loadpatents
Patent applications and USPTO patent grants for OGIWARA; Ryu.The latest application filed is for "memory device".
Patent | Date |
---|---|
Memory Device App 20220109024 - OGIWARA; Ryu ;   et al. | 2022-04-07 |
Memory Device App 20220108729 - OGIWARA; Ryu ;   et al. | 2022-04-07 |
Memory Device App 20220028452 - OGIWARA; Ryu ;   et al. | 2022-01-27 |
Memory Device And Method Of Manufacturing Memory Device App 20210399049 - IIZUKA; Takahiko ;   et al. | 2021-12-23 |
Memory Device App 20210287733 - IIZUKA; Takahiko ;   et al. | 2021-09-16 |
Memory device Grant 11,120,866 - Iizuka , et al. September 14, 2 | 2021-09-14 |
Memory Device App 20210090647 - OGIWARA; Ryu ;   et al. | 2021-03-25 |
Nonvolatile memory device including memory element in equal cross-sectional area of word lines and bit lines Grant 10,950,278 - Iizuka , et al. March 16, 2 | 2021-03-16 |
Memory device Grant 10,923,189 - Ogiwara , et al. February 16, 2 | 2021-02-16 |
Memory Device App 20200403035 - OGIWARA; Ryu ;   et al. | 2020-12-24 |
Storage device Grant 10,803,932 - Ogiwara , et al. October 13, 2 | 2020-10-13 |
Storage Device App 20200303001 - OGIWARA; Ryu ;   et al. | 2020-09-24 |
Nonvolatile Memory Device App 20200302975 - IIZUKA; Takahiko ;   et al. | 2020-09-24 |
Memory device Grant 10,672,468 - Ogiwara , et al. | 2020-06-02 |
Memory Device App 20200098426 - Ogiwara; Ryu ;   et al. | 2020-03-26 |
Resistance change memory device Grant 10,490,271 - Ogiwara , et al. Nov | 2019-11-26 |
Memory Device App 20190295637 - Ogiwara; Ryu ;   et al. | 2019-09-26 |
Multi-layer resistive memory device with variable resistance elements Grant 10,410,720 - Iizuka , et al. Sept | 2019-09-10 |
Resistance Change Memory Device App 20190088319 - OGIWARA; Ryu ;   et al. | 2019-03-21 |
Semiconductor Memory Device App 20180277202 - IIZUKA; Takahiko ;   et al. | 2018-09-27 |
Non-volatile Semiconductor Memory Device App 20180268878 - OGIWARA; Ryu ;   et al. | 2018-09-20 |
Semiconductor memory device including variable resistance element Grant 10,032,509 - Ogiwara , et al. July 24, 2 | 2018-07-24 |
Semiconductor memory device including variable resistance element Grant 9,966,136 - Ogiwara , et al. May 8, 2 | 2018-05-08 |
Semiconductor storage device with voltage generator which generates voltages and currents for read and write operations Grant 9,928,903 - Ogiwara , et al. March 27, 2 | 2018-03-27 |
Semiconductor Memory Device Including Variable Resistance Element App 20180075903 - OGIWARA; Ryu ;   et al. | 2018-03-15 |
Semiconductor storage device Grant 9,607,693 - Ogiwara , et al. March 28, 2 | 2017-03-28 |
Semiconductor Storage Device With Voltage Generator App 20160365143 - OGIWARA; Ryu ;   et al. | 2016-12-15 |
Semiconductor Memory Device App 20160293253 - OGIWARA; Ryu ;   et al. | 2016-10-06 |
Semiconductor Memory Device App 20160293251 - OGIWARA; Ryu ;   et al. | 2016-10-06 |
Semiconductor Storage Device App 20160293252 - OGIWARA; Ryu ;   et al. | 2016-10-06 |
Semiconductor storage device Grant 9,460,785 - Ogiwara , et al. October 4, 2 | 2016-10-04 |
Semiconductor Storage Device App 20160267969 - OGIWARA; Ryu ;   et al. | 2016-09-15 |
Nonvolatile semiconductor memory device Grant 9,437,307 - Itagaki , et al. September 6, 2 | 2016-09-06 |
Semiconductor storage device writing data into memory cells using a half selected state and a write state Grant 9,418,740 - Ogiwara , et al. August 16, 2 | 2016-08-16 |
Semiconductor storage device Grant 9,412,449 - Ogiwara , et al. August 9, 2 | 2016-08-09 |
Semiconductor Storage Device App 20160180930 - OGIWARA; Ryu ;   et al. | 2016-06-23 |
Semiconductor storage device having resistance-change storage elements Grant 9,311,996 - Ogiwara , et al. April 12, 2 | 2016-04-12 |
