Rajski; Janusz

Patent Applications and Registrations

Patent applications and USPTO patent grants for Rajski; Janusz.The latest application filed is for "universal compactor architecture for testing circuits".

Company Profile

19.139.127

Rajski; Janusz - West Linn OR
Rajski; Janusz - US
Rajski; Janusz - Wilsonville OR
Rajski; Janusz - Montreal West CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Universal Compactor Architecture For Testing Circuits App 20220308110 - Liu; Yingdi ; et al.	2022-09-29
Isometric control data generation for test compression Grant 11,422,188 - Huang , et al. August 23, 2	2022-08-23
Layout-friendly test pattern decompressor Grant 11,232,246 - Huang , et al. January 25, 2	2022-01-25
Deterministic Stellar Built-in Self Test App 20210373077 - Liu; Yingdi ; et al.	2021-12-02
Flexible isometric decompressor architecture for test compression Grant 11,150,299 - Rajski , et al. October 19, 2	2021-10-19
Trajectory-Optimized Test Pattern Generation for Built-In Self-Test App 20210156918 - Mrugalski; Grzegorz ; et al.	2021-05-27
Layout-Friendly Test Pattern Decompressor App 20210150112 - Huang; Yu ; et al.	2021-05-20
Prediction of test pattern counts for scan configuration determination Grant 11,010,523 - Huang , et al. May 18, 2	2021-05-18
Test generation using testability-based guidance Grant 10,996,273 - Milewski , et al. May 4, 2	2021-05-04
Scan cell architecture for improving test coverage and reducing test application time Grant 10,963,612 - Mukherjee , et al. March 30, 2	2021-03-30
Test scheduling and test access in test compression environment Grant 10,955,460 - Kassab , et al. March 23, 2	2021-03-23
Flexible Isometric Decompressor Architecture For Test Compression App 20210018563 - Rajski; Janusz ; et al.	2021-01-21
Signal probability-based test cube reordering and merging Grant 10,830,815 - Rajski , et al. November 10, 2	2020-11-10
Scan Cell Architecture For Improving Test Coverage And Reducing Test Application Time App 20200327268 - Mukherjee; Nilanjan ; et al.	2020-10-15
Efficient and flexible network for streaming data in circuits Grant 10,788,530 - Cote , et al. September 29, 2	2020-09-29
Streaming networks efficiency using data throttling Grant 10,775,436 - Cote , et al. Sept	2020-09-15
Test application time reduction using capture-per-cycle test points Grant 10,509,072 - Rajski , et al. Dec	2019-12-17
Timing-aware test generation and fault simulation Grant 10,509,073 - Lin , et al. Dec	2019-12-17
Data generation for streaming networks in circuits Grant 10,476,740 - Cote , et al. Nov	2019-11-12
Data streaming for testing identical circuit blocks Grant 10,473,721 - Cote , et al. Nov	2019-11-12
Test point insertion for low test pattern counts Grant 10,444,282 - Rajski , et al. Oc	2019-10-15
Deep Learning Based Test Compression Analyzer App 20190311290 - Huang; Yu ; et al.	2019-10-10
Isometric Control Data Generation For Test Compression App 20190293717 - Huang; Yu ; et al.	2019-09-26
Signal Probability-Based Test Cube Reordering And Merging App 20190293713 - Rajski; Janusz ; et al.	2019-09-26
Test Generation Using Testability-Based Guidance App 20190293718 - Milewski; Sylwester ; et al.	2019-09-26
Scan chain stitching for test-per-clock Grant 10,379,161 - Rajski , et al. A	2019-08-13
Test point-enhanced hardware security Grant 10,361,873 - Rajski , et al.	2019-07-23
Continuous application and decompression of test patterns and selective compaction of test responses Grant 10,234,506 - Rajski , et al.	2019-03-19
Transition test generation for detecting cell internal defects Grant 10,222,420 - Lin , et al.	2019-03-05
