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Patent applications and USPTO patent grants for Shiozawa; Kenji.The latest application filed is for "semiconductor device".
Patent | Date |
---|---|
Multiple core analysis mode for defect analysis Grant 10,664,370 - Shiozawa , et al. | 2020-05-26 |
Semiconductor device Grant 10,656,201 - Lee , et al. | 2020-05-19 |
Semiconductor Device App 20190004110 - LEE; Takuya ;   et al. | 2019-01-03 |
Semiconductor Device App 20190004914 - SHIOZAWA; Kenji ;   et al. | 2019-01-03 |
Semiconductor Device And Method Of Testing Semiconductor Device App 20180364297 - NAKAMURA; Yoshihide ;   et al. | 2018-12-20 |
Semiconductor integrated circuit and method for manufacturing the same App 20040191991 - Ikeda, Shuji ;   et al. | 2004-09-30 |
Semiconductor integrated circuit and method for manufacturing the same Grant 6,753,231 - Ikeda , et al. June 22, 2 | 2004-06-22 |
Semiconductor integrated circuit and method for manufacturing the same App 20030153147 - Ikeda, Shuji ;   et al. | 2003-08-14 |
Semiconductor integrated circuit and method for manufacturing the same App 20020155657 - Ikeda, Shuji ;   et al. | 2002-10-24 |
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