Yasaka; Anto

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yasaka; Anto.The latest application filed is for "ion source and electron source having single-atom termination structure, tip having single-atom termination structure, gas field".

Company Profile

2.20.20

Yasaka; Anto - Tokyo JP
Yasaka; Anto - Chiba JP
Yasaka; Anto - Chiba-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Ion source and electron source having single-atom termination structure, tip having single-atom termination structure, gas field ion source, focused ion beam apparatus, electron source, electron microscope, mask repair apparatus, and method of manufacturin Grant 10,529,531 - Oshima , et al. J	2020-01-07
Ion Source And Electron Source Having Single-atom Termination Structure, Tip Having Single-atom Termination Structure, Gas Field App 20190164719 - OSHIMA; Chuhei ; et al.	2019-05-30
Method for acquiring image and ion beam apparatus Grant 10,276,343 - Kozakai , et al.	2019-04-30
Method For Acquiring Image And Ion Beam Apparatus App 20180269029 - KOZAKAI; Tomokazu ; et al.	2018-09-20
Method for acquiring image and ion beam apparatus Grant 10,014,157 - Kozakai , et al. July 3, 2	2018-07-03
Focused ion beam apparatus Grant 9,793,085 - Yasaka , et al. October 17, 2	2017-10-17
Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus Grant 9,773,634 - Kozakai , et al. September 26, 2	2017-09-26
Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Electron Source, Electron Microscope, Electron Beam Applied Analysis Apparatus, Ion-Electron Multi-Beam Apparatus, Scanning Probe Microscope, and Mask Repair Apparatus App 20170148603 - Kozakai; Tomokazu ; et al.	2017-05-25
Emitter structure, gas ion source and focused ion beam system Grant 9,640,361 - Yasaka , et al. May 2, 2	2017-05-02
Method For Acquiring Image And Ion Beam Apparatus App 20170092461 - KOZAKAI; Tomokazu ; et al.	2017-03-30
Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus Grant 9,583,299 - Kozakai , et al. February 28, 2	2017-02-28
Repair Apparatus App 20160322123 - Aramaki; Fumio ; et al.	2016-11-03
Focused Ion Beam Apparatus App 20160225574 - YASAKA; Anto ; et al.	2016-08-04
Repair apparatus Grant 9,378,858 - Aramaki , et al. June 28, 2	2016-06-28
Focused ion beam apparatus with precious metal emitter surface Grant 9,336,979 - Yasaka , et al. May 10, 2	2016-05-10
Charged particle beam apparatus, thin film forming method, defect correction method and device forming method Grant 9,257,273 - Koyama , et al. February 9, 2	2016-02-09
Emitter Structure, Gas Ion Source And Focused Ion Beam System App 20150357147 - YASAKA; Anto ; et al.	2015-12-10
Emitter structure, gas ion source and focused ion beam system Grant 9,129,771 - Yasaka , et al. September 8, 2	2015-09-08
Focused Ion Beam Apparatus App 20150162160 - YASAKA; Anto ; et al.	2015-06-11
Method for fabricating emitter Grant 8,999,178 - Sugiyama , et al. April 7, 2	2015-04-07
Repair Apparatus App 20150053866 - Aramaki; Fumio ; et al.	2015-02-26
Nitrogen ions from a gas field ion source held at a pressure of 1.0 x 10^(-6) pa to 1.0 x 10^(-2) pa Grant 8,963,100 - Yasaka , et al. February 24, 2	2015-02-24
Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Electron Source, Electron Microscope, Electron Beam Applied Analysis Apparatus, Ion-Electron Multi-Beam Apparatus, Scanning Probe Microscope, and Mask Repair Apparatus App 20150047079 - Kozakai; Tomokazu ; et al.	2015-02-12
Emitter Structure, Gas Ion Source And Focused Ion Beam System App 20140291542 - YASAKA; Anto ; et al.	2014-10-02
Method For Fabricating Emitter App 20140246397 - SUGIYAMA; Yasuhiko ; et al.	2014-09-04
Method for fabricating emitter Grant 8,764,994 - Sugiyama , et al. July 1, 2	2014-07-01
Method For Fabricating Emitter App 20130248483 - SUGIYAMA; Yasuhiko ; et al.	2013-09-26
Charged Particle Beam Apparatus, Thin Film Forming Method, Defect Correction Method And Device Forming Method App 20130224889 - Koyama; Yoshihiro ; et al.	2013-08-29
Defect repair apparatus and method for EUV mask using a hydrogen ion beam Grant 8,460,842 - Ogawa , et al. June 11, 2	2013-06-11
Focused Ion Beam Apparatus App 20130099133 - YASAKA; Anto ; et al.	2013-04-25
Defect repair apparatus and method for EUV mask App 20110189593 - Ogawa; Takashi ; et al.	2011-08-04
Photomask correction method using composite charged particle beam, and device used in the correction method App 20070267579 - Sugiyama; Yasuhiko ; et al.	2007-11-22
Photomask correction method using composite charged particle beam, and device used in the correction method Grant 7,172,839 - Sugiyama , et al. February 6, 2	2007-02-06
Photomask correction method using composite charged particle beam, and device used in the correction method App 20040131953 - Sugiyama, Yasuhiko ; et al.	2004-07-08
Method of correcting a pattern film Grant 4,902,530 - Yasaka , et al. February 20, 1	1990-02-20

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