Multi-stage test response compactors Grant 10,120,024 - Rajski , et al. November 6, 2	2018-11-06
Low power testing based on dynamic grouping of scan Grant 10,120,029 - Rajski , et al. November 6, 2	2018-11-06
Test Application Time Reduction Using Capture-Per-Cycle Test Points App 20180252768 - Rajski; Janusz ; et al.	2018-09-06
Multi-stage Test Response Compactors App 20180156867 - Rajski; Janusz ; et al.	2018-06-07
Selective Per-cycle Masking Of Scan Chains For System Level Test App 20180143249 - Rajski; Janusz ; et al.	2018-05-24
Deterministic built-in self-test based on compressed test patterns stored on chip and their derivatives Grant 9,933,485 - Mrugalski , et al. April 3, 2	2018-04-03
Channel sharing for testing circuits having non-identical cores Grant 9,915,702 - Huang , et al. March 13, 2	2018-03-13
Timing-aware Test Generation And Fault Simulation App 20180045780 - Lin; Xijiang ; et al.	2018-02-15
Selective per-cycle masking of scan chains for system level test Grant 9,874,606 - Rajski , et al. January 23, 2	2018-01-23
Continuous Application And Decompression Of Test Patterns And Selective Compaction Of Test Responses App 20180017622 - Rajski; Janusz ; et al.	2018-01-18
Multi-stage test response compactors Grant 9,778,316 - Rajski , et al. October 3, 2	2017-10-03
Scan-based test architecture for interconnects in stacked designs Grant 9,720,041 - Rajski , et al. August 1, 2	2017-08-01
Timing-aware test generation and fault simulation Grant 9,720,040 - Lin , et al. August 1, 2	2017-08-01
Test-per-clock based on dynamically-partitioned reconfigurable scan chains Grant 9,714,981 - Rajski , et al. July 25, 2	2017-07-25
Transition Test Generation For Detecting Cell Internal Defects App 20170193155 - Lin; Xijiang ; et al.	2017-07-06
Test Point-Enhanced Hardware Security App 20170141930 - Rajski; Janusz ; et al.	2017-05-18
Isometric test compression with low toggling activity Grant 9,651,622 - Rajski , et al. May 16, 2	2017-05-16
Selective Per-cycle Masking Of Scan Chains For System Level Test App 20170052227 - Rajski; Janusz ; et al.	2017-02-23
Logic built-in self-test with high test coverage and low switching activity Grant 9,568,552 - Lin , et al. February 14, 2	2017-02-14
Multi-stage Test Response Compactors App 20160320450 - Rajski; Janusz ; et al.	2016-11-03
Test-per-clock Based On Dynamically-partitioned Reconfigurable Scan Chains App 20160252573 - Rajski; Janusz ; et al.	2016-09-01
Deterministic Built-In Self-Test App 20160245863 - Mrugalski; Grzegorz ; et al.	2016-08-25
Selective per-cycle masking of scan chains for system level test Grant 9,377,508 - Rajski , et al. June 28, 2	2016-06-28
Test generation for test-per-clock Grant 9,347,993 - Rajski , et al. May 24, 2	2016-05-24
Dynamic shift for test pattern compression Grant 9,335,374 - Lin , et al. May 10, 2	2016-05-10
Test-per-clock based on dynamically-partitioned reconfigurable scan chains Grant 9,335,377 - Rajski , et al. May 10, 2	2016-05-10
Test Point Insertion For Low Test Pattern Counts App 20160109517 - Rajski; Janusz ; et al.	2016-04-21
On-chip comparison and response collection tools and techniques Grant 9,250,287 - Mukherjee , et al. February 2, 2	2016-02-02
Low Power Testing Based On Dynamic Grouping Of Scan App 20150323597 - Rajski; Janusz ; et al.	2015-11-12
Timing-aware Test Generation And Fault Simulation App 20150323600 - Lin; Xijiang ; et al.	2015-11-12
Test Scheduling and Test Access in Test Compression Environment App 20150285854 - Kassab; Mark A. ; et al.	2015-10-08
