As the input signal rises and falls, the output signal rises
and falls correspondingly, but with a certain delay. The delay in
the rise is determined by the values of resistor 12 and capacitor
19. The delay in the fall is determined by the values of resistor
12 and capacitor 18.
[0008] A limitation of circuit 100 is that the delays in the rise
and in the fall cannot be adjusted. That is because the elements
that control the amount of rise and fall are part of the
circuit.
[0009] Another limitation is that there is always an unwanted delay
due to a minimum capacitance. This requires further design to
avoid.
[0010] A problem with circuit 100 is that the feedback scheme
permits noise to be coupled. This affects the waveforms, which in
turn affects the performance of the overall device.
BRIEF SUMMARY OF THE INVENTION
[0011] The present invention overcomes these problems and
limitations of the prior art.
[0012] Generally, the present invention provides a delay circuit
that may be implemented as an integrated circuit. An input node
receives an input signal, and a buffer transfers the input signal
to a floating node. A detector outputs to an output node an output
voltage that has a first level, if the voltage at the floating node
is below a threshold, and a second level otherwise. The output
voltage is thus a pulsed waveform, which follows the input
signal.
[0013] The circuit of the invention includes a reference terminal
that carries a reference voltage. A capacitor and a switch are
coupled between the reference terminal and the floating node. The
switch opens and closes responsive to the output voltage. When it
opens, it shorts out the capacitor.
[0014] The invention offers the advantage that it permits adjusting
the delay of the rising transitions and the falling transitions.
The adjustment is by changing either the value of the reference
voltage, or the capacitance, or both. Moreover, the adjustments are
independent of each other.
[0015] The invention offers the additional advantage that, by
shorting out the capacitor, it eliminates the unwanted delay due to
a minimum capacitance. In addition, while the capacitor is shorted
out, the coupling noise is eliminated. This makes design easier,
along with improving performance.
[0016] In an optional embodiment, the circuit includes a phase
detector and a delay code generator. These are in a feedback
arrangement for continuously adjusting the reference voltages.
[0017] These and other embodiments and advantages of the invention
will become more readily apparent from the following Detailed
Description, which proceeds with reference to the drawings, in
which:
BRIEF DESCRIPTION OF THE DRAWINGS
[0018] FIG. 1 is a diagram of the delay circuit in the prior
art.
[0019] FIG. 2 is a block diagram of the circuit according to a
general embodiment of the invention.
[0020] FIG. 3A is an electrical diagram of a particular embodiment
of the block diagram of FIG. 2.
[0021] FIG. 3B is a timing diagram of key waveforms of the circuit
of FIG. 3A.
[0022] FIG. 3C is a table showing particular values of voltages
during stages of the timing diagram of FIG. 3B.
[0023] FIG. 4A is an electrical diagram of another particular
embodiment of the block diagram of FIG. 2.
[0024] FIG. 4B is a timing diagram of key waveforms of the circuit
of FIG. 4A.
[0025] FIG. 5 is a block diagram of the circuit according to
another general embodiment of the invention.
[0026] FIG. 6A is an electrical diagram of a particular embodiment
of the block diagram of FIG. 5.
[0027] FIG. 6B is a timing diagram of key waveforms of the circuit
of FIG. 6A.
[0028] FIG. 7 is an electrical diagram of a circuit according to
another particular embodiment of the block diagram of FIG. 5.
[0029] FIG. 8 is an electrical diagram of a circuit according to
one more particular embodiment of the block diagram of FIG. 5.
[0030] FIG. 9 is a diagram of a circuit according to yet another
embodiment of the invention, that includes feedback.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT(S)
[0031] As has been mentioned, the present invention provides delay
circuits. The invention is now described in more detail.
[0032] Referring now to FIG. 2, a circuit 200 is made according to
a general embodiment of the invention. Circuit 200 includes an
input node 204 for receiving input signal VIN. Circuit 200 also
includes a floating node 206, and optionally an output node 208, on
which the output voltage VO is generated.
[0033] A buffer 210 is coupled between input node 204 and floating
node 206. Buffer 210 is preferably made by inverter.
[0034] Circuit 200 additionally includes a detector 220. Detector
220 outputs the output voltage VO on output node 208. Output
voltage VO has a first level, such as a high level, if the voltage
VFN at floating node 206 is below a threshold voltage VLT. Output
voltage VO has a second level, such as a low level, otherwise. The
high level may be a voltage supply level such as VDD, while the low
level may be a ground level, such as 0V.
