U.S. patent application number 09/850140 was filed with the patent office on 2001-09-20 for charged-particle beam irradiation method and system.
Invention is credited to Akiyama, Hiroshi, Hiramoto, Kazuo, Matsuda, Koji.
Application Number | 20010022502 09/850140 |
Document ID | / |
Family ID | 13063089 |
Filed Date | 2001-09-20 |
United States Patent
Application |
20010022502 |
Kind Code |
A1 |
Akiyama, Hiroshi ; et
al. |
September 20, 2001 |
Charged-particle beam irradiation method and system
Abstract
A charged-particle beam irradiation method and system are
disclosed in which while a charged-particle beam ejected from an
accelerator is scanned by an electromagnet, each layer resulting
from the division of an affected part into a plurality of layers in
the direction of progression of the charged-particle beam is
irradiated with the charged-particle beam. The intensity of a
charged-particle beam for irradiation of a first layer is made
lower than the intensity of a charged-particle beam for irradiation
of a second layer existing at a position deeper than the first
layer in the beam progressing direction. A scanning speed in the
first layer is changed between a portion of the first layer
subjected to irradiation at the time of irradiation of the second
layer and a portion of the first layer subjected to no irradiation
at the time of irradiation of the second layer.
Inventors: |
Akiyama, Hiroshi;
(Hitachi-shi, JP) ; Hiramoto, Kazuo;
(Hitachiota-shi, JP) ; Matsuda, Koji;
(Hitachi-shi, JP) |
Correspondence
Address: |
ANTONELLI TERRY STOUT AND KRAUS
SUITE 1800
1300 NORTH SEVENTEENTH STREET
ARLINGTON
VA
22209
|
Family ID: |
13063089 |
Appl. No.: |
09/850140 |
Filed: |
May 8, 2001 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
|
09850140 |
May 8, 2001 |
|
|
|
09265557 |
Mar 9, 1999 |
|
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Current U.S.
Class: |
315/503 |
Current CPC
Class: |
A61N 5/1043 20130101;
A61N 5/1045 20130101; A61N 2005/1087 20130101; A61N 2005/1095
20130101; G21K 5/04 20130101 |
Class at
Publication: |
315/503 |
International
Class: |
H05H 015/00 |
Foreign Application Data
Date |
Code |
Application Number |
Mar 10, 1998 |
JP |
10-057695 |
Claims
1. A charged-particle beam irradiation method in which while a
charged-particle beam ejected from an accelerator is scanned by an
electromagnet, each layer resulting from the division of an
affected part into a plurality of layers in the direction of
progression of said charged-particle beam is irradiated with the
charged-particle beam, wherein the intensity of a charged-particle
beam for irradiation of a first layer is made lower than the
intensity of a charged-particle beam for irradiation of a second
layer existing at a position deeper than said first layer in the
beam progressing direction, and a scanning speed in said first
layer is changed between a portion of said first layer subjected to
irradiation at the time of irradiation of said second layer and a
portion of said first layer subjected to no irradiation at the time
of irradiation of said second layer.
2. A charged-particle beam irradiation method in which while a
charged-particle beam ejected from an accelerator is scanned by an
electromagnet, each layer resulting from the division of an
affected part into a plurality of layers in the direction of
progression of said charged-particle beam is irradiated with the
charged-particle beam, wherein the intensity of said
charged-particle beam for irradiation of each layer is made lower
as the position of that layer becomes shallower in the beam
progressing direction, and a scanning speed in a shallower layer is
changed between a portion of said shallower layer subjected to
irradiation at a flat portion of a charged-particle beam
characteristic at the time of irradiation of a deeper layer and a
portion of said shallower layer subjected to no irradiation at the
time of irradiation of said deeper layer.
3. A charged-particle beam irradiation method according to claim 1
or 2, wherein said accelerator includes a synchrotron for ejecting
a charged-particle beam through the application of a high-frequency
electric field thereto, and the intensity of said charged-particle
beam is controlled by controlling said high-frequency electric
field.
4. A charged-particle beam irradiation method according to claim 3,
wherein said high-frequency electric field is generated from an
electrode applied with a high-frequency electric power, and said
high-frequency electric field is controlled by controlling the
power value of said high-frequency electric power.
5. A charged-particle beam irradiation method according to claim 1
or 2, wherein the intensity of said charged-particle beam is
controlled by controlling the amount of ions injected into said
accelerator.
6. A charged-particle beam irradiation method according to claim 1
or 2, wherein the scanning of said charged-particle beam is
performed on the basis of the dose value of said charged-particle
beam.
7. A charged-particle beam irradiation method according to claim 1
or 2, wherein a layer to be irradiated with said charged-particle
beam is changed by changing the energy of said charged-particle
beam, and said change in energy is made by a degrader disposed on
an orbit of said charged-particle beam.
8. A charged-particle beam irradiation system in which while a
charged-particle beam ejected from an accelerator is scanned by an
electromagnet, each layer resulting from the division of an
affected part into a plurality of layers in the direction of
progression of said charged-particle beam is irradiated with the
charged-particle beam, the system comprising: intensity control
means for making the intensity of a charged-particle beam for
irradiation of a first layer lower than the intensity of a
charged-particle beam for irradiation of a second layer existing at
a position deeper than said first layer in the beam progressing
direction; and scanning speed changing means for changing a
scanning speed in said first layer between a portion of said first
layer subjected at the time of irradiation of said-second layer and
a portion of said first layer subjected to no irradiation at the
time of irradiation of said second layer.
9. A charged-particle beam irradiation system in which while a
charged-particle beam ejected from an accelerator is scanned by an
electromagnet, each layer resulting from the division of an
affected part into a plurality of layers in the direction of
progression of said charged-particle beam is irradiated with the
charged-particle beam, the system comprising: intensity control
means for making the intensity of said charged-particle beam for
irradiation of each layer lower as the position of that layer
becomes shallower in the beam progressing direction; and scanning
speed changing means for changing a scanning speed in a shallower
layer between a portion of said shallower layer subjected to
irradiation at a flat portion of a charged-particle beam
characteristic at the time of irradiation of a deeper layer and a
portion of said shallower layer subjected to no irradiation at the
time of irradiation of said deeper layer.
