U.S. patent application number 09/836947 was filed with the patent office on 2001-08-09 for method and apparatus for supplying regulated power to memory device components.
Invention is credited to Butler, Hal W., Casper, Stephen L., Porter, Stephen R..
Application Number | 20010012220 09/836947 |
Document ID | / |
Family ID | 23532816 |
Filed Date | 2001-08-09 |
United States Patent
Application |
20010012220 |
Kind Code |
A1 |
Butler, Hal W. ; et
al. |
August 9, 2001 |
Method and apparatus for supplying regulated power to memory device
components
Abstract
An internal voltage regulator for a synchronous random access
memory ("SDRAM") uses a regulator circuit to supply power to charge
pumps that is separate from a regulator circuit that supplies power
to the arrays of the SDRAM. The regulator supplies an output
voltage to the charge pumps that is maintained constant as the
external supply voltage is increased beyond its normal operating
range. In contrast, a regulated circuit that supplies power to the
arrays increases as the supply voltage is increase beyond its
normal operating range. As a result, the voltage regulator allows
the arrays to be stress tested with a relatively high regulated
output voltage without applying an excessive and potentially
damaging regulated output voltage to the charge pumps.
Inventors: |
Butler, Hal W.; (Boise,
ID) ; Casper, Stephen L.; (Boise, ID) ;
Porter, Stephen R.; (Boise, ID) |
Correspondence
Address: |
Edward W. Bulchis, Esq.
DORSEY & WHITNEY LLP
1420 Fifth Avenue, Suite 3400
Seattle
WA
98101
US
|
Family ID: |
23532816 |
Appl. No.: |
09/836947 |
Filed: |
April 17, 2001 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
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09836947 |
Apr 17, 2001 |
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09388126 |
Sep 1, 1999 |
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6219293 |
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Current U.S.
Class: |
365/189.09 |
Current CPC
Class: |
G11C 11/4074
20130101 |
Class at
Publication: |
365/189.09 |
International
Class: |
G11C 005/00 |
Claims
1. An internal voltage regulator for a memory device having an
array of memory cells and a charge pump, the internal voltage
regulator comprising a plurality of regulator circuits adapted to
receive an external supply voltage and being operable to generate
respective regulated output voltages, a first of the regulator
circuits being coupled to the array of memory cells to supply a
first regulated output voltage thereto, and a second of the
regulator circuits being coupled to the charge pump to supply a
second regulated output voltage thereto, the first regulator
circuit being structured to generate the first regulated output
voltage as a first function of the external supply voltage and the
second regulator circuit being structured to generate the second
regulated output voltage as a second function of the external
supply voltage, the first function being differing from the second
function.
2. The internal voltage regulator of claim 1 wherein the first
voltage regulator is constructed to maintain the magnitude of the
first regulated output voltage substantially constant responsive to
the magnitude of the external supply voltage being in a normal
operating range, and to increase the magnitude of the first
regulated output voltage responsive to the magnitude of the
external supply voltage increasing above the normal operating
range, and the second voltage regulator is constructed to maintain
the magnitude of the second regulated output voltage substantially
constant responsive to the magnitude of the external supply voltage
being in the normal operating range and responsive to the magnitude
of the external supply voltage increasing by at least some
magnitude above the normal operating range.
3. The internal voltage regulator of claim 1 wherein the regulator
circuits each include a reference input adapted to receive a
reference voltage, and wherein the regulator circuits are
constructed to regulate the magnitude of their respective regulated
output voltages at a value corresponding the magnitude of a
reference voltage applied to their respective reference inputs.
4. The internal voltage regulator of claim 1 wherein each of the
regulator circuits includes reference voltage circuit components
that control the magnitude of the respective regulated output
voltages as a function of the magnitude of the external supply
voltage.
5. The internal voltage regulator of claim 1 further comprising a
third regulator circuit coupled to internal components of the
memory device other than the memory array and the charge pump to
supply a third regulated output voltage to the other
components.
6. The internal voltage regulator of claim 1 wherein the memory
device comprises a dynamic random access memory.
7. The internal voltage regulator of claim 6 wherein the dynamic
random access memory comprises a synchronous dynamic random access
memory.
8. An internal voltage regulator for a memory device having an
array of memory cells and a charge pump, the internal voltage
regulator comprising: first regulator means receiving an external
supply voltage and generating a first regulated output voltage as a
first function of the external supply voltage, the first regulator
means applying the first regulated output voltage to the array of
memory cells; and second regulator means receiving the external
supply voltage and generating a second regulated output voltage as
a second function of the external supply voltage, the second
function being different from the first function, the second
regulator means applying the second regulated output voltage to the
charge pump.
