loadpatents
name:-0.060811042785645
name:-0.051079034805298
name:-0.018444061279297
Yan; Chun Patent Filings

Yan; Chun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yan; Chun.The latest application filed is for "processing of workpieces using flourocarbon plasma".

Company Profile
18.44.52
  • Yan; Chun - San Jose CA
  • Yan; Chun - Hangzhou CN
  • Yan; Chun - Santa Clara CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Silicon mandrel etch after native oxide punch-through
Grant 11,387,115 - Yan , et al. July 12, 2
2022-07-12
Spacer etching process
Grant 11,276,560 - Sung , et al. March 15, 2
2022-03-15
Spacer open process by dual plasma
Grant 11,195,718 - Sung , et al. December 7, 2
2021-12-07
Processing of Workpieces Using Flourocarbon Plasma
App 20210305071 - Wang; Shanyu ;   et al.
2021-09-30
Ozone treatment for selective silicon nitride etch over silicon
Grant 11,043,393 - Wang , et al. June 22, 2
2021-06-22
Spacer Etching Process
App 20210066047 - Sung; Tsai Wen ;   et al.
2021-03-04
Processing Of Workpieces Using Deposition Process And Etch Process
App 20210020445 - Wang; Shanyu ;   et al.
2021-01-21
Spacer Open Process By Dual Plasma
App 20210005456 - Sung; Tsai Wen ;   et al.
2021-01-07
Post Plasma Gas Injection In A Separation Grid
App 20200243305 - Zeng; Weimin ;   et al.
2020-07-30
Ozone Treatment for Selective Silicon Nitride Etch Over Silicon
App 20200234969 - Wang; Shanyu ;   et al.
2020-07-23
Silicon Mandrel Etch After Native Oxide Punch-through
App 20200203182 - Yan; Chun ;   et al.
2020-06-25
Integrated system and method for source/drain engineering
Grant 10,504,717 - Yan , et al. Dec
2019-12-10
Method for removing native oxide and residue from a III-V group containing surface
Grant 10,438,796 - Yan , et al. O
2019-10-08
Method for protecting cloud storage video data and system thereof
Grant 10,395,048 - Zhou , et al. A
2019-08-27
UV radiation system and method for arsenic outgassing control in sub 7nm CMOS fabrication
Grant 10,332,739 - Yan , et al.
2019-06-25
Degassing Chamber For Arsenic Related Processes
App 20190169767 - BAO; Xinyu ;   et al.
2019-06-06
Method And Apparatus For Wafer Outgassing Control
App 20190172728 - BAO; Xinyu ;   et al.
2019-06-06
Method of uniform channel formation
Grant 10,243,063 - Yan , et al.
2019-03-26
Method for wafer outgassing control
Grant 10,236,190 - Yan , et al.
2019-03-19
Self-aligned process for sub-10nm fin formation
Grant 10,224,421 - Ye , et al.
2019-03-05
Method of epitaxial growth shape control for CMOS applications
Grant 10,205,002 - Bao , et al. Feb
2019-02-12
Integrated System And Method For Source/drain Engineering
App 20190035623 - YAN; Chun ;   et al.
2019-01-31
Method For Conditioning A Processing Chamber For Steady Etching Rate Control
App 20190013221 - YAN; Chun
2019-01-10
Method for conditioning a processing chamber for steady etching rate control
Grant 10,177,017 - Yan J
2019-01-08
Methods and solutions for cleaning INGAAS (or III-V) substrates
Grant 10,147,596 - Yan , et al. De
2018-12-04
Method and apparatus for wafer outgassing control
Grant 10,115,607 - Bao , et al. October 30, 2
2018-10-30
Integrated system and method for source/drain engineering
Grant 10,090,147 - Yan , et al. October 2, 2
2018-10-02
Self-aligned Process For Sub-10nm Fin Formation
App 20180277649 - YE; Zhiyuan ;   et al.
2018-09-27
Integrated method for wafer outgassing reduction
Grant 10,043,667 - Yan , et al. August 7, 2
2018-08-07
Template Formation For Fully Relaxed Sige Growth
App 20180211836 - YAN; Chun ;   et al.
2018-07-26
Integrated System And Method For Source/drain Engineering
App 20180174825 - YAN; Chun ;   et al.
2018-06-21
Method of forming structures with V shaped bottom on silicon substrate
Grant 10,002,759 - Bao , et al. June 19, 2
2018-06-19
Methods And Solutions For Cleaning Ingaas (or Iii-v) Substrates
App 20180138032 - YAN; Chun ;   et al.