Continuous application and decompression of test patterns and selective compaction of test responses Grant 9,134,370 - Rajski , et al. September 15, 2	2015-09-15
Isometric Test Compression With Low Toggling Activity App 20150253385 - Rajski; Janusz ; et al.	2015-09-10
Timing-aware test generation and fault simulation Grant 9,086,454 - Lin , et al. July 21, 2	2015-07-21
Test scheduling with pattern-independent test access mechanism Grant 9,088,522 - Rajski , et al. July 21, 2	2015-07-21
On-chip Comparison And Response Collection Tools And Techniques App 20150160290 - Mukherjee; Nilanjan ; et al.	2015-06-11
Dynamic Shift For Test Pattern Compression App 20150153410 - Lin; Xijiang ; et al.	2015-06-04
Channel Sharing For Testing Circuits Having Non-Identical Cores App 20150149847 - Huang; Yu ; et al.	2015-05-28
Scan chain configuration for test-per-clock based on circuit topology Grant 9,009,553 - Rajski , et al. April 14, 2	2015-04-14
Fault-driven scan chain configuration for test-per-clock Grant 9,003,248 - Rajski , et al. April 7, 2	2015-04-07
Test data volume reduction based on test cube properties Grant 8,996,941 - Lin , et al. March 31, 2	2015-03-31
Scan Chain Stitching For Test-Per-Clock App 20140372821 - Rajski; Janusz ; et al.	2014-12-18
Test-Per-Clock Based On Dynamically-Partitioned Reconfigurable Scan Chains App 20140372818 - Rajski; Janusz ; et al.	2014-12-18
Scan Chain Configuration For Test-Per-Clock Based On Circuit Topology App 20140372819 - Rajski; Janusz ; et al.	2014-12-18
Fault-Driven Scan Chain Configuration For Test-Per-Clock App 20140372820 - Rajski; Janusz ; et al.	2014-12-18
Test Generation For Test-Per-Clock App 20140372824 - Rajski; Janusz ; et al.	2014-12-18
On-chip comparison and response collection tools and techniques Grant 8,914,694 - Mukherjee , et al. December 16, 2	2014-12-16
Logic Built-In Self-Test with High Test Coverage and Low Switching Activity App 20140365840 - Lin; Xijiang ; et al.	2014-12-11
Scan cell use with reduced power consumption Grant 8,890,563 - Lin , et al. November 18, 2	2014-11-18
Low power compression of incompatible test cubes Grant 8,832,512 - Czysz , et al. September 9, 2	2014-09-09
Selective Per-cycle Masking Of Scan Chains For System Level Test App 20140229779 - Rajski; Janusz ; et al.	2014-08-14
Scan-based Test Architecture For Interconnects In Stacked Designs App 20140223247 - Rajski; Janusz ; et al.	2014-08-07
Scan test application through high-speed serial input/outputs Grant 8,726,112 - Rajski , et al. May 13, 2	2014-05-13
Selective per-cycle masking of scan chains for system level test Grant 8,726,113 - Rajski , et al. May 13, 2	2014-05-13
Test generator for low power built-in self-test Grant 8,683,280 - Rajski , et al. March 25, 2	2014-03-25
Timing-aware Test Generation And Fault Simulation App 20140047404 - Lin; Xijiang ; et al.	2014-02-13
Continuous Application And Decompression Of Test Patterns And Selective Compaction Of Test Responses App 20140006888 - Rajski; Janusz ; et al.	2014-01-02
Test Data Volume Reduction Based On Test Cube Properties App 20130332786 - Lin; Xijiang ; et al.	2013-12-12
Enhanced diagnosis with limited failure cycles Grant 8,595,574 - Huang , et al. November 26, 2	2013-11-26
On-chip Comparison And Response Collection Tools And Techniques App 20130305107 - Mukherjee; Nilanjan ; et al.	2013-11-14
Test Scheduling With Pattern-Independent Test Access Mechanism App 20130290795 - Rajski; Janusz ; et al.	2013-10-31
Timing-aware test generation and fault simulation Grant 8,560,906 - Lin , et al. October 15, 2	2013-10-15
Enhanced Diagnosis With Limited Failure Cycles App 20130246869 - Huang; Yu ; et al.	2013-09-19