10. A charged-particle beam irradiation system according to claim 8
or 9, wherein said accelerator includes a synchrotron for ejecting
a charged-particle beam through the application of a high-frequency
electric field thereto, and there is provided control means for
controlling said high-frequency electric field to control the
intensity of said charged-particle beam.
11. A charged-particle beam irradiation system according to claim
10, wherein said high-frequency electric field is generated from an
electrode applied with a high-frequency electric power, and there
is provided control means for controlling the power value of said
high-frequency electric power to control said high-frequency
electric field.
12. A charged-particle beam irradiation system according to claim 8
or 9, wherein there is provided control means for controlling the
amount of ions injected into said accelerator to control the
intensity of said charged-particle beam.
13. A charged-particle beam irradiation system according to claim 8
or 9, wherein there is provided control means for performing the
scanning of said charged-particle beam on the basis of the dose
value of said charged-particle beam.
14. A charged-particle beam irradiation system according to claim 8
or 9, wherein a layer to be irradiated with said charged-particle
beam is changed by changing the energy of said charged-particle
beam, and there is provided a degrader disposed on an orbit of said
charged-particle beam for making said change in energy.
Description
BACKGROUND OF THE INVENTION
[0001] The present invention relates to a charged-particle beam
irradiation method and system for performing a medical treatment
such as a cancer treatment through irradiation with a
charged-particle beam, and more particularly to a charged-particle
beam irradiation method and system in which an affected part can be
irradiated with a charged-particle beam in conformity of the shape
of the affected part.
[0002] In the case where a cancer treatment is performed by use of
a charged-particle beam such as a proton beam with a high energy
generated by an accelerator or the like, it is required that an
area having a diameter of about 20 cm should be irradiated with a
proton beam having an energy of about 230 MeV at the highest. The
conventional method for realizing this has been disclosed by W. T.
Chu et al, "Instrumentation for treatment of cancer using proton
and light-ion beams", Review of Science Instrument, Vol. 64, No. 8
(August 1993), pp. 2092-2093. In the disclosed method, an affected
part is divided into a plurality of layers in the direction of
depth in a body and is scanned layer by layer through irradiation
with a charged-particle beam in conformity to the shape of each
layer.
[0003] FIG. 9 shows the construction of a charged-particle beam
irradiation system disclosed by the Chu et al's article. Referring
to FIG. 9, a charged-particle beam 90 ejected from an accelerator
is adjusted in energy by a degrader 17 so that the irradiation of a
plurality of layers 210 to 212 in an affected part 202 of a body
201 with the adjusted beam is made in a sequence from a deeper
layer to a shallower layer. The beam is scanned by use of first and
second scanning electromagnets 31a and 31b which are disposed in
the irradiation system so that the directions of deflection are
orthogonal or vertical and horizontal in the plane of each
layer.
[0004] The Chu et al's article has disclosed charged-particle
scanning methods including a wobbler scanning method in which a
beam is circle-wise scanned, a raster scanning method in which a
beam is zigzag-wise scanned, and a pixel scanning method in which a
beam is pixel-wise scanned. FIG. 10 shows a charged-particle beam
irradiation method based on the raster scanning method. As shown in
FIG. 10, a charged-particle beam 220 is zigzag-wise scanned in the
first layer 210 in conformity to the shape of the first layer 210.
A similar scanning is made in the n-th layer 212.
[0005] FIG. 11 shows a dose profile 230 (or a relationship between
depth and dose) in the case where the irradiation is made with a
charged-particle beam having a high energy and a dose profile 231
in the case where the irradiation is made with a charged-particle
beam having a high energy. As shown in FIG. 11, the dose profile of
the charged-particle beam has the value 240 or 241 of a dose peak
called Bragg peak. A beam penetration depth providing the Bragg
peak becomes larger as the energy is higher. It is also shown in
FIG. 11 that the irradiation with the charged-particle beam is made
with a small dose even at depth portions shallower than the Bragg
peak providing portion. Referring to FIG. 10, this shows that when
the irradiation with the charged-particle beam 220 is made for the
first layer 210, a region 222 of the n-th layer 212 is also
subjected to the irradiation with the same charged-particle beam
220. Accordingly, in the case where the irradiation with a
charged-particle beam 221 is made for the n-th layer 212, it is
required that the dose of a beam portion (indicated by dotted line)
for irradiation of the region 222 should be reduced. Though only
the first layer and the n-th layer are shown in FIG. 10 for
simplification of illustration, the actual irradiation of the n-th
layer amounts to the superimposed irradiation for the first to
(n-l)th layers. Therefore, when the irradiation is to be made for
the n-th layer, it is necessary that a dose for the beam portion
indicated by dotted line in the n-th layer should be equal to or
smaller than, for example, one tenth (at the largest ratio) as
compared with a dose for a beam portion indicated by solid
line.
[0006] For such requirements, the Chu et al's article has proposed
two irradiation methods as follows. In a first method, the scanning
speed of a charged-particle beam at the time of irradiation of each
layer is constant while the intensity of the charged-particle beam
is reduced when the region 222 is irradiated. In a second method,
the intensity of a charged-particle beam at the time of irradiation
of each layer is constant while the scanning speed of the
charged-particle beam is increased when the region 222 is
irradiated. With each of the first and second methods, it is
possible to reduce the radiation dose of the charged-particle beam
in the region 222.
[0007] In the first method, however, it is required that while one
layer is being irradiated with a beam, the intensity of the beam
should be changed greatly in accordance with an irradiation
position. Namely, there is a problem that a large change in
intensity of each charged-particle beam, for example, from 1 to
1/10 is needed in the period of 0.1 to 2 seconds when one layer is
irradiated, which complicates the control of the accelerator
ejecting the beam.
[0008] In the second method, it is required that the scanning speed
of a beam at the time of irradiation of the region 222 should be
increased to, for example, 10 times, which needs a large change in
magnetic field intensity of the scanning electromagnet with time.
Accordingly, there is a problem that a power supply voltage of the
scanning electromagnet becomes high, thereby increasing the cost of
a power supply for the scanning electromagnet.
SUMMARY OF THE INVENTION
[0009] An object of the present invention is to provide a
charged-particle beam irradiation method and system in which the
control of an accelerator ejecting a charged-particle beam is
simplified and the cost of a power supply for a scanning
electromagnet can be reduced.