2018-05-17
Integrated System And Method For Source/drain Engineering
App 20180082836 - YAN; Chun ;   et al.
2018-03-22
Method And Apparatus For Wafer Outgassing Control
App 20180082874 - BAO; Xinyu ;   et al.
2018-03-22
Uv Radiation System And Method For Arsenic Outgassing Control In Sub 7nm Cmos Fabrication
App 20180082835 - YAN; Chun ;   et al.
2018-03-22
Degassing Chamber For Arsenic Related Processes
App 20180073162 - BAO; Xinyu ;   et al.
2018-03-15
Integrated Method For Wafer Outgassing Reduction
App 20180076031 - YAN; Chun ;   et al.
2018-03-15
Method and solution for cleaning InGaAs (or III-V) substrates
Grant 9,905,412 - Yan , et al. February 27, 2
2018-02-27
Method And System For Scheduling Video Analysis Tasks
App 20180052711 - Zhou; Mingyao ;   et al.
2018-02-22
Method Of Forming Structures With V Shaped Bottom On Silicon Substrate
App 20180033621 - BAO; Xinyu ;   et al.
2018-02-01
Method Of Uniform Channel Formation
App 20180033873 - YAN; Chun ;   et al.
2018-02-01
Method Of Epitaxial Growth Shape Control For Cmos Applications
App 20180033872 - BAO; Xinyu ;   et al.
2018-02-01
Gas Purge System And Method For Outgassing Control
App 20180033659 - YAN; Chun ;   et al.
2018-02-01
Method And Material For Cmos Contact And Barrier Layer
App 20180019121 - BAO; Xinyu ;   et al.
2018-01-18
Integrated process and structure to form III-V channel for sub-7nm CMOS devices
Grant 9,865,706 - Bao , et al. January 9, 2
2018-01-09
System and method in indium-gallium-arsenide channel height control for sub 7nm FinFET
Grant 9,852,903 - Yan , et al. December 26, 2
2017-12-26
Method For Wafer Outgassing Control
App 20170352557 - YAN; Chun ;   et al.
2017-12-07
Methods for removing contamination from surfaces in substrate processing systems
Grant 9,805,914 - Yan , et al. October 31, 2
2017-10-31
Method For Removing Native Oxide And Residue From A Iii-v Group Containing Surface
App 20170229303 - YAN; Chun ;   et al.
2017-08-10
System And Method In Indium-gallium-arsenide Channel Height Control For Sub 7nm Finfet
App 20170221706 - YAN; Chun ;   et al.
2017-08-03
Methods And Solutions For Cleaning Ingaas (or Iii-v) Substrates
App 20170162379 - YAN; Chun ;   et al.
2017-06-08
Method for removing native oxide and residue from a III-V group containing surface
Grant 9,653,291 - Yan , et al. May 16, 2
2017-05-16
Silicon-containing substrate cleaning procedure
Grant 9,653,282 - Yan , et al. May 16, 2
2017-05-16
Integrated Process And Structure To Form Iii-v Channel For Sub-7nm Cmos Devices
App 20170133224 - BAO; Xinyu ;   et al.
2017-05-11
Sputter etch processing for heavy metal patterning in integrated circuits
Grant 9,484,220 - Hoinkis , et al. November 1, 2
2016-11-01
Methods of surface interface engineering
Grant 9,472,416 - He , et al. October 18, 2
2016-10-18
Method For Protecting Cloud Storage Video Data And System Thereof
App 20160300071 - ZHOU; Bo ;   et al.
2016-10-13
Methods For Removing Contamination From Surfaces In Substrate Processing Systems
App 20160293384 - YAN; Chun ;   et al.
2016-10-06
Method For Removing Native Oxide And Residue From A Iii-v Group Containing Surface
App 20160141175 - YAN; Chun ;   et al.
2016-05-19
Silicon-containing Substrate Cleaning Procedure
App 20160035562 - YAN; Chun ;   et al.
2016-02-04
Copper residue chamber clean
Grant 9,114,438 - Hoinkis , et al. August 25, 2
2015-08-25
Methods Of Surface Interface Engineering
App 20150111389 - HE; JIM ZHONGYI ;   et al.
2015-04-23
Copper Residue Chamber Clean
App 20140345645 - Hoinkis; Mark ;   et al.
