Patent | Date |
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Universal Compactor Architecture For Testing Circuits App 20220308110 - Liu; Yingdi ;   et al. | 2022-09-29 |
Isometric control data generation for test compression Grant 11,422,188 - Huang , et al. August 23, 2 | 2022-08-23 |
Layout-friendly test pattern decompressor Grant 11,232,246 - Huang , et al. January 25, 2 | 2022-01-25 |
Deterministic Stellar Built-in Self Test App 20210373077 - Liu; Yingdi ;   et al. | 2021-12-02 |
Flexible isometric decompressor architecture for test compression Grant 11,150,299 - Rajski , et al. October 19, 2 | 2021-10-19 |
Trajectory-Optimized Test Pattern Generation for Built-In Self-Test App 20210156918 - Mrugalski; Grzegorz ;   et al. | 2021-05-27 |
Layout-Friendly Test Pattern Decompressor App 20210150112 - Huang; Yu ;   et al. | 2021-05-20 |
Prediction of test pattern counts for scan configuration determination Grant 11,010,523 - Huang , et al. May 18, 2 | 2021-05-18 |
Test generation using testability-based guidance Grant 10,996,273 - Milewski , et al. May 4, 2 | 2021-05-04 |
Scan cell architecture for improving test coverage and reducing test application time Grant 10,963,612 - Mukherjee , et al. March 30, 2 | 2021-03-30 |
Test scheduling and test access in test compression environment Grant 10,955,460 - Kassab , et al. March 23, 2 | 2021-03-23 |
Flexible Isometric Decompressor Architecture For Test Compression App 20210018563 - Rajski; Janusz ;   et al. | 2021-01-21 |
Signal probability-based test cube reordering and merging Grant 10,830,815 - Rajski , et al. November 10, 2 | 2020-11-10 |
Scan Cell Architecture For Improving Test Coverage And Reducing Test Application Time App 20200327268 - Mukherjee; Nilanjan ;   et al. | 2020-10-15 |
Efficient and flexible network for streaming data in circuits Grant 10,788,530 - Cote , et al. September 29, 2 | 2020-09-29 |
Streaming networks efficiency using data throttling Grant 10,775,436 - Cote , et al. Sept | 2020-09-15 |
Test application time reduction using capture-per-cycle test points Grant 10,509,072 - Rajski , et al. Dec | 2019-12-17 |
Timing-aware test generation and fault simulation Grant 10,509,073 - Lin , et al. Dec | 2019-12-17 |
Data generation for streaming networks in circuits Grant 10,476,740 - Cote , et al. Nov | 2019-11-12 |
Data streaming for testing identical circuit blocks Grant 10,473,721 - Cote , et al. Nov | 2019-11-12 |
Test point insertion for low test pattern counts Grant 10,444,282 - Rajski , et al. Oc | 2019-10-15 |
Deep Learning Based Test Compression Analyzer App 20190311290 - Huang; Yu ;   et al. | 2019-10-10 |
Isometric Control Data Generation For Test Compression App 20190293717 - Huang; Yu ;   et al. | 2019-09-26 |
Signal Probability-Based Test Cube Reordering And Merging App 20190293713 - Rajski; Janusz ;   et al. | 2019-09-26 |
Test Generation Using Testability-Based Guidance App 20190293718 - Milewski; Sylwester ;   et al. | 2019-09-26 |
Scan chain stitching for test-per-clock Grant 10,379,161 - Rajski , et al. A | 2019-08-13 |
Test point-enhanced hardware security Grant 10,361,873 - Rajski , et al. | 2019-07-23 |
Continuous application and decompression of test patterns and selective compaction of test responses Grant 10,234,506 - Rajski , et al. | 2019-03-19 |
Transition test generation for detecting cell internal defects Grant 10,222,420 - Lin , et al. | 2019-03-05 |
Multi-stage test response compactors Grant 10,120,024 - Rajski , et al. November 6, 2 | 2018-11-06 |
Low power testing based on dynamic grouping of scan Grant 10,120,029 - Rajski , et al. November 6, 2 | 2018-11-06 |
Test Application Time Reduction Using Capture-Per-Cycle Test Points App 20180252768 - Rajski; Janusz ;   et al. | 2018-09-06 |
