Sasaki; Suguru
Patent Applications and Registrations
Patent applications and USPTO patent grants for Sasaki; Suguru.The latest application filed is for "structure for battery analysis and x-ray diffraction device".
- Sasaki; Suguru - Tokyo JP
- Sasaki; Suguru - Shizuoka JP
- SASAKI; Suguru - Ehime JP
- Sasaki; Suguru - Kanagawa JP
| Patent | Date |
|---|---|
| Structure For Battery Analysis And X-ray Diffraction Device App 20220278381 - Ito; Koichiro ; et al. | 2022-09-01 |
| Piezoelectric element and musical instrument Grant 11,176,918 - Koike , et al. November 16, 2 | 2021-11-16 |
| Method For Measuring Components Of Biological Sample App 20210247346 - HIRONAKA; Shouko ; et al. | 2021-08-12 |
| Method for measuring components of biological sample Grant 10,996,186 - Hironaka , et al. May 4, 2 | 2021-05-04 |
| Method For Measuring Components Of Biological Sample App 20200057016 - HIRONAKA; Shouko ; et al. | 2020-02-20 |
| Piezoelectric Element And Musical Instrument App 20190311702 - KOIKE; Hiroshi ; et al. | 2019-10-10 |
| Semiconductor device, battery pack, and electronic device Grant 9,263,777 - Kawahara , et al. February 16, 2 | 2016-02-16 |
| TCP-type semiconductor device and method of testing thereof Grant 8,890,561 - Sasaki November 18, 2 | 2014-11-18 |
| Semiconductor Device, Battery Pack, And Electronic Device App 20140177145 - Kawahara; Youhei ; et al. | 2014-06-26 |
| TCP-type semiconductor device Grant 8,310,068 - Sasaki November 13, 2 | 2012-11-13 |
| Tcp-type Semiconductor Device And Method Of Testing Thereof App 20120133035 - Sasaki; Suguru | 2012-05-31 |
| TCP-type semiconductor device and method of testing thereof Grant 8,138,777 - Sasaki March 20, 2 | 2012-03-20 |
| TCP-type semiconductor device App 20110049688 - Sasaki; Suguru | 2011-03-03 |
| Tcp Type Semiconductor Device App 20110049514 - SASAKI; Suguru ; et al. | 2011-03-03 |
| TCP-type semiconductor device App 20100224874 - Sasaki; Suguru | 2010-09-09 |
| Tcp-type semiconductor device and method of testing thereof App 20100109690 - Sasaki; Suguru | 2010-05-06 |
| Method of correcting mask pattern Grant 7,459,243 - Sasaki December 2, 2 | 2008-12-02 |
| Method and measurement program for burn-in test of two semiconductor devices simultaneously Grant 7,345,498 - Sasaki March 18, 2 | 2008-03-18 |
| Linear grating formation method Grant 7,312,019 - Sasaki , et al. December 25, 2 | 2007-12-25 |
| Alignment mark and overlay inspection mark App 20070176305 - Sasaki; Suguru | 2007-08-02 |
| Semiconductor device and semiconductor wafer Grant 7,180,199 - Machida , et al. February 20, 2 | 2007-02-20 |
| Semiconductor device and semiconductor wafer App 20060197237 - Machida; Satoshi ; et al. | 2006-09-07 |
| Method of forming alignment mark and method of manufacturing semiconductor device App 20060183293 - SASAKI; Suguru | 2006-08-17 |
| Method for burn-in test and measurement program for burn-in test App 20060066340 - Sasaki; Suguru | 2006-03-30 |
| Optimization method of aperture type of projection aligner Grant 6,999,160 - Sasaki February 14, 2 | 2006-02-14 |
| Process for forming a pattern Grant 6,989,333 - Watanabe , et al. January 24, 2 | 2006-01-24 |
| Linear grating formation method App 20050196709 - Sasaki, Suguru ; et al. | 2005-09-08 |
| Method of correcting mask pattern App 20050136339 - Sasaki, Suguru | 2005-06-23 |
| Optimization method of aperture type of projection aligner App 20040141167 - Sasaki, Suguru | 2004-07-22 |
| Process for forming a pattern App 20040121594 - Watanabe, Minoru ; et al. | 2004-06-24 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 