Semiconductor Storage Device Having Resistance-change Storage Elements App 20160071585 - OGIWARA; Ryu ;   et al. | 2016-03-10 |
Semiconductor Storage Device App 20160071586 - OGIWARA; Ryu ;   et al. | 2016-03-10 |
Semiconductor storage device Grant 9,240,226 - Ogiwara , et al. January 19, 2 | 2016-01-19 |
Semiconductor storage device Grant 9,230,618 - Ogiwara , et al. January 5, 2 | 2016-01-05 |
Semiconductor Storage Device App 20150255151 - OGIWARA; Ryu ;   et al. | 2015-09-10 |
Semiconductor Storage Device App 20150255127 - OGIWARA; Ryu ;   et al. | 2015-09-10 |
Semiconductor Storage Device App 20150036410 - OGIWARA; RYU ;   et al. | 2015-02-05 |
Nonvolatile Semiconductor Memory Device App 20150029791 - ITAGAKI; Kiyotaro ;   et al. | 2015-01-29 |
Nonvolatile semiconductor memory device Grant 8,873,296 - Itagaki , et al. October 28, 2 | 2014-10-28 |
Nonvolatile Semiconductor Memory Device App 20130314994 - ITAGAKI; Kiyotaro ;   et al. | 2013-11-28 |
Three dimensional NAND type memory device having selective charge pump activation to minimize noise Grant 8,531,901 - Ogiwara , et al. September 10, 2 | 2013-09-10 |
Nonvolatile semiconductor memory device Grant 8,514,627 - Itagaki , et al. August 20, 2 | 2013-08-20 |
Internal voltage generator Grant 8,259,513 - Ogiwara , et al. September 4, 2 | 2012-09-04 |
Current supply circuit Grant 8,159,285 - Hioka , et al. April 17, 2 | 2012-04-17 |
Nonvolatile Semiconductor Memory Device App 20120069663 - ITAGAKI; Kiyotaro ;   et al. | 2012-03-22 |
Ferroelectric memory and method for testing the same Grant 8,134,855 - Ogiwara , et al. March 13, 2 | 2012-03-13 |
Semiconductor Memory Device App 20120057405 - Ogiwara; Ryu ;   et al. | 2012-03-08 |
Semiconductor memory device Grant 8,045,357 - Ogiwara , et al. October 25, 2 | 2011-10-25 |
Nonvolatile semiconductor memory device Grant 8,045,358 - Ogiwara , et al. October 25, 2 | 2011-10-25 |
Reference voltage generation circuit Grant 7,902,913 - Ogiwara , et al. March 8, 2 | 2011-03-08 |
Internal Voltage Generator App 20110007579 - OGIWARA; Ryu ;   et al. | 2011-01-13 |
Reference voltage generating circuit for use of integrated circuit Grant 7,852,142 - Ogiwara , et al. December 14, 2 | 2010-12-14 |
Reference voltage generation circuit and semiconductor storage apparatus using the same Grant 7,834,682 - Ogiwara , et al. November 16, 2 | 2010-11-16 |
Power supply circuit using insulated-gate field-effect transistors Grant 7,816,976 - Ogiwara , et al. October 19, 2 | 2010-10-19 |
Internal Power Supply Voltage Generation Circuit App 20100237931 - OGIWARA; Ryu ;   et al. | 2010-09-23 |
Current Supply Circuit App 20100237933 - HIOKA; Takeshi ;   et al. | 2010-09-23 |
Voltage step-down circuit Grant 7,795,953 - Ogiwara , et al. September 14, 2 | 2010-09-14 |
Voltage generating circuit Grant 7,763,991 - Ogiwara , et al. July 27, 2 | 2010-07-27 |
Semiconductor device including an internal voltage generation circuit and a first test circuit Grant 7,759,928 - Ogiwara , et al. July 20, 2 | 2010-07-20 |
Voltage generation circuit provided in a semiconductor integrated device Grant 7,750,723 - Ogiwara , et al. July 6, 2 | 2010-07-06 |
Voltage generating circuit Grant 7,746,164 - Ogiwara , et al. June 29, 2 | 2010-06-29 |
Nonvolatile Semiconductor Memory Device App 20100149850 - OGIWARA; Ryu ;   et al. | 2010-06-17 |
Semiconductor memory device Grant 7,733,683 - Takashima , et al. June 8, 2 | 2010-06-08 |
Discharge order control circuit and memory device Grant 7,724,581 - Ogiwara , et al. May 25, 2 | 2010-05-25 |
Semiconductor Memory Device App 20100091547 - Ogiwara; Ryu ;   et al. | 2010-04-15 |
Voltage Detection Circuit And Bgr Voltage Detection Circuit App 20100090727 - Ogiwara; Ryu ;   et al. | 2010-04-15 |
