Patent | Date |
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Qubits With Ion Implant Josephson Junctions App 20220181536 - Gordon; Ryan T. ;   et al. | 2022-06-09 |
Sacrificial Material Facilitating Protection Of A Substrate In A Qubit Device App 20220123195 - Adiga; Vivekananda P. ;   et al. | 2022-04-21 |
Integrated reactive material erasure element with phase change memory Grant 11,257,866 - BrightSky , et al. February 22, 2 | 2022-02-22 |
Lithography For Fabricating Josephson Junctions App 20220037578 - Rodbell; Kenneth P. ;   et al. | 2022-02-03 |
Reducing error rates with alpha particle protection Grant 11,152,378 - Stasiak , et al. October 19, 2 | 2021-10-19 |
Reducing Error Rates With Alpha Particle Protection App 20210305257 - STASIAK; Daniel L. ;   et al. | 2021-09-30 |
Integrated Reactive Material Erasure Element With Phase Change Memory App 20210257410 - BrightSky; Matthew J. ;   et al. | 2021-08-19 |
Heterogeneous miniaturization platform Grant 11,055,459 - Chen , et al. July 6, 2 | 2021-07-06 |
Fragmenting computer chips Grant 10,943,875 - Cabral, Jr. , et al. March 9, 2 | 2021-03-09 |
Measuring flux, current, or integrated charge of low energy particles Grant 10,901,010 - Copel , et al. January 26, 2 | 2021-01-26 |
Ionizing radiation blocking in IC chip to reduce soft errors Grant 10,784,200 - Farooq , et al. Sept | 2020-09-22 |
Thin film interconnects with large grains Grant 10,727,121 - Bruce , et al. | 2020-07-28 |
Real time X-ray dosimeter using diodes with variable thickness degrader Grant 10,634,797 - Gordon , et al. | 2020-04-28 |
Chemically strengthened glass and methods of making same Grant 10,633,280 - Huang , et al. | 2020-04-28 |
Real time X-ray dosimeter using diodes with variable thickness degrader Grant 10,627,529 - Gordon , et al. | 2020-04-21 |
Integrated reactive material erasure element with phase change memory Grant 10,535,713 - BrightSky , et al. Ja | 2020-01-14 |
Tamper-proof electronic packages with stressed glass component substrate(s) Grant 10,535,618 - Busby , et al. Ja | 2020-01-14 |
Tamper-proof electronic packages with stressed glass component substrate(s) Grant 10,535,619 - Busby , et al. Ja | 2020-01-14 |
Heterogeneous Miniaturization Platform App 20190311082 - Chen; Qianwen ;   et al. | 2019-10-10 |
Measuring Flux, Current, Or Integrated Charge Of Low Energy Particles App 20190293690 - Copel; Matthew W. ;   et al. | 2019-09-26 |
Measuring flux, current, or integrated charge of low energy particles Grant 10,416,199 - Copel , et al. Sept | 2019-09-17 |
Activating reactions in integrated circuits through electrical discharge Grant 10,388,615 - Cabral, Jr. , et al. A | 2019-08-20 |
Heterogeneous miniaturization platform Grant 10,380,284 - Chen , et al. A | 2019-08-13 |
Fragmenting Computer Chips App 20190214351 - Cabral, JR.; Cyril ;   et al. | 2019-07-11 |
Fragmenting computer chips Grant 10,290,594 - Cabral, Jr. , et al. | 2019-05-14 |
Activating reactions in integrated circuits through electrical discharge Grant 10,262,955 - Cabral, Jr. , et al. | 2019-04-16 |
Tamper-proof electronic packages formed with stressed glass Grant 10,257,924 - Busby , et al. | 2019-04-09 |
Thin Film Interconnects With Large Grains App 20190096757 - Bruce; Robert L. ;   et al. | 2019-03-28 |
Energy release using tunable reactive materials Grant 10,214,809 - Cabral, Jr. , et al. Feb | 2019-02-26 |
Energy Release Using Tunable Reactive Materials App 20190023963 - Cabral, JR.; Cyril ;   et al. | 2019-01-24 |
Real Time X-ray Dosimeter Using Diodes With Variable Thickness Degrader App 20190011573 - Gordon; Michael S. ;   et al. | 2019-01-10 |