Multi-stage Test Response Compactors App 20180156867 - Rajski; Janusz ;   et al. | 2018-06-07 |
Selective Per-cycle Masking Of Scan Chains For System Level Test App 20180143249 - Rajski; Janusz ;   et al. | 2018-05-24 |
Deterministic built-in self-test based on compressed test patterns stored on chip and their derivatives Grant 9,933,485 - Mrugalski , et al. April 3, 2 | 2018-04-03 |
Channel sharing for testing circuits having non-identical cores Grant 9,915,702 - Huang , et al. March 13, 2 | 2018-03-13 |
Timing-aware Test Generation And Fault Simulation App 20180045780 - Lin; Xijiang ;   et al. | 2018-02-15 |
Selective per-cycle masking of scan chains for system level test Grant 9,874,606 - Rajski , et al. January 23, 2 | 2018-01-23 |
Continuous Application And Decompression Of Test Patterns And Selective Compaction Of Test Responses App 20180017622 - Rajski; Janusz ;   et al. | 2018-01-18 |
Multi-stage test response compactors Grant 9,778,316 - Rajski , et al. October 3, 2 | 2017-10-03 |
Scan-based test architecture for interconnects in stacked designs Grant 9,720,041 - Rajski , et al. August 1, 2 | 2017-08-01 |
Timing-aware test generation and fault simulation Grant 9,720,040 - Lin , et al. August 1, 2 | 2017-08-01 |
Test-per-clock based on dynamically-partitioned reconfigurable scan chains Grant 9,714,981 - Rajski , et al. July 25, 2 | 2017-07-25 |
Transition Test Generation For Detecting Cell Internal Defects App 20170193155 - Lin; Xijiang ;   et al. | 2017-07-06 |
Test Point-Enhanced Hardware Security App 20170141930 - Rajski; Janusz ;   et al. | 2017-05-18 |
Isometric test compression with low toggling activity Grant 9,651,622 - Rajski , et al. May 16, 2 | 2017-05-16 |
Selective Per-cycle Masking Of Scan Chains For System Level Test App 20170052227 - Rajski; Janusz ;   et al. | 2017-02-23 |
Logic built-in self-test with high test coverage and low switching activity Grant 9,568,552 - Lin , et al. February 14, 2 | 2017-02-14 |
Multi-stage Test Response Compactors App 20160320450 - Rajski; Janusz ;   et al. | 2016-11-03 |
Test-per-clock Based On Dynamically-partitioned Reconfigurable Scan Chains App 20160252573 - Rajski; Janusz ;   et al. | 2016-09-01 |
Deterministic Built-In Self-Test App 20160245863 - Mrugalski; Grzegorz ;   et al. | 2016-08-25 |
Selective per-cycle masking of scan chains for system level test Grant 9,377,508 - Rajski , et al. June 28, 2 | 2016-06-28 |
Test generation for test-per-clock Grant 9,347,993 - Rajski , et al. May 24, 2 | 2016-05-24 |
Dynamic shift for test pattern compression Grant 9,335,374 - Lin , et al. May 10, 2 | 2016-05-10 |
Test-per-clock based on dynamically-partitioned reconfigurable scan chains Grant 9,335,377 - Rajski , et al. May 10, 2 | 2016-05-10 |
Test Point Insertion For Low Test Pattern Counts App 20160109517 - Rajski; Janusz ;   et al. | 2016-04-21 |
On-chip comparison and response collection tools and techniques Grant 9,250,287 - Mukherjee , et al. February 2, 2 | 2016-02-02 |
Low Power Testing Based On Dynamic Grouping Of Scan App 20150323597 - Rajski; Janusz ;   et al. | 2015-11-12 |
Timing-aware Test Generation And Fault Simulation App 20150323600 - Lin; Xijiang ;   et al. | 2015-11-12 |
Test Scheduling and Test Access in Test Compression Environment App 20150285854 - Kassab; Mark A. ;   et al. | 2015-10-08 |
Continuous application and decompression of test patterns and selective compaction of test responses Grant 9,134,370 - Rajski , et al. September 15, 2 | 2015-09-15 |
Isometric Test Compression With Low Toggling Activity App 20150253385 - Rajski; Janusz ;   et al. | 2015-09-10 |