9. The internal voltage regulator of claim 8 wherein: the first
voltage regulator means comprise: means for maintaining the
magnitude of the first regulated output voltage substantially
constant responsive to the magnitude of the external supply voltage
being in a normal operating range; and means for increasing the
magnitude of the first regulated output voltage responsive to the
magnitude of the external supply voltage increasing above the
normal operating range; and the second voltage regulator means
comprise: means for maintaining the magnitude of the second
regulated output voltage substantially constant responsive to the
magnitude of the external supply voltage being in the normal
operating range; and means for maintaining the magnitude of the
second regulated output voltage substantially constant responsive
to the magnitude of the external supply voltage increasing by at
least some magnitude above the normal operating range.
10. The internal voltage regulator of claim 8 wherein the first and
second regulator means each include a reference input adapted to
receive a reference voltage, and wherein the regulator means each
comprise means for regulating the magnitude of their respective
regulated output voltages at a value corresponding the magnitude of
a reference voltage applied to their respective reference
inputs.
11. The internal voltage regulator of claim 8 wherein each of the
first and second regulator means includes reference voltage means
that control the magnitude of the respective regulated output
voltages as a function of the magnitude of the external supply
voltage.
12. The internal voltage regulator of claim 8 further comprising
third regulator means for supplying a third regulated output
voltage to internal components of the memory device other than the
memory array and the charge pump.
13. The internal voltage regulator of claim 8 wherein the memory
device comprises a dynamic random access memory.
14. The internal voltage regulator of claim 13 wherein the dynamic
random access memory comprises a synchronous dynamic random access
memory.
15. A memory device, comprising: at least one array of memory cells
adapted to store data at a location determined by a row address and
a column address; a row address circuit adapted to receive and
decode the row address, and to select a row of memory cells
corresponding to the row address responsive to a first command
signal; a column address circuit adapted to receive data from or
apply data to one of the memory cells in the selected row
corresponding to the column address responsive to a second command
signal; a data path circuit adapted to couple data between an
external terminal and the column address circuit responsive to a
third command signal; a charge pump constructed to generate a
pumped voltage to supply power to at least part of either the at
least one array of memory cells or the data path; a first regulator
circuit adapted to receive an external supply voltage and to
generate a first regulated output voltage as a first function of
the external supply voltage, the first regulated output voltage
being used to supply power to the at least one array of memory
cells; and a second regulator circuit adapted to receive the
external supply voltage and to generate a second regulated output
voltage as a second function of the external supply voltage that is
different from the first function, the second regulated output
voltage being used to supply power to the charge pump.
16. The memory device of claim 15 wherein the first voltage
regulator is constructed to maintain the magnitude of the first
regulated output voltage substantially constant responsive to the
magnitude of the external supply voltage being in a normal
operating range, and to increase the magnitude of the first
regulated output voltage responsive to the magnitude of the
external supply voltage increasing above the normal operating
range, and the second voltage regulator is constructed to maintain
the magnitude of the second regulated output voltage substantially
constant responsive to the magnitude of the external supply voltage
being in the normal operating range and responsive to the magnitude
of the external supply voltage increasing by at least some
magnitude above the normal operating range.
17. The memory device of claim 15 wherein the regulator circuits
each include a reference input adapted to receive a reference
voltage, and wherein the regulator circuits are constructed to
regulate the magnitude of their respective regulated output
voltages at a value corresponding the magnitude of a reference
voltage applied to their respective reference inputs.
18. The memory device of claim 15 wherein each of the regulator
circuits includes reference voltage circuit components that control
the magnitude of the respective regulated output voltages as a
function of the magnitude of the external supply voltage.
19. The memory device of claim 15 further comprising a third
regulator circuit coupled to internal components of the memory
device other than the memory array and the charge pump to supply a
third regulated output voltage to the other components.
20. The memory device of claim 15 wherein the memory device
comprises a dynamic random access memory.
21. The memory device of claim 20 wherein the dynamic random access
memory comprises a synchronous dynamic random access memory.