Continuous application and decompression of test patterns and selective compaction of test responses Grant 8,533,547 - Rajski , et al. September 10, 2	2013-09-10
At-speed scan testing with controlled switching activity Grant 8,499,209 - Rajski , et al. July 30, 2	2013-07-30
Enhanced diagnosis with limited failure cycles Grant 8,438,438 - Huang , et al. May 7, 2	2013-05-07
On-chip comparison and response collection tools and techniques Grant 8,418,007 - Mukherjee , et al. April 9, 2	2013-04-09
Fault diagnosis for non-volatile memories Grant 8,356,222 - Mukherjee , et al. January 15, 2	2013-01-15
Compression based on deterministic vector clustering of incompatible test cubes Grant 8,347,159 - Mrugalski , et al. January 1, 2	2013-01-01
Compactor independent fault diagnosis Grant 8,301,414 - Cheng , et al. October 30, 2	2012-10-30
Decompressors for low power decompression of test patterns Grant 8,301,945 - Rajski , et al. October 30, 2	2012-10-30
Test Generator For Low Power Built-In Self-Test App 20120272110 - Rajski; Janusz ; et al.	2012-10-25
Low power scan testing techniques and apparatus Grant 8,290,738 - Lin , et al. October 16, 2	2012-10-16
Compactor independent direct diagnosis of test hardware Grant 8,280,688 - Huang , et al. October 2, 2	2012-10-02
Selective Per-cycle Masking Of Scan Chains For System Level Test App 20120210181 - Rajski; Janusz ; et al.	2012-08-16
Low Power Scan-Based Testing App 20120209556 - RAJSKI; JANUSZ ; et al.	2012-08-16
Timing-aware Test Generation And Fault Simulation App 20120174049 - Lin; Xijiang ; et al.	2012-07-05
Generating test patterns having enhanced coverage of untargeted defects Grant 8,201,131 - Rajski , et al. June 12, 2	2012-06-12
Selective per-cycle masking of scan chains for system level test Grant 8,166,359 - Rajski , et al. April 24, 2	2012-04-24
Modular compaction of test responses Grant 8,161,338 - Rajski , et al. April 17, 2	2012-04-17
Scan Cell Use With Reduced Power Consumption App 20120043991 - Lin; Xijiang ; et al.	2012-02-23
Method and apparatus for selectively compacting test responses Grant 8,108,743 - Rajski , et al. January 31, 2	2012-01-31
Decompressors For Low Power Decompression Of Test Patterns App 20110320999 - Rajski; Janusz ; et al.	2011-12-29
Timing-aware test generation and fault simulation Grant 8,051,352 - Lin , et al. November 1, 2	2011-11-01
Low power decompression of test cubes Grant 8,046,653 - Rajski , et al. October 25, 2	2011-10-25
Low Power Compression Of Incompatible Test Cubes App 20110231721 - CZYSZ; DARIUSZ ; et al.	2011-09-22
On-chip Comparison And Response Collection Tools And Techniques App 20110231722 - Mukherjee; Nilanjan ; et al.	2011-09-22
Method for synthesizing linear finite state machines Grant 8,024,387 - Rajski , et al. September 20, 2	2011-09-20
Decompressors for low power decompression of test patterns Grant 8,015,461 - Rajski , et al. September 6, 2	2011-09-06
Continuous Application And Decompression Of Test Patterns And Selective Compaction Of Test Responses App 20110214026 - Rajski; Janusz ; et al.	2011-09-01
Fault dictionaries for integrated circuit yield and quality analysis methods and systems Grant 7,987,442 - Rajski , et al. July 26, 2	2011-07-26
Generating responses to patterns stimulating an electronic circuit with timing exception paths Grant 7,984,354 - Goswami , et al. July 19, 2	2011-07-19
Low Power Scan Testing Techniques And Apparatus App 20110166818 - Lin; Xijiang ; et al.	2011-07-07
Decompressor/prpg For Applying Pseudo-random And Deterministic Test Patterns App 20110167309 - Rajski; Janusz ; et al.	2011-07-07