[0010] A first invention for attaining the above object is
characterized in that in a charged-particle beam irradiation method
in which while a charged-particle beam ejected from an accelerator
is scanned by an electromagnet, each layer resulting from the
division of an affected part into a plurality of layers in the
direction of progression of the charged-particle beam is irradiated
with the charged-particle beam, wherein the intensity of a
charged-particle beam for irradiation of a first layer is made
lower than the intensity of a charged-particle beam for irradiation
of a second layer existing at a position deeper than the first
layer in the beam progressing direction, and a scanning speed in
the first layer is changed between a portion of the first layer
subjected to irradiation at the time of irradiation of the second
layer and a portion of the first layer subjected to no irradiation
at the time of irradiation of the second layer.
[0011] With the construction of the first invention in which the
intensity of the charged-particle beam for irradiation of the first
layer is made lower than the intensity of the charged-particle beam
for irradiation of the second layer, the scanning speed of the
charged-particle beam for irradiation of the first layer can be
lowered, thereby making it possible to lower a voltage to be
applied to the electromagnet. As a result, it is possible to reduce
the cost of a power supply for the electromagnet. Also, with the
construction in which the scanning speed is changed between the
portion of the first layer subjected to irradiation and the portion
of the first layer subjected to no irradiation, it is possible to
adjust the accumulative dose amount of a portion subjected to
superimposed irradiation. Further, since there is no need to make a
large change of the intensity of the charged-particle beam in a
short time, the control of the accelerator is simplified.
[0012] A second invention for attaining the above object is
characterized in that in a charged-particle beam irradiation method
in which while a charged-particle beam ejected from an accelerator
is scanned by an electromagnet, each layer resulting from the
division of an affected part into a plurality of layers in the
direction of progression of the charged-particle beam is irradiated
with the charged-particle beam, wherein the intensity of a
charged-particle beam for irradiation of each layer is made lower
as the position of that layer becomes shallower in the beam
progressing direction, and a scanning speed in a shallower layer is
changed between a portion of the shallower layer subjected to
irradiation at the time of irradiation of a deeper layer and a
portion of the shallower layer subjected to no irradiation at the
time of irradiation of the deeper layer.
[0013] With the construction in the second invention in which the
intensity of the charged-particle beam for irradiation of each
layer is made lower as the position of that layer becomes shallower
in the beam progressing direction, it is possible to lower a
voltage to be applied to the electromagnet. As a result, it is
possible to reduce the cost of a power supply for the
electromagnet. Also, with the construction in which the scanning
speed is changed between the portion of the shallower layer
subjected to irradiation and the portion of the shallower layer
subjected to no irradiation, it is possible to adjust the
accumulative dose amount of a portion subjected to superimposed
irradiation is possible. Further, since there is no need to make a
large change of the intensity of the charged-particle beam in a
short time, the control of the accelerator is simplified.
[0014] A third invention for attaining the above object has the
features of the first or second invention and is further
characterized in that the accelerator includes a synchrotron for
ejecting a charged-particle beam through the application of a
high-frequency electric field thereto, and the intensity of the
charged-particle beam is controlled by controlling the
high-frequency electric field.
[0015] With the construction in the third invention in which the
intensity of the charged-particle beam is controlled by controlling
the high-frequency electric field, it is possible to shorten a time
required for the change of the beam intensity, thereby shortening a
treatment time.
[0016] A fourth invention for attaining the above object has the
features of the third invention and is further characterized in
that the high-frequency electric field is generated from an
electrode applied with a high-frequency electric power, and the
high-frequency electric field is controlled by controlling the
power value of the high-frequency electric power.
[0017] With the construction in the fourth invention in which the
high-frequency electric field is controlled by controlling the
power value of the high-frequency electric power, the control of
the high-frequency electric field is simplified.
[0018] A fifth invention for attaining the above object has the
features of the first or second invention and is further
characterized in that the intensity of the charged-particle beam is
controlled by controlling the amount of ions injected into the
accelerator.
[0019] With the fifth invention, since the amount of ions injected
into the accelerator can be suppressed to the minimum required, it
is possible to reduce unnecessary beams in the accelerator, thereby
reducing the (radio) activation of the equipment.
[0020] A sixth invention for attaining the above object has the
features of the first or second invention and is further
characterized in that the scanning of the charged-particle beam is
performed on the basis of the dose value of the charged-particle
beam.
[0021] With the construction in the sixth invention in which the
charged-particle beam is scanned on the basis of the dose value
thereof, it is possible to control a dose in each layer accurately
even if the intensity of the charged-particle beam ejected from the
accelerator has some variations.
[0022] A seventh invention for attaining the above object has the
features of the first or second invention and is further
characterized in that a layer to be irradiated with the
charged-particle beam is changed by changing the energy of the
charged-particle beam, and the change in energy is made by a
degrader disposed on an orbit of the charged-particle beam.
[0023] With the construction in the seventh invention in which the
energy of the charged-particle beam is changed by the degrader, the
control of the accelerator is simplified.
[0024] An eighth invention for attaining the above object is
characterized in that in a charged-particle beam irradiation system
in which while a charged-particle beam ejected from-an accelerator
is scanned by electromagnet means, each layer resulting from the
division of an affected part into a plurality of layers in the
direction of progression of the charged-particle beam is irradiated
with the charged-particle beam, the system comprises intensity
control means for making the intensity of a charged-particle beam
for irradiation of a first layer lower than the intensity of a
charged-particle beam for irradiation of a second layer existing at
a position deeper than the first layer in the beam progressing
direction, and scanning speed changing means for changing a
scanning speed in the first layer between a portion of the first
layer subjected to irradiation at the time of irradiation of the
second layer and a portion of the first layer subjected to no
irradiation at the time of irradiation of the second layer.
[0025] With the eighth invention, there are obtained effects
similar to those in the first invention.
