Su; Kuan-Cheng
Patent Applications and Registrations
Patent applications and USPTO patent grants for Su; Kuan-Cheng.The latest application filed is for "electrostatic discharge protection semiconductor device".
Company Profile
6.45.38
- Su; Kuan-Cheng - Taipei TW
- Su; Kuan-Cheng - Taipei City TW
- Su; Kuan-Cheng - Hsinchu TW
- Su; Kuan-Cheng - Hsinchu City TW
Patent Activity
| Patent | Date |
|---|---|
| Electrostatic discharge protection semiconductor device Grant 11,189,611 - Huang , et al. November 30, 2 | 2021-11-30 |
| Electrostatic discharge protection structure Grant 11,004,840 - Yen , et al. May 11, 2 | 2021-05-11 |
| Electrostatic Discharge Protection Semiconductor Device App 20200235088 - Huang; Chung-Yu ; et al. | 2020-07-23 |
| Electrostatic discharge protection semiconductor device Grant 10,672,759 - Huang , et al. | 2020-06-02 |
| Electrostatic Discharge Protection Structure App 20200144814 - Yen; Shih-Che ; et al. | 2020-05-07 |
| Electrostatic discharge protection semiconductor device Grant 10,629,585 - Huang , et al. | 2020-04-21 |
| Grounded gate NMOS transistor having source pulled back region Grant 10,366,978 - Chang , et al. July 30, 2 | 2019-07-30 |
| Electrostatic discharge protection semiconductor device Grant 10,204,897 - Huang , et al. Feb | 2019-02-12 |
| Electrostatic Discharge Protection Semiconductor Device App 20190006348 - Huang; Chung-Yu ; et al. | 2019-01-03 |
| Electrostatic discharge protection semiconductor device Grant 10,103,136 - Huang , et al. October 16, 2 | 2018-10-16 |
| Electrostatic discharge protection semiconductor device and layout structure of ESD protection semiconductor device Grant 10,090,291 - Chao , et al. October 2, 2 | 2018-10-02 |
| Electrostatic Discharge Protection Semiconductor Device App 20180269198 - Huang; Chung-Yu ; et al. | 2018-09-20 |
| Electrostatic Discharge Protection Device And Manufacturing Method Thereof App 20180254268 - Yen; Shih-Che ; et al. | 2018-09-06 |
| Electrostatic discharge protection device and manufacturing method thereof Grant 10,068,896 - Yen , et al. September 4, 2 | 2018-09-04 |
| Semiconductor device Grant 10,062,751 - Chiu , et al. August 28, 2 | 2018-08-28 |
| Electrostatic discharge protection semiconductor device Grant 10,008,489 - Huang , et al. June 26, 2 | 2018-06-26 |
| Semiconductor Device App 20180158902 - Chiu; Hou-Jen ; et al. | 2018-06-07 |
| Layout structure for electrostatic discharge protection Grant 9,899,369 - Tseng , et al. February 20, 2 | 2018-02-20 |
| Electrostatic Discharge Protection Semiconductor Device And Layout Structure Of Esd Protection Semiconductor Device App 20170309613 - Chao; Mei-Ling ; et al. | 2017-10-26 |
| Fin type electrostatic discharge protection device Grant 9,748,222 - Chen , et al. August 29, 2 | 2017-08-29 |
| Electrostatic Discharge Protection Semiconductor Device App 20170221876 - Huang; Chung-Yu ; et al. | 2017-08-03 |
| Electrostatic Discharge Protection Semiconductor Device App 20170194315 - Huang; Chung-Yu ; et al. | 2017-07-06 |
| Semiconductor device for electrostatic discharge protection and method of forming the same Grant 9,691,752 - Chao , et al. June 27, 2 | 2017-06-27 |
| ESD unit Grant 9,673,189 - Huang , et al. June 6, 2 | 2017-06-06 |
| Electrostatic discharge protection semiconductor device Grant 9,653,450 - Huang , et al. May 16, 2 | 2017-05-16 |
| Esd Unit App 20170125399 - Huang; Chung-Yu ; et al. | 2017-05-04 |
| Electrostatic discharge protection semiconductor device Grant 9,640,524 - Huang , et al. May 2, 2 | 2017-05-02 |
| Electrostatic Discharge Protection Semiconductor Device App 20170110446 - Huang; Chung-Yu ; et al. | 2017-04-20 |
| Electrostatic discharge protection device and method for producing an electrostatic discharge protection device Grant 9,607,977 - Wang , et al. March 28, 2 | 2017-03-28 |
| Electrostatic Discharge Protection Semiconductor Device App 20170084603 - Huang; Chung-Yu ; et al. | 2017-03-23 |
| Electrostatic Discharge Protection Device And Method For Producing An Electrostatic Discharge Protection Device App 20170084602 - Wang; Li-Cih ; et al. | 2017-03-23 |
| Layout Structure For Electrostatic Discharge Protection App 20170084604 - Tseng; Pei-Shan ; et al. | 2017-03-23 |
| Semiconductor device Grant 9,564,436 - Wen , et al. February 7, 2 | 2017-02-07 |
| Method of manufacturing fin diode structure Grant 9,559,091 - Wang , et al. January 31, 2 | 2017-01-31 |
| Fin Type Electrostatic Discharge Protection Device App 20160351558 - Chen; Yu-Chun ; et al. | 2016-12-01 |
