OBA; Hiroshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for OBA; Hiroshi.The latest application filed is for "focused ion beam processing apparatus".

Company Profile

4.20.19

OBA; Hiroshi - Tokyo JP
Oba; Hiroshi - Chiba N/A JP
Oba; Hiroshi - Chiba-shi JP
Oba; Hiroshi - Yokohama JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Focused Ion Beam Processing Apparatus App 20210296080 - OBA; Hiroshi ; et al.	2021-09-23
Charged particle beam apparatus Grant 11,017,988 - Oba , et al. May 25, 2	2021-05-25
Composite charged particle beam apparatus and control method thereof Grant 11,017,982 - Sugiyama , et al. May 25, 2	2021-05-25
Composite Charged Particle Beam Apparatus And Control Method Thereof App 20200266029 - SUGIYAMA; Yasuhiko ; et al.	2020-08-20
Method of manufacturing emitter Grant 10,658,143 - Nakajima , et al.	2020-05-19
Charged Particle Beam Apparatus App 20200135437 - OBA; Hiroshi ; et al.	2020-04-30
Method Of Manufacturing Emitter App 20190267208 - NAKAJIMA; Yoko ; et al.	2019-08-29
Focused ion beam apparatus Grant 10,176,964 - Sugiyama , et al. J	2019-01-08
Charged particle beam apparatus and plasma ignition method Grant 10,056,232 - Oba , et al. August 21, 2	2018-08-21
Focused ion beam apparatus Grant 9,793,085 - Yasaka , et al. October 17, 2	2017-10-17
Charged Particle Beam Apparatus And Plasma Ignition Method App 20170278678 - Oba; Hiroshi ; et al.	2017-09-28
Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus Grant 9,773,634 - Kozakai , et al. September 26, 2	2017-09-26
Plasma ion source and charged particle beam apparatus Grant 9,773,637 - Oba , et al. September 26, 2	2017-09-26
Plasma ion source and charged particle beam apparatus Grant 9,773,646 - Oba , et al. September 26, 2	2017-09-26
Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Electron Source, Electron Microscope, Electron Beam Applied Analysis Apparatus, Ion-Electron Multi-Beam Apparatus, Scanning Probe Microscope, and Mask Repair Apparatus App 20170148603 - Kozakai; Tomokazu ; et al.	2017-05-25
Emitter structure, gas ion source and focused ion beam system Grant 9,640,361 - Yasaka , et al. May 2, 2	2017-05-02
Focused Ion Beam Apparatus App 20170069456 - SUGIYAMA; Yasuhiko ; et al.	2017-03-09
Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus Grant 9,583,299 - Kozakai , et al. February 28, 2	2017-02-28
Repair Apparatus App 20160322123 - Aramaki; Fumio ; et al.	2016-11-03
Plasma Ion Source And Charged Particle Beam Apparatus App 20160240354 - OBA; Hiroshi ; et al.	2016-08-18
Plasma Ion Source And Charged Particle Beam Apparatus App 20160240346 - OBA; Hiroshi ; et al.	2016-08-18
Focused ion beam apparatus and control method thereof Grant 9,418,817 - Aramaki , et al. August 16, 2	2016-08-16
Focused Ion Beam Apparatus App 20160225574 - YASAKA; Anto ; et al.	2016-08-04
Repair apparatus Grant 9,378,858 - Aramaki , et al. June 28, 2	2016-06-28
Emitter Structure, Gas Ion Source And Focused Ion Beam System App 20150357147 - YASAKA; Anto ; et al.	2015-12-10
Emitter structure, gas ion source and focused ion beam system Grant 9,129,771 - Yasaka , et al. September 8, 2	2015-09-08
Ion beam apparatus Grant 9,111,717 - Asahata , et al. August 18, 2	2015-08-18
Repair Apparatus App 20150053866 - Aramaki; Fumio ; et al.	2015-02-26
Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Electron Source, Electron Microscope, Electron Beam Applied Analysis Apparatus, Ion-Electron Multi-Beam Apparatus, Scanning Probe Microscope, and Mask Repair Apparatus App 20150047079 - Kozakai; Tomokazu ; et al.	2015-02-12
Focused Ion Beam Apparatus And Control Method Thereof App 20140292189 - ARAMAKI; Fumio ; et al.	2014-10-02
Emitter Structure, Gas Ion Source And Focused Ion Beam System App 20140291542 - YASAKA; Anto ; et al.	2014-10-02
Focused ion beam apparatus and method of adjusting ion beam optics Grant 8,822,911 - Sugiyama , et al. September 2, 2	2014-09-02
Ion Beam Apparatus App 20130248732 - ASAHATA; Tatsuya ; et al.	2013-09-26
Focused Ion Beam Apparatus And Method Of Adjusting Ion Beam Optics App 20130240720 - SUGIYAMA; Yasuhiko ; et al.	2013-09-19
Defect repair apparatus and method for EUV mask using a hydrogen ion beam Grant 8,460,842 - Ogawa , et al. June 11, 2	2013-06-11
Defect repair apparatus and method for EUV mask App 20110189593 - Ogawa; Takashi ; et al.	2011-08-04
Photosensitive composition for electrophotography Grant 4,184,871 - Oba , et al. January 22, 1	1980-01-22
Process for forming vesicular photographic images by employing simultaneous actinic light and infra-red reflex exposure Grant 4,042,391 - Fukutani , et al. August 16, 1	1977-08-16

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