Fault diagnosis of compressed test responses Grant 7,962,820 - Rajski , et al. June 14, 2	2011-06-14
Method And Apparatus For Selectively Compacting Test Responses App 20110138242 - Rajski; Janusz ; et al.	2011-06-09
Enhanced Diagnosis With Limited Failure Cycles App 20110126064 - Huang; Yu ; et al.	2011-05-26
Low power scan testing techniques and apparatus Grant 7,925,465 - Lin , et al. April 12, 2	2011-04-12
On-chip comparison and response collection tools and techniques Grant 7,913,137 - Mukherjee , et al. March 22, 2	2011-03-22
Fault Diagnosis In A Memory Bist Environment App 20110055646 - Mukherjee; Nilanjan ; et al.	2011-03-03
Test pattern compression for an integrated circuit test environment Grant 7,900,104 - Rajski , et al. March 1, 2	2011-03-01
Compressing test responses using a compactor Grant 7,890,827 - Rajski , et al. February 15, 2	2011-02-15
Continuous application and decompression of test patterns to a circuit-under-test Grant 7,877,656 - Rajski , et al. January 25, 2	2011-01-25
Test generation methods for reducing power dissipation and supply currents Grant 7,865,792 - Lin , et al. January 4, 2	2011-01-04
Decompressor/PRPG for applying pseudo-random and deterministic test patterns Grant 7,865,794 - Rajski , et al. January 4, 2	2011-01-04
Scan Test Application Through High-Speed Serial Input/Outputs App 20100313089 - Rajski; Janusz ; et al.	2010-12-09
Low Power Decompression Of Test Cubes App 20100306609 - Rajski; Janusz ; et al.	2010-12-02
Compactor Independent Direct Diagnosis Of Test Hardware App 20100306606 - Huang; Yu ; et al.	2010-12-02
Enhanced diagnosis with limited failure cycles Grant 7,840,862 - Huang , et al. November 23, 2	2010-11-23
At-Speed Scan Testing With Controlled Switching Activity App 20100275077 - Rajski; Janusz ; et al.	2010-10-28
Multi-stage test response compactors Grant 7,818,644 - Rajski , et al. October 19, 2	2010-10-19
Compressing Test Responses Using A Compactor App 20100257417 - Rajski; Janusz ; et al.	2010-10-07
Method and apparatus for selectively compacting test responses Grant 7,805,649 - Rajski , et al. September 28, 2	2010-09-28
Phase shifter with reduced linear dependency Grant 7,805,651 - Rajski , et al. September 28, 2	2010-09-28
Low power decompression of test cubes Grant 7,797,603 - Rajski , et al. September 14, 2	2010-09-14
Fault Diagnosis For Non-Volatile Memories App 20100229055 - MUKHERJEE; NILANJAN ; et al.	2010-09-09
Compression Based On Deterministic Vector Clustering Of Incompatible Test Cubes App 20100229060 - MRUGALSKI; GRZEGORZ ; et al.	2010-09-09
Methods for distribution of test generation programs Grant 7,765,450 - Udell , et al. July 27, 2	2010-07-27
Compressing test responses using a compactor Grant 7,743,302 - Rajski , et al. June 22, 2	2010-06-22
Test Generation Methods For Reducing Power Dissipation And Supply Currents App 20100146350 - Lin; Xijiang ; et al.	2010-06-10
Decompressors For Low Power Decompression Of Test Patterns App 20100138708 - Rajski; Janusz ; et al.	2010-06-03
Compactor independent direct diagnosis of test hardware Grant 7,729,884 - Huang , et al. June 1, 2	2010-06-01
Phase Shifter With Reduced Linear Dependency App 20100083063 - Rajski; Janusz ; et al.	2010-04-01
Test generation methods for reducing power dissipation and supply currents Grant 7,685,491 - Lin , et al. March 23, 2	2010-03-23
Methods for distributing programs for generating test data Grant 7,669,101 - Udell , et al. February 23, 2	2010-02-23
Phase shifter with reduced linear dependency Grant 7,653,851 - Rajski , et al. January 26, 2	2010-01-26