[0026] A ninth invention for attaining the above object is
characterized in that in a charged-particle beam irradiation system
in which while a charged-particle beam ejected from an accelerator
is scanned by electromagnet means, each layer resulting from the
division of an affected part into a plurality of layers in the
direction of progression of the charged-particle beam is irradiated
with the charged-particle beam, the system comprises intensity
control means for making the intensity of the charged-particle beam
for irradiation of each layer lower as the-position of that layer
becomes shallower in the beam progressing direction, and scanning
speed changing means for changing a scanning speed in a shallower
layer between a portion of the shallower layer subjected to
irradiation at the time of irradiation of a deeper layer and a
portion of the shallower layer subjected to no irradiation at the
time of irradiation of the deeper layer.
[0027] With the ninth invention, there are obtained effects similar
to those in the second invention.
[0028] A tenth invention for attaining the above object has the
features of the eighth or ninth invention and is further
characterized in that the intensity control means is constructed to
control the intensity of the charged-particle beam by controlling a
high-frequency electric field applied when the charged-particle
beam is ejected from the accelerator.
[0029] With the tenth invention, there are obtained effects similar
to those in the third invention.
[0030] An eleventh invention for attaining the above object has the
features of the tenth invention and is further characterized in
that the intensity control means is constructed to control the
high-frequency electric field by controlling the power value of a
high-frequency electric power applied to an electrode which
generates the high-frequency electric field when the
charged-particle beam is ejected from the accelerator.
[0031] With the eleventh invention, there are obtained effects
similar to those in the fourth invention.
[0032] A twelfth invention for attaining the above object has the
features of the eighth or ninth invention and is further
characterized in that the intensity control means is constructed to
control the intensity of the charged-particle beam by controlling
the amount of ions injected into the accelerator.
[0033] With the twelfth invention, there are obtained effects
similar to those in the fifth invention.
[0034] A thirteenth invention for attaining the above object has
the features of the eighth or ninth invention and is further
characterized in that there is provided electromagnet control means
for controlling the electromagnet on the basis of the dose value of
the charged-particle beam.
[0035] With the thirteenth invention, there are obtained effects
similar to those in the sixth invention.
[0036] A fourteenth invention for attaining the above object has
the features of the eighth or ninth invention and is further
characterized in that there is provided a degrader disposed on an
orbit of the charged-particle beam for making the change in energy
of the charged-particle beam.
[0037] With the fourteenth invention, there are obtained effects
similar to those in the seventh invention.
BRIEF DESCRIPTION OF THE DRAWINGS
[0038] FIG. 1 is a diagram showing the-construction of a
charged-particle beam irradiation system according to a preferred
embodiment of the present invention;
[0039] FIG. 2 is a diagram showing the construction of a
charged-particle beam irradiation system according to another
embodiment of the present invention;
[0040] FIG. 3 is a diagram showing the construction of a
charged-particle beam irradiation system according to still another
embodiment of the present invention;
[0041] FIG. 4 is a diagram showing the construction of a
charged-particle beam irradiation system according to a further
embodiment of the present invention;
[0042] FIG. 5 is a diagram showing the construction of a
charged-particle beam irradiation system according to a still
further embodiment of the present invention;
[0043] FIG. 6 is a diagram showing the construction of a
charged-particle beam irradiation system according to a furthermore
embodiment of the present invention;
[0044] FIG. 7 is a diagram showing a detailed construction and a
waveform for explaining the operation of the system shown in FIG.
6;
[0045] FIG. 8 is a diagram showing a detailed construction and the
cross section of layers of an affected part for explaining the
operation of the system shown in FIG. 6;
[0046] FIG. 9 is a view showing the construction of the
conventional charged-particle beam irradiation system;
[0047] FIG. 10 is a diagram showing a charged-particle beam
scanning method based on a raster scanning method; and
[0048] FIG. 11 is a graph showing the relation of a dose with the
depth in a body.
DESCRIPTION OF THE PREFERRED EMBODIMENTS
Embodiment 1
[0049] FIG. 1 shows a charged-particle beam irradiation system
according to a preferred embodiment of the present invention. In
FIG. 1, a treatment planning unit 61 determines the depth of an
affected part of a patient in the body thereof and a
three-dimensional shape of the affected part from an image of the
affected part obtained by a CT apparatus (not shown) and determines
the dose of a charged-particle beam (hereinafter referred to as a
beam) and the range and direction of irradiation on the basis of
the determined three-dimensional shape. On the basis of the depth
of the affected part in the body, the dose of the beam and the
range and direction of irradiation determined by the treatment
planning unit 61, a data conversion unit 62 determines the number n
of plural layers into which the affected part is to be divided in
the irradiation direction of the beam, the energy and intensity of
the beam which is to be imparted for each layer, and the patterns
of excitation current values for scanning electromagnets 31a and
31b when each layer is to be irradiated. The determined data is
outputted to a controller 70.
[0050] In the determined pattern, the current value data is defined
so that the scanning speed of the beam is changed at a region which
is subjected to superimposed irradiation. This holds for other
embodiments.
[0051] In the present embodiment, the treatment planning unit 61
and the data conversion unit 62 are provided as separate units.
However, the same unit may have the functions of both of the units
61 and 62. Also, the controller 70 may have the function of the
data conversion unit 62.
[0052] The controller 70 includes an irradiation layer management
unit 71 for managing the number n of layers to be irradiated and a
layer number i of a layer being irradiated at present, a pulse
generation unit 72 for outputting a pulse signal at a constant
period, excitation current indication units 73 and 74 for
indicating excitation current values to electromagnet power
supplies 81a and 81b which supply excitation currents for the
scanning electromagnets 31a and 31b, an intensity indication unit
75 for indicating the intensity of a beam for irradiation to an
intensity controller 21 which controls the intensity of the beam
for irradiation, and an energy indicating unit 76 for indicating
the energy of the beam for irradiation to an energy controller 100
which controls the energy of beam for irradiation. In the
controller 70, the number n of layers, the patterns of excitation
current values for the scanning electromagnets 31a and 31b at the
time of irradiation of each layer, the intensity of the beam for
each layer and the energy of the beam for each layer inputted from
the data conversion unit 62 are stored into the irradiation layer
management unit 71, the excitation current indication units 73 and
74, the intensity indication unit 75 and the energy indication unit
76, respectively. In the present embodiment, a raster scanning
method of scanning in zigzag rasters is used as a beam scanning
method and the excitation current value patterns for the scanning
electromagnets 31a and 31b are set so that the beam is zigzag-wise
scanned.