Timing-aware test generation and fault simulation Grant 9,086,454 - Lin , et al. July 21, 2 | 2015-07-21 |
Test scheduling with pattern-independent test access mechanism Grant 9,088,522 - Rajski , et al. July 21, 2 | 2015-07-21 |
On-chip Comparison And Response Collection Tools And Techniques App 20150160290 - Mukherjee; Nilanjan ;   et al. | 2015-06-11 |
Dynamic Shift For Test Pattern Compression App 20150153410 - Lin; Xijiang ;   et al. | 2015-06-04 |
Channel Sharing For Testing Circuits Having Non-Identical Cores App 20150149847 - Huang; Yu ;   et al. | 2015-05-28 |
Scan chain configuration for test-per-clock based on circuit topology Grant 9,009,553 - Rajski , et al. April 14, 2 | 2015-04-14 |
Fault-driven scan chain configuration for test-per-clock Grant 9,003,248 - Rajski , et al. April 7, 2 | 2015-04-07 |
Test data volume reduction based on test cube properties Grant 8,996,941 - Lin , et al. March 31, 2 | 2015-03-31 |
Scan Chain Stitching For Test-Per-Clock App 20140372821 - Rajski; Janusz ;   et al. | 2014-12-18 |
Test-Per-Clock Based On Dynamically-Partitioned Reconfigurable Scan Chains App 20140372818 - Rajski; Janusz ;   et al. | 2014-12-18 |
Scan Chain Configuration For Test-Per-Clock Based On Circuit Topology App 20140372819 - Rajski; Janusz ;   et al. | 2014-12-18 |
Fault-Driven Scan Chain Configuration For Test-Per-Clock App 20140372820 - Rajski; Janusz ;   et al. | 2014-12-18 |
Test Generation For Test-Per-Clock App 20140372824 - Rajski; Janusz ;   et al. | 2014-12-18 |
On-chip comparison and response collection tools and techniques Grant 8,914,694 - Mukherjee , et al. December 16, 2 | 2014-12-16 |
Logic Built-In Self-Test with High Test Coverage and Low Switching Activity App 20140365840 - Lin; Xijiang ;   et al. | 2014-12-11 |
Scan cell use with reduced power consumption Grant 8,890,563 - Lin , et al. November 18, 2 | 2014-11-18 |
Low power compression of incompatible test cubes Grant 8,832,512 - Czysz , et al. September 9, 2 | 2014-09-09 |
Selective Per-cycle Masking Of Scan Chains For System Level Test App 20140229779 - Rajski; Janusz ;   et al. | 2014-08-14 |
Scan-based Test Architecture For Interconnects In Stacked Designs App 20140223247 - Rajski; Janusz ;   et al. | 2014-08-07 |
Scan test application through high-speed serial input/outputs Grant 8,726,112 - Rajski , et al. May 13, 2 | 2014-05-13 |
Selective per-cycle masking of scan chains for system level test Grant 8,726,113 - Rajski , et al. May 13, 2 | 2014-05-13 |
Test generator for low power built-in self-test Grant 8,683,280 - Rajski , et al. March 25, 2 | 2014-03-25 |
Timing-aware Test Generation And Fault Simulation App 20140047404 - Lin; Xijiang ;   et al. | 2014-02-13 |
Continuous Application And Decompression Of Test Patterns And Selective Compaction Of Test Responses App 20140006888 - Rajski; Janusz ;   et al. | 2014-01-02 |
Test Data Volume Reduction Based On Test Cube Properties App 20130332786 - Lin; Xijiang ;   et al. | 2013-12-12 |
Enhanced diagnosis with limited failure cycles Grant 8,595,574 - Huang , et al. November 26, 2 | 2013-11-26 |
On-chip Comparison And Response Collection Tools And Techniques App 20130305107 - Mukherjee; Nilanjan ;   et al. | 2013-11-14 |
Test Scheduling With Pattern-Independent Test Access Mechanism App 20130290795 - Rajski; Janusz ;   et al. | 2013-10-31 |
Timing-aware test generation and fault simulation Grant 8,560,906 - Lin , et al. October 15, 2 | 2013-10-15 |
Enhanced Diagnosis With Limited Failure Cycles App 20130246869 - Huang; Yu ;   et al. | 2013-09-19 |
Continuous application and decompression of test patterns and selective compaction of test responses Grant 8,533,547 - Rajski , et al. September 10, 2 | 2013-09-10 |