[0035] The output signal VO will therefore be a pulsed signal. This
renders the circuit advantageous if the input signal VIN also has a
pulsed waveform. Pulses are a succession of rising transitions and
falling transitions. The timing of the rising and falling
transitions of the output signal VO, relative to those of VIN, is
controlled as described below.
[0036] Circuit 200 moreover includes a reference terminal 230.
Reference terminal 230 carries a first reference voltage VR1. The
first reference voltage may be any voltage according to the
invention. Particularly advantageous values of VR1 are described
below, along with ways of applying the first reference voltage to
first reference terminal 230.
[0037] Circuit 200 additionally includes a capacitor 240, which is
also known as first capacitor 240. Capacitor 240 is coupled between
floating node 206 and first reference terminal 230. Capacitor 240
is made in any way known in the art. Many such ways are known for
integrated circuits.
[0038] Circuit 200 further includes a switch 250, which is also
known as first switch 250. Switch 250 is coupled between floating
node 206 and first capacitor 240. Switch 250 opens and closes
responsive to the first and second levels of output voltage VO.
When it is open it shorts out capacitor 240, and also VR1, from
floating node 206.
[0039] Referring now to FIG. 3A, a circuit 300 illustrates one of
the preferred embodiments of the block diagram of FIG. 2. Circuit
300 has common elements with circuit 200, whose description will
therefore not be repeated.
[0040] Inverter 310 implements buffer 210 of FIG. 2. Inverter 320
implements detector 220 of FIG. 2.
[0041] First reference terminal 330, corresponding to first
reference terminal 230, is coupled to ground. In other words, first
reference voltage VR1 will equal 0V in this embodiment.
[0042] Capacitor 340 is a field effect transistor for implementing
first capacitor 240.
[0043] Complementary transfer gate 350 implements switch 250 of
FIG. 2. Gate 350 is implemented by two field effect transistors
352, 353. These are controlled by the output voltage VO, through a
pair of successive inverters 356, 358.
[0044] Referring now to FIG. 3B and FIG. 3C, the behavior of
circuit 300 is described. In FIG. 3B, a succession of waveforms
illustrates a generation of the output voltage VO from the input
voltage VIN. These take values from the table of FIG. 3C.
[0045] As can be discerned, input voltage VIN is seen as a pulse.
Output voltage VO is a corresponding pulse, as could be expected
from following two inverters 310, 320. Voltage VFN on floating node
206 changes suddenly, while the capacitor is shorted out, and
slowly only when switch 350 is ON, or closed (stages 2-5 in FIG.
3C).
[0046] As a result, circuit 300 generates an output voltage VO,
where only the falling transition is delayed, but not the rising
transition. The amount of the delay in this embodiment is
determined by the capacitance of capacitor 340.
[0047] Referring now to FIG. 4A, another circuit 400 is described,
that implements the block diagram of FIG. 2. Again, many components
have descriptions similar to those of FIG. 2 and FIG. 3A, and
therefore will not be discussed again.
[0048] Reference terminal 430, corresponding to first reference
terminal 230, carries a second reference voltage VR2. Terminal 430
is coupled to a supply voltage, so VR2=VDD.
[0049] Capacitor 440 is a field effect transistor for implementing
first capacitor 240.
[0050] Complementary transfer gate 450 implements switch 250 of
FIG. 2. Gate 450 is implemented by two field effect transistors
452, 453. These are controlled by the output voltage VO, through
successive inverters 356, 358. It will be observed that gate 450 is
wired oppositely to gate 350.
[0051] Referring now to FIG. 4B, waveforms are given for describing
the behavior of circuit 400. Compared especially to FIG. 3B, it
will be observed that voltage VFN in FIG. 4B has abrupt transitions
only when it is below VLT (owing to the value of VR2 and the wiring
of gate 450).
[0052] Circuit 400 therefore generates an output voltage VO, where
only the rising transition is delayed, but not the falling
transition. The amount of the delay is determined by the
capacitance of capacitor 440. The delay is different in FIG. 4B
than in FIG. 3B, and that is because capacitor 440 has a different
value than capacitor 430.
[0053] Referring now to FIG. 5, a circuit 500 is used to describe
another general embodiment of the invention. It will be recognized
that circuit 500 has many components in common with circuit 200 of
FIG. 2.