Power supply circuit Grant 7,679,412 - Ogiwara , et al. March 16, 2 | 2010-03-16 |
Reference Voltage Generation Circuit App 20100060346 - OGIWARA; Ryu ;   et al. | 2010-03-11 |
Reference voltage generation circuit Grant 7,633,330 - Ogiwara , et al. December 15, 2 | 2009-12-15 |
Power-on detecting circuit Grant 7,609,099 - Ogiwara , et al. October 27, 2 | 2009-10-27 |
Ferroelectric Memory And Method For Testing The Same App 20090231903 - OGIWARA; Ryu ;   et al. | 2009-09-17 |
Reference voltage generator circuit Grant 7,589,513 - Ogiwara , et al. September 15, 2 | 2009-09-15 |
Supply voltage sensing circuit Grant 7,583,114 - Ogiwara , et al. September 1, 2 | 2009-09-01 |
Voltage Generating Circuit App 20090115387 - OGIWARA; Ryu ;   et al. | 2009-05-07 |
Power Supply Circuit Using Insulated-gate Field-effect Transistors App 20090108919 - OGIWARA; Ryu ;   et al. | 2009-04-30 |
Reference Voltage Generating Circuit For Use Of Integrated Circuit App 20090096510 - OGIWARA; Ryu ;   et al. | 2009-04-16 |
Power Supply Circuit App 20090096506 - OGIWARA; Ryu ;   et al. | 2009-04-16 |
Reference Voltage Generation Circuit And Semiconductor Storage Apparatus Using The Same App 20090039944 - OGIWARA; Ryu ;   et al. | 2009-02-12 |
Ferroelectric Memory and Semiconductor Memory App 20080285327 - Ogiwara; Ryu ;   et al. | 2008-11-20 |
Temperature sensing circuit, voltage generation circuit, and semiconductor storage device Grant 7,443,709 - Ogiwara , et al. October 28, 2 | 2008-10-28 |
Voltage Step-down Circuit App 20080231351 - Ogiwara; Ryu ;   et al. | 2008-09-25 |
Power supply voltage control circuit Grant 7,426,147 - Ogiwara , et al. September 16, 2 | 2008-09-16 |
Voltage Generating Circuit App 20080191792 - OGIWARA; Ryu ;   et al. | 2008-08-14 |
Ferroelectric memory to be tested by applying disturbance voltage to a plurality of ferroelectric capacitors at once in direction to weaken polarization, and method of testing the same Grant 7,411,809 - Ogiwara , et al. August 12, 2 | 2008-08-12 |
Semiconductor Memory Device App 20080180984 - TAKASHIMA; Daisaburo ;   et al. | 2008-07-31 |
Voltage Generation Circuit App 20080174290 - OGIWARA; Ryu ;   et al. | 2008-07-24 |
Reference Voltage Generation Circuit App 20080116965 - OGIWARA; Ryu ;   et al. | 2008-05-22 |
Semiconductor Device App 20080111575 - Ogiwara; Ryu ;   et al. | 2008-05-15 |
Discharge Order Control Circuit And Memory Device App 20070274132 - Ogiwara; Ryu ;   et al. | 2007-11-29 |
Reference Voltage Generating Circuit App 20070274138 - Ogiwara; Ryu ;   et al. | 2007-11-29 |
Chain ferroelectric random access memory (CFRAM) having an intrinsic transistor connected in parallel with a ferroelectric capacitor Grant 7,295,456 - Ogiwara , et al. November 13, 2 | 2007-11-13 |
Reference voltage generator circuit App 20070241736 - Ogiwara; Ryu ;   et al. | 2007-10-18 |
Supply Voltage Sensing Circuit App 20070236260 - Ogiwara; Ryu ;   et al. | 2007-10-11 |
Semiconductor memory device having memory cells to store cell data and reference data Grant 7,233,536 - Ogiwara , et al. June 19, 2 | 2007-06-19 |
Temperature sensing circuit, voltage generation circuit, and semiconductor storage device App 20070121404 - Ogiwara; Ryu ;   et al. | 2007-05-31 |
Power-on Detecting Circuit App 20070115007 - OGIWARA; Ryu ;   et al. | 2007-05-24 |
Ferroelectric memory to be tested by applying disturbance voltage to a plurality of ferroelectric capacitors at once in direction to weaken polarization, and method of testing the same App 20070109834 - Ogiwara; Ryu ;   et al. | 2007-05-17 |
Power Supply Voltage Control Circuit App 20070058420 - Ogiwara; Ryu ;   et al. | 2007-03-15 |
Semiconductor device having semiconductor memory with sense amplifier Grant 7,142,473 - Ogiwara , et al. November 28, 2 | 2006-11-28 |
