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Patent applications and USPTO patent grants for Sumi, Yukinori.The latest application filed is for "semiconductor test apparatus and test method using the same".
Patent | Date |
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Semiconductor test apparatus and test method using the same App 20020036509 - Fukasawa, Norio ;   et al. | 2002-03-28 |
Semiconductor test apparatus and test method using the same Grant 6,333,638 - Fukasawa , et al. December 25, 2 | 2001-12-25 |
Semiconductor inspection apparatus and inspection method using the apparatus App 20010010469 - Fukasawa, Norio ;   et al. | 2001-08-02 |
Semiconductor inspection apparatus and inspection method using the apparatus Grant 6,246,249 - Fukasawa , et al. June 12, 2 | 2001-06-12 |
Semiconductor device including pad portion for testing Grant 5,767,528 - Sumi , et al. June 16, 1 | 1998-06-16 |
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