Solid State Measurements Inc
USPTO Trademark & Patent Filings
Trademark applications and grants for Solid State Measurements Inc. Solid State Measurements Inc has 7 trademark applications. The latest application filed is for "NEOMETRIK"
- Company Aliases
- Solid State Measurements, Inc.
- Solid State Measurements, Inc. - Pittsburgh PA
Trademarks Patents
| Patent Application | Date |
|---|---|
| Method of destructive testing the dielectric layer of a semiconductor wafer or sample 20080290889 - 11/805788 Hillard; Robert J. | 2008-11-27 |
| Elastic metal gate MOS transistor for surface mobility measurement in semiconductor materials 20070109007 - 11/281117 Hillard; Robert J. | 2007-05-17 |
| Method and system for automatically determining electrical properties of a semiconductor wafer or sample 20070046310 - 11/216505 Hillard; Robert J. ; et al. | 2007-03-01 |
| Method of measuring semiconductor wafers with an oxide enhanced probe 20060219658 - 11/099114 Howland; William H. JR. | 2006-10-05 |
| In-situ wafer and probe desorption using closed loop heating 20060097740 - 10/982344 Howland; William H. JR. ; et al. | 2006-05-11 |
Mark Image Registration | Serial | Trademark Application Date |
|---|---|
"NEOMETRIK" 3558650 77314171 |
NEOMETRIK 2007-10-26 |
"FASTGUARD" 76132779 |
FASTGUARD 2000-09-21 |
"FASTGATE" 2664042 76091102 |
FASTGATE 2000-07-18 |
"NANOCV" 76074798 |
NANOCV 2000-06-20 |
"NANOGAP" 75501606 |
NANOGAP 1998-06-12 |
"SSM" 1938487 74604529 |
SSM 1994-11-30 |
"NANOSRP" 2192446 74515760 |
NANOSRP 1994-04-08 |
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