At-speed scan testing with controlled switching activity Grant 8,499,209 - Rajski , et al. July 30, 2 | 2013-07-30 |
Enhanced diagnosis with limited failure cycles Grant 8,438,438 - Huang , et al. May 7, 2 | 2013-05-07 |
On-chip comparison and response collection tools and techniques Grant 8,418,007 - Mukherjee , et al. April 9, 2 | 2013-04-09 |
Fault diagnosis for non-volatile memories Grant 8,356,222 - Mukherjee , et al. January 15, 2 | 2013-01-15 |
Compression based on deterministic vector clustering of incompatible test cubes Grant 8,347,159 - Mrugalski , et al. January 1, 2 | 2013-01-01 |
Compactor independent fault diagnosis Grant 8,301,414 - Cheng , et al. October 30, 2 | 2012-10-30 |
Decompressors for low power decompression of test patterns Grant 8,301,945 - Rajski , et al. October 30, 2 | 2012-10-30 |
Test Generator For Low Power Built-In Self-Test App 20120272110 - Rajski; Janusz ;   et al. | 2012-10-25 |
Low power scan testing techniques and apparatus Grant 8,290,738 - Lin , et al. October 16, 2 | 2012-10-16 |
Compactor independent direct diagnosis of test hardware Grant 8,280,688 - Huang , et al. October 2, 2 | 2012-10-02 |
Selective Per-cycle Masking Of Scan Chains For System Level Test App 20120210181 - Rajski; Janusz ;   et al. | 2012-08-16 |
Low Power Scan-Based Testing App 20120209556 - RAJSKI; JANUSZ ;   et al. | 2012-08-16 |
Timing-aware Test Generation And Fault Simulation App 20120174049 - Lin; Xijiang ;   et al. | 2012-07-05 |
Generating test patterns having enhanced coverage of untargeted defects Grant 8,201,131 - Rajski , et al. June 12, 2 | 2012-06-12 |
Selective per-cycle masking of scan chains for system level test Grant 8,166,359 - Rajski , et al. April 24, 2 | 2012-04-24 |
Modular compaction of test responses Grant 8,161,338 - Rajski , et al. April 17, 2 | 2012-04-17 |
Scan Cell Use With Reduced Power Consumption App 20120043991 - Lin; Xijiang ;   et al. | 2012-02-23 |
Method and apparatus for selectively compacting test responses Grant 8,108,743 - Rajski , et al. January 31, 2 | 2012-01-31 |
Decompressors For Low Power Decompression Of Test Patterns App 20110320999 - Rajski; Janusz ;   et al. | 2011-12-29 |
Timing-aware test generation and fault simulation Grant 8,051,352 - Lin , et al. November 1, 2 | 2011-11-01 |
Low power decompression of test cubes Grant 8,046,653 - Rajski , et al. October 25, 2 | 2011-10-25 |
Low Power Compression Of Incompatible Test Cubes App 20110231721 - CZYSZ; DARIUSZ ;   et al. | 2011-09-22 |
On-chip Comparison And Response Collection Tools And Techniques App 20110231722 - Mukherjee; Nilanjan ;   et al. | 2011-09-22 |
Method for synthesizing linear finite state machines Grant 8,024,387 - Rajski , et al. September 20, 2 | 2011-09-20 |
Decompressors for low power decompression of test patterns Grant 8,015,461 - Rajski , et al. September 6, 2 | 2011-09-06 |
Continuous Application And Decompression Of Test Patterns And Selective Compaction Of Test Responses App 20110214026 - Rajski; Janusz ;   et al. | 2011-09-01 |
Fault dictionaries for integrated circuit yield and quality analysis methods and systems Grant 7,987,442 - Rajski , et al. July 26, 2 | 2011-07-26 |
Generating responses to patterns stimulating an electronic circuit with timing exception paths Grant 7,984,354 - Goswami , et al. July 19, 2 | 2011-07-19 |
Low Power Scan Testing Techniques And Apparatus App 20110166818 - Lin; Xijiang ;   et al. | 2011-07-07 |
Decompressor/prpg For Applying Pseudo-random And Deterministic Test Patterns App 20110167309 - Rajski; Janusz ;   et al. | 2011-07-07 |
Fault diagnosis of compressed test responses Grant 7,962,820 - Rajski , et al. June 14, 2 | 2011-06-14 |
