Okayasu; Toshiyuki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Okayasu; Toshiyuki.The latest application filed is for "test apparatus and test method".

Company Profile

0.124.99

Okayasu; Toshiyuki - Tokyo JP
Okayasu; Toshiyuki - Saitama N/A JP
Okayasu; Toshiyuki - Nerima-ku JP
Okayasu; Toshiyuki - Ohra-gun JP
Okayasu, Toshiyuki - Kitakasushika-gun JP
Okayasu; Toshiyuki - Kurihashi-machi JP
Okayasu; Toshiyuki - Kurihashi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Test apparatus and testing method Grant 8,933,716 - Ishida , et al. January 13, 2	2015-01-13
Test apparatus with voltage margin test Grant 8,896,332 - Ishida , et al. November 25, 2	2014-11-25
Test apparatus and manufacturing method Grant 8,892,381 - Watanabe , et al. November 18, 2	2014-11-18
Test apparatus for digital modulated signal Grant 8,754,631 - Watanabe , et al. June 17, 2	2014-06-17
Electronic device and manufacturing method Grant 8,614,465 - Watanabe , et al. December 24, 2	2013-12-24
Wafer unit for testing and test system Grant 8,610,449 - Watanabe , et al. December 17, 2	2013-12-17
Semiconductor wafer, semiconductor circuit, substrate for testing and test system Grant 8,593,166 - Watanabe , et al. November 26, 2	2013-11-26
Test apparatus and test method Grant 8,554,514 - Yamamoto , et al. October 8, 2	2013-10-08
Clock data recovery circuit and method Grant 8,537,935 - Watanabe , et al. September 17, 2	2013-09-17
Test apparatus and driver circuit Grant 8,502,549 - Kojima , et al. August 6, 2	2013-08-06
Test apparatus and test method Grant 8,473,248 - Yamamoto , et al. June 25, 2	2013-06-25
Time measurement circuit Grant 8,471,754 - Yamamoto , et al. June 25, 2	2013-06-25
Power supply stabilizing circuit, electronic device and test apparatus Grant 8,466,701 - Kojima , et al. June 18, 2	2013-06-18
Test system and substrate unit for testing Grant 8,466,702 - Watanabe , et al. June 18, 2	2013-06-18
Test Apparatus And Test Method App 20130147499 - Ishida; Masahiro ; et al.	2013-06-13
Test apparatus for digital modulated signal Grant 8,456,170 - Watanabe , et al. June 4, 2	2013-06-04
Measuring apparatus, parallel measuring apparatus, testing apparatus and electronic device Grant 8,436,604 - Yamamoto , et al. May 7, 2	2013-05-07
Noise measurement apparatus and test apparatus Grant 8,390,268 - Okayasu March 5, 2	2013-03-05
Timing generator Grant 8,392,145 - Watanabe , et al. March 5, 2	2013-03-05
Wafer unit for testing semiconductor chips and test system Grant 8,378,700 - Watanabe , et al. February 19, 2	2013-02-19
Apparatus for manufacturing substrate for testing, method for manufacturing substrate for testing and recording medium Grant 8,375,340 - Watanabe , et al. February 12, 2	2013-02-12
Memory device, manufacturing method for memory device and method for data writing Grant 8,369,126 - Okayasu , et al. February 5, 2	2013-02-05
Switching device and testing apparatus Grant 8,362,544 - Okayasu January 29, 2	2013-01-29
Test Apparatus For Digital Modulated Signal App 20120319794 - Watanabe; Daisuke ; et al.	2012-12-20
Test apparatus and electronic device Grant 8,299,810 - Watanabe , et al. October 30, 2	2012-10-30
Electronic device, host apparatus, communication system, and recording medium Grant 8,301,411 - Okayasu October 30, 2	2012-10-30
Test apparatus and test method Grant 8,278,961 - Watanabe , et al. October 2, 2	2012-10-02
Transfer circuit, transmitter, receiver and test apparatus Grant 8,278,962 - Watanabe , et al. October 2, 2	2012-10-02
Test apparatus and electronic device that tests a device under test Grant 8,274,296 - Kawabata , et al. September 25, 2	2012-09-25
Data receiving circuit Grant 8,270,225 - Watanabe , et al. September 18, 2	2012-09-18
Delay circuit Grant 8,269,553 - Yamamoto , et al. September 18, 2	2012-09-18