Real Time X-ray Dosimeter Using Diodes With Variable Thickness Degrader App 20190011572 - Gordon; Michael S. ;   et al. | 2019-01-10 |
Tamper-proof electronic packages with stressed glass component substrate(s) Grant 10,177,102 - Busby , et al. J | 2019-01-08 |
Thin film interconnects with large grains Grant 10,170,361 - Bruce , et al. J | 2019-01-01 |
Tamper-proof Electronic Packages With Stressed Glass Component Substrate(s) App 20180358311 - BUSBY; James A. ;   et al. | 2018-12-13 |
Tamper-proof Electronic Packages With Stressed Glass Component Substrate(s) App 20180350757 - BUSBY; James A. ;   et al. | 2018-12-06 |
Chemically strengthened glass and methods of making same Grant 10,112,867 - Huang , et al. October 30, 2 | 2018-10-30 |
Sensors including complementary lateral bipolar junction transistors Grant 10,115,750 - Gordon , et al. October 30, 2 | 2018-10-30 |
Damaging integrated circuit components Grant 10,043,765 - Cabral, Jr. , et al. August 7, 2 | 2018-08-07 |
Measuring Flux, Current, Or Integrated Charge Of Low Energy Particles App 20180203045 - Copel; Matthew W. ;   et al. | 2018-07-19 |
Activating reactions in integrated circuits through electrical discharge Grant 9,991,214 - Cabral, Jr. , et al. June 5, 2 | 2018-06-05 |
Energy release using tunable reactive materials Grant 9,970,102 - Cabral, Jr. , et al. May 15, 2 | 2018-05-15 |
Heterogeneous Miniaturization Platform App 20180113969 - Chen; Qianwen ;   et al. | 2018-04-26 |
Tamper-proof Electronic Packages With Stressed Glass Component Substrate(s) App 20180102329 - BUSBY; James A. ;   et al. | 2018-04-12 |
Integrated arming switch and arming switch activation layer for secure memory Grant 9,941,004 - BrightSky , et al. April 10, 2 | 2018-04-10 |
Fragmenting Computer Chips App 20180096954 - Cabral, Jr.; Cyril ;   et al. | 2018-04-05 |
Tamper-proof Electronic Packages Formed With Stressed Glass App 20180098424 - BUSBY; James A. ;   et al. | 2018-04-05 |
Chemically Strengthened Glass And Methods Of Making Same App 20180079683 - Huang; Qiang ;   et al. | 2018-03-22 |
Tamper-proof electronic packages formed with stressed glass Grant 9,913,370 - Busby , et al. March 6, 2 | 2018-03-06 |
Activating Reactions In Integrated Circuits Through Electrical Discharge App 20180061782 - Cabral, JR.; Cyril ;   et al. | 2018-03-01 |
Damaging Integrated Circuit Components App 20180047679 - Cabral, JR.; Cyril ;   et al. | 2018-02-15 |
Chemically strengthened glass and methods of making same Grant 9,890,075 - Huang , et al. February 13, 2 | 2018-02-13 |
Tamper-proof electronic packages with stressed glass component substrate(s) Grant 9,881,880 - Busby , et al. January 30, 2 | 2018-01-30 |
Damaging Integrated Circuit Components App 20180005962 - Cabral, JR.; Cyril ;   et al. | 2018-01-04 |
Damaging integrated circuit components Grant 9,859,227 - Cabral, Jr. , et al. January 2, 2 | 2018-01-02 |
Tamper-proof Electronic Packages With Stressed Glass Component Substrate(s) App 20170330844 - BUSBY; James A. ;   et al. | 2017-11-16 |
Tamper-proof Electronic Packages Formed With Stressed Glass App 20170332485 - BUSBY; James A. ;   et al. | 2017-11-16 |
Sensors Including Complementary Lateral Bipolar Junction Transistors App 20170263656 - GORDON; MICHAEL S. ;   et al. | 2017-09-14 |
Preventing unauthorized use of integrated circuits for radiation-hard applications Grant 9,741,672 - Cheng , et al. August 22, 2 | 2017-08-22 |
Controlling fragmentation of chemically strengthened glass Grant 9,738,560 - Cabral, Jr. , et al. August 22, 2 | 2017-08-22 |
Heterogeneous miniaturization platform Grant 9,735,077 - Chen , et al. August 15, 2 | 2017-08-15 |