[0053] In the controller 70, when an irradiation start command is
inputted from an operator, the irradiation layer management unit 71
outputs "1" to the excitation current indication units 73 and 74,
the intensity indication unit 75 and the energy indication unit 76
as the number i of a layer to be irradiated. The excitation current
indication units 73 and 74 indicate excitation current values to
the electromagnet power supplies 81a and 81b on the basis of the
stored excitation current value patterns and the inputted layer
number "1" so that an initial irradiation position in the first
layer is to be subjected to irradiation with a beam. The intensity
indication unit 75 indicates the intensity of a beam in the first
layer to the intensity controller 21 on the basis of the stored
beam intensity data for each layer and the inputted layer number
"1". Also, the energy indication unit 76 indicates the energy of a
beam corresponding to the first layer to the energy controller 100
on the basis of the stored beam energy data for each layer and the
inputted layer number "1". In the present embodiment, the
irradiation with the beam is made in a sequence from a deep layer
(or a layer existing at the deepest position in the beam
progressing direction) to a shallow layer (or the shallowest
layer). Accordingly, the first layer indicates a layer which exists
at the deepest position.
[0054] The electromagnet power supplies 81a and 81b excite the
scanning electromagnets 31a and 31b on the basis of the indicated
excitation current values. The scanning electromagnets 31a and 31b
generate magnetic fields corresponding to the indicated excitation
current values so that the irradiation position of a beam is set to
an initial irradiation position in accordance with the generated
magnetic fields.
[0055] On the basis of the indicated beam intensity, the intensity
controller 21 determines the power value and frequency range of a
high-frequency electric power to be outputted by an ejecting
high-frequency source 22. In the intensity controller 21, a
relationship between the beam intensity and the power value and
frequency range of the high-frequency electric power is tabulated
beforehand. The determined power value and frequency range are
outputted to the ejecting high-frequency source 22. The ejecting
high-frequency source 22 applies a high-frequency electric power
having the inputted power value and frequency range to an ejecting
high-frequency electrode 13 of a synchrotron 10 in accordance with
an ejection command from the irradiation layer management unit 71.
In the synchrotron 10 in the present embodiment, the oscillation
amplitude of a beam being circulated is increased by applying a
high-frequency electric field to the beam in a state in which the
limit of stability of the beam is kept constant, and the beam
exceeding the stability limit owing to the increase in oscillation
amplitude is ejected by use of resonance. The ejecting
high-frequency electrode 13 is provided for applying the
high-frequency electric field which increases the oscillation
amplitude. With this synchrotron 10, it is possible to control the
intensity of a beam for irradiation by controlling the power value
and frequency range of a high-frequency electric power to be
applied to the ejecting high-frequency electrode 13 which applies
the high-frequency electric field to the beam. The beam intensity
may be controlled by controlling one of the power value and
frequency range of the high-frequency electric power. The control
of the power value may be performed by merely adjusting the gain of
an amplifier and can therefore be performed simply as compared with
the control of the frequency range.
[0056] The energy controller 100 controls a high-frequency
accelerating cavity 11, a deflecting electromagnet 14 and a
quadruple electromagnet 15 so that a beam circulating in the
synchrotron 10 has the indicated energy.
[0057] Next, the irradiation layer management unit 71 instructs an
injector 12 to inject a beam into the synchrotron. The instructed
injector 12 injects the beam into the synchrotron. The beam
injected into the synchrotron is accelerated by the high-frequency
accelerating cavity 11, the deflecting electromagnet 14 and the
quadruple electromagnet 15 up to the energy indicated by the energy
indication unit 76.
[0058] After the completion of acceleration of the beam, the
irradiation layer management unit 71 outputs an ejection command to
the ejecting high-frequency source 22 and outputs a pulse
generation start command to the pulse generation unit 72. The
ejecting high-frequency source 22 inputted with the ejection
command applies a high-frequency electric power to the ejecting
high-frequency electrode 13 so that a high-frequency electric field
is applied from the ejecting high-frequency electrode 13 to the
circulating beam and the beam is ejected from the synchrotron 10.
The ejected beam passes through a beam transport system including
quadruple electromagnets 41a, 41b, 41c, 41d and 41e and deflecting
electromagnets 42a, 42b and 42c and is then introduced to an
irradiation device which includes scanning electromagnets 31a and
31b, a degrader 32, a beam position monitor 33 and a dose monitor
34. The beam is imparted to an initial irradiation position by
virtue of magnetic fields generated by the scanning electromagnets
31a and 31b.
[0059] After receiving the pulse generation start command, the
pulse generation unit 72 outputs a pulse signal to the excitation
current indication units 73 and 74 at a constant period. The
excitation current indication units 73 and 74 inputted with the
pulse signal change, on the basis of the excitation current value
patterns stored therein, the excitation current values indicated to
the electromagnet power supplies 81a and 81b so that the beam is
imparted to the next irradiation position. The electromagnet power
supplies 81a and 81b excite the scanning electromagnets 31a and 31b
on the basis of the changed excitation current values. The scanning
electromagnets 31a and 31b generate magnetic fields corresponding
to the changed excitation current values so that the irradiation
position of the beam is moved from the initial irradiation position
to the next irradiation position. In this manner, each time the
pulse signal is generated, the change of the excitation current
values indicated to the electromagnet power supplies 81a and 81b is
repeated so that the irradiation position is moved. Thereby, the
first layer is irradiated with the beam which is zigzag-wise
scanned, as shown in FIG. 10. In the case where the first layer is
irradiated, the radiation dose of the beam may be constant. That
is, the scanning speed of the beam may be constant. Therefore, the
moving distance of the beam (or the amount of change in excitation
current value) at the time of movement from a certain irradiation
position to the next irradiation position may be constant.
[0060] At a time of point when the scanning for the first layer
based on the excitation current value patterns is completed, the
irradiation layer management unit 71 outputs a stop command to the
pulse generation unit 72, the intensity indication unit 75 and the
energy indication unit 76. Receiving the stop command, the pulse
generation unit 72 stops the output of the pulse signal. The
intensity indication unit 75 stops the indication of the beam
intensity, thereby stopping the application of the high-frequency
electric power to the ejecting high-frequency electrode 13 and the
ejection of the beam. The energy indication unit 76 instructs the
energy controller 100 to decelerate the beam to a predetermined
speed. Thus, in the present embodiment, the irradiation with the
beam is stopped after the irradiation of the first layer is
completed.