22. A computer system, comprising: a processor having a processor
bus; an input device coupled to the processor through the processor
bus adapted to allow data to be entered into the computer system;
an output device coupled to the processor through the processor bus
adapted to allow data to be output from the computer system; and a
memory device coupled to the processor bus, the memory device
comprising: at least one array of memory cells adapted to store
data at a location determined by a row address and a column
address; a row address circuit adapted to receive and decode the
row address, and to select a row of memory cells corresponding to
the row address responsive to a first command signal; a column
address circuit adapted to receive data from or apply data to one
of the memory cells in the selected row corresponding to the column
address responsive to a second command signal; a data path circuit
adapted to couple data between an external terminal and the column
address circuit responsive to a third command signal; a charge pump
constructed to generate a pumped voltage to supply power to at
least part of either the at least one array of memory cells or the
data path; a first regulator circuit adapted to receive an external
supply voltage and to generate a first regulated output voltage as
a first function of the external supply voltage, the first
regulated output voltage being used to supply power to the at least
one array of memory cells; and a second regulator circuit adapted
to receive the external supply voltage and to generate a second
regulated output voltage as a second function of the external
supply voltage that is different from the first function, the
second regulated output voltage being used to supply power to the
charge pump.
23. The computer system of claim 22 wherein the first voltage
regulator is constructed to maintain the magnitude of the first
regulated output voltage substantially constant responsive to the
magnitude of the external supply voltage being in a normal
operating range, and to increase the magnitude of the first
regulated output voltage responsive to the magnitude of the
external supply voltage increasing above the normal operating
range, and the second voltage regulator is constructed to maintain
the magnitude of the second regulated output voltage substantially
constant responsive to the magnitude of the external supply voltage
being in the normal operating range and responsive to the magnitude
of the external supply voltage increasing by at least some
magnitude above the normal operating range.
24. The computer system of claim 22 wherein the regulator circuits
each include a reference input adapted to receive a reference
voltage, and wherein the regulator circuits are constructed to
regulate the magnitude of their respective regulated output
voltages at a value corresponding the magnitude of a reference
voltage applied to their respective reference inputs.
25. The computer system of claim 22 wherein each of the regulator
circuits includes reference voltage circuit components that control
the magnitude of the respective regulated output voltages as a
function of the magnitude of the external supply voltage.
26. The computer system of claim 22 further comprising a third
regulator circuit coupled to internal components of the memory
device other than the memory array and the charge pump to supply a
third regulated output voltage to the other components.
27. The computer system of claim 22 wherein the memory device
comprises a dynamic random access memory.
28. The computer system of claim 27 wherein the dynamic random
access memory comprises a synchronous dynamic random access
memory.
29. A method of powering and testing an array of memory cells and a
charge pump fabricated in a common integrated circuit that is
powered by an external supply voltage, the method comprising:
supplying power to at least a portion of the array at a first
voltage when the external supply voltage has a magnitude that is
less than a predetermined voltage; supplying power to at least a
portion of the array at a voltage having a magnitude that is
greater than the magnitude of the first voltage when the external
supply voltage has a magnitude that is greater than the
predetermined voltage; supplying power to the charge pump at a
second voltage when the external supply voltage has a magnitude
that is less than the predetermined voltage; and supplying power to
the charge pump at substantially the second voltage when the
external supply voltage has a magnitude that is greater than the
predetermined voltage.
30. The method of claim 29 wherein the first and second voltages
are different from each other.
31. The method of claim 29 wherein the predetermined voltage
comprises a voltage having a magnitude that is greater than the
normal operating range of the integrated circuit.
32. The method of claim 29 wherein the integrated circuit comprises
a memory device.
33. The method of claim 32 wherein the memory device comprises a
dynamic random access memory.
Description
TECHNICAL FIELD
[0001] This invention relates to memory devices, and more
particularly, to a method and apparatus for supplying regulated
power to various components of memory devices in a manner that
facilitates stress testing of the components.
BACKGROUND OF THE INVENTION
[0002] Memory devices are in common use in a wide variety of
applications. For example, memory devices are used in personal
computers, telephone answering machines, and cellular telephones.
Various types of memory devices are commercially available,
including read-only memories ("ROMs"), which may be programmable
("PROMs"), and random access memories ("RAMs"), which may be either
static random access memories ("SRAMs") or dynamic random access
memories ("DRAMs"). Furthermore, there are a variety of DRAM types
available, and more being developed. For example, asynchronous
DRAMs, synchronous DRAMs ("SDRAMs"), and video graphics DRAMs are
currently available, and Synchronous Link DRAMs ("SLDRAMs") and
RAMBUS DRAMs ("RDRAMs") will soon be available.
