Reich; Juergen

Patent Applications and Registrations

Patent applications and USPTO patent grants for Reich; Juergen.The latest application filed is for "surface scanning inspection system with independently adjustable scan pitch".

Company Profile

0.15.13

Reich; Juergen - Campbell CA
Reich; Juergen - Milpitas CA
Reich; Juergen - San Francisco CA
Reich; Juergen - Luenen DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Monolithic optical beam splitter with focusing lens Grant 9,664,909 - Whiteside , et al. May 30, 2	2017-05-30
Inspection beam shaping for improved detection sensitivity Grant 9,255,891 - Wolters , et al. February 9, 2	2016-02-09
Illumination energy management in surface inspection Grant 9,194,812 - Wolters , et al. November 24, 2	2015-11-24
Multi-spot defect inspection system Grant 9,182,358 - Xu , et al. November 10, 2	2015-11-10
Surface scanning inspection system with independently adjustable scan pitch Grant 9,116,132 - Wolters , et al. August 25, 2	2015-08-25
Surface Scanning Inspection System With Independently Adjustable Scan Pitch App 20150055128 - Wolters; Christian ; et al.	2015-02-26
Monitoring incident beam position in a wafer inspection system Grant 8,934,091 - Reich , et al. January 13, 2	2015-01-13
Surface scanning inspection system with adjustable scan pitch Grant 8,885,158 - Wolters , et al. November 11, 2	2014-11-11
Illumination Energy Management in Surface Inspection App 20140328043 - Wolters; Christian ; et al.	2014-11-06
Multi-Spot Defect Inspection System App 20140268118 - Xu; Zhiwei ; et al.	2014-09-18
Illumination energy management in surface inspection Grant 8,786,850 - Wolters , et al. July 22, 2	2014-07-22
Large particle detection for multi-spot surface scanning inspection systems Grant 8,755,044 - Reich , et al. June 17, 2	2014-06-17
Inspection Beam Shaping For Improved Detection Sensitivity App 20140139829 - Wolters; Christian ; et al.	2014-05-22
Illumination Energy Management in Surface Inspection App 20140118729 - Wolters; Christian ; et al.	2014-05-01
Monitoring Incident Beam Position in a Wafer Inspection System App 20140071437 - Reich; Juergen ; et al.	2014-03-13
Large Particle Detection For Multi-Spot Surface Scanning Inspection Systems App 20130050689 - Reich; Juergen ; et al.	2013-02-28
Computer-implemented methods for inspecting and/or classifying a wafer Grant 8,269,960 - Reich , et al. September 18, 2	2012-09-18
Surface Scanning Inspection System With Adjustable Scan Pitch App 20120229802 - Wolters; Christian ; et al.	2012-09-13
Computer-implemented Methods For Inspecting And/or Classifying A Wafer App 20100060888 - Reich; Juergen ; et al.	2010-03-11
Methods and systems for detecting pinholes in a film formed on a wafer or for monitoring a thermal process tool Grant 7,528,944 - Chen , et al. May 5, 2	2009-05-05
Methods and systems for determining drift in a position of a light beam with respect to a chuck Grant 7,511,816 - Reich , et al. March 31, 2	2009-03-31
Methods And Systems For Detecting Pinholes In A Film Formed On A Wafer Or For Monitoring A Thermal Process Tool App 20080018887 - Chen; David ; et al.	2008-01-24
Methods and systems for determining drift in a position of a light beam with respect to a chuck App 20060285112 - Reich; Juergen ; et al.	2006-12-21
Accelerator pedal Grant 7,044,019 - Hauschopp , et al. May 16, 2	2006-05-16
Accelerator pedal App 20030217614 - Hauschopp, Marion ; et al.	2003-11-27

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