Pfaff; Paul L.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Pfaff; Paul L..The latest application filed is for "optical methods for obtaining digital data to be used in determining, shaping or testing of semiconductor or anisotropic materials, or devices, under test through all stages of manufacture or development".

Company Profile

0.15.16

Pfaff; Paul L. - Lake Oswego OR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Optical methods for obtaining digital data to be used in determining, shaping or testing of semiconductor or anisotropic materials, or devices, under test through all stages of manufacture or development App 20180246045 - Pfaff; Paul L.	2018-08-30
Methods for obtaining and analyzing digital interferometric data for computer testing and developing semiconductor and anisotropic devices and materials Grant 9,952,161 - Pfaff April 24, 2	2018-04-24
Advanced 4-dimensional Signal And Device Testing Using Circuit-state Recognition App 20160291088 - Pfaff; Paul L.	2016-10-06
Multiple Beam Transmission Interferometric Testing Methods For The Development And Evaluation Of Subwavelength Sized Features Within Semiconductor And Anisotropic Devices App 20160195479 - Pfaff; Paul L.	2016-07-07
Optical to optical methods enhancing the sensitivity and resolution of ultraviolet, electron beam and ion beam devices Grant 9,366,719 - Pfaff June 14, 2	2016-06-14
Multiple beam transmission interferometric testing methods for the development and evaluation of subwavelength sized features within semiconductor and anisotropic devices Grant 9,250,064 - Pfaff February 2, 2	2016-02-02
Multiple Beam Transmission Interferometric Testing Methods For The Development And Evaluation Of Subwavelength Sized Features Within Semiconductor And Anisotropic Devices App 20150041657 - Pfaff; Paul L.	2015-02-12
Multiple optical wavelength interferometric testing methods for the development and evaluation of subwavelength sized features within semiconductor devices and materials, wafers, and monitoring all phases of development and manufacture Grant 8,879,071 - Pfaff November 4, 2	2014-11-04
Methods and processes for optical interferometric or holographic test in the development, evaluation, and manufacture of semiconductor and free-metal devices utilizing anisotropic and isotropic materials Grant 8,736,823 - Pfaff May 27, 2	2014-05-27
Optical To Optical Time And Spatial Resolution Enhancements For Improving Characterization Of Secondary Electron Emission And Control For Etch-, Electron-, And Ion-beam Devices App 20140103935 - Pfaff; Paul L.	2014-04-17
Multiple Optical Wavelength Interferometric Testing Methods For The Development And Evaluation Of Subwavelength Sized Features Within Semiconductor Devices And Materials, Wafers, And Monitoring All Phases Of Development And Manufacture App 20130337585 - Pfaff; Paul L.	2013-12-19
Methods And Processes For Optical Interferometric Or Holographic Test In The Development, Evaluation, And Manufacture Of Semiconductor And Free-metal Devices Utilizing Anisotropic And Isotropic Materials App 20130181722 - Pfaff; Paul L.	2013-07-18
Optically enhanced holographic interferometric testing methods for the development and evaluation of semiconductor devices, materials, wafers, and for monitoring all phases of development and manufacture Grant 8,462,350 - Pfaff June 11, 2	2013-06-11
Optical to optical infrared imaging detection system Grant 8,405,823 - Pfaff March 26, 2	2013-03-26
Holographic Condition Assessment System For A Structure Including A Semiconductor Material App 20120133922 - Pfaff; Paul L.	2012-05-31
Optically Enhanced Holographic Interferometric Testing Methods For The Development And Evaluation Of Semiconductor Devices, Materials, Wafers, And For Monitoring All Phases Of Development And Manufacture App 20120127473 - Pfaff; Paul L.	2012-05-24
Methods for optically enhanced holographic interferometric testing for test and evaluation of semiconductor devices and materials Grant 8,139,228 - Pfaff March 20, 2	2012-03-20
Holographic condition assessment system for a structure including a semiconductor material Grant 8,040,521 - Pfaff October 18, 2	2011-10-18
Method For Optically Enhanced Holograhic Interferometric Testing For Test And Evaluation Of Semiconductor Devices And Materials App 20110122415 - Pfaff; Paul L.	2011-05-26
Method for optically testing semiconductor devices Grant 7,733,499 - Pfaff June 8, 2	2010-06-08
Condition assessment method for a structure including a semiconductor material Grant 7,728,958 - Pfaff June 1, 2	2010-06-01
Holographic Condition Assessment System For A Structure Including A Semiconductor Material App 20100091292 - Pfaff; Paul L.	2010-04-15
Condition assessment system for a structure including a semiconductor material Grant 7,420,687 - Pfaff September 2, 2	2008-09-02
Condition Assessment Method For A Structure Including A Semiconductor Material App 20080186580 - Pfaff; Paul L.	2008-08-07
Condition Assessment Method For A Structure Including A Semiconductor Material App 20070018662 - Pfaff; Paul L.	2007-01-25
Condition Assessment System For A Structure Including A Semiconductor Material App 20070019209 - Pfaff; Paul L.	2007-01-25
Non-destructive Testing System App 20060244974 - Pfaff; Paul L.	2006-11-02

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