Decompressors for low power decompression of test patterns Grant 7,647,540 - Rajski , et al. January 12, 2	2010-01-12
Generating Responses To Patterns Stimulating An Electronic Circuit With Timing Exception Paths App 20090327986 - Goswami; Dhiraj ; et al.	2009-12-31
Selective Per-Cycle Masking Of Scan Chains For System Level Test App 20090300446 - Rajski; Janusz ; et al.	2009-12-03
Test Pattern Compression For An Integrated Circuit Test Environment App 20090259900 - Rajski; Janusz ; et al.	2009-10-15
Fault Diagnosis Of Compressed Test Responses App 20090249147 - Rajski; Janusz ; et al.	2009-10-01
Method And Apparatus For Selectively Compacting Test Responses App 20090228749 - Rajski; Janusz ; et al.	2009-09-10
Determining And Analyzing Integrated Circuit Yield And Quality App 20090210183 - Rajski; Janusz ; et al.	2009-08-20
Phase Shifter With Reduced Linear Dependency App 20090187800 - Rajski; Janusz ; et al.	2009-07-23
Continuous Application And Decompression Of Test Patterns To A Circuit-under-test App 20090183041 - Rajski; Janusz ; et al.	2009-07-16
Generating Test Patterns Having Enhanced Coverage Of Untargeted Defects App 20090183128 - Rajski; Janusz ; et al.	2009-07-16
Decompressor/prpg For Applying Pseudo-random And Deterministic Test Patterns App 20090177933 - Rajski; Janusz ; et al.	2009-07-09
Generating responses to patterns stimulating an electronic circuit with timing exception paths Grant 7,555,689 - Goswami , et al. June 30, 2	2009-06-30
Phase shifter with reduced linear dependency Grant 7,523,372 - Rajski , et al. April 21, 2	2009-04-21
Determining and analyzing integrated circuit yield and quality Grant 7,512,508 - Rajski , et al. March 31, 2	2009-03-31
Test pattern compression for an integrated circuit test environment Grant 7,509,546 - Rajski , et al. March 24, 2	2009-03-24
Fault diagnosis of compressed test responses Grant 7,509,550 - Rajski , et al. March 24, 2	2009-03-24
Generating test patterns having enhanced coverage of untargeted defects Grant 7,509,600 - Rajski , et al. March 24, 2	2009-03-24
Decompressor/PRPG for applying pseudo-random and deterministic test patterns Grant 7,506,232 - Rajski , et al. March 17, 2	2009-03-17
Method and apparatus for selectively compacting test responses Grant 7,500,163 - Rajski , et al. March 3, 2	2009-03-03
Continuous application and decompression of test patterns to a circuit-under-test Grant 7,478,296 - Rajski , et al. January 13, 2	2009-01-13
Methods For Distribution Of Test Generation Programs App 20080320352 - Udell; Jon ; et al.	2008-12-25
Fault diagnosis of compressed test responses having one or more unknown states Grant 7,437,640 - Rajski , et al. October 14, 2	2008-10-14
Method and apparatus for at-speed testing of digital circuits Grant 7,437,636 - Rajski , et al. October 14, 2	2008-10-14
Methods For Distributing Programs For Generating Test Data App 20080216076 - Udell; Jon ; et al.	2008-09-04
Low power scan testing techniques and apparatus App 20080195346 - Lin; Xijiang ; et al.	2008-08-14
Methods for distributing programs for generating test data Grant 7,386,778 - Udell , et al. June 10, 2	2008-06-10
Compressing test responses using a compactor App 20080133987 - Rajski; Janusz ; et al.	2008-06-05
Compressing test responses using a compactor Grant 7,370,254 - Rajski , et al. May 6, 2	2008-05-06
Decompressors for low power decompression of test patterns App 20080052578 - Rajski; Janusz ; et al.	2008-02-28
Low power decompression of test cubes App 20080052586 - Rajski; Janusz ; et al.	2008-02-28
Phase shifter with reduced linear dependency App 20070300110 - Rajski; Janusz ; et al.	2007-12-27
