Ogushi; Nobuaki
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ogushi; Nobuaki.The latest application filed is for "remote maintenance system".
- Ogushi; Nobuaki - Utsunomiya JP
- Ogushi; Nobuaki - Tochigi JP
- Ogushi; Nobuaki - Utsunomiya-shi JP
| Patent | Date |
|---|---|
| Remote maintenance system Grant 7,805,279 - Ogushi , et al. September 28, 2 | 2010-09-28 |
| Information providing method and system Grant 7,225,041 - Kano , et al. May 29, 2 | 2007-05-29 |
| Remote maintenance system App 20060282188 - Ogushi; Nobuaki ; et al. | 2006-12-14 |
| Remote maintenance system Grant 7,062,343 - Ogushi , et al. June 13, 2 | 2006-06-13 |
| Information providing method and system App 20060074507 - Kano; Ichiro ; et al. | 2006-04-06 |
| Information providing method and system Grant 6,980,872 - Kano , et al. December 27, 2 | 2005-12-27 |
| Measuring apparatus, exposure apparatus having the same, and device manufacturing method App 20050270509 - Ogushi, Nobuaki ; et al. | 2005-12-08 |
| Remote maintenance system Grant 6,963,786 - Ogushi , et al. November 8, 2 | 2005-11-08 |
| Industrial machine management system and method Grant 6,957,112 - Ina , et al. October 18, 2 | 2005-10-18 |
| Industrial machine management system, and method App 20050209720 - Ina, Hideki ; et al. | 2005-09-22 |
| Remote maintenance system App 20050197727 - Ogushi, Nobuaki ; et al. | 2005-09-08 |
| Differential pumping system and exposure apparatus Grant 6,897,456 - Hasegawa , et al. May 24, 2 | 2005-05-24 |
| Remote maintenance system Grant 6,892,109 - Ogushi , et al. May 10, 2 | 2005-05-10 |
| Debris removing system for use in X-ray light source Grant 6,867,843 - Ogushi , et al. March 15, 2 | 2005-03-15 |
| Exposure apparatus, method of manufacturing semiconductor devices and plant therefor Grant 6,795,161 - Ogura , et al. September 21, 2 | 2004-09-21 |
| Differential pumping system and exposure apparatus App 20040075063 - Hasegawa, Takayuki ; et al. | 2004-04-22 |
| Synchrotron radiation measurement apparatus, X-ray exposure apparatus, and device manufacturing method Grant 6,665,371 - Chinju , et al. December 16, 2 | 2003-12-16 |
| Debris removing system for use in X-ray light source App 20030020890 - Ogushi, Nobuaki ; et al. | 2003-01-30 |
| Semiconductor manufacturing system and information management method App 20030012373 - Ogura, Masaya ; et al. | 2003-01-16 |
| Industrial machine management system and method App 20020065572 - Ina, Hideki ; et al. | 2002-05-30 |
| Remote maintenance system Grant 6,385,497 - Ogushi , et al. May 7, 2 | 2002-05-07 |
| Information providing method and system App 20020046140 - Kano, Ichiro ; et al. | 2002-04-18 |
| Remote maintenance system App 20020040251 - Ogushi, Nobuaki ; et al. | 2002-04-04 |
| Remote maintenance system App 20020029086 - Ogushi, Nobuaki ; et al. | 2002-03-07 |
| Exposure apparatus, method of manufacturing semiconductor devices and plant therefor App 20010052967 - Ogura, Masaya ; et al. | 2001-12-20 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 