| Patent | Date |
|---|
Integrated circuit chip reliability qualification using a sample-specific expected fail rate
Grant 10,539,611 - Bickford , et al. Ja | 2020-01-21 |
Methodology to prevent metal lines from current pulse damage
Grant 10,216,870 - Bickford , et al. Feb | 2019-02-26 |
Critical path delay prediction
Grant 10,169,500 - Charlebois , et al. J | 2019-01-01 |
Chip performance monitoring system and method
Grant 10,006,964 - Charlebois , et al. June 26, 2 | 2018-06-26 |
Burn-in power performance optimization
Grant 9,940,430 - Bickford , et al. April 10, 2 | 2018-04-10 |
Integrated Circuit Chip Reliability Qualification Using A Sample-specific Expected Fail Rate
App 20180052201 - Bickford; Jeanne P. ; et al. | 2018-02-22 |
Integrated circuit chip reliability qualification using a sample-specific expected fail rate
Grant 9,891,275 - Bickford , et al. February 13, 2 | 2018-02-13 |
On-chip usable life depletion meter and associated method
Grant 9,791,502 - Bickford , et al. October 17, 2 | 2017-10-17 |
Resistance Measurement-dependent Integrated Circuit Chip Reliability Estimation
App 20170212165 - Bickford; Jeanne P. ; et al. | 2017-07-27 |
Methodology To Prevent Metal Lines From Current Pulse Damage
App 20170199949 - BICKFORD; JEANNE P. S. ; et al. | 2017-07-13 |
Burn-in Power Performance Optimization
App 20170161426 - Bickford; Jeanne P. ; et al. | 2017-06-08 |
Integrated circuit chip reliability using reliability-optimized failure mechanism targeting
Grant 9,639,645 - Bickford , et al. May 2, 2 | 2017-05-02 |
System and method for identifying operating temperatures and modifying of integrated circuits
Grant 9,625,325 - Bickford , et al. April 18, 2 | 2017-04-18 |
Integrated Circuit Chip Reliability Qualification Using A Sample-specific Expected Fail Rate
App 20160377674 - Bickford; Jeanne P. ; et al. | 2016-12-29 |
Integrated Circuit Chip Reliability Using Reliability-optimized Failure Mechanism Targeting
App 20160371413 - Bickford; Jeanne P. ; et al. | 2016-12-22 |
Reliability-optimized selective voltage binning
Grant 9,489,482 - Bickford , et al. November 8, 2 | 2016-11-08 |
On-chip Usable Life Depletion Meter And Associated Method
App 20160320214 - Bickford; Jeanne P. ; et al. | 2016-11-03 |
System And Method For Identifying Operating Temperatures And Modifying Of Integrated Circuits
App 20160240479 - Bickford; Jeanne P. ; et al. | 2016-08-18 |
Systems And Methods To Prevent Incorporation Of A Used Integrated Circuit Chip Into A Product
App 20160238653 - Bickford; Jeanne P. ; et al. | 2016-08-18 |
Chip Performance Monitoring System And Method
App 20160231379 - Charlebois; Margaret R. ; et al. | 2016-08-11 |
Chip performance monitoring system and method
Grant 9,383,766 - Charlebois , et al. July 5, 2 | 2016-07-05 |
Flexible performance screen ring oscillator within a scan chain
Grant 9,188,643 - Charlebois , et al. November 17, 2 | 2015-11-17 |
Adaptive power control using timing canonicals
Grant 9,157,956 - Bickford , et al. October 13, 2 | 2015-10-13 |
Performance screen ring oscillator formed from paired scan chains
Grant 9,128,151 - Charlebois , et al. September 8, 2 | 2015-09-08 |
Performance screen ring oscillator formed from multi-dimensional pairings of scan chains
Grant 9,097,765 - Charlebois , et al. August 4, 2 | 2015-08-04 |
Chip Performance Monitoring System And Method
App 20140195196 - Charlebois; Margaret R. ; et al. | 2014-07-10 |
Ring oscillator
Grant 8,754,696 - Charlebois , et al. June 17, 2 | 2014-06-17 |
Flexible Performance Screen Ring Oscillator Within A Scan Chain
App 20140132290 - Charlebois; Margaret R. ; et al. | 2014-05-15 |
Adaptive Power Control Using Timing Canonicals
App 20140074422 - Bickford; Jeanne P. ; et al. | 2014-03-13 |
Ring Oscillator
App 20140028365 - Charlebois; Margaret R. ; et al. | 2014-01-30 |