[0003] Although the following discussion of problems encountered
when testing conventional memory devices will focus on such
problems in the context of an SDRAM, it will be understood that
these or similar problems exist to varying degrees with other types
of memory devices. Similarly, although the solutions to these
problems using the disclosed embodiments of the invention are
explained in the context of an SDRAM, it will be understood that
they are applicable to other types of memory devices.
[0004] One example of a conventional SDRAM 10 exhibiting problems
that can be alleviated using the disclosed embodiments of the
invention is shown in FIG. 1. The SDRAM 10 includes an address
register 12 that receives either a row address or a column address
on an address bus 14. The address bus 14 is generally coupled to a
memory controller (not shown in FIG. 1). A row address is initially
received by the address register 12 and applied to a row address
multiplexer 18. The row address multiplexer 18 couples the row
address to a number of components associated with either of two
memory banks 20, 22 depending upon the state of a bank address bit
BA forming part of the row address. Associated with each of the
memory banks 20, 22 are a respective row address latch 30 which,
stores the row address, and a row decoder 32, which applies various
row signals to its respective array 20 or 22 as a function of the
stored row address. The row address multiplexer 18 also couples row
addresses to the row address latches 30 for the purpose of
refreshing the memory cells in the arrays 20, 22. The row addresses
are generated for refresh purposes by a refresh counter 40, which
is controlled by a refresh controller 42.
[0005] After the row address has been applied to the address
register 12 and stored in one of the row address latches 30, a
column address is applied to the address register 12. The address
register 12 couples the column address to a column address latch
50. Depending on the operating mode of the SDRAM 10, the column
address is either coupled through a burst counter 52 to a column
address buffer 56 or to the burst counter 52 which applies a
sequence of column addresses to the column address buffer 56
starting at the column address output by the address register 12.
In either case, the column address buffer 56 applies a column
address to a column decoder 58, which applies various column
signals to respective column circuitry 60, 62, each of which
includes sense amplifiers and associated circuitry.
[0006] The column circuitry 60, 62 receive data from the arrays 20,
22, respectively, and couple the data to a data output register 70,
which applies the data to a data bus 72. Data to be written to one
of the arrays 20, 22 is coupled from the data bus 72 through a data
input register 74 to the column circuitry 60, 62 where it is
transferred to one of the arrays 20, 22, respectively. A mask
register 76 may be used to selectively alter the flow of data into
and out of the column circuitry 60, 62 such as by selectively
masking data to be read from the arrays 20, 22, respectively.
[0007] The above-described operation of the SDRAM 10 is controlled
by a command decoder 78 responsive to high level command signals
received on a control bus 79. These high level command signals,
which are typically generated by a memory controller (not shown in
FIG. 1), are a clock enable signal CKE*, a clock signal CLK, a chip
select signal CS*, a write enable signal WE*, a row address strobe
signal RAS*, and a column address strobe signal CAS*, which the "*"
designating the signal as active low. However, other high level
command signals may be used. In either case, the command decoder 78
generates a sequence of command signals responsive to the high
level command signals to carry out the function (e.g., a read or a
write) designated by each of the high level command signals.
[0008] The SDRAM 10 also includes an internal voltage regulator 80
that supplies various regulated voltages, including V.sub.PP,
V.sub.CCR1 and V.sub.CCR2. V.sub.PP is typically a "pumped" voltage
having a magnitude greater than the magnitude of an external supply
voltage V.sub.CCX, and is used for such purposes as generating
wordline voltages for the arrays 20, 22, and supplying power to the
data output register 70. However, a negative pumped voltage
V.sub.BB may also be generated that is used to bias the substrate
of the SDRAM 10. The voltage V.sub.CCR1 is typically a regulated
voltage that is used to apply power to the arrays 20, 22, and
V.sub.CCR2 is typically a regulated voltage that is used to apply
power to the other circuitry in the SDRAM 10.
[0009] The internal voltage regulator 80 is illustrated in further
detail in FIG. 2. The voltage regulator 80 includes three internal
voltage regulator circuits 90, 92, 94, each of which is powered by
the external power supply voltage V.sub.CCX. The voltage regulator
circuits 90, 92, 94 are identical to each other, and thus have the
same performance characteristics. Each of the voltage regulator
circuits 90, 92, 94 is also coupled to a reference voltage
generator 96, which supplies the voltage regulator circuits 90, 92,
94 with a common reference voltage V.sub.REF. The design of the
reference voltage circuit 96, which has the characteristics
described below, is well within the ability of one of ordinary
skill in the art. Therefore, in the interests of brevity, a
specific design for the reference voltage circuit 96 will not be
described.