Method And Apparatus For Selectively Compacting Test Responses App 20110138242 - Rajski; Janusz ;   et al. | 2011-06-09 |
Enhanced Diagnosis With Limited Failure Cycles App 20110126064 - Huang; Yu ;   et al. | 2011-05-26 |
Low power scan testing techniques and apparatus Grant 7,925,465 - Lin , et al. April 12, 2 | 2011-04-12 |
On-chip comparison and response collection tools and techniques Grant 7,913,137 - Mukherjee , et al. March 22, 2 | 2011-03-22 |
Fault Diagnosis In A Memory Bist Environment App 20110055646 - Mukherjee; Nilanjan ;   et al. | 2011-03-03 |
Test pattern compression for an integrated circuit test environment Grant 7,900,104 - Rajski , et al. March 1, 2 | 2011-03-01 |
Compressing test responses using a compactor Grant 7,890,827 - Rajski , et al. February 15, 2 | 2011-02-15 |
Continuous application and decompression of test patterns to a circuit-under-test Grant 7,877,656 - Rajski , et al. January 25, 2 | 2011-01-25 |
Test generation methods for reducing power dissipation and supply currents Grant 7,865,792 - Lin , et al. January 4, 2 | 2011-01-04 |
Decompressor/PRPG for applying pseudo-random and deterministic test patterns Grant 7,865,794 - Rajski , et al. January 4, 2 | 2011-01-04 |
Scan Test Application Through High-Speed Serial Input/Outputs App 20100313089 - Rajski; Janusz ;   et al. | 2010-12-09 |
Low Power Decompression Of Test Cubes App 20100306609 - Rajski; Janusz ;   et al. | 2010-12-02 |
Compactor Independent Direct Diagnosis Of Test Hardware App 20100306606 - Huang; Yu ;   et al. | 2010-12-02 |
Enhanced diagnosis with limited failure cycles Grant 7,840,862 - Huang , et al. November 23, 2 | 2010-11-23 |
At-Speed Scan Testing With Controlled Switching Activity App 20100275077 - Rajski; Janusz ;   et al. | 2010-10-28 |
Multi-stage test response compactors Grant 7,818,644 - Rajski , et al. October 19, 2 | 2010-10-19 |
Compressing Test Responses Using A Compactor App 20100257417 - Rajski; Janusz ;   et al. | 2010-10-07 |
Method and apparatus for selectively compacting test responses Grant 7,805,649 - Rajski , et al. September 28, 2 | 2010-09-28 |
Phase shifter with reduced linear dependency Grant 7,805,651 - Rajski , et al. September 28, 2 | 2010-09-28 |
Low power decompression of test cubes Grant 7,797,603 - Rajski , et al. September 14, 2 | 2010-09-14 |
Fault Diagnosis For Non-Volatile Memories App 20100229055 - MUKHERJEE; NILANJAN ;   et al. | 2010-09-09 |
Compression Based On Deterministic Vector Clustering Of Incompatible Test Cubes App 20100229060 - MRUGALSKI; GRZEGORZ ;   et al. | 2010-09-09 |
Methods for distribution of test generation programs Grant 7,765,450 - Udell , et al. July 27, 2 | 2010-07-27 |
Compressing test responses using a compactor Grant 7,743,302 - Rajski , et al. June 22, 2 | 2010-06-22 |
Test Generation Methods For Reducing Power Dissipation And Supply Currents App 20100146350 - Lin; Xijiang ;   et al. | 2010-06-10 |
Decompressors For Low Power Decompression Of Test Patterns App 20100138708 - Rajski; Janusz ;   et al. | 2010-06-03 |
Compactor independent direct diagnosis of test hardware Grant 7,729,884 - Huang , et al. June 1, 2 | 2010-06-01 |
Phase Shifter With Reduced Linear Dependency App 20100083063 - Rajski; Janusz ;   et al. | 2010-04-01 |
Test generation methods for reducing power dissipation and supply currents Grant 7,685,491 - Lin , et al. March 23, 2 | 2010-03-23 |
Methods for distributing programs for generating test data Grant 7,669,101 - Udell , et al. February 23, 2 | 2010-02-23 |
Phase shifter with reduced linear dependency Grant 7,653,851 - Rajski , et al. January 26, 2 | 2010-01-26 |
Decompressors for low power decompression of test patterns Grant 7,647,540 - Rajski , et al. January 12, 2 | 2010-01-12 |
