Teich; Michael

Patent Applications and Registrations

Patent applications and USPTO patent grants for Teich; Michael.The latest application filed is for "probe systems and methods for collecting an optical image of a device under test".

Company Profile

3.33.32

Teich; Michael - Moritzburg DE
Teich; Michael - Friedewald DE
Teich; Michael - Moritzburg OT Friedewald DE
TEICH; Michael - Moritz OT Friedewald DE
Teich; Michael - Riedewald DE
Teich; Michael - Mannheim DE
Teich; Michael - Mannehim DE
Teich; Michael - D-68199 Mannheim DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Probe systems and methods that utilize a flow-regulating structure for improved collection of an optical image of a device under test Grant 10,698,025 - Teich , et al.	2020-06-30
Probe Systems And Methods For Collecting An Optical Image Of A Device Under Test App 20200025823 - Teich; Michael ; et al.	2020-01-23
Shielded probe systems with controlled testing environments Grant 10,281,492 - Teich , et al.	2019-05-07
Shielded Probe Systems With Controlled Testing Environments App 20180031608 - Teich; Michael ; et al.	2018-02-01
Shielded Probe Systems With Controlled Testing Environments App 20170292974 - Teich; Michael ; et al.	2017-10-12
Shielded probe systems with controlled testing environments Grant 9,784,763 - Teich , et al. October 10, 2	2017-10-10
Probe Systems And Methods Including Active Environmental Control App 20170248973 - Teich; Michael ; et al.	2017-08-31
Method for verifying a test substrate in a prober under defined thermal conditions Grant 9,632,108 - Teich , et al. April 25, 2	2017-04-25
Method for testing a test substrate under defined thermal conditions and thermally conditionable prober Grant 9,395,411 - Kiesewetter , et al. July 19, 2	2016-07-19
Removing material from defective opening in glass mold Grant 9,254,533 - Cohen , et al. February 9, 2	2016-02-09
Method For Verifying A Test Substrate In A Prober Under Defined Thermal Conditions App 20140239991 - Teich; Michael ; et al.	2014-08-28
Removing material from defective opening in glass mold and related glass mold for injection molded solder Grant 8,800,952 - Cohen , et al. August 12, 2	2014-08-12
Method for verifying a test substrate in a prober under defined thermal conditions Grant 8,692,567 - Teich , et al. April 8, 2	2014-04-08
Method For Testing A Test Substrate Under Defined Thermal Conditions And Thermally Conditionable Prober App 20140028337 - Kiesewetter; Joerg ; et al.	2014-01-30
Method for testing a test substrate under defined thermal conditions and thermally conditionable prober Grant 8,497,693 - Kiesewetter , et al. July 30, 2	2013-07-30
Probe station for on-wafer-measurement under EMI-shielding Grant 8,344,744 - Schmidt , et al. January 1, 2	2013-01-01
Removing Material From Defective Opening In Glass Mold App 20120241116 - Cohen; Jerome D. ; et al.	2012-09-27
Chuck with triaxial construction Grant 8,240,650 - Teich , et al. August 14, 2	2012-08-14
Removing material from defective opening in glass mold Grant 8,237,086 - Cohen , et al. August 7, 2	2012-08-07
Removing Material From Defective Opening In Glass Mold And Related Glass Mold For Injection Molded Solder App 20120186771 - Cohen; Jerome D. ; et al.	2012-07-26
Method for increasing the accuracy of the positioning of a first object relative to a second object Grant 8,094,925 - Schneidewind , et al. January 10, 2	2012-01-10
Arrangement and method for focusing a multiplane image acquisition on a prober Grant 8,072,586 - Teich , et al. December 6, 2	2011-12-06
Method and apparatus for the correction of defective solder bump arrays Grant 8,044,320 - Herz , et al. October 25, 2	2011-10-25
Method For Verifying A Test Substrate In A Prober Under Defined Thermal Conditions App 20110241711 - Teich; Michael ; et al.	2011-10-06
Probe Station For On-wafer-measurement Under Emi-shielding App 20110227602 - SCHMIDT; Axel ; et al.	2011-09-22
