Patent | Date |
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System and Method for Increasing Productivity of Combinatorial Screening App 20140315332 - Pinto; Gustavo A. ;   et al. | 2014-10-23 |
System and method for increasing productivity of combinatorial screening Grant 8,772,772 - Weiner , et al. July 8, 2 | 2014-07-08 |
Multiple directional scans of test structures on semiconductor integrated circuits Grant 7,656,170 - Pinto , et al. February 2, 2 | 2010-02-02 |
Chemical mechanical polishing test structures and methods for inspecting the same Grant 7,655,482 - Satya , et al. February 2, 2 | 2010-02-02 |
Test Structures And Methods For Inspection Of Semiconductor Integrated Circuits App 20080246030 - Satya; Akella V.S. ;   et al. | 2008-10-09 |
Multiple Directional Scans Of Test Structures On Semiconductor Integrated Circuits App 20080237487 - Pinto; Gustavo A. ;   et al. | 2008-10-02 |
System and Method for Increasing Productivity of Combinatorial Screening App 20070267631 - Weiner; Kurt H. ;   et al. | 2007-11-22 |
Chemical Mechanical Polishing Test Structures And Methods For Inspecting The Same App 20070111342 - Satya; Akella V. S. ;   et al. | 2007-05-17 |
Chemical mechanical polishing test structures and methods for inspecting the same Grant 7,179,661 - Satya , et al. February 20, 2 | 2007-02-20 |
Material management in substrate processing App 20060292846 - Pinto; Gustavo A. ;   et al. | 2006-12-28 |
Media servowriting system App 20060119977 - Zhu; Jun ;   et al. | 2006-06-08 |
Multiple directional scans of test structures on semiconductor integrated circuits Grant 7,012,439 - Pinto , et al. March 14, 2 | 2006-03-14 |
Media servowriting system Grant 6,977,791 - Zhu , et al. December 20, 2 | 2005-12-20 |
Test structures and methods for inspection of semiconductor integrated circuits Grant 6,921,672 - Satya , et al. July 26, 2 | 2005-07-26 |
Multiple directional scans of test structures on semiconductor integrated circuits App 20050139767 - Pinto, Gustavo A. ;   et al. | 2005-06-30 |
Multiple directional scans of test structures on semiconductor integrated circuits Grant 6,867,606 - Pinto , et al. March 15, 2 | 2005-03-15 |
Media servowriting system App 20040125488 - Zhu, Jun ;   et al. | 2004-07-01 |
Stepper type test structures and methods for inspection of semiconductor integrated circuits Grant 6,633,174 - Satya , et al. October 14, 2 | 2003-10-14 |
Multiple directional scans of test structures on srmiconductor integrated circuits App 20030155927 - Pinto, Gustavo A. ;   et al. | 2003-08-21 |
Inspectable buried test structures and methods for inspecting the same Grant 6,576,923 - Satya , et al. June 10, 2 | 2003-06-10 |
Test structures and methods for inspection of semiconductor integrated circuits App 20030096436 - Satya, Akella V. S. ;   et al. | 2003-05-22 |
Multiple directional scans of test structures on semiconductor integrated circuits Grant 6,566,885 - Pinto , et al. May 20, 2 | 2003-05-20 |
Test structures and methods for inspection of semiconductor integrated circuits Grant 6,528,818 - Satya , et al. March 4, 2 | 2003-03-04 |
Inspectable buried test structures and methods for inspecting the same Grant 6,509,197 - Satya , et al. January 21, 2 | 2003-01-21 |
Inspectable buried test structures and methods for inspecting the same App 20020187582 - Satya, Akella V. S. ;   et al. | 2002-12-12 |
Methods and apparatus for optimizing semiconductor inspection tools Grant 6,433,561 - Satya , et al. August 13, 2 | 2002-08-13 |