Generating Responses To Patterns Stimulating An Electronic Circuit With Timing Exception Paths App 20090327986 - Goswami; Dhiraj ;   et al. | 2009-12-31 |
Selective Per-Cycle Masking Of Scan Chains For System Level Test App 20090300446 - Rajski; Janusz ;   et al. | 2009-12-03 |
Test Pattern Compression For An Integrated Circuit Test Environment App 20090259900 - Rajski; Janusz ;   et al. | 2009-10-15 |
Fault Diagnosis Of Compressed Test Responses App 20090249147 - Rajski; Janusz ;   et al. | 2009-10-01 |
Method And Apparatus For Selectively Compacting Test Responses App 20090228749 - Rajski; Janusz ;   et al. | 2009-09-10 |
Determining And Analyzing Integrated Circuit Yield And Quality App 20090210183 - Rajski; Janusz ;   et al. | 2009-08-20 |
Phase Shifter With Reduced Linear Dependency App 20090187800 - Rajski; Janusz ;   et al. | 2009-07-23 |
Continuous Application And Decompression Of Test Patterns To A Circuit-under-test App 20090183041 - Rajski; Janusz ;   et al. | 2009-07-16 |
Generating Test Patterns Having Enhanced Coverage Of Untargeted Defects App 20090183128 - Rajski; Janusz ;   et al. | 2009-07-16 |
Decompressor/prpg For Applying Pseudo-random And Deterministic Test Patterns App 20090177933 - Rajski; Janusz ;   et al. | 2009-07-09 |
Generating responses to patterns stimulating an electronic circuit with timing exception paths Grant 7,555,689 - Goswami , et al. June 30, 2 | 2009-06-30 |
Phase shifter with reduced linear dependency Grant 7,523,372 - Rajski , et al. April 21, 2 | 2009-04-21 |
Determining and analyzing integrated circuit yield and quality Grant 7,512,508 - Rajski , et al. March 31, 2 | 2009-03-31 |
Test pattern compression for an integrated circuit test environment Grant 7,509,546 - Rajski , et al. March 24, 2 | 2009-03-24 |
Fault diagnosis of compressed test responses Grant 7,509,550 - Rajski , et al. March 24, 2 | 2009-03-24 |
Generating test patterns having enhanced coverage of untargeted defects Grant 7,509,600 - Rajski , et al. March 24, 2 | 2009-03-24 |
Decompressor/PRPG for applying pseudo-random and deterministic test patterns Grant 7,506,232 - Rajski , et al. March 17, 2 | 2009-03-17 |
Method and apparatus for selectively compacting test responses Grant 7,500,163 - Rajski , et al. March 3, 2 | 2009-03-03 |
Continuous application and decompression of test patterns to a circuit-under-test Grant 7,478,296 - Rajski , et al. January 13, 2 | 2009-01-13 |
Methods For Distribution Of Test Generation Programs App 20080320352 - Udell; Jon ;   et al. | 2008-12-25 |
Fault diagnosis of compressed test responses having one or more unknown states Grant 7,437,640 - Rajski , et al. October 14, 2 | 2008-10-14 |
Method and apparatus for at-speed testing of digital circuits Grant 7,437,636 - Rajski , et al. October 14, 2 | 2008-10-14 |
Methods For Distributing Programs For Generating Test Data App 20080216076 - Udell; Jon ;   et al. | 2008-09-04 |
Low power scan testing techniques and apparatus App 20080195346 - Lin; Xijiang ;   et al. | 2008-08-14 |
Methods for distributing programs for generating test data Grant 7,386,778 - Udell , et al. June 10, 2 | 2008-06-10 |
Compressing test responses using a compactor App 20080133987 - Rajski; Janusz ;   et al. | 2008-06-05 |
Compressing test responses using a compactor Grant 7,370,254 - Rajski , et al. May 6, 2 | 2008-05-06 |
Decompressors for low power decompression of test patterns App 20080052578 - Rajski; Janusz ;   et al. | 2008-02-28 |
Low power decompression of test cubes App 20080052586 - Rajski; Janusz ;   et al. | 2008-02-28 |
Phase shifter with reduced linear dependency App 20070300110 - Rajski; Janusz ;   et al. | 2007-12-27 |