Arrangement And Method For Image Acquisition On A Prober App 20110181710 - Teich; Michael ; et al.	2011-07-28
Arrangement And Method For Focusing A Multiplane Image Acquisition On A Prober App 20110013011 - Teich; Michael ; et al.	2011-01-20
Method For Testing A Test Substrate Under Defined Thermal Conditions And Thermally Conditionable Prober App 20100289511 - Kiesewetter; Joerg ; et al.	2010-11-18
Device for rapidly changing objectives with the aid of threaded fastening Grant 7,796,352 - Teich , et al. September 14, 2	2010-09-14
Method For Increasing The Accuracy Of The Positioning Of A First Object Relative To A Second Object App 20100111403 - Schineidewind; Stefan ; et al.	2010-05-06
Probe For Temporarily Electrically Contacting A Solar Cell App 20100045264 - KIESEWETTER; Jorg ; et al.	2010-02-25
Method And Device For Forming A Temporary Electrical Contact To A Solar Cell App 20100045265 - KIESEWETTER; Jorg ; et al.	2010-02-25
Removing Material From Defective Opening In Glass Mold And Related Glass Mold For Injection Molded Solder App 20090179020 - Cohen; Jerome D. ; et al.	2009-07-16
Method For Increasing The Accuracy Of The Positioning Of A First Object Relative To A Second Object App 20080298671 - Schneidewind; Stefan ; et al.	2008-12-04
Chuck With Triaxial Construction App 20080224426 - TEICH; Michael ; et al.	2008-09-18
Arrangement And Method For Focusing A Multiplane Image Acquisition On A Prober App 20080212078 - Teich; Michael ; et al.	2008-09-04
Device For Rapidly Changing Objectives With The Aid Of Threaded Fastening App 20080186602 - Teich; Michael ; et al.	2008-08-07
Method And Apparatus For The Correction Of Defective Solder Bump Arrays App 20080173697 - Herz; Enrico ; et al.	2008-07-24
Arrangement And Method For Image Acquisition On A Prober App 20080158664 - Teich; Michael ; et al.	2008-07-03
Weight for a vehicle Grant D549,740 - Teich August 28, 2	2007-08-28
Process For The Inspection Of A Variety Of Repetitive Structures App 20070064992 - Teich; Michael ; et al.	2007-03-22
Fender holding mechanism App 20060108765 - Teich; Michael	2006-05-25
Test apparatus with loading device Grant 7,038,441 - Stoll , et al. May 2, 2	2006-05-02
Folding vehicle seat Grant 6,916,057 - Teich July 12, 2	2005-07-12
Substrate-holding device for testing circuit arrangements on substrates Grant 6,864,676 - Kiesewetter , et al. March 8, 2	2005-03-08
Method for increasing the accuracy of the positioning of a first object relative to a second object App 20040208355 - Schneidewind, Stefan ; et al.	2004-10-21
Folding vehicle seat App 20040164598 - Teich, Michael	2004-08-26
Test apparatus with loading device App 20040108847 - Stoll, Karsten ; et al.	2004-06-10
Tester for pressure sensors Grant 6,688,156 - Dietrich , et al. February 10, 2	2004-02-10
Pre-assembled wall unit for a vehicle cab Grant 6,578,907 - Teich June 17, 2	2003-06-17
Substrate-holding device for testing circuit arrangements on substrates App 20020163350 - Kiesewetter, Jorg ; et al.	2002-11-07
Tester for pressure sensors App 20020152794 - Dietrich, Claus ; et al.	2002-10-24
Pre-assembled wall unit for a vehicle cab App 20020027380 - Teich, Michael	2002-03-07
Storage container attachment device App 20020014506 - Teich, Michael	2002-02-07
Hydro-pneumatic driven axle suspension Grant 6,145,859 - Altherr , et al. November 14, 2	2000-11-14
Pivoting spring-mounted axle suspension Grant 5,879,016 - Altherr , et al. March 9, 1	1999-03-09
Vehicle cab ventilating system Grant 5,860,856 - Teich , et al. January 19, 1	1999-01-19
Supplementary weight for vehicle ballasting Grant 5,690,359 - Teich November 25, 1	1997-11-25
Mounting arrangement for an air cleaner Grant 5,277,157 - Teich January 11, 1	1994-01-11
Suction air filter for combustion engines Grant 5,137,557 - Behrendt , et al. August 11, 1	1992-08-11
Ventilating arrangement for the cab of a vehicle Grant 5,119,718 - Wagner , et al. June 9, 1	1992-06-09