loadpatents
name:-0.02361011505127
name:-0.021205186843872
name:-0.0071310997009277
TAN; Yun Ling Patent Filings

TAN; Yun Ling

Patent Applications and Registrations

Patent applications and USPTO patent grants for TAN; Yun Ling.The latest application filed is for "integrated thin film resistor and memory device".

Company Profile
5.19.21
  • TAN; Yun Ling - Singapore SG
  • Tan; Yun Ling - Singappore SG
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Integrated Thin Film Resistor And Memory Device
App 20220208675 - GAN; Kah Wee ;   et al.
2022-06-30
Thin film conductive material with conductive etch stop layer
Grant 11,315,876 - Rao , et al. April 26, 2
2022-04-26
Via Structures Of Passive Semiconductor Devices
App 20220093508 - RAO; XUESONG ;   et al.
2022-03-24
Thin Film Conductive Material With Conductive Etch Stop Layer
App 20210257300 - RAO; XUESONG ;   et al.
2021-08-19
Methods for producing integrated circuits with magnets and a wet etchant for the same
Grant 10,784,332 - Li , et al. Sept
2020-09-22
Methods of forming integrated circuits with solutions to interlayer dielectric void formation between gate structures
Grant 10,566,441 - Nong , et al. Feb
2020-02-18
Methods For Producing Integrated Circuits With Magnets And A Wet Etchant For The Same
App 20190296100 - Li; Liang ;   et al.
2019-09-26
Method and device for reducing contamination for reliable bond pads
Grant 10,410,854 - Mou , et al. Sept
2019-09-10
Methods Of Forming Integrated Circuits With Solutions To Interlayer Dielectric Void Formation Between Gate Structures
App 20190252515 - Nong; Hao ;   et al.
2019-08-15
Method And Device For Reducing Contamination For Reliable Bond Pads
App 20190206676 - MOU; Honghui ;   et al.
2019-07-04
Methods for removal of hard mask
Grant 10,115,625 - Li , et al. October 30, 2
2018-10-30
Methods For Removal Of Hard Mask
App 20180190537 - LI; Liang ;   et al.
2018-07-05
Integrated circuits having nickel silicide contacts and methods for fabricating the same
Grant 9,548,371 - Huang , et al. January 17, 2
2017-01-17
Method for forming through silicon via with wafer backside protection
Grant 9,230,886 - Leong , et al. January 5, 2
2016-01-05
Integrated Circuits Having Nickel Silicide Contacts And Methods For Fabricating The Same
App 20150311221 - Huang; Jingyan ;   et al.
2015-10-29
Method For Forming Through Silicon Via With Wafer Backside Protection
App 20150137359 - LEONG; Lup San ;   et al.
2015-05-21
Method for forming through silicon via with wafer backside protection
Grant 8,940,637 - Leong , et al. January 27, 2
2015-01-27
Method and apparatus to reduce thermal variations within an integrated circuit die using thermal proximity correction
Grant 8,860,142 - Poon , et al. October 14, 2
2014-10-14
High-K metal gate device
Grant 8,853,796 - Teh , et al. October 7, 2
2014-10-07
Spacer profile engineering using films with continuously increased etch rate from inner to outer surface
Grant 8,828,858 - Rao , et al. September 9, 2
2014-09-09
Method For Forming Through Silicon Via With Wafer Backside Protection
App 20140008810 - Leong; Lup San ;   et al.
2014-01-09
Spacer Profile Engineering Using Films With Continuously Increased Etch Rate From Inner To Outer Surface
App 20130187202 - Rao; Xuesong ;   et al.
2013-07-25
Step-like spacer profile
Grant 8,492,236 - Rao , et al. July 23, 2
2013-07-23
Step-like Spacer Profile
App 20130181259 - Rao; Xuesong ;   et al.
2013-07-18
Method And Apparatus To Reduce Thermal Variations Within An Integrated Circuit Die Using Thermal Proximity Correction
App 20130099321 - Poon; Debora Chyiu Hyia ;   et al.
2013-04-25
High-k Metal Gate Device
App 20120292719 - TEH; Young Way ;   et al.
2012-11-22
Method and apparatus to reduce thermal variations within an integrated circuit die using thermal proximity correction
Grant 8,293,544 - Poon , et al. October 23, 2
2012-10-23
Method and apparatus to reduce thermal variations within an integrated circuit die using thermal proximity correction
App 20100019329 - Poon; Debora Chyiu Hyia ;   et al.
2010-01-28
Semiconductor Device With Doped Transistor
App 20080087958 - Verma; Purakh Raj ;   et al.
2008-04-17
Semiconductor device and fabrication method
Grant 7,326,609 - Verma , et al. February 5, 2
2008-02-05
Ultra-thin gate oxide through post decoupled plasma nitridation anneal
Grant 7,176,094 - Zhong , et al. February 13, 2
2007-02-13
Semiconductor Device And Fabrication Method
App 20060252188 - Verma; Purakh Raj ;   et al.
2006-11-09
Ultra-thin gate oxide through post decoupled plasma nitridation anneal
App 20030170956 - Zhong, Dong ;   et al.
2003-09-11

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