Method for synthesizing linear finite state machines App 20070294327 - Rajski; Janusz ;   et al. | 2007-12-20 |
Timing-aware test generation and fault simulation App 20070288822 - Lin; Xijiang ;   et al. | 2007-12-13 |
Compactor Independent Fault Diagnosis App 20070283202 - Cheng; Wu-Tung ;   et al. | 2007-12-06 |
Adaptive fault diagnosis of compressed test responses Grant 7,302,624 - Rajski , et al. November 27, 2 | 2007-11-27 |
Test generation methods for reducing power dissipation and supply currents App 20070250749 - Lin; Xijiang ;   et al. | 2007-10-25 |
On-chip comparison and response collection tools and techniques App 20070234163 - Mukherjee; Nilanjan ;   et al. | 2007-10-04 |
Multi-stage test response compactors App 20070234157 - Rajski; Janusz ;   et al. | 2007-10-04 |
Generating masking control circuits for test response compactors App 20070234169 - Rajski; Janusz ;   et al. | 2007-10-04 |
Enhanced diagnosis with limited failure cycles App 20070220381 - Huang; Yu ;   et al. | 2007-09-20 |
Phase shifter with reduced linear dependency Grant 7,263,641 - Rajski , et al. August 28, 2 | 2007-08-28 |
Method for synthesizing linear finite state machines Grant 7,260,591 - Rajski , et al. August 21, 2 | 2007-08-21 |
Compactor independent fault diagnosis Grant 7,239,978 - Cheng , et al. July 3, 2 | 2007-07-03 |
Modular compaction of test responses App 20070113135 - Rajski; Janusz ;   et al. | 2007-05-17 |
Methods for distributing programs for generating test data App 20070094556 - Udell; Jon ;   et al. | 2007-04-26 |
Methods for distribution of test generation programs App 20070094561 - Udell; Jon ;   et al. | 2007-04-26 |
Test pattern compression for an integrated circuit test environment App 20070016836 - Rajski; Janusz ;   et al. | 2007-01-18 |
Generating responses to patterns stimulating an electronic circuit with timing exception paths App 20070011527 - Goswami; Dhiraj ;   et al. | 2007-01-11 |
Decompressor/PRPG for applying pseudo-random and deterministic test patterns App 20070011530 - Rajski; Janusz ;   et al. | 2007-01-11 |
Test pattern compression for an integrated circuit test environment Grant 7,111,209 - Rajski , et al. September 19, 2 | 2006-09-19 |
Decompressor/PRPG for applying pseudo-random and deterministic test patterns Grant 7,093,175 - Rajski , et al. August 15, 2 | 2006-08-15 |
Compactor independent direct diagnosis of test hardware App 20060111873 - Huang; Yu ;   et al. | 2006-05-25 |
Defect location identification for microdevice manufacturing and test App 20060069958 - Sawicki; Joseph D. ;   et al. | 2006-03-30 |
Determining and analyzing integrated circuit yield and quality App 20060066339 - Rajski; Janusz ;   et al. | 2006-03-30 |
Fault dictionaries for integrated circuit yield and quality analysis methods and systems App 20060066338 - Rajski; Janusz ;   et al. | 2006-03-30 |
Method and apparatus for at-speed testing of digital circuits App 20060064616 - Rajski; Janusz ;   et al. | 2006-03-23 |
Integrated circuit yield and quality analysis methods and systems App 20060053357 - Rajski; Janusz ;   et al. | 2006-03-09 |
Adaptive fault diagnosis of compressed test responses App 20060041813 - Rajski; Janusz ;   et al. | 2006-02-23 |
Fault diagnosis of compressed test responses having one or more unknown states App 20060041814 - Rajski; Janusz ;   et al. | 2006-02-23 |
Fault diagnosis of compressed test responses App 20060041812 - Rajski; Janusz ;   et al. | 2006-02-23 |
Method and apparatus for at-speed testing of digital circuits Grant 6,966,021 - Rajski , et al. November 15, 2 | 2005-11-15 |
Generating test patterns having enhanced coverage of untargeted defects App 20050240887 - Rajski, Janusz ;   et al. | 2005-10-27 |