[0054] In transitioning from circuit 200 to circuit 500, items
known as "first" are included as "first", and included again as
"second". But then again, words such as "first" and "second" are
used in this document for mere labeling.
[0055] More particularly, circuit 500 has a second reference
terminal 570, a second capacitor 580, and a second switch 590. The
discussion of these items is identical to the discussion
respectively of first reference terminal 230 and reference terminal
430, first capacitor 240 and capacitor 440, and first switch 250
and switch 350.
[0056] One of the main ideas in the circuit of FIG. 5 is to have
two branches for controlling VFN, instead of just the one, that
circuit 200 uses. Proper connections permit these two branches to
operate independently of each other.
[0057] The first branch includes first reference terminal 230,
first capacitor 240, and first switch 250. The first branch may be
used for controlling the delay in the falling transition of the
output voltage VO, as was shown in FIG. 3B, by circuit 300 of FIG.
3A.
[0058] The second branch includes second reference terminal 570,
second capacitor 580, and second switch 590. The second branch may
be used for controlling the delay in the rising transition of the
output voltage VO, as was shown in FIG. 4B, by circuit 400 of FIG.
4A.
[0059] Referring now to FIG. 6A, a circuit 600 is used to describe
an embodiment of block diagram 500, according to the main idea
discussed above. Circuit 600 has components similar to those of
circuits 300, 400.
[0060] Terminal 430, capacitor 440, complementary transfer gate 450
respectively implement terminal 570, capacitor 580, and switch 590.
In addition, circuit 600 includes first and second precharge
switches 648, 688. These are controlled by the output voltage VO,
in this embodiment, via inverter 356. Switch 648 is for selectively
shorting a node 647 between first capacitor 340 and first switch
350 to a ground in this embodiment. Switch 688 is for selectively
shorting a node 687 between second capacitor 680 and second switch
690, to a supply voltage in this embodiment.
[0061] Referring now to FIG. 6B, waveforms are given to describe
the behavior of the output voltage VO with respect to the input
voltage VIN. It will be recognized that the voltage VFN on floating
node 206 is a composite of corresponding behaviors described in
FIG. 3B (for voltage VFN below threshold voltage VLT), and in FIG.
4B (for voltage VFN above threshold voltage VLT). Indeed, only one
of switches 350, 450 is closed at a time, thereby allowing only one
of the respective capacitors 340, 440 to act at a time.
Accordingly, output voltage VO is a composite of the output
voltages of FIG. 4B (having the shorter delay in the rising
transition), and of FIG. 3B (having the longer delay in the falling
transition).
[0062] Referring now to FIG. 7, a circuit 700 is made according to
yet another particular embodiment of FIG. 5. Circuit 700 has many
components identical to those of FIG. 6, whose description will
therefore not be repeated.
[0063] Circuit 700 has a reference terminal 430 (corresponding to
reference terminal 570), which is also called a rising signal
terminal. A capacitor 440 (corresponding to capacitor 580) is also
called a rising capacitor. In addition, circuit 700 has a reference
terminal 330 (corresponding to reference terminal 230), which is
also called a falling signal terminal. A capacitor 340
(corresponding to capacitor 240) is also called a falling
capacitor.
[0064] Importantly, in circuit 700, reference terminals 330, 430
are not necessarily coupled to fixed voltages. In addition,
reference voltages VR2, VR1 may be applied from a rising delay
control signal RDCX, and a falling delay control signal FDCX.
Signals RDCX, FDCX may be analog, thereby varying the ultimate bias
on floating node 206.
[0065] Accordingly, reference voltages VR2, VR1 may be changed
dynamically, while circuit 700 is operating. This allows changing
dynamically the rising and falling delays, respectively.
[0066] Referring now to FIG. 8, a circuit 800 is made according to
yet another particular embodiment of FIG. 5. Circuit 800 has many
components identical to those of FIG. 6, whose description will
therefore not be repeated.
[0067] Circuit 800 has reference terminals 830, 832, 834, 836
(corresponding to reference terminal 230), which are also called
falling signal terminals. Circuit 800 also includes capacitors 840,
842, 844, 846, also called falling capacitors, coupled between
respective falling signal terminals 830, 832, 834, 836 and node
647. It will be appreciated that, if the reference terminals 830,
832, 834, 836 are at the same voltage level, the capacitances of
falling capacitors 840, 842, 844, 846 are added together.