Ferroelectric Memory and Semiconductor Memory App 20060193162 - Ogiwara; Ryu ;   et al. | 2006-08-31 |
Semiconductor memory Grant 7,092,304 - Ogiwara , et al. August 15, 2 | 2006-08-15 |
Phase-change memory device using chalcogenide compound as the material of memory cells App 20060126424 - Ogiwara; Ryu | 2006-06-15 |
Semiconductor storage device Grant 7,061,788 - Ogiwara , et al. June 13, 2 | 2006-06-13 |
Ferroelectric memory with an intrinsic access transistor coupled to a capacitor Grant 7,057,917 - Ogiwara , et al. June 6, 2 | 2006-06-06 |
Phase-change memory device using chalcogenide compound as the material of memory cells Grant 7,053,431 - Ogiwara May 30, 2 | 2006-05-30 |
Semiconductor integrated circuit device Grant 7,046,541 - Ogiwara , et al. May 16, 2 | 2006-05-16 |
Semiconductor Storage Device App 20060067100 - Ogiwara; Ryu ;   et al. | 2006-03-30 |
Semiconductor memory device having memory cells to store cell data and reference data App 20060067138 - Ogiwara; Ryu ;   et al. | 2006-03-30 |
Series connected TC unit type ferroelectric RAM and test method thereof Grant 6,993,691 - Ogiwara , et al. January 31, 2 | 2006-01-31 |
Semiconductor integrated circuit device and operation method therefor Grant 6,980,460 - Shiratake , et al. December 27, 2 | 2005-12-27 |
Semiconductor memory App 20050276140 - Ogiwara, Ryu ;   et al. | 2005-12-15 |
Ferroelectric memory and method of testing the same Grant 6,944,046 - Ogiwara September 13, 2 | 2005-09-13 |
Semiconductor device having semiconductor memory with sense amplifier App 20050146918 - Ogiwara, Ryu ;   et al. | 2005-07-07 |
Semiconductor integrated circuit device App 20050128780 - Ogiwara, Ryu ;   et al. | 2005-06-16 |
Semiconductor device having semiconductor memory with sense amplifier Grant 6,898,104 - Ogiwara , et al. May 24, 2 | 2005-05-24 |
Phase-change memory device using chalcogenide compound as the material of memory cells App 20050098811 - Ogiwara, Ryu | 2005-05-12 |
Semiconductor integrated circuit device and operation method therefor App 20050057956 - Shiratake, Shinichiro ;   et al. | 2005-03-17 |
Ferroelectric memory and method of testing the same App 20040179385 - Ogiwara, Ryu | 2004-09-16 |
Ferroelectric memory and semiconductor memory App 20040136225 - Ogiwara, Ryu ;   et al. | 2004-07-15 |
Semiconductor device having semiconductor memory with sense amplifier App 20040090826 - Ogiwara, Ryu ;   et al. | 2004-05-13 |
Ferroelectric random access memory with isolation transistors coupled between a sense amplifier and an equalization circuit Grant 6,671,200 - Ogiwara , et al. December 30, 2 | 2003-12-30 |
Ferroelectric memory and semiconductor memory App 20030128572 - Ogiwara, Ryu ;   et al. | 2003-07-10 |
Chain-type ferroelectric random access memory (FRAM) with rewrite transistors coupled between a sense amplifier and a bit line pair Grant 6,552,922 - Ogiwara , et al. April 22, 2 | 2003-04-22 |
Ferroelectric memory and semiconductor memory App 20020196656 - Ogiwara, Ryu ;   et al. | 2002-12-26 |
Series connected TC unit type ferroelectric RAM and test method thereof App 20020188893 - Ogiwara, Ryu ;   et al. | 2002-12-12 |
Chain type ferroelectric memory with isolation transistors coupled between a sense amplifier and an equalization circuit Grant 6,473,330 - Ogiwara , et al. October 29, 2 | 2002-10-29 |
NAND-type dynamic RAM having temporary storage register and sense amplifier coupled to multi-open bit lines Grant 5,892,724 - Hasegawa , et al. April 6, 1 | 1999-04-06 |
Semiconductor memory device for suppressing noises occurring on bit and word lines Grant 5,418,750 - Shiratake , et al. May 23, 1 | 1995-05-23 |
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