Method for synthesizing linear finite state machines App 20070294327 - Rajski; Janusz ; et al.	2007-12-20
Timing-aware test generation and fault simulation App 20070288822 - Lin; Xijiang ; et al.	2007-12-13
Compactor Independent Fault Diagnosis App 20070283202 - Cheng; Wu-Tung ; et al.	2007-12-06
Adaptive fault diagnosis of compressed test responses Grant 7,302,624 - Rajski , et al. November 27, 2	2007-11-27
Test generation methods for reducing power dissipation and supply currents App 20070250749 - Lin; Xijiang ; et al.	2007-10-25
On-chip comparison and response collection tools and techniques App 20070234163 - Mukherjee; Nilanjan ; et al.	2007-10-04
Multi-stage test response compactors App 20070234157 - Rajski; Janusz ; et al.	2007-10-04
Generating masking control circuits for test response compactors App 20070234169 - Rajski; Janusz ; et al.	2007-10-04
Enhanced diagnosis with limited failure cycles App 20070220381 - Huang; Yu ; et al.	2007-09-20
Phase shifter with reduced linear dependency Grant 7,263,641 - Rajski , et al. August 28, 2	2007-08-28
Method for synthesizing linear finite state machines Grant 7,260,591 - Rajski , et al. August 21, 2	2007-08-21
Compactor independent fault diagnosis Grant 7,239,978 - Cheng , et al. July 3, 2	2007-07-03
Modular compaction of test responses App 20070113135 - Rajski; Janusz ; et al.	2007-05-17
Methods for distributing programs for generating test data App 20070094556 - Udell; Jon ; et al.	2007-04-26
Methods for distribution of test generation programs App 20070094561 - Udell; Jon ; et al.	2007-04-26
Test pattern compression for an integrated circuit test environment App 20070016836 - Rajski; Janusz ; et al.	2007-01-18
Generating responses to patterns stimulating an electronic circuit with timing exception paths App 20070011527 - Goswami; Dhiraj ; et al.	2007-01-11
Decompressor/PRPG for applying pseudo-random and deterministic test patterns App 20070011530 - Rajski; Janusz ; et al.	2007-01-11
Test pattern compression for an integrated circuit test environment Grant 7,111,209 - Rajski , et al. September 19, 2	2006-09-19
Decompressor/PRPG for applying pseudo-random and deterministic test patterns Grant 7,093,175 - Rajski , et al. August 15, 2	2006-08-15
Compactor independent direct diagnosis of test hardware App 20060111873 - Huang; Yu ; et al.	2006-05-25
Defect location identification for microdevice manufacturing and test App 20060069958 - Sawicki; Joseph D. ; et al.	2006-03-30
Determining and analyzing integrated circuit yield and quality App 20060066339 - Rajski; Janusz ; et al.	2006-03-30
Fault dictionaries for integrated circuit yield and quality analysis methods and systems App 20060066338 - Rajski; Janusz ; et al.	2006-03-30
Method and apparatus for at-speed testing of digital circuits App 20060064616 - Rajski; Janusz ; et al.	2006-03-23
Integrated circuit yield and quality analysis methods and systems App 20060053357 - Rajski; Janusz ; et al.	2006-03-09
Adaptive fault diagnosis of compressed test responses App 20060041813 - Rajski; Janusz ; et al.	2006-02-23
Fault diagnosis of compressed test responses having one or more unknown states App 20060041814 - Rajski; Janusz ; et al.	2006-02-23
Fault diagnosis of compressed test responses App 20060041812 - Rajski; Janusz ; et al.	2006-02-23
Method and apparatus for at-speed testing of digital circuits Grant 6,966,021 - Rajski , et al. November 15, 2	2005-11-15
Generating test patterns having enhanced coverage of untargeted defects App 20050240887 - Rajski, Janusz ; et al.	2005-10-27
