| Patent | Date |
|---|
Inspection System For Use In Monitoring Plants In Plant Growth Areas
App 20220050093 - SCHEINER; David ; et al. | 2022-02-17 |
System And Method For Monitoring Plants In Plant Growing Areas
App 20220053122 - SCHEINER; David ; et al. | 2022-02-17 |
System for utilizing excess heat for carrying out electrochemical reactions
Grant 10,316,419 - Harpaz , et al. | 2019-06-11 |
Device and apparatus for carrying out chemical dissociation reactions at elevated temperatures
Grant 10,072,344 - Scheiner , et al. September 11, 2 | 2018-09-11 |
Lateral Shift Measurement Using An Optical Technique
App 20180031983 - BRILL; Boaz ; et al. | 2018-02-01 |
Lateral shift measurement using an optical technique
Grant 9,785,059 - Brill , et al. October 10, 2 | 2017-10-10 |
A System For Utilizing Excess Heat For Carrying Out Electrochemical Reactions
App 20160251767 - HARPAZ; Rol ; et al. | 2016-09-01 |
Optical system and method for measurement of one or more parameters of via-holes
Grant 9,140,539 - Scheiner September 22, 2 | 2015-09-22 |
Device And Apparatus For Carrying Out Chemical Dissociation Reactions At Elevated Temperatures
App 20150144498 - Scheiner; David ; et al. | 2015-05-28 |
Apparatus And Method For Using Solar Radiation In Electrolysis Process
App 20150047985 - Karni; Jacob ; et al. | 2015-02-19 |
Optical System And Method For Measurement Of One Or More Parameters Of Via-holes
App 20140376006 - SCHEINER; DAVID | 2014-12-25 |
Optical system and method for measurement of one or more parameters of via-holes
Grant 8,531,679 - Scheiner September 10, 2 | 2013-09-10 |
Method And Apparatus For Thin Film Quality Control
App 20110089348 - Finarov; Moshe ; et al. | 2011-04-21 |
Optical System And Method For Measurement Of One Or More Parameters Of Via-holes
App 20100284027 - Scheiner; David | 2010-11-11 |
Lateral Shift Measurement Using An Optical Technique
App 20100214566 - Brill; Boaz ; et al. | 2010-08-26 |
Reflective Optical System
App 20090213377 - SCHEINER; David ; et al. | 2009-08-27 |
Reflective optical system
Grant 7,532,414 - Scheiner , et al. May 12, 2 | 2009-05-12 |
Lateral Shift Measurement Using An Optical Technique
App 20080074665 - BRILL; Boaz ; et al. | 2008-03-27 |
Reflective Optical System
App 20070268591 - Scheiner; David ; et al. | 2007-11-22 |
Optical system operating with variable angle of incidence
Grant 7,292,341 - Brill , et al. November 6, 2 | 2007-11-06 |
Reflective optical system
Grant 7,253,970 - Scheiner , et al. August 7, 2 | 2007-08-07 |
Method and apparatus for measurements of patterned structures
Grant 7,187,456 - Scheiner , et al. March 6, 2 | 2007-03-06 |
Lateral shift measurement using an optical technique
App 20070034816 - Brill; Boaz ; et al. | 2007-02-15 |
Method and apparatus for measurements of patterned structures
Grant 7,123,366 - Scheiner , et al. October 17, 2 | 2006-10-17 |
Lateral shift measurement using an optical technique
App 20060102830 - Brill; Boaz ; et al. | 2006-05-18 |
Optical system operating with variable angle of indidence
App 20060001883 - Brill; Boaz ; et al. | 2006-01-05 |
Reflective optical system
App 20050280906 - Scheiner, David ; et al. | 2005-12-22 |
Lateral shift measurement using an optical technique
Grant 6,974,962 - Brill , et al. December 13, 2 | 2005-12-13 |
Method and system for measuring the topography of a sample
Grant 6,940,609 - Scheiner September 6, 2 | 2005-09-06 |
Method and appratus for measurements of patterned structures
App 20050146729 - Scheiner, David ; et al. | 2005-07-07 |
Image enhancement of substantially coherent imaging systems
App 20050140953 - Scheiner, David | 2005-06-30 |
Method and system for monitoring a process of material removal from the surface of a patterned structure
Grant 6,885,446 - Machavariani , et al. April 26, 2 | 2005-04-26 |
Method and apparatus for measurements of patterned structures
App 20050062965 - Scheiner, David ; et al. | 2005-03-24 |
Method and apparatus for measurements of patterned structures
Grant 6,836,324 - Scheiner , et al. December 28, 2 | 2004-12-28 |
Method and system for thickness measurements of thin conductive layers
Grant 6,815,947 - Scheiner , et al. November 9, 2 | 2004-11-09 |
Method and system for overlay measurement
Grant 6,801,315 - Finarov , et al. October 5, 2 | 2004-10-05 |
Method and apparatus for monitoring a chemical mechanical planarization process applied to metal-based patterned objects
Grant 6,801,326 - Finarov , et al. October 5, 2 | 2004-10-05 |
Method and system for thickness measurements of thin conductive layers
App 20040138838 - Scheiner, David ; et al. | 2004-07-15 |
Lateral shift measurement using an optical technique
App 20030190793 - Brill, Boaz ; et al. | 2003-10-09 |
Method and system for overlay measurement
App 20030169423 - Finarov, Moshe ; et al. | 2003-09-11 |
Method and system for monitoring a process of material removal from the surface of a patterned structure
App 20030155537 - Machavariani, Vladimir ; et al. | 2003-08-21 |
Optical measurements of patterned structures
Grant 6,556,947 - Scheiner , et al. April 29, 2 | 2003-04-29 |
Method and system for measuring the topography of a sample
App 20030058454 - Scheiner, David | 2003-03-27 |
Method and apparatus for measurements of patterned structures
Grant 6,476,920 - Scheiner , et al. November 5, 2 | 2002-11-05 |
Method and apparatus for measurements of patterned structures
App 20020128784 - Scheiner, David ; et al. | 2002-09-12 |
Method and apparatus for monitoring a chemical mechanical planarization process applied to metal-based patterned objects
App 20020005957 - Finarov, Moshe ; et al. | 2002-01-17 |
Method and apparatus for monitoring a chemical mechanical planarization process applied to metal-based patterned objects
Grant 6,292,265 - Finarov , et al. September 18, 2 | 2001-09-18 |
Method and apparatus for measurements of patterned structures
Grant 6,281,974 - Scheiner , et al. August 28, 2 | 2001-08-28 |
Test structure for metal CMP process control
App 20010015811 - Ravid, Avi ; et al. | 2001-08-23 |
Method and apparatus for measurements of patterned structures
Grant 6,100,985 - Scheiner , et al. August 8, 2 | 2000-08-08 |
Gelatin dessert product
Grant 4,500,552 - Kadison , et al. February 19, 1 | 1985-02-19 |
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