[0010] The voltage regulator circuit 90 generates a regulated
voltage V.sub.CCR1 which, as explained above, supplies power to the
arrays 20, 22. Similarly, the voltage regulator circuit 92
generates a regulated voltage V.sub.CCR2 which supplies power to
the other circuitry in the SDRAM 10. Finally, the voltage regulator
circuit 94 generates a regulated voltage V.sub.CCR3, which supplies
power to conventional charge pumps 98. The charge pumps 98, which
are generally entirely separate circuits (not shown) for each
pumped supply voltage, generate a positive pumped supply voltage
V.sub.PP, which may be used as described above, and a negative
voltage V.sub.BB, which, as described above, is used to bias the
substrate of the SDRAM 10.
[0011] The performance characteristic of the regulator circuits 90,
92, 94 is shown in FIG. 3, in which the regulated output voltage
V.sub.CCR is shown on the y-axis as a function of the external
supply voltage V.sub.CCX plotted on the x-axis. As shown in FIG. 3,
the regulated output voltage V.sub.CCR increases linearly with the
external supply voltage V.sub.CCX until the regulator circuits 90,
92, 94 begin to regulate, which occurs at about two volts.
Thereafter, the regulated output voltage V.sub.CCR remains constant
as the external supply voltage V.sub.CCX continues to increase.
However, the regulator circuits 90, 92, 94 are only capable of
regulating the output voltage V.sub.CCR over a limited range of
supply voltages. When the external supply voltage V.sub.CCX reaches
about 4 volts, the output voltage from the regulator circuits 90,
92, 94 starts to increase linearly with V.sub.CCX in order to
perform stress testing. Also, even if the regulator circuits 90,
92, 94 are capable of regulating when the external supply voltage
V.sub.CCX is above 4 volts, they may still perform as illustrated
in FIG. 3 if the reference voltage V.sub.REF increases with the
external supply voltage V.sub.CCX when the external supply voltage
V.sub.CCX is above 4 volts.
[0012] The performance characteristics of the regulator circuits
90, 92, 94 do not present a problem during normal operation of the
SDRAM 10 because the external supply voltage V.sub.CCX is normally
maintained within the operating range of the regulator circuits 90,
92, 94. However, these performance characteristics do present a
problem during testing of the SDRAM 10, as explained below.
[0013] Difficulties also arise in testing the SDRAM 10 at external
supply voltages V.sub.CCX above the normal operating range of the
regulator circuits 90, 92, 94. More particularly, since the pumped
voltage V.sub.PP is normally a voltage greater than, and directly
proportional to, the regulated output voltage V.sub.CCR3 supplying
power to the charge pumps 98, the voltages present in the charge
pumps 98 can become very large as the regulated output voltage
V.sub.CCR3 increases. Although the other regulated output voltages
V.sub.CCR1 and V.sub.CCR2 are normally proportional to the external
supply voltage V.sub.CCX above the normal operating range of the
regulator circuits 90, 92, 94, the voltages present in the
circuitry powered by the output voltages V.sub.CCR1 and V.sub.CCR2
are relatively low since V.sub.CCR1 and V.sub.CCR2 are typically
less than V.sub.CCX. As the external supply voltage V.sub.CCX is
increased above the normal operating range of the regulator
circuits 90, 92, 94, the resulting high voltages present in the
charge pumps 98, which may be 2-3 times the magnitude of the supply
voltage, can damage the charge pumps 98, even though the arrays 20,
22 and other circuitry in the SDRAM 10 would continue to operate.
As a result of the performance characteristics of the regulator
circuits 90, 92, 94, it can be impractical to stress test the SDRAM
10 at adequately high external supply voltages V.sub.CCX.
[0014] The regulator circuits 90, 92, 94 have been described as
generating output voltages V.sub.CCR1, V.sub.CCR2 and V.sub.CCR2
having the same magnitude. However, it will be understood that the
problems described above would continue to exist even if the
regulator circuits 90, 92, 94 were adjusted to output regulated
output voltages V.sub.CCR1, V.sub.CCR2 and V.sub.CCR3 having
different magnitudes or some of the regulated output voltages
V.sub.CCR1, V.sub.CCR2 and V.sub.CCR3 were scaled to a lower
voltage. For example, assume the regulator circuit 90 generates an
output voltage V.sub.CCR1 of 1.5 volts and the regulator circuit 94
generates an output voltage V.sub.CCR3 of 3 volts when an external
supply voltage V.sub.CCX within the normal operating range of the
regulator circuits 90, 92, 94 is applied to the SDRAM 10, When the
external supply voltage V.sub.CCX is raised 1 volt above the normal
operating range, the regulator circuit 90 would generate an output
voltage V.sub.CCR1 of 2.5 volts and the regulator circuit 94 would
generate an output voltage V.sub.CCR3 of 4 volts. This regulated
voltage V.sub.CCR3 of 4 volts might very well damage the charge
pumps 98 even though the arrays 20, 22 would continue to operate
without damage at a regulated output voltage V.sub.CCR1 of 2.5
volts.