2014-11-27
Subtractive plasma etching of a blanket layer of metal or metal alloy
Grant 8,871,107 - Fuller , et al. October 28, 2
2014-10-28
Sputter Etch Processing For Heavy Metal Patterning In Integrated Circuits
App 20140264861 - HOINKIS; MARK D. ;   et al.
2014-09-18
Subtractive Plasma Etching Of A Blanket Layer Of Metal Or Metal Alloy
App 20140273437 - Fuller; Nicholas C. M. ;   et al.
2014-09-18
Methods for silicon electrode assembly etch rate and etch uniformity recovery
Grant 7,442,114 - Huang , et al. October 28, 2
2008-10-28
Method and apparatus for providing uniform plasma in a magnetic field enhanced plasma reactor
Grant 7,374,636 - Horioka , et al. May 20, 2
2008-05-20
Method for removal of metallic residue after plasma etching of a metal layer
Grant 7,320,942 - Chen , et al. January 22, 2
2008-01-22
Method and apparatus for controlling the magnetic field intensity in a plasma enhanced semiconductor wafer processing chamber
Grant 7,316,199 - Horioka , et al. January 8, 2
2008-01-08
Methods for silicon electrode assembly etch rate and etch uniformity recovery
App 20060138081 - Huang; Tuochuan ;   et al.
2006-06-29
Method for removing conductive residue
Grant 6,933,239 - Ying , et al. August 23, 2
2005-08-23
Method for planarizing an interconnect structure
App 20050079703 - Chen, Hui ;   et al.
2005-04-14
Method for etching an organic anti-reflective coating (OARC)
App 20050009342 - Chen, Hui ;   et al.
2005-01-13
Method of fabricating a magneto-resistive random access memory (MRAM) device
Grant 6,841,484 - Ying , et al. January 11, 2
2005-01-11
Method for removal of residue from a substrate
App 20040237997 - Rui, Ying ;   et al.
2004-12-02
Method for etching an aluminum layer using an amorphous carbon mask
App 20040229470 - Rui, Ying ;   et al.
2004-11-18
Method of fabricating a magneto-resistive random access memory (MRAM) device
App 20040209476 - Ying, Chentsau ;   et al.
2004-10-21
Method of etching metallic materials to form a tapered profile
App 20040171272 - Jin, Guangxiang ;   et al.
2004-09-02
Method for planarizing a copper interconnect structure
Grant 6,784,107 - Chen , et al. August 31, 2
2004-08-31
Method for removing conductive residue
App 20040137749 - Ying, Chentsau ;   et al.
2004-07-15
Method for removal of metallic residue after plasma etching of a metal layer
App 20030219912 - Chen, Xiaoyi ;   et al.
2003-11-27
Methods for etching an organic anti-reflective coating
Grant 6,649,532 - Chen , et al. November 18, 2
2003-11-18
Methods For Etching An Organic Anti-reflective Coating
App 20030209520 - Chen, Hui ;   et al.
2003-11-13
Method and apparatus for asymmetric gas distribution in a semiconductor wafer processing system
Grant 6,620,289 - Yan , et al. September 16, 2
2003-09-16
Method and apparatus for controlling the magnetic field intensity in a plasma enhanced semiconductor wafer processing chamber
App 20030085000 - Horioka, Keiji ;   et al.
2003-05-08
Method for etching low k dielectrics
Grant 6,547,977 - Yan , et al. April 15, 2
2003-04-15
Method for etching silicon oxynitride and dielectric antireflection coatings
Grant 6,537,918 - Ionov , et al. March 25, 2
2003-03-25
Method and apparatus for providing uniform plasma in a magnetic field enhanced plasma reactor
App 20030006008 - Horioka, Keiji ;   et al.
2003-01-09
Method of etching dielectric layers using a removable hardmask
Grant 6,458,516 - Ye , et al. October 1, 2
2002-10-01
Plasma assisted processing chamber with separate control of species density
Grant 6,352,049 - Yin , et al. March 5, 2
2002-03-05
Method for etching silicon oxynitride and dielectric antireflection coatings
App 20020016078 - Ionov, Pavel ;   et al.
2002-02-07
Method of pattern etching a low K dielectric layer
Grant 6,331,380 - Ye , et al. December 18, 2
2001-12-18
Method for etching silicon oxynitride and dielectric antireflection coatings
Grant 6,291,356 - Ionov , et al. September 18, 2
2001-09-18
Method of etching patterned layers useful as masking during subsequent etching or for damascene structures
Grant 6,080,529 - Ye , et al. June 27, 2
2000-06-27

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed