Tsay; Cherng-Shyan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tsay; Cherng-Shyan.The latest application filed is for "method and apparatus for integrated circuit mask patterning".

Company Profile

1.12.12

Tsay; Cherng-Shyan - Toufen Township TW
Tsay; Cherng-Shyan - Miaoli N/A TW
Tsay; Cherng-Shyan - Toufen Township, Miaoli County N/A TW
Tsay; Cherng-Shyan - Toufen Town TW
Tsay; Cherng-Shyan - Hsinchu TW
Tsay; Cherng-Shyan - Hsinchu City TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and Apparatus for Integrated Circuit Mask Patterning App 20210240907 - Huang; Chin-Min ; et al.	2021-08-05
Method and apparatus for integrated circuit mask patterning Grant 10,990,744 - Huang , et al. April 27, 2	2021-04-27
Method and Apparatus for Integrated Circuit Mask Patterning App 20180137233 - Huang; Chin-Min ; et al.	2018-05-17
Method and apparatus for integrated circuit mask patterning Grant 9,870,443 - Huang , et al. January 16, 2	2018-01-16
Method and Apparatus for Integrated Circuit Mask Patterning App 20160085906 - Huang; Chin-Min ; et al.	2016-03-24
Photolithography scattering bar structure and method Grant 9,213,233 - Chang , et al. December 15, 2	2015-12-15
Method of lithographic process evaluation Grant 9,026,956 - Chang , et al. May 5, 2	2015-05-05
Method Of Lithographic Process Evaluation App 20150106771 - Chang; Chia-Cheng ; et al.	2015-04-16
Design Structure For Chip Extension App 20150082265 - Huang; Chin-Min ; et al.	2015-03-19
Structure for chip extension Grant 8,972,912 - Huang , et al. March 3, 2	2015-03-03
OPC method with higher degree of freedom Grant 8,972,909 - Chang , et al. March 3, 2	2015-03-03
Photolithogrpahy Scattering Bar Structure And Method App 20150017571 - CHANG; Chia-Cheng ; et al.	2015-01-15
Method of forming and using photolithography mask having a scattering bar structure Grant 8,677,290 - Yen , et al. March 18, 2	2014-03-18
Method and apparatus for enhanced optical proximity correction Grant 8,589,830 - Chang , et al. November 19, 2	2013-11-19
Method And Apparatus For Enhanced Optical Proximity Correction App 20130239071 - Chang; Chia-Cheng ; et al.	2013-09-12
Method Of Forming And Using Photolithography Mask Having A Scattering Bar Structure App 20120040276 - Yen; Yung-Sung ; et al.	2012-02-16
Photolithography mask having a scattering bar structure that includes transverse linear assist features Grant 8,048,590 - Yen , et al. November 1, 2	2011-11-01
Regression system and methods for optical proximity correction modeling Grant 7,778,805 - Huang , et al. August 17, 2	2010-08-17
Photolithography Scattering Bar Structure And Method App 20090246648 - Yen; Yung-Sung ; et al.	2009-10-01
Photolithography scattering bar structure and method App 20070111109 - Yen; Yung-Sung ; et al.	2007-05-17
Regression system and methods for optical proximity correction modeling App 20070038417 - Huang; Wen Chun ; et al.	2007-02-15

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