[0061] Next, the irradiation layer management unit 71 outputs "2"
to the excitation current indication units 73 and 74, the intensity
indication unit 75 and the energy indication unit 76 as the number
i of a layer to be irradiated.
[0062] The excitation current indication units 73 and 74 indicate
excitation current values to the electromagnet power supplies 81a
and 81b on the basis of the stored excitation current value
patterns and the inputted layer number "2" so that an initial
irradiation position in the second layer is subjected to
irradiation with a beam. The second layer includes a region
subjected to irradiation at the time of irradiation of the first
layer. Therefore, it is necessary to increase a scanning speed in
such a region as compared with that in a region which has not yet
been irradiated. Accordingly, excitation current value patterns
corresponding to the second layer are set so that a distance
between irradiation positions (or the amount of change in
excitation current value) becomes large in the region having
already been irradiated. In the present embodiment, since the pulse
signal is outputted from the pulse generation unit 72 at the
constant period, the scanning speed can be increased by making the
distance between irradiation positions long.
[0063] The intensity indication unit 75 indicates the intensity of
a beam in the second layer to the intensity controller 21 on the
basis of the stored beam intensity data for each layer and the
inputted layer number "2". The beam intensity in the second layer
is set to be low as compared with the beam intensity in the case of
the first layer. As mentioned above, the second layer includes a
region subjected to irradiation at the time of irradiation of the
first layer. Therefore, if the second layer is irradiated at the
same beam intensity as that for the first layer, it is necessary to
increase the scanning speed for the second layer as compared with
that for the first speed in order to reduce a radiation dose in the
region having already been irradiated. In the present embodiment,
on the other hand, it is possible to suppress the increase of the
scanning speed by making the beam intensity low.
[0064] A method for determination of the beam intensity for the
second layer in the present embodiment will be described in the
following. Now, it is assumed that a dose to be imparted to the
whole of the affected part is 10 and the beam intensity in the
first layer is 1. In the case where a radiation dose in the region
of the second layer having already been irradiated is 5, the beam
intensity in the second layer is set to 0.5. By thus setting the
beam intensity in the second layer, the beam scanning speed in the
first layer and the beam scanning speed in the region of the second
layer having already been irradiated become equal to each other.
Namely, the beam scanning speed is the same in both the case where
the dose of 10 is imparted at the beam intensity of 1 and the case
where the dose of 5 is imparted at the beam intensity of 0.5. The
scanning speed in a region of the second layer having not yet been
irradiated becomes one half of the scanning speed in the first
layer in order to impart the dose of 10 at the beam intensity of
0.5. Thus, the beam intensity in the second layer is set such that
the maximum scanning speed in the second layer becomes equal to the
scanning speed in the first layer. On the other hand, if the first
layer and the second layer are irradiated at the same beam
intensity, as in the prior art, it is required that the scanning
speed in the region of the second layer having already been
irradiated should be made two times as high as that in the first
layer.
[0065] The energy indication unit 76 inputted with "2" as the layer
number i indicates the energy of a beam corresponding to the second
layer to the energy controller 100 on the basis of the stored beam
energy data for each layer and the inputted layer number "2". Since
the second layer exists at a position shallower than the first
layer, the beam energy is set to a low value. Namely, a required
energy becomes smaller as the position of a layer is shallower.
[0066] In a manner similar to that in the case of irradiation of
the first layer, the beam is ejected from the synchrotron and the
ejected beam is scanned to irradiate the second layer with the
beam.
[0067] Similar irradiation is made for the third to n-th layers,
thereby irradiating the whole of the affected part with the beam.
As the layer position becomes shallower from the third layer to the
n-th layer, a dose imparted beforehand (or having already been
imparted) is increased and a dose distribution is complicated. In
such a case, too, the beam intensity may be set so that the
scanning speed in a region of the corresponding layer having
already been irradiated with the largest dose takes a low value
equal to the scanning speed in the first layer.
[0068] In the present embodiment as mentioned above, the beam
intensity is set for each layer and it is therefore possible to
lower the maximum value of the scanning speed as compared with the
case where the beam intensity in each layer is made constant. The
scanning speed is proportional to a change in magnetic field of the
scanning electromagnets 31a and 31b with time, and this change in
magnetic field with time is proportional to a change in current of
the electromagnet power supplies 81a and 81b with time, that is,
the output voltages of the electromagnet power supplies 81a and
81b. Therefore, when the maximum value of the beam scanning speed
is reduced as in the present embodiment, the output voltages of the
electromagnet power supplies 81a and 81b can be lowered and the
cost of fabrication and operation of the electromagnet power
supplies 81a and 81b can be reduced.
[0069] Also, the control of the beam intensity in the present
embodiment based on the control of the power value and frequency
range of the high-frequency electric power is an electric control.
Therefore, a response is fast and a time required for changing the
beam intensity is short. Accordingly, it is possible to shorten a
treatment time.
[0070] In the present embodiment, the beam energy is changed in
the-synchrotron 10. However, the degrader 32 may be used for a fine
control of the beam energy.
[0071] In the present embodiment, the beam intensity is set so that
the scanning speed in a region of a layer having already been
irradiated with the largest dose becomes equal to the scanning
speed in the first layer. However, if the beam intensity is set
with a mean dose value in a layer taken as a reference, a mean
scanning speed value may be made equal to the scanning speed in the
first layer, thereby making it possible to reduce the output
voltages of the electromagnet power supplies 81a and 81b. Thus, the
maximum value of the scanning speed can be lowered by reducing the
beam intensity in the second to n-th layers even if there is any
reduction.
Embodiment 2
[0072] A charged-particle beam irradiation system according to
another embodiment of the present invention will now be described
using FIG. 2. In the charged-particle beam irradiation system in
the present embodiment, an instruction for change in irradiation
position is made on the basis of a measured radiation dose. The
present embodiment will be described in conjunction with points
different from the first embodiment.
