Stoll; Karsten

Patent Applications and Registrations

Patent applications and USPTO patent grants for Stoll; Karsten.The latest application filed is for "shielded probe systems with controlled testing environments".

Company Profile

1.13.12

Stoll; Karsten - Sohland an der Spree DE
Stoll; Karsten - Bautzen DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Shielded probe systems with controlled testing environments Grant 10,281,492 - Teich , et al.	2019-05-07
Shielded Probe Systems With Controlled Testing Environments App 20180031608 - Teich; Michael ; et al.	2018-02-01
Shielded Probe Systems With Controlled Testing Environments App 20170292974 - Teich; Michael ; et al.	2017-10-12
Shielded probe systems with controlled testing environments Grant 9,784,763 - Teich , et al. October 10, 2	2017-10-10
Method for testing a test substrate under defined thermal conditions and thermally conditionable prober Grant 9,395,411 - Kiesewetter , et al. July 19, 2	2016-07-19
Systems And Methods For Rotational Alignment Of A Device Under Test App 20140184003 - Kiesewetter; Jorg ; et al.	2014-07-03
Chuck for supporting and retaining a test substrate and a calibration substrate Grant 8,680,879 - Rumiantsev , et al. March 25, 2	2014-03-25
Method For Testing A Test Substrate Under Defined Thermal Conditions And Thermally Conditionable Prober App 20140028337 - Kiesewetter; Joerg ; et al.	2014-01-30
Method for testing a test substrate under defined thermal conditions and thermally conditionable prober Grant 8,497,693 - Kiesewetter , et al. July 30, 2	2013-07-30
Probe station for testing semiconductor substrates and comprising EMI shielding Grant 8,278,951 - Kanev , et al. October 2, 2	2012-10-02
Chuck with triaxial construction Grant 8,240,650 - Teich , et al. August 14, 2	2012-08-14
Chuck For Supporting And Retaining A Test Substrate And A Calibration Substrate App 20110291680 - Rumiantsev; Andrej ; et al.	2011-12-01
Chuck for supporting and retaining a test substrate and a calibration substrate Grant 7,999,563 - Rumiantsev , et al. August 16, 2	2011-08-16
Method For Testing A Test Substrate Under Defined Thermal Conditions And Thermally Conditionable Prober App 20100289511 - Kiesewetter; Joerg ; et al.	2010-11-18
Probe support with shield for the examination of test substrates under use of probe supports Grant 7,652,491 - Kanev , et al. January 26, 2	2010-01-26
Chuck For Supporting And Retaining A Test Substrate And A Calibration Substrate App 20090315581 - RUMIANTSEV; Andrej ; et al.	2009-12-24
Chuck With Triaxial Construction App 20080224426 - TEICH; Michael ; et al.	2008-09-18
Probe Support And Process For The Examination Of Test Substrates Under Use Of Probe Supports App 20080116917 - Kanev; Stojan ; et al.	2008-05-22
Probe Station To Testing Semiconductor Substrates And Comprising Emi Shielding App 20080116918 - Kanev; Stojan ; et al.	2008-05-22
Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station Grant 7,265,536 - Kiesewetter , et al. September 4, 2	2007-09-04
Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station App 20060212248 - Kiesewetter; Joerg ; et al.	2006-09-21
Test apparatus with loading device Grant 7,038,441 - Stoll , et al. May 2, 2	2006-05-02
Test apparatus with loading device App 20040108847 - Stoll, Karsten ; et al.	2004-06-10

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