[0015] There is therefore a need for an improved method and
apparatus for supplying regulated voltages to the components of
memory devices, including the SDRAM 10 and other varieties of
DRAMs.
SUMMARY OF THE INVENTION
[0016] In accordance with one aspect of the invention, an internal
voltage regulator provides power to a memory device having an array
of memory cells and a charge pump. The internal voltage regulator
includes at least two regulator circuits adapted to receive an
external supply voltage and operable to generate respective
regulated output voltages. The first regulator circuit supplies a
first regulated output voltage to the array of memory cells, and
the second regulator circuit supplies a second regulated output
voltage to the charge pump. The first regulator circuit generates
the first regulated output voltage as a first function of the
external supply voltage, and the second regulator circuit generates
the second regulated output voltage as a second function of the
external supply voltage, the second function being different from
the first function. In operation, the first regulator circuit
supplies power to at least a portion of the array at a first
voltage when the external supply voltage has a magnitude that is
less than a predetermined voltage. When the external supply voltage
has a magnitude that is greater than the predetermined voltage, the
first regulator circuit supplies power to the array at a voltage
having a magnitude that is greater than the magnitude of the first
voltage. In contrast, the second voltage regulator supplies power
to the charge pump at a second voltage when the external supply
voltage has a magnitude that is less than the predetermined voltage
and also when the external supply voltage has a magnitude that is
greater than the predetermined voltage. As a result, the voltage of
power supplied to the array can be raised by raising the external
voltage without raising the voltage of power supplied to the charge
pump.
BRIEF DESCRIPTION OF THE DRAWINGS
[0017] FIG. 1 is a block diagram of a conventional memory
device.
[0018] FIG. 2 is a block diagram of a conventional system for
supplying regulated power to various components in the memory
device of FIG. 1.
[0019] FIG. 3 is a graph showing the voltage generated by the
system of FIG. 2 as a function of reference voltage or input power
voltage.
[0020] FIG. 4 is a block diagram of one embodiment of the invention
for supplying regulated power to various components in the memory
device of FIG. 1.
[0021] FIGS. 5A and 5B are graphs showing the voltage generated by
the embodiment of the invention shown in FIG. 4 as a function of
the external supply voltage.
[0022] FIG. 6 is a block diagram of another embodiment of the
invention for supplying regulated power to various components in
the memory device of FIG. 1.
[0023] FIG. 7 is a block diagram of a computer system that includes
the memory device of FIG. 1 containing an embodiment of the
inventive system for supplying regulated power to components in the
memory device.
DETAILED DESCRIPTION OF THE INVENTION
[0024] One embodiment of an internal voltage regulator 80' in
accordance with the invention is illustrated in FIG. 4. The voltage
regulator 80' may be used in the SDRAM 10 (FIG. 1) in place of the
voltage regulator 80. As shown in FIG. 4, the voltage regulator
80', like the voltage regulator 80, includes three identical
voltage regulator circuits 100, 102, 104. The voltage regulator
circuit 100 generates a regulated output voltage V.sub.CCR1 that
supplies power to the arrays 20, 22. The regulator circuit 102
generates a regulated output voltage V.sub.CCR2 that supplies power
to the other circuitry in the SDRAM 10. The regulator circuit 104
generates a regulated output voltage V.sub.CCR3 that supplies power
to the charge pumps 98. The charge pumps 98 then produce a pumped
output voltage V.sub.PP and a substrate bias voltage V.sub.BB.
[0025] Unlike the internal voltage regulator 80 of FIG. 2, the
embodiment of the internal voltage regulator 80' shown in FIG. 4
includes a respective reference voltage generator 110, 112, 114 for
each of the regulator circuits 100, 102, 104. Thus, the reference
voltage generator 110 applies a reference voltage V.sub.REF1 to the
voltage regulator circuit 100, the reference voltage generator 112
applies a reference voltage V.sub.REF2 to the voltage regulator
circuit 102, and the reference voltage generator 114 applies a
reference voltage V.sub.REF3 to the voltage regulator circuit 104.