[0073] The irradiation system according to the present embodiment
includes a dose management unit 77 provided in lieu of the pulse
generation unit 72 in the first embodiment. In the present
embodiment, the data conversion unit 62 determines the value of a
radiation dose required at each irradiation position in a layer in
addition to the number n of layers, the energy and intensity of a
beam for each layer and-the patterns of excitation current values
for the scanning electromagnets 31a and 31b. This radiation dose
value is outputted to the dose management unit 77. The dose
management unit 77 stores therein the inputted radiation dose value
in association with the corresponding irradiation position.
[0074] After the completion of beam acceleration, the irradiation
management unit 71 outputs an ejection command to the ejecting
high-frequency source 22 and outputs a dose management start
command to the dose management unit 77. The dose management unit 77
inputted with the command from the irradiation layer management
unit 71 compares a beam dose value measured by the dose monitor 34
with that one of the radiation dose values stored beforehand in
association with irradiation positions which corresponds to an
initial irradiation position. In the case where it is determined as
the result of comparison that the measured beam dose value reaches
the radiation dose value corresponding to the initial
irradiation-position, the dose management unit 77 outputs a pulse
signal to the excitation current indication units 73 and 74. The
excitation current indication units 73 and 74 inputted with the
pulse signal changes excitation current values indicated to the
electromagnet power supplies 81a and 81b on the basis of the stored
excitation current value patterns so that an irradiation position
is changed from the initial irradiation position to the next
irradiation position.
[0075] Thereafter, the dose management unit 77 repeats the
comparison of a beam dose value measured by the dose monitor 34
with that a radiation dose value stored beforehand in association
with an irradiation position and outputs a pulse signal at a point
of time when the measured beam dose value reaches the radiation
dose value required at that irradiation position. With the
irradiation position being thus changed each time the beam dose
value reaches the required radiation dose value, the beam is
scanned to irradiate each layer. In the present embodiment, the
dose value from the dose monitor 34 may be taken in by taking in
the dose value through an analog-to-digital converter or by
generating a pulse in the case where there reaches a fixed dose and
counting the number of pulses.
[0076] Points other than the above-described points are the same as
those in the first embodiment.
[0077] According to the present embodiment, the following effect is
provided in addition to the effects of the first embodiment.
Namely, since a change in irradiation position is made in
accordance with a dose value, it is possible to control a dose at
each irradiation position accurately even if the intensity of a
beam ejected from the synchrotron 10 has some variation.
[0078] In the present embodiment, when a layer is irradiated with a
beam, the irradiation is continuously made without stopping the
beam. However, there may be employed a method in which the
irradiation with the beam is stopped in the case where a dose value
measured by the dose monitor 34 and a dose value stored in the dose
management unit 77 coincide with each other and the irradiation
with the beam is made again after magnetic fields (or excitation
currents) of the scanning electromagnets 31a and 31b are
changed.
Embodiment 3
[0079] A charged-particle beam irradiation system according to
still another embodiment of the present invention will now be
described using FIG. 3. In the charged-particle beam irradiation
system in the present embodiment, a change in beam energy is made
by a degrader. The present embodiment will be described in
conjunction with points different from the first embodiment.
[0080] The irradiation system according to the present embodiment
includes a degrader driver 200 provided in lieu of the energy
controller 100 in the first embodiment. In the present embodiment,
the energy indication unit 76 indicates the energy of a beam to the
degrader driver 200. The degrader driver 200 stores therein
beforehand a relationship between the energy of a beam and a
required degrader thickness and determines the thickness of the
degrader 32 in accordance with the indicated energy. On the basis
of the determined thickness, the degrader driver 200 further
determines the combination of plates of the degrader 32 including a
plurality of plates with different thicknesses so that the
determined combination is arranged on the orbit. The plate forming
the degrader 32 has a property of lowering the energy of a beam
passing therethrough. In the present embodiment, the energy of a
beam ejected from the synchrotron 10 is the maximum required energy
and the degrader 32 is used in the case where there is a need to
lower the energy.
[0081] Points other than the above-described points are the same as
those in the first embodiment.
[0082] According to the present embodiment, the following effect is
provided in addition to the effects of the first embodiment.
Namely, since the beam energy is changed by the degrader 32, the
control of the synchrotron can be simplified.
Embodiment 4
[0083] A charged-particle beam irradiation system according to a
further embodiment of the present invention will now be described
using FIG. 4. In the charged-particle beam irradiation system in
the present embodiment, the intensity of a beam is changed by
changing the amount of ions generated by an ion source 16 in the
injector 12. The present embodiment will be described in
conjunction with points different from the first embodiment.
[0084] The irradiation system according to the present embodiment
has not the intensity controller 21. The intensity indication unit
75 indicates the intensity of a beam to the ion source 16. In
accordance with the indicated beam intensity, the ion source 16
changes the amount of ions to be generated. Namely, as the
indicated beam intensity is higher, the amount of generated ions
becomes larger. In the present embodiment, a high-frequency
electric power applied to the ejecting high-frequency electrode 13
is constant.
[0085] According to the present embodiment, the following effect is
provided in addition to the effects of the first embodiment.
Namely, since the amount of beams injected into the synchrotron 10
can be suppressed to the minimum required, it is possible to reduce
unnecessary beams in the synchrotron 10, thereby reducing the
(radio) activation of the equipment.
[0086] In the present embodiment, a slit may be provided in a beam
transport system connecting the injector 12 and the synchrotron 10
so that the amount of ions injected into the synchrotron 10 is
changed in accordance with the width of the slit.
[0087] In the foregoing, the embodiments has been described in
conjunction with the case where a beam is zigzag-wise scanned.
However, in each embodiment, a beam may be scanned pixel-wise. In
this case, a control for ejecting the beam from the synchrotron 10
can be simplified. Now consider the case where the intensity of a
beam in each layer is constant as in the prior art when the beam is
pixel-wise scanned. In such a case, it is required that an
irradiation time for a region of a shallower layer having already
been irradiated should be made short. Therefore, the beam must be
switched on and off at a short period, which complicates the
control for beam ejection from the synchrotron 10. In the
embodiment of the present invention, on the other hand, since the
beam intensity in a shallower layer is made small, a beam
irradiation time can be made long. Thereby, the control for beam
ejection from the synchrotron 10 can be simplified, as mentioned
above.