Test apparatus for digital modulated signal Grant 8,269,569 - Watanabe , et al. September 18, 2	2012-09-18
Test apparatus and manufacturing method Grant 8,239,147 - Watanabe , et al. August 7, 2	2012-08-07
Timing Generator App 20120158348 - Watanabe; Daisuke ; et al.	2012-06-21
Test Apparatus App 20120146416 - Ishida; Masahiro ; et al.	2012-06-14
Test Apparatus App 20120112783 - Ishida; Masahiro ; et al.	2012-05-10
Test apparatus, demodulation apparatus, test method, demodulation method and electric device Grant 8,159,290 - Yamamoto , et al. April 17, 2	2012-04-17
Timing generator Grant 8,150,648 - Watanabe , et al. April 3, 2	2012-04-03
Signal transmission device, signal reception device, test module, and semiconductor chip Grant 8,139,953 - Okayasu , et al. March 20, 2	2012-03-20
Semiconductor circuit Grant 8,129,857 - Kojima , et al. March 6, 2	2012-03-06
Electronic device identifying method and electronic device comprising identification means Grant 8,093,918 - Okayasu , et al. January 10, 2	2012-01-10
Switching Device And Testing Apparatus App 20110309427 - Okayasu; Toshiyuki	2011-12-22
Semiconductor circuit for performing signal processing Grant 8,063,682 - Kojima , et al. November 22, 2	2011-11-22
Switching device and testing apparatus Grant 8,058,648 - Okayasu November 15, 2	2011-11-15
Memory Device, Manufacturing Method For Memory Device And Method For Data Writing App 20110242895 - OKAYASU; Toshiyuki ; et al.	2011-10-06
A-D converter Grant 8,031,102 - Yamamoto , et al. October 4, 2	2011-10-04
Wafer Unit For Testing And Test System App 20110234252 - WATANABE; Daisuke ; et al.	2011-09-29
Test Apparatus And Manufacturing Method App 20110218752 - WATANABE; Daisuke ; et al.	2011-09-08
Test Apparatus And Test Method App 20110202296 - Yamamoto; Kazuhiro ; et al.	2011-08-18
Electronic Device And Manufacturing Method App 20110193138 - WATANABE; Daisuke ; et al.	2011-08-11
Test Apparatus And Testing Method App 20110181308 - Ishida; Masahiro ; et al.	2011-07-28
Test Apparatus And Test Method App 20110172957 - Yamamoto; Kazuhiro ; et al.	2011-07-14
Test Apparatus And Driver Circuit App 20110163771 - Kojima; Shoji ; et al.	2011-07-07
Semiconductor Wafer, Semiconductor Circuit, Substrate For Testing And Test System App 20110148454 - WATANABE; Daisuke ; et al.	2011-06-23
Signal Output Circuit, Timing Generate Circuit, Test Apparatus And Receiver Circuit App 20110133748 - HAYASE; Yusuke ; et al.	2011-06-09
Time Measurement Circuit App 20110133973 - Yamamoto; Kazuhiro ; et al.	2011-06-09
Test System And Substrate Unit For Testing App 20110128031 - WATANABE; Daisuke ; et al.	2011-06-02
Wafer Unit For Testing And Test System App 20110128027 - WATANABE; Daisuke ; et al.	2011-06-02
Wafer For Testing, Test System, And Semiconductor Wafer App 20110128032 - WATANABE; Daisuke ; et al.	2011-06-02
Apparatus For Manufacturing Substrate For Testing, Method For Manufacturing Substrate For Testing And Recording Medium App 20110125308 - WATANABE; Daisuke ; et al.	2011-05-26
Measuring Apparatus, Parallel Measuring Apparatus, Testing Apparatus And Electronic Device App 20110121815 - YAMAMOTO; Kazuhiro ; et al.	2011-05-26
Test Apparatus And Electrical Device App 20110109321 - KAWABATA; Masayuki ; et al.	2011-05-12
Test Apparatus App 20110099443 - ISHIDA; Masahiro ; et al.	2011-04-28
Test apparatus and test method Grant 7,932,729 - Watanabe , et al. April 26, 2	2011-04-26
Power Supply Stabilizing Circuit, Electronic Device And Test Apparatus App 20110074497 - KOJIMA; Shoji ; et al.	2011-03-31
Signal generating apparatus, test apparatus and circuit device Grant 7,911,242 - Watanabe , et al. March 22, 2	2011-03-22
Connecting device, connecting system, optical waveguide and connecting method Grant 7,905,662 - Fujita , et al. March 15, 2	2011-03-15
Test Apparatus For Digital Modulated Signal App 20110057665 - Watanabe; Daisuke ; et al.	2011-03-10