As explained in greater detail below, it is significant that the
reference voltage V.sub.REF3 applied to the regulator circuit 104
may be different from the reference voltage V.sub.REF1 and
V.sub.REF2 applied to at least one of the other regulator circuits
100, 102. More particularly, since the reference voltage V.sub.REF3
applied to the regulator circuit 104 is different, the performance
characteristic of the regulator circuit 104 may be different. As
mentioned above, the design of the reference voltage circuits 110,
112, 114 having the characteristics described herein is well within
the ability of those skilled in the art. Therefore, in the interest
of brevity, an explanation of specific reference voltage circuits
will be omitted.
[0026] The operation of the internal voltage regulator 80' of FIG.
4 will now be explained with reference to FIGS. 5A and 5B. As shown
in FIG. 5A, the regulator circuit 104 receives a reference voltage
V.sub.REF3 that increases linearly with the external supply voltage
V.sub.CCX until the reference voltage V.sub.REF3 reaches 1.5 volts.
The regulated output voltage V.sub.CCR3 also increases linearly
with the external supply voltage V.sub.CCX at twice the rate as the
reference voltage V.sub.REF3 until the regulated output voltage
V.sub.CCR3 reaches 3 volts. The reference voltage V.sub.REF3 then
remains constant at 1.5 volts as the external supply voltage
V.sub.CCX continues to increase. The constant value of the
reference voltage V.sub.REF3 causes the regulated output voltage
V.sub.CCR3 to likewise remain constant at 3 volts. As a result,
when the external supply voltage V.sub.CCX is raised above the
normal operating range, e.g. to 5 volts, the regulated output
voltage V.sub.CCR3 remains at 3 volts, thereby preventing an
excessive voltage from being applied to the charge pumps 98.
[0027] The regulator circuit 100 supplying power to the arrays 20,
22 operates in a manner that is similar to that of regulator
circuit 104 as the external supply voltage V.sub.CCX is initially
increased. However, the reference voltage V.sub.REF1 no longer
increases with the external supply voltage V.sub.CCX when the
reference voltage V.sub.REF1 reaches 1.25 volts. Similarly, the
regulated output voltage V.sub.CCR1 no longer increases linearly
with the external supply voltage V.sub.CCX when the regulated
output voltage V.sub.REF1 reaches 2.5 volts. The reference voltage
V.sub.REF1 and the regulated output voltage V.sub.CCR1 remain
constant until the external supply voltage V.sub.CCX reaches 4
volts. Thereafter, the reference voltage V.sub.REF1 increases
linearly at half the rate of the external supply voltage V.sub.CCX.
As a result, the regulated output voltage V.sub.CCR1 increases
linearly with the external supply voltage V.sub.CCX when the
external supply voltage V.sub.CCX is increased above 4 volts.
[0028] The advantages of the regulator 80' of FIG. 4 will now be
explained using an example in which the external supply voltage
V.sub.CCX is increased above the normal operating range, e.g. to a
voltage of 5 volts. With an external supply voltage V.sub.CCX of 5
volts, the regulator circuit 104 continues to apply a regulated
output voltage V.sub.CCR3 of 3 volts to the charge pumps 98 just as
is it did with the external supply voltage V.sub.CCX was in its
normal operating range, as shown in FIG. 5A.
[0029] In contrast, as shown in FIG. 5B, the regulator circuit 100
applies a regulated output voltage V.sub.CCR1 to than the arrays
20, 22 that increases from 2.5 volts to 3.5 volts as the external
supply voltage V.sub.CCX increases from its normal operating range
to 5 volts. As a result, the internal voltage regulator 80' is able
to stress the arrays 20, 22 at a higher voltage than normally used
without applying excessive voltages to the charge pumps 98. The
regulator 80' thus avoids the problems described above with
reference to FIGS. 2 and 3 when stress testing the SDRAM 10 with a
voltage above the normal range of the external supply voltage
V.sub.CCX.
[0030] Although the internal voltage regulator 80' of FIG. 4 uses
three separate regulator circuits 100, 102, 104, it will be
understood that a fewer or greater number of regulator circuits may
be used as long as a separate regulator circuit is provided to
power the charge pumps 98 generating the pumped voltage V.sub.PP.
