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1-(n,n-disubstituted carbamoyl) 4-(substituted sulfonyl)triazolin-5-one derivative, 4-(n,n-disubstituted carbamoyl) 1-(substituted sulfonyl)triazolin-5-one derivative, and herbicide containing said derivative as active ingredient
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1-(n,n-disubstituted Carbamoyl) 4-(substituted Sulfonyl)triazolin-5-one Derivative, 4-(n,n-disubstituted Carbamoyl) 1-(substituted Sulfonyl)triazolin-5-one Derivative, And Herbicide Containing Said Derivative As Active Ingredient
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Method For Evaluating Electrical Defect Density Of Semiconductor Layer, And Semiconductor Element
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Charge Trap Evaluation Method And Semiconductor Element
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Semiconductor Device Having Curved Gate Electrode Aligned With Curved Side-wall Insulating Film And Stress-introducing Layer Bet
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Semiconductor device having curved gate electrode aligned with curved side-wall insulating film and stress-introducing layer between channel region and source and drain regions
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Semiconductor device having curved gate electrode aligned with curved side-wall insulating film and stress-introducing layer between channel region and source and drain regions
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Semiconductor Device Having Curved Gate Electrode Aligned With Curved Side-wall Insulating Film And Stress-introducing Layer Between Channel Region And Source And Drain Regions
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Semiconductor device having curved gate electrode aligned with curved side-wall insulating film and stress-introducing layer between channel region and source and drain regions
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Semiconductor device
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Semiconductor device and method for manufacturing same
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