Energy Release Using Tunable Reactive Materials App 20170226633 - Cabral, JR.; Cyril ;   et al. | 2017-08-10 |
Integrated Arming Switch And Arming Switch Activation Layer For Secure Memory App 20170229173 - BrightSky; Matthew J. ;   et al. | 2017-08-10 |
Method of consumer/producer raw material selection Grant 9,720,101 - Gordon , et al. August 1, 2 | 2017-08-01 |
Chemically strengthened glass and methods of making same Grant 9,718,728 - Huang , et al. August 1, 2 | 2017-08-01 |
Chemically Strengthened Glass And Methods Of Making Same App 20170204002 - Huang; Qiang ;   et al. | 2017-07-20 |
Chemically Strengthened Glass And Methods Of Making Same App 20170204004 - Huang; Qiang ;   et al. | 2017-07-20 |
Chemically Strengthened Glass And Methods Of Making Same App 20170204003 - Huang; Qiang ;   et al. | 2017-07-20 |
Sensors including complementary lateral bipolar junction transistors Grant 9,659,979 - Gordon , et al. May 23, 2 | 2017-05-23 |
Method for conversion of commercial microprocessor to radiation-hardened processor and resulting processor Grant 9,646,125 - Fifield , et al. May 9, 2 | 2017-05-09 |
Sensors Including Complementary Lateral Bipolar Junction Transistors App 20170110492 - GORDON; MICHAEL S. ;   et al. | 2017-04-20 |
Integrated Reactive Material Erasure Element With Phase Change Memory App 20170092694 - BrightSky; Matthew J. ;   et al. | 2017-03-30 |
Controlling fragmentation of chemically strengthened glass Grant 9,586,857 - Cabral, Jr. , et al. March 7, 2 | 2017-03-07 |
Boron rich nitride cap for total ionizing dose mitigation in SOI devices Grant 9,484,403 - Grill , et al. November 1, 2 | 2016-11-01 |
Preventing Unauthorized Use Of Integrated Circuits For Radiation-hard Applications App 20160315056 - Cheng; Kangguo ;   et al. | 2016-10-27 |
Activating Reactions In Integrated Circuits Through Electrical Discharge App 20160300802 - Cabral, JR.; Cyril ;   et al. | 2016-10-13 |
Integrated circuits with radioactive source material and radiation detection Grant 9,454,886 - Gordon , et al. September 27, 2 | 2016-09-27 |
Controlling Fragmentation Of Chemically Strengthened Glass App 20160264456 - Cabral, JR.; Cyril ;   et al. | 2016-09-15 |
Activating reactions in integrated circuits through electrical discharge Grant 9,431,354 - Cabral, Jr. , et al. August 30, 2 | 2016-08-30 |
Preventing unauthorized use of integrated circuits for radiation-hard applications Grant 9,401,334 - Cheng , et al. July 26, 2 | 2016-07-26 |
Activating Reactions In Integrated Circuits Through Electrical Discharge App 20160163658 - Cabral, JR.; Cyril ;   et al. | 2016-06-09 |
Controlling Fragmentation Of Chemically Strengthened Glass App 20160137548 - Cabral, JR.; Cyril ;   et al. | 2016-05-19 |
Activating Reactions In Integrated Circuits Through Electrical Discharge App 20160133581 - Cabral, Jr.; Cyril ;   et al. | 2016-05-12 |
Formation of alpha particle shields in chip packaging Grant 9,299,665 - Andry , et al. March 29, 2 | 2016-03-29 |
Boron Rich Nitride Cap For Total Ionizing Dose Mitigation In Soi Devices App 20160064481 - Grill; Alfred ;   et al. | 2016-03-03 |
Boron rich nitride cap for total ionizing dose mitigation in SOI devices Grant 9,231,063 - Grill , et al. January 5, 2 | 2016-01-05 |
Thin Film Interconnects With Large Grains App 20150348832 - Bruce; Robert L. ;   et al. | 2015-12-03 |
Boron Rich Nitride Cap For Total Ionizing Dose Mitigation In Soi Devices App 20150243740 - Grill; Alfred ;   et al. | 2015-08-27 |
Formation Of Alpha Particle Shields In Chip Packaging App 20150171023 - Andry; Paul S. ;   et al. | 2015-06-18 |
Ionizing radiation blocking in IC chip to reduce soft errors Grant 8,999,764 - Farooq , et al. April 7, 2 | 2015-04-07 |