Embodiment 5
[0088] A charged-particle beam irradiation system according to a
still further embodiment of the present invention will now be
described using FIG. 5. In the charged-particle beam irradiation
system in the present embodiment, a cyclotron is used as the
accelerator. The present embodiment will be described in
conjunction with points different from the third embodiment.
[0089] The intensity indication unit 75 indicates the intensity of
a beam to an ion source 16' of a cyclotron 19 to control the amount
of ions injected into the cyclotron 19 from the ion source 16' in
accordance with the indicated beam intensity, thereby adjusting the
intensity of a beam ejected from the cyclotron 19. In the present
embodiment, an ejection command outputted from the irradiation
layer management unit 71 is inputted to the ion source 16' of the
cyclotron 19 and the ion source 16' injects a beam into the
cyclotron 19 in accordance with this command. In the case where the
ejection from the beam from the cyclotron 19 is stopped, a stop
command is inputted from the irradiation layer management unit 71
to the ion source 16', thereby stopping the injection of the beam
from the ion source 16' into the cyclotron 19.
[0090] In the present embodiment, the intensity of a beam is
adjusted by controlling the amount of ions injected from the ion
source into the cyclotron. However, a slit 18 may be provided in a
beam transport system so that the beam intensity is adjusted in
accordance with the width of the slit 18. Also, though the energy
of a beam is controlled by the degrader 32, the control may be made
by a degrader 17 provided in a downstream of the cyclotron 19. In
the present embodiment, the accelerator may be a linear
accelerator.
[0091] According to the present embodiment, effects similar to
those in the third embodiment are obtained.
[0092] In the first to fourth embodiments, similar effects are
obtained in the case where the intensity of a beam is changed by a
slit provided in a beam transport system.
Embodiment 6
[0093] A charged-particle beam irradiation system according to a
furthermore embodiment of the present invention will now be
described using FIG. 6. FIGS. 7 and 8 are diagrams of the detailed
construction showing the operation of the system. In the
charged-particle beam irradiation system in the present embodiment,
a beam is rotationally scanned circle-wise plural times as shown in
FIG. 7 to produce a flat dose distribution and the dose
distribution is imparted in a manner shaped by a multi-leaf
collimator in conformity to the shape of an affected part as shown
in FIG. 8. The present embodiment will be described in conjunction
with points different from the third embodiment.
[0094] In the present embodiment, the patterns of excitation
current values determined by the data conversion unit 62 are set so
that a beam is circle-wise scanned at a constant speed. The
patterns are stored in the excitation current indication units 73
and 74. Also, the data conversion unit 62 determines the radiation
dose value of a beam required in each layer and stores it into the
pulse generation unit 72. Further, the data conversion unit 62
outputs the intensity of a beam for each layer to the intensity
indication unit 75. The beam intensity is set so that it becomes
lower as that position of a layer is shallower.
[0095] When a pulse generation start command is inputted from the
irradiation layer management unit 71, the pulse generation unit 72
generates a pulse signal to the excitation current indication units
73 and 74 at a constant period. The excitation current indication
units 73 and 74 inputted with the pulse signal change excitation
current values to be indicated to the electromagnet power supplies
81a and 81b on the basis of the stored excitation current value
patterns each time the pulse signal is inputted. The scanning
electromagnets 31a and 31b generate magnetic fields in accordance
with excitation current values inputted from the electromagnet
power supplies 81a and 81b so that a beam is scanned circle-wise at
a constant speed. The circle-wise scanned beam is enlarged or
spread by a scatterer 36 into a size larger than an affected part
202. A multi-leaf collimator 35 shapes the enlarged beam so that
the beam conforms to the shape of the affected part. The range of
the shaped beam is conformed by a bolus 37 to the shape of a lower
portion of the affected part.
[0096] The dose monitor 34 measures the dose value of a beam to
output the measured value to the pulse generation unit 72. The
pulse generation unit 72 compares the stored radiation dose value
for each layer and the measured dose value to stop the output of
the pulse signal to the excitation current indication units 73 and
74 when the measured dose value reaches the stored radiation dose
value. Thus, at a point of time when the irradiation of a layer is
completed, the irradiation layer management unit 71 outputs a stop
command to the intensity indication unit 75 and the energy
indication unit 76.
[0097] Points other than the above-described points are the same
those in third embodiment.
[0098] Consider the case where each layer is irradiated with a beam
scanned circle-wise plural times, as in the present embodiment. In
this case, if the intensity of a beam in a shallower layer is made
equal to the intensity of a beam in a deeper layer, a beam
irradiation time becomes short in the shallower layer in order to
make a dose small and hence the number of beam rotations becomes
small. At this time, if variations in the beam intensity with time
are generated, the uniformity of a dose distribution is
deteriorated. Also, the rise and fall of the beam resulting from
the turn-on/off thereof give a larger influence on the dose
distribution. In the present embodiment, however, the intensity of
a beam is made lower as the position of a layer becomes shallower.
Thereby, it is possible to make the irradiation time long. As a
result, the uniformity of the dose distribution can be improved by
making the number of rotational scans large.
[0099] The first to fourteenth inventions defined in the
description of SUMMARY OF THE INVENTION and represented by the
above-described embodiments provide the following effects.
[0100] According to the first and eighth inventions, since a
voltage to be applied to the electromagnet can be lowered, it is
possible to reduce the cost of a power supply for the
electromagnet. Also, the control of the accelerator is
simplified.
[0101] According to the second and ninth inventions, since a
voltage to be applied to the electromagnet can be lowered, it is
possible to reduce the cost of a power supply for the
electromagnet. Also, the control of the accelerator is
simplified.
[0102] According to the third and tenth inventions, it is possible
to shorten a time required for the change in beam intensity,
thereby shortening a treatment time.
[0103] According to the fourth and eleventh inventions, the control
of a high-frequency electric field is simplified.
[0104] According to the fifth and twelfth inventions, it is
possible to reduce unnecessary beams in the accelerator, thereby
reducing the (radio) activation of the equipment.
[0105] According to the sixth and thirteenth inventions, it is
possible to control a dose in each layer accurately even if the
intensity of a charged-particle beam ejected from the accelerator
has some variations.
[0106] According to the seventh and fourteenth inventions, the
control of the accelerator is simplified.
* * * * *