| Patent | Date |
|---|
Semiconductor device, method of generating pattern for semiconductor device, method of manufacturing semiconductor device, and apparatus for generating pattern for semiconductor device
Grant 7,911,027 - Itoh , et al. March 22, 2 | 2011-03-22 |
Semiconductor device method of generating semiconductor device pattern method of semiconductor device and pattern generator for semiconductor device
Grant 7,307,333 - Itoh , et al. December 11, 2 | 2007-12-11 |
Design method for semiconductor integrated circuit suppressing power supply noise
Grant 7,278,124 - Shimazaki , et al. October 2, 2 | 2007-10-02 |
Semiconductor device, method of generating pattern for semiconductor device, method of manufacturing semiconductor device, and apparatus for generating pattern for semiconductor device
App 20070187777 - Itoh; Mitsumi ; et al. | 2007-08-16 |
Semiconductor Device Layout Inspection Method
App 20070136702 - MUKAI; Kiyohito ; et al. | 2007-06-14 |
Semiconductor device, method of generating pattern for semiconductor device, method of manufacturing semiconductor device and device of generating pattern used for semiconductor device
Grant 7,171,645 - Ito , et al. January 30, 2 | 2007-01-30 |
Mask pattern inspecting method, inspection apparatus, inspecting data used therein and inspecting data generating method
App 20070009147 - Tokunaga; Shinya ; et al. | 2007-01-11 |
Mask pattern inspecting method, inspection apparatus, inspecting data used therein and inspecting data generating method
Grant 7,114,144 - Tokunaga , et al. September 26, 2 | 2006-09-26 |
Semiconductor device, method of generating pattern for semiconductor device, method of manufacturing semiconductor device and device for generating pattern used for semiconductor device
Grant 7,062,732 - Ito , et al. June 13, 2 | 2006-06-13 |
Method of analyzing operation of semiconductor integrated circuit device, analyzing apparatus used in the same, and optimization designing method using the same
App 20060091550 - Shimazaki; Kenji ; et al. | 2006-05-04 |
Method of analyzing electromagnetic interference
Grant 7,039,572 - Narahara , et al. May 2, 2 | 2006-05-02 |
Method of analyzing electromagnetic interference
Grant 6,959,250 - Shimazaki , et al. October 25, 2 | 2005-10-25 |
Semiconductor integrated circuit device, method of enerating pattern thereof, method of manufacturing the same, and pattern generating apparatus for the same
App 20050224914 - Mukai, Kiyohito ; et al. | 2005-10-13 |
Layout data verification method, mask pattern verification method and circuit operation verification method
App 20050204327 - Mukai, Kiyohito ; et al. | 2005-09-15 |
Interconnection structure and method for designing the same
Grant 6,943,129 - Hyoto , et al. September 13, 2 | 2005-09-13 |
Design method for semiconductor integrated circuit suppressing power supply noise
App 20050149894 - Shimazaki, Kenji ; et al. | 2005-07-07 |
Method for analyzing power supply noise of semiconductor integrated circuit
App 20050114054 - Shimazaki, Kenji ; et al. | 2005-05-26 |
Method and apparatus for analyzing electromagnetic interference
Grant 6,876,210 - Shimazaki , et al. April 5, 2 | 2005-04-05 |
Semiconductor device method of generating semiconductor device pattern method of semiconductor device and pattern generator for semiconductor device
App 20050017320 - Itoh, Mitsumi ; et al. | 2005-01-27 |
Substrate noise analyzing method for semiconductor integrated circuit, semiconductor integrated circuit, and substrate noise analyzing device for semiconductor integrated circuit
App 20050005254 - Hirano, Shouzou ; et al. | 2005-01-06 |
Electromagnetic disturbance analysis method and apparatus and semiconductor device manufacturing method using the method
Grant 6,810,340 - Shimazaki , et al. October 26, 2 | 2004-10-26 |
Method for optimizing electromagnetic interference and method for analyzing the electromagnetic interference
Grant 6,782,347 - Hirano , et al. August 24, 2 | 2004-08-24 |
Mask pattern inspecting method, inspection apparatus, inspecting data used therein and inspecting data generating method
App 20040148584 - Tokunaga, Shinya ; et al. | 2004-07-29 |
Semiconductor device, method of generating pattern for semiconductor device, method of manufacturing semiconductor device and device of generating pattern used for semiconductor device
App 20040139412 - Ito, Mitsumi ; et al. | 2004-07-15 |
Semiconductor device layout inspection method
App 20040139407 - Mukai, Kiyohito ; et al. | 2004-07-15 |
Electromagnetic interference analysis method and apparatus
Grant 6,754,598 - Shimazaki , et al. June 22, 2 | 2004-06-22 |
Semiconductor device, method of generating pattern for semiconductor device, method of manufacturing semiconductor device and device for generating pattern used for semiconductor device
App 20040102034 - Ito, Mitsumi ; et al. | 2004-05-27 |
Interconnection structure and method for designing the same
App 20040101996 - Hyoto, Chihiro ; et al. | 2004-05-27 |
Latch-up verifying method and latch-up verifying apparatus capable of varying over-sized region
Grant 6,718,528 - Kimura , et al. April 6, 2 | 2004-04-06 |
Interconnection structure and method for designing the same
Grant 6,710,449 - Hyoto , et al. March 23, 2 | 2004-03-23 |
Latch-up verifying method and latch-up verifying apparatus capable of varying over-sized region
App 20030074641 - Kimura, Shinichi ; et al. | 2003-04-17 |
Electromagnetic interference analysis method and apparatus
App 20030057966 - Shimazaki, Kenji ; et al. | 2003-03-27 |
Interconnection structure and method for designing the same
App 20030049945 - Hyoto, Chihiro ; et al. | 2003-03-13 |
Electromagnetic disturbance analysis method and apparatus and semiconductor device manufacturing method using the method
App 20020147553 - Shimazaki, Kenji ; et al. | 2002-10-10 |
Semiconductor device, method of creating pattern of the same, method of manufacturing the same, and apparatus for creating pattern of the same
App 20020109205 - Sawada, Masatoshi ; et al. | 2002-08-15 |
Pattern forming method
Grant 6,434,730 - Ito , et al. August 13, 2 | 2002-08-13 |
Method and apparatus for analyzing electromagnetic interference
App 20020075018 - Shimazaki, Kenji ; et al. | 2002-06-20 |
Method for optimizing electromagnetic interference and method for analyzing the electromagnetic interference
App 20020065643 - Hirano, Shouzou ; et al. | 2002-05-30 |
Electromagnetic interference analysis method and apparatus
App 20020045995 - Shimazaki, Kenji ; et al. | 2002-04-18 |
Semiconductor device geometrical pattern correction process and geometrical pattern extraction process
Grant 6,183,920 - Tsujikawa , et al. February 6, 2 | 2001-02-06 |
| 