Integrated Circuits With Radioactive Source Material And Radiation Detection App 20150084776 - Gordon; Michael S. ;   et al. | 2015-03-26 |
Fabricating a small-scale radiation detector Grant 8,987,031 - Gordon , et al. March 24, 2 | 2015-03-24 |
Formation of alpha particle shields in chip packaging Grant 8,928,145 - Andry , et al. January 6, 2 | 2015-01-06 |
Method Of Consumer/producer Raw Material Selection App 20150006112 - Gordon; Michael S. ;   et al. | 2015-01-01 |
Fabricating A Small-scale Radiation Detector App 20140329351 - GORDON; MICHAEL S. ;   et al. | 2014-11-06 |
Multi-doped silicon antifuse device for integrated circuit Grant 8,860,176 - Fritz , et al. October 14, 2 | 2014-10-14 |
Integrated circuit tamper detection and response Grant 8,861,728 - Chu , et al. October 14, 2 | 2014-10-14 |
Method For Conversion Of Commercial Microprocessor To Radiation-hardened Processor And Resulting Processor App 20140258958 - FIFIELD; John A. ;   et al. | 2014-09-11 |
Microstructure modification in copper interconnect structures Grant 8,828,870 - Cabral, Jr. , et al. September 9, 2 | 2014-09-09 |
Reactive material for integrated circuit tamper detection and response Grant 8,816,717 - Fritz , et al. August 26, 2 | 2014-08-26 |
Tunable radiation source Grant 8,785,217 - Gaynes , et al. July 22, 2 | 2014-07-22 |
Annealing copper interconnects Grant 8,772,161 - Cabral, Jr. , et al. July 8, 2 | 2014-07-08 |
Microstructure Modification In Copper Interconnect Structures App 20140127899 - Cabral, JR.; Cyril ;   et al. | 2014-05-08 |
Integrated Circuit Tamper Detection And Response App 20140103286 - Chu; Jack O. ;   et al. | 2014-04-17 |
Antifuse Device For Integrated Circuit App 20140103485 - FRITZ; GREGORY M. ;   et al. | 2014-04-17 |
Reactive Material For Integrated Circuit Tamper Detection And Response App 20140103957 - Fritz; Gregory M. ;   et al. | 2014-04-17 |
Fully depleted silicon on insulator neutron detector Grant 8,614,111 - Gordon , et al. December 24, 2 | 2013-12-24 |
Microstructure Modification In Copper Interconnect Structures App 20130285245 - Cabral, Jr.; Cyril ;   et al. | 2013-10-31 |
Microstructure modification in copper interconnect structures Grant 8,492,897 - Cabral, Jr. , et al. July 23, 2 | 2013-07-23 |
On-chip radiation dosimeter Grant 8,476,683 - Gordon , et al. July 2, 2 | 2013-07-02 |
Microstructure Modification in Copper Interconnect Structures App 20130062769 - Cabral, JR.; Cyril ;   et al. | 2013-03-14 |
Tunable Radiation Source App 20130062740 - Gaynes; Michael A. ;   et al. | 2013-03-14 |
On-chip Radiation Dosimeter App 20130049130 - Gordon; Michael S. ;   et al. | 2013-02-28 |
Annealing Copper Interconnects App 20130040454 - Cabral, JR.; Cyril ;   et al. | 2013-02-14 |
Fully Depleted Silicon On Insulator Neutron Detector App 20130026544 - Gordon; Michael S. ;   et al. | 2013-01-31 |
On-chip radiation dosimeter Grant 8,361,829 - Gordon , et al. January 29, 2 | 2013-01-29 |
Method And Structure Of Forming Silicide And Diffusion Barrier Layer With Direct Deposited Film On Si App 20130001784 - Cabral, JR.; Cyril ;   et al. | 2013-01-03 |
Formation Of Alpha Particle Shields In Chip Packaging App 20120267768 - Andry; Paul Stephen ;   et al. | 2012-10-25 |
Method and structure of forming silicide and diffusion barrier layer with direct deposited film on silicon Grant 8,293,643 - Cabral, Jr. , et al. October 23, 2 | 2012-10-23 |
Formation of alpha particle shields in chip packaging Grant 8,247,271 - Andry , et al. August 21, 2 | 2012-08-21 |
Dosimeter powered by passive RF absorption Grant 8,212,218 - Cabral, Jr. , et al. July 3, 2 | 2012-07-03 |
