Patent | Date |
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Actively driven V.sub.REF for input buffer noise immunity Grant 7,400,544 - Stubbs , et al. July 15, 2 | 2008-07-15 |
Per-bit set-up and hold time adjustment for double-data rate synchronous DRAM Grant 7,274,605 - Stubbs September 25, 2 | 2007-09-25 |
Integrated semiconductor memory chip with presence detect data capability Grant 7,152,143 - Stubbs , et al. December 19, 2 | 2006-12-19 |
Per-Bit Set-Up and Hold Time Adjustment for Double-Data Rate Synchronous DRAM App 20060250862 - Stubbs; Eric T. | 2006-11-09 |
Per-bit set-up and hold time adjustment for double-data rate synchronous DRAM Grant 7,116,589 - Stubbs October 3, 2 | 2006-10-03 |
Variable delay line Grant 6,959,062 - Stubbs October 25, 2 | 2005-10-25 |
Actively driven VREF for input buffer noise immunity App 20050207227 - Stubbs, Eric T. ;   et al. | 2005-09-22 |
Integrated semiconductor memory chip with presence detect data capability Grant 6,947,341 - Stubbs , et al. September 20, 2 | 2005-09-20 |
Actively driven VREF for input buffer noise immunity Grant 6,898,144 - Stubbs , et al. May 24, 2 | 2005-05-24 |
Integrated semiconductor memory chip with presence detect data capability App 20050099863 - Stubbs, Eric T. ;   et al. | 2005-05-12 |
Method of preparing to test a capacitor Grant 6,882,587 - Beigel , et al. April 19, 2 | 2005-04-19 |
Per-bit set-up and hold time adjustment for double-data rate synchronous DRAM App 20050057978 - Stubbs, Eric T. | 2005-03-17 |
System and method for operating a memory array Grant 6,862,224 - Stubbs March 1, 2 | 2005-03-01 |
Per-bit set-up and hold time adjustment for double-data rate synchronous DRAM Grant 6,838,712 - Stubbs January 4, 2 | 2005-01-04 |
Method of preparing to test a capacitor App 20040240286 - Beigel, Kurt D. ;   et al. | 2004-12-02 |
Method and apparatus for reducing the lock time of a DLL Grant 6,791,381 - Stubbs , et al. September 14, 2 | 2004-09-14 |
Circuit and method for voltage regulation in a semiconductor device Grant 6,778,452 - Beigel , et al. August 17, 2 | 2004-08-17 |
Actively driven VREF for input buffer noise immunity App 20040120205 - Stubbs, Eric T. ;   et al. | 2004-06-24 |
Circuit and method for voltage regulation in a semiconductor device App 20040095822 - Beigel, Kurt D. ;   et al. | 2004-05-20 |
Compensation for a delay locked loop Grant 6,727,739 - Stubbs , et al. April 27, 2 | 2004-04-27 |
High speed memory array architecture App 20040052128 - Stubbs, Eric T. | 2004-03-18 |
Integrated semiconductor memory chip with presence detect data capability App 20040017723 - Stubbs, Eric T. ;   et al. | 2004-01-29 |
High speed memory architecture Grant 6,667,911 - Stubbs December 23, 2 | 2003-12-23 |
Compensation for a delay locked loop Grant 6,636,093 - Stubbs , et al. October 21, 2 | 2003-10-21 |
Integrated semiconductor memory chip with presence detect data capability Grant 6,625,692 - Stubbs , et al. September 23, 2 | 2003-09-23 |
Method of compensating for a defect within a semiconductor device Grant 6,600,687 - Beigel , et al. July 29, 2 | 2003-07-29 |
Actively driven VREF for input buffer noise immunity Grant 6,597,619 - Stubbs , et al. July 22, 2 | 2003-07-22 |
On-chip testing circuit and method for integrated circuits Grant 6,581,174 - Stubbs June 17, 2 | 2003-06-17 |
Per-bit Set-up And Hold Time Adjustment For Double-data Rate Synchronous Dram App 20030099135 - Stubbs, Eric T. | 2003-05-29 |
Method for reducing capacitive coupling between conductive lines Grant 6,570,258 - Ma , et al. May 27, 2 | 2003-05-27 |
High speed memory array architecture App 20030072183 - Stubbs, Eric T. | 2003-04-17 |
Method of compensating for a defect within a semiconductor device App 20030021171 - Beigel, Kurt D. ;   et al. | 2003-01-30 |
Actively driven V REF for input buffer noise immunity App 20020093868 - Stubbs, Eric T. ;   et al. | 2002-07-18 |
Compensation for a delay locked loop App 20020089361 - Stubbs, Eric T. ;   et al. | 2002-07-11 |
Method and apparatus for reducing the lock time of a DLL App 20020057119 - Stubbs, Eric T. ;   et al. | 2002-05-16 |
Method and apparatus for reducing the lock time of DLL Grant 6,388,480 - Stubbs , et al. May 14, 2 | 2002-05-14 |
On-chip testing circuit and method for integrated circuits App 20020026606 - Stubbs, Eric T. | 2002-02-28 |
Method of testing a memory array App 20020018381 - Beigel, Kurt D. ;   et al. | 2002-02-14 |
Margin-range apparatus for a sense amp's voltage-pulling transistor Grant 6,335,888 - Beigel , et al. January 1, 2 | 2002-01-01 |
Method for reducing capacitive coupling between conductive lines App 20010028112 - Ma, Kin F. ;   et al. | 2001-10-11 |
Margin-range apparatus for a sense amp's voltage-pulling transistor App 20010009522 - Beigel, Kurt D. ;   et al. | 2001-07-26 |
Method for reducing capactive coupling between conductive lines Grant 6,259,162 - Ma , et al. July 10, 2 | 2001-07-10 |
Method of compensating for a defect within a semiconductor device App 20010004333 - Beigel, Kurt D. ;   et al. | 2001-06-21 |
Method of stressing a memory device App 20010002889 - Beigel, Kurt D. ;   et al. | 2001-06-07 |
Method Of Testing A Memory Cell App 20010002888 - Beigel, Kurt D. ;   et al. | 2001-06-07 |
Method of altering the margin affecting a memory cell Grant 6,026,040 - Beigel , et al. February 15, 2 | 2000-02-15 |
Memory circuit voltage regulator Grant 5,877,993 - Biegel , et al. March 2, 1 | 1999-03-02 |