Thus, for example, the regulator circuit 104 may supply power to
the charge pumps 98, and the regulator circuit 100 may supply power
to the arrays 20, 22 and all of the other circuitry in the SDRAM
10. Using this embodiment, the regulator circuit 102 would be
unnecessary. Also, although specific performance characteristics of
the regulator circuits 100, 102, 104 have been described with
reference to FIGS. 4 and 5, it will be understood that regulator
circuits having other performance characteristics may be used.
[0031] Another embodiment of a internal voltage regulator in
accordance with the invention is illustrated in FIG. 6. The
internal voltage regulator 80" has the same topography at
conventional voltage regulator 80 of FIG. 2. However, the voltage
regulator 80" uses regulator circuits 120, 122, 124, that, unlike
the regulator circuits 90, 92, 94 used in the regulator 80 of FIG.
2, are not identical to each other and thus do not have the same
performance characteristics. Instead, the regulator circuit 124
supplying power to charge pumps 98 differs from the regulator
circuit 120 supplying power to the arrays 20, 22 and preferably
also to the regulator circuit 122 supplying power to the other
circuitry in the SDRAM 10. Thus, although the regulator circuits
120, 122, 124 all receive the same reference voltage V.sub.REF from
a common reference voltage generator 128, the performance
characteristics of the regulator circuit 124 cause it to generate a
regulated output voltage V.sub.CCR3 that differs from the regulated
output voltage V.sub.CCR1 generated by the regulator circuit 120 as
the external supply voltage V.sub.CCX is increased about its normal
operating range. For example, the regulator circuit 124 may be
designed so that it has the performance characteristics shown in
FIG. 5A. Similarly, the regulator circuit 120 may be designed so
that it has the performance characteristics shown in FIG. 5B. The
design of the regulator circuits 120, 122, 124 having these
characteristics is well within the ability of those skilled in the
art. Therefore, in the interest of brevity, an explanation of
specific regulator designs will be omitted.
[0032] As with the internal voltage regulator 80' of FIG. 4, the
voltage regulator 80" of FIG. 6 may be altered somewhat without
departing from the spirit of the invention. For example, the
regulator circuit 120 may be used to supply power to the arrays 20,
22 and the other circuitry in the SDRAM 10, thus making the
regulator circuit 122 unnecessary. Also, one or more of the
regulator circuits 120, 122, 124 may include an internal voltage
regulating component, such as a zener diode (not shown), thus
making the external reference voltage V.sub.REF unnecessary.
[0033] FIG. 7 is a block diagram of a computer system 200 that
includes the SDRAM 10 of FIG. 1 containing the voltage regulator
80' of FIG. 4 or the voltage regulator 80" of FIG. 6. The computer
system 200 includes a processor 202 for performing various
computing functions, such as executing specific software to perform
specific calculations or tasks. The processor 202 includes a
processor bus 204 that normally includes an address bus, a control
bus, and a data bus. In addition, the computer system 200 includes
one or more input devices 214, such as a keyboard or a mouse,
coupled to the processor 202 to allow an operator to interface with
the computer system 200. Typically, the computer system 200 also
includes one or more output devices 216 coupled to the processor
202, such output devices typically being a printer or a video
terminal. One or more data storage devices 218 are also typically
coupled to the processor 202 to store data or retrieve data from
external storage media (not shown). Examples of typical storage
devices 218 include hard and floppy disks, tape cassettes, and
compact disk read-only memories (CD-ROMs). The processor 202 is
also typically coupled to cache memory 226, which is usually static
random access memory ("SRAM") and to the SDRAM 10 through a memory
controller 230. The memory controller 230 normally includes the
control bus 79 and the address bus 14 that are coupled to the SDRAM
10. The data bus 72 of the SDRAM 10 may be coupled to the processor
bus 204 either directly (as shown), through the memory controller
230, or by some other means.
[0034] It is thus seen that voltage regulators in accordance with
the invention are capable of supplying regulated power to the
internal components of the SDRAM 10 while allowing the arrays to be
stress tested with a relatively high voltage without damaging the
charge pumps in the SDRAM 10. As mentioned above, although the
inventive voltage regulators have been described in the context of
an SDRAM 10, it will be understood that it may be used in other
types of memory devices, including DRAMs other than SDRAMs.
[0035] From the foregoing it will be appreciated that, although
specific embodiments of the invention have been described herein
for purposes of illustration, various modifications may be made
without deviating from the spirit and scope of the invention.
Accordingly, the invention is not limited except as by the appended
claims.
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