Ionizing Radiation Blocking In Ic Chip To Reduce Soft Errors App 20120161300 - Farooq; Mukta G. ;   et al. | 2012-06-28 |
Alpha particle blocking wire structure and method fabricating same Grant 8,129,267 - Cabral, Jr. , et al. March 6, 2 | 2012-03-06 |
Alpha Particle Blocking Wire Structure And Method Fabricating Same App 20120028458 - Cabral, JR.; Cyril ;   et al. | 2012-02-02 |
Method and Structure of Forming Silicide and Diffusion Barrier Layer With Direct Deposited Film on Silicon App 20110309508 - Cabral, JR.; Cyril ;   et al. | 2011-12-22 |
Microstructure modification in copper interconnect structure Grant 8,008,199 - Baker-O'Neal , et al. August 30, 2 | 2011-08-30 |
Dosimeter Powered by Passive RF Absorption App 20110127438 - Cabral, JR.; Cyril ;   et al. | 2011-06-02 |
Method and structures for accelerated soft-error testing Grant 7,939,823 - Gordon , et al. May 10, 2 | 2011-05-10 |
Method For Conversion Of Commercial Microprocessor To Radiation-hardened Processor And Resulting Processor App 20110088008 - FIFIELD; John A. ;   et al. | 2011-04-14 |
Method and structure for reducing contact resistance between silicide contact and overlying metallization Grant 7,923,838 - Lavoie , et al. April 12, 2 | 2011-04-12 |
Computer program products for determining stopping powers of design structures with respect to a traveling particle Grant 7,877,716 - Fiorenza , et al. January 25, 2 | 2011-01-25 |
High temperature processing compatible metal gate electrode for pFETS and methods for fabrication Grant 7,863,083 - Amos , et al. January 4, 2 | 2011-01-04 |
Microstructure Modification In Copper Interconnect Structure App 20100323517 - Baker-O'Neal; Brett C. ;   et al. | 2010-12-23 |
Microstructure modification in copper interconnect structure Grant 7,843,063 - Baker-O'Neal , et al. November 30, 2 | 2010-11-30 |
Structure for reduction of soft error rates in integrated circuits Grant 7,781,871 - Cabral, Jr. , et al. August 24, 2 | 2010-08-24 |
Silicide interconnect structure Grant 7,749,898 - Besser , et al. July 6, 2 | 2010-07-06 |
CMOS storage devices configurable in high performance mode or radiation tolerant mode Grant 7,719,887 - Cannon , et al. May 18, 2 | 2010-05-18 |
Discrete placement of radiation sources on integrated circuit devices Grant 7,649,257 - Gordon , et al. January 19, 2 | 2010-01-19 |
Silicide Interconnect Structure App 20090315182 - Besser; Paul R. ;   et al. | 2009-12-24 |
Method for reduction of soft error rates in integrated circuits Grant 7,601,627 - Cabral, Jr. , et al. October 13, 2 | 2009-10-13 |
Structure For Reduction Of Soft Error Rates In Integrated Circuits App 20090243053 - Cabral, JR.; Cyril ;   et al. | 2009-10-01 |
Discreet Placement Of Radiation Sources On Integrated Circuit Devices App 20090236699 - Gordon; Michael S. ;   et al. | 2009-09-24 |
Microstructure Modification In Copper Interconnect Structure App 20090206484 - Baker-O'Neal; Brett C. ;   et al. | 2009-08-20 |
Static random access memory cell with improved stability Grant 7,545,671 - Bhavnagarwala , et al. June 9, 2 | 2009-06-09 |
Radiation Detection Schemes, Apparatus And Methods Of Transmitting Radiation Detection Information To A Network App 20090108212 - Gordon; Michael S. ;   et al. | 2009-04-30 |
Stabilization of Ni monosilicide thin films in CMOS devices using implantation of ions before silicidation Grant 7,517,795 - Carruthers , et al. April 14, 2 | 2009-04-14 |
Method And Structures For Accelerated Soft-error Testing App 20090065955 - Gordon; Michael S. ;   et al. | 2009-03-12 |
Cmos Storage Devices Configurable In High Performance Mode Or Radiation Tolerant Mode App 20090059657 - Cannon; Ethan H. ;   et al. | 2009-03-05 |