Test Apparatus For Digital Modulated Signal App 20110057642 - Watanabe; Daisuke ; et al.	2011-03-10
Demodulation apparatus, test apparatus and electronic device Grant 7,902,918 - Yamamoto , et al. March 8, 2	2011-03-08
Test Apparatus And Method For Modulated Signal App 20110054827 - Ishida; Masahiro ; et al.	2011-03-03
Test Apparatus, Demodulation Apparatus, Test Method, Demodulation Method And Electric Device App 20100327967 - YAMAMOTO; Kazuhiro ; et al.	2010-12-30
D-A converter and D-A converting method Grant 7,859,444 - Yamamoto , et al. December 28, 2	2010-12-28
Test Apparatus For Digital Modulated Signal App 20100321127 - Watanabe; Daisuke ; et al.	2010-12-23
Transmission circuit for transmitting a differential signal having pulse time larger than a predetermined minimum pulse time and CMOS semiconductor device Grant 7,852,122 - Yamamoto , et al. December 14, 2	2010-12-14
Test apparatus and test method App 20100308856 - Watanabe; Daisuke ; et al.	2010-12-09
Electronic Device Identifying Method App 20100308839 - Okayasu; Toshiyuki ; et al.	2010-12-09
Method and apparatus for managing manufacturing equipment, method for manufacturing device thereby Grant 7,848,828 - Okayasu , et al. December 7, 2	2010-12-07
Test system, electronic device, and test apparatus Grant 7,847,572 - Watanabe , et al. December 7, 2	2010-12-07
Delay Circuit App 20100259435 - Yamamoto; Kazuhiro ; et al.	2010-10-14
Electronic device identifying method Grant 7,812,595 - Okayasu , et al. October 12, 2	2010-10-12
Transfer Circuit, Transmitter, Receiver And Test Apparatus App 20100208780 - WATANABE; Daisuke ; et al.	2010-08-19
Manufacturing system, manufacturing method, managing apparatus, managing method and computer readable medium Grant 7,774,081 - Okayasu , et al. August 10, 2	2010-08-10
Test apparatus Grant 7,756,654 - Yamamoto , et al. July 13, 2	2010-07-13
Timing Generator App 20100164584 - Watanabe; Daisuke ; et al.	2010-07-01
Electronic Device, Host Apparatus, Communication System, And Recording Medium App 20100161280 - OKAYASU; Toshiyuki	2010-06-24
Transmission System And Test Apparatus App 20100158515 - WATANABE; DAISUKE ; et al.	2010-06-24
Noise Measurement Apparatus And Test Apparatus App 20100148751 - OKAYASU; Toshiyuki	2010-06-17
Data Receiving Circuit App 20100128538 - Watanabe; Daisuke ; et al.	2010-05-27
Hermetically sealing member having optical transmission means, optoelectronic apparatus, and optical transmission method Grant 7,699,538 - Hayase , et al. April 20, 2	2010-04-20
Clock Data Recovery Circuit And Method App 20100090737 - Watanabe; Daisuke ; et al.	2010-04-15
Test Apparatus And Test Method App 20100090709 - WATANABE; Daisuke ; et al.	2010-04-15
Calibration apparatus, calibration method, and testing apparatus Grant 7,684,944 - Ishida , et al. March 23, 2	2010-03-23
Demodulation Apparatus, Test Apparatus And Electronic Device App 20100066443 - YAMAMOTO; Kazuhiro ; et al.	2010-03-18
Test equipment and semiconductor device Grant 7,679,391 - Watanabe , et al. March 16, 2	2010-03-16
Semiconductor Circuit App 20100060336 - Kojima; Shoji ; et al.	2010-03-11
Transfer measurement circuit Grant 7,676,343 - Watanabe , et al. March 9, 2	2010-03-09
Signal Generating Apparatus, Test Apparatus And Circuit Device App 20100052736 - WATANABE; DAISUKE ; et al.	2010-03-04
Test Apparatus And Manufacturing Method App 20100049453 - WATANABE; DAISUKE ; et al.	2010-02-25
A-d Converter App 20100026544 - YAMAMOTO; Kazuhiro ; et al.	2010-02-04
D-a Converter And D-a Converting Method App 20100026541 - YAMAMOTO; Kazuhiro ; et al.	2010-02-04
Test Apparatus And Electronic Device App 20100026329 - WATANABE; Daisuke ; et al.	2010-02-04
Test Equipment And Semiconductor Device App 20100007366 - Watanabe; Daisuke ; et al.	2010-01-14