Arithmetic built-in self-test of multiple scan-based integrated circuits Grant 6,954,888 - Rajski , et al. October 11, 2	2005-10-11
Compactor independent fault diagnosis App 20050222816 - Cheng, Wu-Tung ; et al.	2005-10-06
Method and apparatus for selectively compacting test reponses App 20050097419 - Rajski, Janusz ; et al.	2005-05-05
Phase shifter with reduced linear dependency Grant 6,874,109 - Rajski , et al. March 29, 2	2005-03-29
Arithmetic built-in self-test of multiple scan-based integrated circuits App 20050060626 - Rajski, Janusz ; et al.	2005-03-17
Phase shifter with reduced linear dependency App 20050015688 - Rajski, Janusz ; et al.	2005-01-20
Method and apparatus for selectively compacting test responses Grant 6,829,740 - Rajski , et al. December 7, 2	2004-12-07
Compressing test responses using a compactor App 20040230884 - Rajski, Janusz ; et al.	2004-11-18
Method for synthesizing linear finite state machines App 20040172431 - Rajski, Janusz ; et al.	2004-09-02
Decompressor/PRPG for applying pseudo-random and deterministic test patterns App 20040128599 - Rajski, Janusz ; et al.	2004-07-01
Arithmetic built-in self-test of multiple scan-based integrated circuits Grant 6,728,901 - Rajski , et al. April 27, 2	2004-04-27
Method for synthesizing linear finite state machines Grant 6,708,192 - Rajski , et al. March 16, 2	2004-03-16
Decompressor/PRPG for applying pseudo-random and deterministic test patterns Grant 6,684,358 - Rajski , et al. January 27, 2	2004-01-27
Method for clustered test pattern generation Grant 6,662,327 - Rajski December 9, 2	2003-12-09
Test pattern compression for an integrated circuit test environment App 20030131298 - Rajski, Janusz ; et al.	2003-07-10
Continuous application and decompression of test patterns to a circuit-under-test App 20030120988 - Rajski, Janusz ; et al.	2003-06-26
Method and apparatus for selectively compacting test responses App 20030115521 - Rajski, Janusz ; et al.	2003-06-19
Method for synthesizing linear finite state machines App 20030110193 - Rajski, Janusz ; et al.	2003-06-12
Method and apparatus for at-speed testing of digital circuits App 20030097614 - Rajski, Janusz ; et al.	2003-05-22
At-speed test using on-chip controller App 20030084390 - Tamarapalli, Nagesh ; et al.	2003-05-01
Method and apparatus for selectively compacting test responses Grant 6,557,129 - Rajski , et al. April 29, 2	2003-04-29
Test pattern compression for an integrated circuit test environment Grant 6,543,020 - Rajski , et al. April 1, 2	2003-04-01
Method for synthesizing linear finite state machines Grant 6,539,409 - Rajski , et al. March 25, 2	2003-03-25
Method and apparatus for diagnosing memory using self-testing circuits Grant 6,421,794 - Chen , et al. July 16, 2	2002-07-16
Test pattern compression for an integrated circuit test environment App 20020053057 - Rajski, Janusz ; et al.	2002-05-02
Method for synthesizing linear finite state machines Grant 6,353,842 - Rajski , et al. March 5, 2	2002-03-05
Method for synthesizing linear finite state machines App 20020016806 - Rajski, Janusz ; et al.	2002-02-07
Test pattern compression for an integrated circuit test environment Grant 6,327,687 - Rajski , et al. December 4, 2	2001-12-04
Parallel decompressor and related methods and apparatuses Grant 5,991,909 - Rajski , et al. November 23, 1	1999-11-23
Multi-phase test point insertion for built-in self test of integrated circuits Grant 5,737,340 - Tamarapalli , et al. April 7, 1	1998-04-07
Self-testable digital integrator Grant 5,313,469 - Adham , et al. May 17, 1	1994-05-17

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.