Method of detecting and transmitting radiation detection information to a network Grant 7,491,948 - Gordon , et al. February 17, 2 | 2009-02-17 |
Method and structure for reducing contact resistance between silicide contact and overlying metallization Grant 7,491,643 - Lavoie , et al. February 17, 2 | 2009-02-17 |
Ionizing Radiation Blocking In Ic Chip To Reduce Soft Errors App 20090039515 - Farooq; Mukta G. ;   et al. | 2009-02-12 |
Formation Of Alpha Particle Shields In Chip Packaging App 20080318365 - Andry; Paul Stephen ;   et al. | 2008-12-25 |
Radiation Detection Schemes, Apparatus And Methods Of Transmitting Radiation Detection Information To A Network App 20080308747 - Gordon; Michael S. ;   et al. | 2008-12-18 |
High Temperature Processing Compatible Metal Gate Electrode For pFETS and Methods For Fabrication App 20080311745 - Amos; Ricky ;   et al. | 2008-12-18 |
STABILIZATION OF Ni MONOSILICIDE THIN FILMS IN CMOS DEVICES USING IMPLANTATION OF IONS BEFORE SILICIDATION App 20080299720 - Carruthers; Roy A. ;   et al. | 2008-12-04 |
Static Random Access Memory Cell With Improved Stability App 20080225573 - Bhavnagarwala; Azeez ;   et al. | 2008-09-18 |
Method And Structure For Reducing Contact Resistance Between Silicide Contact And Overlying Metallization App 20080211100 - Lavoie; Christian ;   et al. | 2008-09-04 |
Computer Program Products For Determining Stopping Powers Of Design Structures With Respect To A Traveling Particle App 20080201681 - Fiorenza; Giovanni ;   et al. | 2008-08-21 |
Method And Structure For Reduction Of Soft Error Rates In Integrated Circuits App 20080164584 - Cabral; Cyril ;   et al. | 2008-07-10 |
Static random access memory cell with improved stability Grant 7,397,691 - Bhavnagarwala , et al. July 8, 2 | 2008-07-08 |
Homogeneous Copper Interconnects for BEOL App 20080156636 - Petrarca; Kevin S. ;   et al. | 2008-07-03 |
Method Of Determining Stopping Powers Of Design Structures With Respect To A Traveling Particle App 20080163137 - Fiorenza; Giovanni ;   et al. | 2008-07-03 |
Method of determining stopping powers of design structures with respect to a traveling particle Grant 7,386,817 - Fiorenza , et al. June 10, 2 | 2008-06-10 |
Method and structure for reduction of soft error rates in integrated circuits Grant 7,381,635 - Cabral, Jr. , et al. June 3, 2 | 2008-06-03 |
Method and structure for reducing contact resistance between silicide contact and overlying metallization App 20070275548 - Lavoie; Christian ;   et al. | 2007-11-29 |
Static random access memory cell with improved stability App 20070247896 - Bhavnagarwala; Azeez ;   et al. | 2007-10-25 |
Alpha particle shields in chip packaging App 20070045844 - Andry; Paul Stephen ;   et al. | 2007-03-01 |
Automatic exchange of degraders in accelerated testing of computer chips Grant 7,183,758 - Bohnenkamp , et al. February 27, 2 | 2007-02-27 |
STABILIZATION OF Ni MONOSILICIDE THIN FILMS IN CMOS DEVICES USING IMPLANTATION OF IONS BEFORE SILICIDATION App 20070042586 - Carruthers; Roy A. ;   et al. | 2007-02-22 |
Method and structure for reduction of soft error rates in integrated circuits App 20070013073 - Cabral; Cyril JR. ;   et al. | 2007-01-18 |
Stabilization of Ni monosilicide thin films in CMOS devices using implantation of ions before silicidation Grant 7,119,012 - Carruthers , et al. October 10, 2 | 2006-10-10 |
Homogeneous Copper Interconnects for BEOL App 20060071338 - Petrarca; Kevin S. ;   et al. | 2006-04-06 |
Polishing pads with polymer filled fibrous web, and methods for fabricating and using same Grant 6,989,117 - Chen , et al. January 24, 2 | 2006-01-24 |