Power supply stabilizing circuit, an electronic device and a test apparatus Grant 7,642,797 - Kojima , et al. January 5, 2	2010-01-05
Switching Device And Testing Apparatus App 20090302317 - Okayasu; Toshiyuki	2009-12-10
Test System, Electronic Device, And Test Apparatus App 20090295417 - Watanabe; Daisuke ; et al.	2009-12-03
Light receiving apparatus, testing apparatus, light receiving method, testing method, test module and semiconductor chip Grant 7,603,241 - Okayasu , et al. October 13, 2	2009-10-13
Semiconductor Circuit App 20090251001 - Kojima; Shoji ; et al.	2009-10-08
Transmission system, signal receiver, test apparatus and test head Grant 7,555,038 - Watanabe , et al. June 30, 2	2009-06-30
Hermetically Sealing Member Having Optical Transmission Means, Optoelectronic Apparatus, and Optical Transmission Method App 20090162018 - Hayase; Yusuke ; et al.	2009-06-25
Connecting Device, Connecting System, Optical Waveguide And Connecting Method App 20090103869 - FUJITA; KAZUHIRO ; et al.	2009-04-23
Method And Apparatus For Managing Manufacturing Equipment, Method For Manufacturing Device Thereby App 20090081819 - OKAYASU; TOSHIYUKI ; et al.	2009-03-26
Data transmission apparatus, photoelectric conversion circuit and test apparatus Grant 7,509,058 - Ono , et al. March 24, 2	2009-03-24
Measuring Apparatus, Transfer Circuit, And Measuring Method App 20090074420 - Watanabe; Daisuke ; et al.	2009-03-19
Signal generator, test apparatus, and circuit device Grant 7,502,980 - Watanabe , et al. March 10, 2	2009-03-10
Manufacturing System, Manufacturing Method, Managing Apparatus, Managing Method And Computer Readable Medium App 20090058456 - OKAYASU; TOSHIYUKI ; et al.	2009-03-05
Power Supply Stabilizing Circuit, An Electronic Device And A Test Apparatus App 20090058381 - KOJIMA; SHOJI ; et al.	2009-03-05
Transmission Circuit, Cmos Semiconductor Device, And Design Method Thereof App 20090060023 - Yamamoto; Kazuhiro ; et al.	2009-03-05
Test Apparatus App 20090048796 - YAMAMOTO; KAZUHIRO ; et al.	2009-02-19
Light Receiving Apparatus, Testing Apparatus, Light Receiving Method, Testing Method, Test Module And Semiconductor Chip App 20090012729 - OKAYASU; TOSHIYUKI ; et al.	2009-01-08
Threshold voltage control apparatus, test apparatus, and circuit device Grant 7,475,319 - Watanabe , et al. January 6, 2	2009-01-06
Measuring a characteristic of a transfer circuit Grant 7,469,196 - Watanabe , et al. December 23, 2	2008-12-23
Transmission circuit, CMOS semiconductor device, and design method thereof Grant 7,453,289 - Yamamoto , et al. November 18, 2	2008-11-18
Device Identifying Method, Device Manufacturing Method And Electronic Device App 20080180126 - OKAYASU; TOSHIYUKI ; et al.	2008-07-31
Oscillator circuit and test apparatus Grant 7,394,328 - Watanabe , et al. July 1, 2	2008-07-01
Signal Transmission Device, Signal Reception Device, Test Device, Test Module, And Semiconductor Chip App 20080152357 - OKAYASU; TOSHIYUKI ; et al.	2008-06-26
Testing apparatus for testing a device under test and comparator circuit and calibration apparatus for the testing apparatus Grant 7,389,190 - Umemura , et al. June 17, 2	2008-06-17
Calibration apparatus, calibration method, and testing apparatus App 20080091371 - Ishida; Masahiro ; et al.	2008-04-17
Test apparatus and cable guide unit Grant 7,349,617 - Shibata , et al. March 25, 2	2008-03-25
Signal generator, test apparatus, and circuit device App 20080059091 - Watanabe; Daisuke ; et al.	2008-03-06
Threshold voltage control apparatus, test apparatus, and circuit device App 20080048705 - Watanabe; Daisuke ; et al.	2008-02-28
Test apparatus, optical coupler and method of manufacturing same Grant 7,336,885 - Ono , et al. February 26, 2	2008-02-26
Semiconductor test apparatus Grant 7,332,926 - Ohashi , et al. February 19, 2	2008-02-19