Circuit design using design variable function slope sensitivity
Grant 8,464,199 - Charlebois , et al. June 11, 2 | 2013-06-11 |
Method and apparatus for increased effectiveness of delay and transition fault testing
Grant 8,381,050 - Gillis , et al. February 19, 2 | 2013-02-19 |
Critical Path Delay Prediction
App 20130041608 - Charlebois; Margaret R. ; et al. | 2013-02-14 |
Semiconductor layer forming method and structure
Grant 8,341,588 - Herzl , et al. December 25, 2 | 2012-12-25 |
Method and system to optimize semiconductor products for power, performance, noise, and cost through use of variable power supply voltage compression
Grant 8,302,063 - Bickford , et al. October 30, 2 | 2012-10-30 |
Method And Device For Identifying And Implementing Flexible Logic Block Logic For Easy Engineering Changes
App 20120167022 - HERZL; Robert D. ; et al. | 2012-06-28 |
Method for identifying and implementing flexible logic block logic for easy engineering changes
Grant 8,181,148 - Herzl , et al. May 15, 2 | 2012-05-15 |
Semiconductor Layer Forming Method And Structure
App 20120083913 - Herzl; Robert D. ; et al. | 2012-04-05 |
Structure for identifying and implementing flexible logic block logic for easy engineering changes
Grant 8,141,028 - Herzl , et al. March 20, 2 | 2012-03-20 |
Chip design and fabrication method optimized for profit
Grant 8,086,988 - Buck , et al. December 27, 2 | 2011-12-27 |
Method And System To Optimize Semiconductor Products For Power, Performance, Noise, And Cost Through Use Of Variable Power Supply Voltage Compression
App 20110288829 - BICKFORD; Jeanne P. ; et al. | 2011-11-24 |
Minimizing impact of design changes for integrated circuit designs
Grant 8,060,845 - Herzl , et al. November 15, 2 | 2011-11-15 |
Method And Apparatus For Increased Effectiveness Of Delay And Transistion Fault Testing
App 20110121838 - Gillis; Pamela S. ; et al. | 2011-05-26 |
Chip Design And Fabrication Method Optimized For Profit
App 20100293512 - Buck; Nathan ; et al. | 2010-11-18 |
Method for Minimizing Impact of Design Changes For Integrated Circuit Designs
App 20100017773 - Herzl; Robert D. ; et al. | 2010-01-21 |
Method and Device for Identifying and Implementing Flexible Logic Block Logic for Easy Engineering Changes
App 20090183135 - Herzl; Robert D. ; et al. | 2009-07-16 |
Design Structure For Identifying And Implementing Flexible Logic Block Logic For Easy Engineering Changes
App 20090183134 - Herzl; Robert D. ; et al. | 2009-07-16 |
LSSD-compatible edge-triggered shift register latch
Grant 7,543,203 - Ashton , et al. June 2, 2 | 2009-06-02 |
Asic Logic Library Of Flexible Logic Blocks And Method To Enable Engineering Change
App 20090045839 - HERZL; Robert D. ; et al. | 2009-02-19 |
Asic Logic Library Of Flexible Logic Blocks And Method To Enable Engineering Change
App 20090045836 - Herzl; Robert D. ; et al. | 2009-02-19 |
Partial good integrated circuit and method of testing same
Grant 7,478,301 - Farnsworth, III , et al. January 13, 2 | 2009-01-13 |
Partial good integrated circuit and method of testing same
Grant 7,434,129 - Farnsworth, III , et al. October 7, 2 | 2008-10-07 |
Partial Good Integrated Circuit And Method Of Testing Same
App 20080209289 - Farnsworth; Leonard O. ; et al. | 2008-08-28 |
Partial Good Integrated Circuit And Method Of Testing Same
App 20080010571 - Farnsworth; Leonard O. III ; et al. | 2008-01-10 |
Partial good integrated circuit and method of testing same
Grant 7,305,600 - Farnsworth, III , et al. December 4, 2 | 2007-12-04 |
Lssd-compatible Edge-triggered Shift Register Latch
App 20050204244 - Ashton, Gerry ; et al. | 2005-09-15 |
Partial good integrated circuit and method of testing same
App 20050047224 - Farnsworth, Leonard O. III ; et al. | 2005-03-03 |
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