Optimization of storage and power consumption with soft error predictor-corrector Grant 6,986,078 - Rodbell , et al. January 10, 2 | 2006-01-10 |
Method for plating copper conductors and devices formed Grant 6,979,393 - Rodbell , et al. December 27, 2 | 2005-12-27 |
Method for electroplating on resistive substrates Grant 6,974,531 - Andricacos , et al. December 13, 2 | 2005-12-13 |
Stabilization of Ni monosilicide thin films in CMOS devices using implantation of ions before silicidation App 20050250319 - Carruthers, Roy A. ;   et al. | 2005-11-10 |
Electroplated interconnection structures on integrated circuit chips Grant 6,946,716 - Andricacos , et al. September 20, 2 | 2005-09-20 |
Method for electroplating on resistive substrates App 20050199502 - Andricacos, Panayotis ;   et al. | 2005-09-15 |
Automatic exchange of degraders in accelerated testing of computer chips App 20050143945 - Bohnenkamp, Carl E. ;   et al. | 2005-06-30 |
Method and apparatus for thin film thickness mapping Grant 6,909,772 - Kozaczek , et al. June 21, 2 | 2005-06-21 |
Device interconnection App 20050116342 - Clevenger, Lawrence A. ;   et al. | 2005-06-02 |
Device interconnection Grant 6,870,263 - Clevenger , et al. March 22, 2 | 2005-03-22 |
Apparatus and method for testing semiconductors Grant 6,836,106 - Brelsford , et al. December 28, 2 | 2004-12-28 |
Method and apparatus for thin film thickness mapping Grant 6,792,075 - Kozaczek , et al. September 14, 2 | 2004-09-14 |
Method and apparatus for thin film thickness mapping App 20040170249 - Kozaczek, Krzysztof J. ;   et al. | 2004-09-02 |
Polishing pads with polymer filled fibrous web, and methods for fabricating and using same App 20040162013 - Chen, Shyng-Tsong ;   et al. | 2004-08-19 |
Method for electroplating on resistive substrates App 20040069648 - Andricacos, Panayotis ;   et al. | 2004-04-15 |
Polishing pads with polymer filled fibrous web, and methods for fabricating and using same Grant 6,712,681 - Chen , et al. March 30, 2 | 2004-03-30 |
Method And Apparatus For Thin Film Thickness Mapping App 20040047447 - Kozaczek, Krzysztof J. ;   et al. | 2004-03-11 |
Optimization of storage and power consumption with soft error predictor-corrector App 20040030956 - Rodbell, Kenneth P. ;   et al. | 2004-02-12 |
Grooved polishing pads and methods of use Grant 6,685,548 - Chen , et al. February 3, 2 | 2004-02-03 |
Grooved polishing pads and methods of use Grant 6,656,019 - Chen , et al. December 2, 2 | 2003-12-02 |
Grooved polishing pads and methods of use App 20030199234 - Chen, Shyng-Tsong ;   et al. | 2003-10-23 |
High temperature processing compatible metal gate electrode for pFETS and methods for fabrication App 20030098489 - Amos, Ricky ;   et al. | 2003-05-29 |
Method for plating copper conductors and devices formed App 20020066673 - Rodbell, Kenneth P. ;   et al. | 2002-06-06 |
Method for plating copper conductors and devices formed Grant 6,344,129 - Rodbell , et al. February 5, 2 | 2002-02-05 |
Process for fabricating a metallization structure Grant 5,943,601 - Usui , et al. August 24, 1 | 1999-08-24 |
Interconnect structure using a Al.sub.2 Cu for an integrated circuit chip Grant 5,565,707 - Colgan , et al. October 15, 1 | 1996-10-15 |
Dual channel d.c. low noise measurement system and test methodology Grant 5,563,517 - Biery , et al. October 8, 1 | 1996-10-08 |
Multilayered intermetallic connection for semiconductor devices Grant 5,071,714 - Rodbell , et al. December 10, 1 | 1991-12-10 |
Method of chemical-mechanical polishing an electronic component substrate and polishing slurry therefor Grant 4,954,142 - Carr , et al. September 4, 1 | 1990-09-04 |