| Fin diode structure Grant 9,455,246 - Wang , et al. September 27, 2 | 2016-09-27 |
| Electrostatic Discharge Protection Semiconductor Device App 20160260700 - Huang; Chung-Yu ; et al. | 2016-09-08 |
| Complementary metal-oxide-semiconductor device Grant 9,368,500 - Wang , et al. June 14, 2 | 2016-06-14 |
| Fin type electrostatic discharge protection device Grant 9,368,484 - Chen , et al. June 14, 2 | 2016-06-14 |
| Semiconductor device Grant 9,343,567 - He , et al. May 17, 2 | 2016-05-17 |
| Metal Gate Structure And Method Of Forming The Same App 20160126331 - Lee; Chi-Ju ; et al. | 2016-05-05 |
| Fin diode structure Grant 9,331,064 - Wang , et al. May 3, 2 | 2016-05-03 |
| Metal gate structure and method of forming the same Grant 9,331,161 - Lee , et al. May 3, 2 | 2016-05-03 |
| Semiconductor Device App 20160043216 - He; Yi-Ning ; et al. | 2016-02-11 |
| Method Of Manufacturing Fin Diode Structure App 20150303183 - Wang; Chang-Tzu ; et al. | 2015-10-22 |
| Fin Diode Structure App 20150287838 - Wang; Chang-Tzu ; et al. | 2015-10-08 |
| Fin Diode Structure App 20150221632 - Wang; Chang-Tzu ; et al. | 2015-08-06 |
| Fin diode structure Grant 9,093,565 - Wang , et al. July 28, 2 | 2015-07-28 |
| Semiconductor Device App 20150137255 - Wen; Yung-Ju ; et al. | 2015-05-21 |
| Complementary Metal-oxide-semiconductor Device App 20150123184 - Wang; Chang-Tzu ; et al. | 2015-05-07 |
| Electrostatic discharge protection apparatus Grant 8,963,202 - Wang , et al. February 24, 2 | 2015-02-24 |
| Fin Diode Structure App 20150014809 - Wang; Chang-Tzu ; et al. | 2015-01-15 |
| Electrostatic discharge (ESD) protection device Grant 8,817,434 - Wang , et al. August 26, 2 | 2014-08-26 |
| ESD protection circuit and ESD protection device thereof Grant 8,711,535 - Wang , et al. April 29, 2 | 2014-04-29 |
| Electrostatic discharge (ESD) device and semiconductor structure Grant 8,648,421 - Wen , et al. February 11, 2 | 2014-02-11 |
| ESD protection circuit and ESD protection device thereof App 20130250462 - Wang; Chang-Tzu ; et al. | 2013-09-26 |
| Electrostatic Discharge Protection Apparatus App 20130208379 - WANG; Chang-Tzu ; et al. | 2013-08-15 |
| Method for evaluating failure rate Grant 8,510,635 - Yang , et al. August 13, 2 | 2013-08-13 |
| ESD protection circuit and ESD protection device thereof Grant 8,467,162 - Wang , et al. June 18, 2 | 2013-06-18 |
| Electrostatic Discharge (esd) Device And Semiconductor Structure App 20130113045 - Wen; Yung-Ju ; et al. | 2013-05-09 |
| Electrostatic Discharge (esd) Protection Device App 20130088800 - WANG; Chang-Tzu ; et al. | 2013-04-11 |
| Alternating current (AC) stress test circuit, method for evaluating AC stress induced hot carrier injection (HCI) degradation, and test structure for HCI degradation evaluation Grant 8,283,941 - Kuo , et al. October 9, 2 | 2012-10-09 |
| ESD protection circuit and ESD protection device thereof App 20120170160 - Wang; Chang-Tzu ; et al. | 2012-07-05 |
| Method For Evaluating Failure Rate App 20120166130 - YANG; Yun-Chi ; et al. | 2012-06-28 |
| Alternating Current (AC) Stress Test Circuit, Method for Evaluating AC Stress Induced Hot Carrier Injection (HCI) Degradation, and Test Structure for HCI Degradation Evaluation App 20110193586 - Kuo; Sung-Nien ; et al. | 2011-08-11 |
| Method for fabricating a test structure Grant 7,759,957 - Ko , et al. July 20, 2 | 2010-07-20 |
| Test structure Grant 7,649,377 - Ko , et al. January 19, 2 | 2010-01-19 |
| Semiconductor Device And Manufacturing Method Thereof App 20090278170 - Yang; Yun-Chi ; et al. | 2009-11-12 |
| On-wafer AC stress test circuit Grant 7,589,551 - Yang , et al. September 15, 2 | 2009-09-15 |
| Test structure and test method App 20090058455 - Ko; Wen-Hsiung ; et al. | 2009-03-05 |
| Test structure and test method App 20090027074 - Ko; Wen-Hsiung ; et al. | 2009-01-29 |
| Wafer-level Reliability Yield Enhancement System And Related Method App 20080270056 - Yang; Yun-Chi ; et al. | 2008-10-30 |
| CVD oxide coding method for ultra-high density mask read-only-memory (ROM) Grant 5,597,753 - Sheu , et al. January 28, 1 | 1997-01-28 |
| Stacked CVD oxide architecture multi-state memory cell for mask read-only memories Grant 5,576,573 - Su , et al. November 19, 1 | 1996-11-19 |
| Field effect transistor with recessed buried source and drain regions Grant 5,382,534 - Sheu , et al. January 17, 1 | 1995-01-17 |
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