Arithmetic built-in self-test of multiple scan-based integrated circuits Grant 6,954,888 - Rajski , et al. October 11, 2 | 2005-10-11 |
Compactor independent fault diagnosis App 20050222816 - Cheng, Wu-Tung ;   et al. | 2005-10-06 |
Method and apparatus for selectively compacting test reponses App 20050097419 - Rajski, Janusz ;   et al. | 2005-05-05 |
Phase shifter with reduced linear dependency Grant 6,874,109 - Rajski , et al. March 29, 2 | 2005-03-29 |
Arithmetic built-in self-test of multiple scan-based integrated circuits App 20050060626 - Rajski, Janusz ;   et al. | 2005-03-17 |
Phase shifter with reduced linear dependency App 20050015688 - Rajski, Janusz ;   et al. | 2005-01-20 |
Method and apparatus for selectively compacting test responses Grant 6,829,740 - Rajski , et al. December 7, 2 | 2004-12-07 |
Compressing test responses using a compactor App 20040230884 - Rajski, Janusz ;   et al. | 2004-11-18 |
Method for synthesizing linear finite state machines App 20040172431 - Rajski, Janusz ;   et al. | 2004-09-02 |
Decompressor/PRPG for applying pseudo-random and deterministic test patterns App 20040128599 - Rajski, Janusz ;   et al. | 2004-07-01 |
Arithmetic built-in self-test of multiple scan-based integrated circuits Grant 6,728,901 - Rajski , et al. April 27, 2 | 2004-04-27 |
Method for synthesizing linear finite state machines Grant 6,708,192 - Rajski , et al. March 16, 2 | 2004-03-16 |
Decompressor/PRPG for applying pseudo-random and deterministic test patterns Grant 6,684,358 - Rajski , et al. January 27, 2 | 2004-01-27 |
Method for clustered test pattern generation Grant 6,662,327 - Rajski December 9, 2 | 2003-12-09 |
Test pattern compression for an integrated circuit test environment App 20030131298 - Rajski, Janusz ;   et al. | 2003-07-10 |
Continuous application and decompression of test patterns to a circuit-under-test App 20030120988 - Rajski, Janusz ;   et al. | 2003-06-26 |
Method and apparatus for selectively compacting test responses App 20030115521 - Rajski, Janusz ;   et al. | 2003-06-19 |
Method for synthesizing linear finite state machines App 20030110193 - Rajski, Janusz ;   et al. | 2003-06-12 |
Method and apparatus for at-speed testing of digital circuits App 20030097614 - Rajski, Janusz ;   et al. | 2003-05-22 |
At-speed test using on-chip controller App 20030084390 - Tamarapalli, Nagesh ;   et al. | 2003-05-01 |
Method and apparatus for selectively compacting test responses Grant 6,557,129 - Rajski , et al. April 29, 2 | 2003-04-29 |
Test pattern compression for an integrated circuit test environment Grant 6,543,020 - Rajski , et al. April 1, 2 | 2003-04-01 |
Method for synthesizing linear finite state machines Grant 6,539,409 - Rajski , et al. March 25, 2 | 2003-03-25 |
Method and apparatus for diagnosing memory using self-testing circuits Grant 6,421,794 - Chen , et al. July 16, 2 | 2002-07-16 |
Test pattern compression for an integrated circuit test environment App 20020053057 - Rajski, Janusz ;   et al. | 2002-05-02 |
Method for synthesizing linear finite state machines Grant 6,353,842 - Rajski , et al. March 5, 2 | 2002-03-05 |
Method for synthesizing linear finite state machines App 20020016806 - Rajski, Janusz ;   et al. | 2002-02-07 |
Test pattern compression for an integrated circuit test environment Grant 6,327,687 - Rajski , et al. December 4, 2 | 2001-12-04 |
Parallel decompressor and related methods and apparatuses Grant 5,991,909 - Rajski , et al. November 23, 1 | 1999-11-23 |
Multi-phase test point insertion for built-in self test of integrated circuits Grant 5,737,340 - Tamarapalli , et al. April 7, 1 | 1998-04-07 |
Self-testable digital integrator Grant 5,313,469 - Adham , et al. May 17, 1 | 1994-05-17 |