Oscillator, frequency multiplier, and test apparatus Grant 7,321,249 - Watanabe , et al. January 22, 2	2008-01-22
Electronic device test apparatus with optical cables Grant 7,316,578 - Ono , et al. January 8, 2	2008-01-08
Test apparatus and cable guide unit App 20070258694 - Shibata; Masashi ; et al.	2007-11-08
Test apparatus and cable guide unit Grant 7,286,742 - Shibata , et al. October 23, 2	2007-10-23
Optical Connector Cleaning Method, Cleaning Fixture, Cleaning Fixture Unit And Optical Connector App 20070196069 - SHIBATA; Masashi ; et al.	2007-08-23
Oscillator circuit and test apparatus App 20070176695 - Watanabe; Daisuke ; et al.	2007-08-02
Measuring apparatus, transfer circuit, and measuring method App 20070131848 - Watanabe; Daisuke ; et al.	2007-06-14
Data transmission apparatus, photoelectric conversion circuit and test apparatus App 20070116474 - Ono; Atsushi ; et al.	2007-05-24
Data transmission apparatus, photoelectric conversion circuit and test apparatus Grant 7,209,668 - Ono , et al. April 24, 2	2007-04-24
Semiconductor test apparatus App 20070024311 - Ohashi; Masatoshi ; et al.	2007-02-01
Calibration comparator circuit App 20060267637 - Umemura; Yoshiharu ; et al.	2006-11-30
Delay device, semiconductor testing device, semiconductor device, and oscilloscope Grant 7,142,031 - Okayasu , et al. November 28, 2	2006-11-28
Oscillator, frequency multiplier, and test apparatus App 20060261903 - Watanabe; Daisuke ; et al.	2006-11-23
Test apparatus and cable guide unit App 20060257093 - Shibata; Masashi ; et al.	2006-11-16
Semiconductor test apparatus Grant 7,126,366 - Ohashi , et al. October 24, 2	2006-10-24
Variable delay circuit App 20060170472 - Suda; Masakatsu ; et al.	2006-08-03
Test apparatus App 20060158204 - Ono; Atsushi ; et al.	2006-07-20
Variable delay circuit Grant 7,071,746 - Suda , et al. July 4, 2	2006-07-04
Test apparatus, optical coupler and method of manufacturing same App 20060115223 - Ono; Atsushi ; et al.	2006-06-01
Transmission system, signal receiver, test apparatus and test head App 20060109895 - Watanabe; Daisuke ; et al.	2006-05-25
Timing comparator, data sampling apparatus, and testing apparatus Grant 7,034,723 - Suda , et al. April 25, 2	2006-04-25
Signal transmission circuit, CMOS semiconductor device, and circuit board Grant 7,002,243 - Okayasu February 21, 2	2006-02-21
Clock recovery circuit and communication device Grant 6,987,410 - Suda , et al. January 17, 2	2006-01-17
Semiconductor testing apparatus with a variable delay circuit Grant 6,967,516 - Okayasu November 22, 2	2005-11-22
Transmission circuit, CMOS semiconductor device, and design method thereof App 20050239431 - Yamamoto, Kazuhiro ; et al.	2005-10-27
Semiconductor test apparatus App 20050231227 - Ohashi, Masatoshi ; et al.	2005-10-20
Delay circuit, testing apparatus, and capacitor Grant 6,944,835 - Okayasu September 13, 2	2005-09-13
Timing generator, semiconductor test apparatus, and timing generating method Grant 6,940,330 - Okayasu September 6, 2	2005-09-06
Timing comparator, data sampling apparatus, and testing apparatus App 20050111602 - Suda, Masakatsu ; et al.	2005-05-26
Variable delay circuit App 20050110548 - Suda, Masakatsu ; et al.	2005-05-26
Clock recovery circuit and communication device App 20050110544 - Suda, Masakatsu ; et al.	2005-05-26
Data transmission apparatus, photoelectric conversion circuit and test apparatus App 20050025498 - Ono, Atsushi ; et al.	2005-02-03
Signal transmission circuit, CMOS semiconductor device, and circuit board App 20050024104 - Okayasu, Toshiyuki	2005-02-03
Timing generating apparatus and test apparatus Grant 6,842,061 - Suda , et al. January 11, 2	2005-01-11
Signal transmission circuit, CMOS semiconductor device, and circuit board Grant 6,822,267 - Okayasu November 23, 2	2004-11-23
