Peng; Jack Z.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Peng; Jack Z..The latest application filed is for "high reliable otp memory with low reading voltage".

Company Profile

2.9.13

Peng; Jack Z. - Chengdu CN
Peng; Jack Z. - San Jose CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
High reliable OTP memory with low reading voltage Grant 10,510,427 - Liao , et al. Dec	2019-12-17
High reliability OTP memory by using of voltage isolation in series Grant 10,504,908 - Peng , et al. Dec	2019-12-10
High Reliable OTP Memory with Low Reading Voltage App 20190341119 - LIAO; Xuyang ; et al.	2019-11-07
High Reliability OTP Memory by Using of Voltage Isolation in Series App 20190341393 - PENG; Jack Z. ; et al.	2019-11-07
Soft breakdown mode, low voltage, low power antifuse-based non-volatile memory cell Grant 8,797,820 - Peng , et al. August 5, 2	2014-08-05
Spurious induced charge cleanup for one time programmable (OTP) memory Grant 8,780,660 - Peng July 15, 2	2014-07-15
Soft Breakdown Mode, Low Voltage, Low Power Antifuse-based Non-volatile Memory Cell App 20130208525 - Peng; Jack Z. ; et al.	2013-08-15
Spurious Induced Charge Cleanup For One Time Programmable (otp) Memory App 20130194885 - Peng; Jack Z.	2013-08-01
Low voltage and low power memory cell based on nano current voltage divider controlled low voltage sense MOSFET Grant 8,259,518 - Peng , et al. September 4, 2	2012-09-04
A New Low Voltage And Low Power Memory Cell Based On Nano Current Voltage Divider Controlled Low Voltage Sense Mosfet App 20110299344 - Peng; Jack Z. ; et al.	2011-12-08
Electrically programmable fuse bit Grant 7,907,465 - Peng , et al. March 15, 2	2011-03-15
Electically Programmable Fuse Bit App 20100091545 - Peng; Jack Z. ; et al.	2010-04-15
Memory Transistor Gate Oxide Stress Release And Improved Reliability App 20070230232 - Fong; David ; et al.	2007-10-04
Memory Transistor Gate Oxide Stress Release And Improved Reliability App 20070206417 - Fong; David ; et al.	2007-09-06
Electrically programmable fuse bit App 20070183181 - Peng; Jack Z. ; et al.	2007-08-09
Field programmable gate array logic cell and its derivatives App 20050218929 - Wang, Man ; et al.	2005-10-06
Combination field programmable gate array allowing dynamic reprogrammability App 20050169040 - Peng, Jack Z. ; et al.	2005-08-04
CMOS EEPROM cell with tunneling window in the read path Grant 5,587,945 - Lin , et al. December 24, 1	1996-12-24

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