[0068] Circuit 800 also has reference terminals 870, 872, 874, 876
(corresponding to reference terminal 570), which are also called
rising signal terminals. Circuit 800 also includes capacitors 880,
882, 884, 886, also called rising capacitors, coupled between
respective reference terminals 870, 872, 874, 876 and node 687. It
will be appreciated that, if the reference terminals 870, 872, 874,
876 are at the same voltage, the capacitances of rising capacitors
880, 882, 884, 886 are added together.
[0069] In general, for circuit 800, the falling delay control
signal FDC<0:3> and the rising delay control signal
RDC<0:3> are digital. Each has bits that can attain a high or
a low value.
[0070] In circuit 800, falling delay control signal FDC<0:3>
has individual respective bits FDC<0>, FDC<1>,
FDC<2>, FDC<3>, which are applied to falling signal
terminals 830, 832, 834, 836 respectively. Rising delay control
signal RDC<0:3> has individual respective bits RDC<0>,
RDC<1>, RDC<2>, RDC<3>, which are applied to
rising signal terminals 870, 872, 874, 876 respectively.
[0071] It is preferred that the rising and falling capacitors have
staggered values. This way the falling delay control signal
FDC<0:3> and the rising delay control signal RDC<0:3>
can select the required amount of delay. A different number of bits
may be implemented, depending on the desired precision.
[0072] Referring now to FIG. 9, a circuit according to another
embodiment of the invention is described. FIG. 9 shows a portion
900 of an integrated circuit. A circuit 910 according to an
embodiment of the invention is provided for synchronizing input
data DIN0, DIN1, DIN2, . . . , DINi according to a strobe signal
DQS with the aid of a reference voltage VREFI. It will be
appreciated that circuit 910 of the invention uses feedback.
[0073] Data DIN0, DIN1, DIN2, . . . , DINi are first passed through
respective detectors 920, 921, 922, . . . , 927, and then through
respective delays 930, 931, 932, . . . , 937, before being inputted
into respective latches 940, 941, 942, . . . , 947.
[0074] Latches 940, 941, 942, . . . , 947 are controlled by a
signal VO output by circuit 910 of the invention. Strobe signal DQS
preferably, but not necessarily passes through a detector 929 to
provide the input signal VIN for circuit 910 of the invention.
[0075] Circuit 910 of the invention includes a variable delay
circuit 950. This may be implemented as described above with
reference to the block diagram of FIG. 5. It may be suited to
receive a rising delay control signal RDCG at terminal 570, and a
falling delay control signal FDCG at terminal 230. As described
above, rising delay control signal RDCG and falling delay control
signal FDCG may be analog or digital, with one or more bits.
[0076] Circuit 910 additionally includes a phase detector 960.
Detector 960 senses a phase delay between rising transitions of the
output signal VO and corresponding transitions of the input signal
VIN to generate a rising sense signal RS. Detector 960 senses a
phase delay between falling transitions of the output signal VO and
corresponding transitions of the input signal VIN to generate a
falling sense signal FS.
[0077] Circuit 910 moreover includes a delay code generator 970.
Generator 970 generates the rising delay control signal RDCG
responsive to the rising sense signal RS, and the falling delay
control signal FDCS responsive to the falling sense signal FS.
[0078] Circuit 910 may optionally include a second delay circuit
974. Delay circuit 974 may delay the input signal VIN before it
reaches phase detector 960. Its value is determined in conjunction
with values of delays, 930, 931, 932, . . . , 937.
[0079] A person skilled in the art will be able to practice the
present invention in view of the description present in this
document, which is to be taken as a whole. Numerous details have
been set forth in order to provide a more thorough understanding of
the invention. In other instances, well-known features have not
been described in detail in order not to obscure unnecessarily the
invention.
[0080] While the invention has been disclosed in its preferred
form, the specific embodiments as disclosed and illustrated herein
are not to be considered in a limiting sense. Indeed, it should be
readily apparent to those skilled in the art in view of the present
description that the invention may be modified in numerous ways.
The inventor regards the subject matter of the invention to include
all combinations and subcombinations of the various elements,
features, functions and/or properties disclosed herein.
[0081] The following claims define certain combinations and
subcombinations, which are regarded as novel and non-obvious.
Additional claims for other combinations and subcombinations of
features, functions, elements and/or properties may be presented in
this or a related document.
* * * * *