Optical pulse transmission system, optical pulse transmitting method and optical pulse detection method Grant 6,819,876 - Okayasu , et al. November 16, 2	2004-11-16
Delay device, semiconductor testing device, semiconductor device, and oscilloscope App 20040216014 - Okayasu, Toshiyuki ; et al.	2004-10-28
Timing generating apparatus and test apparatus App 20040207436 - Suda, Masakatsu ; et al.	2004-10-21
Delay clock generating apparatus and delay time measuring apparatus Grant 6,807,243 - Okayasu , et al. October 19, 2	2004-10-19
Timing generator, semiconductor test apparatus, and timing generating method App 20040196052 - Okayasu, Toshiyuki	2004-10-07
Optical pulse transmission system, optical pulse transmitting method and optical pulse detecting method Grant 6,778,783 - Okayasu , et al. August 17, 2	2004-08-17
Delay device, semiconductor testing device, semiconductor device, and oscilloscope Grant 6,769,082 - Okayasu , et al. July 27, 2	2004-07-27
Delay time judging apparatus Grant 6,651,179 - Sato , et al. November 18, 2	2003-11-18
Delay clock generating apparatus and delay time measuring apparatus App 20030194038 - Okayasu, Toshiyuki ; et al.	2003-10-16
Delay circuit, testing apparatus, and capacitor App 20030173645 - Okayasu, Toshiyuki	2003-09-18
Delay clock generating apparatus and delay time measuring apparatus Grant 6,597,753 - Okayasu , et al. July 22, 2	2003-07-22
Delay circuit, testing apparatus, and capacitor Grant 6,598,212 - Okayasu July 22, 2	2003-07-22
Variable delay circuit App 20030135796 - Okayasu, Toshiyuki	2003-07-17
CMOS integrated circuit and timing signal generator using same Grant 6,590,405 - Okayasu July 8, 2	2003-07-08
Method for correcting timing for IC tester and IC tester having correcting function using the correcting method Grant 6,586,924 - Okayasu , et al. July 1, 2	2003-07-01
Optically driven driver, optical output type voltage sensor, and IC testing equipment using these devices Grant 6,586,953 - Okayasu July 1, 2	2003-07-01
Variable delay circuit Grant 6,549,052 - Okayasu April 15, 2	2003-04-15
CMOS integrated circuit and timing signal generator using same App 20020158652 - Okayasu, Toshiyuki	2002-10-31
Optical pulse transmission system, optical pulse transmitting method, and optical pulse detecting method Grant 6,381,054 - Okayasu , et al. April 30, 2	2002-04-30
Delay circuit, testing apparatus, and capacitor App 20020026622 - Okayasu, Toshiyuki	2002-02-28
Optical pulse transmission system, optical pulse transmitting method and optical pulse detection method App 20020012145 - Okayasu, Toshiyuki ; et al.	2002-01-31
Optical pulse transmission system, optical pulse transmitting method and optical pulse detecting method App 20020008892 - Okayasu, Toshiyuki ; et al.	2002-01-24
Timing calibration apparatus and method in a semiconductor integrated circuit tester App 20010028251 - Okayasu, Toshiyuki	2001-10-11
Opitcal/electrical hybrid wiring board and its manufacturing method Grant 6,257,771 - Okayasu July 10, 2	2001-07-10
Variable delay circuit App 20010005158 - Okayasu, Toshiyuki	2001-06-28
Integrated circuit device tester Grant 6,157,200 - Okayasu December 5, 2	2000-12-05
Method of signal transmission between semiconductor integrated circuits and output drive circuit for use therewith Grant 6,114,898 - Okayasu September 5, 2	2000-09-05
Driver circuit with temperature correction circuit Grant 6,094,085 - Okayasu , et al. July 25, 2	2000-07-25
Driver circuit with temperature correction circuit Grant 5,973,542 - Okayasu , et al. October 26, 1	1999-10-26
Signal transmission cable driver apparatus without a peaking coil Grant 5,898,326 - Okayasu April 27, 1	1999-04-27
Delay time measurement apparatus for delay circuit Grant 5,764,598 - Okayasu June 9, 1	1998-06-09
Timing signal generation circuit Grant 5,491,673 - Okayasu February 13, 1	1996-02-13